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Article | |
Report number | arXiv:2311.02021 |
Title | CMS ECAL VFE design, production and testing |
Author(s) | Lustermann, W. (Zurich, ETH) ; Abadjiev, D. (Northeastern U.) ; Dissertori, G. (Zurich, ETH) ; Dejardin, M. (IRFU, Saclay) ; Gadek, T. (Zurich, ETH) ; Martin, L.T. (Northeastern U.) ; Stachon, K. (Zurich, ETH) |
Collaboration | CMS Collaboration |
Publication | 2024-05-17 |
Imprint | 2023-11-03 |
Number of pages | 7 |
In: | JINST 19 (2024) C05034 |
In: | Topical Workshop on Electronics for Particle Physics 2023 (TWEPP 2023), Geremeas, Sardinia, Italy, 1 - 6 Oct 2023, pp.C05034 |
DOI | 10.1088/1748-0221/19/05/C05034 |
Subject category | hep-ex ; Particle Physics - Experiment ; physics.ins-det ; Detectors and Experimental Techniques |
Accelerator/Facility, Experiment | CERN LHC ; CMS |
Abstract | Maintaining the required performance of the CMS electromagnetic calorimeter (ECAL) barrel at the High-Luminosity Large Hadron Collider (HL-LHC) requires the replacement of the entire on-detector electronics. 12240 new very front end (VFE) cards will amplify and digitize the signals of 62100 lead-tungstate crystals instrumented with avalanche photodiodes. The VFE cards host five channels of CATIA pre-amplifier ASICs followed by LiTE-DTU ASICs, which digitize signals with 160MS/s and 12bit resolution. We present the strategy and infrastructure developed for achieving the required reliability of less than 0.5% failing channels over the expected lifetime of 20 years. This includes the choice of standards, design for reliability and manufacturing, as well as factory acceptance tests, reception testing, environmental stress screening and calibration of the VFE cards. |
Copyright/License | preprint: (License: arXiv nonexclusive-distrib 1.0) publication: © 2024-2025 The Author(s) (License: CC-BY-4.0) |