Lecture29 140625
Lecture29 140625
The model that has been developed for the large signal sub-threshold operation is:
W vGS-VT vDS
iD = It L exp nV 1 + V where vDS > 0 and VDS(sat) = VON = VGS -VT = 2nVt
t A
Small-signal model:
diD | W It vGS-VT vDS ID qID ID Cox
gm = =I exp 1 + = = =
dvGS Q t L nVt nV t V A nV t nkT Vt Cox+Cjs
diD | ID
gds = dv
DS Q VA
+ VDS
VBS VGS
-
111130-03
M6
M3 M4 Cc
vout
- M1 M2 CL
vin
+
+ M7
VBias M5
-
VSS Fig.7.4-1
Low frequency response:
ro2ro4 ro6ro7 1 1
Avo = gm2gm6 = (No longer )
o2
r + ro4 o6
r + ro7 n n
2 6 (kT/q) 2 ( 2 + 4 )( 6 + 7 ) I D
GB and SR:
ID1 ID5 ID1 kT
GB = and SR = =2 = 2GB n1 = 2GBn1Vt
(n1kT/q)C C C q
M8 M6
Total gain is, vi2
M1 M2
gm1(S6/S4) (S6/S4) vout
Avo = =
(gds6 + gds7) (6 + 7)n1Vt Cc
At room temperature (Vt = 0.0259V) and + M5
VBias
for typical device lengths, gains of 60dB M9 M7
can be obtained. -
The GB is, VSS Fig. 7.4-2
0
0 1 2
vIN nVt Fig. 7.4-5
i1 i2
Current
i2 for W2/L2 = 5.3(W1/L1)
M1 M2 +
i2 for W2/L2 = W1/L1
+ Vds2
VGS 100µA VGS
- -
Volts
0.1Vds2(sat) Vds1(sat)=Vds2(sat)
070507-02
M25 M26
+ i2 i1
M15 M23 VBias M5 M24 M16
M11 M20
M19 M12
- M6
VSS Fig.7.4-7
iin+IB iin IB
kiin
M3
50/1
M5 M4
1/1 1/1
M1 M2
1/1 210/1
Fig. 7.4-7A
M1 is M1 is
noisy S noiseless S Fig. 7.5-0A
Noise Analysis
1.) Insert a noise generator for each transistor that contributes to the noise. (Generally
ignore the current source transistor of source-coupled pairs.)
2.) Find the output noise voltage across an open-circuit or output noise current into a
short circuit.
3.) Reflect the total output noise back to the input resulting in the equivalent input noise
voltage.
+ * M1 M2 *
vin eto2
2 2
-
M1 M2 Cc en8 M8 M9 en9
vout
M11 * *
VBias 2 VBias
+ en6
VBias M8 M9 2 2
- M6 en3 en4 M6
*
M3 M4 M3 * * M4
2
The total output-noise voltage spectral density, eto, is as follows where gm8(eff) 1/rds1,
2 2 2 2 2 2 2 2 2
eto = gm62RII2en6+en7 +RI2gm12en1+gm22en2+gm32en3+gm42en4 + (en8/rds12) + (en9/rds22)
2
Divide by (gm1RIgm6RII)2 to get the eq. input-noise voltage spectral density, eeq, as
2 gm32en3
2 eto
2
2en6
2 2 2
en8 2 gm32en32
eeq = (g g R R )2 = g 2R 2 + 2en11+g 2 + 2 2en11+gm1 2
m1 e
m1 m6 I II m1 I g n1 m12rds1 en1
2 en1
2 = e 2 , e 2 = e 2 , e 2 = e 2 and e 2 = e 2 and g R is large.
where en6 n7 n3 n4 n1 n2 n8 n9 m1 I
CMOS Analog Circuit Design © P.E. Allen - 2016
Lecture 29 – Low Power and Low Noise Op Amps (6/25/14) Page 29-20
2 2 gm32 n3
e
2
2 KNW3L1
eeq = 2en11+g 2 = 2en1 1 + (V2/Hz)
KPW1L3
m1 en1
Comments:
• The choices that reduce the 1/f noise also reduce the thermal noise.
Noise Corner:
Equating the equivalent input-noise voltage spectral density for the 1/f noise and the
thermal noise gives the noise corner, fc, as
3gmB
fc = 8kTWL
Example 29-3 Design of A Two-Stage, Miller Op Amp for Low 1/f Noise
Use the model parameters of KN’ = 120µA/V2, KP’ = 25µA/V2, and Cox = 6fF/µm2
along with the value of KF = 4x10-28 F·A for NMOS and 0.5x10-28 F·A for PMOS and
design the previous op amp with ID5 = 100µA to minimize the 1/f noise. Calculate the
corresponding thermal noise and solve for the noise corner frequency. From this
information, estimate the rms noise in a frequency range of 1Hz to 100kHz. What is the
dynamic range of this op amp if the maximum signal is a 1V peak-to-peak sinusoid?
Solution
1.) The 1/f noise constants, BN and BP are calculated as follows.
KF 4x10-28F·A
BN = = = 1.33x10-22 (V·m)2
2CoxKN’ 2·60x10 F/m ·120x10 A/V
-4 2 -6 2
and
KF 0.5x10-28F·A
BP = 2C K ’ = -4 2 -6 2 = 1.67x10-22 (V·m)2
ox P 2·60x10 F/m ·25x10 A/V
2.) Now select the geometry of the various transistors that influence the noise
performance.
2 small, let W = 100µm and L = 1µm. Select W = 10µm and L =
To keep en1 1 1 3 3
20µm and letW8 and L8 be the same as W1 and L1 since they little influence on the
noise.
CMOS Analog Circuit Design © P.E. Allen - 2016
Lecture 29 – Low Power and Low Noise Op Amps (6/25/14) Page 29-23
10
Experimental noise
performance: 8
Eq. input noise voltage of low-noise op amp
Noise (nV/ Hz)
4
Voltage noise of lateral BJT at 170 mA
2
0
10 100 1000 104 105
Frequency (Hz) Fig. 7.5-7
CMOS Analog Circuit Design © P.E. Allen - 2016
Lecture 29 – Low Power and Low Noise Op Amps (6/25/14) Page 29-26
f
0 fc 2fc 3fc
VB(f)
f
0 fc 2fc 3fc
VC(f)
f
0 fc 2fc 3fc Fig. 7.5-8
Chopper-Stabilized Amplifier
With chopper
fc = 16kHz
nV/ Hz
100
With chopper fc = 128kHz
10
0 10 20 30 40 50
Frequency (kHz) Fig. 7.5-11
Comments:
• The switches in the chopper-stabilized op amp introduce a thermal noise equal to kT/C
where k is Boltzmann’s constant, T is absolute temperature and C are capacitors
charged by the switches (parasitics in the case of the chopper-stabilized amplifier).
• Requires two-phase, non-overlapping clocks.
• Trade-off between the lowering of 1/f noise and the introduction of the kT/C noise.
CMOS Analog Circuit Design © P.E. Allen - 2016
Lecture 29 – Low Power and Low Noise Op Amps (6/25/14) Page 29-31
† C. Menolfi and Q. Huang, “A Fully Integrated, Untrimmed CMOS Instrumentation Amplifier with Submicrovolt Offset,” IEEE J. of Solid-State
Circuits, vol. 34, no.8, March 1999, pp. 415-420.
CMOS Analog Circuit Design © P.E. Allen - 2016
Lecture 29 – Low Power and Low Noise Op Amps (6/25/14) Page 29-32
SUMMARY
• Operation of transistors for low power op amps is generally in weak inversion
• Boosting techniques are needed to get output sourcing and sinking currents that are
larger than that available during quiescent operation
• Be careful about using circuits at weak inversion, i.e. the self-biased cascode will
cause the resistor to be too large
• Primary sources of noise for CMOS circuits is thermal and 1/f
• Noise analysis:
1.) Insert a noise generator for each transistor that contributes to the noise.
(Generally ignore the current source transistor of source-coupled pairs.)
2.) Find the output noise voltage across an open-circuit or output noise current into a
short circuit.
3.) Reflect the total output noise back to the input resulting in the equivalent input
noise voltage.
• Noise is reduced in op amps by making the input stage gain as large as possible and
reducing the noise of this stage as much as possible.
• The input stage noise can be reduced by using lateral BJTs (particularily the 1/f noise)
• Doubly correlated sampling can transfer the noise at low frequencies to the clock
frequency (this technique is used to achieve low input offset voltage op amps).
CMOS Analog Circuit Design © P.E. Allen - 2016