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SKF Microlog Advisor Pro Training Presentation

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0% found this document useful (0 votes)
177 views36 pages

SKF Microlog Advisor Pro Training Presentation

skf

Uploaded by

Adham Elbrawy
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
You are on page 1/ 36

© Schenck Process 2012

SKF Microlog Advisor Pro (CMXA 45)


(Firmware V4.01)
TABLE OF CONTENTS

1 The Equipment

2 SKF Microlog Advisor Pro Start-up, Functions and Basic Setup

3 Test Settings Explained

4 Bump Test Setup

5 Other Analyser Functions


© Schenck Process 2012

6 Questions?

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3
© Schenck Process 2012

THE EQUIPMENT
THE EQUIPMENT

Coaxial Cables

CMSS2200
Accelerometer

T-Piece
Connector
© Schenck Process 2012

SKF Microlog
Advisor Pro
(CMXA 45)

4
SKF MICROLOG ADVISOR PRO (CMXA 45)

• Multi-function stand alone


vibration analyser
• Firmware V4.01 Indicator Lights
• 2 Simultaneous Channels
• Voice recorder
• SD card

Enter Buttons

Function Buttons

Navigation Buttons
Power Button
Alpha/Numeric
Keypad
© Schenck Process 2012

Shift Button

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SKF CMSS2200 ACCELEROMETERS

Axis of Acceleration CMSS2200 Accelerometer


• Uniaxial Measurement
• ICP – Integrated Circuit
Piezoelectric (also known as
IEPE).
• High impedance charge signal
converted to Low Impedance
voltage signal – good for long
cables in dirty environments.
• Require a DC voltage source from Magnetic Base
DAQ device
• Magnetic base for easy
attachment.
© Schenck Process 2012

Compression Shear
Accelerometer Accelerometer
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“TEEING” TWO ACCELEROMETERS TOGETHER

• Used for modal testing


• 2 input signals combine – amplify signal
when in modal resonance Accelerometer Accelerometer
• Can be done post data acquisition without 1 2
“teeing”??????
• Rigid body bounce
• Using only 1 accelerometer?

To Microlog
Data
© Schenck Process 2012

Logger

7
SINGLE DECK MODAL TEST ACCELEROMETER
PLACEMENT AND ORIENTATION

Single Double
Deck Deck
Screen Screen
© Schenck Process 2012

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SKF MICROLOG ADVISOR PRO START-
UP, FUNCTIONS AND BASIC SETUP
© Schenck Process 2012

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© Schenck Process 2012

MAIN MENU
INITIAL MICROLOG SETUP

Route Memory – Card/Internal


Input Range – Auto/Fixed
Trigger – User/Automatic
Module ICP – Sensor setting/on/off

Check settings are


correct
© Schenck Process 2012

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© Schenck Process 2012

MAIN MENU
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© Schenck Process 2012

ANALYSER MENU
BUMP TEST MENU

Shift
Button

BUMP TEST BASIC BUMP TEST


SETTINGS SCREEN COMPLETE SETTINGS
SHOT SCREEN SHOT
“EXPAND” SCREEN
SHOT
© Schenck Process 2012

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TEST SETTINGS EXPLAINED
© Schenck Process 2012

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FILTERING

• High Pass Filter – any frequency below the specified frequency will not be analysed
(recorded)
• Eliminate low frequency signal
• Decrease processing time??
• 2Hz vs 10Hz (600 RPM)? Try 2 and if there isn’t a natural frequency below 10 Hz set
filter at 10 Hz?
© Schenck Process 2012

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LOG VS LINEAR SCALE
Linear Scale
• Linear scale better
represents the true
magnitude of data
– Increments of a
constant value

(Same Data)
Log Scale
• Log scale emphasises the
changes at low
magnitudes by
representing the data
© Schenck Process 2012

more as a ratio.
– Increments of an
order of magnitude

17
WHAT IS FFT WINDOWING?

 • FFT (Fast Fourier Transform) – converts time domain signal to frequency domain
signal.
• FFT – efficient when number of data points is , N=1,2,3…

• The Formula:

• FFT is calculated from fixed blocks of data samples – assumes data is periodic

• Combining blocks of non-periodic data introduces “Leakage”

• Windowing reduces leakage and conditions the results.


© Schenck Process 2012

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WHY WINDOW’S?

Periodic sine wave Non-Periodic sine wave Windowed sine wave (Hanning)
© Schenck Process 2012

Source: “Understanding FFT Windows”, Application note AN014, LDS


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WINDOWING EXAMPLE

Frequency response from a bump test of a beam


© Schenck Process 2012

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Source: “Understanding FFT Windows”, Application note AN014, LDS


CHOOSING THE RIGHT WINDOW

(Rectangular)
© Schenck Process 2012

Source: “Understanding FFT Windows”, Application note AN014, LDS


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WHAT THE WINDOWS LOOK LIKE
© Schenck Process 2012

Source: “Understanding FFT Windows”, Application note AN014, LDS


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MAIN LOBES AND SIDE LOBES

Flat Top Window

Hanning Window
© Schenck Process 2012

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FLAT TOP VS HANNING WINDOWS
© Schenck Process 2012

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Source: “Understanding FFT Windows”, Application note AN014, LDS


OVERLAP PROCESSING

• Shortens acquisition time


− Particularly effective for low
frequency tests (<50Hz)
• Recovers lost data from windowing
• Reduces noise
© Schenck Process 2012

Source: “Understanding FFT


Windows”, Application note AN014,
25

LDS
AVERAGING

• Improves the accuracy and repeatability of measurements


• RMS (Root Mean Square)
• weighted mean of the sum of the squared magnitudes:
• Peak Hold
• not averaging, new spectral magnitudes compared to previous data
• if magnitude is larger, the new magnitude is recorded.
• Exponential
• Weighs new data more than old data (N = number of averages)
• New Average = (New Spectrum • 1/N) + (Old Average) • (N−1)/N

• Average “grows” for first 5N spectra until steady state values reached.
• Once in steady-state, changes in spectra only detected if they last sufficiently
© Schenck Process 2012

long
• Too many averages will eliminate changes that might be important

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© Schenck Process 2012

BUMP TEST SETUP


BUMP TEST SETUP – (2 “TEE’D” CMSS2200
ACCELEROMETERS IN CH1)
• Channels – Ch1 or Ch1 & Ch2
• Sensor – Selection or variable
• Sensitivity – default for variable is 100mV/g
• ICP- On/Off
• View signal – spectrum, time ..?
• Y-axis units – Accel G, Accel m/s/s, Vel m/s, Disp mil,
time etc NEED NEW SCREEN
• X-axis units – Hz/CPM
SHOT!
• Filter – none, 2Hz, 10Hz, etc
• Freq. Range – alpha/numeric (user input)
• Display Y-axis – Linear/Log (dB)
• Detection – Peak, Peak-Peak, RMS
• Lines – 400, 800 etc
• Avg. Type – PkHold/Exponential/RMS
• Averages – alpha/numeric (user input)
© Schenck Process 2012

• Num. Averages – alpha/numeric (user input)


• Overlap – alpha/numeric (user input)
• Window – Rect/Hanning/Hamming/Flat Top
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RUNNING THE BUMP TEST

• Wait for Indicator lights to go green.


• Bump the screen
• Numerous bumps for better sample
• Stop when done

NEED NEW SCREEN


SHOT!
Only 1 channel
© Schenck Process 2012

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AFTER DATA IS ACQUIRED

• Arrow keys move cursor through the data


• Press 7 to find peaks
• Press 4 for harmonic cursor
• Press Save to save data

NEED NEW SCREEN


SHOT!
Complete bump test
© Schenck Process 2012

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SAVING

• Internal/card memory
• Press save
• Input name (default is the date and time)
• Press OK
• Returned to Analyser menu
© Schenck Process 2012

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OTHER ANALYSER FUNCTIONS
© Schenck Process 2012

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RECALL

• Do the same test again


• Start – go straight to data acquisition
• Setup - change settings
© Schenck Process 2012

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REVIEW & OPEN PREVIOUS DATA/SETUPS

• Open Previous tests to view results/start new test with the same setup
• Open Saved setups
© Schenck Process 2012

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© Schenck Process 2012

QUESTIONS?
THANK YOU VERY MUCH.
© Schenck Process 2012

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