SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

U.S. ARMY PRIMARY STANDARDS LABORATORY

AMAM-TMS Buildings 5435 and 5417
Redstone Arsenal, AL 35898-5000
Greg Boggs Phone: 256 955 6367
Russell Kauffman Phone: 256 842 9592

CALIBRATION

Valid To: December 31, 2026 Certificate Number: 1256.01

In recognition of the successful completion of the A2LA evaluation process (including an assessment of
the organization’s compliance with R205 – A2LA’s Calibration Program Requirements), accreditation is
granted to this laboratory to perform the following calibrations1, 11:

I. Acoustical Quantities

Parameter/Range Frequency CMC2 (±) Comments

Microphone Sensors

(-100 to -10) dB 50 Hz to 1 kHz 0.10 dB Type L pressure

(>1 to 6) kHz 0.15 dB reciprocity
(>6 to 25) kHz 0.30 dB

250 Hz 0.16 dB Voltage insertion

2 Hz to 100 kHz 0.50 dB Electrostatic actuator

(>100 to 200) kHz 0.70 dB

Sound Calibrators

(70 to 130) dB 125 Hz to 4 kHz 0.30 dB Comparison to APSL

calibrated standard
sound calibrator

20 Hz to 25 kHz 0.11 dB Voltage insertion

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 1 of 35

II. Dimensional

Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Gage Blocks (0.01 to 0.120) in 4 µin Mechanical comparison

(>0.120 to <1) in 3.3 µin
(1 to <5) in (3.2 + 0.22L) µin
(5 to 20) in (0.5 + 1.0L) µin

Thread Wires (4 to 80) TPI (60° in) (5.5 + 3.8D) µin Laser micrometer
(1 to 20) TPI (29° in)
(10 to 0.2) pitch (mm)
8.0 µin Mechanical comparison

Cylinders & Gear Wires Up to 2 in (5 + 4.4D) µin Laser micrometer

8.0 µin Mechanical comparison

Precision Spheres Up to 1 in (7 + 3.8D) µin Laser micrometer

8.5 µin Mechanical comparison

Internal Diameter: Fixed 1.85 mm (0.62 + 5D) µm Air gauging

Points – Measure 2.4 mm
2.92 mm
3.5 mm
7.0 mm

0.0728 in (25 + 5D) µin

0.0945 in
0.1150 in
0.1378 in
0.2756 in

External Diameter – (0.9838 to 0.9842) in (25 + 5D) µin Air gauging

Measure (1.1992 to 1.1996) in
(1.2006 to 1.2008) in
(1.4788 to 1.4790) in

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 2 of 35

 Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Internal Diameter – (0.2725 to 0.5) in (33 + 1.5D) µin Mechanical comparison

Measure (>0.5 to 1.5) in 12 µin
(1.5 to 10) in (10 + 0.82D) µin

3-Dimensional Length –
Measure

1D Up to 40 in (22 + 2.3L) µin Leitz PMM-C Infinity

2D (40 x 36) in CMM
3D (40 x 36 x 24) in

Angle Blocks Up to 45° 1.0 arcsec Comparison to master

angle block using
Autocollimators

Angle Measurements – ± 1000 arcsec 0.5 arcsec + 0.24 % HP 5528A laser

Measure measurement system
with angular optic
0.8 arcsec + 0.24 % Angle generator
1.0 arcsec Autocollimator

Flatness – Measure Up to 10 in diameter 3.2 µin Interferometer,

Master optical flat

Autocollimators ≤60 arcsec 0.60 arcsec Optical wedges

(>60 to 1000) arcsec 0.8 arcsec + 0.24 % Angle generator

Length Gages/Encoders Up to 1 in 10 µin Gage blocks

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 3 of 35

III. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 4, 12 (±) Comments

DC Voltage – Generate, 1.018 V 0.10 µV/V Fluke 732B

Fixed Points 10 V 0.050 µV/V

(0.002 to <0.006) V 180 µV/V MI 8000/8001 binary

(0.006 to <0.02) V 60 µV/V voltage divider & Fluke
(0.02 to <0.06) V 18 µV/V 57X0A calibrator
(0.06 to <0.1) V 6.3 µV/V
(0.1 to <0.2) V 3.9 µV/V
(0.2 to <1) V 2.3 µV/V
(1 to <2) V 1.6 µV/V
(2 to <60) V 1.0 µV/V
(60 to 1000) V 1.4 µV/V

DC Voltage – Measure (0 to 10) V 50 nV Josephson Voltage

System (JVS)

(10 to 200) V 250 nV/V MI 8000/8001 binary

(200 to 1000) V 800 nV/V voltage divider

Fixed Points 100 V 240 nV/V Fluke 732B with voltage

1000 V 580 nV/V divider & nullmeter

DC Resistance – Measure (1 to <10) µΩ 0.031 % MI 6010-2000 system

(10 to <100) µΩ 0.027 %

100 µΩ to <1 mΩ 6.2 µΩ/Ω MI 6010C direct current

(1 to <10) mΩ 5.1 µΩ/Ω comparator bridge, MI
(10 to <100) mΩ 3.5 µΩ/Ω 6011 range extenders
100 mΩ to <1 Ω 0.49 µΩ/Ω
(1 to <10) Ω 0.23 µΩ/Ω
(10 to <100) Ω 0.23 µΩ/Ω
100 Ω to <1 kΩ 0.21 µΩ/Ω
(1 to <10) kΩ 0.23 µΩ/Ω

(10 to <100) kΩ 0.25 µΩ/Ω MI 6000B binary

100 kΩ to <1 MΩ 1.5 µΩ/Ω voltage divider bridge
(1 to <10) MΩ 3.9 µΩ/Ω
(10 to <100) MΩ 10 µΩ/Ω
100 MΩ to <1 GΩ 15 µΩ/Ω
1 GΩ 30 µΩ/Ω

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 4 of 35

 Parameter/Equipment Range CMC2, 4, 12 (±) Comments

High Value Resistance – 10 MΩ 25 µΩ/Ω Bridge ratio method

Measure, Fixed Points 100 MΩ 15 µΩ/Ω with NIST calibrated
1 GΩ 15 µΩ/Ω standards
10 GΩ 50 µΩ/Ω
100 GΩ 0.049 %
1 TΩ 0.037 %

Inductance – Measure, at 50 µH 0.31 % Comparison with

1 kHz 100 µH 0.18 % reference standards
200 µH 0.13 % using IET RLC
500 µH 0.044 % Digibridge
(1 to 200) mH 0.035 %
(0.5 to 2) H 0.056 %
(5 to 10) H 0.21 %

Capacitance – Measure, 10 pF 3.5 µF/F Andeen-Hagerling

Fixed Points, at 1 kHz 100 pF 3.5 µF/F 2500A bridge plus
10 pf & 100 pF silicon
capacitors

1000 pF 3.6 µF/F Andeen-Hagerling

2500A bridge plus
100 pF silicon
capacitors

VOR Bearing Angle – (0 to 330)° 0.013° Comparison with NIST

Measure VOR standard using
NIST system

Parameter/Range Frequency CMC2, 12 (±) Comments

AC Ratio – Measure, 400 Hz 1.1 parts in 106 Comparison to NIST

Fixed Points 1 kHz 1.1 parts in 106 calibrated DT72A
inductive volt divider
using ratio techniques

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 5 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference –
Current Shunts, Fixed
Quantities, Measure
90 µA/A
1 mA 10 Hz 70 µA/A Fluke A40B current
20 Hz 60 µA/A shunts
40 Hz 60 µA/A
100 Hz 60 µA/A
400 Hz 60 µA/A
1 kHz 90 µA/A
5 kHz 100 µA/A
10 kHz 110 µA/A
20 kHz 150 µA/A
50 kHz 250 µA/A
100 kHz
40 µA/A
10 mA 10 Hz 40 µA/A
20 Hz 30 µA/A
40 Hz 30 µA/A
100 Hz 30 µA/A
400 Hz 30 µA/A
1 kHz 30 µA/A
5 kHz 30 µA/A
10 kHz 30 µA/A
20 kHz 30 µA/A
50 kHz 60 µA/A
100 kHz
20 mA 10 Hz 40 µA/A
20 Hz 40 µA/A
40 Hz 40 µA/A
100 Hz 40 µA/A
400 Hz 30 µA/A
1 kHz 30 µA/A
5 kHz 30 µA/A
10 kHz 30 µA/A
20 kHz 30 µA/A
50 kHz 30 µA/A
100 kHz 55 µA/A

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 6 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference –
Current Shunts, Fixed
Quantities, Measure (cont)
50 mA 10 Hz 45 µA/A Fluke A40B current
20 Hz 45 µA/A shunts
40 Hz 25 µA/A
100 Hz 25 µA/A
400 Hz 25 µA/A
1 kHz 25 µA/A
5 kHz 25 µA/A
10 kHz 30 µA/A
20 kHz 40 µA/A
50 kHz 50 µA/A
100 kHz 50 µA/A
100 mA 10 Hz 50 µA/A
20 Hz 40 µA/A
40 Hz 25 µA/A
100 Hz 25 µA/A
400 Hz 25 µA/A
1 kHz 25 µA/A
5 kHz 25 µA/A
10 kHz 25 µA/A
20 kHz 25 µA/A
50 kHz 40 µA/A
100 kHz 40 µA/A
200 mA 10 Hz 40 µA/A
20 Hz 40 µA/A
40 Hz 25 µA/A
100 Hz 25 µA/A
400 Hz 25 µA/A
1 kHz 25 µA/A
5 kHz 25 µA/A
10 kHz 25 µA/A
20 kHz 25 µA/A
50 kHz 40 µA/A
100 kHz 45 µA/A

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 7 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference –
Current Shunts, Fixed
Quantities, Measure (cont)
500 mA 10 Hz 45 µA/A Fluke A40B current
20 Hz 40 µA/A shunts
40 Hz 30 µA/A
100 Hz 25 µA/A
400 Hz 25 µA/A
1 kHz 25 µA/A
5 kHz 25 µA/A
10 kHz 25 µA/A
20 kHz 25 µA/A
50 kHz 35 µA/A
100 kHz 45 µA/A
1A 10 Hz 50 µA/A
20 Hz 40 µA/A
40 Hz 30 µA/A
100 Hz 30 µA/A
400 Hz 25 µA/A
1 kHz 25 µA/A
5 kHz 25 µA/A
10 kHz 25 µA/A
20 kHz 25 µA/A
50 kHz 40 µA/A
100 kHz 45 µA/A
2A 10 Hz 50 µA/A
20 Hz 50 µA/A
40 Hz 35 µA/A
100 Hz 35 µA/A
400 Hz 30 µA/A
1 kHz 30 µA/A
5 kHz 30 µA/A
10 kHz 35 µA/A
20 kHz 35 µA/A
50 kHz 55 µA/A
100 kHz 55 µA/A

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 8 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference –
Current Shunts, Fixed
Quantities, Measure (cont)
5A 10 Hz 70 µA/A Fluke A40B current
20 Hz 60 µA/A shunts
40 Hz 40 µA/A
100 Hz 40 µA/A
400 Hz 35 µA/A
1 kHz 35 µA/A
5 kHz 35 µA/A
10 kHz 40 µA/A
20 kHz 40 µA/A
50 kHz 65 µA/A
100 kHz 120 µA/A
10 A 10 Hz 95 µA/A
20 Hz 75 µA/A
40 Hz 45 µA/A
100 Hz 45 µA/A
400 Hz 45 µA/A
1 kHz 45 µA/A
5 kHz 45 µA/A
10 kHz 55 µA/A
20 kHz 55 µA/A
50 kHz 90 µA/A
100 kHz 160 µA/A
20 A 10 Hz 110 µA/A
20 Hz 85 µA/A
40 Hz 60 µA/A
100 Hz 60 µA/A
400 Hz 60 µA/A
1 kHz 60 µA/A
5 kHz 60 µA/A
10 kHz 65 µA/A
20 kHz 75 µA/A
50 kHz 120 µA/A
100 kHz 160 µA/A

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 9 of 35

 Parameter/Range Frequency CMC2, 4, 12 (±) Comments

AC/DC Difference –
Current Shunts, Fixed
Quantities, Measure (cont)
50 A 10 Hz 140 µA/A Fluke A40B current
20 Hz 110 µA/A shunts
40 Hz 95 µA/A
100 Hz 70 µA/A
400 Hz 70 µA/A
1 kHz 70 µA/A
5 kHz 70 µA/A
10 kHz 70 µA/A
20 kHz 90 µA/A
50 kHz 190 µA/A
100 kHz 230 µA/A
100 A 10 Hz 190 µA/A
20 Hz 140 µA/A
40 Hz 110 µA/A
100 Hz 95 µA/A
400 Hz 95 µA/A
1 kHz 95 µA/A
5 kHz 100 µA/A
10 kHz 140 µA/A
20 kHz 150 µA/A
50 kHz 250 µA/A
100 kHz 320 µA/A

AC/DC Difference, Voltage –

Measure, Fixed Points
2 mV 10 Hz 130 µV/V Fluke 792A AC/DC
20 Hz 130 µV/V transfer standard
40 Hz 130 µV/V
50 Hz 130 µV/V
100 Hz 80 µV/V
400 Hz 80 µV/V
1 kHz 80 µV/V
3 kHz 70 µV/V
10 kHz 70 µV/V
20 kHz 70 µV/V
30 kHz 70 µV/V
50 kHz 70 µV/V
100 kHz 70 µV/V
300 kHz 120 µV/V
500 kHz 200 µV/V
800 kHz 240 µV/V
1 MHz 240 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 10 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)

6 mV 10 Hz 65 µV/V Fluke 792A AC/DC

20 Hz 65 µV/V transfer standard
40 Hz 65 µV/V
50 Hz 65 µV/V
100 Hz 65 µV/V
400 Hz 65 µV/V
1 kHz 65 µV/V
3 kHz 50 µV/V
10 kHz 50 µV/V
20 kHz 50 µV/V
30 kHz 50 µV/V
50 kHz 50 µV/V
100 kHz 50 µV/V
300 kHz 60 µV/V
500 kHz 110 µV/V
800 kHz 130 µV/V
1 MHz 230 µV/V

10 mV 10 Hz 40 µV/V
20 Hz 40 µV/V
40 Hz 40 µV/V
50 Hz 40 µV/V
100 Hz 40 µV/V
400 Hz 40 µV/V
1 kHz 40 µV/V
3 kHz 40 µV/V
10 kHz 40 µV/V
20 kHz 40 µV/V
30 kHz 45 µV/V
50 kHz 45 µV/V
100 kHz 60 µV/V
300 kHz 65 µV/V
500 kHz 120 µV/V
800 kHz 140 µV/V
1 MHz 140 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 11 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)

20 mV 10 Hz 30 µV/V Fluke 792A AC/DC

20 Hz 30 µV/V transfer standard
40 Hz 30 µV/V
50 Hz 30 µV/V
100 Hz 30 µV/V
400 Hz 30 µV/V
1 kHz 30 µV/V
3 kHz 18 µV/V
10 kHz 18 µV/V
20 kHz 18 µV/V
30 kHz 18 µV/V
50 kHz 26 µV/V
100 kHz 50 µV/V
300 kHz 50 µV/V
500 kHz 100 µV/V
800 kHz 140 µV/V
1 MHz 190 µV/V

60 mV 10 Hz 18 µV/V
20 Hz 18 µV/V
40 Hz 18 µV/V
50 Hz 18 µV/V
100 Hz 18 µV/V
400 Hz 14 µV/V
1 kHz 14 µV/V
3 kHz 14 µV/V
10 kHz 20 µV/V
20 kHz 20 µV/V
30 kHz 20 µV/V
50 kHz 20 µV/V
100 kHz 40 µV/V
300 kHz 55 µV/V
500 kHz 90 µV/V
800 kHz 120 µV/V
1 MHz 120 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 12 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)

100 mV 10 Hz 10 µV/V Fluke 792A AC/DC

20 Hz 8 µV/V transfer standard
40 Hz 8 µV/V
50 Hz 8 µV/V
100 Hz 8 µV/V
400 Hz 8 µV/V
1 kHz 8 µV/V
3 kHz 8 µV/V
10 kHz 10 µV/V
20 kHz 12 µV/V
30 kHz 12 µV/V
50 kHz 12 µV/V
100 kHz 24 µV/V
300 kHz 24 µV/V
500 kHz 24 µV/V
800 kHz 32 µV/V
1 MHz 45 µV/V

200 mV 10 Hz 8 µV/V
20 Hz 8 µV/V
40 Hz 8 µV/V
50 Hz 8 µV/V
100 Hz 8 µV/V
400 Hz 8 µV/V
1 kHz 8 µV/V
3 kHz 8 µV/V
10 kHz 8 µV/V
20 kHz 8 µV/V
30 kHz 8 µV/V
50 kHz 12 µV/V
100 kHz 16 µV/V
300 kHz 16 µV/V
500 kHz 22 µV/V
800 kHz 35 µV/V
1 MHz 40 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 13 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)
500 mV 10 Hz 18 µV/V Fluke 792A AC/DC
20 Hz 18 µV/V transfer standard
40 Hz 12 µV/V
50 Hz 12 µV/V
100 Hz 10 µV/V
400 Hz 10 µV/V
1 kHz 10 µV/V
3 kHz 10 µV/V
10 kHz 10 µV/V
20 kHz 12 µV/V
30 kHz 14 µV/V
50 kHz 20 µV/V
100 kHz 35 µV/V
300 kHz 40 µV/V
500 kHz 40 µV/V
800 kHz 40 µV/V
1 MHz 40 µV/V
600 mV 10 Hz 12 µV/V
20 Hz 10 µV/V
40 Hz 10 µV/V
50 Hz 10 µV/V
100 Hz 10 µV/V
400 Hz 10 µV/V
1 kHz 10 µV/V
3 kHz 10 µV/V
10 kHz 10 µV/V
20 kHz 10 µV/V
30 kHz 10 µV/V
50 kHz 10 µV/V
100 kHz 14 µV/V
300 kHz 14 µV/V
500 kHz 14 µV/V
800 kHz 20 µV/V
1 MHz 26 µV/V

1V 10 Hz 6 µV/V
20 Hz 6 µV/V
40 Hz 6 µV/V
50 Hz 6 µV/V
100 Hz 6 µV/V
400 Hz 6 µV/V
1 kHz 6 µV/V
3 kHz 6 µV/V
10 kHz 6 µV/V
20 kHz 6 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 14 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)
1V 30 kHz 6 µV/V Fluke 792A AC/DC
50 kHz 6 µV/V transfer standard
100 kHz 8 µV/V
300 kHz 10 µV/V
500 kHz 12 µV/V
800 kHz 20 µV/V
1 MHz 24 µV/V
2V 10 Hz 8 µV/V
20 Hz 6 µV/V
40 Hz 6 µV/V
50 Hz 6 µV/V
100 Hz 6 µV/V
400 Hz 4 µV/V
1 kHz 4 µV/V
3 kHz 4 µV/V
10 kHz 4 µV/V
20 kHz 4 µV/V
30 kHz 4 µV/V
50 kHz 4 µV/V
100 kHz 8 µV/V
300 kHz 8 µV/V
500 kHz 12 µV/V
800 kHz 12 µV/V
1 MHz 14 µV/V
3V 10 Hz 8 µV/V
20 Hz 6 µV/V
40 Hz 6 µV/V
50 Hz 4 µV/V
100 Hz 4 µV/V
400 Hz 4 µV/V
1 kHz 4 µV/V
3 kHz 6 µV/V
10 kHz 6 µV/V
20 kHz 6 µV/V
30 kHz 6 µV/V
50 kHz 6 µV/V
100 kHz 6 µV/V
300 kHz 6 µV/V
500 kHz 10 µV/V
800 kHz 12 µV/V
1 MHz 12 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 15 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)
6V 10 Hz 10 µV/V Fluke 792A AC/DC
20 Hz 10 µV/V transfer standard
40 Hz 10 µV/V
50 Hz 10 µV/V
100 Hz 4 µV/V
400 Hz 4 µV/V
1 kHz 4 µV/V
3 kHz 4 µV/V
10 kHz 4 µV/V
20 kHz 4 µV/V
30 kHz 4 µV/V
50 kHz 4 µV/V
100 kHz 6 µV/V
300 kHz 10 µV/V
500 kHz 14 µV/V
800 kHz 16 µV/V
1 MHz 16 µV/V
10 V 10 Hz 8 µV/V
20 Hz 6 µV/V
40 Hz 4 µV/V
50 Hz 4 µV/V
100 Hz 4 µV/V
400 Hz 4 µV/V
1 kHz 4 µV/V
3 kHz 4 µV/V
10 kHz 4 µV/V
20 kHz 4 µV/V
30 kHz 4 µV/V
50 kHz 4 µV/V
100 kHz 8 µV/V
300 kHz 10 µV/V
500 kHz 14 µV/V
800 kHz 14 µV/V
1 MHz 14 µV/V
20 V 10 Hz 8 µV/V
20 Hz 6 µV/V
40 Hz 4 µV/V
50 Hz 4 µV/V
100 Hz 4 µV/V
400 Hz 4 µV/V
1 kHz 4 µV/V
3 kHz 4 µV/V
10 kHz 4 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 16 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)
20 V 20 kHz 4 µV/V Fluke 792A AC/DC
30 kHz 4 µV/V transfer standard
50 kHz 4 µV/V
100 kHz 6 µV/V
300 kHz 6 µV/V
500 kHz 10 µV/V
800 kHz 12 µV/V
1 MHz 12 µV/V
60 V 10 Hz 14 µV/V
20 Hz 10 µV/V
40 Hz 8 µV/V
50 Hz 8 µV/V
100 Hz 8 µV/V
400 Hz 8 µV/V
1 kHz 6 µV/V
3 kHz 6 µV/V
10 kHz 6 µV/V
20 kHz 6 µV/V
30 kHz 6 µV/V
50 kHz 6 µV/V
100 kHz 8 µV/V
300 kHz 28 µV/V
100 V 10 Hz 14 µV/V
20 Hz 10 µV/V
40 Hz 8 µV/V
50 Hz 8 µV/V
100 Hz 6 µV/V
400 Hz 6 µV/V
1 kHz 6 µV/V
3 kHz 6 µV/V
10 kHz 6 µV/V
20 kHz 6 µV/V
30 kHz 8 µV/V
50 kHz 8 µV/V
100 kHz 8 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 17 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

AC/DC Difference,
Voltage – Measure,
Fixed Points (cont)
200 V 10 Hz 18 µV/V Fluke 792A AC/DC
20 Hz 10 µV/V transfer standard
40 Hz 10 µV/V
50 Hz 10 µV/V
100 Hz 8 µV/V
400 Hz 6 µV/V
1 kHz 6 µV/V
3 kHz 6 µV/V
10 kHz 6 µV/V
20 kHz 6 µV/V
30 kHz 6 µV/V
50 kHz 8 µV/V
100 kHz 12 µV/V
600 V 40 Hz 14 µV/V
50 Hz 14 µV/V
100 Hz 14 µV/V
400 Hz 14 µV/V
1 kHz 8 µV/V
3 kHz 8 µV/V
10 kHz 10 µV/V
20 kHz 12 µV/V
30 kHz 18 µV/V
50 kHz 20 µV/V
100 kHz 28 µV/V
1000 V 40 Hz 10 µV/V
50 Hz 10 µV/V
100 Hz 10 µV/V
400 Hz 8 µV/V
1 kHz 8 µV/V
3 kHz 8 µV/V
10 kHz 8 µV/V
20 kHz 10 µV/V

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 18 of 35

 Parameter/Range Frequency CMC2, 4, 12 (±) Comments

AC/DC Difference, (All frequencies apply

Voltage – Measure, Fixed at each voltage)
Points

(0.5, 1.0, 2.0, 3.0) V 1 MHz 0.010 % TVCs, model 1394

3 MHz 0.040 %
10 MHz 0.070 %
20 MHz 0.090 %
30 MHz 0.15 %
50 MHz 0.30 %
70 MHz 0.60 %
100 MHz 1.2 %

Electronic Current – (10 to 100) fA 0.10 % Voltage source &

Measure resistor current source

IV. Electrical – RF/Microwave

Parameter/Range Frequency CMC2, 12 (±) Comments

RF Power – Measure Power ratio with

standard thermistor
mounts;
f = frequency in GHz
CF = calibration factor

Coaxial Type N 100 kHz to 1 MHz 0.70 % CF Agilent 8257 signal

(>1 to 50) MHz 0.60 % CF generator, Tegam
≥50 MHz to 18 GHz (0.025f + 0.38) % CF M1111 & M1120 CN
mount

Coaxial 3.5 mm 10 MHz to 26.5 GHz (0.020f + 1.1) % CF Agilent 8257 signal
generator, adapter

Coaxial 2.92 mm 10 MHz to 30 GHz (0.020f + 1.1) % CF Agilent 8474E,

(>30 to 40) GHz (0.12f – 1.9) % CF adapter

Coaxial 2.4 mm 50 MHz to 30 GHz (0.020 f + 0.80) % CF Agilent 8474E

(>30 to 50) GHz (0.12f − 2.2) % CF without adapter

Coaxial CN Mount 50 MHz 0.19 % CF Using NIST supplied

>50 MHz to 18 GHz (0.20 + 0.005f microcalorimeter
+ 0.000 48f2) % CF

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 19 of 35

 Parameter/Range Frequency CMC2, 12 (±) Comments

RF Power – Measure Power ratio with

(cont) standard thermistor
mounts;
Waveguide Calibration f = frequency in GHz
Factors CF = calibration factor
(0.1 to 10) mW

X band (WR-90) (8.2 to 12.4) GHz 1.8 % CF Agilent X486A

Ku band (WR-62) (12.4 to 18) GHz 1.8 % CF Agilent P486A

K band (WR-42) (18 to 26.5) GHz 1.8 % CF Agilent K486A

Ka band (WR-28) (26.5 to 40) GHz 1.8 % CF Agilent R486A

Q band (WR-22) (33 to 50) GHz (0.10f) % CF Agilent 8474E with

(0.1 to 4.0) mW adapter

Thermal Noise – Ratio technique with

Measure, (5 to 40) dB standard noise sources
ENR

Coaxial Type N (0.01 to 18) GHz 0.30 dB Agilent N4001A

Coaxial 3.5 mm (0.01 to 26.5) GHz 0.30 dB Agilent N4002A

Electromagnetic Field Anechoic chamber &

Strength – Measure TEM cell with
calibrated tapered
(20 to 62) V/m 0.1 MHz to 40 GHz 2.0 dB dipole antennas

Electromagnetic Power Anechoic chamber &

Density – Hazard Probes TEM cell with
& Meters calibrated tapered
dipole antennas
(0.1 to 1.0) mW/cm2 0.1 MHz to 40 GHz 2.0 dB

Attenuation – Measure
Incremental Attenuation,

(0 to 20) dB 300 kHz to 4 GHz 0.0022 dB + Dual bolometer

0.002 dB/10 dB System (DBS)

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 20 of 35

 Parameter/Range CMC2, 12 (±) Magnitude CMC2, 12 (±) Phase Comments

Reflection – Measure Network analyzer

S11 & S22, Magnitude & reflectometer,
Phase Keysight N5225B

Coaxial Type N f = frequency in

Rho - Linear GHz
100 kHz to 18 GHz
For Magnitude: Reflection Stds:
<0.024 (0.000 30f + 0.0050) dB 180° coaxial
≥0.024 to <0.09 (0.000 30f + 0.0050) dB 20° mismatches
≥0.09 to <0.15 (0.000 30f + 0.0050) dB (0.10f + 4.0)°
≥0.15 (0.000 30f + 0.0075) dB (0.10f + 3.0)°

Coaxial 3.5 mm
Rho – Linear
10 MHz to <50 MHz
For Magnitude:
<0.09 (0.000 30f + 0.025) dB 180°
≥0.09 (0.000 30f + 0.025) dB (0.17f + 13) °

Coaxial 3.5 mm
Rho – Linear
>50 MHz to 26.5 GHz
For Magnitude:
<0.09 (0.000 30f + 0.012) dB 180°
≥0.09 (0.000 30f + 0.012) dB (0.17f + 5.0)°

Coaxial 2.92 mm
Rho – Linear Network analyzer
50 MHz to 40 GHz reflectometer,
For Magnitude: Keysight N5225A
<0.09 (0.000 30f + 0.013) dB 180°
≥0.09 (0.000 30f + 0.013) dB (0.20f + 5.0)°

Coaxial 2.4 mm
Rho – Linear
50 MHz to 50 GHz
For Magnitude:
<0.09 (0.000 30f + 0.015) dB 180°
≥0.09 (0.000 30f + 0.015) dB (0.20f + 9.0)°

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 21 of 35

 Parameter/Range CMC2, 12 (±) Magnitude CMC2, 12 (±) Phase Comments

Attenuation – Measure, Network analyzer

S21 & S12, Magnitude & with attenuators;
Phase
f = frequency in GHz
AN = nominal
attenuation in dB
Coaxial Type N
(0.01 to 18) GHz
AN ≤20 dB 0.060 dB (0.15f + 0.90) ° Attenuators within
(30 < AN ≤50) dB 0.25 dB (0.090f + 2.2) ° 9918 & verification kit
(50 < AN ≤60) dB 0.60 dB (0.090 f + 4.0) °

Coaxial Type N
0.01 to <0.03 GHz
(20 < AN ≤30) dB 0.065 dB (0.090f + 0.60)°

(0.03 to 0.05) GHz

(20 < AN ≤30) dB 0.045 dB (0.090f + 0.60)°

>0.05 to 18 GHz
(20 < AN ≤30) dB 0.070 dB (0.090f + 0.60)°

Coaxial 3.5 mm
(0.05 to 26.5) GHz 8493C
AN ≤20 dB (0.0010f + 0.030) dB (0.11f + 0.30)°
(20 < AN ≤40) dB (0.0010f + 0.075) dB (0.11f + 0.45)°

Coaxial 2.92 mm
(1 to 40) GHz Attenuators within Anritsu
AN ≤20 dB (0.0016f + 0.030) dB (0.11f + 0.50)° model 41KC &
(20 < AN ≤50) dB (0.0020f + 0.35) dB (0.11f + 0.85)° verification kit

Coaxial 2.4 mm
(1 to 50) GHz Attenuators within Agilent
AN ≤20 dB (0.0050f + 0.050) dB (0.12f + 0.50)° 85057B verification kit
(20 < AN ≤40) dB (0.0070f + 0.170) dB (0.12f + 1.1)°

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 22 of 35

V. Fluid Quantities

Parameter/Equipment Range CMC2, 4, 10 (±) Comments

M41 PATS Gas Mask (1 to 10 000) fit factor 5% Aerosol measurement

Tester Calibration & comparison to CPC

Liquid Properties –
Measure
(0 to 3) g/cm3 11 x 10-6 g/cm3 DMA 5000 M vibrating
Density U-tube density meter

<10 mm2/s 0.25 % Cannon Fenske routine

Viscosity (10 to 100) mm2/s 0.30 % or Ubbelohde
viscometers

Liquid Flow – Measure (0.08 to 400) gpm 0.060 % Positive displacement

(0.3 to 1600) lpm liquid flow meter

(0.002 to 2) gpm 0.25 %

(0.008 to 8) lpm

Gas Flow – Measure (0.5 to 50) sccm 0.035 % Constant pressure flow
(0.005 to 10) slpm 0.10 % meter (CPFM),
(3 to 15 000) slpm 0.14 % gravimetric flow
standard (GFS),
critical flow venturi
(CFV), Molblocs

Air Velocity – Measure (350 to 880) ft/min 3.5 ft/min Wind tunnel – 12”x12”
(880 to 13 000) ft/min 0.40 % test section using pitot
static probe

Aerosol Number (0.05 to 75 000) 2.5 % Comparison to aerosol

Concentration – Measure particles/cm3, electrometer & linearity
for diameters (20 to test w/diluter
1000) nm

Aerosol Particle Diameter (0.01 to 3) µm 2.5 % Comparison to particle

– Measure (1 to 20) µm 2.5 % size standards

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 23 of 35

VI. Ionizing Radiation & Radioactivity

Parameter/Equipment Range CMC2, 4, 5, 8 (±) Comments

Irradiation of
Thermoluminescent
Dosimeters & Electronic
Dosimeters –
(Beta)
90
SrY, 85Kr Up to 20 μGy/s 6.8 % Beta sources

Radionuclide Source
Calibration6 –
238
Pu, 241Am Up to 6 x104 Bq 2.8 % Alpha sources

Radiation Protection
Survey Instruments6 –
238
Pu Exposure (Alpha) Up to 2 x 106 counts/min 7.3 % Alpha sources
137
Cs Exposure (Gamma) 0.05 mR/h to 5000 R/h 6.0 %

(X Ray) A3, A4, A5, A6,

M30 (20 to 200) R/h 6.6 % A8 chambers
M60 (1.5 to 300) R/h 6.6 %
M100 (1.5 to 300) R/h 6.6 %
M150 (2.5 to 400) R/h 6.6 %
H150 (0.3 to 15) R/h 6.6 %
S75 (50 to 500) R/h 6.6 %
HK10 (15 to 100) R/h 6.6 %
HK20 (25 to 250) R/h 6.6 %
HK30 (20 to 200) R/h 6.6 %
HK60 (4.0 to 150) R/h 6.6 %
HK100 (4.0 to 150) R/h 6.6 %
HK200 (10 to 400) R/h 6.6 %
HK250 (15 to 500) R/h 6.6 %
HK280 (15 to 500) R/h 6.6 %
HK300 (15 to 500) R/h 6.6 %

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 24 of 35

 Parameter/Equipment Range CMC2, 4, 5, 8 (±) Comments

Radiation Protection
Survey Instruments6 –
(cont)

(X Ray)
LK10 (0.15 to 0.80) R/h 6.6 % A3, A4, A5, A6,
LK20 (0.4 to 2.5) R/h 6.6 % A8 chambers
LK30 (0.04 to 0.4) R/h 6.6 %
LK35 (0.075 to 1.0) R/h 6.6 %
LK55 (0.015 to 0.5) R/h 6.6 %
LK70 (0.04 to 0.4) R/h 6.6 %
LK100 (0.01 to 0.4) R/h 6.6 %
LK125 (0.0008 to 0.4) R/h 6.6 %
LK170 (0.0005 to 0.4) R/h 6.6 %
LK210 (0.005 to 0.25) R/h 6.6 %
LK240 (0.0015 to 0.3) R/h 6.6 %
NS10 (1.5 to 10) R/h 6.6 %
NS15 (1.0 to 8.0) R/h 6.6 %
NS20 (1.5 to 15) R/h 6.6 %
NS25 (1.5 to 15) R/h 6.6 %
NS30 (1.0 to 10) R/h 6.6 %
NS40 (0.1 to 4.0) R/h 6.6 %
NS60 (0.2 to 8.0) R/h 6.6 %
NS80 (0.25 to 5.0) R/h 6.6 %
NS100 (0.04 to 2.0) R/h 6.6 %
NS120 (0.2 to 2.0) R/h 6.6 %
NS150 (0.3 to 10) R/h 6.6 %
NS200 (0.2 to 5.0) R/h 6.6 %
NS250 (0.15 to 5.0) R/h 6.6 %
NS300 (0.25 to 5.0) R/h 6.6 %
WS60 (0.5 to 20) R/h 6.6 %
WS80 (1.0 to 40) R/h 6.6 %
WS110 (0.75 to 25) R/h 6.6 %
WS150 (1.5 to 50) R/h 6.6 %
WS200 (2.0 to 100) R/h 6.6 %
WS250 (2.5 to 100) R/h 6.6 %
WS300 (3.0 to 150) R/h 6.6 %

Ionization Chambers 0.05 mR/h to 5000 R/h 1.5 % A3, A4, A5, A6,
A8 chambers

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 25 of 35

 Parameter/Equipment Range CMC2, 4, 5, 8 (±) Comments

Irradiation of Personnel
Dosimeters –
137
Cs (Gamma) >0.03 R/h 5.7 % A3, A4, A5, A6
chambers
(X-Ray)
M30, M60, M100, >0.03 R/h 5.7 %
M150, H150, S75,
HK10, HK20, HK30
HK60, HK100, HK200
HK280, HK300, LK10
LK20, LK30, LK35
LK55, LK70, LK100
LK125, LK170, LK210
LK240, NS10, NS15
NS20, NS25, NS30
NS40, NS60, NS80
NS100, NS120, NS150
NS200, NS250, NS300
WS60, WS80, WS110
WS150, WS200, WS250,
WS300

Gamma / X-Ray Source

Calibration for Air KERMA
Rate6, 7 –
137
Cs3 0.05 mR/h to 5000 R/h 2.5 % A3, A4, A5, A6
chambers
137
Cs3 0.1 mR/h to 600 R/h 4.1 %
60
Co 0.05 mR/h to 1000 R/h 2.5 %

NIST Beam Codes

M30, M60, M100, M150, (0.3 to 400) R/h 1.9 %
H150, S75

ISO Beam Codes

All HK, LK, NS, WS 0.5 mR/h to 500 R/h 2.5 %

Liquid Scintillation
3
H (Beta) (0.17 to 2.4 x 107) Bq 1.1 % SRMs
Ni (Beta)
63
(0.17 to 2.4 x 107) Bq 1.0 %

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 26 of 35

 Parameter/Equipment Range CMC2, 4, 5, 8 (±) Comments

Nuclear Counting
Category
Gas Proportional –
241
Am (Alpha) (0.06 to 3.0 x 106) Bq 4.1 % Radionuclides
90
SrY (Beta) (0.11 to 3.0 x 106) Bq 3.9 %
137
Cs (Gamma) (3.0 x 103 to 3.0 x 106) Bq 4.3 %
137
Cs (Beta) (3.0 x 103 to 3.0 x 106) Bq 3.8 %
60
Co (Gamma) (5.4 x 103 to 3.0 x 106) Bq 4.4 %
60
Co (Beta) (5.4 x 103 to 3.0 x 106) Bq 4.4 %

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 27 of 35

VII. Mechanical

Parameter/Equipment Range CMC2 (±) Comments

Mass 1 mg 0.0012 mg APSL calibration technique

2 mg 0.0012 mg # ASL-008
3 mg 0.0012 mg
5 mg 0.0014 mg CMC is based upon
10 mg 0.0015 mg measurements made using
weighing designs & density
20 mg (0.0017 mg) uncertainties known.

30 mg (0.0017 mg)
50 mg (0.0017 mg)
100 mg (0.0017 mg) Calibration of ounce weights
with tolerances of Class 3 or
200 mg (0.0017 mg) greater can be provided &
are traceable through APSL
300 mg (0.0017 mg) primary standards.
500 mg (0.0021 mg) Calibration of grain weights
with tolerances of Class 3 or
1g (0.0022 mg) greater can be provided &
are traceable through APSL
2g (0.0025 mg) metric primary standards.
3g (0.0026 mg)

5g (0.0033 mg)
10 g (0.0070 mg)
20 g (0.0091 mg)
30 g 0.014 mg
50 g 0.020 mg
100 g 0.029 mg
200 g 0.063 mg
300 g 0.075 mg
500 g 0.10 mg
1 kg 0.13 mg
2 kg 1.0 mg
5 kg 1.1 mg
10 kg 2.6 mg
20 kg 9.3 mg

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 28 of 35

 Parameter/Equipment Range CMC2, 10 (±) Comments

Mass (cont) 0.001 lb 0.0036 mg APSL calibration technique

(0.453 592 4 g) # ASL-008
0.002 lb 0.0058 mg
(0.907 184 7 g) CMC is based upon
0.003 lb 0.014 mg measurements made using
(1.360 777 g) weighing designs & density
0.005 lb 0.018 mg uncertainties known.
(2.267 962 g)
0.01 lb 0.027 mg
(4.535 92 g)
0.02 lb 0.027 mg
(9.071 85 g)
0.03 lb 0.027 mg Calibration of ounce weights
(13.6078 g) with tolerances of Class 3 or
0.05 lb 0.033 mg greater can be provided &
(22.6796 g) are traceable through APSL
0.1 lb 0.040 mg primary standards.
(45.3592 g)
0.2 lb 0.040 mg Calibration of grain weights
(90.7185 g) with tolerances of Class 3 or
0.3 lb 0.076 mg greater can be provided &
(136.078 g) are traceable through APSL
0.5 lb 0.084 mg metric primary standards.
(226.796 g)
1 lb 0.14 mg
(453.592 g)
2 lb 0.16 mg
(907.185 g)
3 lb 0.67 mg
(1360.78 g)
5 lb 2.0 mg
(2267.96 g)
10 lb 4.9 mg
(4535.92 g)
20 lb 8.0 mg
(9071.85 g)
25 lb 11 mg
(11.3398 kg)
50 lb 23 mg
(22.6796 kg)
100 lb 43 mg
(45.3592 kg)

Force – Load Cells, (10 to 1000) lbf 0.015 % of full scale Dead weight force machine
Proving Rings, etc.
(1000 to 0.015 % of full scale
112 000) lbf

(112 000 to 0.05 % of full scale Morehouse hydraulic force

1 000 000) lbf machine

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 29 of 35

 Parameter/Equipment Range CMC2, 4 (±) Comments

Vacuum – Measure (0 to 15) kPa (27x10-6) p + 5.9 Force balanced piston

mPa gauge;
p = pressure

Volume – Measure 500 mL to 5 L 58 µL/L Gravimetric method

(50 to <500) mL 50 µL/L

Accelerometer (2 to 50) Hz 1.0 % Long stroke shaker with

(0.1 to 1) g optical encoder
(2 to 4 Hz) 2.5 % Comparison calibration
5 Hz to 1 kHz 1.0 %
(>1 to 5) kHz 1.5 %
(>5 to 15) kHz 2.0 %
(5 to 50) Hz 0.5 % The Modal Shop 9155C
(>50 to 160) Hz 0.3 % shaker system with laser
>160 Hz to 1 kHz 0.5 % option
(>1 to 5) kHz 1.0 %
(>5 to 15) kHz 1.5 %

Pressure – Mercury (0 to 330) kPa 0.82 Pa + 0.0017 % Schwien mercury

Manometer manometer

Pressure – Piston Gages (1.5 to 25) psi (1.4 × 10-5) p Deadweight piston gage
(25 to 100) psi (1.6 × 10-5) p
(25 to 1000) psi (2.2 × 10-5) p
(1000 to 10 000) psi (3.5 × 10-5) p
(10 000 to 20 000) psi (3.7 × 10-5) p
(0 to 2) psi (3.0 × 10-5) p Air Data calibration
(2 to 50) psi (1.8 × 10-5) p system
(0 to 15) kPa (1.2 × 10-5) p PG-7607;
p = pressure

Pressure – Gas Comparison with standard

piston – cylinders using
Effective Area of (4 to 400) kPa 0.0014 % the piston gage cross float
Piston - Cylinder (400 to 800) kPa 0.0015 % systems.
(800 to 4000) kPa 0.0018 %
(4000 to 10 000) kPa 0.0018 %
(10 to 20) MPa 0.0017 %
(20 to 50) MPa 0.0016 %
(50 to 100) MPa 0.0022 %
(100 to 200) MPa 0.0037 %

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 30 of 35

 Parameter/Equipment Range CMC2, 4 (±) Comments

Pressure – Oil Comparison with

standard piston –
Effective Area of (2 to 10) MPa 0.0017 % cylinders using the
Piston - Cylinder (10 to 100) MPa 0.0020 % piston gage cross
(100 to 200) MPa 0.0022 % float systems.

VIII. Optical Quantities

Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Fiber Optics Power –

Measure
10 nW to 100 µW 850 nm 1.5 % Detector based
1310 nm 1.5 %
1550 nm 1.5 %

Fiber Optic Source (600 to 1700) nm 0.50 nm Spectrum analyzer &

Wavelength – Measure intrinsic source

Spectral Radiance – (1x10-9 to 1x10-5) 4.0 % Detector & source

(300 to 1600) nm Wcm-2sr-1nm-1 based

Detector Spectral Power: Detector based

Response – Measure Si (350 to 1030) nm 3.4 % Si, Ge
(1030 to 1065) nm 4.0 %
(1065 to 1100) nm 4.5 %
Ge (700 to 1650) nm 3.2 %
(1650 to 1720) nm 3.8 %
(1720 to 1800) nm 5.3 %
(V or A)/(W nm-1)
Irradiance:
Si (350 to 1030) nm 4.1 %
(1035 to 1065) nm 4.6 %
(1070 to 1100) nm 5.1 %
Ge (700 to 1650) nm 4.0 %
(1655 to 1720) nm 3.8 %
(1725 to 1800) nm 5.3 %
(V or A)/(W cm-2 nm-1)

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 31 of 35

 Parameter/Equipment Range CMC2, 4, 10 (±) Comments

Photometric – Measure
Illuminance (2 to 500) fcd 2.0 % Detector & source
based
Luminance (10 to 10 000) fL 2.0 %
Color Temperature (2000 to 3200) K 17 K

Laser Energy – Measure, 200 nJ to 20 mJ 5.0 % Detector based &

(1064 nm) using beamsplitters

Laser Power – Measure

488 nm 100 mW to 3 W 5.0 % Detector based &

using beamsplitters
514.5 nm 100 mW to 3 W 5.0 %

632.8 nm 1 µW to 30 mW 5.0 %

780 nm 1 µW to 30 mW 5.0 %

1064 nm 100 mW to 8 W 5.0 %

UV Irradiance – Measure, (365 nm) (600 to 2000) W/cm2 8.0 % Detector based

IX. Thermodynamics

Parameter/Equipment Range CMC2, 10 (±) Comments

Humidity – Measure (10 to 90) % RH 0.5 % RH Two-pressure

chamber, Dew point
mirror

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 32 of 35

 Parameter/Equipment Range CMC2, 10 (±) Comments

Standard Platinum
Resistance Thermometers –
Fixed Point Calibrations

Triple Point of Water 0.01 °C 0.0010 °C Triple, melting, &

Triple Point of Ar -189.3442 °C 0.0025 °C freezing points using a
Triple Point of Hg -38.8344 °C 0.0017 °C DC thermometry bridge
Melting Point of Ga 29.7646 °C 0.0018 °C
Freezing Point of Sn 231.928 °C 0.0026 °C
Freezing Point of Zn 419.527 °C 0.0038 °C

Non-Fixed Point (-80 to 420) °C 0.008 °C Direct comparison in

Calibration of Temperature baths or drywells
Devices Using SPRT

Non-Fixed Point (0 to 1000) °C 0.75 °C Direct comparison

Calibration of Temperature using Type S
Devices Using thermocouple
Thermocouples

Infrared Temperature
Calibration – Measure

Using TRT IV.82 (-5 to 300) °C 1.2 °C Any IR measurement

Transfer Radiation (300 to 550) °C 1.5 °C over the stated range
Thermometer using TRT IV.82

Using NIRT Near (156 to 850) °C 0.73 °C Any IR measurement

Infrared Radiation (851 to 1020) °C 0.80 °C over the stated range
Thermometer (1021 to 1100) °C 0.98 °C using NIRT

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 33 of 35

X. Time & Frequency

Parameter/Equipment Range CMC2, 10 (±) Comments

Frequency – Measuring 10 MHz 1.2 pHz/Hz Microsemi 4310B

Equipment
1 Hz to <1 kHz 10 nHz/Hz Keysight 33250A w/
Microsemi 4310B

1 kHz to 50 GHz 1 nHz/Hz Keysight

33250A/E8257D w/
Microsemi 4310B

Frequency – Measure 1 Hz to <1 kHz 10 nHz/Hz Keysight 53131A w/

Microsemi 4310B

1 kHz to 50 GHz 1 nHz/Hz Keysight

53131A/N9030B w/
Microsemi 4310B

_______________________________
1
This laboratory offers limited commercial calibration services and field calibration services.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMC’s
represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using
a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by
the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences
from the circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the Calibration and
Measurement Capability Uncertainty (CMC) found on the A2LA Scope. Allowance must be made for
aspects such as the environment at the place of calibration and for other possible adverse effects such as
those caused by transportation of the calibration equipment. The usual allowance for the uncertainty
introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own,
could result in the actual measurement uncertainty achievable on a customer’s site being larger than the
CMC.
4
In the statement of CMC, percentages are percentage of reading, unless otherwise indicated. D is the
diameter of the unit under test in the units indicated, unless otherwise indicated. L is the length of unit
under test in the units indicated.
5
CMCs are valid for the nominal intensity range listed.
6
For calibration outside of the nominal intensity range shown, uncertainties would be determined
commensurate with the Parameter/Equipment of the reference field calibration.
7
Enclosed calibration range.

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 34 of 35

8
CMCs are the estimated “best uncertainties” of the laboratory reference fields established to perform the
indicated operations.
9
Effects of tests for non-repeatability, nonlinearity, hysteresis, and environmental factors can cause
uncertainties to be larger than the CMC for balances and scales.
10
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.
11
This scope meets A2LA’s P112 Flexible Scope Policy.
12
The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured value
in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a
percent or fraction of the reading plus a fixed floor specification.

(A2LA Cert. No. 1256.01) Revised 02/12/2025 Page 35 of 35

 Accredited Laboratory
A2LA has accredited

U.S. ARMY PRIMARY STANDARDS LABORATORY

Redstone Arsenal, AL
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of
ANSI/NCSLI Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation
demonstrates technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 10th day of February 2025.

_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1256.01
Valid to December 31, 2026
Revised February 12, 2025

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.