EECS240B Lect1 SP25 Intro-1
EECS240B Lect1 SP25 Intro-1
Osama Shana’a
Sr. Director RF-design, MediaTek Inc.
[email protected]
office hours:
- Regular: TueThu 5:05pm-6:05pm/ 504 Cory
(shortly after class)
- Upon request: (email me if you have any
questions and if I can’t answer by email, we will
schedule a ZOOM meeting
Class objectives:
● Hands on experience in the art of analog circuit
design, with emphasis on practical considerations.
Lecture notes:
● can be downloaded from the bCourse website:
https://bcourses.berkeley.edu/courses/1540021
Lectures:
• Notes in PDF can be downloaded from bCourse
• Lectures will NOT be recorded to help with the in-
person leaning spirit.
• better come to class to attend live discussion. In normal
circumstance we may take attendance.
Typical RF transceiver :
Cellular and connectivity:
• Receiver analog TIA (also called TZ or trans-impedance amplifier)
• Receive/Transmit continuous-time analog filters
• LDOs, PLL, temp-sensors, bandgap reference, biasing generators
WiFi6 Shanaa, et. Al., ISSCC 2020
Course outline:
Part I: Some Fundamentals, useful for Analog design
o MOS transistor modeling (and impact on design flow):
o Square-law model vs gm/Id
o Short channel effects and impact on device
performance/parameters
o Electronic noise and noise analysis
o Gain-bandwidth (GBW) product and its use in amplifier
design
Part V: Misc.
o Transistor matching:
o Area and Vth mismatch (basics)
o Mismatch calculation
o Layout techniques to improve device matching
o Few practical considerations
o Layout techniques to improve device matching
o Comparator design
o Settling (if we have time)
Desired
signal
few µV few 100mV
S/N SNDR harmonics
Desired
signal
few µV few 100mV Noise added by
S/N SNDR analog circuit
noise
Freq (Hz)
2. Selectivity
analog DSP
unwanted
few 10’s dB signal
desired
desired signal
signal
Desired
signal
few µV few 100mV
SNDR harmonics
distortion
Freq (Hz)
analog
DSP
Can be
90dB! fixed signal
level fed to A/D
desired
signal
desired
Freq (Hz) signal
• Silicon area
• Trimming
• Calibration
• Test time
• Off-chip components
→ cost