CMM Inspection Fundamentals
CMM Inspection Fundamentals
CMM Inspection Fundamentals
CMM inspection
fundamentals
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Measured values
Best fit circle
Maximum inscribed
(functional fit) circle
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Scanning
Ideal for controlling the form or profile
of known features that form functional
fits with other parts
Data capture speeds of up to 500
points per second
Incurs wear on the stylus
Scanning allows you to:
Determine the feature position
Accurately measure the feature size
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Scanning
Scanning a cylinder block
Typical scanning
routine, measuring
precision features
where form is critical to
performance
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Digitising
Ideal for capturing large amounts of data
about an unknown surface
Uses many of the same techniques as
scanning
Deflection vector of the probe is used to
determine the motion vector in which the
machine moves next
Digitised surface data can be:
Exported to CAD for reverse engineering
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Digitising
Re-manufacture and reverse engineering
Digitising a master part
to acquire an accurate
description of the
surface
Scanning cycle and
data analysis handled
by Tracecut software
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Digitising can be
performed on CMMs,
machine tools or
dedicated platforms like
Cyclone
Digitising provides large amounts of data
to define unknown contoured surfaces
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Ideal applications
Scanning
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Touch-trigger
Inspection of 3D prismatic
parts and known surfaces
Size and position process
control applications where
form variation is not
significant
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Touch-trigger
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Touch-trigger
Robust sensors
Easy programming
Simple to maintain
Cost-effective replacement for
lower lifetime costs
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Flexibility
Scanning
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Touch-trigger
Renishaw touch-trigger
probes are supported by a
wide range of heads and
accessories
long extension bars for easy
part access
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Why?
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Static errors
dominate at
low speed
Form error
2m
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Dynamic errors
dominate at
high speed
Form error
8m
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Error
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Speed
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Emax
S1
Speed
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Error
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Emax
S1
S2
Speed
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Fixed probes are best suited to applications where simple parts are to be measured
Ideal for flat parts where a single stylus can access all features
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Results:
Comment:
Indexing head repeatability has a similar effect on measurement accuracy to stylus changing repeatability
Result
X
Y
Z
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Span fixed
0.00063
0.00039
0.00045
Span index
0.00119
0.00161
0.00081
[Span]
0.00056
0.00122
0.00036
[Repeatability]
0.00034
0.00036
0.00014
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Therefore indexing repeatability typically has no negative impact on measurement results, but many benefits
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Rapid indexing during CMM positioning moves give
flexible access with no impact on cycle times
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PH10MQ in-quill
version of PH10
indexing head
reduces Z travel
requirements
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Fixed sensor
Articulating
head
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DANGER!
Possible collisions with:
component
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fixturing
stylus change rack
other styli in rack
machine structure
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Maximum stiffness
Minimum joints
Maximum ball size
Maximise the effective working length (EWL)
Test results:
TP200 repeatability with stylus length
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Stylus length
10mm
50mm
Uni-directional repeatability
0.30 m
0.40 m
2D form deviation
0.40 m
0.80 m
3D form deviation
0.65 m
1.00 m
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Stylus changing
Many probe systems now feature a
repeatable stylus module changer
access to features that demand long or
complex styli
different tips (sphere, disc, cylinder)
needed for special features
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increased throughput
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Rapid stylus changing with the passive
SCR600 stylus change rack
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Touch-trigger probe
ideal for discrete point inspection, for
size and position control
compact for easy access to deep
features
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Optical probes
ideal for pliable surfaces
inspection of printed circuit boards
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The solution
Automatic, no requalification,
easy programming
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automatic switching
automatic sensor recognition
automatic electrical connections
automatic alignment of sensor
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Quick and repeatable sensor changing for
maximum flexibility
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Passive sensors
Simple, compact mechanism
no motor drives
no locking mechanism
no tare system
no electromagnets
no electronic damping
Force
Typical scanning
deflection
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Deflection
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Active sensors
Complex, larger mechanism
force generators in each
axis
force is modulated but not
constant
Displacement
sensor
deflection varies as
necessary
Axis drive
force
generator
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Controlled
force range
Deflection
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Active scanning:
CMM moves around a predefined path
form errors accommodated
in the sensor
force variation is controlled
by probe motors
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Active force control does not significantly reduce force
variation in most scanning applications
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Compact
passive
sensor
Active sensors
contact force is controlled
by probe motor drive
large, fixed sensor
long, heavy styli
motors required to suspend
the stylus to avoid high
contact forces
Complex
active
sensor
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Active sensors
probe characteristics,
including stylus bending,
are calibrated
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Compact
passive
sensor
calibration of probe
mechanism characteristics
and stylus bending effects
at fixed force still required
Complex
active
sensor
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High deflection
when bending
Low deflection
in compression
90
180
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Active sensors
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Questions?
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