2011 HSE4A01 Part 1 Logic and Analog and Digital Signals Rev02a
2011 HSE4A01 Part 1 Logic and Analog and Digital Signals Rev02a
Power
Background PCB Tracks TX-line Measurement & Delivery
Introduction Links Probing System
(PDS)
Termination
Review of Analog Circuits
Horowitz & Hill – Art of Electronics (2nd Ed.):
⚫ 1.03 Voltage Dividers
⚫ 1.04 Voltage & Current Sources
⚫ 1.05 Thevenin Equivalent Circuit
⚫ 1.07 Sinusoidal Signals
⚫ 1.08 Signal Amplitudes and Decibels
⚫ 1.09 Other Signals
⚫ 1.10 Logic Levels
⚫ 1.12 Capacitors
Review of Analog Circuits (cont.)
Horowitz & Hill – Art of Electronics (2nd Ed.):
⚫ 1.13 RC Circuits
⚫ 1.14 Differentiators
⚫ 1.15 Integrators
⚫ 1.18 Frequency Analysis of Reactive Circuits
⚫ 1.19 RC Filters
⚫ 1.22 Resonant Circuits
Voltage Divider
Horowitz & Hill: Chapter 1.03
Z2
Z1 vout = vin
+ Z1 + Z 2
vin
+
If Z1 Z 2 then vout vin
−
Z2 vout
otherwise vout vin
−
Source Impedance
Concept & Examples of source impedance
⚫ RF Circuits
⚫ All PSU’s
⚫ Regulation & Trafos
⚫ Power systems
⚫ House wiring
Thévenin Equivalent
Horowitz & Hill: Chapter 1.05
+ + vout Z eq = ZTh
+ − + +
− Z eq
vTh vout
− −
−
1 T 2
VRMS =
T 0
v (t ) dt
Capacitance
Time Domain
⚫ Formula
⚫ Graphic Representation
Capacitance (RC)
Capacitance
Frequency Domain
⚫ Formula
⚫ Graphic Representation
Example: Decoupling Capacitors
= Ideal capacitor 1 nF:
ZC () SMD ceramic
0 V - +ve plane
10
10 nF
5 SMD:
2 Polyester
1 Ceramic
0,5 100 pF
0,2 SMD
0,1 100 nF SMD ceramic
0,05 ceramic:
12 mm tracks
No tracks
C ?
Logic
Track
Gate 1
PCB
Signal Integrity
SI is the ability of high frequency digital
electronics to operate reliably and efficiently
(with integrity)
Without SI:
⚫ Unreliable operation of digital electronics
⚫ High power consumption and demand on
Power Delivery System (PDS)
⚫ High Electromagnetic Interference (EMI)
SI Time Simulation
8 1.50E-01
7 Probe V 1 1.00E-05
Probe V 2 1.04E-05
Probe I 1 DC 1.00E-01
6
5
5.00E-02
Driver and Gate Voltage (V)
3 0.00E+00
-5.00E-02
1
0
-1.00E-01
-1
-2 -1.50E-01
0.0E+00 5.0E-09 1.0E-08 1.5E-08 2.0E-08 2.5E-08 3.0E-08 3.5E-08 4.0E-08 4.5E-08 5.0E-08
Time (sec)
CMOS AND Gate
TTL NAND Gate
CMOS Output Model
Logic Families
Logic Thresholds (Hysteresis)
DGND
t edge
EMI Scan – 12MHz Clock
ITC SERVICES
RE02 NAVY AND AIR FORCE INTERNAL EMC-30 SETTINGS SPECS
Date : 11/21/03 Time : 13:40:56.85 Detector Peak 1) SAAB RE102 Zone SICO.
Technician : Hans Test Equip. : CCS 130 MK IV Bandwidth Per Band 2) SAAB RE102 Zone ICO.
Test Method : MIL STD 462 Test Number : 1 Dwell 20 msec.
Equipment : Sensor Loc. : 1m RF Atten. 0 dB
Mode of Op. : power on Sensor Pol. : v/h/c IF Atten. 0 dB DATA FILE : 12MHZ1.D31
Serial No. : Ext. Atten. : 0 dB
Comment : Graph RE1` 12 MHz x-tal
120 ANTENNA
FILES
110 RVA30-2K.A30
100 BIA30-2K.A30
LCA30-2K.A30
90
dBuV/m
80
70
1.
60
50 OTHER
*2. FACTORS
40
Amplitude
30
20
10
0
-10
-20
-30
-40
E-M
-50
10. 100.
2.000 Frequency MHz 797.750
Choice of Logic Family
Does fastest, always = best?
Logic Family Rise Time ns Bandwidth
Old CMOS 50 ns 6 MHz
TTL/BiCMOS 10 ns 32 MHz
LS-TTL 6 ns 55 MHz
HC CMOS 4,0 ns 80 MHz
STTL/ABT-TTL/ALS-TTL 3,0 ns 120 MHz
FACT CMOS/FAST TTL 2,0 ns 160 MHz
ECL 10kH 1,0 ns 315 MHz
ECL 100k 0,7 ns 455 MHz
ECLinPS3 0,5 ns 635 MHz
E-LITE ECL 0,25 ns 1200 MHz
GaAs 0,2 ns 1600 MHz
Lightning and ESD Bandwidth
Lightning ESD
Is typically a sec event Is typically a nsec event
Unfiltered Filtered
Digital Signal Digital Signal
Low Pass
Filter
(LPF)
BW = f-3dB
t t
Fast Rise & Fall Edge time
Time increased
Bottom Line