USB 2.

0 Compliance Testing with

Agilent Infiniium
Application Note 1400

By Rebecca Suemnicht, Sales Development Engineer, Agilent Technologies

Tokuyoshi RIN, Applications Engineer, Agilent Technologies Japan

Table of Contents Who Should Read This issue for USB. Amazingly, it
Application Note? allows devices to exist up to
Introduction . . . . . . . . . . . . . . . . . . . . . . . . 1
30 meters away from the host,
Basic Specifications . . . . . . . . . . . . . . . . 2 Digital designers and developers and allows up to 127 devices to
Full/Low-Speed Test Suite. . . . . . . . . . . 3 working towards USB 2.0 be connected to a single host and
Full/Low-Speed Test Fixture . . . . . . . . . 4 compliance. port at once through a series of
USB hubs. The ability to talk
Signal Quality Test . . . . . . . . . . . . . . . . . . 5
Introduction directly to devices or to devices
In-Rush Current Check . . . . . . . . . . . . . . 7 through hubs allows for this
Droop and Drop Testing . . . . . . . . . . . . . 8 Universal Serial Bus (USB) burst incredible expansion capability.
Back-Drive Voltage Test . . . . . . . . . . . . . 8 on the scene in 1995 delivering a
revolutionary way to connect USB 1.1 worked best for slower
Hi-Speed Electrical Test Suite . . . . . . . . 9
personal computers and devices. human-interface devices such
Hi-Speed Electrical Test Tool . . . . . . . . 10 Allowing hot-plug capability, as mice and keyboards, with
Hi-Speed Test Fixture . . . . . . . . . . . . . . 10 USB has introduced ease-of-use low-speed operating at 1.5 Mb/s
Hi-Speed Signal Quality Test . . . . . . . . 11 to the PC device market by and full-speed operating at
providing a simple connection 12 Mb/s. Higher-bandwidth
Monotonicity . . . . . . . . . . . . . . . . . . . . . . 11
scheme and protocol for a wide devices were severely limited
Packet Parameters Test . . . . . . . . . . . . 12 variety of computer devices, by these relatively slow data
Receiver Sensitivity . . . . . . . . . . . . . . . . 12 ranging from keyboards and transfer rates. As a result, the
CHIRP Timing Test. . . . . . . . . . . . . . . . . 13 mice to high-bandwidth devices USB-Implementers Forum
such as printers, scanners, and (USB-IF) introduced the fully
Impedance Measurements. . . . . . . . . . 14
PC cameras. backward compatible USB 2.0 in
Summary . . . . . . . . . . . . . . . . . . . . . . . . . 15 May 2000, which resulted in a
Support, Services, and Assistance. . . 16 USB has now successfully 40-fold increase in data
replaced aging serial and parallel throughput for hi-speed over
ports as the connection of choice full-speed. USB 2.0 operates at
for both device manufacturers 480 Mb/s—ideal for devices such
and end users. Whereas cable as video-conferencing cameras
length and device expansion were and high-resolution printers. For
limitations with older serial and more information, see the official
parallel connections, they are no USB website at www.usb.org.
Basic Specifications

As listed previously, USB 2.0 Data Rates Rise Times

comprises three different data
Low-speed (LS) 1.5 Mb/s 75 ns – 300 ns
transfer rates—low-speed,
full-speed, and hi-speed. Full-speed (FS) 12 Mb/s 4 ns – 20 ns

Four wires compose the cable Hi-speed (HS) 480 Mb/s 500 ps
system—VBUS, D+, D-, and
ground. Devices may be either
Table 1. USB 2.0 speed specifications.
bus-powered, with 500 mA
maximum bus current withdraw,
or self-powered, meaning they
have their own power supply.
D- and D+ is a differential signal compliance tests: framework test, parameters. Older methods of
pair that serves as the primary interoperability test, and electri- compliance testing included first
information carrier between the cal test. This document only capturing the signals on a scope,
host, hubs, and devices. USB 2.0 discusses Infiniium’s electrical then moving the data to a PC so it
supports three different types of test solution. could be cropped, stored in a .tsv
data transfer: interrupt, bulk, or format, and finally analyzed in
isochronous. Control packets Low, full, and hi-speed USB MATLAB®. The Agilent Infiniium
containing commands or query require compliance with the USB Test Option is the first scope
parameters may also be sent by signal quality, in-rush current solution in the industry that uti-
the host. check, droop/drop and back lizes the official USB-IF MATLAB
drive voltage electrical tests. script. As the result, it provides
The flexibility inherent in USB is Hi-speed requires compliance an affordable, trustworthy,
a direct result of the specifica- with an additional suite of single-box, compliance solution—
tions above and the stringent electrical tests—hi-speed signal allowing you to say, as did one of
regulations and compliance quality, receiver sensitivity, our customers, “I know I’m going
testing mandated by the USB-IF. CHIRP timing, and packet to pass!”
There are three kinds of

USB Test Test Type Report Output

Signal integrity FSFE, LSFE, LSNE, HSFE, HSNE Overall result, Signal eye, EOP width measurement, Signaling rate measurement
Crossover voltage measurement, Jitter measurement, Signal data diagram, Eye diagram

Inrush Current Hot Plug, Agilent Config, Agilent Overall result, Inrush current measurement, Inrush current graph
Resume, LP Config, LP Resume

Drop/Droop System, Self Powered Hub, Overall Result, Voltage no load measurement, Voltage loaded measurement
Bus Powered Hub Drop measurement, Droop measurement

Table 2. Tests included with Agilent USB test option E2645A, N2854A, N2855A, and E2683A.

2
Full/Low-Speed Test Suite

Agilent test equipment has been

approved by the USB-IF. Table 3
shows the equipment required to
perform the Full/Low-speed
Electrical Test.

Figure 1. Agilent Infiniium at Plugfest.

Low/Full Speed Recommended Equipment (Using Agilent 54815A, 25A, 31B/D, 32B/D, 35A, 45A/B, 46A/B, 53A, 54A, 55A Scopes)

Part # Description Quantity

USB 2.0 test option. Includes one SQiDD test fixture for low/full speed USB 2.0 testing 1
E2645A [1] for 54815A, 54825A, 54835A, 54845A, 54846A
N2854A for 54845B, 54846B
N2855A for 54830B/D Series with software rev. A.02.30 or below
E2683A for 54830B/D Series, 54833A and 54850A Series with software A.03.10 or higher

E2646A Additional SQiDD (Signal Quality Inrush, Drop/Droop) test fixture for low/full speed USB 2.0 testing –
(Note that one E2646A is included in the USB test option)

54832B/32D Option 004 Adds (four) 1165A passive probes for new purchase of 54832B/32D scopes only 1

54846B Option 004 Adds (four) 1161A passive probes for new purchase of 54846B scopes only 1

E2697A High-impedance adapter with one 10073C passive probe for 54853A/54A/55A only 3

1147A 50 MHz current probe (for 54831B/D, 32B/D, 45B, 46B only) 1

N2774A & N2775A 50 MHz current probe and power supply (for 54853A/54A/55A) 1

HUB Intel Customer HUB (CHUB) 5

Adjacent Device Intel Deluxe PC Camera (for full-speed), USB mouse (for low-speed) 1

Multimeter 34401A 1

USB Host System Hardware Configuration: 815EEA2 motherboard, Pentium III 700 MHz, 1
256 MB ram, 40 GB HD, CD (CD-RW), FD, IOGear (or ATEN) USB 2.0 PCI card (5-port)
Software Configuration: Windows 2000 or Windows XP

USB Cable 5 meter cable 6

1 meter cable 1

USB-IF Tool on Host System [2] USBCheck or USBCV program from USB-IF, Inc. 1

[1] To use the E2645A option, you must have the following minimum Infiniium configuration: 300 MHz CPU, 64 MB RAM, Windows 98, Version A.04.20 or greater of the system
software, LS-120 120 MB SuperDisk. To determine if your Infiniium meets these configuration criteria, look at the back of your unit. If the serial number of your unit starts with
US3919 or higher, you meet these requirements. Or if there is a product tag with “E2633A,” “E2633-68703,” or “E2633-68701,” you meet the requirements. If you do not meet the
minimum requirements, you must order an Infiniium oscilloscope performance upgrade in addition to the E2645A. Please contact your Agilent representative for selecting the
right performance upgrade for your Infiniium oscilloscope.
[2] USB Check is supported on Windows 2000 only and is being made obsolete by USBCV. When performing USBCV to test full/low device, USB 2.0 hi-speed HUB is also needed.

Table 3. Recommended test equipment.

3
Full/Low-Speed Test Fixture

The basic USB 2.0 electrical test SQiDD board that can be ordered
suite includes signal quality, as option B30 with the purchase
in-rush current check, and of a new Infiniium or separately
droop/drop tests. A SQiDD as part number E2646A. The
(Signal Quality inrush Droop USB-IF exclusively uses the
Drop) fixture must be used for Agilent SQiDD board for official
these tests. Agilent provides a compliance testing.

‘B’ Socket
‘A’ Socket ‘A’ Socket

Wire loop Wire loop

Switch

Switch

‘A’ Socket
‘B’ Socket ‘B’ Socket

Figure 2. Agilent SQiDD board.

4
Signal Quality Test

Using an oscilloscope to measure Signal quality testing can be

transceiver characteristics, the performed for either upstream
signal quality test looks at: data or downstream data. In the
case of upstream testing, signals
• Signal eye travelling from the device to the
host are captured and analyzed.
• End of Packet (EOP) width Downstream testing performs just
the opposite, capturing signals
• Signaling Rate travelling from the host towards
the device or terminating hub.
• Rise/Fall Times Figure 3 shows a captured down-
stream packet on the Infiniium
• Cross-over Voltage Range with the USB Test Option.

• Consecutive Jitter

• Paired JK Jitter

• Paired KJ Jitter

Figure 3. Captured downstream packet.

5
Signal Quality Test (continued)

Once the USB test is launched,

other conditions must also be set
in the software. For signal quality
tests, these additional conditions
include tier and near end/far end.
The tier refers to the distance
between the device and the host
computer. If the device is con-
nected directly to the host com-
puter, the tier equals 1. If the
device is separated from the host
computer by 3 hubs, the tier
equals 4. Compliance testing
mandates that testing occur at a
minimum tier of 6; therefore,
Agilent recommends that tests
always be performed with a tier Figure 4. Infiniium USB test menu.
of 6. Test results may be stored
in a data file on the Infiniium’s
C: drive, or may also be stored to
a floppy disk.

Infiniium displays all test results

in an html format, including the
eye diagram.

Figure 5. Infiniium signal quality test results.

Figure 6. Infiniium-generated eye diagram for USB test.

6
In-Rush Current Check

The nature of electronic devices

dictates that a surge of current
will occur, followed by a lesser
steady-state current level, when
power is applied to a device. The
hot-pluggable nature of USB
requires that the transient peak
current level be tested to ensure
that it remains within the limits
for the device. If the current does
not remain within its limits, not
only can it cause damage to the
device, but it can also take power
from other devices connected to
the same port.

The USB 2.0 specification out-

lines a current limit of 50 uC.

Figure 7. In-rush current spike.

7
Droop and Drop Testing

Droop and drop testing proce- Bus-Powered Hubs The droop test for bus-powered
dures vary based on whether hubs again uses the 100 mA-load
the device is self-powered or Drop tests for bus-powered hubs board. This load board is con-
bus powered. use 100 mA load boards instead nected to all but one port on the
of the 500 mA load boards used bus-powered device. The SQiDD
Hosts and Self-Powered Hubs in the self-powered hub proce- board is then attached to the
dure. These 100 mA boards are unloaded port. Once again,
Drop testing measures the voltage connected to all downstream markers are used to bracket the
drop across each load board ports. The VBUS voltage is then area between the lowest point
attached to the SQiDD board. To measured at the hub upstream on the captured data and the
get a good indication of voltage port and at each downstream steady-state voltage. The
drop, the test is performed under port. The lowest measured Infiniium then uses the drop
two conditions—no load and load. downstream value is used for test results and the bracketed
Under no load testing, all down- the droop test. data to run the droop test.
stream ports remain open, while
the VBUS voltage test points on
the SQiDD board are probed.
Load testing tests the VBUS volt-
age test points with 500 mA loads
applied to all downstream ports.
The lowest measured loaded
value should be used for the
droop test.

Droop testing involves calculating

Droop, the voltage on VBUS that
occurs when all but one port are
under 500 mA loads. The
unloaded port is then connected
to the SQiDD board. Once the
data is captured on the display,
markers are used to bracket the
area between the lowest point
and steady-state voltage point of
VBUS. Infiniium then uses the
bracketed data to perform the
droop test.

Figure 8. Droop setup for hosts and self-powered hubs.

Back-Drive Voltage Test

The back-drive voltage test is motherboard failure. This test
performed to ensure that a device measures the DC voltages of
only draws current from VBUS on VBUS, D+, and D- before and after
its upstream facing port at all device enumeration. The voltages
times. If a device supplies are then recorded on the back-
current at this port, a number drive voltage fixture. Any voltage
of consequences can occur, exceeding 400 mV is considered
including hub enumeration a failure.
failure, PC boot failure, and

8
Hi-Speed Electrical Test Suite

An additional suite of tests was include hi-speed signal quality, The following test equipment is
added to the USB 2.0 compliance receiver sensitivity, CHIRP required to perform the hi-speed
procedure to accommodate the timing, and packet parameter. electrical test.
new hi-speed mode. These tests

Hi-Speed Recommended Equipment (Using Agilent 54846A/B, 53A, 54A, 55A)

Part # Description Quantity

USB 2.0 test option. Includes one SQiDD test fixture for low/full speed USB 2.0 testing 1
E2645A [1] for 54846A
N2854A for 54846B
E2683A for 54853A/54A/55A

E2646A Additional SQiDD (Signal Quality Inrush, Drop/Droop) test fixture for low/full speed USB 2.0 testing –
(Note that one E2646A is included in the USB test option)

E2649A Hi-speed USB 2.0 test fixture set consists of: 1

E2645-66501 Device Signal Quality test fixture E2645-66505 Host TDR test fixture
E2645-66502 Host Signal Quality test fixture E2645-66506 Host Disconnect test fixture
E2645-66503 Receiver Sensitivity test fixture 0950-2546 Power supply
E2645-66504 Device TDR test fixture

54846B Option 004 Adds (four) 1161A passive probes to the 54846B oscilloscope 1

E2697A High-impedance adapter with one 10073C passive probe for 54853A/54A/55A only 3
(1156A can be used in lieu of E2697A)

1131A/32A/34A InfiniiMax probe amplifier (qty 2 required for hub testing) 1

E2669A Differential connectivity kit for InfiniiMax probes 1

01131-68703 Additional set of 10 damped adapters for use with InfiniiMax probes –
(Note that four damped adapters are included with the E2649A and the E2699A)

Digital Signal Generator [2] 81130A Pulse/Pattern Generator 1

1 MB SRAM Memory Card (#UFH) 1
81132A 660 MHz option 2
8493C #006 6 dB attenuator 2
male SMA cable 2

TDR [3] 86100A/B 1

54745A 1
male SMA cable 2

Multimeter 34401A 1

Hi-Speed USB Test Bed Computer Hardware configuration: 815EEA2 motherboard, Pentium III 700 MHz, 1
256 MB ram, 40 GB HD, CD (CD-RW), FD, IOGear (or ATEN) USB 2.0 PCI card (5-port)
Software configuration: Windows 2000 or Windows XP

USB Cable 1.5 meter cable 1

1 meter cable 1

USB-IF Tool on Host System USB Hi-speed Electrical Test Tool from USB-IF, Inc. 1

[1] To use the E2645A option, you must have the following minimum Infiniium configuration: 300 MHz CPU, 64 MB RAM, Windows 98, Version A.04.20 or greater of the system
software, LS-120 120 MB SuperDisk. To determine if your Infiniium meets these configuration criteria, look at the back of your unit. If the serial number of your unit starts with
US3919 or higher, you meet these requirements. Or if there is a product tag with “E2633A,” “E2633-68703,” or “E2633-68701,” you meet the requirements. If you do not meet the
minimum requirements, you must order an Infiniium oscilloscope performance upgrade in addition to the E2645A. Please contact your Agilent representative for selecting the
right performance upgrade for your Infiniium oscilloscope.
[2] Digital Signal Generator is required when testing receiver sensitivity test for device/hub.
[3] TDR test was deleted from Hi-speed Test Procedure (Rev. 1.0), but it is still recommended to test when at development stage.

Table 4. Recommended test equipment.

9
Hi-Speed Electrical Test Tool

On the hi-speed USB Test Bed

Computer, the USB hi-speed
Electrical Test Tool is required.

Figure 9. USB-IF hi-speed electrical test tool.

Hi-Speed Test Fixture

The hi-speed signal quality test

utilizes the hi-speed signal quality
board, as shown in Figure 10.

The nomenclatures of the test

points differ between the Agilent
hi-speed test fixture and the
Intel test fixture. The official
USB test procedure is written
with reference to Agilent’s test
fixtures. Refer to Table 5, the
cross-reference chart, when
using Intel’s test fixture.

Figure 10. Hi-speed signal quality boards (Agilent fixture and

Intel fixture—device signal quality test).

Intel’s Fixtures Description of the test points Agilent Fixtures

J7 Test Point TP2

J8 Power Port J5

J10 Ground TP5

J11 Ground TP5

SMA1 D- line SMA2

SMA2 D+ line SMA1

Table 5. Cross-reference chart.

10
Hi-Speed Signal Quality Test

Invoke the Hi-speed Electrical

Test Tool software on Electrical
Test bed Computer and select
TEST_PACKET to perform the
signal quality test. Figure 11
shows a hi-speed test packet
captured on Infiniium.

Prior to testing, it must be deter-

mined if the device incorporates
a captive cable, or if it contains a
series B or mini-B connector.
During upstream tests, captive
cables require that tests be run at
the far end. B-connector cables
require that tests be run at the
near end. Figure 12 shows a Figure 11. Hi-speed test packet.
hi-speed eye pattern result dis-
played on Infiniium.

Monotonicity

Monotonicity tests if a transmit-

ted signal increases or decreases
in amplitude without reversal in
the opposite direction. The
monotonicity characteristic of a
signal is determined using the
hi-speed signal quality eye tem-
plate (Figure 12). There is no
independent monotonicity test
mandated by the USB-IF.

Figure 12. Hi-speed signal quality eye diagram.

11
Packet Parameters Test

Another test using the hi-speed

signal quality board tests the
device packet parameters. The
hi-speed signal quality test board
allows for better reception of the
packets coming from the device.
This test measures parameters
such as sync field length, end of
packet (EOP) width, and inter-
packet gap.

Figure 13. Device inter-packet gap.

Receiver Sensitivity

The receiver sensitivity tests

verify sensitivity of the receivers
of a device on both the upstream
and downstream data ports in Data generator packet Device response
noisy environments. The Agilent generator packet
81130A Pulse/Pattern Generator
is used to emulate IN commands
from the port to the device
address 1. IN commands are sent
from the computer to the device
under test, which should be in an
unsquelched mode. The noise is
represented by a pre-set level,
whereby a signal meeting and
exceeding this level responds to
the IN command with an NAK. All
packets from the data generator Figure 14. Receiver sensitivity test.
must be NAK’d by the port under
test. The amplitude of the data
generator packets is then reduced NAK packets are not intermittent. should be NAK’d. When the
in 20 mV increments as the test This indicates the points of device receives IN packets with
is run. The amplitude of these minimum receiver sensitivity a signal amplitude below
packets should be reduced levels before squelch. 100 mV, all packets should be
until the NAK packets become squelched. A waiver is granted
infrequent. The data generator When the device receives IN for squelch at +/- 50 mV for
amplitude is then immediately packets with a signal amplitude each level.
increased to the point where the in excess of 150 mV, all packets

12
CHIRP Timing Test

The CHIRP test utilizes the

hi-speed signal quality test
fixture to measure timing and
voltage on both upstream and
downstream ports. The device
is hot-plugged to the port and
is immediately enumerated to Device’s chip latency
Device hi-speed
capture the CHIRP handshake. (2.5 µs <-> 3 ms)
termination ON
Within the handshake, the
CHIRP-K duration is measured to
verify that it is within the 1.0 ms CHIRP K
and 7.0 ms allowable latency. (1 ms <-> 7 ms)
After the CHIRP K-J, K-J, K-J
sequence, the device responds by
turning on its hi-speed termina-
tions. A drop of amplitude from
800 mV nominal to 400 mV Figure 15. CHIRP test.
nominal occurs. The time
between the beginning of the
last J in the CHIRP K-J, K-J, K-J
sequence and the time when
the device turn on initiates its
hi-speed terminations must be
measured to verify that it is less
than or equal to 500 µs.

In addition to measuring the

time between the last J in CHIRP
and the initiation of hi-speed
termination, the CHIRP
test also measures device
suspend/resume/reset timing as
well as the K and J amplitudes.

Figure 16. Time between last J in CHIRP and hi-speed

termination initiation.

13
Impedance Measurements

In this test, differential time

domain reflectometer (TDR)
measurements are taken to
measure the impedance of the
hi-speed signaling path and
active terminations of the device Termination resistor
under test. The TDR measure- USB connector

ments are compared with the

USB-IF specification require-
ments. The device under test is
powered, placed in SE0-NAK
mode, and isolated from the
system. D+ and D- are measured
to verify that they are 0 V ±10 mV.
A 400 ps edge is then driven into
the device. The resulting wave-
form indicates whether or not Figure 17. TDR measurement.
the termination impedance and
the through impedance meet the
requirements. The TDR measure-
ment is not required for compli-
ance testing. A PASS signal
quality test will suffice for the
TDR measurement.

14
Summary

Agilent provides a comprehensive, Needless to say only the minimum

easy-to-use solution for USB com- number of tests required was
pliance testing. The compliance ever actually performed.
testing that once took days now
takes 5 minutes. The individualized “In a nutshell, this product has
test boards provide flexibility and revolutionized the way in which
affordability for the laboratory we look at USB. We now have a
choosing to test facets of the USB designated test system that is
specification simultaneously. reliable and easy to use and fast.
The main result is that we can
In conclusion, the Agilent now provide real-time feedback,
Infiniium USB Test Option has and the amount of testing we
been described this way: perform is probably up 30-fold
“The term ‘God Send’ comes to or more. And as you may have
mind. Before the arrival of this guessed, the additional testing
scope, a USB test was something has turned up a myriad of inter-
to be avoided! It often required esting opportunities for future
half a day to set up the test and improvements. Just for fun we
an additional 30 minutes to have even started looking at our
massage the numbers into an competitor’s products!”
acceptable MATLAB format.
Infiniium Oscilloscope Operating System Software Revision USB Test Option Tests

5481xA, 5482xA Windows® 98 A.04.20 or higher E2645A Low/Full Speed

5483xB/D Windows 98 A.01.10 or higher N2855A Low/Full Speed

5483xB/D Windows XP Pro A.03.10 or higher E2683A Low/Full Speed

54845A Windows 98 A.04.50 or higher E2645A Low/Full Speed

54846A Windows 98 A.04.50 or higher E2645A Low/Full/Hi Speed

54845B Windows 98 A.04.50 or higher N2854A Low/Full Speed

54846B Windows 98 A.04.50 or higher N2854A Low/Full/Hi Speed

5485xA Windows XP Pro A.03.10 or higher E2683A Low/Full/Hi Speed

Table 6. Infiniium USB Test Option

Additional Resources

USB 2.0 Test Tool available at URL://www.usb.org/developers/tools.html.

1. USBCV
2. USBCheck
3. USB Hi-Speed Electrical Test Tool Kit

Official USB 2.0 Test Procedures may be obtained at URL: //www.usb.org/developers/docs.html

1. Host/Hub/Device Hi-Speed Electrical Test Procedures for Agilent Infiniium 54853A, 54854A, 54855A
Revision 1.2, August 6, 2003
2. Host/Hub/Device Hi-Speed Electrical Test Procedures for Agilent Infiniium 54846B and 1131A
Revision 1.1, August 23, 2003
3. Hi-Speed Electrical Test Procedures for Agilent Test Equipment
Revision 1.0, February 5, 2002

MATLAB® is a U.S. registered trademark of Math Works, Inc.

Windows® is a U.S. registered trademark of Microsoft Corporation.
15
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