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ATLAS Note
Report number	ATL-INDET-PROC-2011-031
Title	ATLAS ABCD Hybrid Fatal Charge Dosage Test
Author(s)	Kuhl, A (UC, Santa Cruz) ; Fadeyev, V (UC, Santa Cruz) ; Grillo, A A (UC, Santa Cruz) ; Martinez-McKinney, F (UC, Santa Cruz) ; Nielsen, J (UC, Santa Cruz) ; Spencer, E (UC, Santa Cruz) ; Wilder, M (UC, Santa Cruz)
Collaboration	for the ATLAS collaboration
Publication	2011
Imprint	15 Nov 2011
Number of pages	7
In:	JINST 6 (2011) C12021
In:	Topical Workshop on Electronics for Particle Physics, Vienna, Austria, 26 - 30 Sep 2011, pp.C12021
DOI	10.1088/1748-0221/6/12/C12021
Subject category	Detectors and Experimental Techniques
Accelerator/Facility, Experiment	CERN LHC ; ATLAS
Free keywords	Front-end electronics for detector readout ; Radiation-hard electronics ; Digital electronic circuits
Abstract	The Semi-Conductor Tracker (SCT) in the ATLAS experiment at the Large Hadron Collider (LHC) could be subject to various beam loss scenarios. If a severe beam loss event were to occur, it would be beneficial to know how SCT components would be affected. In the SCT detector modules, a key component is the ABCD application specific integrated circuit (ASIC), the onboard readout electronics of the system. This ASIC has design specifications that it should withstand a 5 nC charge application within 25 ns, which is the period of the LHC bunch crossing. The first test performed is designed to test this limit, reaching a maximum of 10 nC deposited in 25 ns. One model for beam loss predicts that a large charge, of the order of 106 MIPS, could be incident on the detector. According to detector studies, this causes a local field breakdown between the backplane of the sensor, held at 450 V, and the strips. In this case the signal seen on the readout strip has a rise time of about 1 μs due to a charge screening effect. A second test is designed to test this discharge scenario, with a maximum of 90 nC deposited in 1 μs.
Copyright/License	Publication: (License: CC-BY-3.0)

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