EEE 533: Semiconductor Device and Process Simulation: Spring 2001
EEE 533: Semiconductor Device and Process Simulation: Spring 2001
= V
V =
V + =
+ V =
c
c
+ V =
c
c
V
p qD p q
n qD n q
g r
q t
p
g r
q t
n
p p p
n n n
p p p
n n n
2
E J
E J
J
1
J
1
Phenomenological Transport Simulation
Drift-Diffusion Model (zeroth and first-order moments of the BTE):
Continuity equations
Current density equations
Poissons equation
Variables n, p, and V solved simultaneously on a mesh. Transport is
local, and described by the phenomenological mobility v =(E)E and
diffusion coefficient D(E)=kT/q (E) (Einstein relation).
EEE 533 - Semiconductor Device and Process Simulation
Physical Device Simulation
There are two main components in
any physical device simulator:
- Characterization of charge
motion due to driving forces and
diffusion process (transport)
- Fields due to charge distribution
and motion
Recessed MOSFET represented on 3D mesh
over finite domain (courtesy of S. M. Goodnick)
Initialize Data
Field Solver
Transport Kernel
yes
no
Criterion
satisfied?
START
STOP
EEE 533 - Semiconductor Device and Process Simulation
Historical Development of Physical Device Modeling
Closed-form analytical modeling:
Gradual-channel approximation (Schockley, 1952)
Numerical modeling:
Gummels 1D numerical scheme for BJTs (1964)
De Mari (1968): 1D numerical model for pn - junctions
Sharfetter and Gummel (1969): 1D simulation for Silicon Read
(IMPATT) diodes
Kenedy and OBrien (1970): 2D simulation of silicon JFETs
Slotboom (1973): 2D simulation of BJTs
Yoshii et al. (1982): 3D modeling for a range of semiconductor devices
Commercial device simulators:
2D MOS: MINMOS, GEMINI, PISCES, CADDET, HFIELDS, CURRY
3D MOS: WATMOS, FIELDAY
1D BJT: SEDAN, BIPOLE, LUSTRE
2D BJT: BAMBI, CURRY
MESFETs: CUPID
Particle-based simulators: DAMOCLES
Quantum transport simulators: NEMO