Scanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM)
2
General AFM
“Beam Deflection” Detection
A Solid State
B Laser Diode
1 2 3
Hooke’s Law
k = the cantilever
F = -kx spring constant
x= the vertical
displacement of the
end of the cantilever.
AFM Tips
4. Parts of AFM
15
Piezoelectric transducers
16
Force transducers
18
Scanning Modes
There are different imaging modes of AFM
Contact Mode
Non Contact Mode
Tapping Mode
19
Different modes of operation
OU NanoLab/NSF
NUE/Bumm & Johnson
Example of contact mode
28
Tapping mode
29
Non- contact mode
30