June 21st, 2024 | Washington DC, USA | Convention Center

103rd ARFTG Microwave Measurement Conference

Advanced Measurement Techniques for Next-G
Communication Systems

Friday, June 21st

⚲ Convention Center 145 AB

7:50 Welcome to the 103rd ARFTG Microwave Measurement

– 8:00 Conference

Conference Co-Chairs: Dominique Schreurs, Marco Spirito

TPC Co-Chairs: Mauro Marchetti and Dennis Lewis

⚲ Convention Center 145 AB

8:00 Session A: Measurements for 6G and Future-G Systems

– 9:40
Session Chair: Jon Martens | Anritsu

8:00 Keynote: Approaches to Industrialize and Characterize Near-THz

– 8:40 Communication Systems

A1 Yves Baeyens | Nokia

8:40 Student Paper: Wideband Vector Signal Generation Using Multiple

– 9:00 Narrowband Phase-Coherent Synchronous Signal Channels

A2-S Zi Jun Su*, Ahmed Ben Ayed, Slim Boumaiza | University of Waterloo

9:00 Student Paper: Comparison of Signal Generation Techniques for D-Band

– 9:20 for Component Testing

A3-S Zi Jun Su1, Nizar Messaoudi*,1,2, Ahmed Ben Ayed1, Jean-Pierre Teyssier2, Slim
Boumaiza1 | 1University of Waterloo, 2Keysight Technologies

v.1.6 2024/06/11
 9:20 Characterization Methods for Millimeter Wave IQ Mixers on the Example of a
– 9:40 Planar Star Mixer

A4 Patrick Umbach*, Fabian Thome, Arnulf Leuther, Ruediger Quay | Fraunhofer IAF

9:40 Break – Exhibits, Interactive Forum

– 10:40

⚲ Convention Center 145 AB

10:40 Session B: Characterization of Material Properties

– 12:00
Session Chair: Rusty Myers | Keysight Technologies

10:40 Temperature Humidity Bias Testing of a Wafer Embedded Coplanar

– 11:00 Waveguide Line up to 40 GHz

B1 Lewis J Manning*, Ana Robador, James A Skinner | National Physical Laboratory

11:00 Complex Permittivities of Ultra-Low-Loss 4H-SiC from 55 GHz to 330 GHz

– 11:20
Yoshiyuki Yanagimoto, Shana Yanagimoto | EM labs, inc., Tianze Li, James C.M.Hwang |
B2 Cornell University

11:20 High Frequency Characterization of Ajinomoto Build-Up (ABF) Laminates for

– 11:40 Millimeter Wave Applications

B3 Aditya Jogalekar*,1 Rajen Murugan1, Mahadevan Iyer2, Rashaunda Henderson3,

Mahadevan Iyer2,3, | 1Texas Instruments, 2Amkor Technologies Inc., 3The University of
Texas at Dallas

11:40 Characterization of Dielectric Materials at WM-380 Band (500 - 750 GHz)

– 12:00 Using Three Broadband Measurement Techniques

B4 Xiaobang Shang*,1, Minjie Shu2, Mira Naftaly1, Nick Ridler1, Stephen Hanham3 |
1
National Physical Laboratory, 2Xi’an Jiaotong University, 3Imperial College London

ARFTG-103 Conference Technical Program 2

 ⚲ Convention Center 147 AB

12:00 ARFTG-103 Awards Luncheon

–13:20

ARFTG President: Rusty Myers, ARFTG Awards: David Blackham

⚲ Convention Center 145 AB

13:20 Session C: mm-wave and Sub-THz measurements

– 14:40
Session Chair: Marco Spirito | TU Delft

13:20 Construction and Initial Studies on a 0.6 mm Coaxial Calibration Kit to

– 13:40 220 GHz

C1 Jon Martens*, Tom Roberts | Anritsu

13:40 Modified Semi-Additive Manufacturing of PCBs for Enabling Accurate Device

– 14:00 Measurements at Millimeter-Wave and Sub-Terahertz Frequencies

C2 Arash Arsanjani*,1, Ziad Hatab1, Ahmad Bader Althoman Alterkawi2, Michael E

Gadringer1, Wolfgang Bösch1 | 1Graz University of Technology, 2AT&S AG

14:00 Student Paper: Repeatability of Programmable Waveguide Attenuators at

– 14:20 110-170 GHz and 220-330 GHz

C3-S Piyaphat Phukphan*, Juha-Pekka Mäkelä, Klaus Nevala, Aarno Pärssinen, Marko E.
Leinonen | University of Oulu

14:20 Experimental Determination of the Internal Aperture Dimensions of Sub-

– 14:40 Terahertz Waveguides

C4 James A Skinner*, Nick Ridler | National Physical Laboratory

14:40 Break – Exhibits, Interactive Forum

– 15:30

ARFTG-103 Conference Technical Program 3

 ⚲ Convention Center 145 AB

15:30 Session D: Advances in Linear and Non-Linear Measurements

– 17:10
Session Chair: Patrick Roblin | Ohio State University

15:30 Student Paper: Cold-Termination Noise-Parameter Measurements at

– 15:50 Cryogenic Temperatures

D1-S Marwa Safa (University of Calgary)*1, Ismail Majed1, Leo Belostotski2, Karl Warnick3,
Christopher Groppi4 | 1University of Calgary, 2Nil, Brigham, 3Young University, 4Arizona
State University

15:50 Traceable RF Power Metering Procedures with Thermoelectric Sensors

– 16:10
Zenn Roberts*, Daniel C Gray, Vincent Neylon, Angela Stelson, Aaron Morgan
D2 Hagerstrom, Christian Long, | National Institute for Standards and Technology

16:10 Student Paper: Comparative Study on De-embedding of Highly

– 16:30 Assymetrical Differential Devices using Multimode TRL and Applicability of
Mode Separation
D3-S
Milan Rother*,1, Martin Maier1, Franz Engelsberger2, Macej Wojnowski2, Vadim Issakov1
| 1Technische Universität Braunschweig, 2Infineon

16:30 Linearizability Assessment of a 3.5 GHz 16-Chain Fully Digital MIMO

– 16:50 Transmitter Under Wideband Modulated Signals

D4 Hoda Barkhordarpour*, Jin Gyu Lim, Ahmed Ben Ayed, Patrick Mitran, Slim Boumaiza |
University of Waterloo

16:50 RF Power Amplifier Model Extraction for Accurate and Fast Load Pull
– 17:10 Simulations with Wideband Signals

D5 Wissam Saabe*,1, Christophe Maziere (Amcad Engineering) 1, Arnaud Delias1, Sebastien

Mons2, Edouard Ngoya2 | 1Amcad Engineering, 2XLIM, UMR n°7252, University of
Limoges

17:10 ARFTG-103 Conference Closing

– 17:20

ARFTG-103 Conference Technical Program 4

 ⚲ Convention Center 146 ABC

9:40 Interactive Forum

– 15:30
Session Chair: Dennis Lewis, Boeing

P1 Comparison of S-Parameter Measurement Methods for Attenuators

Andreas Schramm*, Frauke Gellersen, Karsten Kuhlmann | PTB

P2 Smart Signals: Key to Decrease Measurement Time?

Yves Rolain*, Sander De Keersmaeker, Dries Peumans, Gerd Vandersteen | Vrije

Universiteit Brussel

P3 Exploring Phase Skew in Load-pull Configurations

Alex K. Chang, Rafael Lopez, John J. Dominguez, Osman Ceylan* | Maury Microwave

P4 Uncertainty in Vector Mixer Measurements using Harmonic Phase Reference

Calibration

Joel Dunsmore* | Keysight Technologies

P5-S Student Paper: Calibration of an Oscilloscope-Based NVNA for Periodic

Modulated Signals

Miles Lindquist*, Patrick Roblin | Ohio State University

P6 A Fast High Sensitivity Power Transfer Device Approach for (sub)mm-Wave

Applications

Bart Louwes1, Marco Pelk2, Juan Bueno Lopez2, Ehsan Shokrolahzade2, Carmine De
Martino3, Marco Spirito*,2 | 1THUAS, 1TU Delft, 3Vertigo Technologies

P7 Ultra-Fast Characterization Setup for Empirical Optimization of Dual-Input

Power Amplifiers

Shuichi Sakata*,1, Shinro Yatsuda2, Ayano Yano2, Rikito Matsuo2, Yuji Komatsuzaki1,
Shintaro Shinjo1, Takana Kaho2, Koji Yamanaka1 | 1Mitsubishi Electric Corporation,
2
Shonan Institute of Technology

P8-S Student Paper: A 2-Tier TRL Calibration Technique to Assess Flip-Chip

Interconnects at D-Band

ARFTG-103 Conference Technical Program 5

 Nick van Rooijen*,1, Rik Bokhorst1, Sander Dorrestein2, Francesca Chiappini2, Paolo
Sberna1, Nuria Llombart1, Marco Spirito1, Maria Alonso-delPino1 | 1TU Delft, 2CITC, TNO

P9-S Student Paper: On-Wafer Characterisation of Noise Parameters of GaN

HEMTs at between 77 K and 400 K

Jing Wang*, Afesomeh Ofiare, Qingxia Li, James Kelly, Edward Wasige, Chong Li |
University of Glasgow

P10 Using Commercial Source Measure Units for Traceable RF Power

Measurements

Daniel C Gray*, Aaron Morgan Hagerstrom, Zenn Roberts, Christian Long | National
Institute for Standards and Technology

P11 Inclined vs. Horizontal Waveguide Port Saver Approach in WR3.4 Band for
On-Wafer Measurements

Pranav Kumar Shrivastava*,1, Gavin Fisher1, Giancarlo Chirico2 | 1FormFactor GmbH,

2
FormFactor Inc.

P12 Efficient Computational Complexity Reduction of Digital Predistortion using

PLS Method for Beamforming Systems

Dusari Nageswara Rao*, Meenakshi Rawat | Indian Institute of Technology, Roorkee

P13-S Student Paper: Inverted Scanning Microwave Microscopy of GaN/AlN

High-Electron Mobility Transistors

Xiaopeng Wang*,1, Kazuki Nomoto1, Gianluca Fabi1, Richard Al Hadi2, Marco Farina3,
Debdeep Jena1, Huili Grace Xing1, James C. M. Hwang1 | 1Cornell University, 2École de
technologie supérieure, 3Marche Polytechnic University

ARFTG-103 Conference Technical Program 6