Topic 2 - Carrier - Statistics
Topic 2 - Carrier - Statistics
MICROELECTRONIC DEVICES
SKEL 4653
Lecture 1
Two-Level System-Equilibrium
E2 E1
Exponential Distribution : P12 P21e k BT
P12 P12 f1 (1 f 2 )
D
P21 P21 f 2 (1 f1 )
D
1 f1 1 f2
E EF
f 1
e k BT
constant, say e k BT
f (E) ( E EF )/ k BT
1 f 1 e
Lessons Learned:
1. Fermi Energy remains constant
throughout the system independent of
any pair of E1 and E2.
2. If 1 and 2 are ends of the mean free path
(mfp), the equilibrium is established by
equal number of velocity vectors
directed in either x,y,z directions
Band Diagram in Equilibrium
E1 E2
EF v 0
EC Intrinsic Velocity
vi 0
nd nd
with with
2 2
v vi v vi
nd EV
nd nd
2
d 3(bulk 3D), 2 (2 D),1 (1D)
Equilibrium to Nonequilibrium
E2 E1 q E qE cos( ) E
f
EF q E
e k BT
e k BT
E1
E2 1 f
qE 1
f ( E, E)
E ( EF q E )
EF 1 e k BT
EC NEADF (Chapter 4)
nd nd
E EV
DOS, Distribution, and Concentration
3/ 2
1 2m*
D3e ( E )
dse
E Ec
2 2
2
3/ 2
1 2m*
D3h ( E ) 2
dsh
Ev E
2 2
The Fermi-Dirac Probability Distribution
Function
1
f(E) E EF / k B T
1 e
E EF / k B T
e (Maxwell - Boltzman Approx )
Maxwell–Boltzmann approximation
E EF / k B T
f(E)e (Maxwell - Boltzman Approx )
Determine the energy at which the Boltzmann approximation may be
considered valid. Calculate the energy, in terms of kT and EF, at which
the difference between the Boltzmann approximation and the Fermi–
Dirac function is 5 percent of the Fermi function
The Temperture Dependence and Rescaling
for Bandstructure
Carrier Concentration-3D
top
1
Eco k BT
e
E Eco
x E Eco k BTx dE k BT dx
k BT
E EF 3 E Eco Eco EF 3 EF 3 Eco
x 3 3
k BT k BT k BT
3/2
1 2m * 3 1 1
k BT
3/2
n3 2 2 dx x1/2
E F Ec
Normalized Fermi Energy
k BT
1 1 j 1
j x dx
j
(deg)
( j 1) 0 ( j 1) j 1
Gamma Function
( j ) x j 1e x dx
0
j 1! for integer j
( j 1) x j e x dx
0
j ! for integer j
Recursion : ( j 1) j ( j )
3D Non-Degenerate (ND) Electrons
EF 3 Eco
j e 3
e k BT
Eco EF 3
Nc3e kBT
n3 3
e
Nc3
3D Hole Concentration
3D Non-Degenerate (ND) Holes
Evo EF 3
j e
v 3
e k BT
EF 3 Evo
p3 Nv3e k BT
Intrinsic Concentration-ND
EF3→ Ei3 and n3= p3= ni3
Eco Ei 3
ni 3 N c 3e k BT
Ei 3 Evo
ni 3 N v 3 e k BT
Intrinsic Concentration-ND
( EC E Fi ) ( E Fi Ev )
ni pi N C exp N v exp
kT kT
2 ( EC Ev ) Eg
ni N C N v exp N c N v exp
kT kT
Independent of Fermi energy
no and po in terms of ni
3/ 2
2m kT
*
( EC E F ) ( EC E F )
no 2 n
2
exp N C exp
h kT kT
3/ 2
2m kT
*
( E F Ev ) ( E F Ev )
po 2
p
exp N exp
h 2 kT
v
kT
( EC E Fi ) ( E Fi Ev )
ni pi N C exp N v exp
kT kT
n3 and p3 in terms of ni
( EC0 EF3 ) ( EF3 EV0 )
n3 Nc3 exp p3 Nv3 exp
k BT k BT
( EC0 EFi3 ) ( EFi3 EV0 )
ni 3 Nc3 exp pi3 Nv3 exp
k BT k BT
EF3 EFi3
n3 ni 3 exp
k BT
EFi3 EF3
p3 pi 3 exp
k BT
Microelectronics I
Intrinsic; n=p
( EC E Fi ) ( EFi Ev )
N C exp N v exp
kT kT
3 m*p Ec
EFi Emidgap kT ln *
4 m
n Emidgap
Ev
Mp = m n EFi = Emidgap
3 mdsh
*
EC0 2EFi 3 EV0 kBT ln *
2 mdse
EC0 EV0 3 mdsh
*
EFi 3 kBT ln *
2 4 mdse
Modeling and Simulation of Microelectronic Devices
Lecture 2
Degenerate versus Nondegenerate
n3
n3 N c3 1 c 1 c
2 N c3 2
How to evaluate when u3 is given?
Nondegenerate: u3 1 e
2
Nondegenerate: ln( u3 )
Degenerate u3 1 u3 1 0
2 2
http://scitation.aip.org/content/aip/journal/jap/67/6/10.1063/1.345414
Example-ni3 for Si at 300 K
*
mdse 1.09 mo *
mdsh 1.15mo E g 1.12eV
3/2 3/2
3 m
*
T
N c 3 2.54 10 cm
19
ds
2.86 1019 cm 3
mo 300
N v 3 3.10 1019 cm 3
1.12 3
ni 3 2.86 1019 3.10 1019 exp cm
2 0.0259
1.08 1010 cm 3
( EC Ev ) Eg
ni N C N v exp N c N v exp
kT kT
Effective DOS in GaAs
Example: p-type GaAs
*
mdse 0.067 mo *
mdsh 0.48mo Eg 1.43 eV , N A 10 1016 cm 3 , N D 9 1016 cm 3
*
mdse 0.067 mo *
mdsh 0.48mo Eg 1.43 eV ,
N A 10 1016 cm 3 , N D 9 1016 cm 3
p N A N D 1.0 1016 cm 3
3/2 3/2
3 mds T
*
N c 2.54 10 cm
19
4.4 1017 cm 3
o
m 300
N v 8.3 1018 cm 3
Nv
EF Ev k BT ln
po
8.30 1018
0.0259eV ln 16
10
0.17eV
Minority and Majority
Carriers
1.43 eV
ni 4.4 1017 8.3 1019 e 20.0259 eV
cm 3
2.2 106 cm 3
np ni n
2 n
2.2
2
i
10 cm 6
3 2
p 1016 cm 3
4 3
2.2 10 cm 0
Uncompensated versus Compensated
3
N A 4 10 cm 16
3 3
N A 4 10 cm
16
N D 1 10 cm
17
n3 N D N A 6 1016 cm 3
Strong Degenerate 3Doping
2 3 2
n3 N c3 1 c N c3
2 3/ 2
2
2
3 n3 3 2 3 2 n3 3
EF Eco k BT
4 Nc 2m*n
1
1
3 n3 2
3
k F 3 n3
2
3 vF
m*
Microelectronics I
Charge-neutrality condition
no N a po N d
Negative charges Positive charges
no ( N a pa ) po ( N d nd )
Charge Neutrality
Negative charges
p3 N n3 N
Positive charges
D A
2
n
N D n3 N A
i
n3
n3 n3 ( N D N A ) ni 3 0
2 2
2
ND N A ND N A
n3 ni
2
2 2
2
N A ND N A ND
p3 n 2
i3
2 2
Charge Neutrality-Approximation
n3 N D N A when N D N A ni
p3 N A N D when N A N D ni
Perfect compensation : N A N D
n3 p3 ni 3
n3 versus T
Modeling and Simulation of Microelectronic Devices
Lecture 3
Carrier Freeze-Out
N D ND N A N A ( partial Ionization )
N D 1
( EF E D )
g D 2 for spin states
ND
1 gDe k BT
N A 1
( E A EF )
NA
1 g Ae k BT
Charge Neutrality:
p n N NA 0 D
n3/ND versus Temperature
Quasi-Low-Dimensional QWs
2
Ek Ec 0
2m *
2
kx k y kz
2 2
(3D)
2
Ek Ec 2
2m2 *2
2
kx k y
2
(2 D)
kx
Ek Ec1 (1D)
2m *
Ecd Eco 0d d 3(bulk), 2(2D),1(1D)
03 0 02 0z 01 0z 0y
Carrier Statistics in Low-D QW
nd N d d
1
d d 3, 2, or 1
2
m * k BT
d /2
2
N d 2 D
2
2 2 D
d 2m * k B T
( EF Ec ) d
d
kBT
Fermi Energy
Degenerate and Nondegenerate
Fd
Intrinsic Velocity
1 2( E Ec ) 2 k BT
E Ec m * v 2 v vth x1/2 vth
2 m* m*
nd N d d 2 d
2
d 1 d d 1 d
vid vthd 2
vthd 2
d 2 d nd / N cd
2
d 1
2
vthd vth
d
2
Intrinsic Velocity
Nondegenerate Approximation
d 1 d 1
2 2 2
vth
k T
vid vthd B
d m* d
2 2
2 8 kBT
vi 3 vth 3 vth
m*
kBT
vi 2 vth 2 vth
2 2m *
1 2 kBT
vi1 vth1 vth
m*
Intrinsic Velocity
Degenerate Approximation
d d 2( EF Ec ) d
vid vFd
d 1 d 1 m*
1
d d 2 nd d
vid 2
d 1 m * 2 2
1
d d 2 nd d
vid 2
d 1 m * 2 2
Derivation
Intrinsic Velocity Degenerate Approximation
d d 2( EF Ec )d
vidDeg vFd
d 1 d 1 m*
1/2
d d 2 ( EF Ec )d
vFd η k T where d
d 1 d 1 m* d B k BT
d d 2( EF Ec )d
vidDeg vFd
d 1 d 1 m*
1/2
d nd d 2 22 2
2/ d
d
v
d 1 Fd d 1 2 2 m*2
1/2 1/ d
d 22 2 nd d 2
d 1 m*2 2 2
1
d d 2 nd d
vidDeg 2 2
d 1 m*
2
Intrinsic Velocity Degenerate
Approximation
3 1/3
vi 3 3 n3
2
4m *
8 n2 / 9
1/2
vi 2
m*
vi1 n1
4m *
Intrinsic Velocity in Low-D Systems
8
3D
7 2D
1D
6
5
(vi/vth)d
1 -2 -1 0 1
10 10 10 10
(n/N)
d
Mean Energy and rms velocity
d Fd
d
Emd k BT 2
2 d 2 Fd
2
d Fd
d k BT
vrms d 2
m * d 2 Fd
2
Mean Energy
Nondegenerate Approximation
3 3k BT
Em 3 k BT vrms 3
2 m*
2 2 k BT
Em 2 k BT k B T vrms 2
2 m*
1 k BT
Em1 k BT vrms1
2 m*
Intrinsic Energy
Degenerate Approximation
2/ d
d d 2
d d
Emd ( EF Ec ) d 2 nd / 2
d 2 d 2 m* 2 2
2/3
6 3
2
Em 3 n3
5 m* 8
2
Em 2 n2
2 m*
2 2
Em1 n12
24 m *
RMS Velocity
Degenerate Approximation
2 d
vrms d ( EF Ec ) d
m* d 2
1/2 1/ d
d d d
4 2 2 nd / 2
m* d 2
1/3
12
1/ 2
3 n1
vrms 3 n3 vrms1
m* 5 8 m* 2 3
n2
1/2
vrms 2
m*
Unidirectional Transport
As we will find out that in a high electric field, the
Fermi energy is lifted in the degenerate regime because
of Pauli Exclusion Principle. The velocity vectors
transform to an ordered phase with lifting of Fermi
energy as electrons cannot go to already occupied states.
The unidirectional intrinsic velocity is appropriate for
2n electrons as only the half of k-space is occupied. As
degeneracy advances from nondegenerate level to
extreme degenerate level, intrinsic velocity changes
from vid to vud that is reflected as geometic mean vid vud
in the definition of intrinsic temperature. Intrinsic
temperature Ti is higher than the lattice tempertaure
ultimately becoming proportional to the Fermi Energy.
Modeling and Simulation of Microelectronic Devices
Examples
Example 1
The Fermi energy versus carrier concentration indicates that
electron gas is strongly degenerate when the Fermi energy is 3kBT
above the edge of the conduction band.
a) Find the probability of finding the electron at the conduction
band edge Ec.
b) Find the probability of finding electron at the Fermi energy
EF.
c) What is the carrier concentration (in m−3) of electrons in
GaAs at room temperature at the threshold of being strongly
degenerate?
d) Sketch a band diagram showing the intrinsic Fermi energy,
Fermi energy, and bandgap with appropriate values for GaAs
at room temperature.
Example 1a
The Fermi energy versus carrier concentration indicates that
electron gas is strongly degenerate when the Fermi energy is 3kBT
above the edge of the conduction band.
a) Find the probability of finding the electron at the conduction
band edge Ec.
Example 1b
The Fermi energy versus carrier concentration indicates that
electron gas is strongly degenerate when the Fermi energy is 3kBT
above the edge of the conduction band.
b) Find the probability of finding electron at the Fermi energy EF.
Example 1c
The Fermi energy versus carrier concentration indicates that
electron gas is strongly degenerate when the Fermi energy is 3kBT
above the edge of the conduction band.
c) What is the carrier concentration (in m−3) of electrons in
GaAs at room temperature at the threshold of being strongly
degenerate?
Table of Fermi–Dirac Integrals (Page 3)
Example 1d
The Fermi energy versus carrier concentration indicates that
electron gas is strongly degenerate when the Fermi energy is 3kBT
above the edge of the conduction band.
d) Sketch a band diagram showing the intrinsic Fermi energy,
Fermi energy, and bandgap with appropriate values for GaAs
at room temperature.
0.71 eV
1.42 eV
0.71 eV
Example 2
Following the same procedure as for the carrier concentration,
derive the expression for the intrinsic velocity for d=1, 2, and 3.
Discuss its degenerate and nondegenerate limits.
1
d d 2 nd d
vid 2
d 1 m * 2 2
Example 2
Following the same procedure as for the carrier concentration,
derive the expression for the intrinsic velocity for d=1, 2, and 3.
Discuss its degenerate and nondegenerate limits.
Example 3
The energy distribution per unit volume per unit energy of
electrons nE (E) in the conduction band is given by
where A is a constant.
a) Show that the maximum in the energy distribution is at
E − Ec = 1/2 kBT. Hint: nE is maximum when dnE/dE = 0.
Example 3