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SPC Training Content

Statistical Process Control (SPC) is a method for measuring and controlling quality by monitoring manufacturing processes, developed by William A. Shewhart in 1924. It emphasizes continuous improvement and prevention-based quality controls, allowing operators to detect trends before they lead to defects. Key tools include control charts that help visualize process variations and capability indices like Cp and Cpk to assess process performance.
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100% found this document useful (1 vote)
19 views

SPC Training Content

Statistical Process Control (SPC) is a method for measuring and controlling quality by monitoring manufacturing processes, developed by William A. Shewhart in 1924. It emphasizes continuous improvement and prevention-based quality controls, allowing operators to detect trends before they lead to defects. Key tools include control charts that help visualize process variations and capability indices like Cp and Cpk to assess process performance.
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© © All Rights Reserved
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Download as PPTX, PDF, TXT or read online on Scribd
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(Statistical Process

Control)
SPC

Present By:- Aakash


Chaudhary
(Statistical Process Control)
SPC

What is
SPC…???
(Statistical Process Control)
SPC
» Introduction to Statistical Process
Control (SPC)
Statistical Process Control (SPC) is not new to industry. In
1924, a man at Bell Laboratories developed the control chart
and the concept that a process could be in statistical control.
His name was William A. Shewhart. He eventually published
a book titled “Statistical Method from the Viewpoint of
Quality Control” (1939). The SPC process gained wide usage
during World War II by the military in the munitions and
weapons facilities. The demand for product had forced them
to look for a better and more efficient way to monitor product
quality without compromising safety. SPC filled that need.
The use of SPC techniques in America faded following the
war. It was then picked up by the Japanese manufacturing
companies where it is still used today. In the 1970s, SPC
(Statistical Process Control)
SPC
» What is Statistical Process Control
(SPC)
SPC is method of measuring and controlling quality by
monitoring the manufacturing process. Quality data is
collected in the form of product or process measurements or
readings from various machines or instrumentation. The
data is collected and used to evaluate, monitor and control a
process. SPC is an effective method to drive continuous
improvement. By monitoring and controlling a process, we
can assure that it operates at its fullest potential. One of the
most comprehensive and valuable resources of information
regarding SPC is the manual published by the Automotive
Industry Action Group (AIAG).
(Statistical Process Control)
SPC
» Why Use Statistical Process
Control (SPC)companies today are facing ever increasing
Manufacturing
competition. At the same time raw material costs continue to
increase. These are factors that companies, for the most
part, cannot control. prevention-based companies must
concentrate on what they can control: their processes.
Companies must strive for continuous improvement in
quality, efficiency and cost reduction. Many companies still
rely only on inspection after production to detect quality
issues. The SPC process is implemented to move a company
from detection based to prevention-based quality controls.
By monitoring the performance of a process in real time the
operator can detect trends or changes in the process before
they result in non-conforming product and scrap.
(Statistical Process Control)
SPC
» How to Use Statistical Process
Control (SPC)
Data would then be collected and monitored on these key or
critical characteristics.
>Collecting and Recording Data:-
SPC data is collected in the form of measurements of a product
dimension / feature or process instrumentation readings. The data is
then recorded and tracked on various types of control charts, based on
the type of
Variable data being collected.
data:-
•Individual – Moving Range chart: to be used if your data is individual
values
•Xbar – R chart: to be used if you are recording data in sub-groups of 8 or
less
•Xbar – S chart: to be used if your sub-group size is greater than 8
Attribute data:-
•P chart – For recording the number of defective parts in a group of parts
(Statistical Process Control)
SPC

Formul
a:-
(Statistical Process Control)
SPC
» X-Bar - R Chart Example:-
The following is an example of how control limits are computed for
an x-bar and R chart. The subgroup sample size used in the following
example is three.
(Statistical Process Control)
SPC
» Control Chart:-
The control chart is a graph used to study how a process
changes over time. A control chart always has a central line
for the average, an upper line for the upper control limit, and
a lower line for the lower control limit. The control limits are
±3σ from the centerline.
Selection of an appropriate control chart is very important in
control charts mapping, otherwise ended up with inaccurate
control limits for the data.
X̅ and R charts are used for measurable quantities such as
length, weight, and height. Attribute control charts are used
for attribute data. In other words, the data that counts the
number of defective items or the number of defects per unit.
(Statistical Process Control)
SPC
» Control Chart:-
(Statistical Process Control)
SPC
» Control Chart:-
• Discrete Data:- Discrete data is a type of quantitative data that
includes non-divisible figures and statistics you can count. You
typically write discrete data points as numbers that represent exact
values. You can often describe discrete data by using the phrase "the
number of," such as the number of customers in a store. Discrete
data usually represents single events that have already
occurred. When reviewing discrete data, you can analyze
exact figures like units sold on a specific day or the hours an
employee worked during a certain week.
• Continuous Data:- Continuous data is a type of quantitative data
that represents precise measurements of nearly any numeric value.
Often, a continuous data variable has many decimal points because
it's an exact measurement between two defined points. Measuring
this type of data is common in industries requiring specific
(Statistical Process Control)
SPC
» Control Chart:-
• Defect:- It means not meeting a specific requirement
or the specification or failing to achieve a specific
customer/client CTQ. A product could have multiple
defects. Some of these defects might not even be
noticeable by the client. These defects do not
functionally affect the performance of the product, still
these are defects because it does not meet the
specification requirement of the producer. If the
measurement being plotted is the number of defects,
then you use c-chart or u-chart. The number of defects
follow the Poisson Distribution.

• Defective:- A product or service that has one or more


defects and it is not suitable for use. In other words, a
product or service is defective if the defect(s) existing
(Statistical Process Control)
SPC
» Control Chart:-
Example to select an appropriate
attribute chart
(Statistical Process Control)
SPC
» Analyzing the SPC Data:-
The data points recorded on a control chart should fall between the
control limits, provided that only common causes and no special
causes have been identified. Common causes will fall between the
control limits whereas special causes are generally outliers or are
Common cause
outside of the variation
control limits.are as follows:-
• Variation in material properties within specification
• Seasonal changes in ambient temperature or humidity
• Normal machine or tooling wear
• Variability in operator-controlled settings or Normal measurement
variation
Special cause variation are as follows:-
• Failed controllers or Improper equipment adjustments
• A change in the measurement system or A process shift
• Machine malfunction or Raw material properties out of design
specifications
• Broken tool, punch, bit, etc.
(Statistical Process Control)
SPC
Non acceptance condition of SPC.
1st :- If one or more points falls outside of the upper control limit (UCL), or lower 2nd:-If two out of three successive points fall in the area that is beyond two
control limit (LCL). standard deviations from the mean, either above or below

3rd:- If four out of five successive points fall in the area that is beyond one 4th :- 8 consecutive points on both side of center line , none in C zone
standard deviation from the mean, either above or below

Special
cause
variatio
n 5th :- If 15 points in a row fall within the area on either side of the mean that is 6th :- If there is a run of six or more points that are all either successively higher
one standard deviation from the mean or successively lower

7th:- If Nine or more points fall on either side of the mean 8th :- 14 consecutive points alternating up & down.
(Statistical Process Control) SPC

» Cp (Process Capability):-
Cp is measure how well the data might fit b/w the specification
limit, also it’s don’t consider the process is centered with in the
limit.
» Cpk (Process Capability Index):-
Cpk is measure to show how many standard deviation specification
limit (Control Specification limit) are from the center of process.
» Cpk (Process Capability Index) v/s Ppk (Process
Performance Index):-
> Ppk tells us how process has performed in the past, you can't use
it to predict the future because the process is not in state of control.
(Statistical Process Control) SPC
Normal Distribution Diagram:- Bell Curve
Question Session…..??

Thank You for Listening

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