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Modeling Surface Variations For Flexible Assemblies: by Shrinivas Soman Unigraphics Solutions

1) The document discusses modeling surface variations for flexible assemblies. It describes analyzing mean assembly force and force variance using an equivalent stiffness matrix. 2) Functional surface characterization relates surface topography to tolerance analysis by characterizing profiles and discarding short wavelengths. It characterizes populations using mean profiles and average autospectrums to compute covariance. 3) Data acquisition, separation of random/non-random variations, and statistical characterization are described. Sampling issues like aliasing, leakage, and filtration that affect frequency representation are also covered.

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0% found this document useful (0 votes)
65 views18 pages

Modeling Surface Variations For Flexible Assemblies: by Shrinivas Soman Unigraphics Solutions

1) The document discusses modeling surface variations for flexible assemblies. It describes analyzing mean assembly force and force variance using an equivalent stiffness matrix. 2) Functional surface characterization relates surface topography to tolerance analysis by characterizing profiles and discarding short wavelengths. It characterizes populations using mean profiles and average autospectrums to compute covariance. 3) Data acquisition, separation of random/non-random variations, and statistical characterization are described. Sampling issues like aliasing, leakage, and filtration that affect frequency representation are also covered.

Uploaded by

palani
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PPT, PDF, TXT or read online on Scribd
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Modeling Surface Variations

For
Flexible Assemblies

by

Shrinivas Soman
Unigraphics Solutions

1
Analysis of Flexible Assemblies

Mean Assembly Force

{F} = [Keq]{ 0}

Assembly Force Variance

[ F] = [Keq][ 0][Keq]T

2
Functional Surface Characterization

• Relates Surface Topography to Tolerance Analysis


• Characterizes Profile of the Surface
• Discards Short Wavlength Variations
• Characterizes a Population of Surfaces using Two Functions -
– Mean Profile
– Average Autospectrum
• Computes Covariance using Average Autospectrum

3
Functional Surface Characterization Procedure

• Data Acquisition
• Part Set-up, Fixture Design
• Establishment of Coordinate System
• Sampling Issues - Alias, Frequency, Filtration,
Leakage
• Data Analysis
• Separation of Random and Non-random Variations
• Statistical Characterization of Random Variations
• Computing Autocorrelation (Covariance)

4
Sampling Issues
Alias in Frequency -
• Sampling rate must be higher than twice the highest frequency
Profile represented by sinusoid frequency of 10 Profile Sampling by sampling frequency of 100 and 12
1 1

0.8 0.8

0.6 0.6

0.4 0.4

0.2 0.2

profile height
profile height

0 0

-0.2 -0.2

-0.4 -0.4

-0.6
-0.6

-0.8
-0.8
-1
-1 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
spatial distance
spatial distance

5
Effect of Alias in Frequency
-3
x 10
4

3.5

3
Fs = 32
2.5
amplitude, inch

2
Fs = 128
1.5
Fs = 512
1

0.5

0
0 5 10 15 20 25
spatial frequency, cycles/profile length

• Frequency Alias limits the number of data points in a part length.


• Number of data points describing surface variations may not be
equal to number of nodes in the Finite Element Model.

6
Leakage and Frequency Filtration

Figure 4.7A Waveform with f=105cycles/unit length


1

0.5
• Leakage -
waveformheight

0
Frequencies which are not multiples of
-0.5 fundamental frequency, leak into
-1
adjacent frequencies.
0 0.02 0.04 0.06 0.08 0.1
spatial distance

Figure 4.7B Frequency Spectrum


0.8

• Frequency Filtration -
0.6

Finite tip of stylus acts as a low pass


amplitude

0.4
filter.
0.2

0
0 20 40 60 80 100 120 140
spatial frequency, cyles/unit length

7
Profiles Records in Spatial Distance Domain

0.665

0.66

0.655

Profile height
0.65

profile height, inch


0.645

0.64

0.635

0.63

0.625

0.62

0.615
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
spatial distance, inch

Spatial distance

8
Profile Records After Removal of Non-characteristic
Variations
x 10 -3

Profile height
Z Stylus

prof ile height


Leg Height

Surface to be Characterized
Plane of Scanning -5

(0,0) Y
-10

-15
0 0.5 1 1. 5 2 2.5 3 3.5 4 4.5 5
s patial dis tanc e
Spatial distance

9
Mean Surface Profile
-3
x 10 Mean Profile
6

2
Profile height

0
profile height

-2

-4

-6

-8

-10

-12
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
spatial distance
Spatial distance

10
Random Variations, FFT’s and Autospectra
x 10-3 RandomVariations x 10-3 FFTs x 10-8 Autospectra
5
5

0 5

-5
0 0
0
x 10-3 2 4 0x 10-3 10 20 0x 10-8 10 20
5
5

0 5

-5
0 0
0
x 10-3 2 4 0x 10-3 10 20 0x 10-8 10 20
5
5

0 5

-5
0 0
0
x 10-3 2 4 0x 10-3 10 20 0x 10-8 10 20
5
5

0 5

-5
0 0
0
x 10-3 2 4 0x 10-3 10 20 0x 10-8 10 20
5
5

0 5

-5
0 0
0
x 10-3 2 4 0x 10-3 10 20 0x 10-8 10 20
5
5

0 5

-5
0 0
0 2 4 0 10 20 0 10 20

11
Average Autospectrum and Spatial Frequency
Classification
LONG WAVELENGTH REGION
MEDIUM WAVELENGTH REGION
x 10
-8
SHORT WAVELENGTH
Average Autospectrum REGION
3.5

2.5
autospectrum

1.5

0.5

0
0 5 10 15 20 25
spatial frequency

12
Stationary Process and Autocorrelation

(x )

(x)

(x )

n
• Autocorrelation Function R yy (x1, d) = (1 / n)  YK(x1) YK(x1 + d)
k=1
• For Stationary Process, R yy (x1, d) = R yy (x2, d) = R yy (x1, d) = -------= R yy (xi, d)

• Averaging the Autospectrum averages variations across


the population.
• Stationarity assumption averages the variations along
the surface.

13
Circular and Zero Padded Autocorrelation

Autocorrelation Profile Length

Circular

Zero Padded
Biased

Zero Padded Scale Zero Padded Biased


Unbiased

14
Autocorrelation for Population of Surface Profiles
x 10-6
6

4
circular AC
2
zero padded biased AC
0
Autocorrelation

-2

-4

-6
unbiased AC
-8

-10

-12
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
spatial distance

15
Removing Effect of Long Wavelengths
x 10-3 Profiles x 10-3 Polynomial Curves x 10-3 Random Variations
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4
x 10-3 x 10-3 x 10-3
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4
x 10-3 x 10-3 x 10-3
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4
x 10-3 x 10-3 x 10-3
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4
x 10-3 x 10-3 x 10-3
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4
x 10-3 x 10-3 x 10-3
2
5 5

0
0 0

-5 -5 -2
0 2 4 0 2 4 0 2 4

16
Improved Autocorrelation
x 10-8
6

circular AC
4

zero padded AC
2
Autocorrelation Function

-2

-4

unbiased AC
-6

-8
0 1 2 3 4 5 6
spatial distance

17
Conclusion

• Spectrum Model is suitable for surfaces having dominant medium


wavelengths.

• Long wavelengths distort Spectrum Model.

• Polynomial Curves for removing long wavelengths?

18

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