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SPC Basic

This document provides an overview of statistical process control (SPC) concepts and tools. It defines common cause and special cause variation, and explains how control charts can identify special causes. It discusses process capability metrics like Cpk and process types (variable and attribute). Different control chart types are introduced, including X-bar, R, p, and np charts. Guidelines for establishing control limits and identifying out of control points are provided. The document also distinguishes between defects and defective items.

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amy
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82 views

SPC Basic

This document provides an overview of statistical process control (SPC) concepts and tools. It defines common cause and special cause variation, and explains how control charts can identify special causes. It discusses process capability metrics like Cpk and process types (variable and attribute). Different control chart types are introduced, including X-bar, R, p, and np charts. Guidelines for establishing control limits and identifying out of control points are provided. The document also distinguishes between defects and defective items.

Uploaded by

amy
Copyright
© © All Rights Reserved
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
You are on page 1/ 24

SPC Statistical

Process Control
By: Amy Ee

Table of Contents
1.

Common cause & special cause

11. Defect vs Defective

2.

Troubleshoot

12. Moving Range

3.

Cpk

13. I Chart

4.

Lean vs Six Sigma

14. MR Chart

5.

Histogram

15. X Bar Chart

6.

Exercise

7.

Control Chart

16. R Chart

8.

Control Chart Data Types

9.

How do you establish Control


Limits

17. Types of Variation


18. Proportion Chart
19. Constant Proportion Chart

10. SPC Rules

20. More Cpk

11. Data Types

21. U Chart and C Chart

Common cause & special cause


Common cause is a natural part of the process.
Minor effect on the output (e.g. minor differences in raw
material, change in ambient temperature)
Special cause not normally present in the process.
Larger impact on process variation. Catastrophic result
(e.g. miscalibrated equipment, major raw material
differences, excursion caused by operator)
Special cause makes output difficult to predict
Control chart is used to point out the presence of special
cause variation

Troubleshoot
1. Special or common cause?
2. Action:
If common cause reduce it
If special cause eliminate it

CPK

http://www.isixsigma.com/tools-templates/capability-indices-process-capability/
process-capability-cp-cpk-and-process-performance-pp-ppk-what-difference/

In the Six Sigma quality methodology, process


performance is reported to the organization as a sigma
level. The higher the sigma level, the better the process
is performing.
Another way to report process capability and process
performance is through the statistical measurements
ofCp,Cpk,Pp, andPpk. Click on the link to view
definitions, interpretations and calculations
forCpkandPpkthough the use of forum quotations.
Process has to be STABLE before Cpk and Ppk being
calculated

Lean vs Six Sigma


Lean low hanging fruit
Six Sigma breakthrough (6 sigma variation)
Spec limit +- tolerance (process window)
Variation - range between +- tolerance

Histogram
Summary of variation in a set of data
Normal distribution bell curve, system leverage by
normal cases
Powerhouse distribution system leverage by extreme
cases
SKEW
Standard deviation = variation from average/mean
value
Low standard deviation = robust
High standard deviation = manufacture smaller
electronics part

Exercise
Special cause/common cause example
Common cause - minor differences in raw material
Special cause - miscalibrated equipment

What is variation deviation from standard result


Normal distribution how many % will hit +- 3 sigma:
99.73%

Control chart
A type of run chart
Average/Min/Target = X-bar
Spec limits upper & lower limit
Control limits upper & lower control limits (absolute < spec
limit)
Some control limit can be more than spec limit due to large
variation (cannot be used, control limit has to be < spec limit)
Spec
Control
limit
Average
limit
Control
Spec
limit
limit

Control Chart Data Types


In Range (Within control limit)
Outliers (Out of Control)
Shift (x or more in a row either above or below average)
Trend (x or more in a row either ascending or
descending)
STABLE if all within control limits

How do you establish Control Limits


1. When to monitor/collect data (time shifts by day,
hour, shift etc.)
2. If no past data, collect minimum 25 data points based
on IPC standards (if by shifts, 25 shifts)
Collect 3 subgroups per data point and plot the average
Remove out of control limit data due to special cause
Only release to production if process is stable (all data within
control limits)

3. Control limits = 3sigma

SPC Rules
1. Nelson Test for Special Causes

Data Type
Variable
Measureable
Type of chart: X bar-R, X bar-S, I-MR, X bar-MR

Attribute
Not measureable
Used to decide e.g. Yes/No, True/False
Type of chart: p chart, np chart, u chart, c chart

Defect vs Defective
Defects are the subset of defectives. There may be n
no. of defects to have one defective product.

Moving Range
Range = diff between upper and lower limit
Moving range = data difference (variation) in between
time (xn xn-1)
Useful for equipment monitoring

I Chart
20
15.7
15

10
5.4
5 3.4

13.04
9.9

8.9
7.4
3.1

4.2

5.3 4.8

5.2
2.1

3.4

6.6
4.3 4.7

2.5

5.2 4.9

3.2

3.8

4.8

6.1 6
3.5

4.2

6
5.00
3.1
1

2.3

0
-3.04

-5

Data

Average

UCL

LCL

MR Chart
14.00
11.50

12.00

10.40

9.88

10.00
8.00

6.506.80

6.00
4.00
2.00
2.00

5.104.90

4.90
2.70
1.10

2.70
1.80
1.30

3.70

3.40

3.10

2.50
1.50

0.50

5.00

1.40

0.40

1.10
0.30

0.00
-2.00

1.30
0.80
0.10

2.103.02
1.10
0.70

41915 41917 41919 41921 41923 41925 41927 41929 41931 41933 41935 41937 41939 41941 41943
41914 41916 41918 41920 41922 41924 41926 41928 41930 41932 41934 41936 41938 41940 41942
MR

MRAverage

MRLCL

X Bar Chart
40.00
38.00
35.44

36.00
34.30
33.48

34.00
32.40 32.24
32.00
30.00

35.13

34.42

34.24

33.90

32.90
31.70

29.64

34.24

29.98

29.92

31.20

30.44

31.44

31.00
29.94

28.50

28.26
28.00
25.84

26.00
24.00
22.00

One of the sample


is only 6 thus
bringing the
average down
because data was
keyed in
wrongly etc.

20.00
Average of X

30.80
31.21

Average of Ave X

UCL

LCL

27.28

22.74

R Chart
30

The range is too


big.
In X Bar chart, the data is
within control. This is the
danger of mean, it makes the
data behave like normal.
(data in X Bar cannot be
concluded as stable, R chart
shows this fact)

25

20

24.2

16.5

14.38

15

11.7
9.4

10

9.4

9.1
8

7.9
5.9

5.7
4.3
5

4.2
1

5.2

4.8

5.3
4.1

2.1

1.2

Average of R

6.8

4.7
2.1

0
Range

6.4

RLCL

Types of Variation
Range
Moving Range (< 10 sample size per data point)
Standard Deviation (> 10 sample size per data point)

p Chart
0.00250
0.00217
0.00200
0.00150

0.00150

0.00133
0.00113

0.00100

0.00100
0.00078
0.00050

0.00067

0.00056
0.00050

0.00090

0.00100

0.00089

0.00075
0.00086
0.00064
0.00057

0.00063

0.00057

0.00120

0.00033
0.00014

0.00000
1

6
UCL

Center

10
LCL

11

12

13

14

p (Proportion)

15

16

17

18

19

20

np Chart
16

15.09

14

13
12

12
10

12

9
8

87

7.10

5
4

2
0
1

8
7

6
4

12

1
0.00
2

No. of Defective

10

11
Center

12

13
UCL

14

15

LCL

16

17

18

19

20

More Cpk and Ppk


Control chart Stability
Cpk Capability
Cp = mean/6*sigma

//old method

Cpk = (USL mean/3*sigma); (mean LSL/3*sigma)


//whichever lower

The bigger Cpk is, the more capable is the process, i.e.
one straight line at mean ONLY. When Cpk = 2.0, we
achieved 6 sigma.
Ppk for long term (3 months down the road)

U Chart & C Chart


Area of opportunity of defect
Bigger area, bigger chance
C = constant area

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