Am 67
Am 67
AM67x Processors
1 Features Multimedia:
Processor Cores: • Display subsystem
• Up to Quad 64-bit Arm® Cortex®-A53 – Triple display support over OLDI/LVDS (1x
microprocessor subsystem at up to 1.4GHz OLDI-DL, 1x or 2x OLDI-SL), DSI or DPI
– Quad-core Cortex-A53 cluster with 512KB L2 • OLDI-SL (Single Link): up to 1920 x 1080 at
shared cache with SECDED ECC 60fps (165-MHz Pixel Clock)
– Each A53 core has 32KB L1 DCache with • OLDI-DL (Dual Link): up to 3840 x 1080 at
SECDED ECC and 32KB L1 ICache with Parity 60fps (150-MHz Pixel Clock)
protection • MIPI® DSI: with 4 Lane MIPI® D-PHY
• Single-core Arm® Cortex®-R5F at up to 800MHz, supports up to 3840 x 1080 at 60fps (300-
integrated as part of MCU Channel with FFI MHz Pixel Clock)
• DPI (24-bit RGB parallel interface): up to
– 32KB ICache, 32KB L1 DCache, and 64KB
1920 x 1080 at 60fps (165-MHz pixel clock)
TCM with SECDED ECC on all memories
– Four display pipelines with hardware overlay
– 512KB SRAM with SECDED ECC
support. A maximum of two display pipelines
• Single-core Arm® Cortex®-R5F at up to 800MHz,
may be used per display.
integrated to support Device Management
– 32KB ICache, 32KB L1 DCache, and 64KB – Supports safety features such as freeze frame
TCM with SECDED ECC on all memories detection and data correctness check
• Single-core Arm® Cortex®-R5F at up to 800MHz, • 3D Graphics Processing Unit
integrated to support Run-time Management – IMG BXS-4-64 with 256KB cache
– 32KB ICache, 32KB L1 DCache, and 64KB – Up to 50 GFLOPS
TCM with SECDED ECC on all memories – Single shader core
• Two Deep Learning Accelerators (up to 4 TOPS – OpenGL ES3.2 and Vulkan 1.2 API support
total), each with: • Four Camera Serial Interface (CSI-2) Receiver
– C7x floating point, up to 40 GFLOPS, 256-bit with 4 Lane D-PHY
Vector DSP at up to 1.0GHz – MIPI® CSI-2 v1.3 Compliant + MIPI® D-PHY
– Matrix Multiply Accelerator (MMA), up to 2 1.2
TOPS (8b) at up to 1.0GHz – CSI-RX supports for 1,2,3, or 4 data lane mode
– 32KB L1 DCache with SECDED ECC and up to 2.5Gbps per lane
64KB L1 ICache with Parity protection • One CSI2.0 Transmitter with 4 Lane D-PHY
– 2.25MB of L2 SRAM with SECDED ECC (shared with MIPI DSI)
• Depth and Motion Processing Accelerators – CSI-TX supports for 1,2, or 4 data lane mode
(DMPAC) up to 2.5Gbps per lane
– Dense Optical Flow (DOF) Accelerator • Video Encoder/Decoder
– Stereo Disparity Engine (SDE) Accelerator – Support for HEVC (H.265) Main profiles at
• Vision Processing Accelerators (VPAC) with Image Level 5.1 High-tier
Signal Processor (ISP) and multiple vision assist – Support for H.264 BaseLine/Main/High Profiles
accelerators: at Level 5.2
– 600MP/s ISP – Support for up to 4K UHD resolution
– Support for 12-bit RGB-IR (3840 × 2160)
– Support for up to 16-bit input RAW format • Up to 400MP/s operation
– Line support up to 4096 • Motion JPEG encode at 416MPixels/s with
– Wide Dynamic Range (WDR), Lens Distortion resolutions up to 4K UHD (3840 × 2160)
Correction (LDC), Vision Imaging Subsystem
Memory Subsystem:
(VISS), and Multi-Scalar (MSC) support
• Output color format : 8-bits, 12-bits, and • On-chip RAM dedicated to key processing cores
YUV 4:2:2, YUV 4:2:0, RGB, HSV/HSL – 256KB of On-Chip RAM (OCRAM) with
SECDED ECC
– 256KB of On-Chip RAM with SECDED ECC in
SMS Subsystem
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
AM67, AM67A
SPRSPA3A – MARCH 2024 – REVISED SEPTEMBER 2024 www.ti.com
Technology / Package:
• 16-nm FinFET technology 2 Applications
• 18 mm x 18 mm, 0.65 mm pitch with VCA (AMW)
• Human Machine Interface (HMI)
Companion Power Management Solution: • Hospital patient monitoring
• Functional Safety-Compliant support up to ASIL-B • Industrial PC
or SIL-2 targeted • Building security system
• TPS6522x PMIC • Off-highway vehicle
• TPS6287x Stackable, Fast Transient Bucks • Test and measurement
• Energy storage systems
• Video Surveillance
• Machine Vision
• Industrial mobile robot (AGV/AMR)
• Front camera systems
3 Description
The AM67x scalable processor family is based on the evolutionary Jacinto™ 7 architecture, targeted at Smart
Vision Camera and General Compute applications and built on extensive market knowledge accumulated over
a decade of TI’s leadership in the Vision processor market. The AM67x family is built for a broad set of
cost-sensitive high performance compute applications in Factory Automation, Building Automation, and other
markets.
The AM67x provides high performance compute technology for both traditional and deep learning algorithms
at industry leading power/performance ratios with a high level of system integration to enable scalability and
lower costs for advanced vision camera applications. Key cores include the latest Arm and GPU processors for
general compute, next generation DSP with scalar and vector cores, dedicated deep learning and traditional
algorithm accelerators, an integrated next generation imaging subsystem (ISP), video codec, and MCU cores. All
protected by industrial-grade security hardware accelerators.
AM67x contains up to four Arm® Cortex®-A53 cores with 64-bit architecture, a Vision Processing Accelerator
(VPAC) with Image Signal Processor (ISP) and multiple vision assist accelerators, Deep Learning (DL), Dense
Optical Flow (DOF) video and 3D Graphics accelerators, a Cortex®-R5F MCU Island core and two Cortex®-
R5F cores for Device and Run-time Management. The Cortex-A53s provide the powerful computing elements
necessary for Linux applications as well as the implementation of traditional vision computing based algorithms.
Building on the existing world-class ISP, TI’s 7th generation ISP includes flexibility to process a broader
sensor suite including RGB-InfraRed (RGB-IR), support for higher bit depth, and features targeting analytics
applications. Key cores include two “C7x” next generation DSP with scalar and vector cores, dedicated “MMA”
deep learning accelerator combined with a large 2.25MB L2 memory enabling performance up to 4 TOPS
within the lowest power envelope in the industry when operating at the typical automotive worst case junction
temperature of 125°C.
The AM67x integrates high-speed IOs including a PCIe Gen-3 (1L) and 3-port Gigabit Ethernet switch with
one internal port and two external ports with TSN support. In addition, an extensive peripherals set is included
in AM67x to enable system level connectivity such as USB, MMC/SD, four CSI2.0 Camera interface, OSPI,
CAN-FD and GPMC for parallel host interface to an external ASIC/FPGA. AM67x supports secure boot for IP
protection with the built-in HSM (Hardware Security Module) and employs advanced power management support
for power-sensitive applications.
Package Information
PART NUMBER PACKAGE(1) PACKAGE SIZE(2)
XJ722S5A AMW (FCBGA, 594) with VCA 18mm x 18mm
AM67A94 AMW (FCBGA, 594) with VCA 18mm x 18mm
AM67A74 AMW (FCBGA, 594) with VCA 18mm x 18mm
AM6754 AMW (FCBGA, 594) with VCA 18mm x 18mm
(1) For more information, see Mechanical, Packaging, and Orderable Information.
(2) The package size (length × width) is a nominal value and includes pins, where applicable.
AM67x
Run-time Management
Arm® Arm® 64KB TCM
Cortex®-A53 Cortex®-A53 with ECC
Arm® 64KB TCM
512KB SRAM Cortex®-R5F with ECC
with ECC
512KB Shared L2 with ECC
Safety DTK System Memory
256KB SRAM
with ECC GPMC
Deep Learning Accelerator (2 TOPS) Deep Learning Accelerator (2 TOPS) (Shared)
Security
HSM
(Secure Boot) SHA PKA DRBG
SMS
MD5 AES TRNG
426KB SRAM with ECC
System Services
Table of Contents
1 Features............................................................................1 6.9 Timing and Switching Characteristics....................... 95
2 Applications..................................................................... 3 7 Detailed Description....................................................215
3 Description.......................................................................3 7.1 Overview................................................................. 215
3.1 Functional Block Diagram........................................... 5 8 Applications, Implementation, and Layout............... 216
4 Device Comparison......................................................... 7 8.1 Device Connection and Layout Fundamentals....... 216
5 Terminal Configuration and Functions..........................9 8.2 Peripheral- and Interface-Specific Design
5.1 Pin Diagrams.............................................................. 9 Information................................................................ 217
5.2 Pin Attributes.............................................................10 8.3 Clock Routing Guidelines........................................224
5.3 Signal Descriptions................................................... 48 9 Device and Documentation Support..........................225
5.4 Pin Connectivity Requirements.................................79 9.1 Device Nomenclature..............................................225
6 Specifications................................................................ 82 9.2 Tools and Software................................................. 228
6.1 Absolute Maximum Ratings...................................... 82 9.3 Documentation Support.......................................... 228
6.2 ESD Ratings for Devices which are not AEC - 9.4 Support Resources................................................. 228
Q100 Qualified............................................................ 84 9.5 Trademarks............................................................. 228
6.3 Power-On Hours (POH)............................................ 84 9.6 Electrostatic Discharge Caution..............................229
6.4 Recommended Operating Conditions.......................85 9.7 Glossary..................................................................229
6.5 Operating Performance Points..................................87 10 Revision History........................................................ 229
6.6 Electrical Characteristics...........................................88 11 Mechanical, Packaging, and Orderable
6.7 VPP Specifications for One-Time Programmable Information.................................................................. 231
(OTP) eFuses..............................................................93 11.1 Packaging Information.......................................... 231
6.8 Thermal Resistance Characteristics......................... 94
4 Device Comparison
Table 4-1 shows a comparison between devices, highlighting the differences.
Note
Availability of features listed in this table are a function of shared IO pins, where IO signals associated
with many of the features are multiplexed to a limited number of pins. The SysConfig tool should
be used to assign signal functions to pins. This will provide a better understanding of limitations
associated with pin multiplexing.
Note
To understand what device features are currently supported by TI Software Development Kits (SDKs),
see the PROCESSOR-SDK-AM67 Software Build Sheet and PROCESSOR-SDK-AM67A Software
Build Sheet.
(1) J722S is the base part number for the superset device. Software should constrain the features used to match the intended production
device.
(2) Safety features including SIL/ASIL ratings are only applicable to select part number variants as indicated by the Device Type (Y)
identifier in the Device Naming Convention table.
(3) Device security features including Secure Boot and Customer Programmable Keys are applicable to select part number variants as
indicated by the Device Type (Y) identifier in the Table 10-1, Nomenclature Description table
(4) One flash interface, configured as OSPI0 or QSPI0.
(5) PCIe, USB3.0 and SGMII share a total of 2 SERDES ports.
(6) On the AM67A SoC, the Deep Learning Accelerator C7x + MMA are reserved for executing TI provided code, and are not available for
custom code.
Figure 5-1 shows the ball locations for the 594-ball flip chip ball grid array (FCBGA) package to quickly locate
signal names and ball grid numbering. This figure is used in conjuction with Section 5.2.1 through Section 5.4
(Pin Attributes table and all Signal Descriptions tables, including the Pin Connectivity Requirements table).
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
WKUP WKUP MCU_OSC0 MCU_OSC0 PMIC_LPM MCU_SPI0 MCU_SPI0 SERDES1 SERDES1 SERDES0 SERDES0 SERDES0 SERDES0 EXT MCASP0 MCASP0
A VSS _LFOSC0 _LFOSC0 VSS VSS TCK VSS VSS I2C1_SDA MMC1_SDWP VSS
_XO _XI _XI _XO _EN0 _CLK _CS1 _TX0_N _TX0_P _REFCLK0P _REFCLK0N _RX0_P _RX0_N _REFCLK1 _AXR3 _AXR2
MCU_MCAN1 MCU_MCAN0 WKUP MCU_UART0 MCU_UART0 MCU MCU_UART0 WKUP_I2C0 MCU_SPI0 MCU_I2C0 SERDES1 SERDES1 SERDES0 SERDES0 UART0 MCASP0 USB1
B _UART0 RSVD16 TRSTn SPI0_CS0 I2C0_SDA EXTINTn MMC1_SDCD
_RX _TX _RXD _TXD _CTSn _ERRORn _RXD _SCL _D0 _SCL _REFCLK0N _REFCLK0P _TX0_P _TX0_N _RTSn _AXR1 _DRVVBUS
MCU_MCAN1 WKUP WKUP MCU_UART0 WKUP MCU_SPI0 MCU_SPI0 SERDES1 SERDES1 MCASP0 MCASP0
C VSS _UART0 _UART0 RSVD14 _UART0 EMU0 RSVD17 SPI0_CS1 MCAN0_RX VSS I2C1_SCL
_TX _RTSn _CTSn _RTSn _TXD _D1 _CS0 _RX0_N _RX0_P _AFSX _AFSR
VDDA OSPI0
L DDR0_DQ11 DDR0_A5 DDR0_A3 DDR0_A0 RSVD10 DDR0_A1 VDDS_DDR VDDS_DDR VSS VSS VDD_CORE VSS VSS VDDA_PLL0 VSS VDD_CORE VSS CAP_VDDS1 VDDSHV1 OSPI0_D4 OSPI0_DQS OSPI0_CLK OSPI0_D3 OSPI0_D2 OSPI0_D1
_TEMP2 _LBCLKO
DDR0_RAS DDR0_CAS
M VSS RSVD21 DDR0_A2 RSVD11 VSS VSS VDD_CORE VDD_CORE VSS VDDA_PLL2 VDDR_CORE VSS VDD_CORE VSS VDD_CORE VSS VDDR_CORE VDDSHV3 OSPI0_D5 OSPI0_D7
_n _n
GPMC0
R VSS DDR0_DQ17 DDR0_DQ20 VSS DDR0_DQ18 DDR0_CAL0 VSS VSS VDD_CORE VSS VDDA_PLL3 VDD_CORE VDD_CORE VSS VDD_CORE VSS VDD_CORE VSS VSS VDDSHV3 GPMC0_AD0 GPMC0_AD1 GPMC0_AD2
_CSn0
VDDA
T DDR0_DQS2 DDR0_DQ19 VDDS_DDR VDDS_DDR VDD_CORE VSS VSS VDD_CORE VSS VDD_CORE VSS VDD_CORE VSS VDDSHV2 VDDSHV2 GPMC0_AD6 GPMC0_AD7 GPMC0_CLK GPMC0_AD5 GPMC0_AD4 VSS GPMC0_AD3
_TEMP1
DDR0_DQS2 DDR0
U DDR0_DQ21 VSS DDR0_DM2 DDR0_DQ22 VSS VDD_CORE VSS VDDR_CORE VSS VDD_CORE VSS VDD_CORE VSS VDD_CORE VDDR_CORE VSS VSS CAP_VDDS2 GPMC0_AD9 GPMC0_AD8
_n _RESET0_n
VDDA_0P85 VDDA_CORE VDDA_1P8 VDDA_CORE VDDA_1P8 VDDA_1P8 VOUT0 VOUT0 VOUT0 VOUT0 VOUT0 GPMC0 VOUT0
W DDR0_DQS3 DDR0_DQ27 DDR0_DQ29 DDR0_DQ25 VSS USB0_VBUS VSS VDD_MMC0 VSS VSS VSS VDD_CORE VSS
_DLL_MMC0 _USB0 _CSI_DSI _CSI_DSI _CSI_DSI _OLDI0 _DATA5 _DATA4 _DATA3 _DATA2 _DATA1 _WAIT1 _DATA0
DDR0_DQS3 VDDA_3P3 VDDA_1P8 VDDA_1P8 VDDA_CORE VDDA_CORE VDDA VDDA_1P8 VOUT0 VOUT0
Y DDR0_DQ24 VSS VSS VDDS_MMC0 VSS VSS _CSI_DSI VSS VDD_CORE VDD_CORE
_n _USB0 _USB0 _CSI_DSI _CSI_DSI _CLK _TEMP0 _OLDI0 _DATA6 _DATA7
Not to scale
Note
Many device pins support multiple signal functions. Some signal functions are selected via a single
layer of multiplexers associated with pins. Other signal functions are selected via two or more layers
of multiplexers, where one layer is associated with the pins and other layers are associated with
peripheral logic functions.
The Table 5-1, Pin Attributes (AMW Package) table only defines signal multiplexing at the pins. For
more information, related to signal multiplexing at the pins, see Pad Configuration Registers section
in Device Configuration chapter of the device TRM. Refer to the respective peripheral chapter in the
device TRM for information associated with peripheral signal multiplexing.
4. MUX MODE: The MUXMODE value associated with each pin multiplexed signal function:
a. MUXMODE 0 is the primary pin multiplexed signal function. However, the primary pin multiplexed signal
function is not necessarily the default pin multiplexed signal function.
Note
The value found in the MUX MODE AFTER RESET column defines the default pin multiplexed
signal function selected when MCU_PORz is deasserted.
a. MUXMODE values 1 through 15 are possible for pin multiplexed signal functions. However, not all
MUXMODE values have been implemented. The only valid MUXMODE values are those defined as pin
multiplexed signal functions within the Pin Attributes table. Only valid values of MUXMODE should be
used.
b. Bootstrap defines SOC configuration pins, where the logic state applied to each pin is latched on the
rising edge of PORz_OUT. These input signal functions are fixed to their respective pins and are not
programable via MUXMODE.
c. An empty box means Not Applicable.
Note
The following configurations of MUXMODE must be avoided for proper device operation.
• Configuring multiple pins operating as inputs to the same pin multiplexed signal function is not
supported as it can yield unexpected results.
• Configuring a pin to an undefined pin multiplexing mode will cause the pin behavior to be
undefined.
• PWR = Power
• GND = Ground
• CAP = LDO Capacitor.
6. DSIS: The deselected input state (DSIS) indicates the state driven to the subsystem input (logic "0", logic
"1", or "pad" level) when the pin multiplexed signal function is not selected by MUXMODE.
• 0: Logic 0 driven to the subsystem input.
• 1: Logic 1 driven to the subsystem input.
• pad: Logic state of the pad is driven to the subsystem input.
• An empty box means Not Applicable.
7. BALL STATE DURING RESET (RX/TX/PULL): State of the terminal while MCU_PORz is asserted, where
RX defines the state of the input buffer, TX defines the state of the output buffer, and PULL defines the state
of internal pull resistors:
• RX (Input buffer)
– Off: The input buffer is disabled.
– On: The input buffer is enabled.
• TX (Output buffer)
– Off: The output buffer is disabled.
– Low: The output buffer is enabled and drives VOL.
• PULL (Internal pull resistors)
– Off: Internal pull resistors are turned off.
– Up: Internal pull-up resistor is turned on.
– Down: Internal pull-down resistor is turned on.
– NA: Not Applicable.
• An empty box means Not Applicable.
8. BALL STATE AFTER RESET (RX/TX/PULL): State of the terminal after MCU_PORz is deasserted, where
RX defines the state of the input buffer, TX defines the state of the output buffer, and PULL defines the state
of internal pull resistors:
• RX (Input buffer)
– Off: The input buffer is disabled.
– On: The input buffer is enabled.
• TX (Output buffer)
– Off: The output buffer is disabled.
– SS: The subsystem selected with MUXMODE determines the output buffer state.
• PULL (Internal pull resistors)
– Off: Internal pull resistors are turned off.
– Up: Internal pull-up resistor is turned on.
– Down: Internal pull-down resistor is turned on.
– NA: Not Applicable.
• An empty box means Not Applicable.
9. MUX MODE AFTER RESET: The value found in this column defines the default pin multiplexed signal
function after MCU_PORz is deasserted.
An empty box means Not Applicable.
10. I/O VOLTAGE VALUE: This column describes I/O operating voltage options of the respective power supply,
when applicable.
An empty box means Not Applicable.
For more information, see valid operating voltage range(s) defined for each power supply in Section 6.4,
Recommended Operating Conditions.
11. POWER: The power supply of the associated I/O, when applicable.
C9 PADCONFIG EMU0 0 IO 0 On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG30
0x04084078
EMU1
F9 PADCONFIG EMU1 0 IO 0 On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG31
0x0408407C
EXTINTn EXTINTn 0 I 1
PADCONFIG I2C OPEN
B23 Off / Off / NA Off / Off / NA 7 1.8 V/3.3 V VDDSHV0 Yes
PADCONFIG125 GPIO1_31 7 IOD pad DRAIN
0x000F41F4
EXT_REFCLK1 0 I 0
SYNC1_OUT 1 O
SPI2_CS3 2 IO 1
EXT_REFCLK1 SYSCLKOUT0 3 O
A23 PADCONFIG TIMER_IO4 4 IO 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG124
0x000F41F0 CLKOUT0 5 O
CP_GEMAC_CPTS0_RFT_CLK 6 I 0
GPIO1_30 7 IO pad
ECAP0_IN_APWM_OUT 8 IO 0
B7 PADCONFIG MCU_ERRORn 0 IO Off / Off / Down On / SS / Down 0 1.8 V VDDS_OSC0 Yes LVCMOS PU/PD
MCU_PADCONFIG24
0x04084060
MCU_I2C0_SCL MCU_I2C0_SCL 0 IOD 1
PADCONFIG I2C OPEN
B13 Off / Off / NA On / SS / NA 7 1.8 V/3.3 V VDDSHV_MCU Yes
MCU_PADCONFIG17 MCU_GPIO0_17 7 IOD pad DRAIN
0x04084044
MCU_I2C0_SDA MCU_I2C0_SDA 0 IOD 1
PADCONFIG I2C OPEN
E11 Off / Off / NA On / SS / NA 7 1.8 V/3.3 V VDDSHV_MCU Yes
MCU_PADCONFIG18 MCU_GPIO0_18 7 IOD pad DRAIN
0x04084048
MCU_MCAN0_RX 0 I 1
MCU_MCAN0_RX
MCU_TIMER_IO0 1 IO 0
D8 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG14 MCU_SPI1_CS3 2 IO 1
0x04084038
MCU_GPIO0_14 7 IO pad
MCU_MCAN0_TX 0 O
MCU_MCAN0_TX
WKUP_TIMER_IO0 1 IO 0
B2 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG13 MCU_SPI0_CS3 2 IO 1
0x04084034
MCU_GPIO0_13 7 IO pad
MCU_MCAN1_RX 0 I 1
MCU_TIMER_IO3 1 IO 0
MCU_MCAN1_RX
MCU_SPI0_CS2 2 IO 1
B1 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG16 MCU_SPI1_CS2 3 IO 1
0x04084040
MCU_SPI1_CLK 4 IO 0
MCU_GPIO0_16 7 IO pad
MCU_MCAN1_TX 0 O
MCU_MCAN1_TX MCU_TIMER_IO2 1 IO 0
C1 PADCONFIG MCU_SPI1_CS1 3 IO 1 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG15
0x0408403C MCU_EXT_REFCLK0 4 I 0
MCU_GPIO0_15 7 IO pad
A5 MCU_OSC0_XI MCU_OSC0_XI I 1.8 V VDDS_OSC0 Yes HFXOSC
E13 PADCONFIG Off / Low / Off Off / SS / Off 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG23 MCU_GPIO0_21 7 IO pad
0x0408405C
MCU_RESETz
D10 PADCONFIG MCU_RESETz 0 I On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG21
0x04084054
MCU_SPI0_CLK MCU_SPI0_CLK 0 IO 0
A9 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG2 MCU_GPIO0_2 7 IO pad
0x04084008
MCU_SPI0_CS0 MCU_SPI0_CS0 0 IO 1
C12 PADCONFIG WKUP_TIMER_IO1 4 IO 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG0
0x04084000 MCU_GPIO0_0 7 IO pad
MCU_SPI0_CS1 0 IO 1
MCU_OBSCLK0 1 O
MCU_SPI0_CS1
MCU_SYSCLKOUT0 2 O
A10 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG1 MCU_EXT_REFCLK0 3 I 0
0x04084004
MCU_TIMER_IO1 4 IO 0
MCU_GPIO0_1 7 IO pad
MCU_SPI0_D0 MCU_SPI0_D0 0 IO 0
B12 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG3 MCU_GPIO0_3 7 IO pad
0x0408400C
MCU_SPI0_D1 MCU_SPI0_D1 0 IO 0
C11 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG4 MCU_GPIO0_4 7 IO pad
0x04084010
MCU_UART0_CTSn 0 I 1
MCU_UART0_CTSn
MCU_TIMER_IO0 1 IO 0
B5 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG7 MCU_SPI1_D0 3 IO 0
0x0408401C
MCU_GPIO0_7 7 IO pad
MCU_UART0_RTSn 0 O
MCU_UART0_RTSn
MCU_TIMER_IO1 1 IO 0
C5 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG8 MCU_SPI1_D1 3 IO 0
0x04084020
MCU_GPIO0_8 7 IO pad
B8 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG5 MCU_GPIO0_5 7 IO pad
0x04084014
MCU_UART0_TXD MCU_UART0_TXD 0 O
B4 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG6 MCU_GPIO0_6 7 IO pad
0x04084018
MDIO0_MDC MDIO0_MDC 0 O
AC24 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG88 GPIO0_86 7 IO pad
0x000F4160
MDIO0_MDIO MDIO0_MDIO 0 IO 0
AD25 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG87 GPIO0_85 7 IO pad
0x000F415C
AC1 MMC0_CALPAD MMC0_CALPAD A 1.8 V VDDS_MMC0 eMMCPHY
AE1 MMC0_CLK MMC0_CLK IO 0 On / Low / Off On / SS / Off 1.8 V VDDS_MMC0 eMMCPHY PU/PD
AE2 MMC0_CMD MMC0_CMD IO 1 On / Off / Up On / SS / Up 1.8 V VDDS_MMC0 eMMCPHY PU/PD
AD1 MMC0_DS MMC0_DS IO 1 On / Off / Down On / Off / Down 1.8 V VDDS_MMC0 eMMCPHY PU/PD
MMC1_CLK 0 IO 0
TIMER_IO4 2 IO 0
MMC1_CLK
UART3_RXD 3 IO 0
H24 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV5 Yes SDIO PU/PD
PADCONFIG141 SPI1_CS0 5 IO 0
0x000F4234
SPI2_CS2 6 IO 0
GPIO1_46 7 IO 0
MMC1_CMD 0 IO 1
TIMER_IO5 2 IO 1
MMC1_CMD
UART3_TXD 3 IO 1
H22 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV5 Yes SDIO PU/PD
PADCONFIG143 SPI1_CLK 5 IO 1
0x000F423C
SPI2_CS0 6 IO 1
GPIO1_47 7 IO 1
MMC1_SDCD 0 I 0
UART6_RXD 1 I 0
TIMER_IO6 2 I 0
MMC1_SDCD
UART3_RTSn 3 I 0
B24 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG144 MCAN1_TX 4 I 0
0x000F4240
SPI1_CS3 5 I 0
SPI2_CLK 6 I 0
GPIO1_48 7 I 0
L24 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG0 GPIO0_0 7 IO pad
0x000F4000
OSPI0_DQS OSPI0_DQS 0 I 0
L22 PADCONFIG UART5_CTSn 5 I 1 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG2
0x000F4008 GPIO0_2 7 IO pad
OSPI0_LBCLKO OSPI0_LBCLKO 0 IO 0
L23 PADCONFIG UART5_RTSn 5 O Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG1
0x000F4004 GPIO0_1 7 IO pad
OSPI0_CSn0 OSPI0_CSn0 0 O
K26 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG11 GPIO0_11 7 IO pad
0x000F402C
OSPI0_CSn1 OSPI0_CSn1 0 O
K23 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG12 GPIO0_12 7 IO pad
0x000F4030
K27 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG3 GPIO0_3 7 IO pad
0x000F400C
OSPI0_D1 OSPI0_D1 0 IO 0
L27 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG4 GPIO0_4 7 IO pad
0x000F4010
OSPI0_D2 OSPI0_D2 0 IO 0
L26 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG5 GPIO0_5 7 IO pad
0x000F4014
OSPI0_D3 OSPI0_D3 0 IO 0
L25 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG6 GPIO0_6 7 IO pad
0x000F4018
OSPI0_D4 0 IO 0
OSPI0_D4 SPI1_CS0 1 IO 1
L21 PADCONFIG MCASP1_AXR1 2 IO 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG7
0x000F401C UART6_RXD 3 I 1
GPIO0_7 7 IO pad
OSPI0_D5 0 IO 0
OSPI0_D5 SPI1_CLK 1 IO 0
M26 PADCONFIG MCASP1_AXR0 2 IO 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG8
0x000F4020 UART6_TXD 3 O
GPIO0_8 7 IO pad
A8 PADCONFIG Off / Off / Off Off / SS / Off 0 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG32 MCU_GPIO0_22 7 IO pad
0x04084080
PORz_OUT
D27 PADCONFIG PORz_OUT 0 O Off / Low / Off Off / SS / Off 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG148
0x000F4250
RESETSTATz
E27 PADCONFIG RESETSTATz 0 O Off / Low / Off Off / SS / Off 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG147
0x000F424C
RESET_REQz
E26 PADCONFIG RESET_REQz 0 I On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG146
0x000F4248
RGMII1_RXC RGMII1_RXC 0 I 0
AE27 PADCONFIG RMII1_REF_CLK 1 I 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG82
0x000F4148 GPIO0_80 7 IO pad
RGMII1_RX_CTL RGMII1_RX_CTL 0 I 0
AD23 PADCONFIG RMII1_RX_ER 1 I 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG81
0x000F4144 GPIO0_79 7 IO pad
RGMII1_TXC RGMII1_TXC 0 O
AG26 PADCONFIG RMII1_CRS_DV 1 I 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG76
0x000F4130 GPIO0_74 7 IO pad
AF25 PADCONFIG RMII1_TX_EN 1 O Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG75
0x000F412C GPIO0_73 7 IO pad
RGMII1_RD0 RGMII1_RD0 0 I 0
AC25 PADCONFIG RMII1_RXD0 1 I 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG83
0x000F414C GPIO0_81 7 IO pad
RGMII1_RD1 RGMII1_RD1 0 I 0
AD27 PADCONFIG RMII1_RXD1 1 I 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG84
0x000F4150 GPIO0_82 7 IO pad
RGMII1_RD2 RGMII1_RD2 0 I 0
AE24 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG85 GPIO0_83 7 IO pad
0x000F4154
RGMII1_RD3 RGMII1_RD3 0 I 0
AE26 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG86 GPIO0_84 7 IO pad
0x000F4158
RGMII1_TD0 RGMII1_TD0 0 O
AF27 PADCONFIG RMII1_TXD0 1 O Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG77
0x000F4134 GPIO0_75 7 IO pad
RGMII1_TD1 RGMII1_TD1 0 O
AE23 PADCONFIG RMII1_TXD1 1 O Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG78
0x000F4138 GPIO0_76 7 IO pad
RGMII1_TD2 RGMII1_TD2 0 O
AG25 PADCONFIG Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG79 GPIO0_77 7 IO pad
0x000F413C
RGMII1_TD3 RGMII1_TD3 0 O
AF24 PADCONFIG CLKOUT0 1 O Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG80
0x000F4140 GPIO0_78 7 IO pad
B20 PADCONFIG EHRPWM0_A 2 IO 0 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG109
0x000F41B4 GPIO1_15 7 IO pad
A11 PADCONFIG TCK 0 I On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG25
0x04084064
TDI
E12 PADCONFIG TDI 0 I On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG27
0x0408406C
TDO
F10 PADCONFIG TDO 0 OZ Off / Off / Up Off / SS / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG28
0x04084070
TMS
F11 PADCONFIG TMS 0 I On / Off / Up On / Off / Up 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG29
0x04084074
TRSTn
B10 PADCONFIG TRSTn 0 I On / Off / Down On / Off / Down 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG26
0x04084068
E25 PADCONFIG Off / Off / Down Off / Off / Down 7 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG149 GPIO1_50 7 IO pad
0x000F4254
VDDA_1P8_USB0,
AA8 USB0_RCALIB USB0_RCALIB A 1.8 V/3.3 V USB2PHY
VDDA_3P3_USB0
B27 PADCONFIG Off / Off / Down Off / Off / Down 7 1.8 V/3.3 V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG150 GPIO1_51 7 IO pad
0x000F4258
VDDA_1P8_USB1,
E18 USB1_RCALIB USB1_RCALIB A 1.8 V/3.3 V USB2PHY
VDDA_3P3_USB1
VDDA_1P8_USB1,
F18 USB1_VBUS USB1_VBUS A 1.8 V/3.3 V USB2PHY
VDDA_3P3_USB1
H12, H13 VDDA_0P85_SERDES VDDA_0P85_SERDES PWR
J13 VDDA_0P85_SERDES_C VDDA_0P85_SERDES_C PWR
W9 VDDA_0P85_DLL_MMC0 VDDA_0P85_DLL_MMC0 PWR
W13, W16,
VDDA_1P8_CSI_DSI VDDA_1P8_CSI_DSI PWR
Y13
G13 VDDA_1P8_SERDES VDDA_1P8_SERDES PWR
W18, Y19 VDDA_1P8_OLDI0 VDDA_1P8_OLDI0 PWR
Y12 VDDA_1P8_USB0 VDDA_1P8_USB0 PWR
H16 VDDA_1P8_USB1 VDDA_1P8_USB1 PWR
Y11 VDDA_3P3_USB0 VDDA_3P3_USB0 PWR
G15 VDDA_3P3_USB1 VDDA_3P3_USB1 PWR
W15, Y15 VDDA_CORE_CSI_DSI VDDA_CORE_CSI_DSI PWR
Y16 VDDA_CORE_CSI_DSI_CLK VDDA_CORE_CSI_DSI_CLK PWR
W11 VDDA_CORE_USB0 VDDA_CORE_USB0 PWR
H15 VDDA_CORE_USB1 VDDA_CORE_USB1 PWR
P9 VDDA_DDR_PLL0 VDDA_DDR_PLL0 PWR
G11, H11 VDDA_MCU VDDA_MCU PWR
L15 VDDA_PLL0 VDDA_PLL0 PWR
K10 VDDA_PLL1 VDDA_PLL1 PWR
M12 VDDA_PLL2 VDDA_PLL2 PWR
R11 VDDA_PLL3 VDDA_PLL3 PWR
V18 VDDA_PLL4 VDDA_PLL4 PWR
P16 VDDA_PLL5 VDDA_PLL5 PWR
Y17 VDDA_TEMP0 VDDA_TEMP0 PWR
T11 VDDA_TEMP1 VDDA_TEMP1 PWR
L9 VDDA_TEMP2 VDDA_TEMP2 PWR
F12 PADCONFIG Off / Off / Off Off / SS / Off 0 1.8 V/3.3 V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG33 MCU_GPIO0_23 7 IO pad
0x04084084
B3 PADCONFIG MCU_SPI0_CS2 2 IO 1 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG9
0x04084024 MCU_GPIO0_9 7 IO pad
WKUP_UART0_TXD WKUP_UART0_TXD 0 O
C8 PADCONFIG MCU_SPI1_CS2 2 IO 1 Off / Off / Off Off / Off / Off 7 1.8 V/3.3 V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG10
0x04084028 MCU_GPIO0_10 7 IO pad
Note
Signal names and descriptions provided in each Signal Descriptions table, represent the pin
multiplexed signal function which is implemented at the pin and selected via PADCONFIG registers.
Device subsystems may provide secondary multiplexing of signal functions, which are not described
in these tables. For more information on secondary multiplexed signal functions, see the respective
peripheral chapter of the device TRM.
5.3.2 CPTS
5.3.2.1 MAIN Domain
Table 5-6. CPTS Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
CP_GEMAC_CPTS0_RFT_CLK I CPTS Reference Clock Input A23
CP_GEMAC_CPTS0_TS_COMP O CPTS Time Stamp Counter Compare Output from C20, H25
CPSW3G0 CPTS
5.3.3 CSI-2
5.3.3.1 MAIN Domain
Table 5-7. CSIRX0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] ((2)) DESCRIPTION [3] AMW PIN [4]
[2]
CSI0_RXCLKN I CSI Differential Receive Clock Input (negative) AC7
CSI0_RXCLKP I CSI Differential Receive Clock Input (positive) AC6
CSI0_RXRCALIB (1) A CSI pin connected to external resistor for on-chip resistor AB8
calibration
CSI0_RXN0 I CSI Differential Receive Input (negative) AD6
CSI0_RXN1 I CSI Differential Receive Input (negative) AE5
CSI0_RXN2 I CSI Differential Receive Input (negative) AF4
CSI0_RXN3 I CSI Differential Receive Input (negative) AG3
CSI0_RXP0 I CSI Differential Receive Input (positive) AD5
CSI0_RXP1 I CSI Differential Receive Input (positive) AE4
CSI0_RXP2 I CSI Differential Receive Input (positive) AF3
CSI0_RXP3 I CSI Differential Receive Input (positive) AG2
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) CSI TX functionality is available on the DSI pins. For more information, refer to Section 5.3.5.1.1, DSITX0 Signal Descriptions.
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
5.3.4 DDRSS
5.3.4.1 MAIN Domain
Table 5-11. DDRSS0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
DDR0_CAS_n (1) O DDRSS Column Address Strobe / LPDDR4 Chip Select M4
1B
DDR0_RAS_n (1) O DDRSS Row Address Strobe / LPDDR4 Chip Select 0B M3
DDR0_A0 O DDRSS Address Bus L4
DDR0_A1 O DDRSS Address Bus L6
DDR0_A2 O DDRSS Address Bus M5
DDR0_A3 O DDRSS Address Bus L3
DDR0_A4 O DDRSS Address Bus N2
DDR0_A5 O DDRSS Address Bus L2
DDR0_CAL0 (2) A IO Pad Calibration Resistor R6
(1) DDRSS implements different signal functions on Column Address Strobe, Row Address Strobe, Chip Select 0, and Chip Select 1
when configured to operate with LPDDR4 memory devices. These signals function as Chip Select 1B, Chip Select 0B, Chip Select 0A,
and Chip Select 1A respectively when DDRSS is configured to operate with LPDDR4 memory devices. For more information, refer to
Section 8.2.1, DDR Board Design and Layout Guidelines.
(2) An external 240 Ω ±1% resistor must be connected between this pin and VSS. No external voltage should be applied to this pin.
5.3.5 DSI
5.3.5.1 MAIN Domain
Table 5-12. DSITX0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] ((2)) DESCRIPTION [3] AMW PIN [4]
[2]
DSI0_TXCLKN IO DSI Differential Transmit Clock Ouput (negative) AE16
DSI0_TXCLKP IO DSI Differential Transmit Clock Ouput (positive) AE17
DSI0_TXRCALIB (1) A DSI pin connected to external resistor for on-chip resistor AA16
calibration
DSI0_TXN0 IO DSI Differential Transmit Ouput (negative) AD17
DSI0_TXN1 IO DSI Differential Transmit Ouput (negative) AF15
DSI0_TXN2 IO DSI Differential Transmit Ouput (negative) AG14
DSI0_TXN3 IO DSI Differential Transmit Ouput (negative) AC18
DSI0_TXP0 IO DSI Differential Transmit Ouput (positive) AD18
DSI0_TXP1 IO DSI Differential Transmit Ouput (positive) AF16
DSI0_TXP2 IO DSI Differential Transmit Ouput (positive) AG15
DSI0_TXP3 IO DSI Differential Transmit Ouput (positive) AC19
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) The functionality of these pins is controlled by DPHY_TX0_CTRL[1:0] LANE_FUNC_SEL. 0x0 = DSI PPI, 0x1 = CSI0 TX.
5.3.6 DSS
5.3.6.1 MAIN Domain
Table 5-13. DSS0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
VOUT0_DE O Video Output Data Enable AC27
VOUT0_EXTPCLKIN I Video Output External Pixel Clock Input W26
VOUT0_HSYNC O Video Output Horizontal Sync AB24
VOUT0_PCLK O Video Output Pixel Clock Output AC26
VOUT0_VSYNC O Video Output Vertical Sync AB23
VOUT0_DATA0 O Video Output Data 0 W27
VOUT0_DATA1 O Video Output Data 1 W25
VOUT0_DATA2 O Video Output Data 2 W24
VOUT0_DATA3 O Video Output Data 3 W23
5.3.7 ECAP
5.3.7.1 MAIN Domain
Table 5-14. ECAP0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
ECAP0_IN_APWM_OUT IO Enhanced Capture (ECAP) Input or Auxiliary PWM A23, C20
(APWM) Ouput
5.3.9 EPWM
5.3.9.1 MAIN Domain
Table 5-19. EPWM Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
EHRPWM_SOCA O EHRPWM Start of Conversion A D23
EHRPWM_SOCB O EHRPWM Start of Conversion B B22
5.3.10 EQEP
5.3.10.1 MAIN Domain
Table 5-23. EQEP0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
EQEP0_A (1) I EQEP Quadrature Input A A25
EQEP0_B (1) I EQEP Quadrature Input B A26
EQEP0_I (1) IO EQEP Index F23
EQEP0_S (1) IO EQEP Strobe B25
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
5.3.11 GPIO
5.3.11.1 MAIN Domain
Table 5-26. GPIO0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
GPIO0_0 IO General Purpose Input/Output L24
GPIO0_1 IO General Purpose Input/Output L23
GPIO0_2 IO General Purpose Input/Output L22
GPIO0_3 IO General Purpose Input/Output K27
GPIO0_4 IO General Purpose Input/Output L27
GPIO0_5 IO General Purpose Input/Output L26
GPIO0_6 IO General Purpose Input/Output L25
GPIO0_7 IO General Purpose Input/Output L21
GPIO0_8 IO General Purpose Input/Output M26
GPIO0_9 IO General Purpose Input/Output N27
GPIO0_10 IO General Purpose Input/Output M27
GPIO0_11 IO General Purpose Input/Output K26
GPIO0_12 IO General Purpose Input/Output K23
GPIO0_13 (1) IO General Purpose Input/Output K22
GPIO0_14 (1) IO General Purpose Input/Output J22
GPIO0_15 IO General Purpose Input/Output R22
GPIO0_16 IO General Purpose Input/Output R23
GPIO0_17 IO General Purpose Input/Output R26
GPIO0_18 IO General Purpose Input/Output T27
GPIO0_19 IO General Purpose Input/Output T25
GPIO0_20 IO General Purpose Input/Output T24
GPIO0_21 IO General Purpose Input/Output T21
GPIO0_22 IO General Purpose Input/Output T22
GPIO0_23 IO General Purpose Input/Output U27
GPIO0_24 IO General Purpose Input/Output U26
GPIO0_25 IO General Purpose Input/Output V27
GPIO0_26 IO General Purpose Input/Output V25
GPIO0_27 IO General Purpose Input/Output V26
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
5.3.11.2 MCU Domain
Table 5-28. MCU_GPIO0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MCU_GPIO0_0 (1) IO General Purpose Input/Output C12
MCU_GPIO0_1 (1) IO General Purpose Input/Output A10
MCU_GPIO0_2 IO General Purpose Input/Output A9
MCU_GPIO0_3 IO General Purpose Input/Output B12
MCU_GPIO0_4 IO General Purpose Input/Output C11
MCU_GPIO0_5 IO General Purpose Input/Output B8
MCU_GPIO0_6 IO General Purpose Input/Output B4
MCU_GPIO0_7 (1) IO General Purpose Input/Output B5
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
5.3.12 GPMC
5.3.12.1 MAIN Domain
Table 5-29. GPMC0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
GPMC0_ADVn_ALE O GPMC Address Valid (active low) or Address Latch N21
Enable
GPMC0_CLK O GPMC clock T23
GPMC0_DIR O GPMC Data Bus Signal Direction Control N25
GPMC0_FCLK_MUX O GPMC functional clock output T23
GPMC0_OEn_REn O GPMC Output Enable (active low) or Read Enable N22
(active low)
GPMC0_WEn O GPMC Write Enable (active low) N23
GPMC0_WPn O GPMC Flash Write Protect (active low) N24
GPMC0_A0 OZ GPMC Address 0 Output. Only used to effectively W27
address 8-bit data non-multiplexed memories
GPMC0_A1 OZ GPMC address 1 Output in A/D non-multiplexed mode W25
and Address 17 in A/D multiplexed mode
GPMC0_A2 OZ GPMC address 2 Output in A/D non-multiplexed mode W24
and Address 18 in A/D multiplexed mode
GPMC0_A3 OZ GPMC address 3 Output in A/D non-multiplexed mode W23
and Address 19 in A/D multiplexed mode
GPMC0_A4 OZ GPMC address 4 Output in A/D non-multiplexed mode W22
and Address 20 in A/D multiplexed mode
GPMC0_A5 OZ GPMC address 5 Output in A/D non-multiplexed mode W21
and Address 21 in A/D multiplexed mode
GPMC0_A6 OZ GPMC address 6 Output in A/D non-multiplexed mode Y26
and Address 22 in A/D multiplexed mode
GPMC0_A7 OZ GPMC address 7 Output in A/D non-multiplexed mode Y27
and Address 23 in A/D multiplexed mode
5.3.13 I2C
5.3.13.1 MAIN Domain
Table 5-30. I2C0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
I2C0_SCL IOD I2C Clock D23
I2C0_SDA IOD I2C Data B22
5.3.14 MCAN
5.3.14.1 MAIN Domain
Table 5-37. MCAN0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MCAN0_RX I MCAN Receive Data C22
MCAN0_TX O MCAN Transmit Data D22
5.3.15 MCASP
5.3.15.1 MAIN Domain
Table 5-41. MCASP0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MCASP0_ACLKR IO MCASP Receive Bit Clock F24
MCASP0_ACLKX IO MCASP Transmit Bit Clock D25
MCASP0_AFSR IO MCASP Receive Frame Sync C27
MCASP0_AFSX IO MCASP Transmit Frame Sync C26
MCASP0_AXR0 IO MCASP Serial Data (Input/Output) F23
MCASP0_AXR1 IO MCASP Serial Data (Input/Output) B25
MCASP0_AXR2 IO MCASP Serial Data (Input/Output) A26
MCASP0_AXR3 IO MCASP Serial Data (Input/Output) A25
5.3.16 MCSPI
5.3.16.1 MAIN Domain
Table 5-46. MCSPI0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
SPI0_CLK IO SPI Clock D20
SPI0_CS0 IO SPI Chip Select 0 B20
SPI0_CS1 IO SPI Chip Select 1 C20
SPI0_CS2 IO SPI Chip Select 2 E22
SPI0_CS3 IO SPI Chip Select 3 B21
SPI0_D0 IO SPI Data 0 E19
SPI0_D1 IO SPI Data 1 E20
5.3.17 MDIO
5.3.17.1 MAIN Domain
Table 5-51. MDIO0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MDIO0_MDC O MDIO Clock AC24
MDIO0_MDIO IO MDIO Data AD25
5.3.18 MMC
5.3.18.1 MAIN Domain
Table 5-52. MMC0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MMC0_CALPAD (1) A MMC/SD/SDIO Calibration Resistor AC1
MMC0_CLK IO MMC/SD/SDIO Clock AE1
MMC0_CMD IO MMC/SD/SDIO Command AE2
MMC0_DS IO MMC Data Strobe AD1
MMC0_DAT0 IO MMC/SD/SDIO Data AD3
MMC0_DAT1 IO MMC/SD/SDIO Data AD2
MMC0_DAT2 IO MMC/SD/SDIO Data AB4
MMC0_DAT3 IO MMC/SD/SDIO Data AC2
MMC0_DAT4 IO MMC/SD/SDIO Data AC3
MMC0_DAT5 IO MMC/SD/SDIO Data AB3
MMC0_DAT6 IO MMC/SD/SDIO Data AF1
(1) An external 10 kΩ ±1% resistor must be connected between this pin and VSS. No external voltage should be applied to this pin.
5.3.19 OLDI
5.3.19.1 MAIN Domain
Table 5-55. OLDI0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
OLDI0_A0N IO OLDI Differential Data (negative) AF23
OLDI0_A0P IO OLDI Differential Data (positive) AG24
OLDI0_A1N IO OLDI Differential Data (negative) AG22
OLDI0_A1P IO OLDI Differential Data (positive) AG23
OLDI0_A2N IO OLDI Differential Data (negative) AB20
OLDI0_A2P IO OLDI Differential Data (positive) AB21
OLDI0_A3N IO OLDI Differential Data (negative) AG20
OLDI0_A3P IO OLDI Differential Data (positive) AG21
OLDI0_A4N IO OLDI Differential Data (negative) AD21
OLDI0_A4P IO OLDI Differential Data (positive) AC21
OLDI0_A5N IO OLDI Differential Data (negative) AF19
OLDI0_A5P IO OLDI Differential Data (positive) AF18
OLDI0_A6N IO OLDI Differential Data (negative) AG17
OLDI0_A6P IO OLDI Differential Data (positive) AG18
5.3.20 OSPI
5.3.20.1 MAIN Domain
Table 5-56. OSPI0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
OSPI0_CLK O OSPI Clock L24
OSPI0_DQS I OSPI Data Strobe (DQS) or Loopback Clock Input L22
OSPI0_ECC_FAIL I OSPI ECC Status J22
OSPI0_LBCLKO IO OSPI Loopback Clock Output L23
OSPI0_CSn0 O OSPI Chip Select 0 (active low) K26
OSPI0_CSn1 O OSPI Chip Select 1 (active low) K23
OSPI0_CSn2 O OSPI Chip Select 2 (active low) K22
OSPI0_CSn3 O OSPI Chip Select 3 (active low) J22
OSPI0_D0 IO OSPI Data 0 K27
OSPI0_D1 IO OSPI Data 1 L27
OSPI0_D2 IO OSPI Data 2 L26
OSPI0_D3 IO OSPI Data 3 L25
OSPI0_D4 IO OSPI Data 4 L21
OSPI0_D5 IO OSPI Data 5 M26
OSPI0_D6 IO OSPI Data 6 N27
OSPI0_D7 IO OSPI Data 7 M27
OSPI0_RESET_OUT0 O OSPI Reset J22
OSPI0_RESET_OUT1 O OSPI Reset K22
(1) This pin must always be connected via a 1-μF capacitor to VSS.
5.3.22 Reserved
Table 5-58. Reserved Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
RSVD0 N/A Reserved, must be left unconnected E9
RSVD1 N/A Reserved, must be left unconnected AA19
RSVD2 N/A Reserved, must be left unconnected AB7
RSVD3 N/A Reserved, must be left unconnected AC5
RSVD4 N/A Reserved, must be left unconnected AB10
RSVD5 N/A Reserved, must be left unconnected AA12
RSVD6 N/A Reserved, must be left unconnected AB12
RSVD7 N/A Reserved, must be left unconnected AB13
5.3.23 SERDES
5.3.23.1 MAIN Domain
Table 5-59. PCIE0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
PCIE0_CLKREQn IOD PCIE Clock Request Signal F25
(1) An external 3.01 kΩ ±1% resistor must be connected between this pin and VSS. No external voltage should be applied to this pin.
(2) The functionality of these pins is controlled by SERDES0_LN0_CTRL.
(1) An external 3.01 kΩ ±1% resistor must be connected between this pin and VSS. No external voltage should be applied to this pin.
5.3.24.2 Clock
5.3.24.2.1 MCU Domain
Table 5-63. MCU Clock Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
MCU_OSC0_XI I High frequency oscillator input A5
MCU_OSC0_XO O High frequency oscillator output A6
5.3.24.3 System
5.3.24.3.1 MAIN Domain
Table 5-65. System Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
AUDIO_EXT_REFCLK0 IO External clock input to McASP or output from McASP E22, F23, W23
AUDIO_EXT_REFCLK1 IO External clock input to McASP or output from McASP B21, C26, N24
AUDIO_EXT_REFCLK2 IO External clock input to McASP or output from McASP W26
5.3.24.4 VMON
Table 5-68. VMON Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
VMON_1P8_SOC A Voltage monitor input for 1.8 V SoC power supply J7
VMON_3P3_SOC A Voltage monitor input for 3.3 V SoC power supply K7
VMON_ER_VSYS A Voltage monitor input, fixed 0.45 V (+/-3%) threshold. G7
Use with external precision voltage divider to monitor a
higher voltage rail such as the PMIC input supply.
5.3.25 TIMER
5.3.25.1 MAIN Domain
Table 5-69. TIMER Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
TIMER_IO0 IO Timer Inputs and Outputs (not tied to single timer C24, H25
instance)
TIMER_IO1 IO Timer Inputs and Outputs (not tied to single timer A22, J23
instance)
TIMER_IO2 IO Timer Inputs and Outputs (not tied to single timer D22, H20
instance)
TIMER_IO3 IO Timer Inputs and Outputs (not tied to single timer C22, H23
instance)
TIMER_IO4 IO Timer Inputs and Outputs (not tied to single timer A23, H24
instance)
TIMER_IO5 IO Timer Inputs and Outputs (not tied to single timer B22, H22
instance)
TIMER_IO6 I Timer Inputs and Outputs (not tied to single timer B24, E22
instance)
TIMER_IO7 IO Timer Inputs and Outputs (not tied to single timer A24, B21
instance)
5.3.26 UART
5.3.26.1 MAIN Domain
Table 5-72. UART0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
UART0_CTSn I UART Clear to Send (active low) E22
UART0_RTSn O UART Request to Send (active low) B21
UART0_RXD I UART Receive Data F19
UART0_TXD O UART Transmit Data F20
5.3.27 USB
5.3.27.1 MAIN Domain
Table 5-81. USB0 Signal Descriptions
PIN TYPE
SIGNAL NAME [1] DESCRIPTION [3] AMW PIN [4]
[2]
USB0_DM IO USB 2.0 Differential Data (negative) AB5
USB0_DP IO USB 2.0 Differential Data (positive) AA6
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) An external resistor divider is required to limit the voltage applied to the device pin. For more information, see Section 8.2.3, USB
VBUS Design Guidelines.
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) An external resistor divider is required to limit the voltage applied to the device pin. For more information, see Section 8.2.3, USB
VBUS Design Guidelines.
5.4 Pin Connectivity Requirements
This section describes connectivity requirements for package balls that have specific connectivity requirements
and unused package balls.
Note
All power pins must be supplied with the voltages specified in Recommended Operating Conditions,
unless otherwise specified.
Note
For additional clarification, "leave unconnected" or "no connect" (NC) means no signal traces can be
connected to these device ball numbers.
(1) To determine which power supply is associated with any IO, see the POWER column of the Pin Attributes table.
Note
All other unused signal balls with a Pad Configuration Register can be left unconnected with their
multiplexing mode set to GPIO input and internal pull-down resistor enabled. Unused balls are defined
as those which only connect to a PCB solder pad. This is the only use case where internal pull
resistors are allowed as the only source/sink to hold a valid logic level. Any balls connected to a via,
test point, or PCB trace are consider used and must not depend on the internal pull resistor to hold a
valid logic level.
Internal pull resistors are weak and may not source enough current to maintain a valid logic level
for some operating conditions. This can be the case when connected to components with leakage
to the opposite logic level, or when external noise sources couple to signal traces attached to balls
which are only pulled to a valid logic level by the internal resistor. Therefore, external pull resistors are
recommended to hold a valid logic level on balls with external connections.
Many of the device IOs are turned off by default and external pull resistors may be required to hold
inputs of any attached device in a valid logic state until software initializes the respective IOs. The
state of configurable device IOs are defined in the BALL STATE DURING RESET RX/TX/PULL and
BALL STATE AFTER RESET RX/TX/PULL columns of the Pin Attributes table. Any IO with its input
buffer (RX) turned off is allowed to float without damaging the device. However, any IO with its input
buffer (RX) turned on shall never be allowed to float to any potential between VILSS and VIHSS. The
input buffer can enter a high-current state which could damage the IO cell if allowed to float between
these levels.
6 Specifications
Note
All specifications listed are preliminary and may change during device characterization.
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) The absolute maximum ratings for these fail-safe pins depends on their IO supply operating voltage. Therefore, this value is also
defined by the maximum VIH value found in the I2C Open-Drain, and Fail-Safe (I2C OD FS) Electrical Characteristics section, where
the electrical characteristics table has separate parameter values for 1.8-V mode and 3.3-V mode.
(4) The VMON_VSYS pin provides a way to monitor the system power supply. For more information, see System Power Supply Monitor
Design Guidelines.
(5) This parameter applies to all IO pins which are not fail-safe and the requirement applies to all values of IO supply voltage. For
example, if the voltage applied to a specific IO supply is 0 volts the valid input voltage range for any IO powered by that supply will be
–0.3 to +0.3 volts. Special attention should be applied anytime peripheral devices are not powered from the same power sources used
to power the respective IO supply. It is important the attached peripheral never sources a voltage outside the valid input voltage range,
including power supply ramp-up and ramp-down sequences.
(6) An external resistor divider is required to limit the voltage applied to this device pin. For more information, see the USB VBUS Design
Guidelines.
(7) VDD is the voltage on the corresponding power-supply pin(s) for the IO.
(8) For current pulse injection (I-Test):
• Pins stressed per JEDEC JESD78 (Class II) and passed with specified I/O pin injection current and clamp voltage of 1.5 times
maximum recommended I/O voltage and negative 0.5 times maximum recommended I/O voltage.
Fail-safe IO terminals are designed such they do not have dependencies on the respective IO power supply
voltage. This allows external voltage sources to be connected to these IO terminals when the respective IO
power supplies are turned off. The MCU_I2C0_SCL, MCU_I2C0_SDA, WKUP_I2C0_SCL, WKUP_I2C0_SDA,
EXTINTn, VMON_1P8_SOC, VMON_3P3_SOC, and MCU_PORz are the only fail-safe IO terminals. All other IO
terminals are not fail-safe and the voltage applied to them should be limited to the value defined by the Steady
State Max. Voltage at all IO pins parameter in Section 6.1.
Tperiod
Tundershoot
6.2 ESD Ratings for Devices which are not AEC - Q100 Qualified
VALUE UNIT
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Power-On Hours (POH)
POWER ON HOURS (POH)(1) (2) (3)
JUNCTION TEMPERATURE RANGE (TJ)(4) LIFETIME (POH)
–40°C to 105°C 100000
–40°C to 125°C 20000(5)
(1) This information is provided solely for your convenience and does not extend or modify the
warranty provided under TI's standard terms and conditions for TI semiconductor products.
(2) Unless specified in the table above, all voltage domains and operating conditions are supported in
the device at the noted temperatures.
(3) POH is a function of voltage, temperature and time. Usage at higher voltages and temperatures will
result in a reduction in POH.
(4) Either –40 to 105C or –40 to 125C profile should be chosen and applied through the lifetime of
the application. Mixing of these profiles for the purposes of extending temperature and/or POH may
result in increased reliability failure risk and is not recommended.
(5) The –40 to 125C profile is defined as 20000 power on hours with a junction temperature as follows:
5%@–40°C, 65%@70°C, 20%@110°C, and 10%@125°C.
(1) The voltage at the device ball must never drop below the MIN voltage or rise above the MAX voltage for any amount of time during
normal device operation.
(2) VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_DSI_CLK, VDDA_CORE_USB, and VDDA_DDR_PLL0 shall be sourced from
the same power source. Care should be taken to ensure that voltage differential between VDD_CORE and VDDA_CORE_USB is
within +/- 1%.
(3) VDD_CANUART shall be connected to an always on power source when using Partial IO or IO Only + DDR Self-refresh low power
modes. VDD_CANUART shall be connected to the same power source as VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_USB,
and VDDA_DDR_PLL0 when not using Partial IO or IO Only + DDR Self-refresh low power modes.
(4) VDD_MMC0 and VDDA_0P85_DLL_MMC0 must be connected to the same power source as VDD_CORE when MMC0 is not used. In
this case, VDD_MMC0 and VDDA_0P85_DLL_MMC0 may be operated at a nominal voltage of 0.75 or 0.85.
(5) VDDS_DDR and VDDS_DDR_C shall be sourced from the same power source.
(6) Refer to the Recommended Operating Conditions for OTP eFuse Programming table for VPP supply voltages based on eFuse usage.
(7) The VMON_VSYS pin provides a way to monitor the system power supply. For more information, see System Power Supply Monitor
Design Guidelines.
(8) An external resistor divider is required to limit the voltage applied to this device pin. For more information, see USB VBUS Design
Guidelines.
(9) VDDSHV_CANUART shall be connected to an always on power source when using Partial IO or IO Only + DDR Self-refresh low
power modes. VDDSHV_CANUART shall be connected to any valid IO power source when not using Partial IO or IO Only + DDR
Self-refresh low power modes.
High From From 800 500 800 400 800 400 400 500, From
PLL BP PLL BP Speed 400, PLL BP
to Speed to Speed Grade 600 428.5 200, to Speed
Grade Grade Max or Grade
Low Max Max 400 250 400 200 400 133 133 100 Max
(1) Default operating frequency, set by software at boot. Supports Dynamic Frequency Scaling after boot.
(2) Fixed operating frequency, set by software at boot.
(3) Maximum DDR Frequency will be limited based on the specific memory type (vendor) used in a system and by PCB implementation.
Refer to LPDDR4 Board Design and Layout Guidelines for the proper PCB implementation to achieve maximum DDR frequency.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(2) This value also defines the Absolute Maximum Ratings value the IO.
(3) The IOL parameter defines the minimum Low Level Output Current for which the device is able to maintain the specified VOL value.
The value defined by this parameter should be considered the maximum current available to a system implementation which needs to
maintain the specified VOL value for attached components.
(4) f = toggle frequency of the input signal in Hz.
(5) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(6) I2C Hs-mode is not supported when operating the IO in 3.3V mode.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(2) The IOL and IOH parameters define the minimum Low Level Output Current and High Level Output Current for which the device is
able to maintain the specified VOL and VOH values. Values defined by these parameters should be considered the maximum current
available to a system implementation which needs to maintain the specified VOL and VOH values for attached components.
(3) f = toggle frequency of the input signal in Hz.
(4) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(2) The IOL and IOH parameters define the minimum Low Level Output Current and High Level Output Current for which the device is
able to maintain the specified VOL and VOH values. Values defined by these parameters should be considered the maximum current
available to a system implementation which needs to maintain the specified VOL and VOH values for attached components.
(3) f = toggle frequency of the input signal in Hz.
(4) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
Note
CSIRX0 is compliant with MIPI DPHY v1.2 dated August 1, 2014, including ECNs and Errata as
applicable.
Note
The USB0 and USB1 interfaces are compliant with Universal Serial Bus Revision 2.0 Specification
dated April 27, 2000 including ECNs and Errata as applicable.
Note
The DDR interface is compatible with LPDDR4 devices that are JESD209-4B standard-compliant
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Packages
(2) m/s = meters per second.
(3) °C/W = degrees Celsius per watt.
Note
The default SLEWRATE settings in each pad configuration register must be used to ensure timings,
unless specific instructions are given otherwise.
Note
All power balls must be supplied with the voltages specified in the Recommended Operating
Conditions section, unless otherwise specified in Signal Descriptions and Pin Connectivity
Requirements.
Supply value
t
slew rate < 18 mV/μs
slew > (supply value) / (18 mV/μs)
or
supply value × 55.6 μs/V
SPRT740_ELCH_06
Figure 6-4 defines a transition region with one or more power rails which must be sourced from a single common
power supply. No transitions are shown within the region to represent a single ramp within the transition region.
Note
The power supply sequencing requirements defined in this section does not include entry or exit
from low power modes. See the Partial IO Power Sequencing section for more information on the
requirements for entering or exiting from Partial IO low power mode.
Note
All power rails must be turned off and decay below 300mV before initiating a new power-up
sequence anytime a power rail drops below the minimum value defined in Recommended
Operating Conditions. The only exception is when entering/exiting Partial IO low power mode with
VDDSHV_CANUART and VDD_CANUART sourced from an always on power source. For this use
case the VDDSHV_CANUART and VDD_CANUART power rails are allowed to remain on.
(1) VSYS represents the name of a supply which sources power to the entire system. This supply is expected to be a pre-regulated supply
that sources power management devices which source all other supplies.
(2) VMON_VSYS input is used to monitor VSYS via an external resistor divider circuit. For more information, see the Section 8.2.4,
System Power Supply Monitor Design Guidelines.
(3) VDDSHV_CANUART, VDDSHV_MCU, and VDDSHVx [x=0-3] are dual voltage IO supplies which can be operated at 1.8V or 3.3V
depending on the application requirements.
VDDSHV_CANUART shall be connected to an always-on power source when using Partial IO low power mode, or connected to any
valid IO power source when not using Partial IO low power mode. When VDDSHV_CANUART is not connected to an always-on power
source and is operating at 3.3V, it shall be ramped up with other 3.3V supplies during the 3.3V ramp period defined by this waveform.
When any of the VDDSHV_MCU and VDDSHVx [x=0-3] IO supplies are operating at 3.3V, they shall be ramped up with other 3.3V
supplies during the 3.3V ramp period defined by this waveform.
(4) The VMON_3P3_SOC input is used to monitor supply voltage and shall be connected to the respective 3.3V supply source.
(5) VDDSHV_CANUART, VDDSHV_MCU, and VDDSHVx [x=0-3] are dual voltage IO supplies which can be operated at 1.8V or 3.3V
depending on the application requirements.
VDDSHV_CANUART shall be connected to an always-on power source when using Partial IO low power mode, or connected to any
valid IO power source when not using Partial IO low power mode. When VDDSHV_CANUART is not connected to an always-on power
source and is operating at 1.8V, it shall be ramped up with other 1.8V supplies during the 1.8V ramp period defined by this waveform.
When any of the VDDSHV_MCU and VDDSHVx [x=0-3] IO supplies are operating at 1.8V, they shall be ramped up with other 1.8V
supplies during the 1.8V ramp period defined by this waveform.
(6) The VMON_1P8_SOC input is used to monitor supply voltage and shall be connected to the respective 1.8V supply source.
(7) VDDSHV5, and VDDSHV6 were designed to support power-up, power-down, or dynamic voltage change without any dependency on
other power rails. This capability is required to support UHS-I SD Cards.
(8) VDDS_DDR and VDDS_DDR_C are expected to be powered by the same source such that they ramp together.
(9) VDD_CANUART shall be connected to an always-on power source when using Partial IO low power mode.
When VDD_CANUART is connected to an always-on power source, the potential applied to VDD_CORE must never be greater than
the potential applied to VDD_CANUART + 0.18V during power-up or power-down. This requires VDD_CANUART to ramp up before
and ramp down after VDD_CORE. VDD_CANUART does not have any ramp requirements beyond the one defined for VDD_CORE.
(10) VDD_CANUART shall be connected to the same power source as VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_DSI_CLK,
VDDA_CORE_USB, and VDDA_DDR_PLL0 when not using Partial IO low power mode.
VDD_CANUART, VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_DSI_CLK, VDDA_CORE_USB, and VDDA_DDR_PLL0 can
be operated at 0.75V or 0.85V. When these supplies are operating at 0.75V, they shall be ramped up prior to VDDR_CORE as defined
by this waveform.
(11) VDD_CANUART shall be connected to the same power source as VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_DSI_CLK,
VDDA_CORE_USB, and VDDA_DDR_PLL0 when not using Partial IO low power mode.
VDD_CANUART, VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_DSI_CLK, VDDA_CORE_USB, and VDDA_DDR_PLL0 can
be operated at 0.75V or 0.85V. When these supplies are operating at 0.85V, they shall be powered from the same source as
VDDR_CORE and ramped during the 0.85V ramp period defined by this waveform.
(12) The potential applied to VDDR_CORE must never be greater than the potential applied to VDD_CORE + 0.18V during power-up or
power-down. This requires VDD_CORE to ramp up before and ramp down after VDDR_CORE when VDD_CORE is operating at
0.75V. VDD_CORE does not have any ramp requirements beyond the one defined for VDDR_CORE.
VDD_CORE and VDDR_CORE are expected to be powered by the same source so they ramp together when VDD_CORE is
operating at 0.85V.
(13) VPP is the 1.8V eFuse programming supply, which shall be left floating (HiZ) or grounded during power-up/down sequences and
during normal device operation. This supply shall only be sourced while programming eFuse.
VSYS
Waveform A VMON_VSYS
Waveform B
Waveform C
Waveform D
Waveform E
Waveform F
Waveform G
Waveform H
Waveform I Hi-Z
Waveform J
Waveform K
AM62Ax_ELCH_01
Note
The power supply sequencing requirements defined in this section does not include entry or exit
from low power modes. See the Partial IO Power Sequencing section for more information on the
requirements for entering or exiting from Partial IO low power mode.
Note
All power rails must be turned off and decay below 300mV before initiating a new power-up
sequence anytime a power rail drops below the minimum value defined in Recommended
Operating Conditions. The only exception is when entering/exiting Partial IO low power mode with
VDDSHV_CANUART and VDD_CANUART sourced from an always on power source. For this use
case the VDDSHV_CANUART and VDD_CANUART power rails are allowed to remain on.
VSYS
Horizontal dashed lines represent a use case where the system power remains turned “on”
Waveform A VMON_VSYS while the device power management solution is turned “off”.
Waveform B
Waveform C
Waveform D
Waveform E
Waveform F
Waveform G
Waveform H
Waveform I Hi-Z
Waveform J
Waveform K
AM62Ax_ELCH_02
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
Table 6-7. MCU_PORz Timing Requirements
see Figure 6-7
NO. PARAMETER MIN MAX UNIT
Hold time, MCU_PORz active (low) at Power-up
RST1 9500000 ns
after supplies valid (using external crystal circuit)
th(SUPPLIES_VALID - MCU_PORz) Hold time, MCU_PORz active (low) at Power-up
RST2 after supplies valid and external clock stable (using 1200 ns
external LVCMOS clock source)
Pulse Width, MCU_PORz low after Power-up
RST3 tw(MCU_PORzL) (without removal of Power or system reference 1200 ns
clock MCU_OSC0_XI/XO)
(1) This timing parameter is valid only after all supplies are valid and MCU_PORz has been asserted for the specified time.
Table 6-10. MCU_RESETSTATz, and RESETSTATz Switching Characteristics
see Figure 6-9
NO. PARAMETER MIN MAX UNIT
Delay time, MCU_RESETz active (low) to
RST11 td(MCU_RESETzL-MCU_RESETSTATzL) 0 ns
MCU_RESETSTATz active (low)
Delay time, MCU_RESETz inactive (high) to
RST12 td(MCU_RESETzH-MCU_RESETSTATzH) 966*S(1) ns
MCU_RESETSTATz inactive (high)
RST13 td(MCU_RESETzL-RESETSTATzL) Delay time, MCU_RESETz active (low) to
960 ns
RESETSTATz active (low)
RST14 td(MCU_RESETzH-RESETSTATzH) Delay time, MCU_RESETz inactive (high) to
4040*S(1) ns
RESETSTATz inactive (high)
Figure 6-9. MCU_RESETz, MCU_RESETSTATz, and RESETSTATz Timing Requirements and Switching
Characteristics
(1) This timing parameter is valid only after all supplies are valid and MCU_PORz has been asserted for the specified time.
Table 6-12. RESETSTATz Switching Characteristics
see Figure 6-10
NO. PARAMETER MIN MAX UNIT
Delay time, RESET_REQz active (low) to
RST16 td(RESET_REQzL-RESETSTATzL) 900*T(1) ns
RESETSTATz active (low)
Delay time, RESET_REQz inactive (high) to
RST17 td(RESET_REQzH-RESETSTATzH) 4040*S(2) ns
RESETSTATz inactive (high)
Figure 6-10. RESET_REQz and RESETSTATz Timing Requirements and Switching Characteristics
ERR1
MCU_ERRORn
(PWM Mode Enabled)
ERR2
ERR3
MCU_ERRORn
(PWM Mode Disabled)
Input Clock
Output Clock
Device
MCU_OSC0_XI MCU_OSC0_XO
Crystal
CL1 CL2
PCB Ground
AM65x_MCU_OSC_INT_01
The crystal must be in the fundamental mode of operation and parallel resonant. Table 6-21 summarizes the
required electrical constraints.
Table 6-21. MCU_OSC0 Crystal Circuit Requirements
PARAMETER MIN TYP MAX UNIT
Fxtal Crystal Parallel Resonance Frequency 25 MHz
Fxtal Crystal Frequency Stability and Tolerance Ethernet RGMII and RMII ±100 ppm
not used
Ethernet RGMII and RMII ±50
using derived clock
CL1+PCBXI Capacitance of CL1 + CPCBXI 12 24 pF
CL2+PCBXO Capacitance of CL2 + CPCBXO 12 24 pF
CL Crystal Load Capacitance 6 12 pF
Cshunt Crystal Circuit Shunt Capacitance ESRxtal = 30Ω 25MHz 7 pF
ESRxtal = 40Ω 25MHz 5 pF
ESRxtal = 50Ω 25MHz 5 pF
ESRxtal Crystal Effective Series Resistance (1) Ω
(1) The maximum ESR of the crystal is a function of the crystal frequency and shunt capacitance. See the Cshunt parameter.
When selecting a crystal, the system design must consider temperature and aging characteristics of the crystal
based on worst case environment and expected life expectancy of the system.
Table 6-22 details the switching characteristics of the oscillator.
Table 6-22. MCU_OSC0 Switching Characteristics - Crystal Mode
PARAMETER MIN TYP MAX UNIT
CXI XI Capacitance 2.04 pF
CXO XO Capacitance 1.91 pF
CXIXO XI to XO Mutual Capacitance 0.01 pF
VDD_CORE (min.)
VDD_CORE
VSS
Voltage
VSS MCU_OSC0_XO
tsX
Time
AM65x_MCU_OSC_STARTUP_02
Device
Crystal Circuit PCB
Components Signal Traces
MCU_OSC0_XI
MCU_OSC0_XO
AM65x_MCU_OSC_CC_05
Load capacitors, CL1 and CL2 in Figure 6-16, should be chosen such that the below equation is satisfied. CL in
the equation is the load specified by the crystal manufacturer.
CL = [(CL1 + CPCBXI + CXI) × (CL2 + CPCBXO + CXO)] / [(CL1 + CPCBXI + CXI) + (CL2 + CPCBXO + CXO)]
To determine the value of CL1 and CL2, multiply the capacitive load value CL by 2. Using this result, subtract the
combined values of CPCBXI + CXI to determine the value of CL1 and the combined values of CPCBXO + CXO to
determine the value of CL2. For example, if CL = 10pF, CPCBXI = 2.9pF, CXI = 0.5pF,CPCBXO = 3.7pF, CXO = 0.5pF,
the value of CL1 = [(2CL) - (CPCBXI + CXI)] = [(2 × 10pF) - 2.9pF - 0.5pF)] = 16.6pF and CL2 = [(2CL) - (CPCBXO +
CXO)] = [(2 × 10pF) - 3.7pF - 0.5pF)] = 15.8pF
6.9.4.1.1.2 Shunt Capacitance
The crystal circuit must also be designed such that it does not exceed the maximum shunt capacitance for
MCU_OSC0 operating conditions defined in Table 6-21. Shunt capacitance, Cshunt, of the crystal circuit is a
combination of crystal shunt capacitance and parasitic contributions. PCB signal traces which connect crystal
circuit components to MCU_OSC0 have mutual parasitic capacitance to each other, CPCBXIXO, where the PCB
designer should be able to extract mutual parasitic capacitance between these signal traces. The device
package also has mutual parasitic capacitance, CXIXO, where this mutual parasitic capacitance value is defined
in Table 6-22.
PCB routing should be designed to minimize mutual capacitance between XI and XO signal traces. This is
typically done by keeping signal traces short and not routing them in close proximity. Mutual capacitance can
also be minimized by placing a ground trace between these signals when the layout requires them to be routed
in close proximity. It is important to minimize the mutual capacitance on the PCB to provide as much margin as
possible when selecting a crystal.
Device
Crystal Circuit PCB
Components Signal Traces
MCU_OSC0_XI
CPCBXIXO CXIXO
CO
MCU_OSC0_XO
AM65x_MCU_OSC_SC_06
A crystal should be chosen such that the below equation is satisfied. CO in the equation is the maximum shunt
capacitance specified by the crystal manufacturer.
Cshunt ≥ CO + CPCBXIXO + CXIXO
For example, the equation would be satisfied when the crystal being used is 25MHz with an ESR = 30Ω,
CPCBXIXO = 0.04pF, CXIXO = 0.01pF, and shunt capacitance of the crystal is less than or equal to 6.95pF.
Note
1. A DC steady-state condition is not allowed on MCU_OSC0_XI when the oscillator is powered up.
This is not allowed because MCU_OSC0_XI is internally AC coupled to a comparator that can
enter an unknown state when DC is applied to the input. Therefore, application software must
power down MCU_OSC0 any time MCU_OSC0_XI is not toggling between logic states.
2. The LVCMOS clock signal sourcing the MCU_OSC0_XI input must have monotonic transitions.
The clock source should be connected to MCU_OSC0_XI with a point-to-point connection,
via a series termination resistor placed near the clock source. The series termination resistor
value should match the clock source output impedance to the transmission line impedance. For
example, the series termination resistor value needs to be 20 ohms if the clock source has an
output impedance of 30 ohms and the PCB signal trace has a characteristic impedance of 50
ohms. This allows the reflection that returns from the far end of the un-terminated transmission
line to be completely absorbed such that is does not introduce any non-monotonic events on the
signal.
3. The PCB trace length connecting the LVCMOS clock source to MCU_OSC0_XI should be
minimized. This reduces capacitive loading and decreases probability of external noise sources
coupling into the clock signal. Reduced capacitive loading improves rise/fall times of the clock
signal which reduces the probability of jitter being introduced in the system.
Device
MCU_OSC0_XI MCU_OSC0_XO
PCB Ground
AM65x_MCU_OSC_EXT_CLK_03
(1) Most LVCMOS oscillator datasheets define their maximum Output Rise/Fall times with a capacitive load much larger than the actual
load that will be applied by the combined PCB trace capacitance and MCU_OSC0_XI input capacitance. It should not be difficult to
find a LVCMOS oscillator that meets this requirement. However, the system designer must confirm the LVCMOS oscillator selected will
provide the appropriate rise/fall time to MCU_OSC0_XI input.
(2) Most LVCMOS oscillator datasheets define their max RMS Phase Jitter using a larger bandwidth integration range than required by
this device. To get a more appropriate value, it may be necessary to contact the LVCMOS oscillator manufacture and ask them to
provide a maximum RMS Phase Jitter using the same bandwidth integration range that has been defined for this parameter.
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
Rd
Crystal (Optional)
(Optional) Rbias
Cf1 Cf2
PCB Ground
J7ES_LF_OSC_INT_12
Note
User should set CTRLMMR_WKUP_LFXOSC_TRIM[18:16] i_mult = 3b’001 for CL in the range 6pf to
9.5pf. CTRLMMR_WKUP_LFXOSC_TRIM [18:16] i_mult = 3b’010 for CL in the range 8.5pf to 12pf.
Default setting is 3b’010.
Note
The load capacitors, Cf1 and Cf2 in Figure 6-22, should be chosen such that the below equation is
satisfied. CL in the equation is the load specified by the crystal manufacturer. All discrete components
used to implement the oscillator circuit should be placed as close as possible to the associated
oscillator WKUP_LFOSC0_XI, WKUP_LFOSC0_XO, and VSS pins.
Cf1Cf2
CL=
(Cf1+Cf2)
J7ES_CL_MATH_03
The crystal must be in the fundamental mode of operation and parallel resonant. Table 6-25 summarizes the
required electrical constraints.
Table 6-25. WKUP_LFOSC0 Crystal Electrical Characteristics
NAME DESCRIPTION MIN TYP MAX UNIT
Parallel resonance crystal frequency 32768 Hz
fp
Crystal Frequency Stability and Tolerance ±100 PPM
Cf1 Cf1 load capacitance for crystal parallel resonance with Cf1 = Cf2 12 24 pF
Cf2 Cf2 load capacitance for crystal parallel resonance with Cf1 = Cf2 12 24 pF
ESRxtal – 40 kΩ 4 pF
ESRxtal – 60 kΩ 3 pF
Cshunt Shunt capacitance
ESRxtal – 80 kΩ 2 pF
ESRxtal – 100 kΩ 1 pF
ESR Crystal effective series resistance (1) Ω
(1) The maximum ESR of the crystal is a function of the crystal frequency and shunt capacitance. See the Cshunt parameter.
When selecting a crystal, the system design must consider the temperature and aging characteristics of a based
on the worst case environment and expected life expectancy of the system.
Table 6-26 details the switching characteristics of the oscillator and the requirements of the input clock.
Table 6-26. WKUP_LFOSC0 Switching Characteristics – Crystal Mode
NAME DESCRIPTION MIN TYP MAX UNIT
fxtal Oscillation frequency 32768 Hz
tsX Start-up time 96.5 ms
VDD_CORE (min.)
VDD_CORE
VSS
Voltage
WKUP_LFOSC0_XO
VSS
tsX
Time
LFXOSC_STARTUP_02
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
PCB Ground
AM62x_MCU_OSC_EXT_CLK_03
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
NC
PCB Ground
6.9.4.4 Recommended System Precautions for Clock and Control Signal Transitions
All clock and strobe signals must transition between VIH and VIL (or between VIL and VIH) in a monotonic
manner.
Monotonic transitions are more likely to occur with fast signal transitions. It is easy for noise to create non-
monotonic events on a signal with slow transitions. Therefore, avoid slow signal transitions on all clock and
control signals since they are more likely to generate glitches inside the device.
6.9.5 Peripherals
6.9.5.1 ATL
The device contains ATL module that can be used for asynchronous sample rate conversion of audio. The ATL
calculates the error between two time bases, such as audio syncs, and optionally generates an averaged clock
using cycle stealing via software.
Note
For more information about ATL, see Audio Tracking Logic (ATL) section in Peripherals chapter in the
device TRM.
Section 6.9.5.1.1, Section 6.9.5.1.2, Section 6.9.5.1.3, and Section 6.9.5.1.4 present timing requirements and
switching characteristics for ATL.
6.9.5.1.1 ATL_PCLK Timing Requirements
D12
ATCLK[x]
D11
atl_01
6.9.5.2 CPSW3G
For more details about features and additional description information on the device Gigabit Ethernet MAC, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
6.9.5.2.1 CPSW3G MDIO Timing
Table 6-28, Table 6-29, Table 6-30, and Figure 6-27 present timing conditions, timing requirements, and
switching characteristics for CPSW3G MDIO.
Table 6-28. CPSW3G MDIO Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.9 3.6 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 10 470 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 0 5 ns
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 1 ns
MDIO3
MDIO4
MDIO5
MDIO[x]_MDC
MDIO1
MDIO2
MDIO[x]_MDIO
(input)
MDIO7
MDIO[x]_MDIO
(output)
CPSW2G_MDIO_TIMING_01
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
Table 6-32. RMII[x]_REF_CLK Timing Requirements – RMII Mode
see Figure 6-28
NO. PARAMETER DESCRIPTION MIN MAX UNIT
RMII1 tc(REF_CLK) Cycle time, RMII[x]_REF_CLK 19.999 20.001 ns
RMII2 tw(REF_CLKH) Pulse Duration, RMII[x]_REF_CLK High 7 13 ns
RMII3 tw(REF_CLKL) Pulse Duration, RMII[x]_REF_CLK Low 7 13 ns
RMII1
RMII2
RMII[x]_REF_CLK
RMII3
Table 6-33. RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RX_ER Timing Requirements – RMII Mode
see Figure 6-29
NO. PARAMETER DESCRIPTION MIN MAX UNIT
RMII4 tsu(RXD-REF_CLK) Setup time, RMII[x]_RXD[1:0] valid before RMII[x]_REF_CLK 4 ns
tsu(CRS_DV-REF_CLK) Setup time, RMII[x]_CRS_DV valid before RMII[x]_REF_CLK 4 ns
tsu(RX_ER-REF_CLK) Setup time, RMII[x]_RX_ER valid before RMII[x]_REF_CLK 4 ns
RMII5 th(REF_CLK-RXD) Hold time RMII[x]_RXD[1:0] valid after RMII[x]_REF_CLK 2 ns
th(REF_CLK-CRS_DV) Hold time, RMII[x]_CRS_DV valid after RMII[x]_REF_CLK 2 ns
th(REF_CLK-RX_ER) Hold time, RMII[x]_RX_ER valid after RMII[x]_REF_CLK 2 ns
RMII4
RMII5
RMII[x]_REF_CLK
RMII[x]_RXD[1:0], RMII[x]_CRS_DV,
RMII[x]_RX_ER
RMII6
RMII[x]_REF_CLK
RMII[x]_TXD[1:0], RMII[x]_TX_EN
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
RGMII1
RGMII2
RGMII3
(A)
RGMII[x]_RXC
RGMII4
RGMII5
(B)
RGMII[x]_RD[3:0] 1st Half-byte 2nd Half-byte
(B)
RGMII[x]_RX_CTL RXDV RXERR
A. RGMII[x]_RXC must be externally delayed relative to the data and control pins.
B. Data and control information is received using both edges of the clocks. RGMII[x]_RD[3:0] carries data bits 3-0 on the rising edge of
RGMII[x]_RXC and data bits 7-4 on the falling edge of RGMII[x]_RXC. Similarly, RGMII[x]_RX_CTL carries RXDV on rising edge of
RGMII[x]_RXC and RXERR on falling edge of RGMII[x]_RXC.
(1) Output setup/hold times are defining a delay relationship of the transmit data and control outputs relative to the transmit clock output,
but this output relationship is being presented as the minimum setup/hold times provided to the attached receiver. This approach
matches how the output timing relationships are defined in the RGMII specification.
RGMII6
RGMII7
RGMII8
(A)
RGMII[x]_TXC
RGMII9
(B)
RGMII[x]_TD[3:0] 1st Half-byte 2nd Half-byte
RGMII10
(B)
RGMII[x]_TX_CTL TXEN TXERR
A. TXC is delayed internally before being driven to the RGMII[x]_TXC pin. This internal delay is always enabled.
B. Data and control information is received using both edges of the clocks. RGMII[x]_TD[3:0] carries data bits 3-0 on the rising edge of
RGMII[x]_TXC and data bits 7-4 on the falling edge of RGMII[x]_TXC. Similarly, RGMII[x]_TX_CTL carries TXEN on rising edge of
RGMII[x]_TXC and TXERR on falling edge of RGMII[x]_TXC.
6.9.5.3 CPTS
Table 6-40, Table 6-41, Figure 6-33, Table 6-42, and Figure 6-34 present timing conditions, timing requirements,
and switching characteristics for CPTS.
Table 6-40. CPTS Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 10 pF
HWn_TSPUSH
T3 T4 T5
RFT_CLK
TS_COMP
T8 T9
TS_SYNC
T10 T11
SYNCn_OUT
For more information, see Data Movement Architecture (DMA) chapter in the device TRM.
6.9.5.4 CSI-2
Note
For more information, see the Camera Serial Interface Receiver (CSI_RX_IF) section in the device
TRM. The CSI_RX_IF is connected to device port instances named CSIRXn, where n is the instance
number.
The CSI_RX_IF and associated D-PHY implements a CSI-2 port (CSIRX0) compliant with the MIPI D-PHY
specification v1.2 and the MIPI CSI-2 specification v1.3, with 4 differential data lanes plus 1 differential clock
lane operating in synchronous double data rate mode. For CSI-2 timing details, see the respective MIPI
specifications mentioned above.
• Support for 1-, 2-, 3- or 4-lane data transfer modes up to 1.5Gbps
6.9.5.5 CSI-2 TX
TBD
6.9.5.6 DDRSS
For more details about features and additional description information on the device LPDDR4 Memory Interface,
see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-43 and Figure 6-35 present switching characteristics for DDRSS.
Table 6-43. DDRSS Switching Characteristics
see Figure 1-1
NO. PARAMETER DDR TYPE CORE VOLTAGE MIN MAX UNIT
(1) Maximum DDR Frequency will be limited based on the specific memory type (vendor) used in a system and by PCB implementation.
TI strongly recommends all designs to follow the TI LPDDR4 EVM PCB layout exactly in every detail (routing, spacing, vias/backdrill,
PCB material, etc.) in order to achieve the full specified clock frequency. Refer to the Jacinto 7 LPDDR4 Board Design and Layout
Guidelines for details.
1
DDR0_CKP
DDR0_CKN
For more information, see DDR Subsystem (DDRSS) section in Memory Controllers chapter in the device TRM.
6.9.5.7 DSS
Table 6-44, Table 6-45, Figure 6-36, Table 6-46 and Figure 6-37 present timing conditions, timing requirements,
and switching characteristics for DSS.
Table 6-44. DSS Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1.44 26.4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1.5 5 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
D6 D8
Falling-edge Clock Reference
VOUT(x)_EXTPCLKIN
Rising-edge Clock Reference
VOUT(x)_EXTPCLKIN
DPI_TIMING_02
D1 D3
Falling-edge Clock Reference
VOUT(x)_PCLK
Rising-edge Clock Reference
VOUT(x)_PCLK
D5
VOUT(x)_VSYNC
D5
VOUT(x)_HSYNC
D4
D5
VOUT(x)_DE
DPI_TIMING_01
A. The assertion of data can be programmed to occur on the falling or rising edge of the pixel clock. Refer to Display Subsystem (DSS)
section in Peripherals chapter in the device TRM.
B. The polarity and pulse width of VOUT(x)_HSYNC and VOUT(x)_VSYNC are programmable, refer to Display Subsystem (DSS) section
in Peripherals chapter in the device TRM.
C. The VOUT(x)_PCLK frequency is configurable, refer to Display Subsystem section in Peripherals chapter in the device TRM.
For more information, see Display Subsystem (DSS) and Peripherals section in Peripherals chapter of the
device TRM.
6.9.5.8 ECAP
Table 6-47, Table 6-48, Figure 6-38, Table 6-49, and Figure 6-39 present timing conditions, timing requirements,
and switching characteristics for ECAP.
Table 6-47. ECAP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
CAP
EPERIPHERALS_TIMNG_01
APWM
EPERIPHERALS_TIMNG_02
For more information, see Enhanced Capture (ECAP) Module section in Peripherals chapter in the device TRM.
DBTR5 toh(TRC_CLK-TRC_DATAI) Output hold time, TRC_CLK edge to TRC_DATA invalid 0.85 ns
DBTR6 tosu(TRC_CTLV-TRC_CLK) Output setup time, TRC_CTL valid to TRC_CLK edge 0.85 ns
DBTR7 toh(TRC_CLK-TRC_CTLI) Output hold time, TRC_CLK edge to TRC_CTL invalid 0.85 ns
3.3V Mode
DBTR1 tc(TRC_CLK) Cycle time, TRC_CLK 8.78 ns
DBTR2 tw(TRC_CLKH) Pulse width, TRC_CLK high 3.64 ns
DBTR3 tw(TRC_CLKL) Pulse width, TRC_CLK low 3.64 ns
tosu(TRC_DATAV-
DBTR4 Output setup time, TRC_DATA valid to TRC_CLK edge 1.10 ns
TRC_CLK)
DBTR5 toh(TRC_CLK-TRC_DATAI) Output hold time, TRC_CLK edge to TRC_DATA invalid 1.10 ns
DBTR6 tosu(TRC_CTLV-TRC_CLK) Output setup time, TRC_CTL valid to TRC_CLK edge 1.10 ns
DBTR7 toh(TRC_CLK-TRC_CTLI) Output hold time, TRC_CLK edge to TRC_CTL invalid 1.10 ns
DBTR1
DBTR2 DBTR3
TRC_CLK
(Worst Case 1)
(Ideal)
(Worst Case 2)
DBTR4 DBTR5 DBTR4 DBTR5
DBTR6 DBTR7 DBTR6 DBTR7
TRC_DATA
TRC_CTL
SPRSP08_Debug_01
6.9.5.9.2 JTAG
Table 6-52. JTAG Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 2.0 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 5 15 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 83.5 1000(1) ps
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
(1) Maximum propagation delay associated with the JTAG signal traces has a significant impact on maximum TCK operating frequency. It
may be possible to increase the trace delay beyond this value, but the operating frequency of TCK must be reduced to account for the
additional trace delay.
Table 6-53. JTAG Timing Requirements
see Figure 6-41
NO. MIN MAX UNIT
J1 tc(TCK) Cycle time minimum, TCK 40(1) ns
J2 tw(TCKH) Pulse width minimum, TCK high 0.4P(2) ns
J3 tw(TCKL) Pulse width minimum, TCK low 0.4P(2) ns
tsu(TDI-TCK) Input setup time minimum, TDI valid to TCK high 2 ns
J4
tsu(TMS-TCK) Input setup time minimum, TMS valid to TCK high 2 ns
th(TCK-TDI) Input hold time minimum, TDI valid from TCK high 3 ns
J5
th(TCK-TMS) Input hold time minimum, TMS valid from TCK high 3 ns
(1) The maximum TCK operating frequency assumes the following timing requirements and switching characteristis for the attached
debugger. The operating frequency of TCK must be reduced to provide appropriate timing margin if the debugger exceeds any of these
assumptions.
• Minimum TDO setup time of 2ns relative to the rising edge of TCK
• TDI and TMS output delay in the range of -12.9ns to 13.9ns relative to the falling edge of TCK
(2) P = TCK cycle time in ns
Table 6-54. JTAG Switching Characteristics
see Figure 6-41
NO. PARAMETER MIN MAX UNIT
J6 td(TCKL-TDOI) Delay time minimum, TCK low to TDO invalid 0 ns
J7 td(TCKL-TDOV) Delay time maximum, TCK low to TDO valid 12 ns
J1
J2 J3
TCK
J4 J5 J4 J5
TDI / TMS
J7
J6
TDO
6.9.5.10 EPWM
Table 6-55, Table 6-56, Figure 6-42, Table 6-57, Figure 6-43, Figure 6-44, and Figure 6-45 present timing
conditions, timing requirements, and switching characteristics for EPWM.
Table 6-55. EPWM Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
PWM6
EHRPWM_SYNCI
PWM7
EHRPWM_TZn_IN
EPERIPHERALS_TIMNG_07
EHRPWM_A/B
PWM1
PWM2
EHRPWM_SYNCO
PWM5
EHRPWM_SOCA/B
EPERIPHERALS_TIMNG_04
PWM3
EHRPWM_A/B
EHRPWM_TZn_IN
EPERIPHERALS_TIMING_05
PWM4
EHRPWM_A/B
EHRPWM_TZn_IN
For more information, see Enhanced Pulse Width Modulation (EPWM) Module section in Peripherals chapter in
the device TRM.
6.9.5.11 EQEP
Table 6-58, Table 6-59, Figure 6-46, and Table 6-60 present timing conditions, timing requirements, and
switching characteristics for EQEP.
Table 6-58. EQEP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
QEP_A/B
QEP2
QEP_I
QEP3
QEP4
QEP_S
QEP5 EPERIPHERALS_TIMNG_03
For more information, see Enhanced Quadrature Encoder Pulse (EQEP) Module section in Peripherals chapter
in the device TRM.
6.9.5.12 GPIO
Table 6-61, Table 6-62, and Table 6-63 present timing conditions, timing requirements, and switching
characteristics for GPIO.
The device has three instances of the GPIO module.
• MCU_GPIO0
• GPIO0
• GPIO1
Note
GPIOn_x is generic name used to describe a GPIO signal, where n represents the specific GPIO
module and x represents one of the input/output signals associated with the module.
For additional description information on the device GPIO, see the corresponding subsections within
Signal Descriptions and Detailed Description sections.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
Table 6-62. GPIO Timing Requirements
NO. PARAMETER DESCRIPTION MIN MAX UNIT
GPIO1 tw(GPIO_IN) Pulse width, GPIOn_x 2P(1) + 30 ns
For more information, see General-Purpose Interface (GPIO) section in Peripherals chapter in the device TRM.
6.9.5.13 GPMC
For more details about features and additional description information on the device General-Purpose Memory
Controller, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-64 presents timing conditions for GPMC.
Table 6-64. GPMC Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1.65 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 20 pF
PCB CONNECTIVITY REQUIREMENTS
133MHz Synchronous Mode 140 360 ps
td(Trace Delay) Propagation delay of each trace
All other modes 140 720 ps
td(Trace Mismatch
Propagation delay mismatch across all traces 200 ps
Delay)
For more information, see General-Purpose Memory Controller (GPMC) section in Peripherals chapter in the
device TRM.
6.9.5.13.1 GPMC and NOR Flash — Synchronous Mode
Table 6-65 and Table 6-66 present timing requirements and switching characteristics for GPMC and NOR Flash -
Synchronous Mode.
Table 6-65. GPMC and NOR Flash Timing Requirements — Synchronous Mode
see Figure 6-47, Figure 6-48, and Figure 6-51
MIN MAX MIN MAX
NO. PARAMETER DESCRIPTION MODE(4) GPMC_FCLK = GPMC_FCLK = UNIT
100MHz(1) 133MHz(1)
F12 tsu(dV-clkH) Setup time, input data div_by_1_mode; 1.61 0.92 ns
GPMC_AD[15:0] valid before output GPMC_FCLK_MUX;
clock GPMC_CLK high TIMEPARAGRANULARITY_X1
not_div_by_1_mode; 0.86 3.41 ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
F13 th(clkH-dV) Hold time, input data div_by_1_mode; 2.09 2.09 ns
GPMC_AD[15:0] valid after output GPMC_FCLK_MUX;
clock GPMC_CLK high TIMEPARAGRANULARITY_X1
not_div_by_1_mode; 2.09 2.09 ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
F21 tsu(waitV-clkH) Setup time, input wait div_by_1_mode; 1.61 0.92 ns
GPMC_WAIT[j](2) (3) valid before GPMC_FCLK_MUX;
output clock GPMC_CLK high TIMEPARAGRANULARITY_X1
not_div_by_1_mode; 0.86 3.41 ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
F22 th(clkH-waitV) Hold time, input wait div_by_1_mode; 2.09 2.09 ns
GPMC_WAIT[j](2) (3) valid after GPMC_FCLK_MUX;
output clock GPMC_CLK high TIMEPARAGRANULARITY_X1
not_div_by_1_mode; 2.09 2.09 ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
For not_div_by_1_mode:
• GPMC_CONFIG1_i Register: GPMCFCLKDIVIDER = 1h to 3h:
– GPMC_CLK frequency = GPMC_FCLK frequency / (2 to 4)
For GPMC_FCLK_MUX:
• CTRLMMR_GPMC_CLKSEL[1-0] CLK_SEL = 01 = PER1_PLL_CLKOUT / 3 = 300 / 3 = 100MHz
For TIMEPARAGRANULARITY_X1:
• GPMC_CONFIG1_i Register: TIMEPARAGRANULARITY = 0h = x1 latencies (affecting RD/WRCYCLETIME, RD/
WRACCESSTIME, PAGEBURSTACCESSTIME, CSONTIME, CSRD/WROFFTIME, ADVONTIME, ADVRD/WROFFTIME,
OEONTIME, OEOFFTIME, WEONTIME, WEOFFTIME, CYCLE2CYCLEDELAY, BUSTURNAROUND, TIMEOUTSTARTVALUE,
WRDATAONADMUXBUS)
Table 6-66. GPMC and NOR Flash Switching Characteristics – Synchronous Mode
see Figure 6-47, Figure 6-48, Figure 6-49, Figure 6-50, and Figure 6-51
NO. MIN MAX MIN MAX
(2) PARAMETER DESCRIPTION MODE(16) UNIT
100MHz 133MHz
F0 1 / tc(clk) Period, output clock GPMC_CLK(15) div_by_1_mode; 10.00 7.52 ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
F1 tw(clkH) Typical pulse duration, output clock div_by_1_mode; 0.475P 0.475P ns
GPMC_CLK high GPMC_FCLK_MUX; - 0.3(14) - 0.3(14)
TIMEPARAGRANULARITY_X1
F1 tw(clkL) Typical pulse duration, output clock div_by_1_mode; 0.475P 0.475P ns
GPMC_CLK low GPMC_FCLK_MUX; - 0.3(14) - 0.3(14)
TIMEPARAGRANULARITY_X1
F2 td(clkH-csnV) Delay time, output clock GPMC_CLK div_by_1_mode; F - 2.2 F+ F - 2.2 F+ ns
rising edge to output chip select GPMC_FCLK_MUX; (5) 3.75 (5) 3.75
GPMC_CSn[i] transition(13) TIMEPARAGRANULARITY_X1;
no extra_delay
F3 td(clkH-CSn[i]V) Delay time, output clock GPMC_CLK div_by_1_mode; E - 2.2 E+ E - 2.2 E + 4.5 ns
rising edge to output chip select GPMC_FCLK_MUX; (4) 3.18 (4)
Table 6-66. GPMC and NOR Flash Switching Characteristics – Synchronous Mode (continued)
see Figure 6-47, Figure 6-48, Figure 6-49, Figure 6-50, and Figure 6-51
NO. MIN MAX MIN MAX
(2) PARAMETER DESCRIPTION MODE(16) UNIT
100MHz 133MHz
F7 td(clkL-be[x]nIV) Delay time, GPMC_CLK falling edge div_by_1_mode; D - 2.3 D + 1.9 D - 2.3 D + 1.9 ns
to GPMC_BE0n_CLE, GPMC_BE1n GPMC_FCLK_MUX; (3) (3)
invalid(11) TIMEPARAGRANULARITY_X1
F7 td(clkL-be[x]nIV). Delay time, GPMC_CLK falling edge div_by_1_mode; D - 2.3 D + 1.9 D - 2.3 D + 1.9 ns
to GPMC_BE0n_CLE, GPMC_BE1n GPMC_FCLK_MUX; (3) (3)
invalid(12) TIMEPARAGRANULARITY_X1
F8 td(clkH-advn) Delay time, output clock GPMC_CLK div_by_1_mode; G - G + 4.5 G - 2.3 G + 4.5 ns
rising edge to output address GPMC_FCLK_MUX; 2.3(6) (6)
transition(11) TIMEPARAGRANULARITY_X1
F15 td(clkL-do). Delay time, GPMC_CLK falling div_by_1_mode; J - 2.3 J + 2.7 J - 2.3 J + 2.7 ns
edge to GPMC_AD[15:0] data bus GPMC_FCLK_MUX; (9) (9)
transition(12) TIMEPARAGRANULARITY_X1
F17 td(clkH-be[x]n) Delay time, output clock GPMC_CLK div_by_1_mode; J - 2.3 J + 1.9 J - 2.3 J + 1.9 ns
rising edge to output lower byte GPMC_FCLK_MUX; (9) (9)
transition(11) TIMEPARAGRANULARITY_X1
F17 td(clkL-be[x]n). Delay time, GPMC_CLK falling edge div_by_1_mode; J - 2.3 J + 1.9 J - 2.3 J + 1.9 ns
to GPMC_BE0n_CLE, GPMC_BE1n GPMC_FCLK_MUX; (9) (9)
transition(12) TIMEPARAGRANULARITY_X1
F18 tw(csnV) Pulse duration, output chip select Read A A ns
GPMC_CSn[i](13) low
Write A A ns
F19 tw(be[x]nV) Pulse duration, output lower byte Read C C ns
enable and command latch enable
Write C C ns
GPMC_BE0n_CLE, output upper byte
enable GPMC_BE1n low
Table 6-66. GPMC and NOR Flash Switching Characteristics – Synchronous Mode (continued)
see Figure 6-47, Figure 6-48, Figure 6-49, Figure 6-50, and Figure 6-51
NO. MIN MAX MIN MAX
(2) PARAMETER DESCRIPTION MODE(16) UNIT
100MHz 133MHz
F20 tw(advnV) Pulse duration, output address Read K K ns
valid and address latch enable
Write K K ns
GPMC_ADVn_ALE low
• Case GPMCFCLKDIVIDER = 1:
– G = 0.5 × ADVExtraDelay × GPMC_FCLK(14) if (ClkActivationTime and ADVWrOffTime are odd) or (ClkActivationTime and
ADVWrOffTime are even)
– G = (1 + 0.5 × ADVExtraDelay) × GPMC_FCLK(14) otherwise
• Case GPMCFCLKDIVIDER = 2:
– G = 0.5 × ADVExtraDelay × GPMC_FCLK(14) if ((ADVWrOffTime - ClkActivationTime) is a multiple of 3)
– G = (1 + 0.5 × ADVExtraDelay) × GPMC_FCLK(14) if ((ADVWrOffTime - ClkActivationTime - 1) is a multiple of 3)
– G = (2 + 0.5 × ADVExtraDelay) × GPMC_FCLK(14) if ((ADVWrOffTime - ClkActivationTime - 2) is a multiple of 3)
(7) For OE falling edge (OE activated) and IO DIR rising edge (Data Bus input direction):
• Case GPMCFCLKDIVIDER = 0:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(14)
• Case GPMCFCLKDIVIDER = 1:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(14) if (ClkActivationTime and OEOnTime are odd) or (ClkActivationTime and
OEOnTime are even)
– H = (1 + 0.5 × OEExtraDelay) × GPMC_FCLK(14) otherwise
• Case GPMCFCLKDIVIDER = 2:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(14) if ((OEOnTime - ClkActivationTime) is a multiple of 3)
– H = (1 + 0.5 × OEExtraDelay) × GPMC_FCLK(14) if ((OEOnTime - ClkActivationTime - 1) is a multiple of 3)
– H = (2 + 0.5 × OEExtraDelay) × GPMC_FCLK(14) if ((OEOnTime - ClkActivationTime - 2) is a multiple of 3)
For GPMC_FCLK_MUX:
• CTRLMMR_GPMC_CLKSEL[1-0] CLK_SEL = 01 = PER1_PLL_CLKOUT / 3 = 300 / 3 = 100MHz
For TIMEPARAGRANULARITY_X1:
• GPMC_CONFIG1_i Register: TIMEPARAGRANULARITY = 0h = x1 latencies (affecting RD/WRCYCLETIME, RD/
WRACCESSTIME, PAGEBURSTACCESSTIME, CSONTIME, CSRD/WROFFTIME, ADVONTIME, ADVRD/WROFFTIME,
OEONTIME, OEOFFTIME, WEONTIME, WEOFFTIME, CYCLE2CYCLEDELAY, BUSTURNAROUND, TIMEOUTSTARTVALUE,
WRDATAONADMUXBUS)
For no extra_delay:
• GPMC_CONFIG2_i Register: CSEXTRADELAY = 0h = CSn Timing control signal is not delayed
• GPMC_CONFIG4_i Register: WEEXTRADELAY = 0h = nWE timing control signal is not delayed
• GPMC_CONFIG4_i Register: OEEXTRADELAY = 0h = nOE timing control signal is not delayed
• GPMC_CONFIG3_i Register: ADVEXTRADELAY = 0h = nADV timing control signal is not delayed
F1
F0 F1
GPMC_CLK
F2 F3
F18
GPMC_CSn[i]
F4
GPMC_A[MSB:1] Valid Address
F6 F7
F19
GPMC_BE0n_CLE
F19
GPMC_BE1n
F6 F8 F8
F20 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
F13
F12
GPMC_AD[15:0] D0
GPMC_WAIT[j]
GPMC_01
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-47. GPMC and NOR Flash — Synchronous Single Read (GPMCFCLKDIVIDER = 0)
F1
F0 F1
GPMC_CLK
F2 F3
GPMC_CSn[i]
F4
GPMCA[MSB:1] Valid Address
F6 F7
GPMC_BE0n_CLE
F7
GPMC_BE1n
F6 F8 F8 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
F13 F13
F12 F12
GPMC_AD[15:0] D0 D1 D2 D3
F21 F22
GPMC_WAIT[j]
GPMC_02
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-48. GPMC and NOR Flash — Synchronous Burst Read — 4x16–bit (GPMCFCLKDIVIDER = 0)
F1
F1 F0
GPMC_CLK
F2 F3
GPMC_CSn[i]
F4
GPMC_A[MSB:1] Valid Address
F17
F6 F17 F17
GPMC_BE0n_CLE
F17
F17 F17
GPMC_BE1n
F6 F8 F8 F9
GPMC_ADVn_ALE
F14 F14
GPMC_WEn
F15 F15 F15
GPMC_AD[15:0] D0 D1 D2 D3
GPMC_WAIT[j]
GPMC_03
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
F1
F0 F1
GPMC_CLK
F2 F3
GPMC_CSn[i]
F6 F7
GMPC_BE0n_CLE Valid
F6 F7
GPMC_BE1n Valid
F4
GPMC_A[27:17] Address (MSB)
F12
F4 F5 F13 F12
GPMC_AD[15:0] Address (LSB) D0 D1 D2 D3
F8 F8 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
GPMC_WAIT[j]
GPMC_04
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-50. GPMC and Multiplexed NOR Flash — Synchronous Burst Read
F1
F1 F0
GPMC_CLK
F2 F3
F18
GPMC_CSn[i]
F4
GPMC_A[27:17] Address (MSB)
F17
F6 F17 F17
GPMC_BE1n
F17
F6 F17 F17
BPMC_BE0n_CLE
F8 F8
F20 F9
GPMC_ADVn_ALE
F14 F14
GPMC_WEn
F15 F15 F15
GPMC_AD[15:0] Address (LSB) D0 D1 D2 D3
F22 F21
GPMC_WAIT[j]
GPMC_05
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-51. GPMC and Multiplexed NOR Flash — Synchronous Burst Write
(1) The FA5 parameter illustrates the amount of time required to internally sample input data. It is expressed in number of GPMC
functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input data is internally sampled by active
functional clock edge. FA5 value must be stored inside the AccessTime register bit field.
(2) The FA20 parameter illustrates amount of time required to internally sample successive input page data. It is expressed in number of
GPMC functional clock cycles. After each access to input page data, next input page data is internally sampled by active functional
clock edge after FA20 functional clock cycles. The FA20 value must be stored in the PageBurstAccessTime register bit field.
(3) P = PageBurstAccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(5)
(4) H = AccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(5)
(5) GPMC_FCLK is general-purpose memory controller internal functional clock period in ns.
Table 6-68. GPMC and NOR Flash Switching Characteristics – Asynchronous Mode
see Figure 6-52, Figure 6-53, Figure 6-54, Figure 6-55, Figure 6-56, and Figure 6-57
(15)
MIN MAX
NO. PARAMETER DESCRIPTION MODE UNIT
133MHz
FA0 tw(be[x]nV) Pulse duration, output lower-byte enable and Read N (12) ns
command latch enable GPMC_BE0n_CLE, output
Write N (12)
upper-byte enable GPMC_BE1n valid time
FA1 tw(csnV) Pulse duration, output chip select GPMC_CSn[i](13) Read A (1) ns
low
Write A (1)
FA3 td(csnV-advnIV) Delay time, output chip select GPMC_CSn[i](13) Read B - 2 (2) B + 2(2) ns
valid to output address valid and address latch
Write B - 2(2) B + 2(2)
enable GPMC_ADVn_ALE invalid
FA4 td(csnV-oenIV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; C - 2(3) C + 2(3) ns
valid to output enable GPMC_OEn_REn invalid GPMC_FCLK_MUX;
(Single read) TIMEPARAGRANULARITY_X1
FA9 td(aV-csnV) Delay time, output address GPMC_A[27:1] valid to div_by_1_mode; J - 2(9) J + 2(9) ns
output chip select GPMC_CSn[i](13) valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA10 td(be[x]nV-csnV) Delay time, output lower-byte enable and div_by_1_mode; J - 2(9) J + 2(9) ns
command latch enable GPMC_BE0n_CLE, output GPMC_FCLK_MUX;
upper-byte enable GPMC_BE1n valid to output TIMEPARAGRANULARITY_X1
chip select GPMC_CSn[i](13) valid
FA12 td(csnV-advnV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; K - 2(10) K + 2(10) ns
valid to output address valid and address latch GPMC_FCLK_MUX;
enable GPMC_ADVn_ALE valid TIMEPARAGRANULARITY_X1
FA13 td(csnV-oenV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; L - 2(11) L + 2(11) ns
valid to output enable GPMC_OEn_REn valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA16 tw(aIV) Pulse duration output address GPMC_A[26:1] div_by_1_mode; G (7) ns
invalid between 2 successive read and write GPMC_FCLK_MUX;
accesses TIMEPARAGRANULARITY_X1
Table 6-68. GPMC and NOR Flash Switching Characteristics – Asynchronous Mode (continued)
see Figure 6-52, Figure 6-53, Figure 6-54, Figure 6-55, Figure 6-56, and Figure 6-57
(15)
MIN MAX
NO. PARAMETER DESCRIPTION MODE UNIT
133MHz
FA18 td(csnV-oenIV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; I - 2(8) I + 2(8) ns
valid to output enable GPMC_OEn_REn invalid GPMC_FCLK_MUX;
(Burst read) TIMEPARAGRANULARITY_X1
FA20 tw(aV) Pulse duration, output address GPMC_A[27:1] div_by_1_mode; D (4) ns
valid - 2nd, 3rd, and 4th accesses GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA25 td(csnV-wenV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; E - 2(5) E + 2(5) ns
valid to output write enable GPMC_WEn valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA27 td(csnV-wenIV) Delay time, output chip select GPMC_CSn[i](13) div_by_1_mode; F - 2(6) F + 2(6) ns
valid to output write enable GPMC_WEn invalid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA28 td(wenV-dV) Delay time, output write enable GPMC_WEn valid div_by_1_mode; 2 ns
to output data GPMC_AD[15:0] valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA29 td(dV-csnV) Delay time, output data GPMC_AD[15:0] valid to div_by_1_mode; J - 2(9) J + 2(9) ns
output chip select GPMC_CSn[i](13) valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
FA37 td(oenV-aIV) Delay time, output enable GPMC_OEn_REn valid div_by_1_mode; 2 ns
to output address GPMC_AD[15:0] phase end GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
For GPMC_FCLK_MUX:
• CTRLMMR_GPMC_CLKSEL[1-0] CLK_SEL = 00 = CPSWHSDIV_CLKOUT3 = 2000/15 = 133.33MHz
For TIMEPARAGRANULARITY_X1:
• GPMC_CONFIG1_i Register: TIMEPARAGRANULARITY = 0h = x1 latencies (affecting RD/WRCYCLETIME, RD/
WRACCESSTIME, PAGEBURSTACCESSTIME, CSONTIME, CSRD/WROFFTIME, ADVONTIME, ADVRD/WROFFTIME,
GPMC_WAIT[j]
GPMC_06
Figure 6-52. GPMC and NOR Flash — Asynchronous Read — Single Word
GPMC_FCLK
GPMC_CLK
FA5 FA5
FA1 FA1
GPMC_CSn[i]
FA16
FA9 FA9
FA3 FA3
FA12 FA12
GPMC_ADCn_ALE
FA4 FA4
FA13 FA13
GPMC_OEn_REn
GPMC_AD[15:0] Data Upper
GPMC_WAIT[j]
GPMC_07
GPMC_FCLK
GPMC_CLK
FA21 FA20 FA20 FA20
FA1
GPMC_CSn[i]
FA9
GPMC_A[MSB:1] Add0 Add1 Add2 Add3 Add4
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA12
GPMC_ADVn_ALE
FA18
FA13
GPMC_OEn_REn
GPMC_AD[15:0] D0 D1 D2 D3 D3
GPMC_WAIT[j]
GPMC_08
Figure 6-54. GPMC and NOR Flash — Asynchronous Read — Page Mode 4x16–Bit
GPMC_FCLK
GPMC_CLK
FA1
GPMC_CSn[i]
FA9
GPMC_A[MSB:1] Valid Address
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA3
FA12
GPMC_ADVn_ALE
FA27
FA25
GPMC_WEn
FA29
GPMC_AD[15:0] Data OUT
GPMC_WAIT[j]
GPMC_09
Figure 6-55. GPMC and NOR Flash — Asynchronous Write — Single Word
GPMC_FCLK
GPMC_CLK
FA1
FA5
GPMC_CSn[i]
FA9
GPMC_A[27:17] Address (MSB)
FA0
FA10
GPMC_BE0n_CLE Valid
FA0
FA10
GPMC_BE1n Valid
FA3
FA12
GPMC_ADVn_ALE
FA4
FA13
GPMC_OEn_REn
FA29 FA37
GPMC_AD[15:0] Address (LSB) Data IN Data IN
GPMC_WAIT[j]
GPMC_10
Figure 6-56. GPMC and Multiplexed NOR Flash — Asynchronous Read — Single Word
GPMC_FCLK
GPMC_CLK
FA1
GPMC_CSn[i]
FA9
GPMC_A[27:17] Address (MSB)
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA3
FA12
GPMC_ADVn_ALE
FA27
FA25
GPMC_WEn
FA29 FA28
GPMC_AD[15:0] Valid Address (LSB) Data OUT
GPMC_WAIT[j]
GPMC_11
Figure 6-57. GPMC and Multiplexed NOR Flash — Asynchronous Write — Single Word
(1) The GNF12 parameter illustrates the amount of time required to internally sample input data. It is expressed in number of GPMC
functional clock cycles. From start of the read cycle and after GNF12 functional clock cycles, input data is internally sampled by the
active functional clock edge. The GNF12 value must be stored inside AccessTime register bit field.
(2) J = AccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(3)
(3) GPMC_FCLK is general-purpose memory controller internal functional clock period in ns.
(4) For div_by_1_mode:
• GPMC_CONFIG1_i Register: GPMCFCLKDIVIDER = 0h:
– GPMC_CLK frequency = GPMC_FCLK frequency
For GPMC_FCLK_MUX:
• CTRLMMR_GPMC_CLKSEL[1-0] CLK_SEL = 00 = CPSWHSDIV_CLKOUT3 = 2000/15 = 133.33MHz
For TIMEPARAGRANULARITY_X1:
• GPMC_CONFIG1_i Register: TIMEPARAGRANULARITY = 0h = x1 latencies (affecting RD/WRCYCLETIME, RD/
WRACCESSTIME, PAGEBURSTACCESSTIME, CSONTIME, CSRD/WROFFTIME, ADVONTIME, ADVRD/WROFFTIME,
OEONTIME, OEOFFTIME, WEONTIME, WEOFFTIME, CYCLE2CYCLEDELAY, BUSTURNAROUND, TIMEOUTSTARTVALUE,
WRDATAONADMUXBUS)
Table 6-70. GPMC and NAND Flash Switching Characteristics – Asynchronous Mode
see Figure 6-58, Figure 6-59, Figure 6-60 and Figure 6-61
(4)
NO. PARAMETER MODE MIN MAX UNIT
GNF0 tw(wenV) Pulse duration, output write enable GPMC_WEn div_by_1_mode; A ns
valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF1 td(csnV-wenV) Delay time, output chip select GPMC_CSn[i](2) div_by_1_mode; B-2 B+2 ns
valid to output write enable GPMC_WEn valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF2 tw(cleH-wenV) Delay time, output lower-byte enable and div_by_1_mode; C-2 C+2 ns
command latch enable GPMC_BE0n_CLE high to GPMC_FCLK_MUX;
output write enable GPMC_WEn valid TIMEPARAGRANULARITY_X1
GNF3 tw(wenV-dV) Delay time, output data GPMC_AD[15:0] valid to div_by_1_mode; D-2 D+2 ns
output write enable GPMC_WEn valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF4 tw(wenIV-dIV) Delay time, output write enable GPMC_WEn div_by_1_mode; E-2 E+2 ns
invalid to output data GPMC_AD[15:0] invalid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF5 tw(wenIV-cleIV) Delay time, output write enable GPMC_WEn div_by_1_mode; F-2 F+2 ns
invalid to output lower-byte enable and command GPMC_FCLK_MUX;
latch enable GPMC_BE0n_CLE invalid TIMEPARAGRANULARITY_X1
GNF6 tw(wenIV-CSn[i]V) Delay time, output write enable GPMC_WEn div_by_1_mode; G-2 G+2 ns
invalid to output chip select GPMC_CSn[i](2) GPMC_FCLK_MUX;
invalid TIMEPARAGRANULARITY_X1
GNF7 tw(aleH-wenV) Delay time, output address valid and address latch div_by_1_mode; C-2 C+2 ns
enable GPMC_ADVn_ALE high to output write GPMC_FCLK_MUX;
enable GPMC_WEn valid TIMEPARAGRANULARITY_X1
Table 6-70. GPMC and NAND Flash Switching Characteristics – Asynchronous Mode (continued)
see Figure 6-58, Figure 6-59, Figure 6-60 and Figure 6-61
(4)
NO. PARAMETER MODE MIN MAX UNIT
GNF8 tw(wenIV-aleIV) Delay time, output write enable GPMC_WEn div_by_1_mode; F-2 F+2 ns
invalid to output address valid and address latch GPMC_FCLK_MUX;
enable GPMC_ADVn_ALE invalid TIMEPARAGRANULARITY_X1
GNF9 tc(wen) Cycle time, write div_by_1_mode; H ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF10 td(csnV-oenV) Delay time, output chip select GPMC_CSn[i](2) div_by_1_mode; I-2 I+2 ns
valid to output enable GPMC_OEn_REn valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF13 tw(oenV) Pulse duration, output enable GPMC_OEn_REn div_by_1_mode; K ns
valid GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF14 tc(oen) Cycle time, read div_by_1_mode; L ns
GPMC_FCLK_MUX;
TIMEPARAGRANULARITY_X1
GNF15 tw(oenIV-CSn[i]V) Delay time, output enable GPMC_OEn_REn div_by_1_mode; M-2 M+2 ns
invalid to output chip select GPMC_CSn[i](2) GPMC_FCLK_MUX;
invalid TIMEPARAGRANULARITY_X1
For GPMC_FCLK_MUX:
• CTRLMMR_GPMC_CLKSEL[1-0] CLK_SEL = 00 = CPSWHSDIV_CLKOUT3 = 2000/15 = 133.33MHz
For TIMEPARAGRANULARITY_X1:
• GPMC_CONFIG1_i Register: TIMEPARAGRANULARITY = 0h = x1 latencies (affecting RD/WRCYCLETIME, RD/
WRACCESSTIME, PAGEBURSTACCESSTIME, CSONTIME, CSRD/WROFFTIME, ADVONTIME, ADVRD/WROFFTIME,
OEONTIME, OEOFFTIME, WEONTIME, WEOFFTIME, CYCLE2CYCLEDELAY, BUSTURNAROUND, TIMEOUTSTARTVALUE,
WRDATAONADMUXBUS)
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GNF2 GNF5
GPMC_BE0n_CLE
GPMC_ADCn_ALE
GPMC_OEn_REn
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] Command
GPMC_12
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GPMC_BE0n_CLE
GNF7 GNF8
GPMC_ADVn_ALE
GPMC_OEn_REn
GNF9
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] Address
GPMC_13
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
GPMC_FCLK
GNF12
GNF10 GNF15
GPMC_CSn[i]
GPMC_BE0n_CLE
GPMC_ADVn_ALE
GNF14
GNF13
GPMC_OEn_REn
GPMC_AD[15:0] DATA
GPMC_WAIT[j]
GPMC_14
A. GNF12 parameter illustrates amount of time required to internally sample input data. It is expressed in number of GPMC functional
clock cycles. From start of read cycle and after GNF12 functional clock cycles, input data will be internally sampled by active functional
clock edge. GNF12 value must be stored inside AccessTime register bits field.
B. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
C. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3. In GPMC_WAIT[j], j is equal to 0 or 1.
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GPMC_BE0n_CLE
GPMC_ADVn_ALE
GPMC_OEn_REn
GNF9
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] DATA
GPMC_15
6.9.5.14 I2C
The device contains six multicontroller Inter-Integrated Circuit (I2C) controllers. Each I2C controller was
designed to be compliant to the Philips I2C-bus™ specification version 2.1. However, the device IOs are not
fully compliant to the I2C electrical specification. The speeds supported and exceptions are described per port
below:
• I2C0, I2C1, I2C2, and I2C3
– Speeds:
• Standard-mode (up to 100Kbits/s)
– 1.8V
– 3.3V
• Fast-mode (up to 400Kbits/s)
– 1.8V
– 3.3V
– Exceptions:
• The IOs associated with these ports are not compliant to the fall time requirements defined in the I2C
specification because they are implemented with higher performance LVCMOS push-pull IOs that were
designed to support other signal functions that could not be implemented with I2C compatible IOs. The
LVCMOS IOs being used on these ports are connected such they emulate open-drain outputs. This
emulation is achieved by forcing a constant low output and disabling the output buffer to enter the Hi-Z
state.
• The I2C specification defines a maximum input voltage VIH of (VDDmax + 0.5V), which exceeds the
absolute maximum ratings for the device IOs. The system must be designed to ensure the I2C signals
never exceed the limits defined in the Absolute Maximum Ratings section of this datasheet.
• MCU_I2C0 and WKUP_I2C0
– Speeds:
• Standard-mode (up to 100Kbits/s)
– 1.8V
– 3.3V
• Fast-mode (up to 400Kbits/s)
– 1.8V
– 3.3V
• Hs-mode (up to 3.4Mbits/s)
– 1.8V
– Exceptions:
• The IOs associated with these ports were not design to support Hs-mode while operating at 3.3V. So
Hs-mode is limited to 1.8V operation.
• The rise and fall times of the I2C signals connected to these ports must not exceed a slew rate of
0.08V/ns (or 8E+7V/s) when operating at 3.3V. This limit is more restrictive than the minimum fall time
limits defined in the I2C specification. Therefore, it may be necessary to add additional capacitance to
the I2C signals to slow the rise and fall times such that they do not exceed a slew rate of 0.08V/ns.
• The I2C specification defines a maximum input voltage VIH of (VDDmax + 0.5V), which exceeds the
absolute maximum ratings for the device IOs. The system must be designed to ensure the I2C signals
never exceed the limits defined in the Absolute Maximum Ratings section of this datasheet.
Note
I2C3 has one or more signals which can be multiplexed to more than one pin. Timing is only valid for
specific pin combinations known as IOSETs. Valid pin combinations or IOSETs for this interface are
defined in the SysConfig-PinMux Tool.
Refer to the Philips I2C-bus specification version 2.1 for timing details.
For more details about features and additional description information on the device Inter-Integrated Circuit, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
6.9.5.15 MCAN
Table 6-71 and Table 6-72 presents timing conditions and switching characteristics for MCAN.
For more details about features and additional description information on the device Controller Area Network
Interface, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Note
The device has multiple MCAN modules. MCANn is a generic prefix applied to MCAN signal names,
where n represents the specific MCAN module.
For more information, see Controller Area Network (MCAN) section in Peripherals chapter in the device TRM.
6.9.5.16 MCASP
Note
McASP has one or more signals which can be multiplexed to more than one pin. Timing requirements
and switching characteristics defined in this section are only valid for specific pin combinations known
as IOSETs. Valid pin combinations or IOSETs for this interface are defined in the SysConfig-PinMux
Tool.
Table 6-73, Table 6-74, Figure 6-62, Table 6-75, and Figure 6-63 present timing conditions, timing requirements,
and switching characteristics for MCASP.
Table 6-73. MCASP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.7 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1 10 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 100 1100 ps
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
ASP2
ASP1
ASP2
MCASP[x]_AHCLKR/X (Falling Edge Priority)
ASP4
ASP3 ASP4
(A)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 0)
(B)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 1)
ASP6
ASP5
MCASP[x]_AFSR/X (Bit Width, 0 Bit Delay)
ASP8
ASP7
MCASP[x]_AXR[x] (Data In/Receive)
A. For CLKRP = CLKXP = 0, the MCASP transmitter is configured for rising edge (to shift data out) and the MCASP receiver is configured
for falling edge (to shift data in).
B. For CLKRP = CLKXP = 1, the MCASP transmitter is configured for falling edge (to shift data out) and the MCASP receiver is configured
for rising edge (to shift data in).
ASP10
ASP9 ASP10
ASP12
ASP11
ASP12
(A)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 1)
(B)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 0)
ASP13 ASP13
ASP13 ASP13
MCASP[x]_AFSR/X (Bit Width, 0 Bit Delay)
A. For CLKRP = CLKXP = 1, the MCASP transmitter is configured for falling edge (to shift data out) and the MCASP receiver is configured
for rising edge (to shift data in).
B. For CLKRP = CLKXP = 0, the MCASP transmitter is configured for rising edge (to shift data out) and the MCASP receiver is configured
for falling edge (to shift data in).
For more information, see Multichannel Audio Serial Port (MCASP) section in Peripherals chapter in the device
TRM.
6.9.5.17 MCSPI
Note
McSPI has one or more signals which can be multiplexed to more than one pin. Timing requirements
and switching characteristics defined in this section are only valid for specific pin combinations known
as IOSETs. Valid pin combinations or IOSETs for this interface are defined in the SysConfig-PinMux
Tool.
For more details about features and additional description information on the device Serial Port Interface, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-76 presents timing conditions for MCSPI.
Table 6-76. MCSPI Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 2 8.5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 6 12 pF
For more information, see Multichannel Serial Peripheral Interface (MCSPI) section in Peripherals chapter in the
device TRM.
PHA=0
EPOL=1
SPI_CS[i] (OUT)
SM1
SM3
SM8 SM2 SM9
SPI_SCLK (OUT) POL=0
SM1
SM3
SM2
POL=1
SPI_SCLK (OUT)
SM5
SM5
SM4 SM4
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (OUT)
SM2
SM1
SM8 SM3 SM9
SPI_SCLK (OUT) POL=0
SM1
SM2
SM3
POL=1
SPI_SCLK (OUT)
SM5
SM4
SM4 SM5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_02
PHA=0
EPOL=1
SPI_CS[i] (OUT)
SM1
SM3
SM8 SM2 SM9
SPI_SCLK (OUT) POL=0
SM1
SM3
POL=1 SM2
SPI_SCLK (OUT)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (OUT)
SM1
SM2
SM8 SM3 SM9
SPI_SCLK (OUT) POL=0
SM1
SM2
POL=1 SM3
SPI_SCLK (OUT)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit0
SPRSP08_TIMING_McSPI_01
SS1
SS2
SS8 SS3 SS9
SPI_SCLK (IN) POL=0
SS1
SS2
POL=1 SS3
SPI_SCLK (IN)
SS5 SS4
SS4 SS5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
POL=0
SPI_SCLK (IN)
SS1
SS3
POL=1 SS2
SPI_SCLK (IN)
SS4
SS5
SS4 SS5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_04
PHA=0
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
SPI_SCLK (IN) POL=0
SS1
SS2
POL=1 SS3
SPI_SCLK (IN)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
POL=0
SPI_SCLK (IN)
SS1
SS3
POL=1 SS2
SPI_SCLK (IN)
SPI_D[x] (OUT)
Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_03
6.9.5.18 MMCSD
The MMCSD Host Controller provides an interface to embedded Multi-Media Card (MMC), Secure Digital (SD),
and Secure Digital IO (SDIO) devices. The MMCSD Host Controller deals with MMC/SD/SDIO protocol at
transmission level, data packing, adding cyclic redundancy checks (CRCs), start/end bit insertion, and checking
for syntactical correctness.
For more details about MMCSD interfaces, see the corresponding MMC0, MMC1, and MMC2 subsections within
Signal Descriptions and Detailed Description sections.
Note
Some operating modes require software configuration of the MMC DLL delay settings, as shown in
Table 6-81 and Table 6-99.
The modes which show a value of "Tuning" in the ITAPDLYSEL column of Table 6-81 and Table 6-99
require a tuning algorithm to be used for optimizing input timing. Refer to the MMCSD Programming
Guide in the device TRM for more information on the tuning algorithm and configuration of input
delays required to optimize input timing.
For more information, see Multi-Media Card/Secure Digital (MMCSD) Interface section in Peripherals chapter in
the device TRM.
HS4000
MMC0_DS VT
HS4000
VIH
Valid Valid
MMC0_DAT[7-0]
Window Window
VIL
HS4003 HS4004
VIH
Valid
MMC0_CMD
Window
VIL
(1) This parameter defines the output setup time provided to the attached device. This time is relative to the next capture clock edge and
already includes the maximum propagation delay mismatch value defined in the MMC0 Timing Conditions table. The timing references
for this parameter are from mid-supply of the DAT or CMD signal transition to mid-supply of the CLK signal transition. The eMMC
standard defines the setup timing references from VIL or VIH of the DAT or CMD signal transition to mid-supply of the CLK signal
transition. Therefore, the system designer must consider the impact of the DAT signal slew rate when designing the PCB, and ensure
the time it takes for the DAT signal to slew from mid-supply to VIL or VIH does not erode the setup time margin.
(2) This parameter defines the output hold time provided to the attached device. This time is relative to the previous launch clock edge and
already includes the maximum propagation delay mismatch value defined in the MMC0 Timing Conditions table. The timing references
for this parameter are from mid-supply of the CLK signal transition to mid-supply of the DAT or CMD signal transition. The eMMC
standard defines the hold timing references from mid-supply of the CLK signal transition to VIL or VIH of the DAT or CMD signal
transition. Therefore, the system designer must consider the impact of the DAT signal slew rate when designing the PCB, and ensure
the time it takes for the DAT signal to slew from VIL or VIH to mid-supply does not erode the hold time margin.
HS4005
HS4006 HS4007
MMC0_CLK
HS4008 HS40010
MMC0_CMD
HS40011 HS40011
HS4009 HS4009
MMC0_DAT[7:0]
MMC[x]_CLK
SDR121 SDR122
MMC[x]_CMD
SDR123 SDR124
MMC[x]_DAT[3:0]
SDR125
SDR126 SDR127
MMC[x]_CLK
SDR128 SDR128
MMC[x]_CMD
SDR129 SDR129
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR251 SDR252
MMC[x]_CMD
SDR253 SDR254
MMC[x]_DAT[3:0]
SDR255
SDR256 SDR257
MMC[x]_CLK
SDR258 SDR258
MMC[x]_CMD
SDR259 SDR259
MMC[x]_DAT[3:0]
SDR505
SDR506 SDR507
MMC[x]_CLK
SDR508 SDR508
MMC[x]_CMD
SDR509 SDR509
MMC[x]_DAT[3:0]
DDR505
DDR506 DDR507
MMC[x]_CLK
DDR508
MMC[x]_CMD
DDR509 DDR509
MMC[x]_DAT[3:0]
SDR1045
SDR1046 SDR1047
MMC[x]_CLK
SDR1048 SDR1048
MMC[x]_CMD
SDR1049 SDR1049
MMC[x]_DAT[3:0]
(1) Tuning means this mode requires a tuning algorithm to be used for optimal input timing
MMC[x]_CLK
DS1 DS2
MMC[x]_CMD
DS3 DS4
MMC[x]_DAT[3:0]
DS5
DS6 DS7
MMC[x]_CLK
D S8
MMC[x]_CMD
D S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
HS1 H S2
MMC[x]_CMD
HS3 H S4
MMC[x]_DAT[3:0]
HS5
HS6 HS7
MMC[x]_CLK
H S8
MMC[x]_CMD
H S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR121 SDR122
MMC[x]_CMD
SDR123 SDR124
MMC[x]_DAT[3:0]
SDR125
SDR126 SDR127
MMC[x]_CLK
SDR128 SDR128
MMC[x]_CMD
SDR129 SDR129
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR251 SDR252
MMC[x]_CMD
SDR253 SDR254
MMC[x]_DAT[3:0]
SDR255
SDR256 SDR257
MMC[x]_CLK
SDR258 SDR258
MMC[x]_CMD
SDR259 SDR259
MMC[x]_DAT[3:0]
SDR505
SDR506 SDR507
MMC[x]_CLK
SDR508 SDR508
MMC[x]_CMD
SDR509 SDR509
MMC[x]_DAT[3:0]
DDR505
DDR506 DDR507
MMC[x]_CLK
DDR508
MMC[x]_CMD
DDR509 DDR509
MMC[x]_DAT[3:0]
SDR1045
SDR1046 SDR1047
MMC[x]_CLK
SDR1048 SDR1048
MMC[x]_CMD
SDR1049 SDR1049
MMC[x]_DAT[3:0]
6.9.5.19 OSPI
OSPI0 offers two data capture modes, PHY mode and Tap mode.
PHY mode uses an internal reference clock to transmit and receive data via a DLL based PHY, where each
reference clock cycle produces a single cycle of OSPI0_CLK for Single Data Rate (SDR) transfers or a half
cycle of OSPI0_CLK for Double Data Rate (DDR) transfers. PHY mode supports four clocking topologies
for the receive data capture clock. Internal PHY Loopback - uses the internal reference clock as the PHY
receive data capture clock. Internal Pad Loopback - uses OSPI0_LBCLKO looped back into the PHY from the
OSPI0_LBCLKO pin as the PHY receive data capture clock. External Board Loopback - uses OSPI0_LBCLKO
looped back into the PHY from the OSPI0_DQS pin as the PHY receive data capture clock. DQS - uses the DQS
output from the attached device as the PHY receive data capture clock. SDR transfers are not supported when
using the Internal Pad Loopback and DQS clocking topologies. DDR transfers are not supported when using the
Internal PHY Loopback or Internal Pad Loopback clocking topologies.
Tap mode uses an internal reference clock with selectable taps to adjusted data transmit and receive capture
delays relative to OSPI0_CLK, which is a divide by 4 of the internal reference clock for SDR transfers or a divide
by 8 of the internal reference clock for DDR transfers. Tap mode only supports one clocking topology for the
receive data capture clock. No Loopback - uses the internal reference clock as the Tap receive data capture
clock. This clocking topology supports a maximum internal reference clock rate of 200MHz, which produces an
OSPI0_CLK rate up to 50MHz for SDR mode or 25MHz for DDR mode.
For more information, see Octal Serial Peripheral Interface (OSPI) section in Peripherals chapter in the device
TRM.
For more details about features and additional description information on the device Octal Serial Peripheral
Interface, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Section 6.9.5.19.1 defines timing requirements and switching characteristics associated with PHY mode and
Section 6.9.5.19.2 defines timing requirements and switching characteristics associated with Tap mode.
Table 6-112 presents timing conditions for OSPI0.
Table 6-112. OSPI0 Timing Conditions
PARAMETER MODE MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 6 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 3 10 pF
PCB CONNECTIVITY REQUIREMENTS
No Loopback
Propagation delay of OSPI0_CLK trace Internal PHY Loopback 450 ps
Internal Pad Loopback
td(Trace Delay)
Propagation delay of OSPI0_LBCLKO
External Board Loopback 2L(1) - 30 2L(1) + 30 ps
trace
Propagation delay of OSPI0_DQS trace DQS L(1) - 30 L(1) + 30 ps
Propagation delay mismatch of
td(Trace Mismatch
OSPI0_D[7:0] and OSPI0_CSn[3:0] All modes 60 ps
Delay)
relative to OSPI0_CLK
Receive
All modes PHY_CONFIG_RX_DLL_DELAY_FLD (2)
(1) Minimum setup and hold time requirements for OSPI0_D[7:0] inputs are not defined when Data Training is used to find the optimum
data valid window. The tDVW parameter defines the minimum data invalid window required. This parameter is provided in lieu of
minimum setup and minimum hold times, where it must be used to check compatibility with the data valid window provided by an
attached device.
OSPI_DQS
OSPI_D[i:0]
OSPI_TIMING_04
Figure 6-95. OSPI0 Timing Requirements – PHY Data Training, DDR with DQS
OSPI_DQS
O21 O22
OSPI_D[i:0]
OSPI_TIMING_06
Figure 6-96. OSPI0 Timing Requirements – PHY Data Training, SDR with External Board Loopback
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
Note
Timing parameters defined in this section are only applicable when data training is not implemented
and DLL delays are configured as described in Section 6.9.5.19.1.2.1 and Section 6.9.5.19.1.2.2.
Setup time, OSPI0_D[7:0] valid before 1.8V, SDR with Internal PHY Loopback 4.8 ns
O19 tsu(D-CLK)
active OSPI0_CLK edge 3.3V, SDR with Internal PHY Loopback 5.19 ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, SDR with Internal PHY Loopback -0.5 ns
O20 th(CLK-D)
OSPI0_CLK edge 3.3V, SDR with Internal PHY Loopback -0.5 ns
Setup time, OSPI0_D[7:0] valid before 1.8V, SDR with External Board Loopback 0.6 ns
O21 tsu(D-LBCLK)
active OSPI0_DQS edge 3.3V, SDR with External Board Loopback 0.9 ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, SDR with External Board Loopback 1.7 ns
O22 th(LBCLK-D)
OSPI0_DQS edge 3.3V, SDR with External Board Loopback 2.0 ns
OSPI_CLK
O19 O20
OSPI_D[i:0]
OSPI_TIMING_05
Figure 6-99. OSPI0 Timing Requirements – PHY SDR with Internal PHY Loopback
OSPI_DQS
O21 O22
OSPI_D[i:0]
OSPI_TIMING_06
Figure 6-100. OSPI0 Timing Requirements – PHY SDR with External Board Loopback
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
Setup time, OSPI0_D[7:0] valid before 1.8V, DDR with DQS -0.46 ns
O15 tsu(D-LBCLK)
active OSPI0_DQS edge 3.3V, DDR with External Board Loopback 1.23 ns
3.3V, DDR with DQS -0.66 ns
1.8V, DDR with External Board Loopback 1.24(1) ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, DDR with DQS 3.59 ns
O16 th(LBCLK-D)
OSPI0_DQS edge 3.3V, DDR with External Board Loopback 1.44(1) ns
3.3V, DDR with DQS 7.92 ns
(1) This Hold time requirement is larger than the Hold time provided by a typical OSPI/QSPI/SPI device. Therefore, the trace length
between the SoC and attached OSPI/QSPI/SPI device must be sufficiently long enough to ensure that the Hold time is met at the SoC.
The length of the SoC's external loopback clock (OSPI0_LBCLKO to OSPI0_DQS) may need to be shortened to compensate.
OSPI_DQS
OSPI_D[i:0]
OSPI_TIMING_04
Figure 6-102. OSPI0 Timing Requirements – PHY DDR with External Board Loopback or DQS
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
(1) T = OSPI_RD_DATA_CAPTURE_REG[DELAY_FLD]
(2) R = reference clock cycle time in ns
OSPI_CLK
O19 O20
OSPI_D[i:0]
OSPI_TIMING_05
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
(1) T = OSPI_RD_DATA_CAPTURE_REG[DELAY_FLD]
(2) R = reference clock cycle time in ns
OSPI_CLK
OSPI_D[i:0]
OSPI_TIMING_03
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
6.9.5.20 PCIe
The PCI-Express Subsystem is compliant with the PCIe® Base Specification, Revision 4.0. Refer to the
specification for timing details.
For more details about features and additional description information on the device Peripheral Component
Interconnect Express (PCIe), see the SERDES0 Signal Descriptions and the corresponding subsection within
Detailed Description.
For more information, see Peripheral Component Interconnect Express (PCIe) Subsystem section in Peripherals
chapter of the device TRM.
6.9.5.21 Timers
For more details about features and additional description information on the device Timers, see the
corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-126. Timer Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 10 pF
TIMER_IOx (inputs)
T3 T4
TIMER_IOx (outputs)
TIMER_01
For more information, see Timers section in Peripherals chapter in the device TRM.
6.9.5.22 UART
For more details about features and additional description information on the device Universal Asynchronous
Receiver Transmitter, see the corresponding subsections within Signal Descriptions and Detailed Description
sections.
Table 6-129. UART Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1 30(1) pF
(1) This value represents an absolute maximum load capacitance. As the UART baud rate increases, it may be necessary to reduce the
load capacitance to a value less than this maximum limit to provide enough timing margin for the attached device. The output rise/fall
times increase as capacitive load increases, which decreases the time data is valid for the receiver of the attached devices. Therefore,
it is important to understand the minimum data valid time required by the attached device at the operating baud rate. Then use the
device IBIS models to verify the actual load capacitance on the UART signals does not increase the rise/fall times beyond the point
where the minimum data valid time of the attached device is violated.
Table 6-130. UART Timing Requirements
see Figure 6-109
NO. PARAMETER DESCRIPTION MIN MAX UNIT
0.95U(1) 1.05U(1)
1 tw(RXD) Pulse width, receive data bit high or low (2) (2) ns
0.95U(1)
2 tw(RXDS) Pulse width, receive start bit low (2) ns
(1) U = UART baud time in ns = 1/actual baud rate, where the actual baud rate is defined in the UART Baud Rate Settings table of the
device TRM.
2
1
Start
VIH
UARTi_RXD Bit
VIL
Data Bits
4
3
Start
UARTi_TXD Bit
Data Bits
UART_TIMING_01_RCVRVIHVIL
For more information, see Universal Asynchronous Receiver/Transmitter (UART) section in Peripherals chapter
in the device TRM.
6.9.5.23 USB
The USB 2.0 subsystem is compliant with the Universal Serial Bus (USB) Specification, revision 2.0. Refer to the
specification for timing details.
For more details about features and additional description information on the device Universal Serial Bus
Subsystem (USB), see the corresponding subsections within Signal Descriptions and Detailed Description
sections.
7 Detailed Description
7.1 Overview
The AM67x scalable processor family is based on the evolutionary Jacinto™ 7 architecture, targeted at Smart
Vision Camera and General Compute applications and built on extensive market knowledge accumulated over
a decade of TI’s leadership in the Vision processor market. The AM67x family is built for a broad set of
cost-sensitive high performance compute applications in factory automation, building automation, and other
markets.
Key features and benefits:
• Focus on innovation and fast development with Linux® and Android™ SDKs accompanied with real-time
functional safety and security SDKs.
• Address next wave of HMI designs with new generation of 3D GPU and 4K video acceleration.
• Enhance your design connectivity with an extensive set of automotive and high-speed IOs, including: 4x
CAN-FD, 3-port Gigabit Ethernet switch (two external ports) with TSN support, and two USB2.0 ports.
• Supports the latest cybersecurity requirements with the built-in Hardware Security Module (HSM).
• Provides intelligent features, such as: facial recognition and touchless HMI with Arm® Cortex®-A53 CPUs
and open-source AI software and tools
The AM67x processors comply with the AEC - Q100 automotive standard and support industrial-grade. ASIL-B
and SIL-2 functional safety requirements can be addressed using an integrated Arm Cortex-R5F core and
dedicated peripherals, which can all be isolated from the rest of the processor.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
OSPI[x]_LBCLKO
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_01
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK pin, is placeholder for fine tuning, if needed.
Figure 8-1. OSPI Connectivity Schematic for No Loopback, Internal PHY Loopback, and Internal Pad
Loopback
Note
The External Board Loopback hold time requirement (defined by parameter number O16 in the OSPI0
Timing Requirements - PHY DDR Mode section) may be larger than the hold time provided by a
typical OSPI/QSPI/SPI device. In this case, the propagation delay of OPSI[x]_LBCLKO pin to the
OSPI[x]_DQS pin (C to D) can be reduced to provide additional hold time.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
C
R1
0 Ω*
OSPI[x]_LBCLKO
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_02
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK and OSPI[x]_LBCLKO pins, is a placeholder for fine tuning, if
needed.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
OSPI[x]_LBCLKO
C D
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_03
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK pin, is a placeholder for fine tuning, if needed.
Device
USBn_VBUS
16.5 kΩ 3.48 kΩ
±1% ±1%
VBUS signal
10 kΩ
±1% 6.8V
(BZX84C6V8 or equivalent)
VSS VSS
J7ES_USB_VBUS_01
The USB0_VBUS pin can be considered to be fail-safe because the external circuit in Figure 8-4 limits the input
current to the actual device pin in a case where VBUS is applied while the device is powered off.
8.2.4 System Power Supply Monitor Design Guidelines
The VMON_VSYS pin provides a way to monitor a system power supply. This system power supply is typically
a single pre-regulated power source for the entire system and can be connected to the VMON_VSYS pin via
and external resistor divider circuit. This system supply is monitored by comparing the external voltage divider
output voltage to an internal voltage reference, where a power fail event is triggered when the voltage applied
to VMON_VSYS drops below the internal reference voltage. The actual system power supply voltage trip point
is determined by the system designer when selecting component values used to implement the external resistor
voltage divider circuit.
When designing the resistor divider circuit the designer must understand various factors which contribute to
variability in the system power supply monitor trip point. The first thing to consider is the initial accuracy of
the VMON_VSYS input threshold which has a nominal value of 0.45V, with a variation of ±3%. Precision
1% resistors with similar thermal coefficient are recommended for implementing the resistor voltage divider.
This minimizes variability contributed by resistor value tolerances. Input leakage current associated with
VMON_VSYS must also be considered since any current flowing into the pin creates a loading error on the
voltage divider output. The VMON_VSYS input leakage current can be in the range of 10nA to 2.5µA when
applying 0.45V.
Note
The resistor voltage divider shall be designed such that the output voltage never exceeds the
maximum value defined in the Recommended Operating Conditions section, during normal operating
conditions.
Figure 8-5 presents an example, where the system power supply is nominally 5V and the maximum trigger
threshold is 5V - 10%, or 4.5V.
For this example, the designer must understand which variables effect the maximum trigger threshold when
selecting resistor values. A device which has a VMON_VSYS input threshold of 0.45V + 3% needs to be
considered when trying to design a voltage divider that doesn’t trip until the system supply drops 10%. The effect
of resistor tolerance and input leakage also needs to be considered, but the contribution to the maximum trigger
point is not obvious. When selecting component values which produce a maximum trigger voltage, the system
designer must consider a condition where the value of R1 is 1% low and the value of R2 is 1% high combined
with a condition where input leakage current for the VMON_VSYS pin is 2.5µA. When implementing a resistor
divider where R1 = 4.81KΩ and R2 = 40.2KΩ, the result is a maximum trigger threshold of 4.517V.
Once component values have been selected to satisfy the maximum trigger voltage as described above, the
system designer can determine the minimum trigger voltage by calculating the applied voltage that produces an
output voltage of 0.45V - 3% when the value of R1 is 1% high and the value of R2 is 1% low, and the input
leakage current is 10nA, or zero. Using an input leakage of zero with the resistor values given above, the result
is a minimum trigger threshold of 4.013V.
This example demonstrates a system power supply voltage trip point that ranges from 4.013V to 4.517V.
Approximately 250mV of this range is introduced by VMON_VSYS input threshold accuracy of ±3%,
approximately 150 mV of this range is introduced by resistor tolerance of ±1%, and approximately 100mV of
this range is introduced by loading error when VMON_VSYS input leakage current is 2.5µA.
The resistor values selected in this example produces approximately 100µA of bias current through the resistor
divider when the system supply is 4.5V. The 100mV of loading error mentioned above can be reduced to about
10mV by increasing the bias current through the resistor divider to approximately 1mA. So resistor divider bias
current vs loading error is something the system designer needs to consider when selecting component values.
The system designer must also consider implementing a noise filter on the voltage divider output since
VMON_VSYS has minimum hysteresis and a high-bandwidth response to transients. This can be done by
installing a capacitor across R1 as shown in Figure 8-5. However, the system designer must determine the
response time of this filter based on system supply noise and expected response to transient events.
Device
VMON_VSYS
R2
VSYS
40.2 kΩ ±1% (System Power Supply)
R1 4.81 kΩ
C1
±1%
Value = Determined by system designer
VSS
SPRSP56_VMON_ER_MON_01
VMON_1P8_SOC pin provides a way to monitor external 1.8V power supplies. This pin must be connected
directly to their respective power source. An internal resistor divider with software control is implemented inside
the SoC for each of these pins. Software can program each internal resistor divider to create appropriate under
voltage and over voltage interrupts.
VMON_3P3_SOC pin provides a way to monitor external 3.3V power supplies. This pin must be connected
directly to their respective power source. An internal resistor divider with software control is implemented inside
the SoC for each of these pins. Software can program each internal resistor divider to create appropriate under
voltage and over voltage interrupts.
Note
Implementing a ground guard between the MCU_OSC0_XI and MCU_OSC0_XO signals is critical
to minimize shunt capacitance between the two signals. Routing these two signals adjacent to each
other without a ground guard between them will effectively reduce the gain of the oscillator amplifier,
which reduces its ability to start oscillation.
GND vias
Device
Cap
GND guard
MCU_OSC0_XO
GND vias
Figure 8-6. MCU_OSC0 PCB requirements
X Experimental device that is not necessarily representative of the final device's electrical specifications and
may not use production assembly flow.
P Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical
specifications.
null Production version of the silicon die that is fully qualified.
X and P devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
For orderable part numbers of AM67x devices in the AMWpackage type, see the Package Option Addendum of
this document, the TI website (ti.com), or contact your TI sales representative.
Note
Some devices may have a cosmetic circular marking visible on the top of the device package which
results from the production test process. In addition, some devices may also show a color variation in
the package substrate which results from the substrate manufacturer. These differences are cosmetic
only with no reliability impact.
TI aBBBBB
BBrZfYt Q1
XXXXXXX
YYY PPP
A1
(PIN 1 INDICATOR)
(1) To designate the stages in the product development cycle, TI assigns prefixes to the part numbers. These prefixes represent
evolutionary stages of product development from engineering prototypes through fully qualified production devices.
Prototype devices are shipped against the following disclaimer:
“This product is still in development and is intended for internal evaluation purposes.”
Notwithstanding any provision to the contrary, TI makes no warranty expressed, implied, or statutory, including any implied warranty of
merchantability of fitness for a specific purpose, of this device.
(2) J722S is the base part number for the preproduction superset device. Software should constrain the features used to match the
intended production device.
Note
BLANK in the symbol or part number is collapsed so there are no gaps between characters.
9.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
Changes from March 22, 2024 to September 30, 2024 (from Revision * (March 2024) to
Revision A (September 2024)) Page
• Global: Changed the document product status from "Advance Information" to "Production Data"................... 1
• (Features): Added "Motion JPEG encode" feature.............................................................................................1
• (Features/Media and Data Storage): Updated/Changed the "… eMMC interface up to HS200 speed" to "… up
to HS400 speed".................................................................................................................................................1
• (Features): Updated/Changed the CSI2.0 bullet and added sub-bullets............................................................1
• (Applications): Add End Equipment (EE) ulinks to the Applications list..............................................................3
• (Functional Block Diagram): Added an additional ulink for the non-A AM67 TI Software Development Kit
(SDK).................................................................................................................................................................. 5
• (Functional Block Diagram): Added a "JPEG Encode" block to the Multimedia main block...............................5
• (Device Comparison): Added an additional ulink for the non-A AM67 TI Software Development Kit (SDK) to
the "To understand what device features are currently supported by TI Software Development Kits, …" Note.7
• (SDIO Electrical Characteristics): Changed VDDSHV5 power rail name, where applicable, used to define the
VIL/VILSS/VIH/VIHSS/VOL/VOH parameter values by referencing a generic power rail name (VDD), and added an
associated table note........................................................................................................................................90
• (Recommended Operating Conditions for OTP eFuse Programming): Changed the "VPP Slew Rate"
parameter name to "VPP Power-up Slew Rate" to clarify the limit associated with this parameter only applies
during power-up................................................................................................................................................93
• (Power-Up Sequencing): Added note to clarify power rails must decay below 300mv before initiating a new
power-up sequence.......................................................................................................................................... 98
• (Power-Down Sequencing): Added note to clarify power rails must decay below 300mv before initiating a new
power-up sequence........................................................................................................................................ 101
• (BOOTMODE Timing Requirements): Updated the description for parameters RST23 and RST24............. 104
• (MCU_OSC0 LVCMOS Digital Clock Source): Added the new MCU_OSC0 LVCMOS Digital Clock Source
Requirements table.........................................................................................................................................116
• (CPSW3G RGMII Timing Conditions): Added operating voltage conditions to the Input Slew Rate parameter
to allow a relaxed slew rate when operating at 1.8V...................................................................................... 128
• (I2C): Changed the maximum slew rate value from 0.8V/ns to 0.08V/ns and added "when operating at 3.3V"
to clarify the exception is not applicable to 1.8V operation.............................................................................164
• (MMC0 Timing Requirements – HS400 Mode): Changed the maximum values associated with parameters
HS4001, HS4002, HS4003, and HS4004 from 500 to 475............................................................................ 183
• (MMC0 Switching Characteristics – HS400 Mode): Replaced the Delay time parameters HS4008 and
HS4009 with Output setup and Output hold parameters HS4008, HS4009, HS40010, and HS40011.......... 183
• (eMMC in – HS400 Mode – Transmitter Mode): Updated the timing diagram to match the new definitions
associated with parameters HS4008, HS4009, HS40010, and HS40011...................................................... 183
• (Device Nomenclature): Updated/Changed the package type (designator) form "AMH" to "AMW" in the
orderable part numbers paragraph.................................................................................................................225
• (Nomenclature Description): Updated/Changed the table to match the Standard Package Symbolization
image.............................................................................................................................................................. 227
www.ti.com 12-Dec-2024
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
AM6734AKGHIAMWR ACTIVE FCBGA AMW 594 750 RoHS & Green Call TI Level-3-250C-168 HR -40 to 125 AM67 Samples
34AKGHI
AM6754AKGHIAMWR ACTIVE FCBGA AMW 594 750 RoHS & Green Call TI Level-3-250C-168 HR -40 to 125 AM67 Samples
54AKGHI
AM67A74AKGHIAMWR ACTIVE FCBGA AMW 594 750 RoHS & Green Call TI Level-3-250C-168 HR -40 to 125 AM67A Samples
74AKGHI
AM67A94AKGHIAMWR ACTIVE FCBGA AMW 594 750 RoHS & Green Call TI Level-3-250C-168 HR -40 to 125 AM67A Samples
94AKGHI
XAM6754AKGHIAMW ACTIVE FCBGA AMW 594 1 TBD Call TI Call TI -40 to 125 Samples
XAM67A94AKGHIAMW ACTIVE FCBGA AMW 594 1 TBD Call TI Call TI -40 to 125 Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 12-Dec-2024
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE OUTLINE
AMW0594A SCALE 0.900
FCBGA - 2.473 mm max height
BALL GRID ARRAY
18.1 A
B
17.9
BALL A1 CORNER
PIN 1 ID
18.1
17.9
( 13.6)
0.1 C
( 17.6)
( 11.6)
2.154
2.473 1.950 0.2 C
2.245
C
SEATING PLANE
0.357
TYP 0.15 C
0.257
16.9 TYP
AG
AF
AE
AD
AC
AB
AA
Y
W
V
U
T
PKG R
P 16.9
N
M
L
TYP
K
J
H
G
F
E
D
C
B
A
0.45 1 2 3 4 5 6 7 8 9 10 12 14 16 18 20 22 24 26
594X NOTE 3 11 13 15 17 19 21 23 25 27
0.35 0.65 TYP
0.25 C A B
0.1 C
4229875/A 07/2023
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Ball diameter after reflow. Dimension is measured at the maximum solder ball diameter parallel to primary datum C.
www.ti.com
EXAMPLE BOARD LAYOUT
AMW0594A FCBGA - 2.473 mm max height
BALL GRID ARRAY
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
(0.65) TYP A
B
C
D
E
F
G
H
J
K
L
M
N
PKG
P
R
T
U
V
W
Y
AA
AB
AC
AD
AE
AF
AG
PKG
0.07 MAX
( 0.35) 0.07 MIN METAL UNDER
METAL SOLDER MASK
EXPOSED METAL
4229875/A 07/2023
NOTES: (continued)
4. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For more information, see Texas Instruments literature number SPRU811 (www.ti.com/lit/spru811).
www.ti.com
EXAMPLE STENCIL DESIGN
AMW0594A FCBGA - 2.473 mm max height
BALL GRID ARRAY
(0.65) TYP A
B
C
D
E
F
G
H
J
K
L
M
N
PKG
P
R
T
U
V
W
Y
AA
AB
AC
AD
AE
AF
AG
PKG
4229875/A 07/2023
NOTES: (continued)
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
www.ti.com
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