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Exponential

The exponential model, a special case of the Weibull family with a shape parameter of 1, is used for statistical processes that decline monotonically and is significant in software reliability. It features a cumulative distribution function (CDF) and probability density function (PDF) that require parameters K and lambda for specific model estimation. The model has been effectively applied in various reliability studies, including NASA's software defect analysis, demonstrating its importance in understanding defect arrival rates.

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3 views2 pages

Exponential

The exponential model, a special case of the Weibull family with a shape parameter of 1, is used for statistical processes that decline monotonically and is significant in software reliability. It features a cumulative distribution function (CDF) and probability density function (PDF) that require parameters K and lambda for specific model estimation. The model has been effectively applied in various reliability studies, including NASA's software defect analysis, demonstrating its importance in understanding defect arrival rates.

Uploaded by

Azharr Nawaz
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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The Exponential Model

The exponential model is another special case of the Weibull family, with the shape
parameter m equal to 1. It is best used for statistical processes that decline monotonically to
an asymptote. Its cumulative distribution function (CDF) and probability density function
(PDF) are

where c is the scale parameter, t is time, and l =1/ c . Applied to software reliability, l is
referred to as the error detection rate or instantaneous failure rate . In statistical terms it is
also called the hazard rate .
Again the preceding formulas represent a standard distribution ”the total area under the
PDF curve is 1. In actual application, the total number of defects or the total cumulative
defect rate K needs to be multiplied to the formulas. K and lambda ( l ) are the two
parameters for estimation when deriving a specific model from a data set.
where c is the scale parameter, t is time, and l =1/ c . Applied to software reliability, l is
referred to as the error detection rate or instantaneous failure rate . In statistical terms it is
also called the hazard rate .
Again the preceding formulas represent a standard distribution ”the total area under the
PDF curve is 1. In actual application, the total number of defects or the total cumulative
defect rate K needs to be multiplied to the formulas. K and lambda ( l ) are the two
parameters for estimation when deriving a specific model from a data set.
The exponential distribution is the simplest and most important distribution in reliability and
survival studies. The failure data of much equipment and many processes are well
described by the exponential distribution: bank statement and ledger errors, payroll check
errors, light bulb failure, automatic calculating machine failure, radar set component failure,
and so forth. The exponential distribution plays a role in reliability studies analogous to that
of normal distribution in other areas of statistics.
In software reliability the exponential distribution is one of the better known models and is
often the basis of many other software reliability growth models. For instance, Misra (1983)
used the exponential model to estimate the defect-arrival rates for the shuttle's ground
system software of the National Aeronautics and Space Administration (NASA). The
software provided the flight controllers at the Johnson Space Center with processing
support to exercise command and control over flight operations. Data from an actual 200-
hour flight mission indicate that the model worked very well. Furthermore, the mean value
function (CDF) of the Goel-Okumoto (1979) nonhomogeneous Poisson process model
(NPPM) is in fact the exponential model.
We have modeled the weekly defect arrival data since the start of system test, when the
development work was virtually complete. The system-testing stage uses customer
interfaces, tests external requirements, and simulates end- user application environments.
The pattern of defect arrivals during this stage, therefore, should be indicative of the latent
defect rate when the system is shipped.

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