SPC Training - Slides
SPC Training - Slides
PROCESS
CONTROL
TRAINING TOPICS
Introduction.
Types of Variation.
“Process In Control” and “Process Out of Control”.
Advantages of Statistical Process Control.
SPC Charts.
Process Capability Analysis.
Methods of finding out process capability.
Use Process Capability to ensure Process Quality.
STATISTICAL
DEFINATION
▶ For Eg:
The diameter of a pen is expected by
its manufacturer not as 7mm but as 7mm ± 0.05.
▶x-bar charts
It is used to monitor the changes in the mean of
a process (central tendencies).
▶R-bar charts
It is used to monitor the dispersion or variability of
the process
C ontrol C harts for A ttributes
•Ishikawa diagrams
•Designed experiments
•Pareto charts
• Reduces waste
•Cost reduction
•Customer satisfaction
SPC CHARTS
1) Data Points:
Either averages of subgroup measurements or
individual measurements plotted on the x/y axis and
joined by a line. Time is always on the x-axis.
U SL LSL
C p
6
4
E xample
9
F igure (a)
0
Cp 1
5
F igure (b)
1
Cp 1
5
F igure (c)
2
Cp 1
5
3
Process capability 5
ratio 5
(off centering
▶ There is a possibility that the process
mean may shift over a period of time, in
process)
either direction, i.e., towards the USL or
the LSL. This may result in more
defective items then the expected. This
shift of the process mean is called the
off-centering of the process.
USL LS L
C m in ,
p k 3 3
5
E xample
6
▶ Process 1 5 .9
mean:
0 .4
C p 1
6 ( 0 .0 6 7 )
5
7
US LSL
C ,
pk L 3 3
min
Design
Specificatio
ns
(b) Design
specifications and
natural variation the
same; process is
capable of meeting
specifications most of
the time.
Process
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Process Capability (cont.)
Design
Specificatio
ns
(c) Design
specifications
greater than natural
variation; process is
capable of always
conforming to
specifications.
Process
Design
Specificatio
ns
(d) Specifications
greater than natural
variation, but
process off center;
capable but some
output will not meet
upper
specification. Process
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Nomenclature
Four indices:
– Cp: process capability index
– Cpk: minimum process capability index
– Pp: process performance index
– Ppk: minimum process performance index
(USL LSL)
C
p
6SD
Mean LSL
Cpkl
3SD
USL Mean
Cpku
3SD
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A Perfectly Centered Process…
USL
LSL
When the process is not centered, or deliberately run off-center for economic
reasons, or only a single specification limit is involved, Cpk should be used.
50
Cpk, Sigma Value, and PPM
Area under Non conforming parts per million (ppm)
Sigma normal Capability
Cpk distribution
Valu curve (%)* Unilateral specification Bilateral specification* Rating**
e Value
52
QUESTION
US LSL
C ,
pk L 3 3
min
C min
152.25 145.4 , 145.4
pk
137.75
3(1.42)
C pk 3(1.42)
CpK = 1.607
Sigma Level = 4
QUESTION
Product X is compressed on three different
compression machines with following data.
US LSL
C ,
pk L 3 3
min
US LSL
C ,
pk L 3 3
min
US LSL
C ,
pk L 3 3
min
Consider not only process mean & variability but also in relation
to the specification
No additional testing is required since batch release data is
available per current regulation
A simple and powerful indicator to ensure product quality and
process robustness.
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