Digital Integrated Circuit 01 Welcome&Intro
Digital Integrated Circuit 01 Welcome&Intro
Yoonmyung Lee
[email protected]
College of Information & Communication Engineering
Sungkyunkwan University
Kang Ch. 1.9
Rabaey Ch. 1.3
Integrated Circuits & Systems Design Lab.
Course Information
PBL (Project-Based Learning)
온라인 사전제작 + 오프라인 수업 운영 (자율 시간 배분)
오프라인 수업 빈도: 평균 1주일에 1번 목표
매 주 직전 일요일까지 온라인 강의 자료 및 해당 주차 온/오프 진행 계획 공지
(월/수 수업시간은 반드시 일정을 비워야 합니다)
온라인 수업
이론 수업: online 위주로 진행
월요일 수업분 화요일 자정까지 수강 완료
수요일 수업분 목요일 자정까지 수강 완료
오프라인 수업
이론 수업 질의 응답 / 사례 분석
CAD 과제 관련 tutorial / 질의응답
Teaching Assistants
박동현, 김정호, 이경준 (연락처 iCampus 참조)
Office: 반도체관 400417
i-Campus
Official notice and other communication
Lecture notes will be uploaded
Prerequisites
Electronic circuits
Basic MOS device physics, models
Basic Boolean algebra, Logic circuits
Netlist and HSPICE simulation environment
Exams
Midterm & Final
~1.5hr / ~2hr exam
Handwritten Summary Note Allowed (1pg per exam)
Cumulative
Questions
Students are encouraged to ask questions
No need to be shy or worry too much about other students
It is instructor’s role to manage time/pace for questions/lecture
3 11 Sequential Logic
(9/16, 9/18) Wire Models
추석연휴
(11/11, 11/13) Adder
4 12
(9/23, 9/25) CMOS Inverter Adder
(11/18, 11/20)
건학기념일
5 13 Timing
CMOS Inverter
(9/30, 10/2) (11/25, 11/27) Design Methodology
6 14 Multiplier & Shifter
(10/7, 10/9) Combinational Logic 1
한글날
(12/2, 12/4) Memory
7 Combinational Logic 1 15 Memory
(10/14, 10/16) (12/9, 12/11)
Integration Levels
SSI: 10 gates
MSI: 1000 gates
LSI: 10,000 gates
VLSI: > 10k gates
[Moore65]
Electronics Magazine
Source: http://cpudb.stanford.edu/
22 Digital Integrated Circuits
Performance Trend
Processor performance is keep improving
Despite the degradation on improvement rate
+21%
per year
+64%
per year
Source: http://cpudb.stanford.edu/
24 Digital Integrated Circuits
Microprocessor Trends
Putting the trends altogether shows better picture…
Nuclear Reactor →
←Hot Plate
Source: http://cpudb.stanford.edu/
26 Digital Integrated Circuits
Introduction:
Metrics of ICs
Ideal
With Noise
Cost
Reliability
Scalability
Power dissipation
Recurrent costs
Silicon fabrication
Packaging, test
proportional to volume
proportional to chip area
Single die
Wafer
From http://www.amd.com
defects per unit area die area
die yield 1
is approximately 3
v(t) V DD
i(t)
M
N
Fan-out N Fan-in M
tp = ½ (tpHL + tpLH)
36 Digital Integrated Circuits
Power Dissipation
Instantaneous power:
p(t) = v(t)i(t) = Vsupplyi(t)
Peak power:
Ppeak = Vsupplyipeak
Average power:
1 t T Vsupply t T
Pave p(t )dt isupply t dt
T t T t