Memory Device RSC Journal Chapter
Memory Device RSC Journal Chapter
1.1 Introduction
As the performance of digital gadgets for information technology advances,
the complexity of data storage devices increases correspondingly. Conven-
tional memory devices are implemented on semiconductor-based integrated
circuits, such as transistors and capacitors. In order to achieve greater den-
sity of data storage and faster access to information, more components are
deliberately packed onto a single chip. The feature size of transistors has
decreased from 130 nm in the year 2000 to 32 nm at present.1,2 Silicon-based
semiconductor devices become less stable below 22 nm, and the reliability
to store and read individual bits of information will be substantially reduced
by severe “cross-talk” issues. Moreover, power consumption and unwanted
heat generation are also of increasing concern, and the fidelity of address-
ing the memory units diminishes correspondingly. Therefore, the current
1
2 Chapter 1
state-of-the-art memory technologies are no longer capable of fulfilling the
requirements for information storage of the near future.3
Regarding the aspiration for new data storage technologies, ferroelectric
random access memory (FeRAM),4 magnetoresistive random access memory
(MRAM),5 phase change memory (PCM),6 and organic/polymer memory have
appeared on the scene of the information technology industry.7–9 Instead of
information storage and retrieval by encoding “0” and “1” as the amount of
as read only memory (ROM), hybrid memory, and random access memory
(RAM). ROM is factory programmable only; data is physically encoded in the
circuit and cannot be programmed after fabrication. Hybrid memory allows
data to be read and re-written at any time. RAM requires the stored informa-
tion to be periodically read and re-written, or refreshed, otherwise the data
will be lost. Among these types of electronic memory, write-once read-many-
times (WORM) memory,7 hybrid non-volatile and rewritable (flash) memory,8
static random access memory (SRAM) and dynamic random access memory
(DRAM) are the most widely reported polymer memory devices.23,24
A WORM memory device can be used to store archival standards, data-
bases and other massive data where information has to be reliably preserved
for a long period of time. Conventional CD-Rs, DVD±Rs or programmable-
read-only-memory (PROM) devices are examples of WORM memory. Flash
memory is another type of non-volatile electronic memory. Different from
WORM memory, its stored state can be electrically reprogrammed and it has
the ability to write, read, erase and retain the stored state. Thus it is mutable
or rewritable in nature. Due to its non-volatility, no power is needed to main-
tain the information stored in flash memory. DRAM is a type of volatile
random access memory that stores each bit of data in a separate capacitor
within an integrated circuit. Since real-world capacitors have charge-leaking
tendencies, the stored data eventually fade unless the device is refreshed
periodically. Because of this periodical refresh requirement, it is a volatile
and dynamic memory. The volatility, ultrafast data access time and struc-
tural simplicity hold great promise for high density and fast responding per-
formance, making DRAM memory the main memory for most computers.
SRAM is another type of volatile memory. The term “static” differentiates it
from “dynamic” RAM (DRAM) which must be periodically refreshed. SRAM
exhibits data remanence, but it is still volatile and the stored data are eventu-
ally lost when the memory remains in the power-off state. SRAM is faster and
more reliable than the more common DRAM. Due to its high cost, SRAM is
often used only as a memory cache.
4 Chapter 1
Parameters of importance to the performance of a memory cell include
switching (write and erase) time, ON/OFF current ratio (or memory window),
read cycles, and retention ability. The switching time influences the rate
of writing and accessing the stored information, the ON/OFF current ratio
defines the control of the misreading rate during device operation, with a
higher value being essential for the device to function with minimal misread-
ing error, while the number of read cycles and retention ability are related to
1.3
History of Organic/Polymer Electronic
Memory Devices
Different forms of storage, based on various natural phenomena, have been
reported since the 1940s. A computer system usually contains several kinds
of storage, each with an individual purpose. In the 1960s, there was a great
interest in the electrical properties of amorphous semiconductors and disor-
dered structures, arising from their unusual electrical properties which also
make them promising materials for device applications.25,26
In 1968, Gregor observed bistable negative resistance in polymer mate-
rials and noted that a Pb/polydivinylbenzene/Pb bistable electrical switch-
ing device is capable of acting as an information storage device.27 In 1969,
Szymansk et al. reported bistable electrical conductivity phenomena in
thin tetracene films sandwiched between metal electrodes.28 In 1970, Sliva
et al. reported that devices based on Saran® wrap, phthalocyanines and
polystyrene all exhibited bistable switching behavior.29 Subsequently, Segui
et al. demonstrated reproducible bistable switching in polymer thin films
prepared by glow-discharge polymerization.30 Inspired by these pioneering
studies, a wide variety of organic and polymer materials have been explored
for threshold and memory switching effects.31–33 Many of the observed elec-
trical memory effects were due to the formation of filamentary conduction
paths, and the performance was not satisfactory for practical applications.
Memory switching effects in polymethylmethacrylate, polystyrene, polyeth-
ylmethacrylate and polybutylmethacrylate films were ascribed to field-con-
trolled polymer chain ordering and disordering.34 Memory switching effects
in poly(N-vinylcarbazole) (PVK) thin films were attributed to trapping–detrap-
ping processes associated with impurities in PVK.35
Studies of the transition behavior of some ferroelectric polymers began
in the 1980s.36–38 Thin films of ferroelectric materials can be repeatedly
switched between two stable ferroelectric polarization states, and are capa-
ble of exhibiting non-volatile memory effects. Polymer films obtained by
solution processing techniques were so thick that some devices required
operating voltages of at least 30 V. Bune et al. reported a major breakthrough
Organic Electronic Memory Devices 5
in the fabrication of ferroelectric films by the Langmuir–Blodgett (LB) tech-
nique in 1995.39 The resulting ferroelectric films are as thin as 1 nm and can
be switched using a voltage as low as 1 V.40 Rapid progress in polymer ferro-
electric random access memory (FeRAM) as a promising memory technology
has since been achieved.41–43
An organic transistor memory device using a sexithiophene oligomer as
the conductor and an inorganic ferroelectric material as the gate insulator
Figure 1.2
Statistics for publications on organic and polymer memory from 2000
to 2014. Data derived from ISI Web of Science.
Organic Electronic Memory Devices 7
worldwide since the year 2000. Research work on polymer memory before
2008 was summarized in a comprehensive review by Ling et al.22 Liu and
Chen highlighted recent developments in the field of D–A polymers for
resistive switching memory device applications.20 Chen et al. reviewed the
application of electrically, thermally and chemically modified graphene and
polymer-functionalized graphene derivatives for switching and information
storage applications.19 Most recently, Huang and coworkers summarized
1.4.1.1 Device Structure
The organic transistor inherits its design features from inorganic MOSFET
precursors.88,89 It is composed of three main components: source, drain
and gate electrodes, a dielectric insulator layer and an active semiconductor
layer, as illustrated in Figure 1.3a.22 The electrodes can be n- or p-Si, ITO,
PEDOT:PSS, TaN, Au, Pt, Al, Cu, Cr or other metals. Among these, Au elec-
trodes are often used for OFETs because the work function of gold is close
to the ionization potential of many polymer materials, which leads to an
ohmic contact in the device. An OFET memory device consists of at least one
8 Chapter 1
1.4.1.2 Operation Mechanism
A voltage applied to one pair of the transistor’s terminals (either source–
drain or source–gate) can change the current flowing through another pair
of terminals. The voltage applied between the source and drain is referred to
as the source–drain voltage, VD. The current flowing through the semicon-
ductor film from source to drain is referred to as the source–drain current,
ID. For a lightly doped or undoped semiconductor, the concentration of free
charge carriers in the channel is very low. When VG = 0 V, ID is very low and
the transistor is initially in the OFF state. With an increase in VG, a layer of
Organic Electronic Memory Devices 9
mobile charges from the source can accumulate at the interface between the
semiconductor and the insulator. Due to the increased charge carrier con-
centration in the semiconductor, ID increases significantly and turns the
transistor to the ON state.91 The gate threshold voltage (Vth) is defined as the
voltage necessary to induce mobile charges, that is, the gate voltage at which
the square root of the saturation ID begins to increase substantially. Alterna-
tively, field-effect transistor memory can also be operated at constant VG and
1.4.2.1 Device Structure
Several FeRAM structures, including 1T1C (T – transistor, C – capacitor),98
2T2C,99 1T2C100 and others, have been developed. The simplest DRAM and
FeRAM cells have similar structures, both utilizing 1T1C as the building
components. Figure 1.4a shows an image of a 1T1C FeRAM device, while a
schematic circuit diagram of the cell is shown in Figure 1.4b.98 The plate
line (PL) of a FeRAM device has a variable voltage level to enable the switch-
ing of the polarization of the ferroelectric capacitor. The upper electrode of
10 Chapter 1
the capacitor is made of Pt, Ir or Ru, and the lower electrode is Pt/Ti.101 The
local interconnect between the access transistor and the storage node of
the capacitor is TiN. These materials are refractive and can form conductive
oxides, such as IrOx or RuOx.
1.4.2.2 Operation Mechanism
Ferroelectric materials exhibit polarization–electric field hysteresis loops. As
shown in Figure 1.5, when voltages are applied from 0 V to +Vcc, the polariza-
tion state changes from point A to B to C progressively.22 Similarly, the polar-
ization state changes progressively from point D to E to F, with the applied
voltages increasing from 0 V to −Vcc. When voltages are applied from +Vcc
to 0 V and from −Vcc to 0 V, the polarization state changes, moving from
point C to D and from point F to A, respectively. The amount of polarization
charge can be maintained well, without reversing their direction. Under such
a situation, zero-voltage remnant polarization states with opposite direction
(Pr, points A and D) can be obtained by a large saturation voltage (±Vcc), and
can be reversed or switched by the coercive voltage (±Vc), the minimum value
of the voltage necessary to reverse, or switch, the polarization state. Thus, “0”
and “1” can be defined as the two stable states, “upward polarization” and
“downward polarization”, to apply ferroelectric characteristics to electronic
memory.22
“1” or “0” data can be written to a FeRAM cell by applying a voltage +Vcc or
−Vcc to both electrodes of the ferroelectric capacitor. For instance, to write
“0”, the word line (WL) is turned on (meaning that the access transistor is
on), the bit line (BL) is held at 0 V and the plate line (PL) is cycled from 0 V
to Vcc to 0 V (Figures 1.4b and 1.5).22 This polarizes the ferroelectric capac-
itor in the “0” state. After writing, data is retained even if the selected WL
becomes unselected (meaning that the transistor is off). When reading “0”
or “1” data from a cell, prior to selecting the WL, the BL must be precharged
to 0 V to retain the high-impedance condition. Next, the WL is selected and
Vcc is applied to the PL (Figures 1.4b and 1.5). For the cell in the “0” state,
there will be a minimal voltage change on the BL since the capacitor does
Organic Electronic Memory Devices 11
not switch the polarization direction. For the cell in the “1” state, there will
be a larger voltage variation on the BL since the capacitor switches the polar-
ization direction and the difference in compensating charge flows onto the
BL. When reading the “1” state, the reversal in polarity causes the data to be
destroyed, creating a “0” state. Therefore, it is necessary for the capacitor to
be re-polarized to the “1” state before closing the WL and moving on to the
next operation. To rewrite the “1” state, the BL voltage level is set at Vcc and
the PL voltage level is set at 0 V. Finally, the WL is turned off and the “1” state
is stored again (Figures 1.4b and 1.5).22 When reading the “0” state, since
no reversal of polarity occurs, the datum is not destroyed and the re-writing
process is not required.
1.4.3.1 Device Structure
Resistor-type electronic memory usually has a simple structure with an
organic/polymer thin film sandwiched between two electrodes on a support-
ing substrate (glass, silicon wafer, plastic or metal foil). The configuration
of the top and bottom electrodes can be either symmetric or asymmetric,
with aluminum, gold, copper, p- or n-doped silicon, and ITO being the most
widely used electrode materials. Test structures usually consist of a spin-
coated polymer thin film on the bottom electrode, for instance, ITO, with the
top electrodes deposited through a shadow mask via thermal evaporation in
a vacuum chamber. The area covered by the top electrode forms the active
device area. The basic configuration of a test memory device is shown in
Figure 1.6a. The individual memory cells can be integrated into a cross-bar
(two dimensional or 2D) memory array (Figure 1.6b), and further stacked
into three-dimensional (3D) data storage devices (Figure 1.6c). Each cell in
the 2D memory array or 3D stacked device can be identified by its unique
Cartesian coordinates. Due to the two terminal simple structure and the
nanoscale active organic/polymer thin film, high data storage density can be
realized in organic/polymer memory.
1.4.3.2 Operation Mechanism
Resistor-type memory is based on the change of the electrical conductivity
of materials in response to an applied voltage (electric field). Various mech-
anisms have been proposed to explain electrical conductance switching in
organic/polymer memory devices. Among them, the most widely reported
mechanisms include filament conduction, space charges and traps, charge
transfer effects, and conformational changes.
(δ < 0.4) forms, which is also insulating. If the donor has intermediate size
and ionization potential, it tends to form a weakly ionic salt with the accep-
tor, which possesses incomplete CT (0.4 < δ < 0.7) and thus is potentially
conductive. The formation of a conductive CT complex can be employed to
design molecular electronic devices. Many organic CT systems, including
organometallic complexes, carbon allotrope (fullerene, carbon nanotubes
and graphene)-based polymer complexes, gold nanoparticle–polymer com-
plexes, and single polymers with intra-molecular D–A structures have been
explored for memory applications.112–115
write–read–erase–reread cycles was greater than 106, and the retention time
reached 10 000 s without current degradation.
Organic dyes, such as phthalocyanines (Pc), porphyrins (Por) and xanthene
derivatives have also been explored for electrical memory effects. Ray et al.
fabricated bistable memory devices by using 70 nm thick spun films of PbPc
molecules sandwiched between an ITO substrate and Al top electrodes.138
The bistable electrical switching effects were attributed to the existence of
a depletion layer at the ITO/PbPc interface and an exponential distribution
of the energetics of traps in the non-active region of the PbPc films. Similar
phenomena can also be observed for some other phthalocyanine derivatives,
such as NiPc,105 CuPc139 and ZnPc.140 Pal et al. observed high electrical con-
ductance switching (ON/OFF ratio = 105) in single-layer sandwich structures
based on the organic molecule Rose Bengal (RB) at room temperature.141 A
molecular switching device utilizing LB monolayer films containing ZnPor
as a redox-active component has also been reported.142 Devices with the
structure metal/ZnPor LB monolayer/metal exhibited outstanding switching
diode and tunneling diode behavior at room temperature.
Organic memory devices with a triple-layer structure sandwiched between
two outer metal electrodes have been reported.143 The active layer of the
Organic Electronic Memory Devices 17
Figure 1.8 Chemical structures of D–A molecules, (b) macroscopic I–V charac-
(a)
teristics of ITO/TPDBCN/Al, (c) macroscopic I–V characteristics of ITO/
TPDYCN1/Al, (d) macroscopic I–V characteristics of ITO/TPDYCN2/Al,
and (e) comparison of the ON/OFF current ratio of (b) and (c). The inset
of (b) shows the device structure used for macroscopic I–V measure-
ments. Reproduced with permission from ref. 146, © 2010 WILEY-VCH
Verlag GmbH & Co. KGaA, Weinheim.
Organic Electronic Memory Devices 19
of the donor and acceptor within the molecular backbone plays a key role in
the electrical memory behavior of devices.
Lu and coworkers reported a simple DRAM device based on SNACA where the
electron acceptor naphthalimide (NA) and electron donor carbazole (CA) were
linked by a hydrazone bond (Figure 1.9a).147 The electrical switching behavior
of a Pt/SNACA/Al device is demonstrated in Figure 1.9c. From theoretical cal-
culations, it was found that during the HOMO to LUMO transition, the elec-
Figure 1.9
Molecular structures, and HOMO and LUMO energy levels of SNACA
(a) and CAPyNA (b); current–voltage (I–V) characteristics of the memory
device Pt/SNACA/Al (c) and ITO/CAPyNA/Al (d). Reproduced from ref.
147 and 148 with permission from The Royal Society of Chemistry.
20 Chapter 1
molecular skeleton to replace the original hydrazone bond between the carba-
zole unit and the naphthalimide moiety (Figure 1.9b and d).148
Small D–A molecules with multilevel stable states can lead to an increased
device capacity of 3n or larger. As illustrated in Scheme 1.3, a series of novel
small organic molecules have been designed and synthesized for ternary
data-storage devices.74–76,149–152 Figure 1.10a shows the I–V characteristics of an
ITO/DPKAZO/Al device.76 The device demonstrates typical non-volatile ternary
WORM memory behavior. As shown in Figure 1.10b, the I–V characteristics of
the ITO/FKAZO/Al device also exhibit non-volatile ternary WORM characteris-
tics. The two switching threshold voltages of FKAZO are markedly lower than
those of DPKAZO (−1.05 and −1.81 V compared to −1.50 and −2.61 V). The low
switching threshold voltages are due to the fact that FKAZO has a planar con-
formation (Figure 1.10c), which can generate a highly ordered arrangement
in the film and decrease the hole injection energy barrier. The charge carrier
transport process in the D–A molecule FKAZO (Figure 1.10d) was proposed to
explain the switching mechanism of the ternary memory device.
Song et al. reported a meta-conjugated donor–bridge–acceptor (DBA)
organic molecule for electronic multilevel storage.153 This DBA molecule is
Organic Electronic Memory Devices 21
exploited as the storage medium (Figure 1.11a) in which TPA acts as an elec-
tron donor and TCF acts as an electron acceptor. The D–A pair is separated by
a meta-conjugated bridge of a 2,7,12-trisubstituted truxene unit. As shown in
Figure 1.11b and c, the device with the structure of ITO/DBA/Al shows good
electrically bistable switching behavior between “0” (OFF) and “2” (HC-ON)
states in the dark, with a large ON/OFF ratio of more than 106. In cooperation
with UV light, a new “1” (LC-ON) state is addressable. This “1” state is “writ-
ten” from the “0” state, by a combination of UV light and a positive voltage
of +1.0 V, or from the “2” (HC-ON) state, by a combination of UV light and a
negative voltage of −3.4 V.
Certain organic materials and biomacromolecules possess great poten-
tial for application in biocompatible, low cost and disposable electronic
devices.154–156 Chen et al. used the sericin protein as the functional mate-
rial for the fabrication of flexible multilevel memory devices.154 Kundu
et al. reported the fabrication of transparent bio-memristor devices using
natural regenerated silk fibroin protein.155 As shown in Figure 1.12, by
sweeping the dc bias in 4 steps, the ITO/silk/Al device exhibits typical
pinch hysteresis-like I–V characteristics on a linear scale. The observed
22 Chapter 1
1.5.2.1 Functional Polyimides
Functional polyimides (PIs) are one of the most attractive polymeric materi-
als for organic electrical memory applications due to their good solution pro-
cessability, high thermal stability and mechanical strength.18 In functional
PIs, phthalimide acts as the electron acceptor, and electron donors (triphe-
nylamine or carbazole moieties) are introduced to form a D–A structure. An
electric field-induced CT state can be formed, which is the main mechanism
responsible for the memory behavior.157 Electronic memory devices based on
soluble PIs were first reported in 2006.59 As shown in Figure 1.13a, the func-
tional TP6F-PI contains triphenylamine as electron donor and phthalimide
as the acceptor. The hexafluoroisopropylidene (6F) group plays an important
role in increasing the solubility of the PIs due to its bulkiness and low surface
energy. TP6F-PI exhibited excellent thermal stability, with a 10% weight-loss
Figure 1.14
(a) Design strategy for starburst triarylamine-based polyimide
9Ph-6FDA. (b) I–V characteristics, and (c) appearance in various bent
states, and variation of current and threshold voltage with different
bending radii of the ITO/9Ph-6FDA/Al flexible memory device. Repro-
duced with permission from ref. 166, © 2013 WILEY-VCH Verlag
GmbH & Co. KGaA, Weinheim.
Organic Electronic Memory Devices 25
film-formation properties of the PI. As shown by the I–V characteristics of
Figure 1.14b, the device can switch from the OFF state to the ON state during
the negative sweep. The fifth sweep was conducted after turning off the power
for about 3 min. It was found that the ON state had relaxed to the steady OFF
state without an erasing process. The device could be reprogrammed to the
ON state again at a threshold voltage of −3.6 V. Thus the ITO/9Ph-6FDA/Al
flexible memory device exhibits SRAM memory behavior. Reliable and repro-
Figure 1.15
Donor–acceptor random copolymers with pendent triphenylamine
and 1,3,4-oxidazole for memory device applications. Reproduced with
permission from ref. 66, © 2011, American Chemical Society.
26 Chapter 1
oxadiazole-containing units (OXD or BOXD) can be tuned using the donor/
acceptor ratio or acceptor trapping ability.168 The electrical I–V character-
istics change between the diode, the volatile memory, and the insulator,
depending on the relative donor/acceptor ratios. The unstable ON state in
the P(VPK8OXD2) or P(VPK8BOXD2) device was due to shallow hole traps
with spontaneous back transfer of charge carriers when the electric field was
removed to produce volatile SRAM behavior.
1.5.2.3 Conjugated Polymers
Considerable effort has been devoted to develop novel conjugated polymers
for information and communication technology.178–180 The incorporation of
different electron acceptors into conjugated polymer donors significantly
affects the memory properties, while the induced trapping environment or
charge transfer channel determines the volatility of the memory device.20
D–A type conjugated polymers (Scheme 1.4) have been utilized to fabricate
29
permission from The Royal Society of Chemistry.
30 Chapter 1
190
material. The devices exhibited switching immediately after fabrication
and did not require the “electroforming” step required in many types of
memory device. The conductivity of the polythiophene layer could be revers-
ibly switched between high and low conductance states with a “write–erase”
(W–E) bias, with only minor degradation of response after 200 W–E cycles.
A poly(Schiff base) is a conjugated polymer with imine groups (C=N) in its
backbone. Li et al. fabricated an organic resistive switching memory device
reversible redox behavior, and its stable oxidized form ferrocenium (Fe3+),
which renders the possibility of non-volatility for memory applications.
Choi et al. synthesized a new conjugated polymer (PFT2-Fc) with redox-active
functionality, ferrocene, in the polymer main chain (Figure 1.18).197 The fab-
ricated Al/LiF/PFT2-Fc/ITO device exhibited non-volatile rewritable memory
behavior. Its switching mechanism involves ferrocene acting as a voltage-
dependent in-situ dopant during the redox process to result in the enhance-
ment of conductivity of the polymer film.
Ling et al. coupled 1.3 mol% of a rare-earth metal complex (Eu-complex)
with a carbazole donor to synthesize the D–A type functional copolymers,
PKEu (Scheme 1.5).112 The as-fabricated transparent and uniform film
avoided the phenomena of ion aggregation and phase separation commonly
found in mixed or doped systems. The Al/PKEu/ITO device exhibited non-
volatile rewritable memory behavior with an ON/OFF ratio as high as 104.
Transient current density versus time measurements indicated that the device
transition occurred in less than 20 µs. They further introduced 1,3,4-oxadi-
azole moieties (electron acceptors) into the polymer chains, to obtain a new
triblock copolymer, PCzOxEu.198 The device based on PCzOxEu exhibited
much better rewritable memory performance, with an ON/OFF current ratio
up to 105, a switching response time of ∼1.5 µs, more than 106 read cycles and
a retention time of more than 8 h.
Non-volatile flash memory devices using polyfluorenes containing Ir(iii)
complexes in the main chain (iamP1–iamP3) as the active material have
been reported.60 The fluorene moieties act as electron donors and the Ir(iii)
complex units as the electron acceptors. Charge transfer and traps in the
polymers are probably responsible for the conductance-switching behavior
Organic Electronic Memory Devices 33
stable triple state memory characteristics (i.e., low resistance state (LRS),
high resistance state (HRS) and interstate (IRS)), unlike triple layer devices
consisting of Al/PS:BCNT or PS:NCNT/Al. The ON/OFF ratios for LRS/IRS
and IRS/HRS were 50 and 15, respectively. The switching mechanism of the
CNT:PS composite memory devices follows a charge storage mechanism by
trapping and de-trapping.
Graphene nanosheets have been of particular interest for application in
organic–inorganic hybrid material-based memory devices.215–221 Figure 1.22
shows a schematic structure of the hydrogen bonding between poly(styrene-
block-4-vinylpyridine) (PS-b-P4VP) and GO sheets.217 The ITO/PS-b-P4VP:7
wt% GO composite/Al device exhibits a WORM memory effect with an ON/
OFF ratio of 105 at −1.0 V. The switching mechanism was attributed to the
38 Chapter 1
1.5.3.2 Organic–Inorganic Nanocomposites
Hybrid electronic memory devices have been reported in some organic
composites containing metal nanoparticles (NPs), quantum dots (QDs) and
metal oxide NPs.222–227 Yang et al. fabricated a memory device with the struc-
ture of a Au NP and 8-hydroxyquinoline-containing PS film sandwiched
between two metal electrodes.8 Electronic transitions were attributed to
electric field-induced charge transfer between the Au NPs and 8-hydroxy-
quinoline. Au NPs can also be introduced into electroactive polymers such
as P3HT,54 PANI224 and PVK226 to realize memory behavior. A rewritable
memory effect was demonstrated in a hybrid memory device with an active
layer consisting of P3HT and Au NPs capped with 1-dodecanethiol sand-
wiched between two metal electrodes.54 The device was fabricated through a
simple solution processing technique and exhibited remarkable electrically
bistable behavior.
In such electroactive polymer–metal nanoparticles hybrid systems,
the electroactive polymers usually act as electron donors while the metal
nanoparticles act as electron acceptors; the electrical bistability is related to
electric field-induced charge transfer between the two components. Thus,
the compatibility of the two components is crucial for optimal device perfor-
mance. Yang et al. reported a non-volatile rewritable memory device based on
polyaniline (PANI) nanofibers decorated with Au NPs.55 The active polymer
layer was created by growing nanometer sized gold particles within the PANI
nanofibers using a redox reaction with chloroauric acid. The solution synthe-
ses of PANI nanofibers with different sizes of autoreduced Au NPs were also
investigated and the relationship between Au NP size and bistable memory
response was evaluated (Figure 1.24).224 The performance of devices made
from four different solutions, with the Au NPs in four distinct size ranges is
shown in Figure 1.24g.
Metal NP–polymer hybrids have also been used in organic polymer
floating-gate transistor memory.82,85 Organic memory devices consisting
of P3HT electrospun nanofiber transistors functionalized with surface-
modified Au NPs have been reported.82 Figure 1.25 illustrates a prototypical
40 Chapter 1
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