Physics 1200 Lecture 25 Fall 2024
Physics 1200 Lecture 25 Fall 2024
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Announcements
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Physics 1200
Lecture 25
Fall 2024
Exam 3 Information, Topics Covered, Etc.
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Exam 3 Information
• Exam Date: Wednesday Dec. 4, 6 -7:25 pm.
• Conflict Exam, Thursday Dec. 5, 6 – 7:25 pm.
➢Available to students with legitimate time conflict with regularly
scheduled exam.
➢You must submit a request to your section professor and Prof. Ciolek by
email by 5 pm Monday, Dec. 2 that you would like to take the conflict
exam and state the reason why.
➢We reserve the right to deny a student from taking the conflict exam if it
is determined that there is not a legitimate reason for taking the exam at
that alternate time, or if they have not submitted a request from
instructors in advance, as required above.
• Students with accommodations
➢Remind your section instructor of your exam accommodations.
➢Exam will be taken in 2C14 of the J-Rowl Science Center. Bring a copy
(paper or electronic) of your accommodations notice to the exam room.
➢Start at the regular time and submit at the agreed time.
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Exam 3 Information (2)
• Allowed resources –
➢You may use you a calculator with capabilities and functions
up to the TI-Nspire. Devices with communication/internet
capability are not allowed.
➢You are allowed a single 8.5′′ × 11′′ sheet of paper (both
sides) crib sheet. Must be a single piece of paper – no taped
or stapled pages.
➢Writing instruments (pencils, pens). For pens, darker inks are
preferred. Red ink is not allowed.
• A short table of physical constants (same as done for Exams
1 & 2) will be included on the first page of the Exam 3 test
booklet.
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Exam 3 Information (3)
• Exam will focus on topics presented in classes 17, and 19-24.
• Exam Structure
➢Multiple choice and numerical short answer questions for ~ 70%
to 80% of exam pts.
✓ ~ ½ conceptual and scaling questions
✓ ~ ½ numerical solution
➢Free response questions for the remaining % of exam pts.
• Good resources
➢MasteringPhysics: Lecture quizzes; Practice Problems; Homework
➢Exam Archives (LMS)
➢Activity worksheets
➢Lecture slides
➢Text
• Monitor your email and LMS announcements for exam
information and updates.
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Exam 3 Information (4)
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Exam 3 Answer Sheet
Front Side Back Side
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Exam 3 Rooms
Class Section Instructor Exam Room
1, 2 Ciolek Eaton 214
3, 4 Ward DCC 318
5 Meng Sage 3303
6, 9 Zheng Sage 3303
7, 8 Persans DCC 324
11 Narendran DCC 318
Accommodations All 2C14 J-Rowl SC
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Exam 3 – Material Covered
• Everything from Classes 17 and 19 - 24 is eligible to be on the
exam.
• Includes:
➢Reading assignments.
➢Homework (paper and online).
➢Lab activities.
➢Quizzes.
➢Lectures and questions.
• Of course, we assume that you understand all the material
covered in classes 1 – 16, and on the last two exams.
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Exam 3 – Material Covered (2)
Topic
EM waves and light. Index of refraction.
Wave fronts and rays. Huygens’s Principle.
Polarization, Malus’s Law.
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EM Waves and Light, Index of Refraction
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EM Waves: Wave Fronts and Rays
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Principle of Huygens
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Polarization of EM Waves/Light
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Polarization of EM Waves/Light (2)
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Exam 3 – Material Covered (3)
Topics
Superposition of waves. Wave interference of coherent light beams.
Intensity in two-beam interference.
Interference and phase change.
Sources of phase change:
Path length and/or index of refraction. Intrinsic.
Young’s double-slit experiment.
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Interference of Waves, Intensity
• Interference involves differences in the phases of waves that are being
superposed at a point.
➢ Waves of equal amplitude and same frequency being superposed:
𝐸1 = 𝐸0 cos(−𝜔𝑡), 𝐸2 = 𝐸0 cos −𝜔𝑡 + Δ𝜙 ,
Δ𝜙 = 𝜙1 − 𝜙2 is the net phase difference between waves 1 and 2.
Δ𝜙 Δ𝜙
Superposed total: 𝐸𝑡𝑜𝑡 = 𝐸1 + 𝐸2 = 2𝐸0 cos cos −𝜔𝑡 + ,
2 2
➢ Resulting intensity:
Δ𝜙 1
𝐼 = 4𝐼0 cos 2 , 𝐼0 = 𝑐𝜖0 𝐸02 = intensity of single wave 1 or 2.
2 2
➢ conditions for intensity maxima and minima:
If Δ𝜙 = 2𝑚𝜋, 𝑚 = 0, ±1, ±2, ±3, … (= [even number] × 𝜋)
⇒ intensity 𝐼 = 4𝐼0 (the maximum value) ⇒ constructive interference.
If Δ𝜙 = 2𝑚 + 1 𝜋 , 𝑚 = 0, ±1, ±2, ±3, … (= [odd number] × 𝜋)
⇒ intensity 𝐼 = 0 (the minimum value) ⇒ destructive interference.
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Interference Effects: Phase Differences
• Wave phase differences is the sum
Δ𝜙 = Δ𝜙path + Δ𝜙source + Δ𝜙ref ,
Δ𝜙path = phase difference between waves 1 and 2 due to differences in path lengths traveled
by waves, including differences in refactive index 𝑛 along paths,
Δ𝜙source = intrinsic phase difference introduced by wave sources,
Δ𝜙ref = phase difference caused by reflection of the waves at an interface between regions of
different index of refraction 𝑛.
• Effect of index of refraction on wavelength, phase difference between two waves
2𝜋
along path length has general expression: Δ𝜙 = σ𝑁 1
𝑗=1 𝑛1𝑗 𝑥1𝑗 − σ𝑁2
𝑗=1 𝑛2𝑗 𝑥2𝑗
𝜆
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Young’s 2-Slit Interference Experiment (2)
𝑦𝑚
𝜃𝑚
𝑑
𝐷
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The Michelson Interferometer
• Can measure fringe shift
differences due to placement
of sample of index of
refraction 𝑛 in one of the
interferometer path legs.
Determine optical path length
change from fringe shift, then
use to calculate 𝑛.
• Michelson interferometer can
also be used to determine if
either of the mirrors moves a
certain distance, even for
extremely small changes in
lengths 𝐿1 or 𝐿2 , by watching
the change in the interference
fringe pattern.
• The sensitivity to minute changes in distance makes the Michelson interferometer
the main instrument for the detection of gravitational waves.
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Exam 3 – Material Covered (4)
Topics
Diffraction. Single-slit diffraction pattern and intensity.
Two-slit interference with diffraction.
Circular apertures. Resolution.
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Diffraction
• Effect due to wave barriers/slits/edges having
finite extent. According to Huygens’s principle,
each point of a wave front acts as a source of
new waves.
➢ Even for a finite width, there is an infinite
number of point sources within the aperture.
➢ Should be interference between wavelets
created in a single slit: a self-interference effect.
Gives rise to a diffraction pattern.
➢ Huygens wavelets from unblocked portion of an
impinging wave front explains ‘bending’ of a wave
around a barrier’s edge. Diffraction pattern (for
coherent waves) seen near edge of the obstacle.
➢ Similar results for viewing coherent light diffraction
on other finite-extent objects (e.g., image of the
shadow of a razor blade).
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Single-Slit Diffraction
• Single-slit Fraunhofer diffraction: consider single slit
of width 𝑎 to be a source of a large number 𝑁
wavelets.
• Adopt parallel-ray approximation again, similar to
that was done in the interference study.
• Because intensity of a wave is proportional to the
square of the electric field amplitude, using phasor
analysis find single-slit intensity as
𝛽 2
sin 2 2𝜋𝑎
𝐼 = 𝐼0 𝛽 , 𝛽= sin 𝜃 ,
𝜆
2 𝑚′ = 3
and 𝐼0 is the intensity at the central maximum. 𝑚′ = 2
𝑚′ = 1
𝛽
➢ Intensity equation yields minima at = 𝑚′ 𝜋,
2
𝑎 sin 𝜃 = 𝑚 𝜆 ,′ ′
𝑚 = ±1, ±2, ±3, … 𝑚′ = −1
𝑚′ = −2
𝑚′ = −3
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Single-Slit Diffraction (2)
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Two-Slit Interference & Diffraction: Identical Slits
• Diffraction effects from the slits must be taken into account.
• For two-slit interference with diffraction for identical slits, phasor calculation finds
resultant intensity is the product of the diffraction pattern of a single slit
multiplied by the pattern for two-slit interference in the absence of diffraction :
𝛽 2
sin 𝛼 2𝜋𝑎 2𝜋𝑑
𝐼 𝜃 = 𝐼0 𝛽
2
cos 2 , 𝛽= sin 𝜃 , 𝛼= sin 𝜃 .
2 𝜆 𝜆
2
𝜃 is angle with respect to line from the slits to the viewing screen, 𝑎 =slit width of,
𝑑 = the distance between slits, and 𝐼0 = intensity of central maximum.
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Two-Slit Interference & Diffraction Identical Slits (2)
➢ Diffraction minima are labeled by
integer 𝑚d = ±1, ±2, … (“d” is for
“diffraction”).
➢ Interference maxima labeled by
integer 𝑚i = 0, ±1, ±2, … (“i” is for
“interference”).
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Diffraction from Circular Apertures
• Diffraction also occurs in other apertures,
including circular apertures.
• Diffraction pattern formed by a circular
aperture has a central bright spot encircled
by alternating series of dark and bright
rings.
• Airy disk bound by first dark ring (i.e., first
diffraction minimum) and has angular
radius 𝜃1 :
𝜆
sin 𝜃1 = 1.22 𝐷 ,
𝐷 = diameter of circular aperture.
• Rayleigh’s criterion for resolving two point
objects:
➢ Objects are just resolved (distinguishable) if
center of one diffraction pattern coincides
with first minimum of the other. The angle
for the Rayleigh criterion is
𝜆
𝜃𝑅 = sin−1 1.22 𝐷 .
➢ For small angles, sin 𝜃 ≈ 𝜃, and
𝜆
𝜃𝑅 = 1.22 𝐷 (angle in radians). 33
Exam 3 – Material Covered (5)
Topics
The special theory of relativity. Frames of reference.
Lorentz factor. Time dilation. Length contraction.
Relativistic momentum and energy.
Energy and mass units.
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The Special Theory of Relativity
• The theory is founded on two postulates:
I. Relativity principle: The laws of physics are the same in all inertial
reference frames, despite the fact that these frames may be in
uniform translation with respect to each other. Consequently, all
inertial frames are completely equivalent. There are no preferred
inertial reference frames.
II. Constancy of the speed of light: The velocity of light in vacuum is
the same (𝑐) in all inertial reference frames and is independent of
the motion of its source.
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Relativistic Time Dilation
• Clock at rest and located at position 𝑥 ′ in frame
𝑆 ′ . Time interval between two events 𝐴 and 𝐵
that occur at clock location at times 𝑡𝐴′ and 𝑡𝐵′
(recorded by an observer in 𝑆 ′ who also stays
located at 𝑥 ′ ) is the proper time interval:
Δ𝑡0 = 𝑡𝐵′ − 𝑡𝐴′ .
• An observer in frame 𝑆, sees events 𝐴 and 𝐵
occur at different locations 𝑥𝐴 and 𝑥𝐵 ,
recorded at times 𝑡𝐴 and 𝑡𝐵 by their own clock.
Relativistic (Lorentz) transformation equations
yield:
𝑡𝐵 − 𝑡𝐴 = Δ𝑡 = 𝛾Δ𝑡0 .
1 Δ𝑡
• Lorentz factor 𝛾 = > 1 for 𝑢 ≠ 0, it follows that = 𝛾 > 1.
𝑢 2 Δ𝑡0
1−
𝑐
𝑥𝐴′ 𝑥𝐵′ 𝑥′
𝑥𝐴 𝑥𝐵 𝑥
• Lorentz transform equations give:
𝑥𝐵′ − 𝑥𝐴′ = 𝛾(𝑥𝐵 − 𝑥𝐴 ) ⇒ 𝐿0 = 𝛾𝐿 , where 𝐿0 = 𝑥𝐵′ − 𝑥𝐴′ is the proper
length (rod seen at rest in 𝑆 ′ -frame) and 𝐿 = 𝑥𝐵 − 𝑥𝐴 is the length of the rod as
measured in 𝑆 -frame (frame in which the rod is seen as moving).
1
• Rewriting equation: 𝐿= 𝐿0 .
𝛾
1 𝑢 2
• Because = 1− < 1 for 𝑢 ≠ 0, 𝐿 < 𝐿0 . Relativistic length contraction.
𝛾 𝑐
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Energy and Mass Units
• Atomic and Nuclear Physicists and Engineers often use the energy unit:
electron-volt or eV.
• The electron volt is a good unit for atomic physics – binding energies are
of the order of 1 to 10 eV. For instance, the ground-state binding energy
of the hydrogen atom is 13.6 eV.
• Recall that, in SI units, 1 eV = 1.6 × 10−19 J.
• Nuclear reactions tend to occur on the mega-electron-volt or MeV scale.
1 MeV = 106 eV.
• In addition to the SI unit of mass (kg), when dealing with nuclear
reactions scientists and engineers may also use the unit MeV/𝑐 2 .
Convenient to use for energy calculations, especially for rest energies,
since rest energy 𝐸0 = 𝑚𝑐 2 .
• To convert from kg to MeV/𝑐 2 , use
𝑐2 𝑚𝑐 2 𝐸0
𝑚=𝑚 = = .
𝑐2 𝑐2 𝑐2
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Exam 3 – Material Covered (6)
Topics
Photons. Photoelectric effect, stopping potential. Einstein’s
photoelectric equation. Work function.
Intensity in the photon model.
. Photon momentum & the Compton experiment.
Introduction to wave-particle duality.
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Photoelectric Effect Experiment
• Experiment had results contrary to
expectations based on EM wave theory
deduced from Maxwell’s equations. Cathode
Anode
• Electrons are ejected from the illuminated
emitter plate (cathode) & travel to the
collector plate (anode).
➢ Energy of freed electrons is conserved.
➢ The stopping potential 𝑉0 = −𝑉AC is the
potential that just stops the current from
getting to the anode, that is, the potential
that causes 𝐾A = 0.
➢ The maximum kinetic energy of the ejected
cathode electrons for that case is
𝐾C,max = 𝑒𝑉0 .
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Photoelectric Effect Experiment (2)
• Einstein proposed Individual photon with
energy
ℎ𝑐
𝐸 = ℎ𝑓 = (ℎ = Planck’s constant)
𝜆
arriving at a surface is absorbed by a single
electron.
➢ He also proposed maximum kinetic energy of
ejected photoelectrons from a surface is
➢ 𝐾C,max = 𝑒𝑉0 = ℎ𝑓 − 𝜙 ,
𝜙 is the work function of a metal.
➢ Electron can escape from the surface
(𝐾C,max > 0) only if the energy it absorbs is
greater than the work function 𝜙.
➢ The greater the work function of a material,
the greater the minimum frequency needed
to emit photoelectrons. Explains why there is
a threshold frequency.
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EM Wave Intensity in the Photon Description
• For EM waves, wave intensity is:
𝑃𝑜𝑤𝑒𝑟 (𝐸𝑀 𝑊𝑎𝑣𝑒 𝐸𝑛𝑒𝑟𝑔𝑦)
Intensity 𝐼 = = .
𝐴𝑟𝑒𝑎 (𝑇𝑖𝑚𝑒)(𝐴𝑟𝑒𝑎)
• For photons:
𝑁𝛾 ℎ𝑓 𝑁𝛾
𝐼= = ℎ𝑓 = 𝐹𝛾 𝐸𝛾 ,
𝑇𝑖𝑚𝑒 (𝐴𝑟𝑒𝑎) 𝑇𝑖𝑚𝑒 𝐴𝑟𝑒𝑎
(𝑁𝛾 )
𝐹𝛾 = = photon flux,
𝑡𝑖𝑚𝑒 𝐴𝑟𝑒𝑎
ℎ𝑐
𝐸𝛾 = ℎ𝑓 = = photon energy.
𝜆
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Photon Momentum, Compton Scattering
• Photons travel at speed of light and have mass 𝑚 = 0.
• For photons, 𝐸 2 = 𝑝𝑐 2
𝐸 ℎ𝑓 ℎ
⇒ 𝑝= = = = magnitude of photon momentum.
𝑐 𝑐 𝜆
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Review Lab Activity
• Lab classes Mon (Dec. 2)/Tues (Dec. 3): set of practice questions.
• Worth 6.67 extra-credit lab activity points. Can work in groups and ask
questions, just like a regular lab.
• Class 25 attendance and participation is required to earn the extra-
credit lab points.
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