Control Chart

Quality Control Kelas A

Statistika FMIPA Unpad

Source : John Wiley & Sons, Inc. Applied Statitstics and Probability for
Engineers, by Montgomery and Runger

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 Introduction
Statistical Process Control (SPC) is a powerful collection of
problem-solving tools useful in achieving process stability and
improving capability through the reduction of variability.
Its seven major tools are :
1. Histogram or stem-and-leaf plot
2. Check sheet
3. Pareto chart
4. Cause-and-effect diagram
5. Defect concentration diagram
6. Scatter diagram
7. Control chart
These tools, often called the magnificent seven. The concept
was evolved by Walter A. Shewhart of the Bell Telephone
Laboratories, in 1920.

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 Explanation of Control Chart

Of the seven tools, the Shewhart control chart is probably the most technically
sophisticated. Certainly is not new, but its use in modern-day business and
industry is of tremendous value.

It may not be possible to completely eliminate variability, but the control chart
is an effective tool in reducing variability as much as possible. The control
chart is an on-line process-monitoring technique widely used for this purpose.

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
State at Page 15, 29, 54

Control charts are among the most important management control tools; they are as
important as cost controls and material controls. Techniques such as control charts can
be used to monitor the process output and detect when changes in the inputs are
required to bring the process back to an in control state.

Control charts also used in the control step of DMAIC (Define, Measure, Analyze,
Improve, and Control); many process control plans involve control charts on critical
process metrics.

Modern computer technology has made it easy to implement control charts in any type
of process, as data collection and analysis can be performed on a microcomputer or a
local area network terminal in real-time, on-line at the work center.

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

A process that is operating with only

chance causes of variation present is said
to be in statistical control.
A process that is operating in the presence
of assignable causes is said to be out of
control.
The eventual goal of SPC is the elimination
of variability in the process.
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

A typical control chart has control limits set at values
such that if the process is in control, nearly all points
will lie within the upper control limit (UCL) and the
lower control limit (LCL).

Figure 15-1 A typical control chart.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

Figure 15-2 Process

improvement using the
control chart.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 Model of Control Chart

where,
L = distance of the control limit from the center line
w = mean of some sample statistic (w)
w = standard deviation of some statistic (w)

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

Important uses of the control chart
1. Most processes do not operate in a state of statistical
control
2. Consequently, the routine and attentive use of control
charts will identify assignable causes. If these causes
can be eliminated from the process, variability will be
reduced and the process will be improved
3. The control chart only detects assignable causes.
Management, operator, and engineering action will be
necessary to eliminate the assignable causes.
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

Types of control charts
Variables Control Charts
These charts are applied to data that follow a
continuous distribution.
Attributes Control Charts
These charts are applied to data that follow a
discrete distribution.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.1 Basic Principles

Popularity of control charts

1) Control charts are a proven technique for improving

productivity.
2) Control charts are effective in defect prevention.
3) Control charts prevent unnecessary process adjustment.
4) Control charts provide diagnostic information.
5) Control charts provide information about process
capability.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
1. Control charts are a proven technique for improving productivity.
A successful control chart program will reduce scrap and rework, which are the
primary productivity killers in any operation. If you reduce scrap and rework, then
productivity increases, cost decreases, and production capacity (measured in the
number of good parts per hour) increases.
2. Control charts are effective in defect prevention.
The control chart helps keep the process in control, which is consistent with the do
it right the first time philosophy. It is never cheaper to sort out good units from
bad units later on than it is to build it right initially.

3. Control charts prevent unnecessary process adjustment.

A control chart can distinguish between background noise and abnormal variation;
no other device including a human operator is as effective in making this distinction.
In other words, the control chart is consistent with the if it isnt broken, dont fix it
philosophy.

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
4. Control charts provide diagnostic information.
Frequently, the pattern of points on the control chart will contain information of
diagnostic value to an experienced operator or engineer. This information allows
the implementation of a change in the process that improves its performance.
5. Control charts provide information about process capability.
The control chart provides information about the value of important process
parameters and their stability over time. This allows an estimate of process capability
to be made. This information is of tremendous use to product and process designers.

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.2 Design of a Control Chart

Suppose we have a process that we assume the true

process mean is = 74 and the process standard
deviation is = 0.01. Samples of size 5 are taken
giving a standard deviation of the sample average,
is
0.01
x 0.0045
n 5

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.2 Design of a Control Chart

Control limits can be set at 3 standard
deviations from the mean in both directions.
3-Sigma Control Limits
UCL = 74 + 3(0.0045) = 74.0135
CL= 74
LCL = 74 - 3(0.0045) = 73.9865

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.2 Design of a Control Chart

Figure 15-3 X-bar control chart for piston ring diameter.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.2 Design of a Control Chart

Choosing the control limits is equivalent to

setting up the critical region for hypothesis
testing

H0: = 74
H1: 74

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.3 Rational Subgrouping

Subgroups or samples should be selected

so that if assignable causes are present, the
chance for differences between subgroups
will be maximized, while the chance for
differences due to these assignable causes
within a subgroup will be minimized.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.3 Rational Subgrouping

Constructing Rational Subgroups
Select consecutive units of production.
Provides a snapshot of the process.
Good at detecting process shifts.
Select a random sample over the entire sampling
interval.
Good at detecting if a mean has shifted
out-of-control and then back in-control.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Look for runs - this is a sequence of

observations of the same type (all above the
center line, or all below the center line)
Runs of say 8 observations or more could
indicate an out-of-control situation.
Run up: a series of observations are increasing
Run down: a series of observations are decreasing

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Figure 15-4 X-bar control chart.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Figure 15-5 An X-bar chart with a cyclic pattern.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Figure 15-6 (a) Variability with the cyclic pattern. (b) Variability with the cyclic pattern
eliminated. 23
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Western Electric Handbook Rules

A process is considered out of control if any of the
following occur:
1) One point plots outside the 3-sigma control limits.
2) Two out of three consecutive points plot beyond the 2-
sigma warning limits.
3) Four out of five consecutive points plot at a distance of
1-sigma or beyond from the center line.
4) Eight consecutive points plot on one side of the center
line.
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-2: Introduction to Control Charts

15-2.4 Analysis of Patterns on Control Charts

Figure 15-7 The Western Electric zone rules. 25

John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

3-sigma control limits:

The grand mean:

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

The average range:

An unbiased estimator of :

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

x Control Chart (from R ):

R Chart:

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

3-sigma control limits for S:

An unbiased estimator of :

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

S Chart:

x Control Chart (from S ):

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 32
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

Figure 15-8 and RXcontrol

charts for vane opening.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

Figure 15-9 The S control chart for vane opening.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts

Example 15-1

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-3: X-bar and R or S Control Charts
Example 15-1

Figure 15-10
The X-bar
and R control charts
for vane opening.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-4: Control Charts for Individual Measurements

What if you could not get a sample size greater than 1

(n =1)? Examples include
Automated inspection and measurement technology
is used, and every unit manufactured is analyzed.
The production rate is very slow, and it is
inconvenient to allow samples sizes of N > 1 to
accumulate before analysis
Repeat measurements on the process differ only
because of laboratory or analysis error, as in many
chemical processes.
The individual control charts are useful for samples of
sizes n = 1. 40
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-4: Control Charts for Individual Measurements

The moving range (MR) is defined as the

absolute difference between two successive
observations:
MRi = |xi - xi-1|
which will indicate possible shifts or
changes in the process from one observation
to the next.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-4: Control Charts for Individual Measurements

Individuals Control Chart

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-4: Control Charts for Individual Measurements

Interpretation of the Charts

X Charts can be interpreted similar to X-bar charts. MR charts cannot be
interpreted the same as X-bar or R charts.
Since the MR chart plots data that are correlated with one another, then
looking for patterns on the chart does not make sense.
MR chart cannot really supply useful information about process variability.
More emphasis should be placed on interpretation of the X chart.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Process capability refers to the performance of

the process when it is operating in control.
Two graphical tools are helpful in assessing
process capability:
Tolerance chart (or tier chart)
Histogram

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Tolerance Chart

Figure 16-12 Tolerance diagram of

vane openings.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Histogram

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Figure 15-13 Histogram for vane openings.
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Process Capability Ratio

PCRk

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Figure 15-14 Process Fallout and

the process capability ratio
(PCR).

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Example 15-3

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-5: Process Capability

Figure 15-15 Mean of a six-sigma process shifts by 1.5 standard deviations.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

15-6.1 P Chart (Control Chart for Proportions)

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-4

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-4

Figure 15-16 P chart for a ceramic substrate.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-4

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

15-6.2 U Chart (Control Chart for Defects per Unit)

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-5

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-5

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-6: Attribute Control Charts

Example 15-5

Figure 15-17 U chart of defects per unit on printed circuit boards.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-7: Control Chart Performance

Average Run Length

The average run length (ARL) is a very important
way of determining the appropriate sample size
and sampling frequency.
Let p = probability that any point exceeds the
control limits. Then,

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-7: Control Chart Performance

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
15-7: Control Chart Performance

Figure 15-18 Process mean shift of 2.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.1 Cumulative Sum Control Chart

The cusum chart incorporates all information in
the sequence of sample values by plotting the
cumulative sums of the deviations of the sample
values from a target value.
xj
If 0 is the target for the process mean, is the
average of the jth sample, then the cumulative
sum control chart is formed by plotting the
quantity
i
Si ( X j 0 )
j 1
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 63
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

Figure 15-19 Plot of the

cumulative sum for the
concentration data, Table
15-7.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

Figure 15-20 The cumulative sum control chart. (a) The V-mask and scaling. (b) The cumulative
sum control chart in operation.
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.1 Cumulative Sum Control Chart

CUSUM Control Chart

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

Example 15-6

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 68
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

Example 15-6

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

Example 15-6

Figure 15-21 The CUSUM

status chart for Example
15-6.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.2 Exponential Weighted Moving Average

Control Chart

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.2 Exponential Weighted Moving Average

Control Chart

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.2 Exponential Weighted Moving Average

Control Chart

Figure 15-22 EWMAs with =0.8 and =0.2 show a compromise between a smooth curve
and a response to a shift
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.2 Exponential Weighted Moving Average

Control Chart
EWMA Control Chart

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts
Example 15-7

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-8: Time-Weighted Charts

15-8.2 Exponential Weighted Moving Average

Control Chart

Figure 15-23 EWMA control chart for the Chemical Process Concentration Data from
Minitab.
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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-9: Other SPC Problem-Solving Tools

Pareto Diagram

Figure 15-24 Pareto

diagram for printed circuit
board defects.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-9: Other SPC Problem-Solving Tools

Cause-and-effect Diagram

Figure 15-25 Cause-and-effect diagram for the printed circuit board flow solder
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process.
John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-9: Other SPC Problem-Solving Tools

Defect Concentration Diagram

Figure 15-26 Defect concentration diagram for a printed circuit board.

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
 15-10: Implementing SPC

Strategic Management of Quality

Demings 14 points

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.
Important Terms & Concepts of Chapter 15
ARL Defects-per-unit chart PCR
Assignable causes Demings 14 points PCRk
Attributes control charts Exponentially-weighted Problem-solving tools
Average run length moving average Process capability
C chart control chart (EWMA) Process capability ratio
Cause-and-effect diagram False alarm Quality control
Center line Fraction-defective control R chart
chart
Chance causes Rational subgroup
Implementing SPC
Control chart Run rule
Individuals control chart
Control limits (X chart) S chart
Cumulative sum control Moving range Shewhart control chart
chart Six-sigma process
NP chart
Defect concentration Specification limits
diagram P chart
Pareto diagram

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John Wiley & Sons, Inc. Applied Statistics and Probability for Engineers, by Montgomery and Runger.