4 LECT SQC Variables
4 LECT SQC Variables
QUALITY CONTROL
For Variables
Courtesy: Dr. Pravin Kumar
Introduction
• Control charting is one of the tools of Statistical Quality Control (SQC).
• It is the most technically sophisticated tool of SQC. Dr. Walter A. Shewhart (1920)
of the Bell Telephone Labs developed it as a statistical tool to the study of
manufacturing process variation for the purpose of improving the economic
effectiveness of the process.
• These methods are based on continuous monitoring of process variation.
X j R1 R2 ... Rg R j
X 1 X 2 ... X g j 1 R
j 1
X g g
g g
UCLX X z X X 3 X X A2 R
LCLX X z X X 3 X X A2 R
3 ' 3
Here, 3 X .R A2 R
n d2 n
X
j 1
Xd R R
j 1
d
X0 ; R0
g gd g gd
R0
UCLX X 0 A 0 X 0 A
d2
R0
LCLX X 0 A 0 X 0 A
d2
and UCLR D2 0
LCLR D1 0
Where the value of A, D1 , and D2 are the factors which will be take from Statistical Table Appendix.
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X-bar and R Chart
(Cont…)
R
g
X 1 X 2 ... X g
X j
990 R1 R2 ... Rg j
211
j 1
X
j 1
41.25; R 8.79
g g 24 g g 24
X Xd
990 65 50 34 51
j 1
X0 39.5
g gd 20
g
R R d
211 30
j 1
R0 10.73
g gd 23
R0 10.73
UCLX X 0 A 0 X 0 A 39.5 1.5 47.316
d2 2.059
R0 10.73
LCLX X 0 A 0 X 0 A 39.5 1.5 31.683
d2 2.059
10.73
and UCLR D2 0 4.698 24.482
2.059
10.73
LCLR D1 0 0 0
2.059
2
n n
n X i X i
2
S j i 1 i 1
n n 1
g
X
j 1
j
X 1 X 2 ... X n
X ; where X j ; j
g n
g 2
n
n n
S n X X i X X
2
j i i
S
j 1
; Where S j i 1 i 1 i 1
; j
g n n 1 n 1
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UCLX X A3 S ; LCLX X A3 S
UCLS B4 S ; LCLC B3 S
g g
X
j 1
Xd S S
j 1
d
S0
X0 ; S0 ; 0
g gd g gd c4
UCLX X 0 A 0 ; LCLX X 0 A 0
UCLS B6 0 ; LCLS B5 0
Example 2: Find the control limits for X-bar and S chart from
the data given in Example 1.
Subgroup No X1 X2 X3 X4 s
1 36 41 46 37 40 4.546061
2 34 36 34 40 36 2.828427
3 68 59 69 64 65 4.546061
4 44 40 38 34 39 4.163332
5 34 43 41 42 40 4.082483
6 46 41 41 44 43 2.44949
7 36 38 41 33 37 3.366502
8 51 49 52 48 50 1.825742
9 42 36 43 47 42 4.546061
10 39 38 38 41 39 1.414214
11 41 37 37 37 38 2
12 47 35 40 38 40 5.09902
13 45 42 38 39 41 3.162278
14 43 45 50 42 45 3.559026
15 39 29 35 33 34 4.163332
16 34 29 40 41 36 5.597619
17 58 28 44 38 42 12.54326
18 38 37 32 33 35 2.94392
19 48 45 55 56 51 5.354126
20 45 37 40 38 40 3.559026
21 35 40 42 39 39 2.94392
22 39 36 39 42 39 2.44949
23 35 38 36 43 38 3.559026
24 43 44 38 39 41 2.94392
X 1 X 2 ... X g X j
990
j 1
X 41.25
g g 24
S 93.624
j 1
S0 3.901
g 24
UCLX X A3 S 41.25 1.628 3.901 47.6
LCLX X A3 S 41.25 1.628 3.901 34.899
UCLS B4 S 2.266 3.901
LCLs B3 S 0 3.901 0
X Xd
990 65 50 34 51
S S d
93.624 12.543
39.5;
j 1 j 1
X0 S0 3.252
g gd 20 g gd 23
S0 3.252
0 3.75
c4 0.94
UCLX X 0 A 0 39.5 1.5 3.75 45.125; LCLX X 0 A 0 39.5 1.5 3.75 33.875
UCLS B6 0 2.088 3.75 7.83; LCLS B5 0 0 3.75 0
X W W W . X
2
a
g W W
2 2
g W . X W X
b Slope of line
g W W
2 2
W = Subgroup numbers
represents the horizontal line
a = Intercepts of vertical axis
X - X -
z
X
n
S=
S S
=
g 20
• Estimate the population standard deviation, S
• Process capability is equal to 6 σ0 =
c4
0
• Capability Index,
U L
Cp ;
6 0
where C p is capability index,U-L is tolerance,
and 6σ 0 is process capability.
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Example 23.3: Using the data provided in Example 1, find
the process capability index. The upper and lower specific
index is given as 50 mm and 30 mm.
S 3.90
σ0 = 4.23
c 4 0.9213
U L 50 30
Cp 0.788
6 0 6 4.23
i.e. U L 6 0