Diksha Iot 8
Diksha Iot 8
1. Aim: Automate quality inspection of products using cameras and edge computing.
2. Objective: To design and implement an automated quality inspection system for products using
cameras and edge computing.
3. Pre requisites:
Software Requirements:
1. Python (version 3.8 or above)
2. TensorFlow/Keras or PyTorch
3. OpenCV for image processing
4. Flask/Django for backend integration
5. MQTT or HTTP protocols for IoT data transfer
4. Procedure:
Step 1: Data Collection (Image Acquisition)
1. Cameras: Use high-quality cameras (e.g., industrial cameras or machine vision cameras) to
capture product images. Depending on the application, cameras can be positioned at various
points along the production line.
2. Lighting: Proper lighting is essential to ensure clear and consistent image capture. Lighting can
be adjusted to reduce shadows and enhance defect visibility.
3. Trigger Mechanism: Use sensors (like proximity sensors or conveyors) to trigger the camera
when a product passes through.
tf.keras.models.load_model("defect_detection_model.h5")
# Example usage
predict_defect("product.jpg")
6. Screenshot:
DEPARTMENT OF
COMPUTER SCIENCE & ENGINEERING
DEPARTMENT OF
7. Conclusion:
In this experiment, we explored essential techniques for image preprocessing, transfer learning, and
model deployment to build an effective deep learning pipeline for product defect classification. By
leveraging OpenCV and NumPy, we efficiently loaded, resized, and normalized images to ensure
optimal input for deep learning models.
Using transfer learning with a pre-trained VGG16 model, we extracted meaningful features and
customized the network to differentiate between defective and non-defective products, improving
classification accuracy. Finally, we successfully deployed the trained TensorFlow model, demonstrating
its capability to make real-time predictions and trigger automated responses, such as alerts or actuator
controls. This workflow highlights the practical implementation of deep learning for industrial
automation, enhancing defect detection efficiency and reliability.