689 Track Hold
689 Track Hold
689 Track Hold
Sample-and-Hold Circuit
S/H:
S t
Vi
S/H circuit
Vo
Vo S/H command Vi
Block Diagram
Idealized Response
Performances of S & H
Realistic Transient Response:
Input & Output Voltage Vin Voltage Drift Vout t CK ta th t Track Error
Pedestal
Vi tap ts
Hold step
Feedthrough
Desired output
Vo
Droop
tac
Performance Definition
Acquisition Time: the required time for the output transient after the sampling signal. Hold Settling Time: the time after the hold signal required for the output to settle within an acceptable error. Pedestal Error: due to the transition of sample to hold mode. Voltage Drift: the rate of discharge of the sampling capacitor during the hold mode. Dynamic Range: the ratio of the maximum and minimum input level, which can be sampled with a given resolution.
Performance Definition
Nonlinearity Error: the maximum deviation of the Vout/Vin characteristic from the straight line passed through the end points.
Gain Error: the deviation of the slope of the straight line from unity.
Vout Nonlinearity Error 1
G Gain Error= 1 - G
P 0 0 Vin
Analog and Mixed-Signal Center, TAMU
Performance Definition
Hold Mode Feedthrough: the percentage of the input signal that appears at the output during the hold mode.
Parasitic capacitors S
CK
Cp Vin CS Vout
Performance Definition
Aperture Error: the random variation of the turn off time of the switch results in an uncertain sampling time. Maximum Allowable Aperture Error for 1/2 LSB:
10nsec 1nsec
t ts b bi s t t 6 6 b ts bi ts 8 8 b t bii ts b bii
f
t max =
1 N +1 f in 2
Ideal sampling point
Vin
Sampling Error t
100psec 10psec
10 10 12 12
* nBin
Vin
nsw *
* nBout
Vout
f clk
Vin
Q1 Chld
Vout
Analysis QCH COX WLVeff 1 QC = = hld 2 2 where Veff 1 is given by Veff 1 = VGS1 Vtn = VDD Vtn Vin
V = QC hld
COX WLVeff 1 = 2Chld
Fig. 1 An open-loop track and hold realized using MOS technology. f clk
Vin
Q1
C hld
Vout
Chld
f clk Fig. 2 An open-loop track and hold realized using a CMOS transmission gate.
CK X S
f clk
f clk
Vin
Q1
Q2
.. .
Vin
1
Vout
. C .
Output Buffer 1
Vout
Chld
Fig. 3 An open-loop track and hold realized using an n-channel switch along with a dummy switch for clock-feedthrough cancellation.
CMOS Technology
VDD M4
IEE
ISS
CK Gm
V1
Vin
V-
Vout
CK
+
Cs M1
V+
Vin
Gm
V1
Vout
CK
M2
Gm Vout
Vin
CH
X
Vin
Gm
.
Vout Vin
+
clk
A0
Q1 Chld
Vout
clk
Fig B. Including an opamp in a feedback loop of a sample and hold to increase the input impedance.
clk
Q3
clk clk
Opamp 1 +
Chld Q1
Q2 Vin
+
Q1
.
Chld
.
Vout
Vin
.
Vout
+ Opamp 2
clk
Q2
CS g m1
=
CS
CK
M1
2 C ox (1 + A) W1 L1 3 W ( VGS VTn ) L
g m1
= C ox
D1 A1 + Vi +
D2 SW
A2 + + Vo
-
CH
S/H
Switch driver
+ A 1 LT118A -
A1 LT11010 R2 2k C2 D1
Q1
2N5432
+ Vo
-
C1 50pF
G R7 2k
Cgd
C3 100pF
R10
HP2810 R6 1k
Q2 2N2222
R7 200k
VEE
A 5 MHz track-and-hold circuit, using discrete components, with charge compensation to minimize the hold step.
f clk
ts1 ideal
ts 2 ideal ts 2 actual
Sampling jitter
Fig. The clock waveforms for V in and clk used to illustrate how a finite slope for the sampling clock introduces sampling-time jitter.
CK + Gm M1 X M2
CH
Vin
CK
. .
.
Vout
A0 + C2
.
C1
Vout
Vin X
.
A0 +
Vout
.Z
Y.
C1
.Z
C2
(a)
-
Vout X C1
C2
(b)
A0 +
.Z
C2 (c)
Fig. Open-loop architecture with Miller capacitance. (a) Basic circuit; (b) equivalent circuit in the acquisition mode; (c) equivalent circuit in the hold mode. The open-loop architecture with Miller capacitance employs two different values of capacitance in the acquisition and hold modes to achieve high speed and small pedestal error. This is accomplished using a Miller amplifier that multiplies the effective value of the sampling capacitor by a large number when the SHA enters the hold mode.
vin
C1
1
. .
C2 +
. .
vout
S4 CS
vin
S1
1B
.
S2
2B
1B
.
S3
S5
.. .
CX 1
CH
. .
S6
Vout
2S
COF
1B
S7
A switched-capacitor S/H.
MULTIPLEXED-INPUT ARCHITECTURES
Vin Gm1 CK Gm2 CK (a)
. .
CH
R2 Vout R1 Vin
+-
Gm1
-+
+-
R
-+
.
C1 X Y
Vout
CK
-+
Gm2
+-
. .
S1
S2
CK C2 A Rout X CH Vout
Multiplexed-input architecture. (a) Basic (single-ended) circuit; (b) equivalent circuit in the hold mode.
R2 R1 Vin
+-
R
+-
+-
Gm1
-+
R
-+
.
C1 C2
-+
.
C1 X Y C2
Vout
Vout
-+
Gm1
+-
(b)
(c)
Equivalent circuits of dual-loop multiplexed-input architecture. (b) Acquisition mode; (c) hold mode.
CK + -
Cs
M1 V+
Gm1
Iin
+ -
Gm2
Iout
CC
Q1
CFF Q12 R2
Q3 CK (Track)
B1 X1 C1
. .
S5
S3 S4
B2 Y1 C2
. .
Vout
Vin B1 X1 C1
Vout
Vout B1 X1 C1 B2 Y1 C2 Gm + C3
B2 Y1 C2
..
Gm + C3
..
(a)
Gm + C3
S2
(b)
Fig. 17 Equivalent circuits of recycling architecture. (a) Sampling mode; (b) hold mode.
Offset
Vi
+ A1 -
SW
CH
Cgd
A2 + + Vo
-
S/H SW driver
Vi
Buffer
SW1
CH
L.Dai and R. Harjani, CMOS Switched-Op-Amp Based Sample and Hold Circuit,IEEE JSSC, January 2000, pp 109-113
ON OFF Cgd
q
R vi
Cgs
+1
+ -
M1
Ch
vo
Q ch
'
= WLC ox (VGS
VT )
V =
k Q ch Ch
VT )
V =
''
( VDD
C para
Ch
VG
Vin
SOP +
A Ch
+1
Vout
+ Vin+ -
1m Gm S1
R1=100k
R2=100k + VinGm 1m
S2 M2 4/2
Ch2=1p +1 Vout-
Ib=5u Vdd=5V
M4
pcas
M9
VNerr VPerr
C Npara Ch Ch
+
C Npara C Ppara
VN GS VPGS
C Ppara
+
Time(us)
Frequency (kHz)
References
[1] U.L. McCreary and P.R. Gray, All-MOS charge redistribution analog-to-digital conversion techniques, IEEE J. Solid-State Circuits, vol. SC-10, pp. 371-379, Dec. 1975. [2] P. Van Peteghem and W. Sanaen, Single versus complementary switches: A discussion of clock feedthrough in SC circuits, in Proc. 12th Eur. Solid-State Circuits Conf. (ESSCIRC 86), Delft, the Netherlands, Sept. 1986, pp. 16-18. [3] C. Eichenberger and W. Guggenbuhl, Dummy transistor compensation of analog MOS switches, IEEE J. Solid-State Circuits, vol. 24, pp. 1143-1146, Aug. 1991. [4] M. Nayebi and B.A. Wooley, A 10-bit video BiCMOS track-and-hold amplifier, IEEE J. Solid-State Circuits, vol. 24, pp. 1507-1516, Dec. 1989. [5] P.J. Lim and B.A. Wooley, A high-speed sample-and-hold technique using a miller hold capacitance, IEEE Solid-State Circuits, vol. 26, pp. 643-651, Apr. 1991. [6] G.C. Temes, Y. Huang, and P.F. Ferguson Jr., A high-frequency track-and-hold stage with offset and gain compensation, IEEE Trans. Circuits Syst. II, vol. 42, pp. 559-560. Aug. 1995. [7] S. Brigati, F. Maloberti, and G. Torelli, A CMOS sample and hold for high-speed ADCs, in Proc. IEEE Int. Symp. Circuits and Systems Circuits and Systems Connecting the World, vol. 1, May 1996, pp. 163-166. [8] J.H. Shieh, M. Patil, and B.J. Sheu, Measurement and analysis of charge injection in MOS switches, IEEE J. Solid-State Circuits, vol. SC-22, pp. 277-281, Apr. 1986. [9] G. Wegman, E.A. Vittoz, and F. Rahali, Charge injection in analog MOS switches, IEEE J. Solid-State Circuits, vol. SC-22, pp. 1091-1097, Dec. 1987. [10] D. Jons and K. Martin, Analog Integrated Circuit Design. New York: Wiley, 1997. [11] J. Crols and M. Steyaert, Switched-opamp: An approach to realize full CMOS switchedcapacitor circuits at very low power supply voltages, IEEE J. Solid-State Circuits, vol. 29, no. 8, Aug. 1994.