Lab Module9_WSME_P Chart
Lab Module9_WSME_P Chart
Evaluation Criteria
Taxonomy Max Marks
Knowledge Components Domain Contribution
Level Marks Obtained
Total Marks 10
Generally in a production process a sample of items consisting of different sub groups is taken
and defective items for each sub group are traced by using suitable inspection methods. Then the
fraction defective or percent defective per each sub group will be calculated and these values are
plotted on P –chart.
The central line of the P – chart is expressed as
−
P = average of all fraction defectives
OR
Total number of defectives
P = ------------------------------------------
Total number of pieces inspected
The fraction defectives tend to approach binomial distribution and the control limits (UCL &
LCL) are set at 3σ of the fractional defectives from mean ¯P. Thus the upper and lower control
limits are given by
UCLp = ¯P + 3σ P LCLp = ¯P - 3σ P
Where σP = Standard deviation of the distribution of the fraction defectives. Whenever
calculations give a negative value of LCL of P –chart, that limit is recorded as zero.
PROCEDURE:
1) Take the random samples of size 50 each (n) and make 10 groups.
2) Observe the number of green balls in each sample (di).
3) Find the fraction defective in each sample (di / n). _
4) Calculate the center line or mean fraction defective (P = ΣPi /10).
5) Compute the control limits (UCL & LCL)
Review Questions
Q#1: Provide an example from a manufacturing setting where a P chart could be effectively
employed for quality control. Discuss the specific variable being monitored and its implications.
Q#2: If a point on the P chart falls outside the control limits, what does this indicate about the
process? How would you distinguish between common cause and special cause variation in this
scenario?
Q#3: How does changing the sample size influence the width and position of the control limits?