P55 Datasheet
P55 Datasheet
P55 Datasheet
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA.
TMS320F28P550SJ, TMS320F28P559SJ-Q1
SPRSP85A – APRIL 2024 – REVISED SEPTEMBER 2024 www.ti.com
PWM channels, all supporting frequency-independent resolution modes, enable control of various power stages
from a 3-phase inverter to power factor correction and advanced multilevel power topologies.
The inclusion of the Configurable Logic Block (CLB) allows the user to add custom logic and potentially integrate
FPGA-like functions into the C2000 real-time MCU.
Interfacing is supported through various industry-standard communication ports (such as SPI, SCI, I2C, PMBus,
LIN, and CAN FD) and offers multiple pin-muxing options for optimal signal placement.
Want to learn more about features that make C2000 Real-Time MCUs the right choice for your real-time control
system? Check out The Essential Guide for Developing With C2000™ Real-Time Microcontrollers and visit the
C2000™ real-time control MCUs page.
The Getting Started With C2000™ Real-Time Control Microcontrollers (MCUs) Getting Started Guide covers all
aspects of development with C2000 devices from hardware to support resources. In addition to key reference
documents, each section provides relevant links and resources to further expand on the information covered.
Ready to get started? Check out the TMDSCNCD28P55X evaluation board or the LAUNCHXL-F28P55X
development kit, and download C2000Ware.
Package Information
PART NUMBER(1) PACKAGE(2) PACKAGE SIZE(3)
PDT (QFP, 128) 16mm x 16mm
PZ (QFP, 100) 16mm x 16mm
TMS320F28P559SJ-Q1(4)
PNA (QFP, 80) 12mm x 12mm
PM (QFP, 64) 12mm x 12mm
PDT (QFP, 128) 16mm x 16mm
PZ (QFP, 100) 16mm x 16mm
TMS320F28P550SJ PNA (QFP, 80) 12mm x 12mm
PM (QFP, 64) 12mm x 12mm
RSH (VQFN, 56) 7mm x 7mm
PDT (QFP, 128) 16mm x 16mm
PZ (QFP, 100) 16mm x 16mm
TMS320F28P559SG-Q1(4)
PNA (QFP, 80) 12mm x 12mm
PM (QFP, 64) 12mm x 12mm
PDT (QFP, 128) 16mm x 16mm
PZ (QFP, 100) 16mm x 16mm
TMS320F28P550SG(4) PNA (QFP, 80) 12mm x 12mm
PM (QFP, 64) 12mm x 12mm
RSH (VQFN, 56) 7mm x 7mm
(1) For more information on these devices, see the Device Comparison table.
(2) For more information, see the Mechanical, Packaging and Orderable Information section.
(3) Package size (length x width) is a nominal value and includes pins, where applicable
(4) Preview information (not Production Data).
C28x CPU
(150 MHz)
FPU32 CLA
Boot ROM
TMU (150 MHz)
VCRC
Secure ROM
Flash Bank0
128 Sectors, 256KB CLA to CPU MSG RAM
SYSTEM CONTROL
CPU Timers
XTAL Flash Bank1 CPU to CLA MSG RAM
INTOSC1, INTOSC2 128 Sectors, 256KB
PLL
ePIE
Windowed WD Flash Bank2 CLA Data ROM
NMI WD 128 Sectors, 256KB
CLA Program ROM
Flash Bank3
128 Sectors, 256KB
SECURITY
JTAG Lock Flash Bank4 CLA to DMA MSG RAM
Secure Boot 32 Sectors, 64 KB
DMA to CLA MSG RAM
M0-M1 RAM
4KB
DIAGNOSTICS Buses Legend
DCC
MPOST LS0-LS9 RAM CPU
ERAD 64KB
NPU CLA
JTAG/cJTAG
DMA
PF1 PF3 PF4 PF2 PF7 PF8 PF9 PF10 PF11 PF12
Result Data 1x PMBUS 2x CAN FD 1x LIN 3x SCI 2x CLB 1x USB 1x AES LFU
24x ePWM Channels
4x CMPSS NPU 2x I2C
(12Ch Hi-Res Capable) 5x 12-Bit ADC 65x GPIO 2x SPI
1x FSI RX
Input XBAR
2x eCAP 1x Buffered DAC 1x FSI TX
Output XBAR
ePWM XBAR
3x eQEP CLB XBAR
3x PGA
(CW/CCW Support)
CLB Input XBAR
CLB Output XBAR
A. The internal DAC from one of the CMPSS modules can be configured as an output DAC.
B. The LIN module can also be used as a SCI module.
Table of Contents
1 Features............................................................................1 6.17 Communications Peripherals................................ 179
2 Applications..................................................................... 2 7 Detailed Description....................................................212
3 Description.......................................................................3 7.1 Overview................................................................. 212
3.1 Functional Block Diagram........................................... 5 7.2 Functional Block Diagram....................................... 213
4 Device Comparison......................................................... 7 7.3 Memory................................................................... 214
4.1 Related Products........................................................ 9 7.4 Identification............................................................225
5 Pin Configuration and Functions.................................10 7.5 Bus Architecture – Peripheral Connectivity.............226
5.1 Pin Diagrams............................................................ 10 7.6 C28x Processor...................................................... 227
5.2 Pin Attributes.............................................................15 7.7 Control Law Accelerator (CLA)............................... 229
5.3 Signal Descriptions................................................... 40 7.8 Embedded Real-Time Analysis and Diagnostic
5.4 Pin Multiplexing.........................................................52 (ERAD)...................................................................... 231
5.5 Pins With Internal Pullup and Pulldown.................... 64 7.9 Direct Memory Access (DMA).................................232
5.6 Connections for Unused Pins................................... 65 7.10 Device Boot Modes...............................................233
6 Specifications................................................................ 67 7.11 Security................................................................. 240
6.1 Absolute Maximum Ratings...................................... 67 7.12 Watchdog.............................................................. 241
6.2 ESD Ratings – Commercial...................................... 68 7.13 C28x Timers..........................................................242
6.3 ESD Ratings – Automotive....................................... 69 7.14 Dual-Clock Comparator (DCC)............................. 243
6.4 Recommended Operating Conditions.......................70 7.15 Configurable Logic Block (CLB)............................244
6.5 Power Consumption Summary................................. 71 8 Reference Design........................................................ 246
6.6 Electrical Characteristics...........................................76 9 Device and Documentation Support..........................248
6.7 Special Considerations for 5V Fail-Safe Pins........... 78 9.1 Device Nomenclature..............................................248
6.8 Thermal Resistance Characteristics for PDT 9.2 Markings................................................................. 249
Package...................................................................... 79 9.3 Tools and Software................................................. 252
6.9 Thermal Resistance Characteristics for PZ 9.4 Documentation Support.......................................... 253
Package...................................................................... 79 9.5 Support Resources................................................. 255
6.10 Thermal Resistance Characteristics for PNA 9.6 Trademarks............................................................. 255
Package...................................................................... 79 9.7 Electrostatic Discharge Caution..............................255
6.11 Thermal Resistance Characteristics for PM 9.8 Glossary..................................................................255
Package...................................................................... 80 10 Revision History........................................................ 256
6.12 Thermal Resistance Characteristics for RSH 11 Mechanical, Packaging, and Orderable
Package...................................................................... 80 Information.................................................................. 259
6.13 Thermal Design Considerations..............................80 11.1 Package Option Addendum.................................. 260
6.14 System.................................................................... 81 TAPE AND REEL INFORMATION................................ 262
6.15 Analog Peripherals................................................124 TRAY.............................................................................264
6.16 Control Peripherals............................................... 168
4 Device Comparison
Table 4-1. Device Comparison
FEATURE(1) (4) F28P559SJ-Q1(3) (6) F28P550SJ F28P559SG-Q1(3) (6) F28P550SG(6)
C28x Subsystem
Frequency (MHz) 150
32-bit Floating-Point Unit (FPU) Yes
C28x VCRC Yes
TMU - Type 1 Yes - Type 1 - NLPID Instruction Supported
1: F28P559SJ9-Q1, 1: F28P559SG9-Q1,
Number F28P559SJ6-Q1 1 F28P559SG8-Q1 1
CLA - Type 2 0: F28P559SJ2-Q1 0: F28P559SG2-Q1
Frequency (MHz) 150
6-Channel DMA - Type 0 1
External Interrupts 5
MIPS 300 (CPU + CLA)
Memory
Main Array 1MB (4 x 256KB Banks) 512KB (2 x 256KB Banks)
F28P559SJ9-Q1, F28P550SJ9, F28P559SJ6-Q1, F28P550SJ6, F28P559SG9-Q1,
Flash 64KB Bank
F28P550SG9
User OTP 8KB 2KB
Dedicated 4KB
Local Shared RAM 64KB
RAM Message 1KB
Global Shared RAM 64KB 32KB
Total RAM 133KB 101KB
C28x CPUs and CLAs 512 bytes (256 bytes per direction)
Message RAM Types
DMAs and CLAs 512 bytes (256 bytes per direction)
ECC FLASH, Mx RAM
Parity ROM, CAN RAM, Message RAM, LSx RAM, GSx RAM
System
2 tiles - F28P559SJ9-Q1, F28P559SJ6-Q1, F28P550SJ9, F28P550SJ6, F28P559SG9-Q1,
Configurable Logic Block (CLB)
F28P550SG9, F28P559SG8-Q1, F28P550SG8
Neural-Network Processing Unit (NPU) 1 - F28P559SJ9-Q1, F28P550SJ9, F28P559SG9-Q1, F28P550SG9
Embedded Pattern Generator (EPG) 1
32-bit CPU Timers 3
Advanced Encryption Standard (AES) Accelerator 1
Live Firmware Update (LFU) Support Yes, with enhancements and flash bank erase time improvements
Security for on-chip flash and RAM Yes
Zero-pin Boot Yes
Secure Boot Yes
JTAG Lock Yes
MPOST Yes
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor
differences between devices that do not affect the basic functionality of the module. For more information, see the C2000 Real-Time
Control Peripherals Reference Guide.
(2) Time between start of sample-and-hold window to start of sample-and-hold window of the next conversion.
(3) The suffix -Q1 refers to AEC Q100 qualification for automotive applications.
(4) "-" on the feature entry indicates that the corresponding package type in not available.
(5) For devices that are available in more than one package, the peripheral count listed in the smaller package is reduced because the
smaller package has less device pins available. The number of peripherals internally present on the device is not reduced compared to
the largest package offered within a part number.
(6) Preview information (not Production Data).
4.1 Related Products
TMS320F280013x Real-Time Microcontrollers
The F280013x has common pinouts with the F28P55x series of devices. The F28P55x series adds CLA and
DMA support, in addition to faster CPU clock speed and increased memory size. Additionally the F28P55x has
Programmable Gain Amplifiers(PGA), USB, CLB and supports live FW update.
TMS320F28015x Real-Time Microcontrollers
The F280015x has common pinouts with the F28P55x series of devices. The F28P55x series adds CLA and
DMA support, in addition to faster CPU clock speed and increased memory size. Additionally the F28P55x
has Programmable Gain Amplifiers(PGA), USB, CLB and supports live FW update. The F280015x series has
lockstep C28x CPUs for safety related systems.
TMS320F28003x Real-Time Microcontrollers
The F28003x has common pinouts with the F28P55x series of devices. The F28P55x series has a faster overall
CPU clock and increased memory options in addition to Programmable Gain Amplifiers(PGA) and USB support.
The F28003x series offers SDFM support, along with BGCRC and HWBIST.
GPIO30
GPIO14
GPIO15
GPIO34
GPIO10
GPIO59
GPIO61
GPIO81
GPIO80
GPIO79
GPIO78
GPIO77
GPIO76
GPIO75
GPIO45
GPIO44
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
VDD
VSS
128
127
126
125
124
123
122
121
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
104
103
102
101
100
99
98
97
GPIO29 1 96 GPIO4
A16,B16,C16,GPIO28 2 95 GPIO8
XRSn 3 94 GPIO42
GPIO46 4 93 VREGENZ
VDDIO 5 92 VSS
VDD 6 91 GPIO43
VSS 7 90 VDD
GPIO47 8 89 VDDIO
GPIO66 9 88 GPIO19,X1
GPIO67 10 87 GPIO18,X2
GPIO48 11 86 GPIO74
GPIO49 12 85 GPIO73
GPIO50 13 84 GPIO72
GPIO51 14 83 GPIO71
GPIO52 15 82 GPIO58
GPIO53 16 81 GPIO57
GPIO54 17 80 GPIO56
A6,D14,E14,GPIO228 18 79 GPIO32
B2,C6,E12,GPIO226 19 78 GPIO35/TDI
A3,B3,C5,GPIO242,PGA2_INP 20 77 TMS
A2,B6,C9,GPIO224,PGA1_INP 21 76 GPIO37/TDO
A15,B9,C7,PGA1_INM 22 75 TCK
C25,D5,E5 23 74 GPIO70
A26,D6,E6 24 73 GPIO69
B26,D7,E7 25 72 GPIO68
A14,B14,C4,PGA1_OUT 26 71 GPIO27
A11,B10,C0,PGA2_OUT 27 70 GPIO26
A5,B12,C2,PGA2_INM 28 69 GPIO25
A1,B7,CMP1_DACL,D11 29 68 B25,D4,E4,GPIO24
A0,B15,C15,DACA_OUT 30 67 A25,D3,E3,GPIO17
D20,E20,VREFHI 31 66 C24,D2,E2,GPIO16
D20,E20,VREFHI 32 65 B24,D1,E1,GPIO33
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
Not to scale
A13,B13,C13,D13,E13,VREFLO
A13,B13,C13,D13,E13,VREFLO
A12,C1,E11,PGA3_INP
B11,D16,E16,PGA3_INM
A7,B30,C3,D12,E30
B5,D15,E15,PGA3_OUT
A8,B0,C11
VSSA
VDDA
A4,B8,C14
C26,D8,E8,GPIO211
A27,D9,E9,GPIO212
B27,D10,E10,GPIO213
C27,D18,E18,GPIO214
A28,D19,E19,GPIO215
A9,GPIO227
B4,C8,GPIO236
A10,B1,C10,GPIO230
GPIO55
GPIO60
VSS
VDD
VDDIO
GPIO64
GPIO65
GPIO62
GPIO63
A17,B17,C17,GPIO20
A18,B18,C18,GPIO21
A19,B19,C19,GPIO13
A20,B20,C20,GPIO12
A24,D0,E0,GPIO11
A. Only the GPIO function is shown on GPIO pins. See the Pin Attributes table for the complete, muxed signal name.
GPIO29
GPIO31
GPIO30
GPIO14
GPIO15
GPIO34
GPIO10
GPIO59
GPIO61
GPIO44
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
VDD
VSS
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
A16,B16,C16,GPIO28 1 75 GPIO4
XRSn 2 74 GPIO8
VDDIO 3 73 VREGENZ
VDD 4 72 VSS
VSS 5 71 VDD
GPIO47 6 70 VDDIO
GPIO48 7 69 GPIO19,X1
GPIO49 8 68 GPIO18,X2
GPIO50 9 67 GPIO58
GPIO51 10 66 GPIO57
GPIO52 11 65 GPIO56
GPIO53 12 64 GPIO32
GPIO54 13 63 GPIO35/TDI
A6,D14,E14,GPIO228 14 62 TMS
B2,C6,E12,GPIO226 15 61 GPIO37/TDO
B3,GPIO242,PGA2_INP 16 60 TCK
A2,B6,C9,GPIO224,PGA1_INP 17 59 GPIO27
A3,B9,C7,PGA1_INM 18 58 GPIO26
A14,B14,C4,PGA1_OUT 19 57 GPIO25
A11,B10,C0,PGA2_OUT 20 56 B25,D4,E4,GPIO24
B12,C2,PGA2_INM 21 55 A25,D3,E3,GPIO17
A1,B7,CMP1_DACL,D11 22 54 C24,D2,E2,GPIO16
A0,B15,C15,DACA_OUT 23 53 B24,D1,E1,GPIO33
D20,E20,VREFHI 24 52 A24,D0,E0,GPIO11
D20,E20,VREFHI 25 51 A20,B20,C20,GPIO12
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
Not to scale
A13,B13,C13,D13,E13,VREFLO
A13,B13,C13,D13,E13,VREFLO
A12,C5
C1,E11,PGA3_INP
B11,D16,E16,PGA3_INM
A7,B30,C3,D12,E30
B5,D15,E15,PGA3_OUT
VSSA
VDDA
A5
A4,B8
A8
A9,GPIO227
B4,C8,GPIO236
A10,B1,C10,GPIO230
B0,C11,GPIO253
C14,GPIO247
GPIO55
GPIO60
VSS
GPIO62
GPIO63
A17,B17,C17,GPIO20
A18,B18,C18,GPIO21
A19,B19,C19,GPIO13
A. Only the GPIO function is shown on GPIO pins. See the Pin Attributes table for the complete, muxed signal name.
GPIO14
GPIO15
GPIO34
GPIO10
GPIO45
GPIO44
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
VDD
VSS
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
GPIO30 1 60 GPIO3
GPIO31 2 59 GPIO4
GPIO29 3 58 GPIO8
A16,B16,C16,GPIO28 4 57 GPIO42
XRSn 5 56 VREGENZ
GPIO46 6 55 VSS
VDDIO 7 54 GPIO43
VDD 8 53 VDD
VSS 9 52 VDDIO
A6,D14,E14,GPIO228 10 51 GPIO19,X1
B2,C6,E12,GPIO226 11 50 GPIO18,X2
A3,B3,C5,GPIO242,PGA2_INP 12 49 GPIO32
A2,B6,C9,GPIO224,PGA1_INP 13 48 GPIO35/TDI
A15,B9,C7,PGA1_INM 14 47 TMS
A14,B14,C4,PGA1_OUT 15 46 GPIO37/TDO
A11,B10,C0,PGA2_OUT 16 45 TCK
A5,B12,C2,PGA2_INM 17 44 GPIO27
A1,B7,CMP1_DACL,D11 18 43 GPIO26
A0,B15,C15,DACA_OUT 19 42 GPIO25
D20,E20,VREFHI 20 41 B25,D4,E4,GPIO24
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
Not to scale
A13,B13,C13,D13,E13,VREFLO
A12,C1,E11,PGA3_INP
A7,B30,C3,D12,E30,PGA3_INM
A8,B0,C11,PGA3_OUT
VSSA
VDDA
A4,B8,C14
A9,B4,C8,GPIO227,GPIO236
A10,B1,C10,GPIO230
VSS
GPIO62
GPIO63
A17,B17,C17,GPIO20
A18,B18,C18,GPIO21
A19,B19,C19,GPIO13
A20,B20,C20,GPIO12
A24,D0,E0,GPIO11
B24,D1,E1,GPIO33
C24,D2,E2,GPIO16
A25,D3,E3,GPIO17
A. Only the GPIO function is shown on GPIO pins. See the Pin Attributes table for the complete, muxed signal name.
GPIO10
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
VDD
VSS
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
GPIO29 1 48 GPIO4
A16,B16,C16,GPIO28 2 47 GPIO8
XRSn 3 46 VREGENZ
VDD 4 45 VSS
VSS 5 44 VDD
A6,D14,E14,GPIO228 6 43 VDDIO
B2,C6,E12,GPIO226 7 42 GPIO19,X1
A3,B3,C5,GPIO242,PGA2_INP 8 41 GPIO18,X2
A2,B6,C9,GPIO224,PGA1_INP 9 40 GPIO32
A15,B9,C7,PGA1_INM 10 39 GPIO35/TDI
A14,B14,C4,PGA1_OUT 11 38 TMS
A11,B10,C0,PGA2_OUT 12 37 GPIO37/TDO
A5,B12,C2,PGA2_INM 13 36 TCK
A1,B7,CMP1_DACL,D11 14 35 B25,D4,E4,GPIO24
A0,B15,C15,DACA_OUT 15 34 A25,D3,E3,GPIO17
D20,E20,VREFHI 16 33 C24,D2,E2,GPIO16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
Not to scale
A13,B13,C13,D13,E13,VREFLO
A12,C1,E11,PGA3_INP
A7,B30,C3,D12,E30,PGA3_INM
A8,B0,C11,PGA3_OUT
VSSA
VDDA
A4,B8,C14
A9,B4,C8,GPIO227,GPIO236
A10,B1,C10,GPIO230
VSS
A17,B17,C17,GPIO20
A18,B18,C18,GPIO21
A19,B19,C19,GPIO13
A20,B20,C20,GPIO12
A24,D0,E0,GPIO11
B24,D1,E1,GPIO33
A. Only the GPIO function is shown on GPIO pins. See the Pin Attributes table for the complete, muxed signal name.
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
GPIO4
VDD
56
55
54
53
52
51
50
49
48
47
46
45
44
43
GPIO6 1 42 VREGENZ
GPIO29 2 41 VDD
A16,B16,C16,GPIO28 3 40 VDDIO
XRSn 4 39 GPIO19,X1
VDD 5 38 GPIO18,X2
A3,B3,C5,GPIO242,PGA2_INP 6 37 GPIO32
A2,B6,C9,GPIO224,PGA1_INP 7 36 GPIO35/TDI
VSS
A15,B9,C7,PGA1_INM 8 35 TMS
A14,B14,C4,PGA1_OUT 9 34 GPIO37/TDO
A11,B10,C0,PGA2_OUT 10 33 TCK
A5,B12,C2,PGA2_INM 11 32 B25,D4,E4,GPIO24
A1,B7,CMP1_DACL,D11 12 31 A25,D3,E3,GPIO17
A0,B15,C15,DACA_OUT 13 30 C24,D2,E2,GPIO16
D20,E20,VREFHI 14 29 B24,D1,E1,GPIO33
15
16
17
18
19
20
21
22
23
24
25
26
27
28
A13,B13,C13,D13,E13,VREFLO
A12,C1,E11,PGA3_INP
A7,B30,C3,D12,E30,PGA3_INM
A8,B0,C11,PGA3_OUT
VSSA
VDDA
A4,B8,C14
A9,B4,C8,GPIO227,GPIO236
A10,B1,C10,GPIO230
A17,B17,C17,GPIO20
A18,B18,C18,GPIO21
A19,B19,C19,GPIO13
A20,B20,C20,GPIO12
A24,D0,E0,GPIO11
Not to scale
A. Only the GPIO function is shown on GPIO pins. See the Pin Attributes table for the complete, muxed signal name.
Figure 5-5. 56-Pin RSH Very Thin Quad Flatpack No-Lead (Top View)
(1) On the 128-PDT package, VREFLO is assigned to pins 33 and 34; these pins should be tied together at the PCB level. On the 100-PZ
package, VREFLO is assigned to pins 26 and 27; these pins should be tied together at the PCB level.
(2) On the 128-PDT package, VREFHI is assigned to pins 31 and 32; these pins should be tied together at the PCB level. On the 100-PZ
package, VREFHI is assigned to pins 24 and 25; these pins should be tied together at the PCB level.
(1) On the 128-PDT package, VREFHI is assigned to pins 31 and 32; these pins should be tied together at the PCB level. On the 100-PZ
package, VREFHI is assigned to pins 24 and 25; these pins should be tied together at the PCB level.
(2) On the 128-PDT package, VREFLO is assigned to pins 33 and 34; these pins should be tied together at the PCB level. On the 100-PZ
package, VREFLO is assigned to pins 26 and 27; these pins should be tied together at the PCB level.
Note
If digital signals with sharp edges (high dv/dt) are connected to the AIOs, cross-talk can occur with
adjacent analog signals. Therefore, limit the edge rate of signals connected to AIOs if adjacent
channels are being used for analog functions.
(1) By default there are no signals connected to AGPIO pins. One of the other rows in the table must be chosen for pin functionality.
Note
If digital signals with sharp edges (high dv/dt) are connected to the AGPIOs, cross-talk can occur with
adjacent analog signals. The user must therefore limit the edge rate of signals connected to AGPIOs,
if adjacent channels are being used for analog functions.
The general schematic of analog subsystem with AGPIO implementation is illustrated in Figure 5-6. The
combinations of use cases for a specific analog input pin need special consideration are shown in Table 5-8.
The AGPIO analog pin path contains an extra series switch of 53Ω. This creates a low capacitance isolated
node shared by the ADC and CMPSS Comparator as shown in Figure 5-6. This node can be disturbed
when the ADC samples the channel (depending on the prior voltage stored on the ADC sample and hold
capacitor), and this disturbance can cause a false CMPSS event of up to 50ns. As shown in Table 5-8, special
considerations or workarounds need to be used for the combination of CMPSS Input, ADC Sampling, and
AGPIO. To accommodate this potential disturbance the following workarounds can be implemented:
1. Use a different pin (that is AIO pin type) for analog channels which need both ADC and CMPSS together.
2. Use the CMPSS Digital Filter with a setting of 50ns or greater, which filters the temporary disturbance.
3. Precondition the sample and hold capacitor of the ADC so the disturbance does not cause a false trip. For
example, perform a dummy read of a 3.3V connection from a different channel on the ADC immediately
before the impacted channel is read so the disturbance is in the positive direction, away from the false trip.
The opposite dummy read of a 0V signal can be used if the false trip is inverted in polarity.
CMPSS MUX
–
ADC MUX
Switch RON ADC
AGPIO switch
AIO pin
Cp Ch
GPIO
VREFLO
GPIO Logic
GPIO0 Asynchronous
Synchronous Input X-BAR
GPIOx Sync. + Qual.
Other Sources
INPUT16
INPUT15
INPUT14
INPUT13
INPUT12
INPUT10
INPUT11
INPUT9
INPUT8
INPUT7
INPUT6
INPUT5
INPUT4
INPUT3
INPUT2
INPUT1
127:16
eCAP1
eCAP2
INPUT[16:1]
15:0
EPG1IN1
EPG EPG1IN2
EPG1IN3
EPG1IN4
TZ1,TRIP1
TZ2,TRIP2 ePWM
DCCx Clock Source-0
TZ3,TRIP3 Modules
TRIP6
DCCx Clock Source-1
INPUT[1-14] CLB X-BAR
Output X-BAR
5.4.5 GPIO Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR
The Output X-BAR has eight outputs that can be selected on the GPIO mux as OUTPUTXBARx. The CLB
X-BAR has eight outputs that are connected to the CLB global mux as AUXSIGx. The CLB Output X-BAR has
eight outputs that can be selected on the GPIO mux as CLB_OUTPUTXBARx. The ePWM X-BAR has eight
outputs that are connected to the TRIPx inputs of the ePWM. The sources for the Output X-BAR, CLB X-BAR,
CLB Output X-BAR, and ePWM X-BAR are shown in Figure 5-8. For details on the Output X-BAR, CLB X-BAR,
CLB Output X-BAR, and ePWM X-BAR, see the Crossbar (X-BAR) chapter of the TMS320F28P55x Real-Time
Microcontrollers Technical Reference Manual.
EPG EPG1.EPGOUT
AUXSIG1
CTRIPOUTH AUXSIG2
AUXSIG3
CTRIPOUTL
CLB AUXSIG4
CLB
X-BAR AUXSIG5 Global
CMPSSx AUXSIG6 Mux
CTRIPH AUXSIG7
CTRIPL AUXSIG8
TRIP1
TRIP2
Input X-BAR INPUT1-14 TRIP3
TRIP4
TRIP5
TRIP6
FSI RXTRIG[1-3] TRIP7
ePWM TRIP8 All
X-BAR TRIP9 ePWM
CLB CLBx_OUT[0-7] TRIP10 Modules
TRIP11
ePWM and eCAP TRIP12
EXTSYNCOUT TRIP14
Sync Chain
TRIP15
Figure 5-8. Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR Sources
(1) Pins not bonded out in a given package will have the internal pullups enabled by the Boot ROM.
• No Connect
Analog input pins (except • Tie to VSSA
DACx_OUT)
• Tie to VSSA through resistor
DIGITAL
• No connection (input mode with internal pullup enabled)
GPIOx • No connection (output mode with internal pullup disabled)
• Pullup or pulldown resistor (any value resistor, input mode, and with internal pullup disabled)
When TDI mux option is selected (default), the GPIO is in Input mode.
GPIO35/TDI • Internal pullup enabled
• External pullup resistor
When TDO mux option is selected (default), the GPIO is in Output mode only during JTAG activity;
otherwise, it is in a tri-state condition. The pin must be biased to avoid extra current on the input buffer.
GPIO37/TDO • Internal pullup enabled
• External pullup resistor
• No Connect
TCK • Pullup resistor
(1) AGPIO pins share analog and digital functionality. The actions here only apply if these pins are also not being used for analog
functions.
6 Specifications
6.1 Absolute Maximum Ratings
over recommended operating conditions (unless otherwise noted)(1) (2)
MIN MAX UNIT
VDD with respect to VSS –0.3 1.5
Supply voltage VDDIO with respect to VSS –0.3 4.6 V
VDDA with respect to VSSA –0.3 4.6
VIN (3.3 V) –0.3 4.6 V
Input voltage (7)
VIN (5.0 V) (5) –0.3 6.0 V
Output voltage VO –0.3 4.6 V
IIK
Input clamp current - per pin (4) (6) - VIN < VSS/VSSA –20 20
- VIN > VDDIO/VDDA
Input clamp current - per pin: IIK
–20 mA
GPIO2/3/9/32 - VIN < VSS
IIKTOTAL
Input clamp current - total for all inputs (6) - VIN < VSS/VSSA –20 20
- VIN > VDDIO/VDDA
Output current Digital output (per pin), IOUT –20 20 mA
Operating junction temperature TJ –40 155 °C
Storage temperature(3) Tstg –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device
life. For additional information, see the Semiconductor and IC Package Thermal Metrics Application Note.
(4) Continuous clamp current per pin is ±2mA
(5) GPIO2, GPIO3, GPIO9, GPIO32 Only
(6) Applying a VIN greater than VDDIO/VDDA or less than VSS/VSSA will turn on the ESD current clamping diode causing additional
current flow to the respective supply rail. If this occurs, the current must be kept within the MIN/MAX listed to prevent permanent
damage to the device.
(7) Input clamp current must also be observed.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) Operation above TJ = 105°C for extended duration will reduce the lifetime of the device. See Calculating Useful Lifetimes of Embedded
Processors for more information.
(2) See the Power Management Module (PMM) section.
(3) Internal BOR is enabled by default.
(4) See the Power Management Module Operating Conditions table.
(5) These pins support applied voltage prior to the device being powered
(6) Applying a VIN greater than VDDIO/VDDA or less than VSS/VSSA will turn on the ESD current clamping diode causing additional
current flow to the respective supply rail. VDDIO/VDDA voltage will internally rise and could impact other electrical characteristics.
IDLE MODE
- CPU is in IDLE mode 30°C 30 mA
VDDIO current consumption - Flash is powered down
IDDIO 85°C 36 mA
while device is in Idle mode - PLL is Enabled,
SYSCLK=Max Device 125°C 54 mA
Frequency, CPUCLK is gated
- X1/X2 crystal is powered up
- Analog Modules are
VDDA current consumption while powered down
IDDA 125°C 3 mA
device is in Idle mode - Outputs are static without
DC Load
- Inputs are static high or low
STANDBY MODE (PLL Enabled)
- CPU is in STANDBY mode 30°C 8 mA
VDDIO current consumption - Flash is powered down
IDDIO 85°C 14 mA
while device is in Standby mode- PLL is Enabled, SYSCLK &
CPUCLK are gated 125°C 29 mA
- X1/X2 crystal is powered
down
- Analog Modules are
VDDA current consumption while powered down
IDDA 125°C 3 mA
device is in Standby mode - Outputs are static without
DC Load
- Inputs are static high or low
RESET MODE
30°C 10 mA
VDDIO current consumption
IDDIO 85°C 13 mA
while reset is active(2)
Device is under Reset 125°C 20 mA
VDDA current consumption while
IDDA 125°C 0.01 mA
reset is active(2)
(1) Brownout events during flash programming can corrupt flash data and permanently lock the device. Programming environments using
alternate power sources (such as a USB programmer) must be capable of supplying the rated current for the device and other system
components with sufficient margin to avoid supply brownout conditions.
(2) This is the current consumption while reset is active, that is XRSn is low.
IDLE MODE
- CPU is in IDLE mode 30°C 28 mA
VDD current consumption while - Flash is powered down
IDD 85°C 35 mA
device is in Idle mode - PLL is Enabled,
SYSCLK=Max Device 125°C 54 mA
Frequency, CPUCLK is gated 30°C 3 mA
VDDIO current consumption - X1/X2 crystal is powered up
IDDIO - Analog Modules are 85°C 6 mA
while device is in Idle mode
powered down 125°C 7 mA
- Outputs are static without
VDDA current consumption while DC Load
IDDA 125°C 3 mA
device is in Idle mode - Inputs are static high or low
STANDBY MODE (PLL Enabled)
- CPU is in STANDBY mode 30°C 6 mA
VDD current consumption while - Flash is powered down
IDD 85°C 12 mA
device is in Standby mode - PLL is Enabled, SYSCLK &
CPUCLK are gated 125°C 32 mA
- X1/X2 crystal is powered 30°C 3 mA
VDDIO current consumption down
IDDIO 85°C 6 mA
while device is in Standby mode - Analog Modules are
powered down 125°C 7 mA
- Outputs are static without
VDDA current consumption while DC Load
IDDA 125°C 3 mA
device is in Standby mode - Inputs are static high or low
RESET MODE
30°C 5 mA
VDD current consumption while
IDD 85°C 8 mA
reset is active(2)
125°C 15 mA
30°C 5 mA
Device is under Reset
VDDIO current consumption
IDDIO 85°C 5 mA
while reset is active(2)
125°C 5 mA
VDDA current consumption while
IDDA 125°C 0.01 mA
reset is active(2)
(1) Brownout events during flash programming can corrupt flash data and permanently lock the device. Programming environments using
alternate power sources (such as a USB programmer) must be capable of supplying the rated current for the device and other system
components with sufficient margin to avoid supply brownout conditions.
(2) This is the current consumption while reset is active, that is XRSn is low.
(1) This current represents the current drawn by the digital portion of the each module.
(1) See the Pins With Internal Pullup and Pulldown table for a list of pins with a pullup or pulldown.
(2) The analog pins are specified separately; see the Per-Channel Parasitic Capacitance tables that are in the ADC Input Model section.
(3) See the Power Management Module (PMM) section.
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
6.14 System
6.14.1 Power Management Module (PMM)
6.14.1.1 Introduction
The Power Management Module (PMM) handles all the power management functions required for device
operation.
6.14.1.2 Overview
The block diagram of the PMM is shown in Figure 6-2. As can be seen, the PMM comprises of various
subcomponents, which are described in the subsequent sections.
To Rest of Chip
MCU
PMM
I/O CPU Reset
POR RISE Release
DELAY
(80us)
I/O
BOR Internal
All RISE DELAY
Monitors (Ext VREG = 320us)
Release (Int VREG = 40us)
Signal
EN
VMONCTL.bit.BORLVMONDIS
VDD
POR
EN
OUT
IN
XRSn
VDD
VSS
VSS
External External
CVDDIO CVDD
Note
Not all the voltage monitors are supported for device operation in an application after boot up. In the
case where a voltage monitor is not supported, an external supervisor is recommended if the device
needs supply voltage monitoring while the application is running.
The three voltage monitors (I/O POR, I/O BOR, VDD POR) all have to release their respective outputs before the
device begins operation (that is, XRSn goes high). However, if any of the voltage monitors trips, XRSn is driven
low. The I/Os are held in high impedance when any of the voltage monitors trip.
Note
The level at which the I/O POR trips is well below the minimum recommended voltage for VDDIO, and
therefore should not be used for device supervision.
3.63 V +10%
Recommended
System Voltage
3.3 V 0% Regulator Range
VDDIO
Operating
Range
3.1 V –6.1%
VBOR-GB
BOR Guard Band
3.0 V –9.1%
VBOR-VDDIO
Internal BOR Threshold
2.81 V –14.8%
2.80 V –15.1%
Note
VDD POR is programmed at a level below the minimum recommended voltage for VDD, and therefore
it should not be relied upon for VDD supervision if that is required in the application.
VDD Monitoring:
• VDD supplied from the internal VREG: The VDD supply is derived from the VDDIO supply. The VREG is
designed in such a way that a valid VDDIO supply(monitored by the IO BOR) implies a valid VDD supply.
• VDD supplied from an external supply: The VDD POR is not supported for application use. If VDD monitoring
is required by the application, an external supervisor can be used to monitor the VDD rail.
Note
The use of an external supervisor with the internal VREG is not supported.If VDD monitoring is
required by the application, a package with a VREGENZ pin must be used to power VDD externally.
Note
The delay numbers specified in the block diagram are typical numbers.
Note
Not all device packages have VREGENZ pinned out. For packages without VREGENZ, external
VREG mode is not supported.
Note
Having the decoupling capacitor or capacitors close to the device pins is critical.
Note
Having the decoupling capacitor or capacitors close to the device pins is critical.
Note
All the supply pins per rail are tied together internally. For example, all VDDIO pins are tied together
internally, all VDD pins are tied together internally, and so forth.
CAUTION
If the above sequence is violated, device malfunction and possibly damage can occur as current will
flow through unintended parasitic paths in the device.
A. This trip point is the trip point before XRSn releases. See the Power Management Module Characteristics table.
B. This trip point is the trip point after XRSn releases. See the Power Management Module Characteristics table.
C. During power up, the All Monitors Release Signal goes high after all POR and BOR monitors are released. See the PMM Block
Diagram.
D. During power down, the All Monitors Release Signal goes low if any of the POR or BOR monitors are tripped. See the PMM Block
Diagram.
Note
The All Monitors Release Signal is an internal signal.
Note
If there is an external circuit driving XRSn (for example, a supervisor), the boot-up sequence does not
start until the XRSn pin is released by all internal and external sources.
VBOR-VDDIO-UP(A) VBOR-VDDIO-DN(B)
Internal Internal All
All Monitors Release Monitors Release
Signal(C) Signal(D)
XRSn XRSn
SRVDDIO-UP SRVDDIO-DN
VPOR-VDDIO VPOR-VDDIO
A. This trip point is the trip point before XRSn releases. See the Power Management Module Characteristics table.
B. This trip point is the trip point after XRSn releases. See the Power Management Module Characteristics table.
C. During power up, the All Monitors Release Signal goes high after all POR and BOR monitors are released. See the PMM Block
Diagram.
D. During power down, the All Monitors Release Signal goes low if any of the POR or BOR monitors are tripped. See the PMM Block
Diagram.
Note
The All Monitors Release Signal is an internal signal.
Note
If there is an external circuit driving XRSn (for example, a supervisor), the boot-up sequence does not
start until the XRSn pin is released by all internal and external sources.
CAUTION
Non-acceptable sequences leads to reliability concerns and possibly damage.
For simplicity, connecting all 3.3-V rails together and following the descriptions in Supply Pins Power Sequence
is recommended.
Note
The analog modules on the device should only be powered after VDDA has reached the minimum
recommended operating voltage.
Note
The toggling on XRSn has no adverse effect on the device as boot only starts once XRSn is steadily
high. However if XRSn from the device is used to gate the reset signal of other ICs, then the slew rate
requirement should be met to prevent this toggling.
VDD has a minimum slew rate requirement in external VREG mode. If the minimum slew rate is not met, the
VDD POR may release before the VDD operational minimum voltage is met and the device may not start in a
properly reset state.
(1) A bulk capacitor should also be used. The exact value of the decoupling capacitance depends on the system voltage regulation
solution that is supplying these pins.
(2) It is recommended to tie the 3.3V rails (VDDIO, VDDA) together and supply them from a single source.
(3) See the Supply Slew Rate section. Supply ramp rate faster than the maximum can trigger the on-chip ESD protection.
(4) See the Power Management Module (PMM) section on possible configurations for the total decoupling capacitance.
(5) TI recommends VBOR-VDDIO-GB to avoid BOR-VDDIO resets due to normal supply noise or load-transient events on the 3.3-V VDDIO
system regulator. Good system regulator design and decoupling capacitance (following the system regulator specifications) are
important to prevent activation of the BOR-VDDIO during normal device operation. The value of VBOR-VDDIO-GB is a system-level design
consideration; the voltage listed here is typical for many applications.
(6) Delay between when the 3.3-V rail ramps up and when the 1.2-V rail ramps up. See the VREG Sequence Summary table for the
allowable supply ramp sequences.
(7) Max capacitor tolerance should be 20%.
2.2 kW to 10 kW
Optional open-drain
XRSn
Reset source
£100 nF
The parameter th(boot-mode) must account for a reset initiated from any of these sources.
See the Resets section of the System Control chapter in the TMS320F28P55x Real-Time Microcontrollers
Technical Reference Manual.
CAUTION
Some reset sources are internally driven by the device. Some of these sources will drive XRSn low,
use this to disable any other devices driving the boot pins. The SCCRESET and debugger reset
sources do not drive XRSn; therefore, the pins used for boot mode should not be actively driven by
other devices in the system. The boot configuration has a provision for changing the boot pins in
OTP.
VDDIO VDDA
(3.3V)
VDD (1.2V)
tw(RSL1)
XRSn(A)
tboot-flash
Boot ROM
CPU
Execution
Phase
User code
th(boot-mode)(B) User code dependent
tw(RSL2)
XRSn
User code
CPU
Execution User code Boot ROM
Phase
Boot ROM execution starts
(initiated by any reset source) th(boot-mode)(A)
I/O Pins User-Code Dependent GPIO Pins as Input (Pullups are Disabled)
User-Code Dependent
A. After reset from any source (see the Reset Sources section), the Boot ROM code samples BOOT Mode pins. Based on the status of
the Boot Mode pin, the boot code branches to destination memory or boot code function. If Boot ROM code executes after power-on
conditions (in debugger environment), the Boot code execution time is based on the current SYSCLK speed. The SYSCLK will be
based on user environment and could be with or without PLL enabled.
(1) On reset, internal oscillator 2 (INTOSC2) is the default clock source for the PLL (OSCCLK).
WDCLK Watchdog
Timer
PERCLKDIVSEL.USBCLKDIV
/1 CLBCLKCTL
/2
. SYSCLK
USBBITCLK
.
.
/8 CLB_TILE_CLK
/1 /1 or /2
PLLCLK
/2
.
.
CLB_REG_CLK
.
SYSCLKDIVSEL /8
SYSCLK
SYS PLLSYSCLK
Divider NMIWD
INTOSC1 SYSPLL PLLRAWCLK
INTOSC2 OSCCLK
PLLCLKEN
X1 (XTAL)
OSCCLKRCSEL CPUCLK
CPU FPU
TMU
GSx RAMs
Boot ROM CLA ROM LSx RAMs
SYSCLK SYSCLK ePIE DCSM Mx RAMs
FLASH XINT Message RAM
GPIO WD System Control
KDIV
AUXCLKDIVSEL.MCANxCLKDIV
/1
0
/2
Reserved 1
.
AUXCLKIN(GPIO29) MCAN Bit Clock
2 .
PLLRAWCLK 3 .
/20
CLKSRCCTL2.MCANxBCLKSEL
SYSPLL
÷
IMULT
fOSCCLK
fPLLRAWCLK = × IMULT (1)
REFDIV + 1 ODIV + 1
6.14.3.2.1.3 X1 Input Level Characteristics When Using an External Clock Source - Not a Crystal
over recommended operating conditions (unless otherwise noted)
PARAMETER MIN MAX UNIT
X1 VIL Valid low-level input voltage (Buffer) –0.3 0.3 * VDDIO V
X1 VIH Valid high-level input voltage (Buffer) 0.7 * VDDIO VDDIO + 0.3 V
(1) The PLL lock time here defines the typical time that takes for the PLL to lock once PLL is enabled (SYSPLLCTL1[PLLENA]=1).
Additional time to verify the PLL clock using Dual Clock Comparator (DCC) is not accounted here. TI recommends using the latest
example software from C2000Ware for initializing the PLLs. For the system PLL, see InitSysPll() or SysCtl_setClock().
(1) PLL output frequency when OSCCLK is dead (Loss of OSCCLK causes PLL to Limp).
Microcontroller Microcontroller
* Available as a
+3.3 V
GPIO when X1 is
used as a clock
VDD Out
3.3-V Oscillator
Gnd
GPIO19 GPIO18
VSS X1 X2
XTAL Oscillator
Buffer
Comp
1
XCLKOUT
Circuit
[XTAL On]
Rbias
XCLKOUT
Pierce Inverter
Internal Internal
GPIO
X1
X2
External External
Rd
Crystal
CL1 CL2
GND GND
In this mode of operation, the clock on X1 is passed through a buffer (Buffer) to the rest of the chip. See
the X1 Input Level Characteristics When Using an External Clock Source (Not a Crystal) table for the input
requirements of the buffer.
6.14.3.4.2.1.2 XTAL Output on XCLKOUT
The output of the electrical oscillator that is fed to the rest of the chip can be brought out on XCLKOUT for
observation by configuring the CLKSRCCTL3.XCLKOUTSEL and XCLKOUTDIVSEL.XCLKOUTDIV registers.
See the GPIO Muxed Pins table for a list of GPIOs that XCLKOUT comes out on.
6.14.3.4.2.2 Quartz Crystal
Electrically, a quartz crystal can be represented by an LCR (Inductor-Capacitor-Resistor) circuit. However, unlike
an LCR circuit, crystals have very high Q due to the low motional resistance and are also very underdamped.
Components of the crystal are shown in Figure 6-15 and explained below.
Quartz Crystal
Internal External
Cm
Rm C0 CL
Lm
The effect of CL on the crystal is frequency-pulling. If the effective load capacitance is lower than the target, the
crystal frequency will increase and vice versa. However, the effect of frequency-pulling is usually very minimal
and typically results in less than 10-ppm variation from the nominal frequency.
6.14.3.4.2.3 GPIO Modes of Operation
On this device, X1 and X2 can be used as GPIO19 and GPIO18, respectively, depending on the operating mode
of the XTAL. Refer to the External Oscillator (XTAL) section of the TMS320F28P55x Real-Time Microcontrollers
Technical Reference Manual .
6.14.3.4.3 Functional Operation
2
ESR = Rm * 1 + C0
CL (2)
Note that ESR is not the same as motional resistance of the crystal, but can be approximated as such if the
effective load capacitance is much greater than the shunt capacitance.
6.14.3.4.3.2 Rneg – Negative Resistance
Negative resistance is the impedance presented by the electrical oscillator to the crystal. It is the amount of
energy the electrical oscillator must supply to the crystal to overcome the losses incurred during oscillation. Rneg
depicts a circuit that provides rather than consume energy and can also be viewed as the overall gain of the
circuit.
The generally accepted practice is to have Rneg > 3x ESR to 5x ESR to ensure the crystal starts up under
all conditions. Note that it takes slightly more energy to start up the crystal than it does to sustain oscillation;
therefore, if it can be ensured that the negative resistance requirement is met at start-up, then oscillation
sustenance will not be an issue.
Figure 6-16 and Figure 6-17 show the variation between negative resistance and the crystal components for this
device. As can be seen from the graphs, the crystal shunt capacitance (C0) and effective load capacitance (CL)
greatly influence the negative resistance of the electrical oscillator. Note that these are typical graphs; so, refer to
Table 6-5 for minimum and maximum values for design considerations.
6.14.3.4.3.3 Start-up Time
Start-up time is an important consideration when selecting the components of the crystal circuit. As mentioned
in the Rneg – Negative Resistance section, for reliable start-up across all conditions, it is recommended that the
Rneg > 3x ESR to 5x ESR of the crystal.
Crystal ESR and the dampening resistor (Rd) greatly affect the start-up time. The higher the two values, the
longer the crystal takes to start up. Longer start-up times are usually a sign that the crystal and components are
not a correct match.
Refer to Crystal Oscillator Specifications for the typical start-up times. Note that the numbers specified here are
typical numbers provided for guidance only. Actual start-up time depends heavily on the crystal in question and
the external components.
6.14.3.4.3.3.1 X1/X2 Precondition
On this device, the GPIO19/18 alternate functionality on X1/X2 can be used to speed up the start-up time of the
crystal if needed. This functionality is achieved by preconditioning the load capacitors CL1 and CL2 to a known
state before the XTAL is turned on. See the TMS320F28P55x Real-Time Microcontrollers Technical Reference
Manual for details.
(1) Start-up time is dependent on the crystal and tank circuit components. TI recommends that the crystal vendor characterize the
application with the chosen crystal.
2000 9
1500
1000
500
0
2 4 6 8 10 12 14 16
Effective CL (pF)
Rneg (Ohms)
1000 9
800
600
400
200
0
2 4 6 8 10 12 14 16
Effective CL (pF)
(1) INTOSC frequency may shift due to the thermal and mechanical stress of solder reflow. A post-reflow bake can restore the unit to its
original data sheet performance.
The F28P55x devices have a 128-bit prefetch buffer that provides high flash code execution efficiency across
wait states. Figure 6-18 and Figure 6-19 illustrate typical efficiency across wait-state settings compared to
previous-generation devices with a 64-bit prefetch buffer. Wait-state execution efficiency with a prefetch buffer
will depend on how many branches are present in application software. Two examples of linear code and
if-then-else code are provided.
100% 100%
95%
90%
90%
80%
Efficiency (%)
Efficiency (%)
85%
70% 80%
60% 75%
30% 55%
0 1 2 3 4 5 0 1 2 3 4 5
Wait State D005 Wait State D006
Figure 6-18. Application Code With Heavy 32-Bit Figure 6-19. Application Code With 16-Bit If-Else
Floating-Point Math Instructions Instructions
Note
The Main Array flash programming must be aligned to 64-bit address boundaries and each 64-bit
word may only be programmed once per write/erase cycle.
(1) Program time is at the maximum device frequency. Program time includes overhead of the flash state machine but does not include
the time to transfer the following into RAM:
• Code that uses flash API to program the flash
• Flash API itself
• Flash data to be programmed
In other words, the time indicated in this table is applicable after all the required code/data is available in the device RAM, ready for
programming. The transfer time will significantly vary depending on the speed of the JTAG debug probe used.
Program time calculation is based on programming 144 bits at a time at the specified operating frequency. Program time includes
Program verify by the CPU. The program time does not degrade with write/erase (W/E) cycling, but the erase time does.
Erase time includes Erase verify by the CPU and does not involve any data transfer.
(2) Erase time includes Erase verify by the CPU.
(3) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
(4) The combined total of bank and sector write/erase cycles is limited to this number
(1) Without arbitration between read/write/fetch. Access completes in 2 cycles; otherwise, arbitration priority (Write/Read/Fetch) is
followed.
Table 6-8. RAM Parameters – F28P55xSG
FETCH READ NUMBER OF NUMBER OF
STORE TIME BURST
RAM TYPE SIZE TIME(1) TIME(1) BUS WIDTH BUSES WAIT
(CYCLES) ACCESS
(CYCLES) (CYCLES) AVAILABLE STATES
LS RAM 64KB 2 2 1 16/32 bits 2 0 No
M0 2KB 2 2 1 16/32 bits 1 0 No
M1 2KB 2 2 1 16/32 bits 1 0 No
GS RAM 32KB 2 2 1 16/32 bits 2 0 No
CLA-to-CPU
Message 256B 2 2 1 16/32 bits 2 0 No
RAM
CPU-to-CLA
Message 256B 2 2 1 16/32 bits 2 0 No
RAM
CLA-to-DMA
Message 256B 2 2 1 16/32 bits 3 0 No
RAM
DMA-to-CLA
Message 256B 2 2 1 16/32 bits 3 0 No
RAM
(1) Without arbitration between read/write/fetch. Access completes in 2 cycles; otherwise, arbitration priority (Write/Read/Fetch) is
followed.
(1) Without arbitration between read/write/fetch. Access completes in 2 cycles; otherwise, arbitration priority (Write/Read/Fetch) is
followed.
6.14.7 Emulation/JTAG
The JTAG (IEEE Standard 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture) port has
four dedicated pins: TMS, TDI, TDO, and TCK. The cJTAG (IEEE Standard 1149.7-2009 for Reduced-Pin and
Enhanced-Functionality Test Access Port and Boundary-Scan Architecture) port is a compact JTAG interface
requiring only two pins (TMS and TCK), which allows other device functionality to be muxed to the traditional
GPIO35 (TDI) and GPIO37 (TDO) pins.
Typically, no buffers are needed on the JTAG signals when the distance between the MCU target and the JTAG
header is smaller than 6 inches (15.24 cm), and no other devices are present on the JTAG chain. Otherwise,
each signal should be buffered. Additionally, for most JTAG debug probe operations at 10 MHz, no series
resistors are needed on the JTAG signals. However, if high emulation speeds are expected (35 MHz or so), 22-Ω
resistors should be placed in series on each JTAG signal.
The PD (Power Detect) pin of the JTAG debug probe header should be connected to the board's 3.3-V supply.
Header GND pins should be connected to board ground. TDIS (Cable Disconnect Sense) should also be
connected to board ground. The JTAG clock should be looped from the header TCK output pin back to the
RTCK input pin of the header (to sense clock continuity by the JTAG debug probe). This MCU does not support
the EMU0 and EMU1 signals that are present on 14-pin and 20-pin emulation headers. These signals should
always be pulled up at the emulation header through a pair of board pullup resistors ranging from 2.2 kΩ to
4.7 kΩ (depending on the drive strength of the debugger ports). Typically, a 2.2-kΩ value is used.
Header pin RESET is an open-drain output from the JTAG debug probe header that enables board components
to be reset through JTAG debug probe commands (available only through the 20-pin header). Figure 6-20 shows
how the 14-pin JTAG header connects to the MCU’s JTAG port signals. Figure 6-21 shows how to connect to
the 20-pin JTAG header. The 20-pin JTAG header pins EMU2, EMU3, and EMU4 are not used and should be
grounded.
For more information about hardware breakpoints and watchpoints, see Hardware Breakpoints and Watchpoints
in CCS for C2000 devices.
For more information about JTAG emulation, see the XDS Target Connection Guide.
Note
JTAG Test Data Input (TDI) is the default mux selection for the pin. The internal pullup is disabled by
default. If this pin is used as JTAG TDI, the internal pullup should be enabled or an external pullup
added on the board to avoid a floating input. In the cJTAG option, this pin can be used as GPIO.
JTAG Test Data Output (TDO) is the default mux selection for the pin. The internal pullup is disabled
by default. The TDO function will be in a tri-state condition when there is no JTAG activity, leaving this
pin floating. The internal pullup should be enabled or an external pullup added on the board to avoid a
floating GPIO input. In the cJTAG option, this pin can be used as GPIO.
2.2 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A)
3 4
TDI TDI TDIS GND
MCU 3.3 V 100 Ω
5 6
3.3 V PD KEY
10 kΩ
(A)
7 8
TDO TDO GND
9 RTCK GND 10
A. TDI and TDO connections are not required for cJTAG option and these pins can be used as GPIOs instead.
3.3 V
2.2 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A)
3 TDI TDIS 4 GND
MCU TDI
3.3 V 100 Ω
3.3V 5 PD KEY 6
10 kΩ
(A)
7 TDO GND 8
TDO
9 RTCK GND 10
TCK
TDO
3 4
TDI/TMS
(1) Rise time and fall time vary with load. These values assume a 6-pF load.
GPIO
tr(GPO)
tf(GPO)
(1) "n" represents the number of qualification samples as defined by GPxQSELn register.
(2) For tw(GPI), pulse width is measured from VIL to VIL for an active low signal and VIH to VIH for an active high signal.
(A)
GPIO Signal GPxQSELn = 1,0 (6 samples)
1 1 0 0 0 0 0 0 0 1 0 0 0 1 1 1 1 1 1 1 1 1
SYSCLK
QUALPRD = 1
(SYSCLK/2)
(D)
Output From
Qualifier
A. This glitch will be ignored by the input qualifier. The QUALPRD bit field specifies the qualification sampling period. It can vary from 00 to
0xFF. If QUALPRD = 00, then the sampling period is 1 SYSCLK cycle. For any other value "n", the qualification sampling period in 2n
SYSCLK cycles (that is, at every 2n SYSCLK cycles, the GPIO pin will be sampled).
B. The qualification period selected through the GPxCTRL register applies to groups of eight GPIO pins.
C. The qualification block can take either three or six samples. The GPxQSELn Register selects which sample mode is used.
D. In the example shown, for the qualifier to detect the change, the input should be stable for 10 SYSCLK cycles or greater. In other words,
the inputs should be stable for (5 × QUALPRD × 2) SYSCLK cycles. This would ensure 5 sampling periods for detection to occur.
Because external signals are driven asynchronously, an 13-SYSCLK-wide pulse ensures reliable recognition.
SYSCLK
GPIOxn
tw(GPI)
6.14.9 Interrupts
The C28x CPU has fourteen peripheral interrupt lines. Two of them (INT13 and INT14) are connected directly
to CPU timers 1 and 2, respectively. The remaining twelve are connected to peripheral interrupt signals through
the enhanced Peripheral Interrupt Expansion (ePIE) module. The ePIE multiplexes up to sixteen peripheral
interrupts into each CPU interrupt line. It also expands the vector table to allow each interrupt to have its own
ISR. This allows the CPU to support a large number of peripherals.
An interrupt path is divided into three stages—the peripheral, the ePIE, and the CPU. Each stage has its
own enable and flag registers. This system allows the CPU to handle one interrupt while others are pending,
implement and prioritize nested interrupts in software, and disable interrupts during certain critical tasks.
Figure 6-27 shows the interrupt architecture for this device.
TINT0
TIMER0
TIMER1 INT13
TIMER2 INT14
Peripherals
See ePIE Table
tw(INT)
XINT1, XINT2, XINT3,
XINT4, XINT5
td(INT)
Address bus
Interrupt Vector
(internal)
(1) The Flash module is not powered down by hardware in any LPM. It may be powered down using software if required by the
application.
(2) The XTAL is not powered down by hardware in any LPM. It may be powered down by software setting the XTALCR.OSCOFF bit to 1.
This can be done at any time during the application if the XTAL is not required.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
XCLKOUT
tw(WAKE)
(A)
WAKE
A. WAKE can be any enabled interrupt, WDINT or XRSn. After the IDLE instruction is executed, a delay of five OSCCLK cycles (minimum)
is needed before the wake-up signal could be asserted.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
Wake-up
Signal
tw(WAKE-INT)
td(WAKE-STBY)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
(1) For applications using X1/X2 for OSCCLK, the user must characterize their specific oscillator start-up time as it is dependent on
circuit/layout external to the device. See the Crystal Oscillator (XTAL) section for more information. For applications using INTOSC1
or INTOSC2 for OSCCLK, see the Internal Oscillators section for toscst. Oscillator start-up time does not apply to applications using a
single-ended crystal on the X1 pin, as it is powered externally to the device.
Device
HALT HALT
Status
GPIOn
td(WAKE-HALT)
tw(WAKE-GPIO)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
Figure 6-32 shows the Analog Subsystem Block Diagram for the 128-/80-pin TQFP, the 64-pin LQFP, and the
56-pin VQFN.
Figure 6-33 shows the Analog Subsystem Block Diagram for the 100-pin LQFP.
Figure 6-34 shows the general overview of the analog group connections.
The analog pins and internal connections are given in Analog Pins and Internal Connections. Analog Signal
Descriptions lists descriptions of analog signals.
Input MUX
A2/B6/C9/PGA1_INP HPMXSEL0/ /LPMXSEL0/ DAC12
A0 to A30 Digital CTRIP2L
A11/B10/C0/PGA2_OUT HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1 ADC-A CMP2_LN
Filter
(128-pin) B5/D15/E15 HPMXSEL5/ /LPMXSEL5/ CTRIPOUT2L
AGPIO
12-bits
Analog Interconnect
AGPIO
AGPIO CMP2_LP
AIO
AIO
CMPSS1 Input MUX AIO Comparator Subsystem 3
REFLO CMP3_HP
Digital CTRIP3H
A10/B1/C10 HPMXSEL2/HNMXSEL0/LPMXSEL2/LNMXSEL0
HPMXSEL1/ /LPMXSEL1/ CMP3_HN VDDA Filter CTRIPOUT3H
A9
A12 HPMXSEL0/HNMXSEL1/LPMXSEL0/LNMXSEL1
DAC12
A5 HPMXSEL4/ /LPMXSEL4/
REFHI
DAC12 Digital CTRIP3L
ADC Inputs
Input MUX
AGPIO
AGPIO
CMP3_LN
AGPIO
B0 to B30 Filter CTRIPOUT3L
AIO
AIO
ADC-B
CMPSS2 Input MUX AIO CMP3_LP
12-bits
(64/80/128-pin) B2/C6/E12 HPMXSEL0/ /LPMXSEL0/ CMP4_HP Comparator Subsystem 4
B3/PGA2_INP HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0 REFLO Digital CTRIP4H
A14/B14/C4/PGA1_OUT HPMXSEL4/ /LPMXSEL4/ CMP4_HN VDDA Filter CTRIPOUT4H
B12/C2/PGA2_INM HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1
A3 HPMXSEL5/ /LPMXSEL5/ DAC12
AGPIO
AGPIO
A0/B15/C15/DACA_OUT HPMXSEL2/ /LPMXSEL2/ AGPIO
DAC12
AIO REFHI CMP4_LN Digital CTRIP4L
CMPSS3 Input MUX AIO
AIO ADC Inputs Filter CTRIPOUT4L
Input MUX
C0 to C30 ADC-C
B4/C8 HPMXSEL0/ /LPMXSEL0/ CMP4_LP
C14 HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0 12-bits
C1/E11/PGA3_INP HPMXSEL2/ /LPMXSEL2/
A8/B0/C11 HPMXSEL4/ /LPMXSEL4/
REFLO
(128-pin) B11/D16/E16 HPMXSEL5/ /LPMXSEL5/
A7/C3/D12/B30/E30 HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1
AGPIO
AGPIO
AGPIO
CMPSS4 Input MUX AIO
AIO
AIO
REFHI
ADC Inputs
Input MUX
D0 to D30 ADC-D
12-bits
REFLO
REFHI
ADC Inputs
Input MUX
E0 to E30 ADC-E
12-bits
REFLO
CMPSS Inputs
VREFHI
DACA_OUT 12-bit
Buffered
DAC-A
Input MUX
A2/B6/C9/PGA1_INP HPMXSEL0/ /LPMXSEL0/ DAC12
A0 to A30 Digital CTRIP2L
A11/B10/C0/PGA2_OUT HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1 ADC-A CMP2_LN
Filter
B5/D15/E15 HPMXSEL5/ /LPMXSEL5/ CTRIPOUT2L
AGPIO
12-bits
Analog Interconnect
AGPIO
AGPIO CMP2_LP
AIO
AIO
CMPSS1 Input MUX AIO Comparator Subsystem 3
REFLO CMP3_HP
Digital CTRIP3H
A10/B1/C10 HPMXSEL2/HNMXSEL0/LPMXSEL2/LNMXSEL0
HPMXSEL1/ /LPMXSEL1/
CMP3_HN VDDA Filter CTRIPOUT3H
A9
B0/C11 HPMXSEL3/ /LPMXSEL3/
DAC12
A12 HPMXSEL0/HNMXSEL1/LPMXSEL0/LNMXSEL1
REFHI
A5 HPMXSEL5/ /LPMXSEL5/ DAC12 Digital CTRIP3L
ADC Inputs CMP3_LN
Input MUX
AGPIO
AGPIO
AGPIO
B0 to B30 Filter CTRIPOUT3L
AIO
AIO
ADC-B
CMPSS2 Input MUX AIO CMP3_LP
12-bits
B2/C6/E12 HPMXSEL0/ /LPMXSEL0/ CMP4_HP Comparator Subsystem 4
B3/PGA2_INP HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0 REFLO Digital CTRIP4H
A14/B14/C4/PGA1_OUT HPMXSEL4/ /LPMXSEL4/ CMP4_HN VDDA Filter CTRIPOUT4H
B12/C2/PGA2_INM HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1
A3 HPMXSEL5/ /LPMXSEL5/ DAC12
AGPIO
AGPIO
A0/B15/C15/DACA_OUT HPMXSEL2/ /LPMXSEL2/ AGPIO
DAC12
AIO REFHI CMP4_LN Digital CTRIP4L
CMPSS3 Input MUX AIO
AIO ADC Inputs Filter CTRIPOUT4L
Input MUX
C0 to C30 ADC-C
B4/C8 HPMXSEL0/ /LPMXSEL0/ CMP4_LP
C14 HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0 12-bits
C1/E11/PGA3_INP HPMXSEL2/ /LPMXSEL2/
A8/B0/C11 HPMXSEL4/ /LPMXSEL4/
REFLO
B11/D16/E16 HPMXSEL5/ /LPMXSEL5/
A7/B30/C3/D12/E30 HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1
AGPIO
AGPIO
AGPIO
CMPSS4 Input MUX AIO
AIO
AIO
REFHI
ADC Inputs
Input MUX
D0 to D30 ADC-D
12-bits
REFLO
REFHI
ADC Inputs
Input MUX
E0 to E30 ADC-E
12-bits
REFLO
CMPSS Inputs
VREFHI
DACA_OUT 12-bit
Buffered
DAC-A
CMPxHNMX
CMPx_HN0 0
CMPx_HN1 CMPx_HN
1
To CMPSSx
CMPxLNMX
CMPx_LN0 0
CMPx_LN1 CMPx_LN
1
CMPxLPMX
CMPx_LP0
0
CMPx_LP1
1
CMPx_LP2
2
CMPx_LP3 CMPx_LP
3
CMPx_LP4 4
CMPx_LP5 5
CMPx_LP6 6
ADCA ADCA
AIO
AGPIO
ADCB ADCB
AIO
AGPIO
ADCC ADCC
AIO
TO Device Pins
AGPIO
To ADCs
ADCD ADCD
AIO
AGPIO
ADCE ADCE
AIO
PGAx_OUT
AGPIO
VDDA
PGAx_OUT_INT
PGAx_INP +
PGAx_INM
- PGAx_OUT
VSSA
Input connections to the CMPSS modules are selectable through a programmable input mux. Figure 6-34
demonstrates the connection between the input MUX of CMPSS modules, PGA modules, and ADC modules.
Table 6-11 shows the mapping of ADC input signals and PGA input and output signals to CMPSS mux inputs.
• To configure the CMPx_HP input mux for CMPSSx, write to the CMPxHPMXSEL field in the CMPHPMXSEL
analog subsystem register.
• To configure the CMPx_HN input mux for CMPSSx, write to the CMPxHNMXSEL field in the CMPHNMXSEL
analog subsystem register.
• To configure the CMPx_LP input mux for CMPSSx, write to the CMPxLPMXSEL field in the CMPLPMXSEL
analog subsystem register.
• To configure the CMPx_LN input mux for CMPSSx, write to the CMPxLNMXSEL field in the CMPLNMXSEL
analog subsystem register.
Table 6-11. CMPSS Input Mux Options
CMPSSx Input MUX CMP1 CMP2 CMP3 CMP4
HP0 A2, B6, C9, PGA1_INP A4, B8 B2,C6, E12 B4, C8
HP1 A11, B10, C0, PGA2_OUT A12 B12, C2, PGA2_INM A7, C3, D12, B30, E30,
HP2 A6, D14, E14(3) A9 A0, B15, C15, DACA_OUT C1, E11, PGA3_INP
A10, B1, C10
HP3 A15(2) B3, PGA2_INP C14
B0, C11(1)
A8
HP4 A1, B7, D11, CMP1_DACL A14, B14, C4, PGA1_OUT
B0, C11(2)
HP5 B5, D15, E15(4) A5(1) A3 B11, D16, E16(4)
HP6 PGA1_OUT_INT PGA3_OUT_INT PGA2_OUT_INT
HP7 TEMP SENSOR
HN0 A15(2) A10, B1, C10 B3, PGA2_INP C14
HN1 A11, B10, C0, PGA2_OUT A12 B12, C2, PGA2_INM A7, B30, C3, D12, E30
LP0 A2, B6, C9, PGA1_INP A4, B8 B2, C6, E12 B4, C8
LP1 A11, B10, C0, PGA2_OUT A12 B12, C2, PGA2_INM A7, B30, C3, D12, E30
LP2 A6, D14, E14(3) A9 A0, B15, C15, DACA_OUT C1, E11, PGA3_INP
A10, B1, C10
LP3 A15(2) B3, PGA2_INP C14
B0, C11(1)
A8
LP4 A1, B7, D11, CMP1_DACL A14, B14, C4, PGA1_OUT
B0, C11(2)
LP5 B5, D15, E15(4) A5(1) A3 B11, D16, E16(4)
LP6 PGA1_OUT_INT PGA3_OUT_INT PGA2_OUT_INT
LN0 A15 A10, B1, C10 B3, PGA2_INP C14
LN1 A11, B10, C0, PGA2_OUT A12 B12, C2, PGA2_INM A7, C3, D12, B30,E30
(1) These MUX options are available only on 100 QFP package.
(2) This MUX option is available only on 56 QFN, 64 QFP, 80 QFP, and 128 QFP packages.
(3) This MUX option is available only on 64 QFP, 80 QFP, 100 QFP, and 128 QFP packages.
(4) This MUX option is available only on 100 QFP and 128 QFP packages.
(1) Signal is bonded together with another signal as a single pin on this package.
(2) Internal connection only; does not come to a device pin.
(3) Only on 100 QFP package, AGPIO 247 is available.
Note
The GPIOs on the analog pins support full digital input and output functionality and are referred to as AGPIOs. By default, the AGPIOs are
unconnected; that is, the analog and digital functions are both disabled. For configuration details, see the Digital Inputs and Outputs on ADC
Pins (AGPIOs) section.
Note
Not every channel can be pinned out from all ADCs. See the Pin Configuration and Functions section
to determine which channels are available.
The block diagram for the ADC core and ADC wrapper are shown in Figure 6-35.
ADCEXTMUX[3:0]
ADCCLK SYSCLK
Clock Prescaler Analog to Digital Control Logic
SIGNALMODE
SIGNALMODE
RESOLUTION Post Processing Block
RESOLUTION
TRIGSEL
Triggers
CHSEL [15:0]
Reference Voltage Generator
[15:0] REPEATx (1-2)
ADCIN0 0 ACQPS Analog System Control
SOC Arbitration& TRIGSEL
ADCIN1 1 [15:0]
Control CHSEL MODE
ADCIN2 2 ADCSOC Input Circuit
NSEL
ADCIN3 3 [15:0]
EXTCHSEL PHASE
ADCIN4 4 SPREAD Converter
ADCIN5 5
ADCIN6 6 REPEATx (1-2)
...
...
ADCIN7 7 VIN+
ADCIN8 8 DOUT SOCxSTART[15:0] TRIGGER[15:0] SOCx (0-15)
ADCIN9 9 VIN-
ADCIN10 10 RESULT
ADCIN11 11 EOCx[15:0]
EOCx[15:0]
... ... S/H
Circuit Converter
ADCIN29 29
FREECOUNT
ADCIN30 30
ADCIN31 31 ADCRESULT 0–15 Regs
PPBxRESULT
Input Circuit Sample Correction
(OFFCAL, OFFREF, INV, ABS,
last-sample delta)
Analog to Digital Core
Oversampling and
Accumulation
(COUNT, SUM, MAX, MIN)
VREFHI ADCEVTINT
Limit Compare and Event
1 Logic, Digital Filters ADCEVT
Bandgap
Reference
0 ADCOSINT1
Circuit Post Processing Block (1-4)
REFPMUXSEL
ANAREFx1P65SEL
(1) Writing these values differently to different ADC modules could cause the ADCs to operate
asynchronously. For guidance on when the ADCs are operating synchronously or asynchronously,
see the Ensuring Synchronous Operation section of the Analog-to-Digital Converter (ADC) chapter
in the TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual .
6.15.4.1.1 Signal Mode
The ADC supports single-ended signaling. The input voltage to the converter is sampled through a single pin
(ADCINx), referenced to VREFLO.
Pin Voltage
VREFHI
VREFHI
ADCINx ADCINx
VREFHI/2 ADC
VREFLO
VREFLO
(VSSA)
Digital Output
2n - 1
ADC Vin
Note
The ADC inputs should be kept below VDDA + 0.3 V. If an ADC input goes above this level, ADC
disturbances to other channels may occur by two mechanisms:
• ADC input overvoltage will overdrive the CMPSS mux, disturbing all other channels which share a
common CMPSS mux. This disturbance will be continuous regardless of if the overvoltage input is
sampled by the ADC
• When the ADC samples the overvoltage ADC input, VREFHI will be pulled up to a higher level.
This will disturb subsequent ADC conversions on any channel until the VREF stabilizes
Note
The VREFHI pin must be kept below VDDA + 0.3 V to ensure proper functional operation. If the
VREFHI pin exceeds this level, a blocking circuit may activate, and the internal value of VREFHI may
float to 0 V internally, giving improper ADC conversion.
(1) The sample window must also be at least as long as 1 ADCCLK cycle for correct ADC operation.
(2) In internal reference mode, the reference voltage is driven out of the VREFHI pin by the device. The user should not drive a voltage
into the pin in this mode.
(1) Load current on VREFHI increases when ADC input is greater than VDDA. This causes inaccurate conversions.
(2) A ceramic capacitor with package size of 0805 or smaller is preferred. Up to ±20% tolerance is acceptable.
(3) IO activity is minimized on pins adjacent to ADC input and VREFHI pins as part of best practices to reduce capacitive coupling and
crosstalk.
(4) Variation across all channels belonging to the same ADC module.
(5) Worst case variation compared to other ADC modules.
(6) Frequency tolerance over temperature of the INTOSC results in lower SNR versus external clock, due to FFT uncertainty
0x006
0x005
0x004
Digital Output Code
0x003
0x002
0x001
DNL Error
0x000
= INL Error
VREFHI – VREFLO
R=
2^n
ADC
ADCINx
Rs
Switch Ron
AC Cp Ch
VREFLO
This input model should be used with actual signal source impedance to determine the acquisition window
duration. For more information, see the Choosing an Acquisition Window Duration section of the Analog-
to-Digital Converter (ADC) chapter in the TMS320F28P55x Real-Time Microcontrollers Technical Reference
Manual. For recommendations on improving ADC input circuits, see the ADC Input Circuit Evaluation for C2000
MCUs Application Note.
Table 6-16. Per-Channel Parasitic Capacitance for 128-Pin QFP
Cp (pF)
ADC CHANNEL
COMPARATOR DISABLED COMPARATOR ENABLED
A0, B15, C15, DACA_OUT 6.1 9.6
A9 3.7 8.7
C5 5.4 5.4
A5 4.2 7.6
A9 3.7 8.7
C5 5.4 5.4
A9 3.7 8.7
C5 5.4 5.4
A9 3.7 8.7
C5 5.4 5.4
A9 3.7 8.7
C5 5.4 5.4
Input on SOC0.CHSEL
Input on SOC1.CHSEL
Sample n+1
SYSCLK
ADCCLK
ADCTRIG
ADCSOCFLG.SOC0
ADCSOCFLG.SOC1
ADCINTFLG.ADCINTx
tSH tLAT
tEOC
tINT
Figure 6-44. ADC Timings for 12-bit Mode in Early Interrupt Mode
Sample n
Input on SOC0.CHSEL
Input on SOC1.CHSEL
Sample n+1
SYSCLK
ADCCLK
ADCTRIG
ADCSOCFLG.SOC0
ADCSOCFLG.SOC1
ADCINTFLG.ADCINTx
tSH tLAT
tEOC
tINT
Figure 6-45. ADC Timings for 12-bit Mode in Late Interrupt Mode
(1) By default, tINT occurs one SYSCLK cycle after the S+H window if INTPULSEPOS is 0. This can be changed by writing to the OFFSET
field in the ADCINTCYCLE register.
Table 6-23. ADC Timings in 12-bit Mode with SAMPCAPRESETSEL = 1
ADCCLK Prescale SYSCLK Cycles
ADCCTL2. tINT tINT
Prescale Ratio tEOC tLAT tDMA
PRESCALE (Early)(1) (Late)
0 1 14 19 1 14 19
2 2 28 33 1 28 33
3 2.5 35 40 1 35 40
4 3 42 47 1 42 47
5 3.5 49 54 1 49 54
6 4 56 61 1 56 61
7 4.5 63 68 1 63 68
8 5 70 75 1 70 75
9 5.5 77 82 1 77 82
10 6 84 89 1 84 89
11 6.5 91 96 1 91 96
12 7 98 103 1 98 103
13 7.5 105 110 1 105 110
14 8 112 117 1 112 117
15 8.5 119 124 1 119 124
(1) By default, tINT occurs one SYSCLK cycle after the S+H window if INTPULSEPOS is 0. This can be changed by writing to the OFFSET
field in the ADCINTCYCLE register.
CMPSS Module
GPIO Mux
CMP1_HP Comparator Subsystem 1 CTRIP1H ePWM X-BAR
Digital CTRIP1H
CMP1_HN VDDA Filter CTRIPOUT1H CTRIP1L ePWMs
DAC12 CMP1_DACL CTRIP2H
CTRIP1L
Output X-BAR
DAC12 Digital
CMP1_LN CTRIP2L
Filter CTRIPOUT1L
CMP1_LP CTRIP3H ePWM X-BAR ePWMs
CMP2_HP Comparator Subsystem 2
CTRIP2H CTRIP3L
Digital
CMP2_HN VDDA Filter CTRIPOUT2H CTRIP4H
DAC12 CTRIP4L
CTRIP2L
DAC12 Digital
CMP2_LN
Filter CTRIPOUT2L
CMP2_LP
CMP3_HP Comparator Subsystem 3
Digital CTRIP3H
CMP3_HN VDDA Filter CTRIPOUT3H
DAC12
CTRIPOUT1H
DAC12 Digital CTRIP3L
CMP3_LN
Filter CTRIPOUT3L CTRIPOUT1L
CMP3_LP CTRIPOUT2H
CMP4_HP Comparator Subsystem 4
CTRIPOUT2L
Digital CTRIP4H
CMP4_HN VDDA Filter CTRIPOUT4H CTRIPOUT3H Output X-BAR GPIO Mux
DAC12
CTRIPOUT3L
DAC12 Digital CTRIP4L
CMP4_LN
Filter CTRIPOUT4L CTRIPOUT4H
CMP4_LP
CTRIPOUT4L
ASYNCH
SYSCLK > COMPDACHCTL[SWLOADSEL] COMPCTL[COMPHINV] 3 CTRIPH Digital Filter
CMPx_HP SYSCLK SYNCH
EPWMSYNCPER_H + 2 To EPWM X-BAR
COMPSTS[COMPHSTS]
>
COMPSTS[COMPLSTS] D Q 0 1 CTRIPOUTH Output MUX
>
_ R
1 1
>
TRIGSYNCH COMPCTL[CTRIPOUTHSEL] CMPSS DAC
EN CMPx_HN 1 . R Q
EXT_FILTIN_H . OR CMPSS Buffered DAC
Ramp Generator(H) 1 n
COMPCTL[COMPHSOURCE] 0 0
COMPDACHCTL[RAMPSOURCE]+ COMPSTS[COMPHLATCH]
16*COMPDACHCTL2[RAMPSOURCEUSEL] CTRIPHFILCTL[FILTINSEL] 1
COMPDACHCTL[DACSOURCE] OR
COMPSTSCLR[HSYNCCLREN]
EPWM1SYNCPER 0 COMPCTL[ASYNCHEN]
EPWM2SYNCPER 1 EPWMSYNCPER_H 0 0 COMPSTSCLR[HLATCHCLR]
EPWM3SYNCPER 2
OR
EPWMBLANK_H 1
... … AND
EPWMnSYNCPER n-1 COMPDACHCTL[BLANKEN]
COMPSTSCLR[LSYNCCLREN]
COMPSTSCLR[LLATCHCLR]
EPWMSYNCPER_L
COMPDACLCTL[RAMPSOURCE]+ 0 0 COMPCTL[ASYNCLEN]
OR
16*COMPDACLCTL2[RAMPSOURCEUSEL] COMPDACLCTL[BLANKEN]
AND OR
COMPDACHCTL[BLANKSOURCE]+ 1 0 0
EPWMBLANK_L
16*COMPDACHCTL2[BLANKSOURCEUSEL] COMPSTS[COMPLLATCH]
COMPDACHCTL[SWLOADSEL] 1
EPWM1BLANK CMPx_LP CTRIPLFILCTL[FILTINSEL]
0 SYSCLK > + OR
EPWM2BLANK 1 R Q
EPWM3BLANK D Q 0 0
>
2 12-bit COMPL 0 Digital COMPCTL[CTRIPLSEL]
R
>
... … DACLVALS 0
DACL 0 D RQ Filter S
D Q 1 _ 1 1
EPWMnBLANK n-1 3 CTRIPL
CMPx_LN 1 . COMPSTS[COMPLSTS]
DACLVALA 2 To EPWM X-BAR
>
EN EXT_FILTIN_L . SYNCL
COMPDACLCTL[BLANKSOURCE]+ n SYSCLK 1 CTRIPOUTL
ASYNCL To OUTPUT X-BAR
16*COMPDACLCTL2[BLANKSOURCEUSEL] 1 COMPCTL[COMPLSOURCE] 0
Ramp Generator(L) 0 COMPCTL[COMPLINV] To LPM Wakeup
COMPCTL[CTRIPOUTLSEL]
COMPDACLCTL[DACSOURCE] CMPxDACL
TRIGSYNCL
>>1 1 Buer To Pin
Each reference 12-bit DAC can be configured to drive a reference voltage into the negative input of the
respective comparator. Some CMPSS instances also allow the low DAC output to be routed to a pin to act as
an external DAC. In this case, all other CMPSS module functionality is not useable, including the high DAC, both
comparators, ramp generation, and the digital filters. The reference 12-bit DAC is illustrated in Figure 6-48.
VDDA DACREF
12-bit DACOUTH
DACHVALA DACH To COMPH
12-bit DACOUTL
DACLVALA DACL To COMPL
VSSA
Figure 6-48. Reference DAC Block Diagram
(1) The CMPSS DAC is used as the reference to determine how much hysteresis to apply. Therefore, hysteresis will scale with the
CMPSS DAC reference voltage. Hysteresis is available for all comparator input source configurations.
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Hysteresis
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Offset Error
Ideal Gain
Actual Gain
Linearity Error
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) DAC can drive a minimum resistive load of 1 kΩ, but the output range will be limited.
(3) This is the linear output range of the DAC. The DAC can generate voltages outside this range, but the output voltage will not be linear
due to the buffer.
(4) For best PSRR performance, VREFHI should be less than VDDA.
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) Gain error is calculated for linear output range.
(3) VREFHI = 3.2 V, VDDA = 3.3 V DC + 100 mV Sine.
(4) 11-bit effective (monotonic response).
VDDA
DACVALS D Q 0
12-bit DACOUT
DACVALA
DAC
D Q 1
EPWM1SYNCPER
0
EN
EPWM2SYNCPER
1
EPWM3SYNCPER VSSA VSSA
2
...
... DACCTL[MODE]
EPWMnSYNCPER (Select x1 or x2 gain)
n-1
DACCTL[SYNCSEL]
A. VDAC is not available for this device; so, VREFHI and VSSA are the reference voltages.
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) DAC can drive a minimum resistive load of 1 kΩ, but the output range will be limited.
(3) This is the linear output range of the DAC. The DAC can generate voltages outside this range, but the output voltage will not be linear
due to the buffer.
(4) For best PSRR performance, VREFHI should be less than VDDA.
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) Per active Buffered DAC module.
(3) Gain error is calculated for linear output range.
(4) The DAC output is monotonic.
(5) VREFHI = 3.2 V, VDDA = 3.3 V DC + 100 mV Sine.
FILT_RES_SEL
PGA_INP +
_ PGA_OUT
RFILT
(1) This is the linear output range of the PGA. The PGA can output voltages outside this range, but the voltages will not be linear.
Time-Base (TB)
CTR=PRD
EPWMxSYNCI
TBCTL[PHSEN]
TBCTL[SWFSYNC]
Counter
DCAEVT1/sync(A)
Up/Down
(16 bit) DCBEVT1/sync(A)
CTR=ZERO
TBCTR
Active (16) CTR_Dir CTR=PRD EPWMx_INT
CTR=ZERO
TBPHSHR (8)
CTR=PRD or ZERO EPWMxSOCA
16 8
CTR=CMPA Event On-chip
Phase EPWMxSOCB
TBPHS Active (24) Trigger ADC
Control CTR=CMPB
And
CTR=CMPC
Interrupt
CTR=CMPD (ET) ADCSOCOUTSELECT
Counter Compare (CC)
CTR_Dir
Action
CTR=CMPA Qualifier DCAEVT1.soc(A) Select and pulse stretch
(AQ) DCBEVT1.soc(A) for external ADC
CMPAHR (8)
16 HiRes PWM (HRPWM)
CMPAHR (8)
CMPA Active (24) ADCSOCAO
ADCSOCBO
CMPA Shadow (24) EPWMA ePWMxA
A. These events are generated by the ePWM digital compare (DC) submodule based on the levels of the TRIPIN inputs.
TBCTL2[OSHTSYNC]
TBCTL3[OSSFRCEN]
GLDCTL2[OSHTLD]
SWFSYNC
:ULWH ³1´ WR
:ULWH ³1´ WR
CTR=ZERO
CTR=CMPB
CTR=CMPC
TBCTL2[OSHTSYNCMODE]
CTR=CMPD
CLR
DCAEVT1.sync One Shot
DCBEVT1.sync Latch
0
Set Q
EPWMSYNCOUTEN
1
SWEN
ZEROEN
0 0
CMPBEN
1 EPWMxSYNCOUT
CMPCEN OR 1
0
CMPDEN
DCARVT1EN
TBCTL2[SELFCLRTRREM]
DCBEVT1EN
Disable Clear
Register
EPWM1SYNCOUT 0
|
|
|
EPWMxSYNCOUT
EPWMxSYNCIN HRPCTL[PWMSYNCSELX]
ECAP1SYNCOUT CTR=CMPC UP
|
|
|
CTR=CMPC DOWN
ECAPySYNCOUT CTR=CMPD UP EPWMxSYNCPER
Other Sources CTR=CMPD DOWN CMPSS
DAC
HRPCTL[PWMSYNCSEL]
EPWMSYNCINSEL CTR=PRD
CTR=ZERO
Note: SYNCO and SYNCOUT are used interchangeably
EPWMCLK
tw(TZ)
(A)
TZ
td(TZ-PWM)
(B)
PWM
(1) The MEP step size will be largest at high temperature and minimum voltage on VDD. MEP step size will increase with higher
temperature and lower voltage and decrease with lower temperature and higher voltage.
Applications that use the HRPWM feature should use MEP Scale Factor Optimizer (SFO) estimation software functions. See the TI
software libraries for details of using SFO functions in end applications. SFO functions help to estimate the number of MEP steps per
SYSCLK period dynamically while the HRPWM is in operation.
tw(ADCSOCL)
ADCSOCAO
or
ADCSOCBO
SYNC
ECAPxSYNCIN
OVF CTR_OVF CTR [0−31]
ECAPxSYNCOUT TSCTR
PWM
(counter−32 bit) Output
Delta−Mode PRD [0−31] Compare
RST X-Bar
Logic
CMP [0−31]
32
CTR=PRD
CTR [0−31]
CTR=CMP
32
PRD [0−31]
HRCTRL[HRE] ECCTL1 [ CAPLDEN, CTRRSTx]
32
32 CAP1 LD1
Polarity
(APRD Active) LD
Select
APRD
32
shadow CMP [0−31]
HRCTRL[HRE] 32
32 HRCTRL[HRE]
32
CAP2 LD2 Polarity
(ACMP Active) LD Select Other
Event [127:16]
Sources
Prescale
Event
32 ACMP
qualifier 16
shadow ECCTL1[PRESCALE] Input
HRCTRL[HRE] [15:0]
X-Bar
32
Polarity
32 CAP3 LD3
LD Select
(APRD Shadow)
HRCTRL[HRE]
32
32 CAP4 LD4 Polarity
(ACMP Shadow) LD
Select
ECCTL2[CTRFILTRESET]
Interrupt Continuous /
Trigger Oneshot MODCNTRSTS
and CTR_OVF Capture Control
Flag
CTR=PRD
ECAPx Control
(to ePIE) CTR=CMP
ECCTL2 [ REARM, CONT_ONESHT, STOP_WRAP]
Registers: ECEINT, ECFLG, ECCLR, ECFRC
HRCLK HR Submodule
ECAPx_HRCAL HR Input
(to ePIE)
ECAPx
Disable 0x0
0x1 ECAPxSYNCIN
ECAPxSYNCIN EPWMxSYNCOUT
ECCTL2[SWSYNC] EXTSYNCOUT
Signals ECAPxSYNCOUT
CTR=PRD
(EPWM, ECAP, Disable
INPUTXBAR, «) Disable
0xn SYNCSELECT[SYNCOUT]
ECCTL2[SYNCOSEL]
ECAPSYNCINSEL[SEL]
Data bus
QCPRD
Enhanced QEP (eQEP) peripheral
QCAPCTL QCTMR
16 16
16
Quadrature
capture unit
QCTMRLAT (QCAP)
QCPRDLAT
(1) The GPIO GPxQSELn Asynchronous mode should not be used for eQEP module input pins.
Note
The availability of the CAN FD feature is dependent on the device's part number. Refer to the device
data sheet for more information.
Device
MCANSS
Correctable ECC
Configurable Interrupts (2 lines)
PIE
Counter Overflow and Clock Stop/
Wakeup
RESET Reset
• Maskable interrupt (two configurable interrupt lines, correctable ECC, counter overflow and clock stop/
wakeup)
• Non-maskable interrupt (uncorrectable ECC)
• Two clock domains (CAN clock/host clock)
• ECC check for Message RAM
• Clock stop and wake-up support
• Timestamp counter
Non-supported features:
• Host bus firewall
• Clock calibration
• Debug over CAN
I2C module
I2CXSR I2CDXR
TX FIFO
FIFO Interrupt
SDA
to CPU/PIE
RX FIFO
Peripheral bus
I2CRSR I2CDRR
Control/status
Clock registers CPU
SCL synchronizer
Prescaler
Note
To meet all of the I2C protocol timing specifications, the I2C module clock must be configured in the
range from 7 MHz to 12 MHz.
A pullup resistor must be chosen to meet the I2C standard timings. In most circumstances, 2.2 kΩ of
total bus resistance to VDDIO is sufficient. For evaluating pullup resistor values for a particular design,
see the I2C Bus Pullup Resistor Calculation Application Note.
SDA
ACK Contd...
S6 T10 S7
T5 T7 S3
SCL S4 Contd...
9th
T6 T8 clock
S2
Repeated
START STOP
S5
SDA
ACK
T2
T9
T1
SCL
9th
clock
Note
Please see the TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual to
determine which pins support Fast Plus Mode as well as full SMBUS3.0 and PMBUS1.3 specifications
PCLKCR20
SYSCLK
Div PMBCTRL
ALERT DMA
Bit clock
CTL Other registers
PMBus Module
(1) This bit must be set to enable 0ns hold time/SMBUS3.0 Compliance
(2) If the max clock is used all below timings will be met with the default register configurations for the PMBUS
(3) Due to max IO drive strength of 12mA, 1MHz SCL clock is only valid for bus capacitances up to 520pF
(4) Due to max IO drive strength of 12mA, 1MHz SCL clock is only valid for bus capacitances up to 330pF
(1) This bit must be set to enable 0ns hold time/SMBUS3.0 Compliance
(2) If the max clock is used all below timings will be met with the default register configurations for the PMBUS
(1) This bit must be set to enable 0ns hold time/SMBUS3.0 Compliance
(2) If the max clock is used all below timings will be met with the default register configurations for the PMBUS
Note
All registers in this module are 8-bit registers. When a register is accessed, the register data is in the
lower byte (bits 7–0), and the upper byte (bits 15–8) is read as zeros. Writing to the upper byte has no
effect.
TXSHF
SCITXD
Register
TXENA
SCICTL1.1
Frame
Format and Mode
Parity
Even/Odd TXEMPTY
0 1
SCICCR.6 8 SCICTL2.6
Enable
TX FIFO_0
TXINT
SCICCR.5 To CPU
TX FIFO_1 TX FIFO Interrupts TX Interrupt
88
Logic
TX FIFO_N
TXINTENA
TXRDY SCICTL2.0
8
TXWAKE 0 1 SCICTL2.7
SCICTL1.3
WUT 8
Transmit Data
Buffer Register
SCITXBUF.7-0 Auto Baud Detect Logic
Baud Rate
MSB/LSB
LSPCLK Registers
RXSHF
SCIRXD
Register
SCIHBAUD.15-8 RXWAKE
RXENA
0 1
8
SCIFFENA
SCIFFTX.14 RX FIFO_0 RXINT
8 RX FIFO_1 To CPU
RX FIFO Interrupts RX Interrupt
Logic
RX FIFO_N
RXFFOVF
8 SCIFFRX.15
0 1
RXBKINTENA
SCICTL2.1
RXRDY
SCIRXST.6
RXENA BRKDT
RXERRINTENA
SCICTL1.0
SCIRXST.5 SCICTL1.6
SCIRXST.5-2
Receive Data BRKDT FE OE PE
Buffer Register
RXERROR
SCIRXBUF.7-0
SCIRXST.7
PCLKCR8
Low-Speed
LSPCLK SYSCLK CPU
Prescaler
Bit Clock
SYSRS
Peripheral Bus
SPIPICO
SPIPOCI
GPIO MUX SPI
SPIINT
SPICLK PIE
SPITXINT
SPIPTE
SPIRXDMA
DMA
SPITXDMA
Note
All timing parameters for SPI High-Speed Mode assume a load capacitance of 5 pF on SPICLK,
SPIPICO, and SPIPOCI.
(1) The (BRR + 1) condition is Even when (SPIBRR + 1) is even or SPIBRR is 0 or 2. It is Odd when (SPIBRR + 1) is odd and SPIBRR is
greater than 3.
(2) GPIOs 2, 3, 9, 23, 32, or 41 do not support full High-Speed Mode(37.5MHz) SPI operation
Normal Mode
4 td(PICO)M Delay time, SPICLK to SPIPICO valid Even, Odd 2 ns
Even 0.5tc(SPC)M – 3
5 tv(PICO)M Valid time, SPIPICO valid after SPICLK ns
Odd 0.5tc(SPC)M – 0.5tc(LSPCLK) – 3
High-Speed Mode
Even 0.5tc(SPC)M – 2
4 td(PICO)M Delay time, SPIPICO valid to SPICLK ns
Odd 0.5tc(SPC)M + 0.5tc(LSPCLK) – 2
Delay time, SPIPICO valid to SPICLK Even 0.5tc(SPC)M – 3
4 td(PICO)M (when used on pin muxed with PMBUS ns
- GPIO2, 3, 9, or 32) Odd 0.5tc(SPC)M + 0.5tc(LSPCLK) – 3
Even 0.5tc(SPC)M – 3
5 tv(PICO)M Valid time, SPIPICO valid after SPICLK ns
Odd 0.5tc(SPC)M – 0.5tc(LSPCLK) – 3
Valid time, SPIPICO valid after SPICLK Even 0.5tc(SPC)M – 4.5
5 tv(PICO)M (when used on pin muxed with PMBUS ns
- GPIO2, 3, 9, or 32) Odd 0.5tc(SPC)M – 0.5tc(LSPCLK) – 4.5
Normal Mode
Even 0.5tc(SPC)M – 2
4 td(PICO)M Delay time, SPIPICO valid to SPICLK ns
Odd 0.5tc(SPC)M + 0.5tc(LSPCLK) – 2
Even 0.5tc(SPC)M – 3
5 tv(PICO)M Valid time, SPIPICO valid after SPICLK ns
Odd 0.5tc(SPC)M – 0.5tc(LSPCLK) – 3
Valid time, SPIPICO valid after SPICLK Even 0.5tc(SPC)M – 4.5
5 tv(PICO)M (when used on pin muxed with PMBUS ns
- GPIO2, 3, 9, or 32) Odd 0.5tc(SPC)M – 0.5tc(LSPCLK) – 4.5
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
4
5
Controller out data
SPIPICO is valid
8
9
Controller out
SPIPOCI data must be valid
23 24
SPIPTE
A. On the trailing end of the word, SPIPTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO
modes.
1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
4
5
Controller out data
SPIPICO is valid
8
9
Controller out
SPIPOCI data must be valid
24
23
SPIPTE
A. On the trailing end of the word, SPIPTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO
modes.
12
SPICLK
(clock polarity = 0)
13
14
SPICLK
(clock polarity = 1)
15 16
19
20
SPIPICO data
SPIPICO must be valid
25 26
SPIPTE
12
SPICLK
(clock polarity = 0)
13 14
SPICLK
(clock polarity = 1)
15
19 16
20
SPIPTE
ADDRESS BUS
CHECKSUM
CALCULATOR INTERFACE
ID PARTY
CHECKER
BIT
MONITOR
TXRX ERROR
DETECTOR (TED)
TIME-OUT
CONTROL
COUNTER
LINRX/
SCIRX COMPARE
PCLKCR18
SYSCLK
SYSRSN
C28x ePIE
FSITXyINT1
FSITXyINT2
CLA
Register Interface
Registers
FSITXyCLK
GPIO MUX
FSITXyD0
DMA FSITX
FSITXyD1
FSITXyDMA
Trigger Muxes(A)
32
A. The signals connected to the trigger muxes are described in the External Frame Trigger Mux section of the Fast Serial Interface (FSI)
chapter in the TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual.
FSITX
PLLRAWCLK
SYSRSN
SYSCLK
FSI Mode:
Transmit Clock TXCLKIN
TXCLK = TXCLKIN/2
Generator SPI Signaling Mode:
Register Interface TXCLK = TXCLKIN
Core Reset
FSITXINT1
Control Registers, TXCLK
FSITXINT2 Interrupt Management
FSITX_DMA_EVT Ping Time-out Counter
TXD0
Transmitter Core
Transmit Data
Buffer
ECC Logic
FSITXCLK 2
FSITXD0
FSITXD1
3
SYSCLK
SYSRSN
C28x ePIE
FSIRXyINT1
FSIRXyINT2
CLA
Register Interface
Registers
FSIRXyCLK
GPIO MUX
FSIRXyD0
DMA FSIRX
FSIRXyD1
FSIRXyDMA
FSIRX
SYSRSn
SYSCLK
Frame Watchdog
Register Interface
Core Reset
FSIRXINT1 Control Registers,
FSIRXINT2 Interrupt Management
RXCLK
FSIRX_DMA_EVT Ping Watchdog
Receiver Core Skew
RXD0
Control
RXD1
Receive Data
Buffer
ECC Check
Logic
FSIRXCLK 2
FSIRXD0
FSIRXD1
3
2
FSITXCLK
3
FSITXD0
5
4
FSITXD1
Endpoint Control
Transmit
EP0 –31
Control
Receive
CPU Interface
Interrupt Interrupts
Host
Combine Control
Transaction
Endpoints
Scheduler
EP Reg.
Decoder
Note
The accuracy of the on-chip zero-pin oscillator (see the INTOSC Characteristics section) will not
meet the accuracy requirements of the USB protocol. An external clock source must be used for
applications using USB. For applications using the USB boot mode, see the Boot ROM and Peripheral
Booting section for clock frequency requirements.
7 Detailed Description
7.1 Overview
The TMS320F28P55x (F28P55x) is a member of the C2000™ real-time microcontroller family of scalable,
ultra-low latency devices designed for efficiency in power electronics, including but not limited to: high power
density, high switching frequencies, and supporting the use of GaN and SiC technologies.
These include such applications as:
• Industrial motor drives
• Motor control
– Traction inverter motor control
– HVAC motor control
– Mobile robot motor control
• Solar inverters
– Central inverter
– Micro inverter
– String inverter
• Digital power
• Electrical vehicles and transportation
• EV charging infrastructure
The real-time control subsystem is based on TI’s 32-bit C28x DSP core, which provides 150 MIPS of signal-
processing performance in each core for floating- or fixed-point code running from either on-chip flash or SRAM.
The C28x CPU is further boosted by the Trigonometric Math Unit (TMU) and VCRC (Cyclical Redundancy
Check) extended instruction sets, speeding up common algorithms key to real-time control systems. Extended
instruction sets enable IEEE double-precision 32-bit floating-point math. Finally, the Control Law Accelerator
(CLA) enables an additional 150 MIPS per core of independent processing ability. Machine learning is supported
with the addition of the Neural-network Processing Unit (NPU), capable of 600 MOPS on 8-bit weight/8-bit data
across multiple NN layers.
To allow fast context switching from existing to new firmware, hardware enhancements for Live Firmware Update
(LFU) have been added to F28P55x.
High-performance analog blocks are tightly integrated with the processing and control units to provide optimal
real-time signal chain performance. The Analog-to-Digital Converter (ADC) has been enhanced with up to
39 analog channels, 22 of which have general-purpose input/output (GPIO) capability. Implementation of
oversampling is greatly simplified with hardware improvement. For safety-critical ADC conversions, a hardware
redundancy checker has been added. The hardware redundancy checker provides the ability to compare
ADC conversion results from multiple ADC modules for consistency without additional CPU cycles. Three
Programmable Gain Amplifiers (PGAs) are present, supporting unity gain as well as up to 64x of non-inverting
gain. Twenty-four frequency-independent PWMs, 16 with high-resolution capability, enable control of multiple
power stages, from 3-phase inverters to advanced multilevel power topologies.
The inclusion of the Configurable Logic Block (CLB) allows the user to add custom logic and potentially integrate
FPGA-like functions into the C2000 real-time MCU.
Industry-standard protocols like CAN FD and USB 2.0 are available on this device. The Fast Serial Interface
(FSI) enables up to 200 Mbps of robust communications across an isolation boundary. Enhancements have
been made to the PMBUS module to support Fast Plus mode.
Want to learn more about features that make C2000 MCUs the right choice for your real-time control system?
Check out The Essential Guide for Developing With C2000™ Real-Time Microcontrollers and visit the C2000™
real-time control MCUs page.
C28x CPU
(150 MHz)
FPU32 CLA
Boot ROM
TMU (150 MHz)
VCRC
Secure ROM
Flash Bank0
128 Sectors, 256KB CLA to CPU MSG RAM
SYSTEM CONTROL
CPU Timers
XTAL Flash Bank1 CPU to CLA MSG RAM
INTOSC1, INTOSC2 128 Sectors, 256KB
PLL
ePIE
Windowed WD Flash Bank2 CLA Data ROM
NMI WD 128 Sectors, 256KB
CLA Program ROM
Flash Bank3
128 Sectors, 256KB
SECURITY
JTAG Lock Flash Bank4 CLA to DMA MSG RAM
Secure Boot 32 Sectors, 64 KB
DMA to CLA MSG RAM
M0-M1 RAM
4KB
DIAGNOSTICS Buses Legend
DCC
MPOST LS0-LS9 RAM CPU
ERAD 64KB
NPU CLA
JTAG/cJTAG
DMA
PF1 PF3 PF4 PF2 PF7 PF8 PF9 PF10 PF11 PF12
Result Data 1x PMBUS 2x CAN FD 1x LIN 3x SCI 2x CLB 1x USB 1x AES LFU
24x ePWM Channels
4x CMPSS NPU 2x I2C
(12Ch Hi-Res Capable) 5x 12-Bit ADC 65x GPIO 2x SPI
1x FSI RX
Input XBAR
2x eCAP 1x Buffered DAC 1x FSI TX
Output XBAR
ePWM XBAR
3x eQEP CLB XBAR
3x PGA
(CW/CCW Support)
CLB Input XBAR
CLB Output XBAR
A. The internal DAC from one of the CMPSS modules can be configured as an output DAC.
B. The LIN module can also be used as a SCI module.
7.3 Memory
7.3.1 Memory Map
The Memory Map table describes the memory map. See the Memory Controller Module section of the System
Control chapter in the TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual.
Table 7-1. Memory Map
CPU1.CLA1 CPU1.CLA1
START END CPU1.DMA ECC/
MEMORY SIZE (x16) DATA PROGRAM SECURITY PART NUMBER
ADDRESS ADDRESS ACCESS Parity
ACCESS ACCESS
M0 RAM 1024 0x0000_0000 0x0000_03FF - - - ECC - -
M1 RAM 1024 0x0000_0400 0x0000_07FF - - - ECC - -
PIE Vector Table 512 0x0000_0D00 0x0000_0EFF - - - Parity - -
CLAtoCPU MSG
128 0x0000_1480 0x0000_14FF - YES - Parity - -
RAM
CPUtoCLA MSG
128 0x0000_1500 0x0000_157F - YES - Parity - -
RAM
CLAtoDMA MSG
128 0x0000_1680 0x0000_16FF YES YES - Parity - -
RAM
DMAtoCLA MSG
128 0x0000_1700 0x0000_177F YES YES - Parity - -
RAM
F28P559SJ9-Q1,
F28P550SJ9,
F28P559SG9-Q1,
LS8 RAM - CLA F28P550SG9,
8192 0x0000_4000 0x0000_5FFF - - YES Parity YES
Prog F28P550SG8,
F28P559SG8-Q1,
F28P559SJ6-Q1,
F28P550SJ6
F28P559SJ9-Q1,
F28P550SJ9,
F28P559SG9-Q1,
LS9 RAM - CLA F28P550SG9,
8192 0x0000_6000 0x0000_7FFF - - YES Parity YES
Prog F28P550SG8,
F28P559SG8-Q1,
F28P559SJ6-Q1,
F28P550SJ6
LS0 RAM 2048 0x0000_8000 0x0000_87FF - YES YES Parity YES -
LS1 RAM 2048 0x0000_8800 0x0000_8FFF - YES YES Parity YES -
LS2 RAM 2048 0x0000_9000 0x0000_97FF - YES YES Parity YES -
LS3 RAM 2048 0x0000_9800 0x0000_9FFF - YES YES Parity YES -
LS4 RAM 2048 0x0000_A000 0x0000_A7FF - YES YES Parity YES -
LS5 RAM 2048 0x0000_A800 0x0000_AFFF - YES YES Parity YES -
LS6 RAM 2048 0x0000_B000 0x0000_B7FF - YES YES Parity YES -
LS7 RAM 2048 0x0000_B800 0x0000_BFFF - YES YES Parity YES -
GS0 RAM 8192 0x0000_C000 0x0000_DFFF YES - - Parity - -
GS1 RAM 8192 0x0000_E000 0x0000_FFFF YES - - Parity - -
F28P559SJ9-Q1,
F28P550SJ9,
F28P559SG9-Q1,
F28P550SG9,
CLA Data ROM 4096 0x0000_F000 0x0000_FFFF - YES - Parity -
F28P550SG8,
F28P559SG8-Q1,
F28P559SJ6-Q1,
F28P550SJ6
F28P559SJ9-Q1,
F28P550SJ9,
GS2 RAM 8192 0x0001_0000 0x0001_1FFF YES - - Parity - F28P559SJ2-Q1,
F28P559SJ6-Q1,
F28P550SJ6
7.4 Identification
Table 7-5 lists the Device Identification Registers. Additional information on these device identification registers
can be found in the TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual. See the register
descriptions of PARTIDH and PARTIDL for identification of production status (TMX or TMS) and other device
information.
Table 7-5. Device Identification Registers
NAME ADDRESS SIZE (x16) DESCRIPTION
Bits Options
14-13 1 = InstaSPIN-FOC
INSTASPIN 2 = NONE
3 = NONE
10-8 0 = 56 pin (QFN)
PIN_COUNT 1 = 64 pin (QFP)
PARTIDL 0x0005 D008 2
2 = 80 pin (QFP)
3 = 100 pin (QFP)
4 = 128 pin (QFP)
7-6 0 = Engineering Sample (TMX)
QUAL 1 = Pilot Production (TMP)
2 = Fully Qualified (TMS)
Device part identification number
TMS320F28P55xSJ9 0x09FF 0500
TMS320F28P55xSJ6 0x09FC 0500
PARTIDH 0x0005 D00A 2 TMS320F28P55xSJ2 0x09F8 0500
TMS320F28P55xSG9 0x09F5 0500
TMS320F28P55xSG8 0x09F4 0500
TMS320F28P55xSG2 0x09EE 0500
Silicon revision number
REVID 0x0005 D00C 2 Revision 0 0x0000 0001
Revision A 0x0000 0002
Unique identification number. This number is different on each
individual device with the same PARTIDH. This unique number
UID_UNIQUE 0x0007 2172 4
can be used as a serial number in the application. This number
is present only on TMS devices.
(1) These modules are accessible from DMA but cannot trigger a DMA transfer.
Exponent instruction IEXP2F32 and logarithmic instruction LOG2F32 have been added to support computation
of floating-point power function for the nonlinear proportional integral derivative control (NLPID) component of
the C2000 Digital Control Library. These two added instructions reduce the power function calculations from a
typical of 300 cycles using library emulation to less than 10 cycles.
No changes have been made to existing instructions, pipeline, or memory bus architecture. All TMU instructions
use the existing FPU register set (R0H to R7H) to carry out the operations.
For more information, see the TMS320C28x Extended Instruction Sets Technical Reference Manual.
CLA Control
Register Set
MIFR(16)
MPERINT1 MIOVF(16) CLA_INT1
From Shared to to
Peripherals MPERINT8 MICLR(16) CLA_INT8
MICLROVF(16) C28x
PIE INT11
MIFRC(16) CPU
MIER(16) INT12
MIRUN(16)
LVF
MCTLBGRND(16)
LUF
MSTSBGRND(16)
CLA1SOFTINTEN(16)
CLA1INTFRC(16)
SYSCLK
CLA Clock Enable MVECT1(16)
CPU Read/Write Data Bus
SYSRS MVECT2(16)
MVECT3(16)
MVECT4(16) CLA Program
MVECT5(16) CLA Program Bus Memory (LSx)
MVECT6(16)
MVECT7(16)
MVECT8(16) LSxMSEL[MSEL_LSx]
MVECTBGRND(16) LSxCLAPGM[CLAPGM_LSx]
MVECTBGRNDACTIVE(16)
MPSACTL(16)
MCTL(16)
MPC(16)
MSTF(32)
MR0(32)
MR1(32) Shared
MR2(32) MEALLOW Peripherals
MR3(32)
MAR0(16)
MAR1(16)
CPU Read Data Bus
XINT(1-5)
ADCx.INT(1-5), ADCx.EVT
AESA_ContextIn, AESA_ContextOut, AESA_DataIn, AESA_DataOut
DMA_CHx(1-6)
LINxTXDMA, LINxRXDMA
C28x
DMA Trigger
Source Selection
ECAP(1-2)DMA PIE
DMACHSRCSEL1.CHx DMA
DMACHSRCSEL2.CHx
EPWM(1-12).SOCA, EPWM(1-12).SOCB CHx.MODE.PERINTSEL
(x = 1 to 6)
CLB1-2INT
EPGAINT
SPITXDMA(A-B)
SPIRXDMA(A-B)
FSITXADMA, FSIRXADMA
FSI_DATA_TAG_MATCH,
FSI_PING_TAG_MATCH
PM
PGA DAC CMPSS eQEP eCAP EPWM EPG CLB SPI FSI
Bus
(1) SCI boot mode can be used as a wait boot mode as long as SCI continues to wait for an 'A' or 'a' during the SCI autobaud lock
process.
(2) If the default flash entry address is not programmed, the boot mode will switch to USB Boot for those devices that include the USB
peripheral. On devices without a USB, the action will be to enter the ITRAP ISR if the default flash entry address is not programmed.
The switch to USB boot is only supported for the default flash entry address option and not all entry address options.
Note
The CAN boot mode turns on the XTAL. Be sure an XTAL is installed in the application before using
CAN boot mode.
Note
When using Z2-OTP-BOOTPIN-CONFIG, the configurations programmed in this location will take
priority over the configurations in Z1-OTP-BOOTPIN-CONFIG. It is recommended to use Z1-OTP-
BOOTPIN-CONFIG first and then if OTP configurations need to be altered, switch to using Z2-OTP-
BOOTPIN-CONFIG.
The following GPIOs cannot be used as a BMSP. If selected for a particular BMSP, the boot ROM automatically
selects the factory default GPIO (the factory default for BMSP2 is 0xFF, which disables the BMSP).
• GPIO 20 and GPIO 21
• GPIO 36 and GPIO 38
• GPIO 62 to GPIO 223
Note
When decoding the boot mode, BMSP0 is the least-significant-bit and BMSP2 is the most-significant-
bit of the boot table index value. It is recommended when disabling BMSPs to start with disabling
BMSP2. For example, in an instance when only using BMSP2 (BMSP1 and BMSP0 are disabled),
then only the boot table indexes of 0 and 4 will be selectable. In the instance when using only BMSP0,
then the selectable boot table indexes are 0 and 1.
Note
The locations Z2-OTP-BOOTDEF-LOW and Z2-OTP-BOOTDEF-HIGH will be used instead of Z1-
OTP-BOOTDEF-LOW and Z1-OTP-BOOTDEF-HIGH locations when Z2-OTP-BOOTPIN-CONFIG is
configured. Refer to Configuring Boot Mode Pins for more details on BOOTPIN_CONFIG usage.
7.11 Security
Security features are enforced by the Dual Code Security Module (DCSM). The primary layer of defense is
securing the boundary of the chip, which should always be enabled. Additionally, the Dual Zone Security feature
is available to support code partitioning.
7.11.1 Securing the Boundary of the Chip
The following two features, along with authentication in the firmware update code, should be used to help to
prevent unauthorized code from running on the device.
7.11.1.1 JTAGLOCK
Enabling the JTAGLOCK feature in the USER OTP disables JTAG access (for example, debug probe) to
resources on the device.
7.11.1.2 Zero-pin Boot
Enabling the Zero-pin Boot option along with Flash Boot in the USER OTP blocks all pin-based external
bootloader options (for example, SCI, CAN, Parallel).
7.11.2 Dual-Zone Security
The dual-zone security mechanism offers protection for two zones: Zone 1 (Z1) and Zone 2 (Z2). The security
implementation for both zones is identical. Each zone has its own dedicated secure resource (OTP memory and
secure ROM) and allocated secure resource (LSx RAM and flash sectors).
7.11.3 Disclaimer
THE CODE SECURITY MODULE (CSM) INCLUDED ON THIS DEVICE WAS DESIGNED
TO PASSWORD PROTECT THE DATA STORED IN THE ASSOCIATED MEMORY AND IS
WARRANTED BY TEXAS INSTRUMENTS (TI), IN ACCORDANCE WITH ITS STANDARD TERMS
AND CONDITIONS, TO CONFORM TO TI'S PUBLISHED SPECIFICATIONS FOR THE WARRANTY
PERIOD APPLICABLE FOR THIS DEVICE.
TI DOES NOT, HOWEVER, WARRANT OR REPRESENT THAT THE CSM CANNOT BE
COMPROMISED OR BREACHED OR THAT THE DATA STORED IN THE ASSOCIATED MEMORY
CANNOT BE ACCESSED THROUGH OTHER MEANS. MOREOVER, EXCEPT AS SET FORTH
ABOVE, TI MAKES NO WARRANTIES OR REPRESENTATIONS CONCERNING THE CSM OR
OPERATION OF THIS DEVICE, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY
OR FITNESS FOR A PARTICULAR PURPOSE.
IN NO EVENT SHALL TI BE LIABLE FOR ANY CONSEQUENTIAL, SPECIAL, INDIRECT,
INCIDENTAL, OR PUNITIVE DAMAGES, HOWEVER CAUSED, ARISING IN ANY WAY OUT OF
YOUR USE OF THE CSM OR THIS DEVICE, WHETHER OR NOT TI HAS BEEN ADVISED OF THE
POSSIBILITY OF SUCH DAMAGES. EXCLUDED DAMAGES INCLUDE, BUT ARE NOT LIMITED
TO LOSS OF DATA, LOSS OF GOODWILL, LOSS OF USE OR INTERRUPTION OF BUSINESS OR
OTHER ECONOMIC LOSS.
7.12 Watchdog
The watchdog module is the same as the one on previous TMS320C2000™ microcontrollers, but with an
optional lower limit on the time between software resets of the counter. This windowed countdown is disabled by
default, so the watchdog is fully backward-compatible.
The watchdog generates either a reset or an interrupt. It is clocked from the internal oscillator with a selectable
frequency divider.
Figure 7-4 shows the various functional blocks within the watchdog module.
WDCR.WDPRECLKDIV WDCR.WDPS WDCR.WDDIS
WDCNTR
WDCLK
(INTOSC1) Overflow 1-count
delay
8-bit
WDCLK Watchdog Watchdog
Divider Prescaler Counter
SYSRSn
Clear
Count
WDWCR.MIN
WDKEY (7:0)
Out of Window Watchdog
Watchdog Good Key
Window
Key Detector Detector
WDCR(WDCHK(2:0))
55 + AA
Bad Key
WDRSTn Generate
1 0 1 512-WDCLK Watchdog Time-out
WDINTn Output Pulse
SCSR.WDENINT
GPIO0 Asynchronous
to Synchronous Input X-BAR
GPIOx Sync. + Qual
IN P U T 1 – IN P U T 6 CLBx T ILE
O t h er OU T 4 /5
S o u rc es
CLB X-BAR
GPREG CELL
IN0-7
All C LB T i l e
Ou t p u t s
GP IO M U X
Absolute encoder protocol interfaces are now provided as Position Manager solutions in the C2000Ware
MotorControl SDK. Configuration files, application programmer interface (API), and use examples for such
solutions are provided with C2000Ware MotorControl SDK. In some solutions, the TI-configured CLB is used
with other on-chip resources, such as the SPI port or the C28x CPU, to perform more complex functionality.
8 Reference Design
The TI Reference Design Library is a robust reference design library spanning analog, embedded processor,
and connectivity. Created by TI experts to help you jump start your system design, all reference designs include
schematic or block diagrams, BOMs, and design files to speed your time to market. Search and download
designs at the Select TI reference designs page.
Below is a partial list of applicable reference designs. A full listing of supported reference designs for this device,
as well as other C2000 MCUs, is maintained inside TI resource explorer.
3-kW, 180-W/in3 single-phase totem-pole bridgeless PFC reference design with 16-A max input
This reference design demonstrates a method to control a continuous conduction mode Totem pole power factor
correction converter (PFC) using C2000™ microcontrollers. The PFC also works as inverter in grid connected
(current controlled) mode. The converter is designed to support a maximum input current of 16-ARMS and peak
power of 3.6 kW.
Bidirectional 400-V/12-V DC/DC Converter Reference Design
The Bidirectional 400V-12V DC/DC Converter Reference Design is a microcontroller-based implementation of
an isolated bi-directional DC-DC converter. A phase shifted full-bridge (PSFB) with synchronous rectification
controls power flow from a 400V bus/battery to the 12V battery in step-down mode, while a push-pull stage
controls the reverse power flow from the low voltage battery to the high voltage bus/battery in boost mode.
GaN-based, 6.6-kW, bidirectional, onboard charger reference design
The PMP22650 reference design is a 6.6-kW, bidirectional, onboard charger. The design employs a two-phase
totem pole PFC and a full-bridge CLLLC converter with synchronous rectification. The CLLLC utilizes both
frequency and phase modulation to regulate the output across the required regulation range.
Bidirectional CLLLC resonant dual active bridge (DAB) reference design for HEV/EV onboard charger
CLLLC resonant DAB with bidirectional power flow capability and soft switching characteristics is an ideal
candidate for Hybrid Electric Vehicle/Electric Vehicle (HEV/EV) on-board chargers and energy storage
applications. This design illustrates control of this power topology using a C2000™ MCU in closed voltage
and closed current-loop mode.
7.4-kW on-board charger reference design with CCM totem pole PFC and CLLLC DC/DC using C2000™ MCU
TIDM-02013 is a bidirectional onboard charger reference design. The design consists of an interleaved
continuous conduction mode (CCM) totem-pole (TTPL) bridgeless power-factor correction (PFC) power stage
followed by a CLLLC DCDC power stage all controlled using a single C2000™ real-time control microcontroller
(MCU), while utilizing a TI gallium nitride (GaN) power module.
48-V Three-Phase Inverter With Shunt-Based In-Line Motor Phase Current Sensing Evaluation Module
The BOOSTXL-3PHGANINV evaluation module features a 48-V/10-A three-phase GaN inverter with precision
in-line shunt-based phase current sensing for accurate control of precision drives such as servo drives.
C2000 DesignDRIVE position manager BoosterPack™ plug-in module
The PositionManager BoosterPack is a flexible low voltage platform intended for evaluating interfaces to
absolute encoders and analog sensors like resolvers and SinCos transducers. When combined with thec
DesignDRIVE Position Manager software solutions this low-cost evaluation module becomes a powerful tool
for interfacing many popular position encoder types such as EnDat, BiSS and T-format with C2000 Real-Time
Control devices. C2000 Position Manager technology integrates interfaces to the most popular digital and analog
position sensors onto C2000 Real-Time Controller, thus eliminating the need for external FPGAs for these
functions.
Distributed multi-axis servo drive over fast serial interface (FSI) reference design
This reference design presents an example distributed or decentralized multi-axis servo drive over Fast Serial
Interface (FSI) using C2000™ real-time controllers. Multi-axis servo drives are used in many applications such
as factory automation and robots. The cost per axis, performance and ease of use are always high concerns for
such systems. FSI is a cost-optimized and reliable high speed communication interface with low jitter that can
daisy-chain multiple C2000 microcontrollers.
10-kW, bidirectional three-phase three-level (T-type) inverter and PFC reference design
This verified reference design provides an overview on how to implement a three-level three-phase SiC based
DC:AC T-type inverter stage. Higher switching frequency of 50KHz reduces the size of magnetics for the filter
design and enables higher power density. The use of SiC MOSFETs with switching loss ensures higher DC
bus voltages of up to 1000V and lower switching losses with a peak efficiency of 99 percent. This design is
configurable to work as a two-level or three-level inverter.
Bi-directional, dual active bridge reference design for level 3 electric vehicle charging stations
This reference design provides an overview on the implementation of a single-phase dual active bridge (DAB)
DC/DC converter. DAB topology offers advantages like soft-switching commutations, a decreased number of
devices and high efficiency. The design is beneficial where power density, cost, weight, galvanic isolation, high
voltage conversion ratio and reliability are critical factors, making it ideal for EV charging stations and energy
storage applications. Modularity and symmetrical structure in DAB allow for stacking converters to achieve high
power throughput and facilitate a bidirectional mode of operation to support battery charging and discharging
applications.
1.6kW, bidirectional micro inverter based on GaN reference design
This reference design shows a four-input bidirectional 1.6kW GaN-based microinverter with energy storage
capability.
TMX Experimental device that is not necessarily representative of the final device's electrical specifications and
may not use production assembly flow.
TMP Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical
specifications.
TMS Production version of the silicon die that is fully qualified.
PREFIX(A)
TMX (X) = experimental device AUTOMOTIVE AEC-Q100 QUALIFICATION
TMS (blank) = qualified device (blank) = Not AEC-Q100 qualified
Q1 = AEC-Q100 qualification
DEVICE FAMILY
320 = TMS320 MCU Family SHIPPING OPTIONS
(blank) = Tray
R = Tape and Reel
CPU ARCHITECTURE
F28 = C28 CPU
PACKAGE TYPE
PDT = 128-pin Thin Quad Flatpack (TQFP)
SERIES PZ = 100-pin Low-profile Quad Flatpack (LQFP)
PNA = 80-pin TQFP
P = Performance (150 MIPS to 600 MIPS)
PM = 64-pin LQFP
RSH = 56-pin Very Thin Quad Flatpack No-Lead (VQFN)
MEMORY
J = 1MB Flash, 133KB RAM
G = 512KB Flash, 101KB RAM
9.2 Markings
Figure 9-2, Figure 9-3, Figure 9-4, Figure 9-5, Figure 9-6, Figure 9-7, Figure 9-8, and Figure 9-9 show the
package symbolization. Table 9-1 lists the silicon revision codes.
Package
Pin 1
Figure 9-2. Package Symbolization for PDT Package – Automotive
Package
Pin 1
Figure 9-3. Package Symbolization for PZ Package – Automotive
Package
Pin 1
Figure 9-4. Package Symbolization for PZ Package – Non-Automotive
Package
Pin 1
Figure 9-5. Package Symbolization for PNA Package – Automotive
Package
Pin 1
Figure 9-6. Package Symbolization for PNA Package – Non-Automotive
Package
Pin 1
Figure 9-7. Package Symbolization for PM Package – Automotive
Package
Pin 1
Figure 9-8. Package Symbolization for PM Package – Non-Automotive
Package
Pin 1
Figure 9-9. Package Symbolization for RSH Package – Non-Automotive
Studio is available for download across Windows®, Linux® and macOS® desktops. It can also be used in
the cloud by visiting https://dev.ti.com. Code Composer Studio includes an optimizing C/C++ compiler, source
code editor, project build environment, debugger, profiler and many other features. The intuitive IDE takes you
through each step of the application development flow. Familiar tools and interfaces make getting started faster
than ever before. The desktop version of Code Composer Studio combines the advantages of the Eclipse
software framework with advanced capabilities from TI resulting in a compelling feature-rich environment. The
cloud-based Code Composer Studio leverages the Theia application framework enabling development in the
cloud without needing to download and install large amounts of software.
SysConfig System configuration tool
SysConfig is a comprehensive collection of graphical utilities for configuring pins, peripherals, radios,
subsystems, and other components. SysConfig helps you manage, expose and resolve conflicts visually so
that you have more time to create differentiated applications. The tool's output includes C header and code files
that can be used with software development kit (SDK) examples or used to configure custom software. The
SysConfig tool automatically selects the pinmux settings that satisfy the entered requirements. The SysConfig
tool is delivered integrated in CCS, as a standalone installer, or can be used via the dev.ti.com cloud tools portal.
For more information about the SysConfig system configuration tool, visit the System configuration tool page.
C2000 Third-party search tool
TI has partnered with multiple companies to offer a wide range of solutions and services for TI C2000 devices.
These companies can accelerate your path to production using C2000 devices. Download this search tool to
quickly browse third-party details and find the right third-party to meet your needs.
UniFlash Standalone Flash Tool
UniFlash is a standalone tool used to program on-chip flash memory through a GUI, command line, or scripting
interface.
Models
Various models are available for download from the product Design & development pages. These models
include I/O Buffer Information Specification (IBIS) Models and Boundary-Scan Description Language (BSDL)
Models. To view all available models, visit the Design tools & simulation section of the Design & development
page for each device.
Training
To help assist design engineers in taking full advantage of the C2000 microcontroller features and performance,
TI has developed a variety of training resources. Utilizing the online training materials and downloadable
hands-on workshops provides an easy means for gaining a complete working knowledge of the C2000
microcontroller family. These training resources have been designed to decrease the learning curve, while
reducing development time, and accelerating product time to market. For more information on the various
training resources, visit the C2000™ real-time control MCUs – Support & training site.
9.4 Documentation Support
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Notifications to register and receive a weekly digest of any product information that has changed. For change
details, review the revision history included in any revised document.
The current documentation that describes the processor, related peripherals, and other technical collateral
follows.
Note
TI is transitioning to use more inclusive terminology. Some language may be different than what you
would expect to see for certain technology areas.
Errata
TMS320F28P55x Real-Time MCUs Silicon Errata describes known advisories on silicon and provides
workarounds.
Technical Reference Manual
TMS320F28P55x Real-Time Microcontrollers Technical Reference Manual details the integration, the
environment, the functional description, and the programming models for each peripheral and subsystem in
the F28P55x real-time microcontrollers.
CPU User's Guides
TMS320C28x CPU and Instruction Set Reference Guide describes the central processing unit (CPU) and the
assembly language instructions of the TMS320C28x fixed-point digital signal processors (DSPs). This Reference
Guide also describes emulation features available on these DSPs.
TMS320C28x Extended Instruction Sets Technical Reference Manual describes the architecture, pipeline, and
instruction set of the TMU, VCU-II, and FPU accelerators.
Peripheral Guides
C2000 Real-Time Control Peripherals Reference Guide describes the peripheral reference guides of the 28x
DSPs.
Tools Guides
TMS320C28x Assembly Language Tools v22.6.0.LTS User’s Guide describes the assembly language tools
(assembler and other tools used to develop assembly language code), assembler directives, macros, common
object file format, and symbolic debugging directives for the TMS320C28x device.
TMS320C28x Optimizing C/C++ Compiler v22.6.0.LTS User’s Guide describes the TMS320C28x C/C++
compiler. This compiler accepts ANSI standard C/C++ source code and produces TMS320 DSP assembly
language source code for the TMS320C28x device.
Application Notes
The SMT & packaging application notes website lists documentation on TI’s surface mount technology (SMT)
and application notes on a variety of packaging-related topics.
Semiconductor Packing Methodology describes the packing methodologies employed to prepare semiconductor
devices for shipment to end users.
Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime
of TI embedded processors (EPs) under power when used in electronic systems. It is aimed at general
engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement.
An Introduction to IBIS (I/O Buffer Information Specification) Modeling discusses various aspects of IBIS
including its history, advantages, compatibility, model generation flow, data requirements in modeling the input/
output structures, and future trends.
Serial Flash Programming of C2000™ Microcontrollers discusses using a flash kernel and ROM loaders for
serial programming a device.
The Essential Guide for Developing With C2000™ Real-Time Microcontrollers provides a deeper look into the
components that differentiate the C2000 Microcontroller Unit (MCU) as it pertains to Real-Time Control Systems.
Migrating Software From 8-Bit (Byte) Addressable CPUs to C28x CPU discusses common scenarios of
migrating software from 8-bit (byte) addressable CPUs to C28x CPU, and provides a guide on how to develop
application irrespective of the addressability.
The Hardware Design Guide for F2800x C2000™ Real-Time MCU Series Application Note is an essential guide
for hardware developers using C2000 devices, and helps to streamline the design process while mitigating the
potential for faulty designs. Key topics discussed include: power requirements; general-purpose input/output
(GPIO) connections; analog inputs and ADC; clocking generation and requirements; and JTAG debugging
among many others.
9.5 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.6 Trademarks
C2000™, TMS320C2000™, Code Composer Studio™, and TI E2E™ are trademarks of Texas Instruments.
Windows® is a registered trademark of Microsoft Corporation.
Linux® is a registered trademark of Linus Torvalds.
macOS® is a registered trademark of Apple Inc.
All trademarks are the property of their respective owners.
9.7 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.8 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
Changes from April 2, 2024 to September 19, 2024 Page
• This Revision History lists the changes from SPRSP85 to SPRSP85A. .................................................... 1
• Global: TI is transitioning to use more inclusive terminology. Some language may be different than what you
would expect to see for certain technology areas. For SPI, all instances of legacy terminology have been
changed to controller and peripheral. All instances of legacy pin names have been changed to: POCI
(Peripheral OUT Controller IN); PICO (Peripheral IN Controller OUT); and CS (Chip Select). For the I2C Bus
Interface, all instances of legacy terminology have been changed to controller and target. For the CAN and
LIN Interface/BUS, all instances of legacy terminology have been changed to commander and responder.
For the EtherCAT Controller, all instances of legacy terminology have been changed to MainDevice (or
MDevice) and SubordinateDevice (or SubDevice)............................................................................................. 1
• Global: Changed document status statement from "ADVANCE INFORMATION for preproduction products;
subject to change without notice" to "UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA"..................................................................................................................................................................1
• Global: Information on the TMS320F28P550SJ device is Production Data...................................................... 1
• Global: Information on the TMS320F28P559SJ-Q1, TMS320F28P559SG-Q1, and TMS320F28P550SG
devices is preview information only (not Production Data),................................................................................1
• Global: Removed TMS320F28P550SD device................................................................................................. 1
• Global: Changed "NNPU" to "NPU"...................................................................................................................1
• Global: Changed DACB_OUT to CMP1_DACL................................................................................................ 1
• Features section: Removed "Neural-Network Processing Unit (NNPU)" from "Real-time processing"
features...............................................................................................................................................................1
• Features section: Added Fast Serial Interface (FSI) to Communications peripherals........................................1
• Features section: Changed "24 ePWM channels with 16 channels that have high-resolution capability (150ps
resolution)" to "24 ePWM channels with 12 channels that have high-resolution capability (150ps
resolution)"..........................................................................................................................................................1
• Features section: Added "Neural-network Processing Unit (NPU)" features..................................................... 1
• Description section: Updated applications link in "These include such applications as". Added paragraph
about Neural-network Processing Unit (NPU).................................................................................................... 3
• Package Information table: Added "Preview information (not Production Data)" footnote................................. 3
• Functional Block Diagram figure: Changed "24x ePWM Channels (16Ch Hi-Res Capable)" to "24x ePWM
Channels (12Ch Hi-Res Capable)".....................................................................................................................5
• Device Comparison table: Added "Preview information (not Production Data)" footnote...................................7
• Pin Attributes table: Changed DACB_OUT to CMP1_DACL. Added footnotes about VREFLO and VREFHI. 10
• 128-pin PDT Thin Quad Flatpack (Top View) figure: Changed DACB_OUT to CMP1_DACL on Pin 29......... 10
• 100-Pin PZ Low-Profile Quad Flatpack (Top View) figure: Changed DACB_OUT to CMP1_DACL on
Pin 22............................................................................................................................................................... 10
• 80-Pin PNA Thin Quad Flatpack (Top View) figure: Changed DACB_OUT to CMP1_DACL on Pin 18.......... 10
• 64-Pin PM Low-Profile Quad Flatpack (Top View) figure: Changed DACB_OUT to CMP1_DACL on Pin 14..10
• 56-Pin RSH Very Thin Quad Flatpack No-Lead (Top View) figure: Changed DACB_OUT to CMP1_DACL on
Pin 12............................................................................................................................................................... 10
• Analog Signals table: Removed DACB_OUT. Added footnotes about VREFLO and VREFHI........................ 40
• Digital Inputs and Outputs on ADC Pins (AGPIOs) section: Updated section..................................................52
• Absolute Maximum Ratings table: Removed reference to "Continuous clamp current per pin is ±2mA"
footnote from "Input clamp current - total for all inputs"....................................................................................67
• Electrical Characteristics table: Updated IOL, ROL, and ILEAK. Added VIH (High-level input voltage -
GPIO23/41). Updated MIN values of VHYSTERESIS........................................................................................... 67
• ESD Ratings – Commercial table: Added HBM value for 5V FS (fail-safe) pins.............................................. 68
• ESD Ratings – Automotive table: Added HBM value for 5V FS (fail-safe) pins............................................... 69
• System Current Consumption - VREG Enable - Internal Supply table: Updated table.................................... 71
• System Current Consumption - VREG Disable - External Supply table: Updated table.................................. 71
• Typical Current Reduction per Disabled Peripheral table: Changed "ePWM(per)" to "ePWM (for 1 ePWM)"..75
• Special Considerations for 5V Fail-Safe Pins section: Added section..............................................................78
• Clocking System figure: Updated figure........................................................................................................... 93
• Internal Clock Frequencies table: Added f(NPU), NPUCLK frequency............................................................... 96
• Crystal Oscillator Specifications section: Removed duplicate Crystal Oscillator Electrical Characteristics
table................................................................................................................................................................ 103
• RAM Specifications section: Removed RAM Parameters – F28P55xSD table..............................................108
• ROM Specifications section: Changed table title from ROM Parameters – F28P55xSJ, F28P55xSG, and
F28P55xSD to ROM Parameters – F28P55xSJ and F28P55xSG................................................................. 109
• GPIO Electrical Data and Timing section: Updated section........................................................................... 114
• Analog Subsystem Block Diagram (128-/80-/64-/56-Pin Packages) figure: Changed A1/B7/D11/DACB_OUT
to A1/B7/D11/CMP1_DACL............................................................................................................................124
• Analog Subsystem Block Diagram (100-Pin Package) figure: Changed A1/B7/D11/DACB_OUT to A1/B7/D11/
CMP1_DACL..................................................................................................................................................124
• CMPSS Input Mux Options table: Changed "A1, B7, D11, DACB_OUT" to "A1, B7, D11, CMP1_DACL" for
HP4 and LP4.................................................................................................................................................. 124
• Analog Pins and Internal Connections table: Changed "A1/B7/D11/DACB_OUT" to "A1/B7/D11/
CMP1_DACL" in Analog Group 1. Changed DACB_OUT to CMP1_DACL in Analog Group 1. ..................129
• Analog Signal Descriptions table: Changed DACB_OUT to CMP1_DACL. ................................................. 132
• ADC Characteristics table: Updated Offset Error, SNR, THD, ENOB, and PSRR. Added "Frequency tolerance
over temperature of the INTOSC ..." footnote. .............................................................................................. 136
• ADC Performance Per Pin section: Added section........................................................................................ 139
• Per-Channel Parasitic Capacitance for 128-Pin QFP table: Updated table................................................... 143
• Per-Channel Parasitic Capacitance for 100-Pin QFP table: Updated table................................................... 143
• Per-Channel Parasitic Capacitance for 80-Pin QFP table: Updated table..................................................... 143
• Per-Channel Parasitic Capacitance for 64-Pin QFP table: Updated table..................................................... 143
• Per-Channel Parasitic Capacitance for 56-Pin QFN table: Updated table..................................................... 143
• Buffered Output from CMPx_DACL Electrical Characteristics table: Updated MIN and MAX values of INL..157
• PGA Characteristics table: Updated table and footnotes............................................................................... 165
• Overview section: Updated section................................................................................................................ 212
• Functional Block Diagram figure: Changed "24x ePWM Channels (16Ch Hi-Res Capable)" to "24x ePWM
Channels (12Ch Hi-Res Capable)".................................................................................................................213
• Flash Memory Map table: Updated table........................................................................................................218
• Peripheral Registers Memory Map table: Updated table................................................................................220
• Device Identification Registers table: Removed PARTIDH for TMS320F28P55xSD7. Added REVID for silicon
revision A........................................................................................................................................................225
• Reference Design section: Updated section.................................................................................................. 246
• Device Nomenclature figure: Updated figure..................................................................................................248
• Package Symbolization for PDT Package – Automotive figure: Updated definition of G4............................. 249
• Package Symbolization for PZ Package – Automotive figure: Updated definition of G4................................249
• Package Symbolization for PZ Package – Non-Automotive figure: Updated definition of G4. Updated device
number............................................................................................................................................................249
• Package Symbolization for PNA Package – Automotive figure: Updated definition of G4.............................249
• Package Symbolization for PNA Package – Non-Automotive figure: Updated definition of G4. Updated device
number............................................................................................................................................................249
• Package Symbolization for PM Package – Automotive figure: Updated definition of G4...............................249
• Package Symbolization for PM Package – Non-Automotive figure: Updated definition of G4. Updated device
number............................................................................................................................................................249
• Package Symbolization for RSH Package – Non-Automotive figure: Updated definition of G4. Updated device
number............................................................................................................................................................249
• Revision Identification table: Changed REVID of Silicon Revision 0 to 0x0000 0001. Added silicon
revision A........................................................................................................................................................ 249
• Documentation Support section: Added Migrating Software From 8-Bit (Byte) Addressable CPUs to C28x
CPU to Application Notes section...................................................................................................................253
• Documentation Support section: Added Hardware Design Guide for F2800x C2000™ Real-Time MCU Series
Application Note..............................................................................................................................................253
Packaging Information
Package Package Lead/Ball MSL Peak
Orderable Device Status(1) Package Type Pins Eco Plan(2) Op Temp (°C) Device Marking(4) (5)
Drawing Qty Finish(6) Temp(3)
F28P550SJ9PDT ACTIVE TQFP PDT 128 90 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PDT
no Sb/Br) 168 HR
F28P550SJ9PDTR ACTIVE TQFP PDT 128 Call TI Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PDT
no Sb/Br) 168 HR
XF28P559SJ9PDTQ1 ACTIVE TQFP PDT 128 90 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PDTQ
no Sb/Br) 168 HR
XF28P559SJ9PDTRQ1 ACTIVE TQFP PDT 128 Call TI Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PDTQ
no Sb/Br) 168 HR
F28P550SJ9PZ ACTIVE LQFP PZ 100 90 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PZ
no Sb/Br) 168 HR
F28P550SJ9PZR ACTIVE LQFP PZ 100 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PZ
no Sb/Br) 168 HR
XF28P559SJ9PZQ1 ACTIVE LQFP PZ 100 90 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PZQ
no Sb/Br) 168 HR
XF28P559SJ9PZRQ1 ACTIVE LQFP PZ 100 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PZQ
no Sb/Br) 168 HR
F28P550SJ9PNA ACTIVE TQFP PNA 80 160 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PNA
no Sb/Br) 168 HR
F28P550SJ9PNAR ACTIVE TQFP PNA 80 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PNA
no Sb/Br) 168 HR
XF28P559SJ9PNAQ1 ACTIVE TQFP PNA 80 160 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PNAQ
no Sb/Br) 168 HR
XF28P559SJ9PNARQ1 ACTIVE TQFP PNA 80 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PNAQ
no Sb/Br) 168 HR
F28P550SJ9PM ACTIVE LQFP PM 64 160 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PM
no Sb/Br) 168 HR
F28P550SJ9PMR ACTIVE LQFP PM 64 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 F28P550SJ9PM
no Sb/Br) 168 HR
XF28P559SJ9PMQ1 ACTIVE LQFP PM 64 160 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PMQ
no Sb/Br) 168 HR
XF28P559SJ9PMRQ1 ACTIVE LQFP PM 64 1000 Green (RoHS & NIPDAU Level-3260C- –40 to 125 XF28P559SJ9PMQ
no Sb/Br) 168 HR
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Width (mm)
H
W
L
All dimensions are nominal.
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
F28P550SJ9RSHR VQFN RSH 56 4000 367.0 367.0 35.0
XF28P559SJ9PMRQ1 LQFP PM 64 1000 336.6 336.6 41.3
F28P550SJ9PMR LQFP PM 64 1000 336.6 336.6 41.3
XF28P559SJ9PNARQ1 TQFP PNA 80 1000 336.6 336.6 41.3
F28P550SJ9PNAR TQFP PNA 80 1000 336.6 336.6 41.3
XF28P559SJ9PZRQ1 LQFP PZ 100 1000 367.0 367.0 55.0
F28P550SJ9PZR LQFP PZ 100 1000 367.0 367.0 55.0
XF28P559SJ9PDTRQ1 TQFP PDT 128 1000 367.0 367.0 55.0
F28P550SJ9PDTR TQFP PDT 128 1000 367.0 367.0 55.0
TRAY
W-
Outer
tray
width
Text
14.05
PIN 1 ID B
13.95
A 128 97
1 96
14.05 16.1
TYP
13.95 15.9
32
65
33
64
124X 0.4 0.23
128X
0.13
4X 12.4 0.05 C A B
C
(0.13) TYP
SEATING PLANE
0.08 C
0.25
GAGE PLANE (1)
DETAIL A
TYPICAL
DETAIL A
SCALE: 12
4215171/A 10/2023
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
www.ti.com
EXAMPLE BOARD LAYOUT
PDT0128A TQFP - 1.2 mm max height
PLASTIC QUAD FLATPACK
SYMM
128 97
128X (1.45)
1
96
128X (0.2)
124X (0.4)
(R0.05) TYP
SYMM
(15.35)
32 65
SEE DETAILS
33 64
(15.35)
www.ti.com
EXAMPLE STENCIL DESIGN
PDT0128A TQFP - 1.2 mm max height
PLASTIC QUAD FLATPACK
SYMM
128 97
128X (1.45)
1
96
128X (0.2)
124X (0.4)
SYMM
(15.35)
(R0.05) TYP
32 65
33 64
(15.35)
4215171/A 10/2023
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
7. Board assembly site may have different recommendations for stencil design.
www.ti.com
MECHANICAL DATA
0,27
0,50 0,08 M
0,17
75 51
76 50
1 25
12,00 TYP Gage Plane
14,20
SQ
13,80
16,20 0,25
SQ 0,05 MIN 0°– 7°
15,80
1,45 0,75
1,35 0,45
Seating Plane
4040149 /B 11/96
10.1
PIN 1 ID B
9.9
80 61
A
1 60
12.2
TYP
11.8
10.1
9.9
20 41
21 40
0.21
76X 0.4 80X
0.15
4X 7.6 0.05 C A B
SEE DETAIL A
1.2 MAX
C
(0.13) TYP
SEATING PLANE
0.08 C
0.25
GAGE PLANE (1)
0.15
0 -5 0.7 0.05
0.5
DETAIL A
DETAIL A
SCALE: 14
TYPICAL
4229169/E 09/2024
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PNA0080A TQFP - 1.2 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.45)
1
60
80X (0.2)
(11.4)
(R0.05) TYP
20 41
21 40
(11.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
www.ti.com
EXAMPLE STENCIL DESIGN
PNA0080A TQFP - 1.2 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.45)
1
60
80X (0.2)
(11.4)
(R0.05) TYP
20 41
21 40
(11.4)
4229169/E 09/2024
NOTES: (continued)
7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
8. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
PM0064A SCALE 1.400
LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
10.2
B
9.8
NOTE 3
64 49
PIN 1 ID
1 48
10.2 12.2
TYP
9.8 11.8
NOTE 3
16 33
17 32
A
0.27
60X 0.5 64X
0.17
4X 7.5 0.08 C A B
C
(0.13) TYP
SEATING PLANE
0.08
SEE DETAIL A
TYPICAL
4215162/A 03/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
60X (0.5) (11.4)
(R0.05) TYP
16 33
17 32
(11.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
4215162/A 03/2017
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
(R0.05) TYP
16 33
17 32
(11.4)
4215162/A 03/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
RSH0056G SCALE 2.000
VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
7.1
B A
6.9
7.1
6.9
(0.17)
(0.175)
DETAIL A
A35.000
1.0
0.8 TYPICAL
C
SEATING PLANE
0.05 0.08 C
0.00
2X 5.2
SYMM
EXPOSED (0.1) TYP
THERMAL PAD 15 28
14 29
SYMM 57
2X 5.2 5.3 0.1
1 42
52X 0.4 0.225
56X
43 0.125
56
PIN 1 ID 0.1 C A B
(45 X 0.3) 0.65
56X 0.05 C
0.45
SEE DETAIL A
4229539/B 08/2023
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RSH0056G VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
( 5.3)
SYMM
56 43 SEE SOLDER MASK
56X (0.75) DETAIL
56X (0.2)
1
42
(1.12) TYP
52X (0.4)
( 0.2) TYP
VIA
14 29
15 28
(1.28) TYP (1.12)
TYP
(6.65)
0.05 MIN
0.05 MAX ALL AROUND
ALL AROUND
METAL UNDER
METAL EDGE SOLDER MASK
4229539/B 08/2023
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
RSH0056G VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
56 43
56X (0.75)
56X (0.2)
1
42
57 (0.64) TYP
SYMM (6.65)
(R0.05) TYP
16X (1.08)
14 29
15 28
SYMM 16X
(1.08)
(6.65)
EXPOSED PAD 57
66% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
4229539/B 08/2023
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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