Synchronous Lecture Notes Week 5 Tutorial - Updated 18-2-21
Synchronous Lecture Notes Week 5 Tutorial - Updated 18-2-21
D = Defects/cm2
A = Area cm2:
Note: Area and defect values are related to cm2
Eg
• If D = 1.5/cm2,
IC dimensions 11mm x 12mm = 1.1 x1.2 = 1.32 cm2
1
Dr. P.J. Mather
NHE2483 Digital Systems Integration
A
P
Stuck-at-Fault Cout Full Adder B
Sout
A B Cin P G X Cout
100
A B C P G x Cout %
s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-a-t
0 0 0
0 0 0 0
0 0 1
0 0 0 0
0 1 0
1 0 0 0
0 1 1 1 0 1 1
1 0 0
1 0 1
1 0 0 0
1 1 0
1 0 1 1
1 1 1
0 1 0 1
0 1 0 1
Dr. P.J. Mather
2
NHE2483 Digital Systems Integration
A
P
Stuck-at-Fault Sout Full Adder B
Sout
A B Cin P G X Sout
100
A B C P G x Sout %
s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-a-t
0 0 0
0 0 0 0
0 0 1
0 0 0 1
0 1 0
1 0 0 1
0 1 1 1 0 1 0
1
1
0
0
0
1
1 0 0 1
1 1 0
1 0 1 0
1 1 1
0 1 0 0
0 1 0 1
Dr. P.J. Mather
3
NHE2483 Digital Systems Integration
A
P
Sout
B
Stuck-at-Fault Cout & Sout Full G
Adder X
Cout
Cin
A B C P G x
Cout
100%
s-a-t
s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1 s-0 s-1
0 0 0
0 0 0 0 0
0 0 1
0 0 0 0 1
0 1 0
1 0 0 0 1
0 1 1
1 0 1 1 0
1 0 0
1 0 0 0 1
1 0
1 0 1
1 0 1
1 1 0
0 1 0 1 0
0 1 0 1 1
1 1 1 4
Dr. P.J. Mather
NHE2483 Digital Systems Integration
Example Question
An Automatic Test Equipment (ATE) manufacturing test device is
used to test a section of a digital ASIC containing 30 input pins, 18
internal memory devices and 10,000 logic gates. The ASIC
contains no embedded Design For Test (DFT) structures. The ATE
costs £2 M plus 256 digital test pins costing £15 k, each with linear
depreciation over 4 years: annual operating and maintenance costs
are £0.5 M.
i) If the ATE is operated 24hrs a day for 330 days per year
estimate the cost per second of running the equipment.
ii) If the ATE equipment, used to test the ASIC is running at 100
MHz, calculate the time required and thus cost to test the above
ASIC using exhaustive functional or structural test techniques.
Example Solution