OPTICAL BACKSCATTER

REFLECTOMETRY (OBR) ˗
OVERVIEW AND APPLICATIONS

INTRODUCTION
REFLECTANCE AND RETURN LOSS
MEASURING RETURN LOSS
OPTICAL TIME-DOMAIN REFLECTOMETERS (OTDR)
OPTICAL LOW-COHERENCE REFLECTOMETRY (OLCR)
OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY (OFDR)
OPTICAL BACKSCATTER REFLECTOMETRY (OBR)
ULTRA-HIGH SPATIAL RESOLUTION AND NO DEAD ZONES
ADDITIONAL MEASUREMENT CAPABILITIES OF OBR
APPLICATIONS OF OBR
CHARACTERIZATION OF SHORT FIBER NETWORKS
COMPONENT AND WAVEGUIDE CHARACTERIZATION
LATENCY AND LENGTH MEASUREMENT
LUNA OBR REFLECTOMETERS
LEARN MORE
Optical communications technology is rapidly
evolving to meet the ever-growing demand for
ubiquitous connectivity and higher data rates. As
signaling rates increase and modulation schemes
become more complex, guaranteeing a high-fidelity
optical transmission medium is becoming even more
critical. Additionally, modern networks are relying
more on photonic integrated circuits (PICs) based on
silicon photonics or other developing technologies,
introducing additional variables into the design and
deployment of robust high bandwidth optical
systems. Measurement and full characterization of
loss along the light path is a fundamental tool in the
design and optimization of these components and
fiber optic networks.
source, and generally compromise the performance
Different types of reflectometers are available to of the optical component or system.
measure return loss, insertion loss, and event
location for different types of optical systems. While The two primary phenomena that cause return loss
optical time domain reflectometers (OTDRs) are a are Fresnel back reflection and Rayleigh backscatter
standard tsool for medium to long span fiber optic (Figure 1). Fresnel back reflection occurs when light
networks, optical backscatter reflectometry (OBR) transitions through different media with different
offers a unique combination of ultra-high spatial refractive indices (ni). In an optical fiber, for example,
resolution and sensitivity that make it a very Fresnel reflections are caused by air gaps, cracks in
important tool for shorter fiber spans, modern the core, misalignment of fiber cores in splices,
photonic integrated circuits (PICs) and silicon macro bends, etc. Rayleigh backscattering, on the
photonics. other hand, is an intrinsic property of optical media
and is caused by the natural impurities and
imperfections in the optical fiber core or media.
Rayleigh backscattering occurs along the entire
length of the optical fiber or light path.
Whether characterizing a miniaturized PIC or
troubleshooting a long-haul fiber optic span,
understanding and quantifying the loss along the
optical path is a very important step when optimizing
performance or resolving transmission problems.

Return loss (RL) is defined as the ratio of light

reflected back from a device under test (PR) to the
light launched into that device (Pin). RL is typically
expressed as a negative number in decibels (dB).
𝑃𝑅
𝑅𝐿 = 10 log ( )
𝑃𝑖𝑛

High levels of optical return loss can lower signal-to-

noise ratios, contribute to higher bit-error rates
(BER), interfere with the operation of the light

lunainc.com | PAGE 1
Reflectometry is a general method of measuring The OTDR is the most familiar and popular
return loss and consists of launching a probe signal instrument used for reflectometry measurements of
into the device or network, measuring the reflected fiber optic networks. OTDRs work by launching
light, and calculating the ratio of the two (Figure 2). optical pulses into the optical fiber and measuring
The measurement may either quantify the total the travel time and strength of the reflected and
amount of light reflected or map the loss along the backscattered light. These measurements are used
length of the optical path. Measuring the aggregate to create a trace or profile of the returned signal
or total amount of optical return loss (ORL) in a fiber versus length. An example OTDR trace is shown in
network or optical component is Figure 3.
relatively straightforward and
consists of injecting a known
level of light into the device or
network under test and
measuring the reflection with an
optical power meter. A popular
tool for this type of measurement is the optical The dynamic range of the OTDR determines the
continuous-wave reflectometer (OCWR). While total length of the network link that can be traced. It
measuring the total end-to-end optical return loss is is common for OTDRs to have measurement ranges
often useful, it gives no indication or insight into reaching hundreds of kilometers, making them
where the attenuation occurs or where a problem useful for long-haul fiber optic links. The spatial
may be in the optical system. resolution of the OTDR, defined as the smallest
distance over which one can resolve two distinct
With a time-domain or frequency-domain based reflection events, is generally determined by the
reflectometer, however, the return loss can be optical pulse width. A shorter pulse width enables
measured along the length of the device or network higher resolution (more closely spaced points) but
under test. There are three established technologies limits the dynamic range and distance range of the
available for spatially-resolved reflectometry - optical OTDR. Typical OTDRs have the ability to reduce the
time domain reflectometry, optical low-coherence pulse width enough to resolve adjacent reflection
reflectometry, and optical frequency-domain events in the range of 1 or 2 meters.
reflectometry.
The spatial resolution of an OTDR is also limited by
its dead zone. An OTDR dead zone is the distance
after a reflection that the OTDR cannot detect or
measure a second reflection event. The OTDR dead
zone is generally determined by the pulse width as
well as the recovery time of the detector within the
OTDR. The dead zones are most prevalent at the
connector to the OTDR and any other strong
reflectors.

Standard OTDRs are well suited for relatively long

network spans, reaching hundreds of kilometers or
more. For shorter networks and when higher
resolution is needed, high-resolution OTDRs employ
techniques to decrease the dead zone and reduce
the spatial resolution to tens of centimeters.

lunainc.com | PAGE 2
Optical low-coherence reflectometry (OLCR) is an
optical measurement technology that can deliver
very precise detection. OLCR is an interferometer-
based measurement that uses a wideband low-
coherent light source and a tunable optical delay line
to characterize optical reflections.

While an OLCR measurement can achieve high

spatial resolution down to the tens of micrometers,
OFDR is well suited for applications that require a
the overall measurement range is limited, often to
combination of high speed, sensitivity, and
only tens of centimeters. Therefore, the usefulness
resolution over short and intermediate lengths.
of the OLCR is limited to inspecting individual
components, such as fiber optic connectors.

Falling somewhere in between OTDR and OLCR

with regards to measurement range, optical Optical backscatter reflectometry (OBR) is a
frequency domain reflectometry (OFDR) is an polarization-diverse implementation of OFDR that
interferometer-based measurement that utilizes a further improves the sensitivity and resolution
wavelength-swept laser source. Interference fringes without sacrificing the usable measurement range.
generated as the laser sweeps are detected and
processed using the Fourier transform, yielding a A simplified diagram of the OBR measurement
map of reflections as a function of the length. method is shown in Figure 4. Light from a tunable
laser source (TLS) is split between the reference
and measurement arms of an interferometer. A

lunainc.com | PAGE 3
polarization beam splitter and a polarization The resolution of the OBR increases for materials
controller split the reference light evenly between with a higher refractive index. For example, silicon
two orthogonal polarization states. The interference photonics waveguides can be scanned with a
between the measurement field and these two resolution of about 5 µm.
polarization states is then
recorded at detectors labeled S
and P. The complex reflection
coefficients are obtained, and a
Fourier transform converts the
data into reflectivity as a function
of length.

The very high resolution of OBR extends the In addition to the measurement of spatially-resolved
capabilities of OFDR to levels that make it a very RL, an OBR system can simultaneously measure
useful tool for characterizing PICs, silicon photonics, other important characteristics of the light path. For
and other small optical components. With example, insertion loss can also be measured along
measurement ranges able to extend up to 2 km, the optical path and at specific locations using the
OBR is also very useful for troubleshooting short Rayleigh backscatter levels, as shown in Figure 6.
fiber networks and cable harnesses, and even
measuring transmission latency, or length, with sub- An OBR can also be used to make the following
nanosecond precision. Figure 5 summarizes the measurements, in addition to Return Loss (RL):
landscape of established technologies for optical • Insertion Loss (IL)
reflectometry. By mapping the measurement range • RL Spectrum
and spatial resolution of the most common • Latency
technologies, the plot illustrates the unique • Group delay (delay versus wavelength)
application coverage of OBR. • Phase derivative (local wavelength vs.
distance)
• Polarization state evolution
The biggest advantage of OBR over other Because it can measure spectral shift in the
reflectometers is its ability to achieve unprecedented Rayleigh backscatter with high precision, OBR can
spatial resolution, completely avoiding the limitations also be used to measure strain (deformation) or
of OTDRs caused by large dead zones. temperature in the core of the optical fiber. Luna has
developed this capability into a dedicated sensor
Because OBR instruments are frequency-based,
measurement platform (ODiSI) that can measure
they do not suffer from dead zones. Reflection
strain or temperature along an optical fiber with a
events in very close proximity to each other can be
spatial resolution of less than 1 mm.
detected and measured with an OBR. An OBR
instrument also can achieve ultra-high spatial
resolution, as low as 10 µm for 30 m measurement
ranges and 1 mm resolution for 2 km ranges.

lunainc.com | PAGE 4
The unique precision and resolution of OBR make it
a useful tool for many applications involving short
fiber networks and PICs. This white paper will
describe three general applications that illustrate the
value of the OBR’s measurement capabilities:
• Characterization of Short Fiber Networks
• Component and Waveguide Characterization
• Latency (or Length) Measurement
This set of example applications is not exhaustive, of
course, but illustrates how OBR delivers important
insight into a variety of optical design, validation,
characterization and troubleshooting applications.

The range and high resolution of OBR are well

suited to characterizing or troubleshooting shorter
fiber optic networks. As optical data communications
rates continue to increase, higher speed optical links
are becoming prevalent within data center buildings
and campuses (Figure 7) and in fiber to the premise
(FTTP) applications. Optical networks are also being
deployed for onboard communications on aircraft,
ships and other vessels. These applications utilize
relatively short high-performance optical links that
can be precisely characterized using OBR.

An example of measuring and characterizing a

relatively short network is illustrated in Figure 8. An
OBR system scans the simple fiber network and
generates a detailed trace of loss versus length
which is similar to an OTDR. However, the location of the reflection events can be very precisely located
due to the ultra-high resolution and lack of any dead
zone. For example, the second connector reflection
appears to have an abnormal amount of loss, and
one might assume this is a misaligned connector.
However, with the resolution of an OBR system, we
are able to zoom into this area and see that this
reflection actually includes a second reflection just
behind the connector interface. This second
reflection, located only about 8 mm from the
connector face, is caused by a crack in the fiber core
due to stress where it exits the connector ferrule.

Only an OBR system has the combination of spatial

resolution and range to detect and quantify these
types of defects and issues.

lunainc.com | PAGE 5
As silicon photonics and other technologies evolve
to pack more functionality into smaller packages,
limiting power loss and dispersion becomes even
more critically important. The ability to see deep
inside a photonic integrated circuit (PIC) and map
out the entire loss profile, including the coupling of
light into and out of the component, can be
invaluable for improving optical waveguide designs.

For example, Figure 9 illustrates the use of OBR to

scan a planar lightguide circuit (PLC). The OBR
trace shows the RL at the input and output coupling,
the insertion loss along the waveguide path, as well
as the small reflections due to optical interaction
occurring at path crossings internal to the device.

The reflection from the far end of the PLC device

demonstrates some broadening of the peak. This is
indicative of dispersion in the PLC device. Using
standard OBR analysis tools, we are able to also
examine group delay versus wavelength. The slope
of the group delay indicates the presence of
chromatic dispersion, a common phenomenon in
these types of photonic components.

As an additional example in silicon photonics, Figure

10 shows a scan using Luna’s OBR system of a
silicon photonics waveguide. The trace clearly
shows the 50 reflections spaced at about 50 µm
within the integrated device.

lunainc.com | PAGE 6
 <0.0034% of the total length (or latency).
For a 30 m optical fiber, this corresponds to
The length of a fiber optic segment, and also an accuracy of around 5 ps; for a 2 km fiber,
the physical transmission latency, can be this corresponds to an accuracy of about
very precisely measured with an OBR 0.34 ns.
system. This is useful for quality control in
the production of
precision length fiber
links, diagnosing latency
issues in a fiber
network, and certifying
link latency in time-critical transmissions,
such as in financial data centers.

With its ultra-high sampling resolution, OBR Luna Innovations’ line of OBR reflectometers
can measure latency with sub-picosecond delivers the unique performance and capabilities of
resolution. The example in Figure 11 OBR to R&D labs, production floors, quality control
illustrates a measurement of two fibers, labs, and to the field. OBR options include:
each approximately 50 m in length. An OBR
• OBR 4600: 10 m resolution and range up to
system measures the difference in latency
2km. Great for labs and production floors.
between the two links as 95 ps, which for
this fiber is equivalent to a difference of 19.3 • OBR 6200: Portable OBR for field maintenance
applications.
mm in length. Luna’s OBR 4600 can
measure latency with an accuracy of • Luna 6415: Component analyzer with OBR
mode - streamlined for the production floor
with an update rate of >10 Hz.
The OBR 4600 has the highest measurement
performance, working over either the C & L (1525-
1610 nm) or O (1270-1340 nm) bands, and featuring
80 dB of dynamic range for RL measurement.

The OBR systems include an intuitive and powerful

software platform for interactive measurements and
analysis, as well as tools for easily integrating the
OBR into your test platform or production line.

Please visit lunainc.com to learn more about all of

Luna’s solutions for testing fiber optics and photonic
components.

lunainc.com | PAGE 7