Asian Journal of Convergence in Technology Volume II, Issue III

Issn No.:2350-1146, I.F-2.71

Simple and Low Cost IC Tester for Analog and Digital

Labs
Amol R. Sutar Rashmi R. Kulkarni Ashwin Chhetri
Department of Electronics and Department of Electronics and
Department Electronics Engineering
Telecommunication Telecommunication
Finolex Academy of Management and Finolex Academy of Management and Finolex Academy of Management and
Technology Technology Technology
Ratnagiri, India Ratnagiri,India Ratnagiri,India
[email protected] [email protected]

Abstract – Integrated Circuits (ICs) are the important “PASS” message get displayed on LCD. If output of IC is not
component of each and every electronic circuit and can be used tallied with expected one then “FAIL” message get displayed
for wide variety of purposes. Sometime due to faulty ICs the on LCD. Selection of microcontroller is based on it’s memory
circuit doesn’t work. It takes lot of efforts to troubleshoot the capacity.
circuit and confirm whether the circuit is creating problem or
the IC is faulty. So the proposed project is designed to
confirm whether the IC under consideration is properly
working or not. Unlike the IC testers available in the market II. BLOCK DIAGRAM OF SYSTEM
today which are usually expensive, this IC tester is affordable The block diagram of the programmable analog and digital
and user-friendly. This Digital and Analog IC tester is
IC tester is as shown in fig.1. It consists of single
constructed using microcontroller along with a keyboard and a
display unit. Since it is programmable, any number of ICs microcontroller IC, a 24-pin ZIF socket, a 4x3 matrix keypad
can be tested within the constraint of the memory available. unit, a LCD display unit. It needs 5v power supply. We have
This IC tester can be used to test a wide variety of ICs which used regulator IC7805 that gives output voltage of 5V. The
includes simple logic gates and also sequential and minimum input voltage required for the IC7805 is near about
combinational ICs like flip-flops, counters, shift registers 7v. Therefore here transformer of 9 v is used with voltage
etc. This tester able to identify which particular logic gate is rating 230v/9v and current rating 500 mA. The output of
faulty in that ICs. This tester can also test frequently required the transformer is applied to bridge rectifier with capacitor
analog ICs in Laboratories like Operational amplifiers, Timers (1000uf/25v) filter. The output of rectifier is more than 8V
etc.
DC, which is converted to fixed 5v DC by IC7805.
Index Terms – Analog IC, Digital IC, IC Tester,
The AT89C55 is a low-power, high-performance CMOS
Microcontroller.
8-bit microcomputer with 20K bytes of Flash programmable
I. INTRODUCTION and erasable read only memory. The device is manufactured
using Atmel’s high density nonvolatile memory technology
When troubleshooting ICs (either digital or analog), one and is compatible with the industry standard 80C51
cannot be concerned with what is going on inside the IC. One instruction set and pinout. The on-chip Flash allows the
cannot take measurements or conduct repairs inside the IC. program memory to be reprogrammed in-system or by a
One should, therefore, consider the IC as a black box that conventional nonvolatile memory programmer. By combining
performs a certain function and can check the IC, however, to a versatile 8-bit CPU with Flash on a monolithic chip, the
see that it can perform its design functions.We can easily test Atmel AT89C55 is a powerful microcomputer which provides
any digital and analog IC using this kind of an IC tester.
Unlike other IC testers, this one is more reliable and
easier to operate since we do not need to rig up different
kind of circuits for different kind of ICs, each time we need.
When Tester circuit is turned on, it asks to enter IC
number. When user enters IC number and presses OK key,
microcontroller sends pattern of inputs on ICs Input pins. If
IC is functioning properly it generates correct results. Output
of IC is checked with expected result. If results are verified,

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Special issues in Communication
Asian Journal of Convergence in Technology Volume II, Issue III
Issn No.:2350-1146, I.F-2.71
IC. ZIF sockets are much more expensive than standard IC
sockets and also tend to take up a larger board area due to the
space taken up by the lever mechanism. Therefore they are
only used when there is a good reason to do so.
Six port pins are required to interface LCD. Seven ports
are utilized by 4x3 matrix keypad. Here 13 ports are
consumed, while 19 port pins are available for interfacing ZIF
socket. While testing IC logic and dealing with LCD, port
pins connected to keypad are not required. Hence along with
free 19 port pins, these pins are utilized for interfacing ZIF
socket. This technique helped us to test IC maximum of 24
pins.
III. FLOWCHART AND OPERATION
After a power on reset, system displays message
‘WELCOME’ on first line of LCD and ‘IC TESTER’ on
second line of LCD. Delay of 1 sec. is provided to make
Fig.1. Block Diagram of IC Tester
message visible properly. Thereafter next message get
displayed is ’ INSERT IC IN ZIF ‘, on first line of LCD and
a highly flexible and cost effective solution to many
‘ PRESS OK KEY’ on second line of LCD. To test a
embedded control applications. Port 0 is an 8-bit open drain
particular digital or analog IC, one needs to insert the IC into
bidirectional I/O port. Port 1, Port 2, Port 3 are 8-bit
the IC socket.
bidirectional I/O ports with internal pull-ups. [5]. Here
Then user has to press ‘OK’ key on keyboard. System
microcontroller is programmed to generate test signals and to
asks user to enter IC number through keypad matrix by
check respective outputs of IC under test.
displaying massage’ ENTER IC NUMBER’ on LCD. Now
The keyboard makes use of a 4 line - 3 column matrix
user has to enter IC number using 4x3matrix keypad. If
keyboard. Many applications require large number of keys
correct IC number is entered then user has to press ‘OK’ key
connected to MPU. If single key is required then one can
present on keypad and if by mistake wrong number is get
connect it directly to I/O pin of microcontroller. But one can
entered then provision is given to reenter and correct entered
not connect multiple keys directly to microcontrollers I/O
IC number. IC number entered by user is crosschecked by
because it will consume precious I/O lines and MCU to
microcontroller with list of IC numbers available with it
keypad interface will contain lots of wires. One can avoid all
which controller can test.
these troubles by using clever technique called multiplexed
matrix keypad. In this technique keys are connected in matrix
style. Rows and columns of keyboard are connected to
microcontroller’s I/O port pins. At a time only one column is
activated and by reading status of all rows, exactly which key
is pressed is get identified.
Here the LCD is used in four bit mode. Since 4-bit mode
is used the LCD will require a total of 6 data lines (2 control
lines plus the 4 lines for the data bus).The third control line
RW ( Read/Write control pin) is permanently grounded to
enable only write operation. Hence lesser number of port pins
of microcontroller are required.
To test the IC, it required to be inserted in ZIF socket.
Zero insertion force (ZIF) is a type of IC socket or electrical
connector that requires very little force for insertion. With a
ZIF socket, before the IC is inserted, a lever or slider on the
side of the socket is moved, pushing all the sprung contacts
apart so that the IC can be inserted with very little force -
generally the weight of the IC itself is sufficient and no
external downward force is required. The lever is then moved
back, allowing the contacts to close and grip the pins of the

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Special issues in Communication
Asian Journal of Convergence in Technology Volume II, Issue III
Issn No.:2350-1146, I.F-2.71

Fig.2. Flowchart of IC Tester

For IC number which is not present in controllers list, the

message ‘ SORRY,CAN’T TEST” get displayed on LCD. For
IC number in list, microcontroller refers database of that
particular IC. Accordingly it generates test vectors and checks
output for each test vector.
If desired output is obtained then, it displays ‘IC PASS’
message on LCD. If desired output is not obtained then,
microcontroller displays ‘IC FAIL’ message.
If logic gate IC is faulty then along with ‘IC FAIL’
message, this IC tester also provides facility to show which
particular logic gate is faulty and which logic gates are
working. This facility is not available in conventional IC
testers[2]. This tester provides facility of testing , frequently
used ,both digital and analog ICs using single ZIF socket,
single microcontroller, single keypad and single LCD.
IV. RESULTS
Simulation is done in Proteus software. IC555 is
considered for test. Initially controller displays welcome
message and project title. Figure 3 shows this welcome
message. Then as shown in Figure 4 the message, insert IC in
ZIF socket and press OK key is displayed. IC555 is inserted
and correct number is entered through keypad (Fig. 5). IC is
tested by system and if it is in working condition, figure 6
shows, 555 IC PASS message. When faulty IC555 is tested,
555 IC FAIL message get displayed on LCD, which is shown

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Special issues in Communication
Asian Journal of Convergence in Technology Volume II, Issue III
Issn No.:2350-1146, I.F-2.71
in figure 6. After testing IC system again ready for testing LCD1
LM016L
new IC. IC number which is not in list of microcontrollers RV1

data base, when entered, SORRY,CAN’T TEST message get

displayed on LCD. It is shown in figure 9.

VDD
VSS

VEE

RW
RS

D0
D1
D2
D3
D4
D5
D6
D7
E
1k

1
2
3

4
5
6

7
8
9
10
11
12
13
14
R1
C1 4k7
LCD1 R2
LM016L U1
4k7
33p 19 39 R3
RV1 X1
XTAL1 P0.0/AD0
38
P0.1/AD1
CRYSTAL 37
C2 P0.2/AD2 4k7
18 36 R4
XTAL2 P0.3/AD3
35
P0.4/AD4
34
P0.5/AD5 4k7

VDD
VSS

VEE

RW
33p 33

RS

D0
D1
D2
D3
D4
D5
D6
D7
P0.6/AD6

E
9 32
C3 RST P0.7/AD7
1k R5

1
2
3

4
5
6

7
8
9
10
11
12
13
14
R1 R20 P2.0/A8
21
4k7 22
P2.1/A9 4k7
10u 23 R6
4k7 P2.2/A10
C1 R2 29
PSEN P2.3/A11
24
30 25
ALE P2.4/A12 4k7
U1 31
EA P2.5/A13
26
4k7 27
33p 19 39 R3 P2.6/A14
XTAL1 P0.0/AD0 28
X1 P0.1/AD1
38 P2.7/A15
CRYSTAL 37
C2 P0.2/AD2 4k7 1 10
18 36 R4 P1.0/T2 P3.0/RXD
XTAL2 P0.3/AD3 2 11
35 P1.1/T2EX P3.1/TXD U2
P0.4/AD4 3 12

8
34 P1.2 P3.2/INT0
P0.5/AD5 4k7 4 13
33p 33 P1.3 P3.3/INT1
P0.6/AD6 5 14 4 3

VCC
9 32 P1.4 P3.4/T0 R Q
C3 RST P0.7/AD7 6 15
P1.5 P3.5/T1
R5 7 16 7
R20 P2.0/A8
21
8
P1.6 P3.6/WR
17
DC
22 P1.7 P3.7/RD
4k7 P2.1/A9 4k7 5
10u 23 CV
29
P2.2/A10
24
R6 AT89C55
PSEN P2.3/A11

3
30 25
ALE P2.4/A12 4k7

GND
31 26 2 6
EA P2.5/A13
P2.6/A14
27
28
A 1 2 3 TR TH

P2.7/A15

1
555
1 10
2
3
P1.0/T2
P1.1/T2EX
P3.0/RXD
P3.1/TXD
11
12 U2
B 4 5 6
8

P1.2 P3.2/INT0
4 13
P1.3 P3.3/INT1
5 14 4 3
7 8 9
VCC

P1.4 P3.4/T0 R Q C
6 15
P1.5 P3.5/T1
7 16 7
P1.6 P3.6/WR DC
8 17
P1.7 P3.7/RD
5
AT89C55
CV D 0 #
1

GND

2 6 KEYPAD
A 1 2 3 TR TH

Fig.4. System asks to insert IC under test in ZIF socket

1

555
B 4 5 6
C 7 8 9 LCD1
LM016L

RV1
D 0 #
KEYPAD

VDD
VSS

VEE

RW
RS

D0
D1
D2
D3
D4
D5
D6
D7
Fig.3. Initial WELCOME message

E
1k

1
2
3

4
5
6

7
8
9
10
11
12
13
14
R1
C1 4k7
R2
U1
4k7
33p 19 39 R3
XTAL1 P0.0/AD0
X1 P0.1/AD1
38
CRYSTAL 37
C2 P0.2/AD2 4k7
18 36 R4
XTAL2 P0.3/AD3
35
P0.4/AD4
34
P0.5/AD5 4k7
33p 33
P0.6/AD6
9 32
C3 RST P0.7/AD7
R5
R20 P2.0/A8
21
4k7 22
P2.1/A9 4k7
10u 23 R6
P2.2/A10
29 24
PSEN P2.3/A11
30 25
ALE P2.4/A12 4k7
31 26
EA P2.5/A13
27
P2.6/A14
28
P2.7/A15
1 10
P1.0/T2 P3.0/RXD
2 11
P1.1/T2EX P3.1/TXD U2
3 12
8

P1.2 P3.2/INT0
4 13
P1.3 P3.3/INT1
5 14 4 3
VCC

P1.4 P3.4/T0 R Q
6 15
P1.5 P3.5/T1
7 16 7
P1.6 P3.6/WR DC
8 17
P1.7 P3.7/RD
5
CV
AT89C55
1

GND

2 6
A 1 2 3 TR TH
1

555
B 4 5 6
C 7 8 9
D 0 #
KEYPAD
Fig.5. Entered IC number

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Special issues in Communication
Asian Journal of Convergence in Technology Volume II, Issue III
Issn No.:2350-1146, I.F-2.71
LCD1
LM016L

RV1 LCD1
LM016L

RV1

VDD
VSS

VEE

RW
RS

D0
D1
D2
D3
D4
D5
D6
D7
E
1k

VDD
VSS

VEE

RW
RS
1
2
3

4
5
6

7
8
9
10
11
12
13
14

D0
D1
D2
D3
D4
D5
D6
D7
R1

E
1k

1
2
3

4
5
6

7
8
9
10
11
12
13
14
C1 4k7
R2 R1
U1 C1 4k7
4k7
33p 19
XTAL1 P0.0/AD0
39 R3 R2
X1 P0.1/AD1
38 U1
CRYSTAL 37 4k7
C2 P0.2/AD2 4k7 33p 19 39
18
XTAL2 P0.3/AD3
36 R4 XTAL1 P0.0/AD0 R3
35 X1 P0.1/AD1
38
P0.4/AD4 37
34 CRYSTAL P0.2/AD2 4k7
P0.5/AD5 4k7 C2 18 36 R4
33p 33 XTAL2 P0.3/AD3
P0.6/AD6 35
9 32 P0.4/AD4
C3 RST P0.7/AD7 34
P0.5/AD5 4k7
R5 33p 33
R20 P2.0/A8
21
9
P0.6/AD6
32
4k7 22 C3 RST P0.7/AD7
P2.1/A9 4k7
10u
P2.2/A10
23 R6 R5
29 24 R20 P2.0/A8
21
PSEN P2.3/A11 22
30 25 4k7 P2.1/A9 4k7
ALE P2.4/A12 4k7 10u 23
31
EA P2.5/A13
26
29
P2.2/A10
24
R6
27 PSEN P2.3/A11
P2.6/A14 30 25
28 ALE P2.4/A12 4k7
P2.7/A15 31 26
EA P2.5/A13
27
1 10 P2.6/A14 U2:A
P1.0/T2 P3.0/RXD 28
2 11 P2.7/A15
P1.1/T2EX P3.1/TXD U2 1
3 12
8

P1.2 P3.2/INT0 1 10 3
4 13 P1.0/T2 P3.0/RXD
P1.3 P3.3/INT1 2 11 2
5 14 4 3 P1.1/T2EX P3.1/TXD
VCC

P1.4 P3.4/T0 R Q 3 12
6 15 P1.2 P3.2/INT0
P1.5 P3.5/T1 4 13 7400
7 16 7 P1.3 P3.3/INT1
P1.6 P3.6/WR DC 5 14
8 17 P1.4 P3.4/T0
P1.7 P3.7/RD 6 15
5 P1.5 P3.5/T1
CV 7 16
AT89C55 P1.6 P3.6/WR U2:B
8 17
P1.7 P3.7/RD
1

4
GND

AT89C55 6
2 6
A 1 2 3 TR TH 5

3
7400
1 2 3
1

555 A
B 4 5 6
U2:C
B 4 5 6 10
C 7 8 9 9
8

C 7 8 9 7400
D 0 #
D 0 # U2:D
KEYPAD 13
11
Fig.6. Output of system after testing IC in good condition KEYPAD 12

7400
LCD1 Fig.8. Testing of Digital IC7400
LM016L

RV1
VDD
VSS

VEE

RW
RS

D0
D1
D2
D3
D4
D5
D6
D7
E

1k
1
2
3

4
5
6

7
8
9
10
11
12
13
14

R1
C1 4k7
R2
U1
4k7
33p 19 39 R3
XTAL1 P0.0/AD0
X1 P0.1/AD1
38
CRYSTAL 37
C2 P0.2/AD2 4k7
18 36 R4
XTAL2 P0.3/AD3
35
P0.4/AD4
34
P0.5/AD5 4k7
33p 33
P0.6/AD6
9 32
C3 RST P0.7/AD7
R5
R20 P2.0/A8
21
4k7 22
P2.1/A9 4k7
10u 23 R6
P2.2/A10
29 24
PSEN P2.3/A11
30 25
ALE P2.4/A12 4k7
31 26
EA P2.5/A13
27
P2.6/A14
28
P2.7/A15
1 10
P1.0/T2 P3.0/RXD
2 11
P1.1/T2EX P3.1/TXD U2
3 12
8

P1.2 P3.2/INT0
4 13
P1.3 P3.3/INT1
5 14 4 3
VCC

P1.4 P3.4/T0 R Q
6 15
P1.5 P3.5/T1
7 16 7
P1.6 P3.6/WR DC
8 17
P1.7 P3.7/RD
5
CV
AT89C55
1

GND

2 6
A 1 2 3 TR TH
1

555
B 4 5 6
C 7 8 9
D 0 #
KEYPAD
Fig.7. Output of system after testing faulty IC

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Special issues in Communication
Asian Journal of Convergence in Technology Volume II, Issue III
Issn No.:2350-1146, I.F-2.71
LCD1
LM016L
V. CONCLUSION
RV1
Purchasing IC testers available in market needs large
funds to invest. Again keeping proper maintenance of it, is

VDD
VSS

VEE

RW
RS

D0
D1
D2
D3
D4
D5
D6
D7
E
1k
one of the big issue.

1
2
3

4
5
6

7
8
9
10
11
12
13
14
R1
C1 4k7
R2
Unlike IC testers available in market, this is low cost,
U1
33p 19
XTAL1 P0.0/AD0
39
4k7
R3
easier to operate IC tester. Design and implementation of this
X1 P0.1/AD1
38

C2 CRYSTAL
18
XTAL2
P0.2/AD2
P0.3/AD3
37
36
35
4k7
R4 IC tester is simple as it requires minimum hardware. It can
P0.4/AD4
33p
9
P0.5/AD5
P0.6/AD6
34
33
32
4k7
test 24 pin digital IC. In case of Logic gate ICs, not only IC
C3 RST P0.7/AD7

R20
4k7
P2.0/A8
21
22
R5
PASS or FAIL is displayed but along with that which
P2.1/A9 4k7
10u
29
30
PSEN
ALE
P2.2/A10
P2.3/A11
P2.4/A12
23
24
25
R6
4k7
particular gate is faulty is identified and indicated on LCD.
31 26
EA P2.5/A13
P2.6/A14
P2.7/A15
27
28 U2:A This IC tester is more suitable in Digital and Analog
1
1
2
P1.0/T2
P1.1/T2EX
P3.0/RXD
P3.1/TXD
10
11 2
3 labs, as it covers all IC testing, required for conducting
3 12
4
5
P1.2
P1.3
P1.4
P3.2/INT0
P3.3/INT1
P3.4/T0
13
14
7400
practicals of Digital Electronics and Analog Electronics Labs.
6 15
P1.5 P3.5/T1
7 16
P1.6 P3.6/WR U2:B
8
P1.7
AT89C55
P3.7/RD
17
4
6
REFERENCES
5
1

7400 [1] Y. Bertrand, F. Azaı¨s, M.-L. Flottes, and R. Lorival, “A Successful

A 1 2 3
Distance-Learning Experience for IC Test Education,” Proc. Int’l
U2:C
B 4 5 6 10
Conf.erence Microelectronic Systems Education,pp. 20-21, July 1999.
9
8
[2] H. Yousif Taha Yousif Elamin “Microcontroller based Integrated IC Tester”
C 7 8 9 7400 Int. Journal of Engineering Research and Applications ISSN : 2248-9622,
Vol. 5, Issue 2, ( Part -2) February 2015, pp.118-122
D 0 # U2:D
13 [3] Miss M.A.Tarkunde, Mrs.A.A.Shinde, “IC Tester using 89s52
11
KEYPAD 12 Microcontroller”, International Journal Of Computational Engineering
7400
Research (ijceronline.com) Vol. 2, Issue. 7
Fig.9. For IC, which cannot be tested by this IC Tester [4] Anindya Bhattacharya, “Digital Integrated Circuit Tester (Using AT89s51
Microcontroller)” International Journal of Emerging Technology and
Advanced Engineering, ISSN 2250-2459, ISO 9001:2008 Certified Journal,
Volume 3, Issue 6, June 2013.
[5] Mazidi, J Mazidi, R. McKinlay, ”The 8051 Microcontroller And Embedded
Systems ”,Pearson Publication

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