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2020 – today
- 2023
[j20]Martí Caro
, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt:
An automotive case study on the limits of approximation for object detection. J. Syst. Archit. 138: 102872 (2023)- [j19]Josep Altet, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo:
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. Sensors 23(16): 7069 (2023) - [j18]Jordi Fornt, Pau Fontova-Musté, Martí Caro, Jaume Abella, Francesc Moll, Josep Altet, Christoph Studer:
An Energy-Efficient GeMM-Based Convolution Accelerator With On-the-Fly im2col. IEEE Trans. Very Large Scale Integr. Syst. 31(11): 1874-1878 (2023) - [i1]Martí Caro, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt:
An Automotive Case Study on the Limits of Approximation for Object Detection. CoRR abs/2304.06327 (2023) - 2022
- [c19]Jordi Fornt, Leixin Jin, Imanol Etxezarreta, Pau Fontova, Josep Altet, Antonio Calomarde, Enric Morancho, Francesc Moll, Antonio Rubio:
Two examples of approximate arithmetic to reduce hardware complexity and power consumption. DCIS 2022: 1-6 - 2021
- [j17]Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter:
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21(3): 805 (2021)
2010 – 2019
- 2019
- [j16]Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet:
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. Sensors 19(21): 4815 (2019) - [j15]Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet:
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68(8): 2861-2870 (2019) - [c18]Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo:
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology. DCIS 2019: 1-6 - [c17]Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo:
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. DCIS 2019: 1-6 - 2015
- [j14]Ferran Reverter, Josep Altet:
On-Chip Thermal Testing Using MOSFETs in Weak Inversion. IEEE Trans. Instrum. Meas. 64(2): 524-532 (2015) - 2014
- [j13]Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà:
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014) - [c16]Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [c15]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet:
Defect-oriented non-intrusive RF test using on-chip temperature sensors. VTS 2013: 1-6 - 2012
- [j12]Didac Gómez, Josep Altet, Diego Mateo:
On the Use of Static Temperature Measurements as Process Variation Observable. J. Electron. Test. 28(5): 685-695 (2012) - [j11]Didac Gómez, Cédric Dufis, Josep Altet, Diego Mateo, José Luis González:
Electro-thermal coupling analysis methodology for RF circuits. Microelectron. J. 43(9): 633-641 (2012) - [c14]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet:
Testing RF circuits with true non-intrusive built-in sensors. DATE 2012: 1090-1095 - [c13]Nathalie Deltimple, José Luis González, Josep Altet, Yohann Luque, Eric Kerherve:
Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor. ESSCIRC 2012: 398-401 - [c12]Josep Altet, Diego Mateo, Didac Gómez:
On line monitoring of RF power amplifiers with embedded temperature sensors. IOLTS 2012: 109-113 - [c11]Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà:
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC 2012: 1-8 - 2011
- [j10]Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez:
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. J. Electron. Test. 27(3): 225-240 (2011) - [j9]Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez:
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(3): 458-469 (2011) - [c10]Joan Mauricio, Francesc Moll, Josep Altet:
Monitor strategies for variability reduction considering correlation between power and timing variability. SoCC 2011: 225-230 - 2010
- [c9]Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. IOLTS 2010: 135
2000 – 2009
- 2009
- [c8]Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1 - 2008
- [c7]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - 2007
- [j8]Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements. Microelectron. J. 38(2): 151-156 (2007) - 2006
- [j7]Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio:
Dynamic Surface Temperature Measurements in ICs. Proc. IEEE 94(8): 1519-1533 (2006) - [c6]Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. ISCAS 2006 - 2004
- [j6]Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby:
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44(1): 95-103 (2004) - [c5]Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing. VTS 2004: 179-184 - 2003
- [j5]Josep Altet, Antonio J. Rubio, José Luis Rosselló, Jaume Segura:
Structural RFIC device testing through built-in thermal monitoring. IEEE Commun. Mag. 41(9): 98-104 (2003) - [j4]Josep Altet, André Ivanov, A. Wong:
Thermal Testing of Analogue Integrated Circuits: A Case Study. J. Electron. Test. 19(3): 353-357 (2003) - 2002
- [j3]Ashish Syal, Victor Lee, André Ivanov, Josep Altet:
CMOS Differential and Absolute Thermal Sensors. J. Electron. Test. 18(3): 295-304 (2002) - 2001
- [j2]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36(1): 81-91 (2001) - [c4]Ashish Syal, Victor Lee, André Ivanov, Josep Altet:
CMOS Differential and Absolute Thermal Sensors. IOLTW 2001: 127- - 2000
- [c3]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
1990 – 1999
- 1999
- [j1]Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility. J. Electron. Test. 14(1-2): 57-66 (1999) - 1997
- [c2]Josep Altet, Antonio Rubio, Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits. Asian Test Symposium 1997: 149-154 - [c1]Josep Altet, Antonio Rubio:
Differential Sensing Strategy for Dynamic Thermal Testing of ICs. VTS 1997: 434-439
Coauthor Index
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