Fundamentals of VLSI Chip Design

Download as ppt, pdf, or txt
Download as ppt, pdf, or txt
You are on page 1of 26

CSCE 613: Fundamentals of VLSI Chip Design

Instructor: Jason D. Bakos


Topics for this Lecture
• Semiconductor theory in a nutshell
• MOSFET devices as switches
• Transistor-level logic
• Logic gates
• IC fabrication
• SCMOS design rules
• Cell libraries

Fund. of VLSI Chip Design 2


Elements

Fund. of VLSI Chip Design 3


Semiconductors
• Silicon is a group IV element (4 valence electrons, shells: 2, 8, 18, …)
– Forms covalent bonds with four neighbor atoms (3D cubic crystal lattice)
– Si is a poor conductor, but conduction characteristics may be altered
– Add impurities/dopants (replaces silicon atom in lattice):
• Makes a better conductor
• Group V element (phosphorus/arsenic) => 5 valence electrons
– Leaves an electron free => n-type semiconductor (electrons, negative carriers)
• Group III element (boron) => 3 valence electrons
– Borrows an electron from neighbor => p-type semiconductor (holes, positive carriers)

+- +-
+ + ++ + + --- ---
P-N junction + + ++ + + --- ---

forward bias
reverse bias

Fund. of VLSI Chip Design 4


MOSFETs
• Diodes not very useful for building logic
• Metal-oxide-semiconductor structures built onto substrate
– Diffusion: Inject dopants into substrate
– Oxidation: Form layer of SiO2 (glass)
– Deposition and etching: Add aluminum/copper wires
negative
positive voltage voltage (rel.
(Vdd) to body)
(GND)

NMOS/NFET ---
PMOS/PFET
+++
--- +++
current current

body/bulk channel body/bulk


shorter length,
GROUND faster transistor HIGH
(dist. for electrons) (S/D to body is
reverse-biased)

Fund. of VLSI Chip Design 5


FETs as Switches
• NFETs and PFETs can act as switches
CMOS
logic

bulk
node not
shown

pull-up pull-up
OFF ON

pull-down Z 1
OFF (floating)

pull-down 0 smokin’!
ON

CMOS: assuming PU and


PN network are perfect
switches and switch
simultanously, no current flow
“and structure” “or structure”
and no power consumption!

Fund. of VLSI Chip Design 6


Logic Gates
• CMOS: complimentary in form and function
• NMOS devices (positive logic) form pull-down inv
network
• PMOS devices (negative logic) form pull-up YA
network
• Implication: CMOS transistor-level logic gates
implement functions where may the inputs are
inverted (inverting gates)
• Add inverter at inputs/outputs to create non-
inverting gate

NOR2
NAND2
NAND3 Y  A B
Y  A B Y  A B

Y  A B
DeMorgan’s Law

A B  A  B

Fund. of VLSI Chip Design 7


Compound Gates
• Combine parallel and series structures to form
compound gates
  
Y  A B C  D
– Example:   
Y  A B C  D

– Use DeMorgan’s law to determine complement (pull- Y  A  B  C  D


Y   A  B  C  D
down network):

C Y   A  B   C   D

A B D
Y
A C

Fund. of VLSI Chip Design 8


Pass Transistors/Transmission Gates
• NMOS passes strong 0 (pull-down)
• PMOS passes strong 1 (pull-up)

Pass transistor: Transmission gate:

Fund. of VLSI Chip Design 9


Tristates

Fund. of VLSI Chip Design 10


Multiplexer

Transmission gate multiplexer

Inverting multiplexer

Fund. of VLSI Chip Design 11


Multiplexer

4-input multiplexer

Fund. of VLSI Chip Design 12


Latches

Positive level-sensitive latch

Fund. of VLSI Chip Design 13


Latches

Positive edge-sensitive latch

Fund. of VLSI Chip Design 14


IC Fabrication
• Inverter cross-section

field oxide

Fund. of VLSI Chip Design 15


IC Fabrication
• Inverter cross-section with well and substrate contacts

(ohmic contact)

Fund. of VLSI Chip Design 16


IC Fabrication
• Chips are fabricated using set of masks
– Photolithography
• Inverter uses 6 layers:
– n-well, poly, n+ diffusion, p+ diffusion,
contact, metal

• Basic steps
– oxidize
– apply photoresist
– remove photoresist with mask
– HF acid eats oxide but not photoresist
– pirana acid eats photoresist

– ion implantation (diffusion, wells)


– vapor deposition (poly)
– plasma etching (metal)

Fund. of VLSI Chip Design 17


IC Fabrication

Furnace used to oxidize (900-1200 C)

Mask exposes photoresist to light,


allowing removal
HF acid etch

piranha acid etch

diffusion (gas) or ion implantation


(electric field)

HF acid etch

Fund. of VLSI Chip Design 18


IC Fabrication
Heavy doped poly is grown with gas in
furnace (chemical vapor deposition)

Masked used to pattern poly

Poly is not affected by ion implantation

Fund. of VLSI Chip Design 19


IC Fabrication

Metal is sputtered
(with vapor) and
plasma etched from
mask

Fund. of VLSI Chip Design 20


Layout Design Rules
• Design rules define ranges for features
– Examples:
• min. wire widths to avoid breaks
• min. spacings to avoid shorts
• minimum overlaps to ensure complete overlaps
– Measured in microns
– Required for resolution/tolerances of masks

• Fabrication processes defined by minimum channel width


– Also minimum width of poly traces
– Defines “how fast” a fabrication process is

• Lambda-based (scalable CMOS) design rules define scalable rules based on


 (which is half of the minimum channel length)
– classes of MOSIS SCMOS rules: SUBMICRON, DEEP SUBMICRON

Fund. of VLSI Chip Design 21


Layout Design Rules

Fund. of VLSI Chip Design 22


Layout Design Rules
• Transistor dimensions are in W/L ratio
– NFETs are usually twice the width
– PFETs are usually twice the width of NFETs
• Holes move more slowly than electrons (must be wider to deliver same
current)

Fund. of VLSI Chip Design 23


Layout

3-input NAND

Fund. of VLSI Chip Design 24


Design Flow
• Design flow is a sequence of steps for design and
verification
• In this course:
– Describe behaviors with VHDL/Verilog code
– Simulate behavioral designs
– Synthesize behaviors into cell-level netlists
– Simulate netlists with cell-delay models
– Place-and-route netlists into a physical design
– Simulate netlists with cell-delay models and wire-delay models
• Need to define a cell library:
– Function
– Electrical characteristics of each cell
– Layout

Fund. of VLSI Chip Design 25


Cell Library (Snap Together)

Layout

Fund. of VLSI Chip Design 26

You might also like