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2020 – today
- 2024
[j29]Oriol Avino-Salvado
, Cyril Buttay, Ferran Bonet, Christophe Raynaud, Pascal Bevilacqua, José Rebollo, Hervé Morel, Xavier Perpiñà:
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. IEEE Trans. Ind. Electron. 71(5): 5285-5295 (2024)- [j28]Roger Solé, Conrad Ferrer, Oriol Avino-Salvado, Xavier Jordà, Xavier Perpiñà:
Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging. IEEE Trans. Instrum. Meas. 73: 1-11 (2024) - 2023
- [j27]Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà:
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - 2021
- [j26]Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter:
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21(3): 805 (2021) - [j25]Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà:
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. IEEE Trans. Ind. Electron. 68(12): 12840-12849 (2021)
2010 – 2019
- 2019
- [j24]Manuel Fernandez, Xavier Perpiñà, José Rebollo, Miquel Vellvehí, David Sanchez, Tomás Cabeza, Sergio Llorente, Xavier Jordà:
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices. IEEE Trans. Ind. Electron. 66(3): 1832-1841 (2019) - [j23]Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet:
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68(8): 2861-2870 (2019) - 2017
- [j22]Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà:
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. IEEE Trans. Ind. Electron. 64(11): 9012-9022 (2017) - 2015
- [j21]Xavier Jordà, Jesús Esarte, Xavier Perpiñà, Miquel Vellvehí, Gorka Argandoña, Maite Aresti:
Characterization of phase change material systems using a thermal test device. Microelectron. J. 46(12): 1195-1201 (2015) - [j20]Javier Leon, Xavier Perpiñà, Jordi Sacristán, Miquel Vellvehí, Antoni Baldi, Xavier Jordà:
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging. IEEE Trans. Ind. Electron. 62(12): 7774-7785 (2015) - 2014
- [j19]Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà:
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014) - [j18]Xavier Perpiñà, Xavier Jordà, Javier Leon, Miquel Vellvehí, Daniel Antón, Sergio Llorente:
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications. Microelectron. Reliab. 54(9-10): 1839-1844 (2014) - [j17]Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà:
Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectron. Reliab. 54(9-10): 2207-2212 (2014) - [c3]Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon:
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. ESSDERC 2014: 385-388 - [c2]Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [j16]Jiri Jakovenko, J. Formánek, X. Perpiñà, Xavier Jordà, Miquel Vellvehí, Robert J. Werkhoven, Miroslav Husák, J. M. G. Kunen, P. Bancken, P. J. Bolt, A. Gasse:
Design methodologies for reliability of SSL LED boards. Microelectron. Reliab. 53(8): 1076-1083 (2013) - [j15]B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko, Robert J. Werkhoven, Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, T. Van Weelden, P. Bancken:
Thermal resistance investigations on new leadframe-based LED packages and boards. Microelectron. Reliab. 53(8): 1084-1094 (2013) - 2012
- [j14]Viorel Banu, Philippe Godignon, Xavier Perpiñà, Xavier Jordà, José Millán:
Enhanced power cycling capability of SiC Schottky diodes using press pack contacts. Microelectron. Reliab. 52(9-10): 2250-2255 (2012) - [j13]Xavier Perpiñà, Robert J. Werkhoven, Jiri Jakovenko, J. Formánek, Miquel Vellvehí, Xavier Jordà, Jos M. G. Kunen, Peter Bancken, Pieter Jan Bolt:
Design for reliability of solid state lighting systems. Microelectron. Reliab. 52(9-10): 2294-2300 (2012) - [j12]Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà:
Thermal cycling analysis of high temperature die-attach materials. Microelectron. Reliab. 52(9-10): 2314-2320 (2012) - [j11]Ignasi Cortés, Xavier Perpiñà, Jesús Urresti, Xavier Jordà, José Rebollo:
Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling. Microelectron. Reliab. 52(9-10): 2471-2476 (2012) - [c1]Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà:
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC 2012: 1-8 - 2011
- [j10]Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti:
SiC Schottky Diodes for Harsh Environment Space Applications. IEEE Trans. Ind. Electron. 58(7): 2582-2590 (2011) - [j9]Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet:
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Trans. Ind. Electron. 58(7): 2662-2672 (2011) - [j8]Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, José Rebollo, Michel Mermet-Guyennet:
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions. IEEE Trans. Ind. Electron. 58(7): 2706-2714 (2011)
2000 – 2009
- 2008
- [j7]X. Perpiñà, Jean-François Serviere, Xavier Jordà, A. Fauquet, Salvador Hidalgo, Jesús Urresti-Ibañez, José Rebollo, Michel Mermet-Guyennet:
IGBT module failure analysis in railway applications. Microelectron. Reliab. 48(8-9): 1427-1431 (2008) - 2007
- [j6]Michel Mermet-Guyennet, X. Perpiñà, M. Piton:
Revisiting power cycling test for better life-time prediction in traction. Microelectron. Reliab. 47(9-11): 1690-1695 (2007) - [j5]X. Perpiñà, M. Piton, Michel Mermet-Guyennet, Xavier Jordà, José Millán:
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles. Microelectron. Reliab. 47(9-11): 1701-1706 (2007) - [j4]T. Lhommeau, Xavier Perpiñà, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama:
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications. Microelectron. Reliab. 47(9-11): 1779-1783 (2007) - [j3]X. Perpiñà, Alberto Castellazzi, M. Piton, Michel Mermet-Guyennet, José Millán:
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. Microelectron. Reliab. 47(9-11): 1784-1789 (2007) - 2006
- [j2]X. Perpiñà, Jean-François Serviere, J. Saiz, Davide Barlini, Michel Mermet-Guyennet, José Millán:
Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectron. Reliab. 46(9-11): 1834-1839 (2006) - 2004
- [j1]Xavier Perpiñà, Xavier Jordà, N. Mestres, Miquel Vellvehí, Philippe Godignon, José Millán:
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. Microelectron. J. 35(10): 841-847 (2004)
Coauthor Index
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