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    Analytical and Instrumentation Techniques: Topic: Scanning Electron Microscope

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    Nivin prasanth
    The document discusses the scanning electron microscope (SEM). It provides a brief history of the SEM's development starting in the 1930s. It then describes the basic components of the SEM, including the electron gun, condenser lenses, objective aperture, scanning coils, electron detectors, and vacuum system. The document compares the SEM to the transmission electron microscope (TEM) and discusses some advantages and disadvantages of the SEM, such as its ability to provide detailed 3D images but large size and high cost.

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    Analytical and Instrumentation Techniques: Topic: Scanning Electron Microscope

    Uploaded by

    Nivin prasanth
    25 views14 pages
    The document discusses the scanning electron microscope (SEM). It provides a brief history of the SEM's development starting in the 1930s. It then describes the basic components of the SEM, including the electron gun, condenser lenses, objective aperture, scanning coils, electron detectors, and vacuum system. The document compares the SEM to the transmission electron microscope (TEM) and discusses some advantages and disadvantages of the SEM, such as its ability to provide detailed 3D images but large size and high cost.

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    The document discusses the scanning electron microscope (SEM). It provides a brief history of the SEM's development starting in the 1930s. It then describes the basic components of the SEM, including the electron gun, condenser lenses, objective aperture, scanning coils, electron detectors, and vacuum system. The document compares the SEM to the transmission electron microscope (TEM) and discusses some advantages and disadvantages of the SEM, such as its ability to provide detailed 3D images but large size and high cost.

    Copyright:

    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
    Download as pptx, pdf, or txt
    25 views14 pages

    Analytical and Instrumentation Techniques: Topic: Scanning Electron Microscope

    Uploaded by

    Nivin prasanth
    The document discusses the scanning electron microscope (SEM). It provides a brief history of the SEM's development starting in the 1930s. It then describes the basic components of the SEM, including the electron gun, condenser lenses, objective aperture, scanning coils, electron detectors, and vacuum system. The document compares the SEM to the transmission electron microscope (TEM) and discusses some advantages and disadvantages of the SEM, such as its ability to provide detailed 3D images but large size and high cost.

    Copyright:

    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
    Download as pptx, pdf, or txt
    of 14

    ANALYTICAL AND INSTRUMENTATION

    TECHNIQUES
    TOPIC : SCANNING ELECTRON MICROSCOPE
    (SEM)
    Presentation by: R.TAMILKAVIYAN

    I st M. Sc., APPLIED GEOLOGY


    CONTENTS

     INTRODUCTION
     CONSTRUCTION
     SEM Vs TEM
     ADVANTAGES
     DISADVANTAGES
    INTRODUCTION

     The development of a SEM began a few years after the invention of


    a TEM by Ruska in 1931.
     But the commercialisation of the SEM required about 30 years
     The original prototype of the SEM, was made by Knoll in 1935
    (Germany) which scans the specimen with an electron beam to
    obtain an image.
     Here, specimen irradiated with an 100 micro diameter electron
    beam and an absorbed current image was taken from the system.
     In 1938, Von Ardenne (Germany) developed SEM that was
    incorporated with a demagnifying lens system.
     It is also called Scanning Transmission Electron Microscope
    (STEM) because it is used for thin film specimens.
     Here, the image obtained was directly recorded on a photographic
    film placed below the specimen.
     The image was not visible until developing the photographic film
    and this model was not used for observing bulk specimen.
    CONSTRUCTION
    Basic components
     Electron gun (Filament)
     Condenser lenses
     Objective Aperture
     Scanning coils
     Electron Detectors
     Vaccum system
    Condenser lenses, Aperture
    And scanning coil
    Electron Detectors
    SEM Vs TEM
    (TRANSMITTED ELECTRON
    MICROSCOPE) TEM
    ADVANTAGES
     Advantages of a Scanning Electron Microscope include its wide-array
    of applications, the detailed three-dimensional and topographical
    imaging and the versatile information garnered from different detectors.
     SEMS are also easy to operate with the proper training and advances in
    computer technology and associated software make operation user-
    friendly.
     Although all samples must be prepared before placed in the vacuum
    chamber, most SEM samples require minimal preparation actions.
    DISADVANTAGES

     The disadvantages of a Scanning Electron Microscope start with the size and cost.
     SEMS are expensive, large and must be housed in an area free of any possible
    electric, magnetic or vibration interference.
     Maintenance involves keeping a steady voltage, currents to electromagnetic coils
    and circulation of cool water.
     SEMS are limited to solid, inorganic samples small enough to fit inside the
    vacuum chamber that can handle moderate vacuum pressure .
    Thank you

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