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2023 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator
/ Ferraro, Rudy (CERN) ; Gkountoumis, Panagiotis (CERN) ; Foucard, Gilles (CERN) ; Ventura, Antonio (CERN) ; Scialdone, Antonio (CERN ; Montpellier U.) ; Zimmaro, Alessandro (CERN ; Montpellier U.) ; Glecer, Bruno (CERN) ; Koseoglou, Sokratis (CERN) ; Botias, Cai Arcos (CERN) ; Masi, Alessandro (CERN) et al.
The sensitivity of a variety of components for particle accelerator electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital, and mixed devices..
2023 - 8 p.
- Published in : 10.1109/REDW61050.2023.10265814
In : 2023 IEEE Radiation Effects Data Workshop (REDW 2023): (in conjunction with 2023 NSREC), Kansas City, Missouri, United States, 24 - 28 Jul 2023
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2.
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Testing and Validation Methodology for a Radiation Monitoring System for Electronics in Particle Accelerators
/ Zimmaro, Alessandro (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Boch, Jerome (IES, Montpellier) ; Saigne, Frederic (IES, Montpellier) ; Garcia Alia, Ruben (CERN) ; Brucoli, Matteo (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
In this work, a methodology for the design and validation of a radiation monitoring (RadMON) system for electronic systems in particle accelerators is presented. The methodology expands the common radiation hardness assurance (RHA) procedure implemented at CERN, including new steps dedicated to both system-level testing, focused on a wireless device, and sensors characterization and readout validation. [...]
2022 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1642-1650
Fulltext: PDF;
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3.
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Impact of flux selection, pulsed beams and operation mode on system failure observability during radiation qualification
/ Zimmaro, Alessandro (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Boch, Jérôme (IES, Montpellier) ; Saigné, Frédéric (IES, Montpellier) ; García Alía, Rubén (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
Systems and Systems on Chip (SoCs) under radiation can have complex failure modes with different probabilities. [...]
2022. - 8 p.
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4.
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Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
/ Tsiligiannis, G (CERN ; IES, Montpellier) ; Debarge, C (Unlisted, FR) ; Le Mauff, J (Unlisted, FR) ; Masi, A (CERN) ; Danzeca, S (CERN)
In search of alternative solutions for Field Programmable Gate Arrays (FPGA) that can withstand the higher dose levels foreseen in the upcoming upgrades of the Large Hadron Collider (LHC), a new Radiation Hardened FPGA is targeted. More specifically, in this work, the effects of proton induced radiation on a 65nm Rad Hard SRAM-Based FPGA are investigated, while applying tailored tests for each resource of the FPGA. [...]
2019 - 8 p.
- Published in : 10.1109/radecs47380.2019.9745713
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2019), 16 - 20 Sep 2019, Montpellier, France
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5.
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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
/ Danzeca, S (CERN) ; Peronnard, P (CERN) ; Foucard, G (CERN) ; Tsiligiannis, G (CERN) ; Secondo, R (IES, Montpellier) ; Ferraro, R (IES, Montpellier) ; McAllister, C G (CERN) ; Borel, T (IES, Montpellier) ; Brugger, M (CERN) ; Masi, A (CERN) et al.
Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices..
2017 - 6 p.
- Published in : 10.1109/NSREC.2017.8115434
In : 2017 IEEE Radiation Effects Data Workshop, New Orleans, LA, USA, 17 - 21 Jul 2017
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6.
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Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF Metrics
/ Scialdone, Antonio (CERN ; LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Ferraro, Rudy (cern) ; Dilillo, Luigi (LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Saigne, Frederic (Montpellier U. ; CNRS, France) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
This article describes how to analyze radiation-induced effects using traditional radio-frequency (RF) metrics in RF integrated circuits (RFICs) to be used in the implementation of software-defined radios (SDRs). The impacts of total ionizing dose (TID) and single-event effects (SEEs) on the device characteristics are shown and their consequences for an SDR are discussed. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.2068-2075
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7.
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2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
/ Danzeca, Salvatore (CERN) ; Foucard, G (CERN) ; Tsiligiannis, G (CERN) ; Ferraro, R (CERN ; Montpellier U.) ; Piscopo, G (CERN) ; McAllister, C G (CERN) ; Borel, T (CERN) ; Peronnard, P (CERN) ; Brugger, M (CERN) ; Masi, A (CERN) et al.
The sensitivity of a variety of components for particle accelerators electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital and mixed devices..
2018 - 6 p.
- Published in : 10.1109/NSREC.2018.8584266
In : 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584266
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8.
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The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions
/ Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
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Using Software Mitigation Schemes to improve the availability of IoT applications in harsh radiation environment
/ Zimmaro, A (CERN ; IES, Montpellier) ; Ferraro, R (CERN) ; Boch, J (IES, Montpellier) ; Saigne, F (IES, Montpellier) ; Masi, A (CERN) ; Danzeca, S (CERN)
The integration of IoT infrastructure in the context of particle accelerators promises numerous benefits (reduced costs and maintenance time, increased deployment). However, the use of microcontroller units (MCUs), typical of IoT systems, can potentially compromise future accelerator availability performances. [...]
2024 - 7 p.
- Published in : JINST 19 (2024) C02059
Fulltext: PDF;
In : Topical Workshop on Electronics for Particle Physics 2023 (TWEPP 2023), Geremeas, Sardinia, Italy, 1 - 6 Oct 2023, pp.C02059
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10.
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CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications
/ Scialdone, A (CERN ; IES, Montpellier) ; Gkountoumis, P (CERN ; UC, Irvine) ; Ferraro, R (CERN) ; Barros Marin, M (CERN) ; Dilillo, L (IES, Montpellier) ; Saigne, F (IES, Montpellier) ; Boch, J (IES, Montpellier) ; Danzeca, S (CERN) ; Masi, A (CERN)
The CHARM Radiation Tolerant FPGA Tester Board (CRaTeBo) isa FPGA testing platform for the CERN High-energy Accelerator (CHARM)irradiation facility. It is meant to ease the radiation testing ofFPGA-based systems by providing users with a radiation-tolerantcarrier card featuring an FPGA interface, a high-speed communicationinterface, a flexible power supply, and an HPC-FMC connector foradditional front-end electronics. [...]
2024 - 11 p.
- Published in : JINST 19 (2024) P01012
Fulltext: PDF;
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