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HW2

The document discusses various statistical tests related to burning times of chemical flares, impurity percentages before and after the installation of a filtering device, photoresist thickness at different baking temperatures, and deflection temperatures of ABS plastic pipe formulations. It includes hypothesis testing for equal variances and means, along with P-value calculations for different scenarios. The tests are conducted at a significance level of α = 0.05.

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anahorner48
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9 views6 pages

HW2

The document discusses various statistical tests related to burning times of chemical flares, impurity percentages before and after the installation of a filtering device, photoresist thickness at different baking temperatures, and deflection temperatures of ABS plastic pipe formulations. It includes hypothesis testing for equal variances and means, along with P-value calculations for different scenarios. The tests are conducted at a significance level of α = 0.05.

Uploaded by

anahorner48
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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The following are the burning times (in minutes) of chemical flares of two different formulations.

The design engineers are


interested in both the mean and variance of the burning times.

(a) Test the hypothesis that the two variances are equal. Use 𝛼 = 0.05.
(b) Using the results of (a), test the hypothesis that the mean burning times are equal. Use 𝛼 = 0.05. What is the P-value for
this test?

Comparison of different formulations and their respective


burning times
A new filtering device is installed in a chemical unit. Before its installation, a random sample yielded the following information about
the percentage of impurity: y1 = 12.5, S1 = 101.17, and n1 = 8. After installation, a random sample yielded y2 = 10.2, S2 =
94.73, n2 = 9.

(a) Can you conclude that the two variances are equal? Use 𝛼 = 0.05.
(b) Has the filtering device reduced the percentage of impurity significantly? Use 𝛼 = 0.05.

Photoresist is a light-sensitive material applied to semiconductor wafers so that the circuit pattern can be imaged on to
the wafer. After application, the coated wafers are baked to remove the solvent in the photoresist mixture and to harden
the resist. Here are measurements of photoresist thickness (in kA) for eight wafers baked at two different tem-
peratures. Assume that all of the runs were made in random order.

(a) Is there evidence to support the claim that the higher baking temperature results in wafers with a lower mean
photoresist thickness? Use 𝛼 = 0.05.
(b) What is the P-value for the test conducted in part (a)?
Comparison of temperatures of the two baked wafers

The deflection temperature under load for two different formulations of ABS plastic pipe is being studied. Two
samples of 12 observations each are prepared using each formulation and the deflection temperatures (in F) are reported
below:

(b) Do the data support the claim that the mean deflection temperature under load for formulation 1 exceeds that of formulation 2?
Use 𝛼 = 0.05.
(c) What is the P-value for the test in part (a)?
In semiconductor manufacturing, wet chemical etching is often used to remove silicon from the backs of wafers prior to

(a) Do the data indicate that the claim that both solutions have the same mean etch rate is valid? Use 𝛼 = 0.05 and assume
equal variances.

Comparison of different solutions evaluated


Suppose that we are testing H ∶ 𝜇 = 𝜇 versus H ∶𝜇 ≠𝜇 where the two sample sizes are n =n =12.
Both sample variances are unknown but assumed equal. Find bounds on the P-value for the following observed values of
the test statistic.

(a) t0=2.30 (b) t0 =3.41 (c) t0 =1.95 (d) t0 =−2.45


Suppose that we are testing H ∶ 𝜇1 = 𝜇2 versus H ∶ 𝜇1 >𝜇2 where the two sample sizes are n =n =10. Both sample
variances are unknown but assumed equal. Find bounds on the P-value for the following observed values of the test
statistic.
(a) 0.10 (b) 0.05 (c) 0.025 (d) 0.01 (e) none of the above.

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