EE518 - Epitaxial Dep.S07
EE518 - Epitaxial Dep.S07
EE518 - Epitaxial Dep.S07
Daniel Lentz
EE 518
Penn State University
March 29, 2007
Instructor: Dr. J. Ruzyllo
Outline
Introduction
Mechanism of epitaxial growth
http://www.bnl.gov/nsls2/sciOps/chemSci/growth.asp
Vapor Phase Epitaxy
Specific form of chemical vapor deposition (CVD)
Reactants introduced as gases
Material to be deposited bound to ligands
Ligands dissociate, allowing desired chemistry to
reach surface
Some desorption, but most adsorbed atoms find
proper crystallographic position
Example: Deposition of silicon
SiCl4 introduced with hydrogen
Forms silicon and HCl gas
Alternatively, SiHCl3, SiH2Cl2
SiH4 breaks via thermal decomposition
Precursors for VPE
Must be sufficiently volatile to allow
acceptable growth rates
Heating to desired T must result in pyrolysis
Less hazardous chemicals preferable
Arsine highly toxic; use t-butyl arsine instead
VPE techniques distinguished by precursors
used
Varieties of VPE
Chloride VPE
Chlorides of group III and V elements
Hydride VPE
Chlorides of group III element
Group III hydrides desirable, but too unstable
Hydrides of group V element
Organometallic VPE
Organometallic group III compound
Hydride or organometallic of group V element
Not quite that simple
Combinations of ligands in order to optimize
deposition or improve compound stability
Ex. trimethylaminealane gives less carbon
contamination than trimethylalluminum
http://upload.wikimedia.org/wikipedia/en/thumb/e/e5/Trimethylaluminum.png/100px-Trimethylaluminum.png,
http://pubs.acs.org/cgi-bin/abstract.cgi/jpchax/1995/99/i01/f-pdf/f_j100001a033.pdf?sessid=6006l3
Other Methods
Liquid Phase Epitaxy Fast, inexpensive
Reactants are dissolved in Not ideal for large area
a molten solvent at high layers or abrupt interfaces
temperature Thermodynamic driving
Substrate dipped into force relatively very low
solution while the Molecular Beam Epitaxy
temperature is held
Very promising technique
constant
Elemental vapor phase
Example: SiGe on Si
method
Bismuth used as solvent
Beams created by
Temperature held at
evaporating solid source in
800°C
UHV
High quality layer
Doping of Epitaxial Layers
Incorporate dopants during deposition
Theoretically abrupt dopant distribution
Add impurities to gas during deposition
Arsine, phosphine, and diborane common
Low thermal budget results
High T treatment results in diffusion of dopant into
substrate
Reason abrupt distribution not perfect
Properties of Epitaxial Layer
Crystallographic structure of film reproduces that of
substrate
Substrate defects reproduced in epi layer
Electrical parameters of epi layer independent of
substrate
Dopant concentration of substrate cannot be reduced
Epitaxial layer with less dopant can be deposited
Epitaxial layer can be chemically purer than
substrate
Abrupt interfaces with appropriate methods
Applications
Engineered wafers
Clean, flat layer on top of
less ideal Si substrate
On top of SOI structures
Ex.: Silicon on sapphire
Higher purity layer on lower
quality substrate (SiC)
In CMOS structures
Layers of different doping
Ex. p- layer on top of p+
substrate to avoid latch-up
More applications
Bipolar Transistor
Needed to produce
buried layer
http://www.search.com/reference/Bipolar_junction_transistor
III-V Devices
Interface quality key
Heterojunction Bipolar
Transistor
LED
Laser
http://www.veeco.com/library/elements/images/hbt.jpg
Summary
Deposition continues crystal structure
Creates clean, abrupt interfaces and high
quality surfaces
High temperature, clean surface required
Vapor phase epitaxy a major method of
deposition
Epitaxial layers used in highest quality wafers
Very important in III-V semiconductor
production
References
P. O. Hansson, J. H. Werner, L. Tapfer, L. P. Tilly, and E. Bauser, Journal of Applied
Physics, 68 (5), 2158-2163 (1990).
G. B. Stringfellow, Journal of Crystal Growth, 115, 1-11 (1991).
S. M. Gates, Journal of Physical Chemistry, 96, 10439-10443 (1992).
C. Chatillon and J. Emery, Journal of Crystal Growth, 129, 312-320 (1993).
M. A. Herman, Thin Solid Films, 267, 1-14 (1995).
D. L. Harame et al, IEEE Transactions on Electron Devices, 42 (3), 455-468 (1995).
G. H. Gilmer, H. Huang, and C. Roland, Computational Materials Science, 12, 354-380
(1998).
B. Ferrand, B. Chambaz, and M. Couchaud, Optical Materials, 11, 101-114 (1999).
R. C. Cammarata, K. Sieradzki, and F. Spaepen, Journal of Applied Physics, 87 (3),
1227-1234 (2000).
R. C. Jaeger, Introduction to Microelectronic Fabrication, 141-148 (2002).
R. C. Cammarata and K. Sieradzki, Journal of Applied Mechanics, 69, 415-418 (2002).
A. N. Larsen, Materials Science in Semiconductor Processing, 9, 454-459 (2006).