HW05
HW05
Kaustav Banerjee
(a) Keep the Wp/Wn ratio of the Pseudo-NMOS stage 2:1, find the delay for a low-to-high transition at the
output, tpLH, in terms of Cunit and Runit.
(b) Use Cunit = 2 fF, find the optimal S that minimize the low-to-high delay by taking derivative of your
result in part (a).
(c) Use tp0=0.69*Runit*Cunit=20ps, calculate the minimum delay for low-to-high transition at the output, tpLH,
for a given Runit=2kΩ.
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ECE 122A, Fall 2021, Homework 05 Prof. Kaustav Banerjee
(d) Suppose that the probability for input being 0V, α0=50%; the probability for input being 2.5V, α1=50%.
Ignore short circuit current, what is the average power dissipated by this circuit? Use VDD=2.5V,
fclk=3GHz. Use Cunit=2fF, Runit=2kΩ.
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ECE 122A, Fall 2021, Homework 05 Prof. Kaustav Banerjee
1
W
3fF X
Y 2
Z
25fF
1
W
3fF X
Y 2
Z
25fF
(B) (5 PTS) As discussed in the course, the carrier mobility decreases when temperature increases. Assume
temperature only affects carrier mobility. Intuitively, higher temperature makes it more difficult for a circuit
stage to drive the next stage, because the driving current decreases. Hence, we may define a temperature
effort (T for path temperature effort, and t for single stage temperature effort) to describe the effects of
temperature-induced current decrease in a combinational logic block.
The following figure shows the relation between fan-out (f) and delay of a logic gate. The logical effort and
intrinsic delay of this gate are g0 and p0. What is the fan-out to delay curve of a gate of logical effort g1
and intrinsic delay p1 (g1 > g0, p1 > p0)? If temperature increases, how will the fan-out to delay relation
change? Show your answers in the same figure. (You need to draw the three curves in the same figure)
From the above analysis, derive the temperature effort t of a logical gate, with respect to the change of
mobility.
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ECE 122A, Fall 2021, Homework 05 Prof. Kaustav Banerjee
Delay
g0, p0
Fanout
(C) (10 PTS) Again, a unit size inverter has the ratio Wp:Wn = 3:1, and operates at temperature T0, when
the mobility of electrons and holes is μn0 and μp0. Assume temperature T1 causes the mobility to decrease
by 10% (μn/μn0 = μp/μp0 = 0.9), and temperature T2 causes the mobility to decrease by 20% (μn/μn0 = μp/μp0
= 0.8). Assume temperature only affects the mobility of a device.
Now each stage is set to be at temperature either T1 or T2, as shown in the figure below. Find the input
capacitances necessary for each of the gates {W, X, Y, Z} in the path in order to minimize path delay.
Assume the path delay is minimized when each stage bears the same effort.
T1 T1 T2
T2
1
W
3fF X
Y 2
Z
25fF