Tms 320 F 2800157
Tms 320 F 2800157
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA.
TMS320F2800157-Q1, TMS320F2800157, TMS320F2800156-Q1, TMS320F2800155-Q1
TMS320F2800155, TMS320F2800154-Q1, TMS320F2800153-Q1, TMS320F2800152-Q1
SPRSP68B – JANUARY 2023 – REVISED NOVEMBER 2023 www.ti.com
• Engine fan
2 Applications • eTurbo/charger
• Automotive • Pump
– ADAS • Automatic transmission
• Radar ECU • Electric power steering (EPS)
• Mechanically scanning LIDAR – Infotainment and cluster
– Body electronics & lighting • Head-up display
• Door module • Telematics control unit
• Trunk module • Automotive head unit
• Window module • Aftermarket audio amplifier
• Body control module (BCM) • Automotive active noise cancellation
• HVAC compressor module • Automotive external amplifier
• HVAC control module • Industrial
• Interior heater module – Motor drives
• Headlight • AC drive control module
• Seat comfort module • AC drive power stage module
• Seat position and fold module • Servo drive control module
• Steering wheel control • Servo drive power stage module
• DC/AC inverter – Factory automation & control
• Mid power DC/DC converter • Mobile robot motor control
• Hybrid, Electric, Powertrain Systems – Telecom & server power
– Battery management system (BMS) • Merchant DC/DC
• DC/DC converter • Merchant network & server PSU
• Inverter & motor control • Merchant telecom rectifiers
• On-board (OBC) & wireless charger – UPS
• Vehicle control unit (VCU) • Three phase UPS
• Virtual engine sound system (VESS) • Single phase online UPS
3 Description
The TMS320F280015x (F280015x) is a member of the cost-optimized C2000 real-time microcontroller family of
scalable, ultra-low latency devices designed for efficiency in power electronics.
These include such applications as:
• HVAC compressor module
• Headlight
• DC/DC converter
• Inverter & motor control
• On-board (OBC) & wireless charger
• Pump
• Industrial motor drives
• Motor control
• Digital power
• Sensing and signal processing
TMS320F280015x has dual 32-bit C28x CPUs in Lockstep, enabling the device to achieve ASIL B functional
safety device rating without much SW overhead. The real-time control subsystem is based on TI’s 32-bit C28x
DSP core, which provides 120 MHz of signal-processing performance for floating- or fixed-point code running
from either on-chip flash or SRAM. The C28x CPU is further boosted by the Trigonometric Math Unit (TMU) and
VCRC (Cyclical Redundancy Check) extended instruction sets, speeding up common algorithms key to real-time
control systems.
The F280015x supports up to 256KB (128KW) of flash memory. Up to 36KB (18KW) of on-chip SRAM is also
available to supplement the flash memory.
High-performance analog blocks are integrated on the F280015x real-time microcontroller (MCU) and are closely
coupled with the processing and PWM units to provide optimal real-time signal chain performance. Fourteen
PWM channels enable control of various power stages from a 3-phase inverter to power-factor correction and
other advanced multilevel power topologies.
Interfacing is supported through various industry-standard communication ports (such as PMBUS, SPI, SCI, LIN,
I2C, CAN and CAN FD) and offers multiple pin-muxing options for optimal signal placement.
Want to learn more about features that make C2000™ MCUs the right choice for your real-time control system?
Check out The Essential Guide for Developing With C2000™ Real-Time Microcontrollers and visit the C2000
real-time microcontrollers page.
The Getting Started With C2000™ Real-Time Control Microcontrollers (MCUs) Getting Started Guide covers all
aspects of development with C2000 devices from hardware to support resources. In addition to key reference
documents, each section provides relevant links and resources to further expand on the information covered.
Ready to get started? Check out the TMDSCNCD2800157 evaluation board and download C2000Ware.
Package Information
PART NUMBER PACKAGE(1) PACKAGE SIZE(2) BODY SIZE (NOM)
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
TMS320F2800157-Q1
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
TMS320F2800157 PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
TMS320F2800156-Q1
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
TMS320F2800155-Q1
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
TMS320F2800155 PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
PN (LQFP, 80) 14 mm × 14 mm 12 mm × 12 mm
PM (LQFP, 64) 12 mm × 12 mm 10 mm × 10 mm
TMS320F2800154-Q1
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
TMS320F2800153-Q1
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
PHP (HTQFP, 48) 9 mm × 9 mm 7 mm × 7 mm
TMS320F2800152-Q1
RHB (VQFN, 32) 5 mm × 5 mm 5 mm × 5 mm
(1) For more information, see Mechanical, Packaging, and Orderable Information.
(2) The package size (length × width) is a nominal value and includes pins, where applicable.
Device Information
PACKAGE FREQUENCY CMPSS HRPWM FLASH Free-Air
PART NUMBER(1) CODE(2) AEC-Q100
OPTIONS (MHz) (12-bit DAC) Channels SIZE Temperature
TMS320F2800157 S 80PN 256KB
64PM – 120 1 4
TMS320F2800155 48PHP 128KB
(1) For more information on these devices, see the Device Comparison table.
(2) S: Non-automotive parts
Q: Automotive Grade 1 parts
E: Automotive Grade 0 parts
(3) Preview information (not Production Data).
LS0-LS1 RAM
16 KW (32 KB)
Crystal Oscillator
INTOSC1, INTOSC2
PLL
Table of Contents
1 Features............................................................................1 6.14 Analog Peripherals................................................107
2 Applications..................................................................... 2 6.15 Control Peripherals............................................... 134
3 Description.......................................................................2 6.16 Communications Peripherals................................ 145
3.1 Functional Block Diagram........................................... 5 7 Detailed Description....................................................167
4 Device Comparison......................................................... 7 7.1 Overview................................................................. 167
4.1 Related Products...................................................... 10 7.2 Functional Block Diagram....................................... 168
5 Pin Configuration and Functions................................. 11 7.3 Memory................................................................... 169
5.1 Pin Diagrams.............................................................11 7.4 Identification............................................................176
5.2 Pin Attributes.............................................................15 7.5 C28x Processor...................................................... 177
5.3 Signal Descriptions................................................... 30 7.6 Device Boot Modes.................................................180
5.4 Pin Multiplexing.........................................................38 7.7 Security................................................................... 188
5.5 Pins With Internal Pullup and Pulldown.................... 44 7.8 Watchdog................................................................ 189
5.6 Connections for Unused Pins................................... 44 7.9 C28x Timers............................................................190
6 Specifications................................................................ 46 7.10 Dual-Clock Comparator (DCC)............................. 190
6.1 Absolute Maximum Ratings...................................... 46 7.11 Functional Safety.................................................. 192
6.2 ESD Ratings – Commercial...................................... 46 8 Applications, Implementation, and Layout............... 193
6.3 ESD Ratings – Automotive....................................... 47 8.1 Application and Implementation..............................193
6.4 Recommended Operating Conditions.......................47 8.2 Key Device Features...............................................193
6.5 Power Consumption Summary................................. 48 8.3 Application Information........................................... 196
6.6 Electrical Characteristics...........................................58 9 Device and Documentation Support..........................213
6.7 Thermal Resistance Characteristics for PN 9.1 Getting Started and Next Steps.............................. 213
Package...................................................................... 59 9.2 Device Nomenclature..............................................213
6.8 Thermal Resistance Characteristics for PM 9.3 Markings................................................................. 214
Package...................................................................... 59 9.4 Tools and Software................................................. 218
6.9 Thermal Resistance Characteristics for PHP 9.5 Documentation Support.......................................... 219
Package...................................................................... 59 9.6 Support Resources................................................. 220
6.10 Thermal Resistance Characteristics for RHB 9.7 Trademarks............................................................. 220
Package...................................................................... 60 9.8 Electrostatic Discharge Caution..............................220
6.11 Thermal Design Considerations..............................60 9.9 Glossary..................................................................220
6.12 Thermal Design Considerations for AEC-Q100 10 Revision History........................................................ 220
Grade 0....................................................................... 60 11 Mechanical, Packaging, and Orderable
6.13 System.................................................................... 62 Information.................................................................. 222
4 Device Comparison
Table 4-1 lists the features of the TMS320F280015x devices.
Table 4-1. Device Comparison
F2800157 F2800155
F2800153- F2800156- F2800154- F2800152-
FEATURE(1) F2800157- F2800155-
Q1 Q1(2) Q1 Q1
Q1(2) Q1
PROCESSOR AND ACCELERATORS
Frequency (MHz) 120 100
FPU32 - Type 0 Yes
C28x (dual-core, lockstep)
TMU – Type 0 Yes
VCRC Yes
MEMORY
256KB 128KB 64KB 256KB 128KB 64KB
Flash
(128KW) (64KW) (32KW) (128KW) (64KW) (32KW)
RAM 36KB (18KW)
Security: JTAGLOCK, Zero-pin boot, Dual-zone
Yes
security
SYSTEM
32-bit CPU timers 3
Watchdog-timer 1
Dual Clock Compare (DCC) 1
External Interrupts 5
Embedded Pattern Generator (EPG) 1
Nonmaskable Interrupt Watchdog (NMIWD) timers 1
Crystal oscillator/External clock input 1
INTOSC with ExtR accuracy(6) +/- 1%
Internal oscillator accuracy (2 INTOSC) See the Internal Oscillators section
52
80-pin QFP PN
(11 shared with analog and 4 shared with TDI, TDO, X1, X2)
37
64-pin QFP PM
(11 shared with analog and 4 shared with TDI, TDO, X1, X2)
27
48-pin QFP PHP
(9 shared with analog and 4 shared with TDI, TDO, X1, X2)
GPIO
18
32-pin QFN RHB
(5 shared with analog and 4 shared with TDI, TDO, X1, X2)
4
(When cJTAG is used, TDI and TDO can be GPIO.
Additional GPIO
When INTOSC is used as clock source, X1 and X2 can be GPIO.)
Note: These 4 GPIOs are included in the counts above.
80-pin QFP PN 10
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor
differences between devices that do not affect the basic functionality of the module.
(2) Information on the TMS320F2800157-Q1 (Grade 1) and TMS320F2800156-Q1 (Grade 1) devices is Production Data.
Information on the TMS320F2800157-Q1 (Grade 0) and TMS320F2800156-Q1 (Grade 0) devices is preview information only (not
Production Data).
(3) Time between start of sample-and-hold window to start of sample-and-hold window of the next conversion.
(4) For devices that are available in more than one package, the peripheral count listed in the smaller package is reduced because the
smaller package has less device pins available. The number of peripherals internally present on the device is not reduced compared
to the largest package offered within a part number. See Section 5 to identify which peripheral instances are accessible on pins in the
smaller package.
(5) Q1 refers to AEC-Q100 qualification for automotive applications.
(6) See the Internal Oscillators section for INTOSC accuracy values
(7) 32 RHB is Functional Safety Quality-Managed
GPIO14
GPIO15
GPIO34
GPIO10
GPIO45
GPIO44
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
VDD
VSS
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
GPIO30 1 60 GPIO3
GPIO31 2 59 GPIO4
GPIO29 3 58 GPIO8
A16/C16,GPIO28 4 57 GPIO42
XRSn 5 56 VREGENZ
GPIO46 6 55 VSS
VDDIO 7 54 GPIO43
VDD 8 53 VDD
VSS 9 52 VDDIO
A6,GPIO228 10 51 GPIO19,X1
C6,GPIO226 11 50 GPIO18,X2
A3/C5,GPIO242 12 49 GPIO32
A2/C9,GPIO224 13 48 GPIO35/TDI
A15/C7 14 47 TMS
C4/A14 15 46 GPIO37/TDO
A11/C0 16 45 TCK
A5/C2 17 44 GPIO27
A1 18 43 GPIO26
A0/C15/CMP1_DACL 19 42 GPIO25
VREFHI 20 41 GPIO24
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
Not to scale
VREFLO
A12/C1
A7/C3
A8/C11
VSSA
VDDA
A4/C14
C8/A9,GPIO227
A10/C10,GPIO230
VSS
GPIO48
GPIO49
A17/C17,GPIO20
A18/C18,GPIO21
A19/C19,GPIO13
A20/C20,GPIO12
GPIO11
GPIO33
GPIO16
GPIO17
A. Only the GPIO function is shown on GPIO terminals. See Section 5.2 for the complete, muxed signal name.
GPIO10
GPIO22
GPIO41
GPIO23
GPIO40
VDDIO
GPIO6
GPIO9
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
VDD
VSS
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
GPIO29 1 48 GPIO4
A16/C16,GPIO28 2 47 GPIO8
XRSn 3 46 VREGENZ
VDD 4 45 VSS
VSS 5 44 VDD
A6,GPIO228 6 43 VDDIO
C6,GPIO226 7 42 GPIO19,X1
A3/C5,GPIO242 8 41 GPIO18,X2
A2/C9,GPIO224 9 40 GPIO32
A15/C7 10 39 GPIO35/TDI
C4/A14 11 38 TMS
A11/C0 12 37 GPIO37/TDO
A5/C2 13 36 TCK
A1 14 35 GPIO24
A0/C15/CMP1_DACL 15 34 GPIO17
VREFHI 16 33 GPIO16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
Not to scale
VREFLO
A12/C1
A7/C3
A8/C11
VSSA
VDDA
A4/C14
C8/A9,GPIO227
A10/C10,GPIO230
VSS
A17/C17,GPIO20
A18/C18,GPIO21
A19/C19,GPIO13
A20/C20,GPIO12
GPIO11
GPIO33
A. Only the GPIO function is shown on GPIO terminals. See Section 5.2 for the complete, muxed signal name.
VREGENZ
GPIO44
VDDIO
GPIO6
GPIO5
GPIO7
GPIO0
GPIO1
GPIO2
GPIO3
GPIO4
VDD
48
47
46
45
44
43
42
41
40
39
38
37
GPIO29 1 36 VDD
A16/C16,GPIO28 2 35 VDDIO
XRSn 3 34 GPIO19,X1
A6,C6,GPIO226,GPIO228 4 33 GPIO18,X2
A3/C5,GPIO242 5 32 GPIO32
A2/C9,GPIO224 6 31 GPIO35/TDI
VSS
A15/C7,C4/A14 7 30 TMS
A11/C0 8 29 GPIO37/TDO
A5/C2 9 28 TCK
A1 10 27 GPIO24
A0/C15/CMP1_DACL 11 26 GPIO16
VREFHI 12 25 GPIO33
13
14
15
16
17
18
19
20
21
22
23
24
Not to scale
VREFLO
A12/C1
A7/C3
A8/C11
VSSA
VDDA
A4/C14
C8/A9,GPIO227
A10/C10,GPIO230
A17/C17,GPIO20
A19/C19,GPIO13
A20/C20,GPIO12
A. Only the GPIO function is shown on GPIO terminals. See Section 5.2 for the complete, muxed signal name.
Figure 5-3. 48-Pin PHP PowerPAD™ Thermally Enhanced Thin Quad Flatpack (Top View)
A16/C16,GPIO28
VREGENZ
GPIO29
GPIO5
GPIO7
GPIO0
GPIO1
GPIO3
32
31
30
29
28
27
26
25
XRSn 1 24 VDD
A6,C6,GPIO226,GPIO228 2 23 VDDIO
A3/C5,GPIO242 3 22 GPIO19,X1
A2/C9,GPIO224 4 21 GPIO18,X2
VSS
A15/C7,C4/A14 5 20 GPIO32
A11/C0,A5/C2 6 19 GPIO35/TDI
A0/C15/CMP1_DACL,A1 7 18 TMS
A12/C1,A7/C3 8 17 GPIO37/TDO
10
12
13
14
15
16
11
9
A8/C11
VSSA
VDDA
A4/C14
A10/C10,C8/A9,GPIO227,GPIO230
GPIO11
GPIO24
TCK
Not to scale
A. Only the GPIO function is shown on GPIO terminals. See Section 5.2 for the complete, muxed signal name.
Figure 5-4. 32-Pin RHB Very Thin Quad Flatpack No Lead (Top View)
Product Folder Links: TMS320F2800157-Q1 TMS320F2800157 TMS320F2800156-Q1 TMS320F2800155-Q1 TMS320F2800155 TMS320F2800154-Q1 TMS320F2800153-Q1
TMS320F2800152-Q1
TMS320F2800157-Q1, TMS320F2800157, TMS320F2800156-Q1, TMS320F2800155-Q1
TMS320F2800155, TMS320F2800154-Q1, TMS320F2800153-Q1, TMS320F2800152-Q1
www.ti.com SPRSP68B – JANUARY 2023 – REVISED NOVEMBER 2023
Note
If digital signals with sharp edges (high dv/dt) are connected to the AIOs, cross-talk can occur with
adjacent analog signals. The user should therefore limit the edge rate of signals connected to AIOs if
adjacent channels are being used for analog functions.
(1) By default there are no signals connected to AGPIO pins. One of the other rows in the table must be chosen for pin functionality.
Note
If digital signals with sharp edges (high dv/dt) are connected to the AGPIOs, cross-talk can occur with
adjacent analog signals. The user must therefore limit the edge rate of signals connected to AGPIOs,
if adjacent channels are being used for analog functions.
CTRIPOUTH
CTRIPOUTL (Output X-BAR only)
CMPSSx
CTRIPH
CTRIPL (ePWM X-BAR only)
X-BAR Flags
(shared)
(1) Pins not bonded out in a given package will have the internal pullups enabled by the Boot ROM.
DIGITAL
• No connection (input mode with internal pullup enabled)
GPIOx • No connection (output mode with internal pullup disabled)
• Pullup or pulldown resistor (any value resistor, input mode, and with internal pullup disabled)
When TDI mux option is selected (default), the GPIO is in Input mode.
GPIO35/TDI • Internal pullup enabled
• External pullup resistor
When TDO mux option is selected (default), the GPIO is in Output mode only during JTAG activity;
otherwise, it is in a tri-state condition. The pin must be biased to avoid extra current on the input buffer.
GPIO37/TDO • Internal pullup enabled
• External pullup resistor
• No Connect
TCK • Pullup resistor
6 Specifications
6.1 Absolute Maximum Ratings
over recommended operating conditions (unless otherwise noted)(1) (2)
MIN MAX UNIT
VDD with respect to VSS –0.3 1.5
Supply voltage VDDIO with respect to VSS –0.3 4.6 V
VDDA with respect to VSSA –0.3 4.6
Input voltage VIN (3.3 V) –0.3 4.6 V
Output voltage VO –0.3 4.6 V
Digital/analog input (per pin), IIK (VIN < VSS/VSSA or VIN > VDDIO/
–20 20
VDDA)(4)
Input clamp current mA
Total for all inputs, IIKTOTAL
–20 20
(VIN < VSS/VSSA or VIN > VDDIO/VDDA)
Output current Digital output (per pin), IOUT –20 20 mA
Operating junction temperature TJ –40 155 °C
Storage temperature(3) Tstg –65 150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device
life. For additional information, see the Semiconductor and IC Package Thermal Metrics Application Report.
(4) Continuous clamp current per pin is ±2 mA. Do not operate in this condition continuously as VDDIO/VDDA voltage may internally rise and
impact other electrical specifications.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) Operation above TJ = 105°C for extended duration will reduce the lifetime of the device. See Calculating Useful Lifetimes of Embedded
Processors for more information.
(2) See the Power Management Module (PMM) section.
(3) Internal BOR is enabled by default.
(4) See the Power Management Module Operating Conditions table.
IDLE MODE
30 ℃ 19.3 mA
- CPU is in IDLE mode 85 ℃ 24 mA
VDDIO current consumption - Flash is powered down
IDDIO 125 ℃ 37.22 mA
while device is in Idle mode - PLL is Enabled,
SYSCLK=Max Device 134 ℃(3) 39.8 mA
Frequency, CPUCLK is gated 155 ℃(4) 45.1 mA
- X1/X2 crystal is powered up
- Analog Modules are 30 ℃ 0.01 mA
powered down 85 ℃ 0.1 mA
VDDA current consumption while - Outputs are static without
IDDA DC Load 125 ℃ 0.1 mA
device is in Idle mode
- Inputs are static high or low 134 ℃(3) 0.1 mA
155 ℃(4) 0.1 mA
STANDBY MODE (PLL Enabled)
30 ℃ 7.6 mA
- CPU is in STANDBY mode 85 ℃ 11.8 mA
VDDIO current consumption - Flash is powered down
IDDIO 125 ℃ 23.82 mA
while device is in Standby mode- PLL is Enabled, SYSCLK &
CPUCLK are gated 131 ℃(3) 25.5 mA
- X1/X2 crystal is powered 154 ℃(4) 31.8 mA
down
- Analog Modules are 30 ℃ 0.01 mA
powered down 85 ℃ 0.1 mA
VDDA current consumption while - Outputs are static without
IDDA DC Load 125 ℃ 0.1 mA
device is in Standby mode
- Inputs are static high or low 131 ℃(3) 0.1 mA
154 ℃(4) 0.1 mA
(1) Brownout events during flash programming can corrupt flash data and permanently lock the device. Programming environments using
alternate power sources (such as a USB programmer) must be capable of supplying the rated current for the device and other system
components with sufficient margin to avoid supply brownout conditions.
(2) This is the current consumption while reset is active (that is, XRSn is low).
(3) Temperature shown is TJ that occurs when TA is 125 °C (AEC-Q100 Grade 1) at the given current. TJ rises above TA to due to device
self-heating from current consumption. This TJ is applicable for all packages. See Thermal Resistance Characteristics sections for
each package for values used in calculating self-heating due to current consumption.
(4) Temperature shown is TJ that occurs when TA is 150 °C (AEC-Q100 Grade 0) at the given current. TJ rises above TA to due to device
self-heating from current consumption. This TJ is applicable for 48PHP package. See Thermal Resistance Characteristics sections for
each package for values used in calculating self-heating due to current consumption.
(5) Device SYSCLK frequency reduced to 60 MHz to avoid exceeding TJ MAX specification of device. See Thermal Design
Considerations for AEC-Q100 Grade 0 section for more details.
(6) Continuous ERASE/PROGRAM pulses will exceed TJ MAX and must be avoided. Programming and erasing a single sector will not
cause a thermal rise above TJ MAX and can be done at all temperatures. The current provided is the peak ERASE/PROGRAM pulse
current. Device power consumption must not exceed approximately 169 mW (continuous) when using AEC-Q100 Grade 0 temperature
ranges. Otherwise, TJ MAX specification will be exceeded. To avoid exceeding TJ MAX, the average flash current consumed can be
reduced by increasing the time between ERASE/PROGRAM flash pulses. This reduces the overall self-heating of the device by giving
the device time to cool down to ambient temperatures after any temperature rise that occurs during the ERASE/PROGRAM pulse.
(1) Brownout events during flash programming can corrupt flash data and permanently lock the device. Programming environments using
alternate power sources (such as a USB programmer) must be capable of supplying the rated current for the device and other system
components with sufficient margin to avoid supply brownout conditions.
(2) This is the current consumption while reset is active (that is, XRSn is low).
(3) Temperature shown is TJ that occurs when TA is 125 °C (AEC-Q100 Grade 1) at the given current. TJ rises above TA to due to device
self-heating from current consumption. This TJ is applicable for all packages. See Thermal Resistance Characteristics sections for
each package for values used in calculating self-heating due to current consumption.
(4) Temperature shown is TJ that occurs when TA is 150 °C (AEC-Q100 Grade 0) at the given current. TJ rises above TA to due to device
self-heating from current consumption. This TJ is applicable for 48PHP package. See Thermal Resistance Characteristics sections for
each package for values used in calculating self-heating due to current consumption.
CAUTION
Figure 6-2 includes operating mode current data above 125 °C. Not all current and temperature
combinations illustrated in the graph are possible. To minimize the risk of damage to equipment,
operating current must be limited below certain levels to avoid exceeding TJ MAX device
specifications as outlined in Section 6.12.
Figure 6-1. Operating Current Versus Frequency Figure 6-2. Current Versus Temperature - Internal
Supply
70
60
50
OPERATING
40 IDLE
IDD (mA)
STANDBY (PLL EN)
STANDBY (PLL DIS)
30
HALT
20
10
0
40 60 80 100 120 140
Temperature (°C)
(1) This current represents the current drawn by the digital portion of the each module.
(1) See the Pins With Internal Pullup and Pulldown table for a list of pins with a pullup or pulldown.
(2) The analog pins are specified separately; see the Per-Channel Parasitic Capacitance tables that are in the ADC Input Model section
(3) See the Power Management Module (PMM) section.
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘ JC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘ JC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘ JC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘ JC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
F280015xE parts are AEC-Q100 Grade 0 qualified. To maintain both ambient TA (150°C) and junction TJ
(155°C) temperature requirements, the device frequency, excessive IO current, and flash erase/program pulse
frequency must be limited. This is only required for internal supply mode (VREG enabled). The tables below
summarize an example of how the TA and T J requirements can be met for different ambient temperature ranges
of the Grade 0 device.
Table 6-1. Operating Mode Power Example
TA 125°C TA 150°C(3)
SUPPLY VOLTAGE (V)
CURRENT(1) (mA) POWER (mW) CURRENT(1) (mA) POWER (mW)
IDDIO(2) 3.63 77.1 280 45.3 164
IDDA 3.63 2.6 9 1.4 5
TOTAL – 289 – 169
(1) Refer to the System Current Consumption - VREG Enable - Internal Supply table for details.
(2) VDDIO power is dependent on system activity and loads, the values listed in that table assume no DC loads on IO buffers and typical
IO switching activity.
(3) Frequency limited to 60 MHz to reduce current consumption. Current and power values represent the estimated maximum allowable
values based on the thermal characteristics outlined in Thermal Resistance Characteristics for PHP Package.
TA SYSCLK TJ TJ REQUIREMENT
FREQUENCY POWER TA-to-TJ RISE(1)
f(SYSCLK)
125°C 120 MHz 289 mW 18°C 143°C
<155°C
150°C 60 MHz 160 mW 5°C 155°C
(1) TA-to-TJ rise in this example is calculated using RΘJA from the Thermal Resistance Characteristics for PHP Package table.
6.13 System
6.13.1 Power Management Module (PMM)
6.13.1.1 Introduction
The Power Management Module (PMM) handles all the power management functions required for device
operation.
6.13.1.2 Overview
The block diagram of the PMM is shown in Figure 6-4. As can be seen, the PMM comprises of various
subcomponents, which are described in the subsequent sections.
MCU
To Rest of Chip
PMM
I/O CPU Reset
POR RISE Release
DELAY
(80us)
I/O
BOR Internal
All RISE
Monitors DELAY
Release (40us)
Signal
EN
VMONCTL.bit.BORLVMONDIS
VDD
POR
EN
OUT
IN
XRSn
VDD
VSS
VSS
External External
CVDDIO CVDD
Note
Not all the voltage monitors are supported for device operation in an application after boot up. In the
case where a voltage monitor is not supported, an external supervisor is recommended if the device
needs supply voltage monitoring while the application is running.
The three voltage monitors (I/O POR, I/O BOR, VDD POR) all have to release their respective outputs before the
device begins operation (that is, XRSn goes high). However, if any of the voltage monitors trips, XRSn is driven
low. The I/Os are held in high impedance when any of the voltage monitors trip.
6.13.1.2.1.1 I/O POR (Power-On Reset) Monitor
The I/O POR monitor supervises the VDDIO rail. During power up, this is the first monitor to release (that is, first
to untrip) on VDDIO.
6.13.1.2.1.2 I/O BOR (Brown-Out Reset) Monitor
The I/O BOR monitor also supervises the VDDIO rail. During power up, this is the second monitor to release
(that is, second to untrip) on VDDIO. This monitor has a tighter tolerance compared to the I/O POR.
Any drop in voltage below the recommended operating voltages will trip the I/O BOR and reset the device but
this can be disabled by setting VMONCTL.bit.BORLVMONDIS to 1. The I/O BOR can only be disabled after the
device has fully booted up. If the I/O BOR is disabled, the I/O POR will reset the device for voltage drops.
Note
The level at which the I/O POR trips is well below the minimum recommended voltage for VDDIO, and
therefore should not be used for device supervision.
3.63 V +10%
Recommended
System Voltage
3.3 V 0% Regulator Range
VDDIO
Operating
Range
3.1 V –6.1%
VBOR-GB
BOR Guard Band
3.0 V –9.1%
VBOR-VDDIO
Internal BOR Threshold
2.81 V –14.8%
2.80 V –15.1%
Note
VDD POR is programmed at a level below the minimum recommended voltage for VDD, and therefore
it should not be relied upon for VDD supervision if that is required in the application.
VDD Monitoring:
• VDD supplied from the internal VREG: The VDD supply is derived from the VDDIO supply. The VREG is
designed in such a way that a valid VDDIO supply(monitored by the IO BOR) implies a valid VDD supply.
• VDD supplied from an external supply: The VDD POR is not supported for application use. If VDD monitoring
is required by the application, an external supervisor can be used to monitor the VDD rail.
Note
The use of an external supervisor with the internal VREG is not supported.If VDD monitoring is
required by the application, a package with a VREGENZ pin must be used to power VDD externally.
Note
The delay numbers specified in the block diagram are typical numbers.
Note
Not all device packages have VREGENZ pinned out. For packages without VREGENZ, external
VREG mode is not supported.
Note
Having the decoupling capacitor or capacitors close to the device pins is critical.
Note
Having the decoupling capacitor or capacitors close to the device pins is critical.
Note
All the supply pins per rail are tied together internally. For example, all VDDIO pins are tied together
internally, all VDD pins are tied together internally, and so forth.
CAUTION
If the above sequence is violated, device malfunction and possibly damage can occur as current will
flow through unintended parasitic paths in the device.
VDDIO VDDIO
(A)
VBOR-VDDIO-UP VDD VDD VBOR-VDDIO-DN(B)
Internal Internal All
All Monitors Release Monitors Release
Signal(C) Signal(D)
XRSn XRSn
SRVDDIO-UP SRVDD-UP SRVDD-DN SRVDDIO-DN
A. This trip point is the trip point before XRSn releases. See the Power Management Module Characteristics table.
B. This trip point is the trip point after XRSn releases. See the Power Management Module Characteristics table.
C. During power up, the All Monitors Release Signal goes high after all POR and BOR monitors are released. See the PMM Block
Diagram.
D. During power down, the All Monitors Release Signal goes low if any of the POR or BOR monitors are tripped. See the PMM Block
Diagram.
Note
The All Monitors Release Signal is an internal signal.
Note
If there is an external circuit driving XRSn (for example, a supervisor), the boot-up sequence does not
start until the XRSn pin is released by all internal and external sources.
VDDIO VDDIO
(A)
VBOR-VDDIO-UP VBOR-VDDIO-DN(B)
Internal Internal All
All Monitors Release Monitors Release
Signal(C) Signal(D)
XRSn XRSn
SRVDDIO-UP SRVDDIO-DN
VPOR-VDDIO VPOR-VDDIO
A. This trip point is the trip point before XRSn releases. See the Power Management Module Characteristics table.
B. This trip point is the trip point after XRSn releases. See the Power Management Module Characteristics table.
C. During power up, the All Monitors Release Signal goes high after all POR and BOR monitors are released. See the PMM Block
Diagram.
D. During power down, the All Monitors Release Signal goes low if any of the POR or BOR monitors are tripped. See the PMM Block
Diagram.
Note
The All Monitors Release Signal is an internal signal.
Note
If there is an external circuit driving XRSn (for example, a supervisor), the boot-up sequence does not
start until the XRSn pin is released by all internal and external sources.
CAUTION
Non-acceptable sequences leads to reliability concerns and possibly damage.
For simplicity, connecting all 3.3-V rails together and following the descriptions in Supply Pins Power Sequence
is recommended.
Note
The analog modules on the device should only be powered after VDDA has reached the minimum
recommended operating voltage.
Note
The toggling on XRSn has no adverse effect on the device as boot only starts once XRSn is steadily
high. However if XRSn from the device is used to gate the reset signal of other ICs, then the slew rate
requirement should be met to prevent this toggling.
VDD has a minimum slew rate requirement in external VREG mode. If the minimum slew rate is not met, the
VDD POR may release before the VDD operational minimum voltage is met and the device may not start in a
properly reset state.
6.13.1.5 Recommended Operating Conditions Applicability to the PMM
As noted in the Recommended Operating Conditions table, the voltage (VIN) of all pins on the device should be
kept above VSS – 0.3 V. Negative voltages below this value will inject current into the device, which could cause
abnormal operation. Specific care should be taken for pins near the PMM. A negative voltage on these pins can
cause the POR or BOR blocks to unexpectedly assert XRSn or disable the internal VREG (see the PMM Block
Diagram). Pins near the PMM on this device are shown in the Pins Near PMM table below.
Table 6-5. Pins Near PMM
PIN NUMBER
PIN NAME
80 PN 64 PM 48 PHP 32 RHB
GPIO42 57 – – –
GPIO8 58 47 – –
GPIO4 59 48 38 –
GPIO3 60 49 39 26
GPIO2 61 50 40 –
(1) A bulk capacitor should also be used. The exact value of the decoupling capacitance depends on the system voltage regulation
solution that is supplying these pins.
(2) It is recommended to tie the 3.3V rails (VDDIO, VDDA) together and supply them from a single source.
(3) See the Supply Slew Rate section. Supply ramp rate faster than the maximum can trigger the on-chip ESD protection.
(4) See the Power Management Module (PMM) section on possible configurations for the total decoupling capacitance.
(5) TI recommends VBOR-VDDIO-GB to avoid BOR-VDDIO resets due to normal supply noise or load-transient events on the 3.3-V VDDIO
system regulator. Good system regulator design and decoupling capacitance (following the system regulator specifications) are
important to prevent activation of the BOR-VDDIO during normal device operation. The value of VBOR-VDDIO-GB is a system-level design
consideration; the voltage listed here is typical for many applications.
(6) Delay between when the 3.3-V rail ramps up and when the 1.2-V rail ramps up. See the VREG Sequence Summary table for the
allowable supply ramp sequences.
(7) Max capacitor tolerance should be 20%.
2.2 kW to 10 kW
Optional open-drain
XRSn
Reset source
£100 nF
The parameter th(boot-mode) must account for a reset initiated from any of these sources.
See the Resets section of the System Control chapter in the TMS320F280015x Real-Time Microcontrollers
Technical Reference Manual.
CAUTION
Some reset sources are internally driven by the device. Some of these sources will drive XRSn low,
use this to disable any other devices driving the boot pins. The SCCRESET and debugger reset
sources do not drive XRSn; therefore, the pins used for boot mode should not be actively driven by
other devices in the system. The boot configuration has a provision for changing the boot pins in
OTP.
VDDIO VDDA
(3.3V)
VDD (1.2V)
tw(RSL1)
XRSn(A)
tboot-flash
Boot ROM
CPU
Execution
Phase
User code
th(boot-mode)(B) User code dependent
tw(RSL2)
XRSn
User code
CPU
Execution User code Boot ROM
Phase
Boot ROM execution starts
(initiated by any reset source) th(boot-mode)(A)
I/O Pins User-Code Dependent GPIO Pins as Input (Pullups are Disabled)
User-Code Dependent
A. After reset from any source (see the Reset Sources section), the Boot ROM code samples BOOT Mode pins. Based on the status of
the Boot Mode pin, the boot code branches to destination memory or boot code function. If Boot ROM code executes after power-on
conditions (in debugger environment), the Boot code execution time is based on the current SYSCLK speed. The SYSCLK will be
based on user environment and could be with or without PLL enabled.
(1) On reset, internal oscillator 2 (INTOSC2) is the default clock source for the PLL (OSCCLK).
SYSCLKDIVSEL PLLSYSCLK
Watchdog NMIWD
Timer
SYS
PLLRAWCLK Divider
INTOSC1 SYSPLL CPUCLK FPU
OSCCLK TMU
INTOSC2 SYSPLLCLKEN
X1 (XTAL)
OSCCLKSRCSEL
CPU
ePIE Boot ROM
GPIO DCSM
SYSCLK SYSCLK Mx RAMs System Control
Lx RAMs WD
FLASH XINT
CLKSRCCTL2.CANxBCLKSEL
PERx.SYSCLK
CAN Bit Clock
CLKSRCCTL2.MCANxBCLKSEL
CPUSYSCLK
AUXCLKIN / MCAN Bit Clock
PLLRAWCLK
AUXCLKDIVSEL.MCANCLKDIV
SYSPLL
÷
IMULT
fOSCCLK
fPLLRAWCLK = × IMULT (1)
REFDIV + 1 ODIV + 1
6.13.3.2.1.3 X1 Input Level Characteristics When Using an External Clock Source - Not a Crystal
over recommended operating conditions (unless otherwise noted)
PARAMETER MIN MAX UNIT
X1 VIL Valid low-level input voltage (Buffer) –0.3 0.3 * VDDIO V
X1 VIH Valid high-level input voltage (Buffer) 0.7 * VDDIO VDDIO + 0.3 V
(1) The PLL lock time here defines the typical time that takes for the PLL to lock once PLL is enabled (SYSPLLCTL1[PLLENA]=1).
Additional time to verify the PLL clock using Dual Clock Comparator (DCC) is not accounted here. TI recommends using the latest
example software from C2000Ware for initializing the PLLs. For the system PLL, see InitSysPll() or SysCtl_setClock().
(1) PLL output frequency when OSCCLK is dead (Loss of OSCCLK causes PLL to Limp).
(2) For more details regarding changing device frequency for thermal management, see Thermal Design Considerations for AEC-Q100
Grade 0 section.
Microcontroller Microcontroller
* Available as a
+3.3 V
GPIO when X1 is
used as a clock
VDD Out
3.3-V Oscillator
Gnd
GPIO19 GPIO18
VSS X1 X2
XTAL Oscillator
Buffer
Comp
1
XCLKOUT
Circuit
[XTAL On]
Rbias
XCLKOUT
Pierce Inverter
Internal Internal
GPIO
X1
X2
External External
Rd
Crystal
CL1 CL2
GND GND
In this mode of operation, the clock on X1 is passed through a buffer (Buffer) to the rest of the chip. See
the X1 Input Level Characteristics When Using an External Clock Source (Not a Crystal) table for the input
requirements of the buffer.
6.13.3.4.2.1.2 XTAL Output on XCLKOUT
The output of the electrical oscillator that is fed to the rest of the chip can be brought out on XCLKOUT for
observation by configuring the CLKSRCCTL3.XCLKOUTSEL and XCLKOUTDIVSEL.XCLKOUTDIV registers.
See the GPIO Muxed Pins table for a list of GPIOs that XCLKOUT comes out on.
6.13.3.4.2.2 Quartz Crystal
Electrically, a quartz crystal can be represented by an LCR (Inductor-Capacitor-Resistor) circuit. However, unlike
an LCR circuit, crystals have very high Q due to the low motional resistance and are also very underdamped.
Components of the crystal are shown in Figure 6-17 and explained below.
Quartz Crystal
Internal External
Cm
Rm C0 CL
Lm
The effect of CL on the crystal is frequency-pulling. If the effective load capacitance is lower than the target, the
crystal frequency will increase and vice versa. However, the effect of frequency-pulling is usually very minimal
and typically results in less than 10-ppm variation from the nominal frequency.
6.13.3.4.2.3 GPIO Modes of Operation
On this device, X1 and X2 can be used as GPIO19 and GPIO18, respectively, depending on the operating mode
of the XTAL. Refer to the External Oscillator (XTAL) section of the TMS320F280015x Real-Time Microcontrollers
Technical Reference Manual .
6.13.3.4.3 Functional Operation
2
ESR = Rm * 1 + C0
CL (2)
Note that ESR is not the same as motional resistance of the crystal, but can be approximated as such if the
effective load capacitance is much greater than the shunt capacitance.
6.13.3.4.3.2 Rneg – Negative Resistance
Negative resistance is the impedance presented by the electrical oscillator to the crystal. It is the amount of
energy the electrical oscillator must supply to the crystal to overcome the losses incurred during oscillation. Rneg
depicts a circuit that provides rather than consume energy and can also be viewed as the overall gain of the
circuit.
The generally accepted practice is to have Rneg > 3x ESR to 5x ESR to ensure the crystal starts up under
all conditions. Note that it takes slightly more energy to start up the crystal than it does to sustain oscillation;
therefore, if it can be ensured that the negative resistance requirement is met at start-up, then oscillation
sustenance will not be an issue.
Figure 6-18 and Figure 6-19 show the variation between negative resistance and the crystal components for this
device. As can be seen from the graphs, the crystal shunt capacitance (C0) and effective load capacitance (CL)
greatly influence the negative resistance of the electrical oscillator. Note that these are typical graphs; so, refer to
Table 6-8 for minimum and maximum values for design considerations.
6.13.3.4.3.3 Start-up Time
Start-up time is an important consideration when selecting the components of the crystal circuit. As mentioned
in the Rneg – Negative Resistance section, for reliable start-up across all conditions, it is recommended that the
Rneg > 3x ESR to 5x ESR of the crystal.
Crystal ESR and the dampening resistor (Rd) greatly affect the start-up time. The higher the two values, the
longer the crystal takes to start up. Longer start-up times are usually a sign that the crystal and components are
not a correct match.
Refer to Crystal Oscillator Specifications for the typical start-up times. Note that the numbers specified here are
typical numbers provided for guidance only. Actual start-up time depends heavily on the crystal in question and
the external components.
6.13.3.4.3.3.1 X1/X2 Precondition
On this device, the GPIO19/18 alternate functionality on X1/X2 can be used to speed up the start-up time of the
crystal if needed. This functionality is achieved by preconditioning the load capacitors CL1 and CL2 to a known
state before the XTAL is turned on. See the TMS320F280015x Real-Time Microcontrollers Technical Reference
Manual for details.
(1) Start-up time is dependent on the crystal and tank circuit components. TI recommends that the crystal vendor characterize the
application with the chosen crystal.
2000 9
1500
1000
500
0
2 4 6 8 10 12 14 16
Effective CL (pF)
Rneg (Ohms)
1000 9
800
600
400
200
0
2 4 6 8 10 12 14 16
Effective CL (pF)
(1) Start-up time is dependent on the crystal and tank circuit components. TI recommends that the crystal vendor characterize the
application with the chosen crystal.
(1) INTOSC frequency may shift due to the thermal and mechanical stress of solder reflow. A post-reflow bake can restore the unit to its
original data sheet performance.
VDDIO
ExtR Pin
10 nF 100 k
VSS
Place close to device and
avoid noise coupling
In ExtR mode, the oscillator frequency error is directly proportional to the accuracy of the ExtR resistor.
The quality of the VDDIO supply directly affects the ExtR INTOSC performance. VDDIO capacitance values and
circuit design must be decided with care to provide the cleanest supply possible to avoid jitter, noise, and other
performance issues.
Placing a resistor on the ExtR pin prevents the pin from being used as a GPIO or X1.
Table 6-10 provides an example calculation for determining the total error of INTOSC2 given the parameters of a
resistor.
Table 6-10. Sample Total Error Calculation
PARAMETER VALUE UNIT
INTOSC2 Ideal Frequency Variation 0.70 %
ExtR Resistor Tolerance RTOLERANCE %
ExtR Resistor Temperature Coefficient RTEMPCO ppm/°C
Operating Temperature TOPERATING_POINT °C
ExtR Data Sheet Ambient Temperature TAMBIENT °C
[(0.70/100) + (RTOLERANCE/100) + ((RTEMPCO/1E6) *
Total Frequency Error %
abs(TOPERATING_POINT-TAMBIENT))]*100
The F280015x devices have an improved 128-bit prefetch buffer that provides high flash code execution
efficiency across wait states. Figure 6-22 and Figure 6-23 illustrate typical efficiency across wait-state settings
compared to previous-generation devices with a 64-bit prefetch buffer. Wait-state execution efficiency with a
prefetch buffer will depend on how many branches are present in application software. Two examples of linear
code and if-then-else code are provided.
100% 100%
95%
90%
90%
80%
Efficiency (%)
60% 75%
30% 55%
0 1 2 3 4 5 0 1 2 3 4 5
Wait State D005 Wait State D006
Figure 6-22. Application Code With Heavy 32-Bit Figure 6-23. Application Code With 16-Bit If-Else
Floating-Point Math Instructions Instructions
Note
The Main Array flash programming must be aligned to 64-bit address boundaries and each 64-bit
word may only be programmed once per write/erase cycle.
(1) Program time is at the maximum device frequency. Program time includes overhead of the flash state machine but does not include
the time to transfer the following into RAM:
• Code that uses flash API to program the flash
• Flash API itself
• Flash data to be programmed
In other words, the time indicated in this table is applicable after all the required code/data is available in the device RAM, ready for
programming. The transfer time will significantly vary depending on the speed of the JTAG debug probe used.
Program time calculation is based on programming 144 bits at a time at the specified operating frequency. Program time includes
Program verify by the CPU. The program time does not degrade with write/erase (W/E) cycling, but the erase time does.
Erase time includes Erase verify by the CPU and does not involve any data transfer.
(2) Erase time includes Erase verify by the CPU.
(3) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
(4) The combined total of bank and sector write/erase cycles is limited to this number.
6.13.7 Emulation/JTAG
The JTAG (IEEE Standard 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture) port has
four dedicated pins: TMS, TDI, TDO, and TCK. The cJTAG (IEEE Standard 1149.7-2009 for Reduced-Pin and
Enhanced-Functionality Test Access Port and Boundary-Scan Architecture) port is a compact JTAG interface
requiring only two pins (TMS and TCK), which allows other device functionality to be muxed to the traditional
GPIO35 (TDI) and GPIO37 (TDO) pins.
Typically, no buffers are needed on the JTAG signals when the distance between the MCU target and the JTAG
header is smaller than 6 inches (15.24 cm), and no other devices are present on the JTAG chain. Otherwise,
each signal should be buffered. Additionally, for most JTAG debug probe operations at 10 MHz, no series
resistors are needed on the JTAG signals. However, if high emulation speeds are expected (35 MHz or so), 22-Ω
resistors should be placed in series on each JTAG signal.
The PD (Power Detect) pin of the JTAG debug probe header should be connected to the board's 3.3-V supply.
Header GND pins should be connected to board ground. TDIS (Cable Disconnect Sense) should also be
connected to board ground. The JTAG clock should be looped from the header TCK output pin back to the
RTCK input pin of the header (to sense clock continuity by the JTAG debug probe). This MCU does not support
the EMU0 and EMU1 signals that are present on 14-pin and 20-pin emulation headers. These signals should
always be pulled up at the emulation header through a pair of board pullup resistors ranging from 2.2 kΩ to
4.7 kΩ (depending on the drive strength of the debugger ports). Typically, a 2.2-kΩ value is used.
Header pin RESET is an open-drain output from the JTAG debug probe header that enables board components
to be reset through JTAG debug probe commands (available only through the 20-pin header). Figure 6-24 shows
how the 14-pin JTAG header connects to the MCU’s JTAG port signals. Figure 6-25 shows how to connect to
the 20-pin JTAG header. The 20-pin JTAG header pins EMU2, EMU3, and EMU4 are not used and should be
grounded.
For more information about hardware breakpoints and watchpoints, see Hardware Breakpoints and Watchpoints
in CCS for C2000 devices.
For more information about JTAG emulation, see the XDS Target Connection Guide.
Note
JTAG Test Data Input (TDI) is the default mux selection for the pin. The internal pullup is disabled by
default. If this pin is used as JTAG TDI, the internal pullup should be enabled or an external pullup
added on the board to avoid a floating input. In the cJTAG option, this pin can be used as GPIO.
JTAG Test Data Output (TDO) is the default mux selection for the pin. The internal pullup is disabled
by default. The TDO function will be in a tri-state condition when there is no JTAG activity, leaving this
pin floating. The internal pullup should be enabled or an external pullup added on the board to avoid a
floating GPIO input. In the cJTAG option, this pin can be used as GPIO.
2.2 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A)
3 4
TDI TDI TDIS GND
MCU 3.3 V 100 Ω
5 6
3.3 V PD KEY
10 kΩ
(A)
7 8
TDO TDO GND
9 10
RTCK GND
11 12
TCK TCK GND
4.7 kΩ 4.7 kΩ
3.3 V 13 EMU0 EMU1 14 3.3 V
A. TDI and TDO connections are not required for cJTAG option and these pins can be used as GPIOs instead.
3.3 V
2.2 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A)
3 TDI TDIS 4 GND
MCU TDI
3.3 V 100 Ω
3.3V 5 PD KEY 6
10 kΩ
(A)
7 TDO GND 8
TDO
9 RTCK GND 10
TCK
TDO
3 4
TDI/TMS
(1) Rise time and fall time vary with load. These values assume a 6-pF load.
GPIO
tr(GPO)
tf(GPO)
(1) "n" represents the number of qualification samples as defined by GPxQSELn register.
(2) For tw(GPI), pulse width is measured from VIL to VIL for an active low signal and VIH to VIH for an active high signal.
(A)
GPIO Signal GPxQSELn = 1,0 (6 samples)
1 1 0 0 0 0 0 0 0 1 0 0 0 1 1 1 1 1 1 1 1 1
SYSCLK
QUALPRD = 1
(SYSCLK/2)
(D)
Output From
Qualifier
A. This glitch will be ignored by the input qualifier. The QUALPRD bit field specifies the qualification sampling period. It can vary from 00 to
0xFF. If QUALPRD = 00, then the sampling period is 1 SYSCLK cycle. For any other value "n", the qualification sampling period in 2n
SYSCLK cycles (that is, at every 2n SYSCLK cycles, the GPIO pin will be sampled).
B. The qualification period selected through the GPxCTRL register applies to groups of eight GPIO pins.
C. The qualification block can take either three or six samples. The GPxQSELn Register selects which sample mode is used.
D. In the example shown, for the qualifier to detect the change, the input should be stable for 10 SYSCLK cycles or greater. In other words,
the inputs should be stable for (5 × QUALPRD × 2) SYSCLK cycles. This would ensure 5 sampling periods for detection to occur.
Because external signals are driven asynchronously, an 13-SYSCLK-wide pulse ensures reliable recognition.
SYSCLK
GPIOxn
tw(GPI)
6.13.9 Interrupts
The C28x CPU has fourteen peripheral interrupt lines. Two of them (INT13 and INT14) are connected directly
to CPU timers 1 and 2, respectively. The remaining twelve are connected to peripheral interrupt signals through
the enhanced Peripheral Interrupt Expansion (ePIE) module. The ePIE multiplexes up to sixteen peripheral
interrupts into each CPU interrupt line. It also expands the vector table to allow each interrupt to have its own
ISR. This allows the CPU to support a large number of peripherals.
An interrupt path is divided into three stages—the peripheral, the ePIE, and the CPU. Each stage has its
own enable and flag registers. This system allows the CPU to handle one interrupt while others are pending,
implement and prioritize nested interrupts in software, and disable interrupts during certain critical tasks.
Figure 6-31 shows the interrupt architecture for this device.
TINT0
TIMER0
TIMER1 INT13
tw(INT)
XINT1, XINT2, XINT3,
XINT4, XINT5
td(INT)
Address bus
Interrupt Vector
(internal)
(1) The Flash module is not powered down by hardware in any LPM. It may be powered down using software if required by the
application. For more information, see the Flash and OTP Memory section of the System Control chapter in the TMS320F280015x
Real-Time Microcontrollers Technical Reference Manual.
(2) The XTAL is not powered down by hardware in any LPM. It may be powered down by software setting the XTALCR.OSCOFF bit to 1.
This can be done at any time during the application if the XTAL is not required.
Delay time, external wake signal to Without input qualifier 40tc(SYSCLK) cycles
td(WAKE-IDLE) From Flash (active state)
program execution resume(1) With input qualifier 40tc(SYSCLK) + tw(WAKE) cycles
Delay time, external wake signal to Without input qualifier 25tc(SYSCLK) cycles
td(WAKE-IDLE) From RAM
program execution resume(1) With input qualifier 25tc(SYSCLK) + tw(WAKE) cycles
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
XCLKOUT
tw(WAKE)
(A)
WAKE
A. WAKE can be any enabled interrupt, WDINT or XRSn. After the IDLE instruction is executed, a delay of five OSCCLK cycles (minimum)
is needed before the wake-up signal could be asserted.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
Wake-up
Signal
tw(WAKE-INT)
td(WAKE-STBY)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
(1) For applications using X1/X2 for OSCCLK, the user must characterize their specific oscillator start-up time as it is dependent on
circuit/layout external to the device. See Crystal Oscillator (XTAL) section for more information. For applications using INTOSC1 or
INTOSC2 for OSCCLK, see the Internal Oscillators section for toscst. Oscillator start-up time does not apply to applications using a
single-ended crystal on the X1 pin, as it is powered externally to the device.
Device
HALT HALT
Status
GPIOn
td(WAKE-HALT)
tw(WAKE-GPIO)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
AGPIO
AIO
AIO
CMPSS1 Input MUX AIO
REFLO CMP3_HP CMPSS_LITE 3
CMP3_HN Digital CTRIP3H
A10/C10 HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0
A9/C8 HPMXSEL2/ /LPMXSEL2/ VDDA Filter CTRIPOUT3H
A4/C14 HPMXSEL0/ /LPMXSEL0/
DAC12
A12/C1 HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1
A8/C11 HPMXSEL4/ /LPMXSEL4/ DAC12 Digital CTRIP3L
AGPIO
AGPIO CMP3_LN
AGPIO Filter CTRIPOUT3L
AIO
AIO
CMP3_LP
CMPSS_LITE2 Input MUX AIO
CMP4_LP
C0 to C20 ADC-C
HPMXSEL0/ /LPMXSEL0/
HPMXSEL3/HNMXSEL0/LPMXSEL3/LNMXSEL0 12-bits
HPMXSEL2/ /LPMXSEL2/
HPMXSEL4/ /LPMXSEL4/ REFLO
A7/C3 HPMXSEL1/HNMXSEL1/LPMXSEL1/LNMXSEL1 AGPIO
AGPIO
AGPIO
CMPSS
AIO
AIO
CMPSS_LITE4 Input MUX AIO Inputs
A16/C16
(48/64/80-pin) A17/C17
(64/80-pin) A18/C18
(48/64/80-pin) A19/C19
(48/64/80-pin) A20/C20
AGPIO
AGPIO
AGPIO
CMPSSx/CMPSSx_LITE
Input MUX
CMPxHPMX
CMPx_HP0
0
CMPx_HP1
1
CMPx_HP2
2 CMPx_HP
CMPx_HP3
3
CMPx_HP4
4
CMPxHNMX
CMPx_HN0 0
To CMPSSx
CMPx_HN1 CMPx_HN
1
CMPxLNMX
CMPx_LN0 0
CMPx_LN1 CMPx_LN
1
CMPxLPMX
CMPx_LP0
0
CMPx_LP1
1
CMPx_LP2
2 CMPx_LP
CMPx_LP3
3
CMPx_LP4
4
Gx_ADCA Gx_ADCA
AIO or AGPIO
To ADCs
Gx_ADCC Gx_ADCC
AIO or AGPIO
(1) Signal is bonded together with another signal as a single pin on this package.
(2) Internal connection only; does not come to a device pin.
(3) The GPIOs on these analog pins support full digital input and output functionality and are referred to as AGPIOs. By default, the AGPIOs are unconnected; that is, the analog and digital
functions are both disabled. For configuration details, see the Digital Inputs and Outputs on ADC Pins (AGPIOs) section.
(4) On 32 RHB package, VREFHI is internally connected to VDDA and VREFLO is internally connected to VSSA.
Product Folder Links: TMS320F2800157-Q1 TMS320F2800157 TMS320F2800156-Q1 TMS320F2800155-Q1 TMS320F2800155 TMS320F2800154-Q1 TMS320F2800153-Q1
TMS320F2800152-Q1
TMS320F2800157-Q1, TMS320F2800157, TMS320F2800156-Q1, TMS320F2800155-Q1
TMS320F2800155, TMS320F2800154-Q1, TMS320F2800153-Q1, TMS320F2800152-Q1
www.ti.com SPRSP68B – JANUARY 2023 – REVISED NOVEMBER 2023
Note
Not every channel can be pinned out from all ADCs. See the Pin Configuration and Functions section
to determine which channels are available.
The block diagram for the ADC core and ADC wrapper are shown in Figure 6-38.
Analog-to-Digital Core Analog-to-Digital Wrapper Logic
Input Circuit
SOCx (0-15)
TRIGSEL
Triggers
CHSEL [15:0]
...
...
ADCIN4 4
SOCxSTART[15:0]
ADCIN5 5
EOCx[15:0]
ADCIN6 6 ADCCOUNTER TRIGGER[15:0]
xV
1
IN+
ADCIN7 7 u
ADCIN8 8 DOUT1
xV
2
IN-
ADCIN9 9
ADCIN10 10
ADCIN11 11 SOC Delay Trigger
ADCIN12 12 Timestamp Timestamp
S/H Circuit Converter
... ...
ADCIN19 19
RESULT
ADCIN20 20 + -
ADCPPBxOFFCAL
ADCRESULT
0–15 Regs
saturate
ADCPPBxOFFREF
+ -
ADCPPBxRESULT
NOTE: VREFHI internally tied to VDDA on 32-pin package
VREFHI ADCEVT
CONFIG Event
Logic ADCEVTINT
Bandgap
Reference Circuit
1.65-V Output 1
Post Processing Block (1-4)
(3.3-V Range)
0
or
2.5-V Output
(2.5-V Range) Interrupt Block (1-4)
ADCINT1-4
VREFLO
NOTE: VREFLO internally tied to VSSA
on 32-pin package
Analog System Control
ANAREFSEL
ANAREFx2PSSEL
(1) Writing these values differently to different ADC modules could cause the ADCs to operate
asynchronously. For guidance on when the ADCs are operating synchronously or asynchronously,
see the Ensuring Synchronous Operation section of the Analog-to-Digital Converter (ADC) chapter
in the TMS320F280015x Real-Time Microcontrollers Technical Reference Manual.
Pin Voltage
VREFHI
VREFHI
ADCINx ADCINx
VREFHI/2 ADC
VREFLO
VREFLO
(VSSA)
Digital Output
2n - 1
ADC Vin
Note
The ADC inputs should be kept below VDDA + 0.3 V. If an ADC input goes above this level, ADC
disturbances to other channels may occur by two mechanisms:
• ADC input overvoltage will overdrive the CMPSS mux, disturbing all other channels which share a
common CMPSS mux. This disturbance will be continuous regardless of if the overvoltage input is
sampled by the ADC
• When the ADC samples the overvoltage ADC input, VREFHI will be pulled up to a higher level.
This will disturb subsequent ADC conversions on any channel until the VREF stabilizes
Note
The VREFHI pin must be kept below VDDA + 0.3 V to ensure proper functional operation. If the
VREFHI pin exceeds this level, a blocking circuit may activate, and the internal value of VREFHI may
float to 0 V internally, giving improper ADC conversion.
(1) The sample window must also be at least as long as 1 ADCCLK cycle for correct ADC operation.
(2) In internal reference mode, the reference voltage is driven out of the VREFHI pin by the device. The user should not drive a voltage
into the pin in this mode.
(3) On 32QFN package, VREFHI is internally tied to VDDA and VREFLO is internally tied to VSSA. Internal reference mode is not
supported on 32QFN package.
(1) Load current on VREFHI increases when ADC input is greater than VDDA. This causes inaccurate conversions.
(2) A ceramic capacitor with package size of 0805 or smaller is preferred. Up to ±20% tolerance is acceptable.
(3) IO activity is minimized on pins adjacent to ADC input and VREFHI pins as part of best practices to reduce capacitive coupling and
crosstalk.
(4) Variation across all channels belonging to the same ADC module.
(5) Worst case variation compared to other ADC modules.
11.5
11.4
11.3
11.2
ENOB
11.1
11
10.9 EXT
INT_2.5
INT_3.0
10.8
A20/C20
A3/C5
A2/C9
A7/C3
A9/C8
A14/C4
A15/C7
A0/C15
A12/C1
A4/C14
A6
A1
A16/C16
A10/C10
A19/C19
A5/C2
A11/C0
A8/C11
ADC Channel
Figure 6-40. Per-Channel ENOB for 80-Pin PN Figure 6-41. Per-Channel ENOB for 48-Pin PHP
LQFP and 64-Pin PM LQFP HTQFP
11.55
11.54
11.53
11.52
11.51
ENOB
11.5
11.49
11.48
11.47
EXT_3.0_VDDA
11.46
A16/C16
A3/C5
A15/C7
A0/C15
A4/C14
A6
A1
A10/C10
A2/C9
A5/C2
A7/C3
A9/C8
A12/C1
A11/C0
A8/C11
ADC Channel
ADC
ADCINx
Rs
Switch Ron
AC Cp Ch
VREFLO
This input model should be used with actual signal source impedance to determine the acquisition window
duration. For more information, see the Choosing an Acquisition Window Duration section of the Analog-to-
Digital Converter (ADC) chapter in the TMS320F280015x Real-Time Microcontrollers Technical Reference
Manual. For recommendations on improving ADC input circuits, see the ADC Input Circuit Evaluation for C2000
MCUs Application Report.
Sample n
Input on SOC0.CHSEL
Input on SOC1.CHSEL
Sample n+1
SYSCLK
ADCCLK
ADCTRIG
ADCSOCFLG.SOC0
ADCSOCFLG.SOC1
ADCINTFLG.ADCINTx
tSH tLAT
tEOC
tINT
(1) By default, tINT occurs one SYSCLK cycle after the S+H window if INTPULSEPOS is 0. This can be changed by writing to the OFFSET
field in the ADCINTCYCLE register.
6.14.5.2 CMPx_DACL
Some CMPSS module instances have support for DAC output buffered to a pin. This CMPx_DACL output from
the CMPSS module uses the low-side DAC of the CMPSS module specified. When using DAC output from a
CMPSS instance, all other CMPSS module features for that instance are unavailable.
For CMPx_DACL instances available for a particular device, please see the DAC column of the Analog Pins and
Internal Connections table.
See the Buffered Output from CMPx_DACL Electrical Characteristics section for DAC output capabilities.
6.14.5.3 CMPSS Connectivity Diagram
CMP2_HP CMPSS_LITE 2
CMP2_HN Digital CTRIP2H
VDDA Filter CTRIPOUT2H
DAC12 CTRIP4H
DAC12 Digital CTRIP2L
CMP2_LN CTRIP4L
Filter CTRIPOUT2L
CMP2_LP
CTRIPOUT1H
CTRIPOUT1L
CTRIPOUT2H
CMP4_ HP CMPSS_LITE 4
CTRIPOUT2L
CMP4_ HN Digital CTRIP4H
VDDA Filter CTRIPOUT4H Output X- BAR GPIO Mux
DAC12
DAC12 Digital CTRIP4L
CMP4_LN
Filter CTRIPOUT4L
CMP4_ LP
CTRIPOUT4H
CTRIPOUT4L
To LPM Wakeup
COMPCTL[CTRIPHSEL]
COMPSTS[COMPHSTS]
ASYNCH
SYSCLK > COMPDACHCTL[SWLOADSEL] COMPCTL[COMPHINV] 0 CTRIPH
EPWMSYNCPER_H CMPx_HP SYSCLK SYNCH
1 To EPWM X-BAR
+ COMPSTS[COMPHSTS]
>
COMPSTS[COMPLSTS] D Q 0 2 CTRIPOUTH
2 1|0 DACHVALS 0 12-bit COMPH 0 0 Digital 3 To OUTPUT X-BAR
COMPDACHCTL2[XTRIGCFG] D Q 1 DACHVALA
DACH 0 D RQ Filter S
>
_ 1 1 R
>
TRIGSYNCH COMPCTL[CTRIPOUTHSEL]
EN CMPx_HN 1 . R Q
EXT_FILTIN_H . OR
Ramp Generator(H) 1 n
COMPCTL[COMPHSOURCE] 0 0
COMPSTS[COMPHLATCH]
COMPDACHCTL[RAMPSOURCE] CTRIPHFILCTL[FILTINSEL] 1
COMPDACHCTL[DACSOURCE] OR
COMPSTSCLR[HSYNCCLREN]
EPWM1SYNCPER COMPCTL[ASYNCHEN]
0
EPWM2SYNCPER EPWMSYNCPER_H 0 0 COMPSTSCLR[HLATCHCLR]
1
EPWM3SYNCPER
OR
2 EPWMBLANK_H 1
... … AND
EPWMnSYNCPER n-1 COMPDACHCTL[BLANKEN]
COMPSTSCLR[LSYNCCLREN]
COMPSTSCLR[LLATCHCLR]
EPWMSYNCPER_L
COMPDACLCTL[RAMPSOURCE] 0 0 COMPCTL[ASYNCLEN]
OR
COMPDACLCTL[BLANKEN]
AND OR
1 0 0
COMPDACHCTL[BLANKSOURCE] EPWMBLANK_L
COMPSTS[COMPLLATCH]
COMPDACHCTL[SWLOADSEL] 1
EPWM1BLANK CMPx_LP CTRIPLFILCTL[FILTINSEL]
0 SYSCLK > + OR
EPWM2BLANK
1 R Q
EPWM3BLANK D Q 0 COMPL 0
>
2 12-bit 0 Digital COMPCTL[CTRIPLSEL]
R
>
... … DACLVALS 0 0 D RQ S
1 DACL _ 1 Filter
EPWMnBLANK D Q 1 3 CTRIPL
n-1 CMPx_LN . COMPSTS[COMPLSTS]
1 2 To EPWM X-BAR
DACLVALA
>
EN EXT_FILTIN_L . SYNCL
COMPDACLCTL[BLANKSOURCE] n 1 CTRIPOUTL
SYSCLK ASYNCL
1 COMPCTL[COMPLSOURCE] 0 To OUTPUT X-BAR
Ramp Generator(L) 0 COMPCTL[COMPLINV] To LPM Wakeup
COMPCTL[CTRIPOUTLSEL]
COMPDACLCTL[DACSOURCE] CMPx_DACL
TRIGSYNCL
>>1 1 Buer To Pin
Note: Enabling the DACL to a pin
Enable
disables all other func onality:
COMPDACHCTL2[XTRIGCFG] 1 2|0 CMPxDACOUTEN DACH, both COMP, the Ramp
(from Analog Subsystem)
Generator, and the digital lters.
COMPSTS[COMPHSTS] COMPSTS[COMPLSTS]
EPWMSYNCPER_L
ASYNCH
SYSCLK > COMPDACHCTL[SWLOADSEL] COMPCTL[COMPHINV] 0 CTRIPH
CMPx_HP SYSCLK SYNCH
1 To EPWM X-BAR
+ COMPSTS[COMPHSTS]
>
D Q 0 2 CTRIPOUTH
12-bit COMPH 0 0 Digital 3 To OUTPUT X-BAR
DACHVALS D Q 1 DACHVALA 0 D RQ S
DACH(1) Filter
>
_ 1 1 R
>
COMPCTL[CTRIPOUTHSEL]
EN CMPx_HN 1 . R Q
EXT_FILTIN_H . OR
n
COMPCTL[COMPHSOURCE] 0 0
COMPSTS[COMPHLATCH]
COMPDACHCTL[RAMPSOURCE] CTRIPHFILCTL[FILTINSEL] 1 OR
COMPSTSCLR[HSYNCCLREN]
EPWM1SYNCPER COMPCTL[ASYNCHEN]
0
EPWM2SYNCPER EPWMSYNCPER_H 0 0 COMPSTSCLR[HLATCHCLR]
1
EPWM3SYNCPER
OR
2 EPWMBLANK_H 1
... … AND
EPWMnSYNCPER n-1 COMPDACHCTL[BLANKEN]
COMPSTSCLR[LSYNCCLREN]
EPWMSYNCPER_L
COMPSTSCLR[LLATCHCLR]
OR
COMPDACLCTL[BLANKEN] 0 0 COMPCTL[ASYNCLEN]
COMPDACLCTL[RAMPSOURCE] AND
EPWMBLANK_L 1 0 0 OR
COMPDACHCTL[BLANKSOURCE]
COMPSTS[COMPLLATCH]
COMPDACHCTL[SWLOADSEL] 1
EPWM1BLANK CMPx_LP CTRIPLFILCTL[FILTINSEL]
0 SYSCLK > + OR
EPWM2BLANK
1 R Q
EPWM3BLANK D Q 0 COMPL 0
>
EN EXT_FILTIN_L . SYNCL
n 1 CTRIPOUTL
COMPDACLCTL[BLANKSOURCE] SYSCLK ASYNCL
COMPCTL[COMPLSOURCE] 0 To OUTPUT X-BAR
COMPCTL[COMPLINV] To LPM Wakeup
COMPCTL[CTRIPOUTLSEL]
Each reference 12-bit DAC can be configured to drive a reference voltage into the negative input of the
respective comparator. Some CMPSS instances also allow the low DAC output to be routed to a pin to act as
an external DAC. In this case, all other CMPSS module functionality is not useable, including the high DAC, both
comparators, ramp generation, and the digital filters. The reference 12-bit DAC is illustrated in Figure 6-48.
VDDA DACREF
12-bit DACOUTH
DACHVALA DACH To COMPH
12-bit DACOUTL
DACLVALA DACL To COMPL
VSSA
Figure 6-48. Reference DAC Block Diagram
(1) The CMPSS DAC is used as the reference to determine how much hysteresis to apply. Therefore, hysteresis will scale with the
CMPSS DAC reference voltage. Hysteresis is available for all comparator input source configurations.
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Hysteresis
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Offset Error
Ideal Gain
Actual Gain
Linearity Error
Note
Above error terms are based on the max SYSCLK of the target device. If operating below the max
SYSCLK then the "m" error term should be scaled accordingly.
300
Max Error
200
150
100
50
0
0 200 400 600 800 1000 1200 1400 1600
RAMPxSTEPVALA
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) DAC can drive a minimum resistive load of 1 kΩ, but the output range will be limited.
(3) This is the linear output range of the DAC. The DAC can generate voltages outside this range, but the output voltage will not be linear
due to the buffer.
(4) For best PSRR performance, VREFHI should be less than VDDA.
(1) Typical values are measured with VREFHI = 3.3 V and VREFLO = 0 V, unless otherwise noted. Minimum and maximum values are
tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(2) Gain error is calculated for linear output range.
(3) VREFHI = 3.2 V, VDDA = 3.3 V DC + 100 mV Sine.
(4) 11-bit effective (monotonic response).
Time-Base (TB)
CTR=PRD
EPWMxSYNCI
TBCTL[PHSEN]
TBCTL[SWFSYNC]
Counter
DCAEVT1/sync(A)
Up/Down
(16 bit) DCBEVT1/sync(A)
CTR=ZERO
TBCTR
Active (16) CTR_Dir CTR=PRD EPWMx_INT
CTR=ZERO
TBPHSHR (8)
CTR=PRD or ZERO EPWMxSOCA
16 8
CTR=CMPA Event On-chip
Phase EPWMxSOCB
TBPHS Active (24) Trigger ADC
Control CTR=CMPB
And
CTR=CMPC
Interrupt
CTR=CMPD (ET) ADCSOCOUTSELECT
Counter Compare (CC)
CTR_Dir
Action
CTR=CMPA Qualifier DCAEVT1.soc(A) Select and pulse stretch
(AQ) DCBEVT1.soc(A) for external ADC
CMPAHR (8)
16 HiRes PWM (HRPWM)
CMPAHR (8)
CMPA Active (24) ADCSOCAO
ADCSOCBO
CMPA Shadow (24) EPWMA ePWMxA
A. These events are generated by the ePWM digital compare (DC) submodule based on the levels of the TRIPIN inputs.
GPIO0 Async/
Sync/ Input X-Bar
Sync+Filter
GPIOx
Other Sources 16:127
INPUT15
INPUT16
INPUT13
INPUT14
INPUT10
INPUT12
INPUT11
INPUT1
INPUT2
INPUT3
INPUT4
INPUT5
INPUT6
INPUT7
INPUT8
INPUT9
eCAPx
INPUT[1:16] 0:15
XINT1
XINT2
ADC
XINT3
Wrapper(s)
XINT4 PIE
ePWM XINT5
eCAP
EXTSYNCIN1
Sync Mux EXTSYNCIN2
TZ1 EPWMINT
TZ2 TZINT
TZ3
TRIP1
TRIP2 EPWMx.EPWMCLK
TRIP3 PCLKCR2[EPWMx]
TRIP6
TBCLKSYNC
INPUT[1:14] TRIP4 PCLKCR0[TBCLKSYNC]
CMPSSx.TRIPH
TRIP5
TRIP7
CMPSSx.TRIPHORL TRIP8
CMPSSx.TRIPL TRIP9 All
ADCx.EVT1-4 TRIP10
ePWM ePWM
ECAPx.OUT TRIP11 Modules
X-Bar
TRIP12 ADCSOCAO Select
ADCSOCBO Select
EXTSYNCOUT
ADCSOCxO
SOCA ADC
Reserved Wrapper(s)
TRIP13 SOCB
ECCERR TRIP14
PIEVECTERROR TRIP15
EQEPERR TZ4 EPWMSYNCPER
CLKFAIL TZ5 CMPSS
EMUSTOP TZ6 Blanking Window
TBCTL2[OSHTSYNC]
TBCTL3[OSSFRCEN]
GLDCTL2[OSHTLD]
SWFSYNC
:ULWH ³1´ WR
:ULWH ³1´ WR
CTR=ZERO
CTR=CMPB
CTR=CMPC
TBCTL2[OSHTSYNCMODE]
CTR=CMPD
CLR
DCAEVT1.sync One Shot
DCBEVT1.sync Latch
0
Set Q
EPWMSYNCOUTEN
1
SWEN
ZEROEN
0 0
CMPBEN
1 EPWMxSYNCOUT
CMPCEN OR 1
0
CMPDEN
DCARVT1EN
TBCTL2[SELFCLRTRREM]
DCBEVT1EN
Disable Clear
Register
EPWM1SYNCOUT 0
|
|
|
EPWMxSYNCOUT
EPWMxSYNCIN HRPCTL[PWMSYNCSELX]
ECAP1SYNCOUT CTR=CMPC UP
|
|
|
CTR=CMPC DOWN
ECAPySYNCOUT CTR=CMPD UP EPWMxSYNCPER
Other Sources CTR=CMPD DOWN CMPSS
DAC
HRPCTL[PWMSYNCSEL]
EPWMSYNCINSEL CTR=PRD
CTR=ZERO
Note: SYNCO and SYNCOUT are used interchangeably
EPWMCLK
tw(TZ)
(A)
TZ
td(TZ-PWM)
(B)
PWM
(1) The MEP step size will be largest at high temperature and minimum voltage on VDD. MEP step size will increase with higher
temperature and lower voltage and decrease with lower temperature and higher voltage.
Applications that use the HRPWM feature should use MEP Scale Factor Optimizer (SFO) estimation software functions. See the TI
software libraries for details of using SFO functions in end applications. SFO functions help to estimate the number of MEP steps per
SYSCLK period dynamically while the HRPWM is in operation.
SYNC
ECAPxSYNCIN
OVF CTR_OVF CTR [0−31]
ECAPxSYNCOUT TSCTR
PWM
(counter−32 bit) Output
Delta−Mode PRD [0−31] Compare
RST X-Bar
Logic
CMP [0−31]
32
CTR=PRD
CTR [0−31]
CTR=CMP
32
PRD [0−31]
HRCTRL[HRE] ECCTL1 [ CAPLDEN, CTRRSTx]
32
32 CAP1 LD1
Polarity
(APRD Active) LD
Select
APRD
32
shadow CMP [0−31]
HRCTRL[HRE] 32
32 HRCTRL[HRE]
32
CAP2 LD2 Polarity
(ACMP Active) LD Select Other
Event [127:16]
Sources
Prescale
Event
32 ACMP
qualifier 16
shadow ECCTL1[PRESCALE] Input
HRCTRL[HRE] [15:0]
X-Bar
32
Polarity
32 CAP3 LD3
LD Select
(APRD Shadow)
HRCTRL[HRE]
32
32 CAP4 LD4 Polarity
(ACMP Shadow) LD
Select
ECCTL2[CTRFILTRESET]
Interrupt Continuous /
Trigger Oneshot MODCNTRSTS
and CTR_OVF Capture Control
Flag
CTR=PRD
ECAPx Control
(to ePIE) CTR=CMP
ECCTL2 [ REARM, CONT_ONESHT, STOP_WRAP]
Registers: ECEINT, ECFLG, ECCLR, ECFRC
HRCLK HR Submodule
ECAPx_HRCAL HR Input
(to ePIE)
ECAPx
Disable 0x0
0x1 ECAPxSYNCIN
ECAPxSYNCIN EPWMxSYNCOUT
ECCTL2[SWSYNC] EXTSYNCOUT
Signals ECAPxSYNCOUT
CTR=PRD
(EPWM, ECAP, Disable
INPUTXBAR, «) Disable
0xn SYNCSELECT[SYNCOUT]
ECCTL2[SYNCOSEL]
ECAPSYNCINSEL[SEL]
Data bus
QCPRD
Enhanced QEP (eQEP) peripheral
QCAPCTL QCTMR
16 16
16
Quadrature
capture unit
QCTMRLAT (QCAP)
QCPRDLAT
(1) The GPIO GPxQSELn Asynchronous mode should not be used for eQEP module input pins.
Note
The CAN module uses the IP known as DCAN. This document uses the names CAN and DCAN
interchangeably to reference this peripheral.
Note
For a CAN bit clock of 100 MHz, the smallest bit rate possible is 3.90625Kbps.
Note
The accuracy of the on-chip oscillator is in the INTOSC Characteristics table. Depending on
parameters such as the CAN bit timing settings, bit rate, bus length, and propagation delay, the
accuracy of this oscillator may not meet the requirements of the CAN protocol. In this situation, an
external clock source must be used.
CAN_H
CAN Bus
CAN_L
CAN
CAN Core
Message RAM
Message Handler
Message
RAM
Interface
32 Register and Message
Message Object Access (IFx)
Objects Test Modes
(Mailboxes) Only
Module Interface
CANINT0 CANINT1
CPU Bus
(to ePIE)
Figure 6-63. CAN Block Diagram
Note
The availability of the CAN FD feature is dependent on the device's part number. Refer to the device
data sheet for more information.
Device
MCANSS
Correctable ECC
Configurable Interrupts (2 lines)
PIE
Counter Overflow and Clock Stop/
Wakeup
RESET Reset
I2C module
I2CXSR I2CDXR
TX FIFO
FIFO Interrupt
SDA
to CPU/PIE
RX FIFO
Peripheral bus
I2CRSR I2CDRR
Control/status
Clock registers CPU
SCL synchronizer
Prescaler
Note
To meet all of the I2C protocol timing specifications, the I2C module clock must be configured in the
range from 7 MHz to 12 MHz.
A pullup resistor must be chosen to meet the I2C standard timings. In most circumstances, 2.2 kΩ of
total bus resistance to VDDIO is sufficient. For evaluating pullup resistor values for a particular design,
see the I2C Bus Pullup Resistor Calculation Application Report.
(1) In order to minimize the rise time, TI recommends using a strong pullup on both the SDA and SCL bus lines on the order of 2.2-kΩ net
pullup resistance. It is also recommended that the value of the pullup resistance used on both SCL and SDA pins be matched.
(2) The C2000 I2C is a Fast-mode device. There is a limitation when using the I2C as a target transmitter with a standard mode host. For
more information, see the TMS320F280015x Real-Time MCUs Silicon Errata.
SDA
ACK Contd...
S6 T10 S7
T5 T7 S3
SCL S4 Contd...
9th
T6 T8 clock
S2
Repeated
START STOP
S5
SDA
ACK
T2
T9
T1
SCL
9th
clock
SYSCLK
Div PMBCTRL
ALERT
Bit clock
CTL Other registers
PMBus Module
Note
All registers in this module are 8-bit registers. When a register is accessed, the register data is in the
lower byte (bits 7–0), and the upper byte (bits 15–8) is read as zeros. Writing to the upper byte has no
effect.
TXSHF
SCITXD
Register
TXENA
SCICTL1.1
Frame
Format and Mode
Parity
Even/Odd TXEMPTY
0 1
SCICCR.6 8 SCICTL2.6
Enable
TX FIFO_0
TXINT
SCICCR.5 To CPU
TX FIFO_1 TX FIFO Interrupts TX Interrupt
88
Logic
TX FIFO_N
TXINTENA
TXRDY SCICTL2.0
8
TXWAKE 0 1 SCICTL2.7
SCICTL1.3
WUT 8
Transmit Data
Buffer Register
SCITXBUF.7-0 Auto Baud Detect Logic
Baud Rate
MSB/LSB
LSPCLK Registers
RXSHF
SCIRXD
Register
SCIHBAUD.15-8 RXWAKE
RXENA
0 1
8
SCIFFENA
SCIFFTX.14 RX FIFO_0 RXINT
8 RX FIFO_1 To CPU
RX FIFO Interrupts RX Interrupt
Logic
RX FIFO_N
RXFFOVF
8 SCIFFRX.15
0 1
RXBKINTENA
SCICTL2.1
RXRDY
SCIRXST.6
RXENA BRKDT
RXERRINTENA
SCICTL1.0
SCIRXST.5 SCICTL1.6
SCIRXST.5-2
Receive Data BRKDT FE OE PE
Buffer Register
RXERROR
SCIRXBUF.7-0
SCIRXST.7
PCLKCR8
Low-Speed
LSPCLK SYSCLK CPU
Prescaler
Bit Clock
SYSRS
Peripheral Bus
SPISIMO
SPISOMI
GPIO MUX SPI
SPIINT
SPICLK PIE
SPITXINT
SPISTE
Note
All timing parameters for SPI High-Speed Mode assume a load capacitance of 5 pF on SPICLK,
SPISIMO, and SPISOMI.
(1) The (BRR + 1) condition is Even when (SPIBRR + 1) is even or SPIBRR is 0 or 2. It is Odd when (SPIBRR + 1) is odd and SPIBRR is
greater than 3.
SPICLK
(clock polarity = 0)
SPICLK
(clock polarity = 1)
4
5
Master In Data
SPISOMI
Must Be Valid
23 24
(A)
SPISTE
A. On the trailing end of the word, SPISTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO
modes.
SPICLK
(clock polarity = 1)
4
5
A. On the trailing end of the word, SPISTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO
modes.
SPICLK
(clock polarity = 0)
13
14
SPICLK
(clock polarity = 1)
15
16
19
20
SPISIMO Data
SPISIMO
Must Be Valid
25 26
SPISTE
12
SPICLK
(clock polarity = 0)
13 14
SPICLK
(clock polarity = 1)
15
19 16
20
25 26
SPISTE
ADDRESS BUS
CHECKSUM
CALCULATOR INTERFACE
ID PARTY
CHECKER
BIT
MONITOR
TXRX ERROR
DETECTOR (TED)
TIME-OUT
CONTROL
COUNTER
LINRX/
SCIRX COMPARE
7 Detailed Description
7.1 Overview
The TMS320F280015x (F280015x) is a member of the cost-optimized C2000 real-time microcontroller family of
scalable, ultra-low latency devices designed for efficiency in power electronics.
These include such applications as:
• HVAC compressor module
• Headlight
• DC/DC converter
• Inverter & motor control
• On-board (OBC) & wireless charger
• Pump
• Industrial motor drives
• Motor control
• Digital power
• Sensing and signal processing
TMS320F280015x has dual 32-bit C28x CPUs in Lockstep, enabling the device to achieve ASIL B functional
safety device rating without much SW overhead. The real-time control subsystem is based on TI’s 32-bit C28x
DSP core, which provides 120 MHz of signal-processing performance for floating- or fixed-point code running
from either on-chip flash or SRAM. The C28x CPU is further boosted by the Trigonometric Math Unit (TMU) and
VCRC (Cyclical Redundancy Check) extended instruction sets, speeding up common algorithms key to real-time
control systems.
The F280015x supports up to 256KB (128KW) of flash memory. Up to 36KB (18KW) of on-chip SRAM is also
available to supplement the flash memory.
High-performance analog blocks are integrated on the F280015x real-time microcontroller (MCU) and are closely
coupled with the processing and PWM units to provide optimal real-time signal chain performance. Fourteen
PWM channels enable control of various power stages from a 3-phase inverter to power-factor correction and
other advanced multilevel power topologies.
Interfacing is supported through various industry-standard communication ports (such as PMBUS, SPI, SCI, LIN,
I2C, CAN and CAN FD) and offers multiple pin-muxing options for optimal signal placement.
Want to learn more about features that make C2000™ MCUs the right choice for your real-time control system?
Check out The Essential Guide for Developing With C2000™ Real-Time Microcontrollers and visit the C2000
real-time microcontrollers page.
The Getting Started With C2000™ Real-Time Control Microcontrollers (MCUs) Getting Started Guide covers all
aspects of development with C2000 devices from hardware to support resources. In addition to key reference
documents, each section provides relevant links and resources to further expand on the information covered.
Ready to get started? Check out the TMDSCNCD2800157 evaluation board and download C2000Ware.
LS0-LS1 RAM
16 KW (32 KB)
Crystal Oscillator
INTOSC1, INTOSC2
PLL
7.3 Memory
7.3.1 Memory Map
The Memory Map table describes the memory map. See the Memory Controller Module section of the System
Control chapter in the TMS320F280015x Real-Time Microcontrollers Technical Reference Manual.
Table 7-1. Memory Map
ACCESS
MEMORY SIZE START ADDRESS END ADDRESS ECC/ PARITY SECURITY
PROTECTION
M0 RAM 1K x 16 0x0000 0000 0x0000 03FF ECC Yes -
M1 RAM 1K x 16 0x0000 0400 0x0000 07FF ECC Yes -
PieVectTable 256 x 16 0x0000 0D00 0x0000 0DFF - - -
LS0 RAM 8K x 16 0x0000 8000 0x0000 9FFF Parity Yes Yes
LS1 RAM 8K x 16 0x0000 A000 0x0000 BFFF Parity Yes Yes
1 2
TI OTP 1.5K x 16 0x0007 1000 0x0007 15FF ECC - Yes
2
User OTP 1K x 16 0x0007 8000 0x0007 83FF ECC - Yes
Flash 128K x 16 0x0008 0000 0x0009 FFFF ECC - Yes
Secure ROM 7K x 16 0x003F 4000 0x003F 5BFF Parity - Yes
CPU STL ROM 9K x 16 0x003F 5C00 0x003F 7FFF Parity - -
Boot ROM 32K x 16 0x003F 8000 0x003F FFFF Parity - -
Pie Vector Fetch Error (part of Boot
1 x 16 0x003F FFBE 0x003F FFBF Parity - -
ROM)
Default Vectors (part of Boot ROM) 64 x 16 0x003F FFC0 0x003F FFFF Parity - -
F2800157-Q1, Sector 45 1K x 16 0x0008 B400 0x0008 B7FF 128 x 16 0x0108 1680 0x0108 16FF
F2800157, Sector 46 1K x 16 0x0008 B800 0x0008 BBFF 128 x 16 0x0108 1700 0x0108 177F
F2800156-Q1, Sector 47 1K x 16 0x0008 BC00 0x0008 BFFF 128 x 16 0x0108 1780 0x0108 17FF
F2800155-Q1, Sector 48 1K x 16 0x0008 C000 0x0008 C3FF 128 x 16 0x0108 1800 0x0108 187F
F2800155, Sector 49 1K x 16 0x0008 C400 0x0008 C7FF 128 x 16 0x0108 1880 0x0108 18FF
F2800154-Q1
Sector 50 1K x 16 0x0008 C800 0x0008 CBFF 128 x 16 0x0108 1900 0x0108 197F
Sector 51 1K x 16 0x0008 CC00 0x0008 CFFF 128 x 16 0x0108 1980 0x0108 19FF
Sector 52 1K x 16 0x0008 D000 0x0008 D3FF 128 x 16 0x0108 1A00 0x0108 1A7F
Sector 53 1K x 16 0x0008 D400 0x0008 D7FF 128 x 16 0x0108 1A80 0x0108 1AFF
Sector 54 1K x 16 0x0008 D800 0x0008 DBFF 128 x 16 0x0108 1B00 0x0108 1B7F
Sector 55 1K x 16 0x0008 DC00 0x0008 DFFF 128 x 16 0x0108 1B80 0x0108 1BFF
Sector 56 1K x 16 0x0008 E000 0x0008 E3FF 128 x 16 0x0108 1C00 0x0108 1C7F
Sector 57 1K x 16 0x0008 E400 0x0008 E7FF 128 x 16 0x0108 1C80 0x0108 1CFF
Sector 58 1K x 16 0x0008 E800 0x0008 EBFF 128 x 16 0x0108 1D00 0x0108 1D7F
Sector 59 1K x 16 0x0008 EC00 0x0008 EFFF 128 x 16 0x0108 1D80 0x0108 1DFF
Sector 60 1K x 16 0x0008 F000 0x0008 F3FF 128 x 16 0x0108 1E00 0x0108 1E7F
Sector 61 1K x 16 0x0008 F400 0x0008 F7FF 128 x 16 0x0108 1E80 0x0108 1EFF
Sector 62 1K x 16 0x0008 F800 0x0008 FBFF 128 x 16 0x0108 1F00 0x0108 1F7F
Sector 63 1K x 16 0x0008 FC00 0x0008 FFFF 128 x 16 0x0108 1F80 0x0108 1FFF
7.4 Identification
Table 7-4 lists the Device Identification Registers. Additional information on these device identification registers
can be found in the TMS320F280015x Real-Time Microcontrollers Technical Reference Manual.
Table 7-4. Device Identification Registers
NAME ADDRESS SIZE (x16) DESCRIPTION
Bits Options
14-13 1 = InstaSPIN-FOC
INSTASPIN 2 = NONE
3 = NONE
10-8 2 = 64 pin (QFP)
PIN_COUNT 3 = 80 pin (QFP)
4 = 48 pin (QFP)
PARTIDL 0x0005 D008 2
5 = 32 pin (QFN)
7 = 48 pin (QFN)
8 = 64 pin (QFP, with
VREGENZ)
7-6 0 = Engineering sample (TMX)
QUAL
1 = Pilot production (TMP)
2 = Fully qualified (TMS)
Device part identification number
TMS320F2800157 0x07FF 0500
TMS320F2800156 0x07FE 0500
PARTIDH 0x0005 D00A 2 TMS320F2800155 0x07FD 0500
TMS320F2800154 0x07FC 0500
TMS320F2800153 0x07FB 0500
TMS320F2800152 0x07FA 0500
Silicon revision number
Revision 0 0x0000 0001
REVID 0x0005 D00C 2
Revision A 0x0000 0002
Revision B 0x0000 0003
Unique identification number. This number is different on each
individual device with the same PARTIDH. This unique number
UID_UNIQUE0 0x0007 114A 2
can be used as a serial number in the application. This number
is present only on TMS devices.
Unique identification number. This number is different on each
individual device with the same PARTIDH. This unique number
UID_UNIQUE1 0x0007 114C 2
can be used as a serial number in the application. This number
is present only on TMS devices.
No changes have been made to existing instructions, pipeline or memory bus architecture. All TMU instructions
use the existing FPU register set (R0H to R7H) to carry out their operations.
For more information, see the TMS320C28x Extended Instruction Sets Technical Reference Manual.
7.5.3 VCRC Unit
Cyclic redundancy check (CRC) algorithms provide a straightforward method for verifying data integrity over
large data blocks, communication packets, or code sections. The C28x+VCRC can perform 8-bit, 16-bit, 24-bit,
and 32-bit CRCs. For example, the VCRC can compute the CRC for a block length of 10 bytes in 10 cycles. A
CRC result register contains the current CRC, which is updated whenever a CRC instruction is executed.
The following are the CRC polynomials used by the CRC calculation logic of the VCRC:
• CRC8 polynomial = 0x07
• CRC16 polynomial 1 = 0x8005
• CRC16 polynomial 2 = 0x1021
• CRC24 polynomial = 0x5d6dcb
• CRC32 polynomial 1 = 0x04c11db7
• CRC32 polynomial 2 = 0x1edc6f41
This module can calculate CRCs for a byte of data in a single cycle. The CRC calculation for CRC8, CRC16,
CRC24, and CRC32 is done byte-wise (instead of computing on a complete 16-bit or 32-bit data read by the
C28x core) to match the byte-wise computation requirement mandated by various standards.
The VCRC Unit also allows the user to provide the size (1b-32b) and value of any polynomial to fit custom CRC
requirements. The CRC execution time increases to three cycles when using a custom polynomial.
For more information on the Cyclic Redundancy Check (VCRC) instruction sets, see the TMS320C28x Extended
Instruction Sets Technical Reference Manual.
7.5.4 Lockstep Compare Module (LCM)
Hardware module integrity during run-time is a critical functional safety requirement. Hardware Redundancy
implemented by the lockstep CPU architecture (two CPUs executing the same function and the output of
the CPUs are continuously compared) is a proven method for achieving high diagnostic coverage for both
permanent and transient faults. The Lockstep Comparator Module (LCM) is implemented to compare output from
the C28x CPU to detect permanent and transient faults.
The LCM implements the following features:
• Pipelined architecture
• Redundant comparison
• Self-test capability
– Match and mismatch test
– Error forcing capability
• Temporal redundancy: The operation of the two modules is skewed by two cycles to address the issue of
common cause failures like failure of clock, power, and so on. This makes sure of temporal redundancy.
• Spatial redundancy: Each module is physically separate and their outputs are compared. The physical
separation provides spatial redundancy.
• Non-delayed functional output path to provide non-delayed CPU execution for the system (while still having
temporal redundancy).
• Register protection of critical memory mapped registers of the module, using a parity scheme.
Figure 7-2 shows the LCM block diagram.
LCM_CONTROL.CMPEN
Lockstep Delay Lockstep Delay
SYSCLK
Compare Error
Comparator
Secondary/
Redundant Module
OR
Clock Enable
Comparator
(Redundant)
LSEN.Enable
Note
The Module described in this block diagram can be either a CPU (for example, CPU1) or a peripheral
(for example, DMA) depending on availability for the device.
(1) SCI boot mode can be used as a wait boot mode as long as SCI continues to wait for an 'A' or 'a' during the SCI autobaud lock
process.
Table 7-7 lists the possible boot modes supported on the device. The default boot mode pins are GPIO24 (boot
mode pin 1) and GPIO32 (boot mode pin 0). Users may choose to have weak pullups for boot mode pins if they
use a peripheral on these pins as well, so the pullups can be overdriven. On this device, customers can change
the factory default boot mode pins by programming user-configurable Dual Code Security Module (DCSM) OTP
locations.
Table 7-7. All Available Boot Modes
BOOT MODE NUMBER BOOT MODE
0 Parallel
1 SCI / Wait
2 CAN
3 Flash
4 Wait
5 RAM
6 SPI
7 I2C
8 CAN FD
10 Secure Flash
Note
All the peripheral boot modes supported use the first instance of the peripheral module (SCIA, SPIA,
I2CA, CANA, and so forth). Whenever these boot modes are referred to in this section, such as SCI
boot, it is actually referring to the first module instance, meaning SCI boot on the SCIA port. The same
applies to the other peripheral boots.
Note
The CAN boot mode turns on the XTAL. Be sure an XTAL is installed in the application before using
CAN boot mode.
Note
When using Z2-OTP-BOOTPIN-CONFIG, the configurations programmed in this location will take
priority over the configurations in Z1-OTP-BOOTPIN-CONFIG. It is recommended to use Z1-OTP-
BOOTPIN-CONFIG first and then if OTP configurations need to be altered, switch to using Z2-OTP-
BOOTPIN-CONFIG.
Note
GPIO 224 to 253 are analog pins, but digital inputs are possible on these pins provided the software
writes to the GPIOHAMSEL register bits.
The following GPIOs cannot be used as a BMSP. If selected for a particular BMSP, the boot ROM will
automatically select the factory default GPIOs for BMSP0 and BMSP1. Factory default for BMSP2 is
0xFF, which disables the BMSP.
• GPIO 36, 38, 39, 47, 50-223, 225, 229, 230-241, 243 (Not available on any package)
Note
When decoding the boot mode, BMSP0 is the least-significant-bit and BMSP2 is the most-significant-
bit of the boot table index value. It is recommended when disabling BMSPs to start with disabling
BMSP2. For example, in an instance when only using BMSP2 (BMSP1 and BMSP0 are disabled),
then only the boot table indexes of 0 and 4 will be selectable. In the instance when using only BMSP0,
then the selectable boot table indexes are 0 and 1.
Note
The locations Z2-OTP-BOOTDEF-LOW and Z2-OTP-BOOTDEF-HIGH will be used instead of Z1-
OTP-BOOTDEF-LOW and Z1-OTP-BOOTDEF-HIGH locations when Z2-OTP-BOOTPIN-CONFIG is
configured. Refer to Section 7.6.1.1 for more details on BOOTPIN_CONFIG usage.
Note
F280013x and F280015x CANTXA GPIO Option 0 (default) selections are different. All other CAN
boot option GPIO selections are the same. Please refer to respective device data sheet for details.
7.7 Security
Security features are enforced by the Dual Code Security Module (DCSM). The primary layer of defense is
securing the boundary of the chip, which should always be enabled. Additionally, the Dual Zone Security feature
is available to support code partitioning.
7.7.1 Securing the Boundary of the Chip
The following two features, along with authentication in the firmware update code, should be used to help to
prevent unauthorized code from running on the device.
7.7.1.1 JTAGLOCK
Enabling the JTAGLOCK feature in the USER OTP disables JTAG access (for example, debug probe) to
resources on the device.
7.7.1.2 Zero-pin Boot
Enabling the Zero-pin Boot option along with Flash Boot in the USER OTP blocks all pin-based external
bootloader options (for example, SCI, CAN, Parallel).
7.7.2 Dual-Zone Security
The dual-zone security mechanism offers protection for two zones: Zone 1 (Z1) and Zone 2 (Z2). The security
implementation for both zones is identical. Each zone has its own dedicated secure resource (OTP memory and
secure ROM) and allocated secure resource (LSx RAM and flash sectors).
7.7.3 Disclaimer
THE CODE SECURITY MODULE (CSM) INCLUDED ON THIS DEVICE WAS DESIGNED
TO PASSWORD PROTECT THE DATA STORED IN THE ASSOCIATED MEMORY AND IS
WARRANTED BY TEXAS INSTRUMENTS (TI), IN ACCORDANCE WITH ITS STANDARD TERMS
AND CONDITIONS, TO CONFORM TO TI'S PUBLISHED SPECIFICATIONS FOR THE WARRANTY
PERIOD APPLICABLE FOR THIS DEVICE.
TI DOES NOT, HOWEVER, WARRANT OR REPRESENT THAT THE CSM CANNOT BE
COMPROMISED OR BREACHED OR THAT THE DATA STORED IN THE ASSOCIATED MEMORY
CANNOT BE ACCESSED THROUGH OTHER MEANS. MOREOVER, EXCEPT AS SET FORTH
ABOVE, TI MAKES NO WARRANTIES OR REPRESENTATIONS CONCERNING THE CSM OR
OPERATION OF THIS DEVICE, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY
OR FITNESS FOR A PARTICULAR PURPOSE.
IN NO EVENT SHALL TI BE LIABLE FOR ANY CONSEQUENTIAL, SPECIAL, INDIRECT,
INCIDENTAL, OR PUNITIVE DAMAGES, HOWEVER CAUSED, ARISING IN ANY WAY OUT OF
YOUR USE OF THE CSM OR THIS DEVICE, WHETHER OR NOT TI HAS BEEN ADVISED OF THE
POSSIBILITY OF SUCH DAMAGES. EXCLUDED DAMAGES INCLUDE, BUT ARE NOT LIMITED
TO LOSS OF DATA, LOSS OF GOODWILL, LOSS OF USE OR INTERRUPTION OF BUSINESS OR
OTHER ECONOMIC LOSS.
7.8 Watchdog
The watchdog module is the same as the one on previous TMS320C2000™ microcontrollers, but with an
optional lower limit on the time between software resets of the counter. This windowed countdown is disabled by
default, so the watchdog is fully backward-compatible.
The watchdog generates either a reset or an interrupt. It is clocked from the internal oscillator with a selectable
frequency divider.
Figure 7-3 shows the various functional blocks within the watchdog module.
WDCR.WDPRECLKDIV WDCR.WDPS WDCR.WDDIS
WDCNTR
WDCLK
(INTOSC1) Overflow 1-count
delay
8-bit
WDCLK Watchdog Watchdog
Divider Prescaler Counter
SYSRSn
Clear
Count
WDWCR.MIN
WDKEY (7:0)
Out of Window Watchdog
Watchdog Good Key
Window
Key Detector Detector
WDCR(WDCHK(2:0))
55 + AA
Bad Key
WDRSTn Generate
1 0 1 512-WDCLK Watchdog Time-out
WDINTn Output Pulse
SCSR.WDENINT
The Hardware Design Guide for F2800x C2000™ Real-Time MCU Series Application Note is an essential guide
for hardware developers using C2000 devices, and helps to streamline the design process while mitigating the
potential for faulty designs. Key topics discussed include: power requirements; general-purpose input/output
(GPIO) connections; analog inputs and ADC; clocking generation and requirements; and JTAG debugging
among many others.
8.2 Key Device Features
Table 8-1. Key Device Features
MODULE FEATURE SYSTEM BENEFIT
PROCESSING
TI's 32-bit lockstep dual-C28x core enables the device to achieve ASIL
B functional safety device rating without much software overhead.
SENSING
ADC provides precise and concurrent sampling of all three-phase
currents and DC bus with zero jitter.
Analog-to-Digital Up to 2 ADC modules ADC post-processing – On-chip hardware reduces ADC ISR complexity
Converter (ADC) 4 MSPS and shortens current loop cycles.
(12-bit) Up to 21 channels More ADCs help in multiphase applications. Provide better effective
MSPS (oversampling) and typical ENOB for better control-loop
performance.
4 channels with high-resolution capability Beneficial for accurate control and enables better-performance high-
High-Resolution (150 ps) frequency power conversion.
Pulse Width
Provides 150-ps steps for duty cycle, period,
Modulation Achieves cleaner waveforms and avoids oscillations/limit cycle at
(HRPWM) Dead band, and phase offsets for 99%
output.
greater precision
CONNECTIVITY
Serial Peripheral
1 high-speed SPI port Supports 30 MHz
Interface (SPI)
Serial
Communication 3 SCI (UART) modules Interfaces with controllers
Interface (SCI)
Local Interconnect Provides a low-cost solution where the bandwidth and fault tolerance of
1 LIN a Controller Area Network (CAN) are not required
Network (LIN)
Controller Area
Network (CAN/ 1 DCAN module Provides compatibility with classic CAN modules
DCAN)
Inter-Integrated
2 I2C modules Interfaces with external EEPROMs, sensors, or controllers
Circuit (I2C)
• Enabling precise control and fast shutdown in an overcurrent scenario by high bandwidth and fast response
current sensing.
• Safely and efficiently controlling and protecting the power switch [insulated-gate bipolar transistor/silicon
carbide (IGBT/SiC)].
8.3.1.1.1 System Block Diagram
VBUS VOUT
1A 2A 3A 4A
+ +
1B 2B 3B 4B
IRES
IOUT
1A
PWM1
1B CPU
32 bit
2A C28x
DSP core
PWM2 Lock-Step
120 MHz
2B
3V3
3A
PWM3
3B 3V3
LDO
4A
PWM4
4B VREG
Voltage
1V2 Supervisor
VOUT Window WDT
ADC Comms
IRES
SPI
IOUT
GPIO UART
Vref CAN FD Host
VBUS
VACL
95~275 1A 2A 3A
VAC F
I
L +
T
E IPFC
R
VACN 1B 2B 3B
1A
CPU PWM1
32 bit 1B
C28x
Aux. DSP core 2A
Lock-Step PWM2
DC/DC 120 MHz
LV 2B
3V3
Battery 3A
PWM3
3V3 3B
LDO
VREG
Voltage VACL
Supervisor 1V2 VACN
Window WDT
Comms ADC VBUS
SPI IPFC
LIN GPIO
CAN FD and
CAN FD Vref
LIN
Transceiver
Synchronous rectification is implemented via the same microcontroller with Rogowski coil current sensors. High
density is achieved through the use of high-speed GaN switches (LMG3522). The PFC is operating at 120 kHz
and the CLLLC runs with a variable frequency from 200 kHz to 800 kHz. A peak system efficiency of 96.5% was
achieved with an open-frame power density of 3.8 kW/L. While the design calculations were done for a 6.6-kW
output power, the design represents a suitable starting point for a 7.x-kW (for example, 7.2-kW to 7.4-kW) rated
OBC operating from a 240-V input with a 32-A breaker.
TIDUEG2C TIDM-02002 Bidirectional CLLLC resonant dual active bridge (DAB) reference design for HEV/EV
onboard charger
The CLLLC resonant DAB with bidirectional power flow capability and soft switching characteristics is an
ideal candidate for Hybrid Electric Vehicle/Electric Vehicle (HEV/EV) on-board chargers and energy storage
applications. This design illustrates control of this power topology using a C2000™ MCU in closed voltage and
closed current-loop mode. The hardware and software available with this design help accelerate your time to
market.
TIDUEG3A TIDM-1022 Valley switching boost power factor correction (PFC) reference design
This reference design illustrates a digital control method to significantly improve Boost Power Factor Correction
(PFC) converter performance such as the efficiency and Total Harmonic Distortion (THD) under light load
condition where efficiency and THD standards are difficult to meet. This is achieved using the integrated digital
control feature of the C2000™ microcontroller (MCU). The design supports phase-shedding, valley-switching,
valley-skipping, and Zero Voltage Switching (ZVS) for different load and instantaneous input voltage conditions.
The software available with this reference design accelerates time to market.
8.3.1.2 Automotive Pump
Fluid or fuel control pumps are typically used in automotive engine management systems based on the type of
powertrain required. Depending on the type of system and load, these actuators are in open loop or closed loop,
complete with precise control.
All vehicles—internal combustion engine, electric, or hybrid (ICE/EV/HEV)—need various types of pumps (such
as fuel pumps; coolant or water pumps; and oil pumps). Although the purpose of each pump is different, the
function of the pump is the same: to move fluid, fuel, or oil from one place to another. In the example of a fuel
pump, the pump transfers fuel from the fuel tank to the engine chamber for the engine to use. Depending on the
function, pumps can be variable-speed pumps or fixed-speed pumps.
The vehicle’s battery provides the current required to run the fuel pump. An electronic control unit (ECU)
regulates the output pressure and volume of the gasoline, as well as meters the incoming fuel from the tank. The
ECU assists the car in conserving fuel, resulting in improved economy and power.
–
1A 2A 3A
Va +
Motor Vb
–
Vc +
–
1B 2B 3B
Ia Ib Ic
1A
CPU PWM1
32 bit 1B
C28x
DSP core 2A
Lock-Step PWM2
120 MHz
2B
LV 3V3
Battery 3A
PWM3
3V3 3B
PSU
VREG
Voltage Ia
Supervisor 1V2 Ib
Window WDT Ic
Comms ADC
Va
SPI Vb
LIN GPIO
CAN FD and Vc
CAN FD Vref
LIN Vdc
Transceiver
cabin heater for Battery-powered Electric Vehicles (BEVs) and Hybrid Electric Vehicles (HEVs). As part of the
heating, ventilation and air-conditioning (HVAC) system: a PTC cabin heater increases the temperature of the air
stream coming from the blower.
In HEV/EVs, the sizing or the absence of a combustion engine requires the introduction of two additional
components that play a key role in the HVAC system:
• A brushless DC (BLDC) motor is a type of DC motor that rotates the AC compressor, instead of the engine.
• A positive temperature coefficient (PTC) heater or alternatively, a heat pump, heats the coolant, rather than
the engine.
Automotive interior heater module designs require:
• Minimized number of isolated components.
• Reduced electromagnetic interference (EMI) to optimize system performance.
8.3.1.3.1 System Block Diagram
Vdc
HV Battery
+
–
Temp
Sensor PTC PTC PTC PTC +
Load Load Load Load
–
Temp Vc
+
1A 1B 7A 7B
–
I_1A I_1B I_7A I_7B
1A
CPU PWM1
32 bit 1B
C28x
Aux. DSP core 2A
Lock-Step PWM2
DC/DC 120 MHz
2B
LV
3V3
Battery 3A
3V3 3B
LDO
7A
PWM7
VREG 7B
Voltage I_1, … 7A
Supervisor 1V2
I_1, … 7B
Window WDT
Comms ADC Temp
SPI
GPIO LIN
CAN FD and
CAN FD Vref Vdc
LIN
Transceiver
–
1A 2A 3A
Va +
Motor Vb
–
Vc +
–
1B 2B 3B
Ia Ib Ic
1A
CPU PWM1
32 bit 1B
C28x
DSP core 2A
Aux. Lock-Step PWM2
120 MHz
LV DC/DC 2B
3V3
Battery 3A
PWM3
3V3 3B
LDO
VREG
Voltage Ia
Supervisor 1V2 Ib
Window WDT Ic
Comms ADC
Va
SPI Vb
LIN GPIO
CAN FD and Vc
CAN FD Vref
LIN Vdc
Transceiver
Reliable real-time control in automotive HVAC compressor applications for HEVs and EVs
In this article, we focus on the design challenges of HVAC compressor subsystems within HEV and EV heating
and cooling systems and discuss how real-time control can address those challenges.
8.3.1.5 Single-Phase Line-Interactive Uninterruptable Power Supply (UPS)
A line-interactive UPS maintains the DC/AC inverter in line and charges a battery under normal condition when
AC power is available. When AC power is lost, the UPS generates AC power from the battery.
For this type of UPS, an AC power inverter is always connected to the output of the UPS. When the input AC
power is normal, the inverter of the UPS is in reverse operation (AC/DC mode) and provides battery charging.
Once the input power fails, the transfer switch opens and the power flows from the battery to the UPS output.
This is indicated in the diagram below. The transfer switches S1 and S2 connect to the "Line_ON" position when
AC power is available. When there is a power failure, S1 and S2 take the "Line_OFF" position.
Line-interactive UPS systems are a cheaper option than the online double-conversion technology and will protect
a critical load from power failures, power sags, power surges, undervoltage and overvoltage. However, this type
of UPS does not protect against electrical line noise, frequency variation, switching transient, and harmonic
distortion.
8.3.1.5.1 System Block Diagram
V+
V+
Q1 Vbat Q3
C1
1A 2A
Ibat
Is Line_OFF Io
Lo Line_OFF
Lb
Vo
S2
S1
Line_ON
Cb C2 Line_ON
Q2 Q4
1B 2B Co RL
V-
V-
Neutral
PWM1 1A
Aux. 1B
DC/DC C28x
3V3 2A
PWM2
DC bus 2B
3V3
Is
V+
V-
ADC Vbat
Comms Ibat
Vo
SPI Io
CAN &
LIN GPIO
LIN
CAN
Transceiver
1A 2A 3A
DC bus
1A 4A 5A 6A
CPU PWM-1
1B
32 bit FPU Va2 ACIM or
2A
PWM-2 Vb2 PMSM
2B
Ia1 Vc2
Ib1 3A 4B 5B 6B Drum/Pump
Ic1 PWM-3
Va1 3B
Vb1 ADCA Ia2 Ib2 Ic2 3 phase voltage sensing
Vc1 4A are only necessary for
VDC PWM-4
4B FAST algorithm
Tmtr1
Tinv1
5A
PWM-5
Ia2 5B
Ib2 LDO or
Ic2 Aux. DC/DC
Va2
6A +3.3 V DC/DC
ADCC PWM-6
Vb2
6B
Vc2
Tmtr2 +15 V DC bus
Tinv2 FO1
XBAR
FO2
I2C EEPROM
+3.3 V OSC & PLL
Figure 8-7. Typical Washer and Dryer with Dual-Motor Control Using Three-Shunt Current Sensing
VDC
DC bus
1A 2A 3A
Filter Va1
165~265 & PM1
Vb1
VAC Rectifier
Bridge Vc1
1B 2B 3B Drum
Idclink1 DC bus
F280013x
1A 4A 5A 6A
CPU PWM-1
1B
32 bit FPU Va2
2A PM2
PWM-2 Vb2
2B
Idclink1 Vc2
3A 4B 5B 6B Drum/Pump
Va1 PWM-3
Vb1 3B
Vc1 ADCA
VDC 3 phase voltage sensing
4A are only necessary for
Tmtr1 PWM-4
Tinv1 FAST algorithm
4B
5A Idclink2
PWM-5
5B
LDO or
Idclink2 Aux. DC/DC
Va2 6A +3.3 V DC/DC
ADCC PWM-6
Vb2
Vc2 6B
Tmtr2 +15 V DC bus
Tinv2 FO1
XBAR
FO2
CMPSS1
Relay for Power
GPIO Relay for Valves
CMPSS2
I2C EEPROM(option)
Figure 8-8. Typical Washer and Dryer with Dual-Motor Control Using Single-Shunt Current Sensing
VDC
DC bus
1A 2A 3A
Filter Va1
165~265 & PM1
Vb1
VAC Rectifier
Bridge Vc1
1B 2B 3B Drum
Idclink1
F280013x
1A LDO or
Aux. DC/DC
CPU PWM-1 +3.3 V DC/DC
1B
32 bit FPU 2A
PWM-2 +15 V DC bus
2B
Idclink1 3A
Va1 PWM-3
Vb1 ADCA 3B
Vc1
XBAR FO1
VDC
Tmtr1 ADCC Relay for Power
Tinv1 GPIO
Relay for Valves
Figure 8-9. Typical Washer and Dryer with One-Motor Control Using Single-Shunt Current Sensing
Dc bus
VBUS VOUT
Si GaN GaN
VACL
1A 2A 3A 4A 5A
95~275
VAC
F
I +
L
T IPFC
E
R
Si GaN GaN
VACN
1B 2B 3B 4B 5B 6A 6B
IRES
IOUT
4A
1A Aux.
PWM1 PWM1
Aux. 1B 4B Isolated
DC/DC C28x DC/DC
3V3 2A 5A C28x 3V3 DC bus
DC bus PWM2 PWM2
2B
PWM3 3A 5B PWM3
3B
3V3 6A 3V3
PWM4 PWM4
6B
Host
Dc bus
VBUS VOUT
Si GaN GaN
2A 3A 4A 5A
95~275
VAC
F
I +
L
T
E
R
Si GaN GaN
2B 3B 4B 5B 6A 6B
IRES
IOUT
VOUT
VACL
VACN
C28x AMC1311
ADC VBUS
IPFC
IRES
Aux. IOUT
DC/DC
3V3
DC bus
1A
3V3 PWM1
1B
2A
PWM2
2B
PWM3 3A
I/On 3B
4A
PWM4
Comms 4B
I2C 5A
PWM5
PMB us 5B 6A
SPI
UART PWM6
CAN 6B
Host
TIDA-010203 4-kW single-phase totem pole PFC reference design with C2000 and GaN
This reference design is a 4-kW CCM totem-pole PFC with a F280049/F280025 control card and an LMG342x
EVM board. This design demonstrates a robust PFC solution, which avoids isolated current sense by putting
the controller's ground in the middle of a MOSFET leg. Benefitting from non-isolation, AC current sense can be
implemented by high-speed amplifier OPA607, helping to realize reliable overcurrent protection. In this design,
efficiency, thermal image, AC drop, lighting surge, and EMI CE are fully validated. With completed test data, this
reference design shows the maturity of totem-pole PFC with C2000 and GaN, and is a good study platform for
high-efficiency products' PFC stage design.
High efficiency PFC stage using GaN and C2000™ Real-time control MCUs (Video)
GaN power FETs and C2000™ MCUs enable a totem-pole Power Factor Correction (PFC) topology, eliminating
bridge rectifier power losses.
TIDM-02000 Peak current-mode controlled phase-shifted full-bridge reference design using C2000™ real-time
MCU
This design implements a digitally peak current mode-controlled (PCMC) phase-shifted full bridge (PSFB) DC-
DC converter that converts a 400-V DC input to a regulated 12-V DC output. Novel PCMC waveform generation
based on the type-4 PWM and internal slope compensation; and simple PCMC implementation are the highlights
of this design. A TMS320F280049C MCU from the C2000 real-time microcontroller family is used.
TIDA-010062 1-kW, 80 Plus titanium, GaN CCM totem pole bridgeless PFC and half-bridge LLC reference
design
This reference design is a digitally controlled, compact 1-kW AC/DC power supply design for server power
supply unit (PSU) and telecom rectifier applications. The highly efficient design supports two main power
stages, including a front-end continuous conduction mode (CCM) totem-pole bridgeless power factor correction
(PFC) stage. The PFC stage features an LMG341x GaN FET with integrated driver to provide enhanced
efficiency across a wide load range and meet 80-plus titanium requirements. The design also supports a
half-bridge LLC isolated DC/DC stage to achieve a +12-V DC output at 1-kW. Two control cards use C2000™
Entry-Performance MCUs to control both power stages.
TIDM-1001 Two Phase Interleaved LLC Resonant Converter Reference Design Using C2000™ MCUs
Resonant converters are popular DC-DC converters frequently used in server, telecom, automotive, industrial,
and other power supply applications. Their high performance (efficiency, power density, etc.), improving
requirements of the various industry standards, and the ever-increasing power density goals have made these
converters a good choice for medium- to high-power applications.
This design implements a digitally controlled 500-W two-phase interleaved LLC resonant converter. The system
is controlled by a single C2000™ microcontroller (MCU), TMS320F280025C, which also generates PWM
waveforms for all power electronic switching devices under all operating modes. This design implements a
novel current-sharing technique to accurately achieve current-balancing between phases.
For more information, see Merchant network & server PSU.
Hardware Design Guide for F2800x C2000™ Real-Time MCU Series
This is an essential guide for hardware developers using C2000 devices and helps streamline the
design process while mitigating the potential for faulty designs. Key topics discussed include: power
requirements; general-purpose input/output (GPIO) connections; analog inputs and ADC; clocking generation
and requirements; and JTAG debugging, among many others.
TMDX Development-support product that has not yet completed Texas Instruments internal qualification testing.
TMDS Fully-qualified development-support product.
TMX and TMP devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type
(for example, PN) and temperature range (for example, Q).
For orderable part numbers of TMS320F280015x devices in the PN, PM, PHP, and RHB package types, see the
Package Option Addendum of this document, ti.com, or contact your TI sales representative.
For additional description of the device nomenclature markings on the die, see the TMS320F280015x Real-Time
MCUs Silicon Errata.
PREFIX(A)
TMX (X) = experimental device AUTOMOTIVE AEC-Q100 QUALIFICATION
TMS (blank) = qualified device (blank) = Not AEC-Q100 qualified
Q1 = AEC-Q100 Grade 1 or Grade 0 qualification
DEVICE FAMILY
320 = TMS320 MCU Family SHIPPING OPTIONS
(blank) = Tray
R = Tape and Reel
TECHNOLOGY
F = Flash
PACKAGE TYPE
PN = 80-pin Low-Profile Quad Flatpack (LQFP)
DEVICE PM = 64-pin LQFP
PHP = 48-pin PowerPAD™ Thermally Enhanced Thin Quad Flatpack (HTQFP)
2800157 2800156
RHB = 32-pin Very Thin Quad Flatpack No-Lead (VQFN)
2800155 2800154
2800153 2800152
TEMPERATURE RANGE
S = –40°C to 125°C (TA)
Q = –40°C to 125°C (TA)
E = –40°C to 150°C (TA)
9.3 Markings
Figure 9-2, Figure 9-3, Figure 9-4, Figure 9-5, Figure 9-6, Figure 9-7, Figure 9-8, and Figure 9-9 show the
package symbolization. Table 9-1 lists the silicon revision codes.
Pin 1
Figure 9-2. Package Symbolization for PN Package
Pin 1
Figure 9-3. Package Symbolization for PN Package (AEC-Q100 Grade 1 Qualification)
Pin 1
Figure 9-4. Package Symbolization for PM Package
Pin 1
Figure 9-5. Package Symbolization for PM Package (AEC-Q100 Grade 1 Qualification)
Pin 1
Figure 9-6. Package Symbolization for PHP Package
Pin 1
Figure 9-7. Package Symbolization for PHP Package (AEC-Q100 Grade 1 Qualification)
Pin 1
Figure 9-8. Package Symbolization for PHP Package (AEC-Q100 Grade 0 Qualification)
Pin 1
Figure 9-9. Package Symbolization for RHB Package (AEC-Q100 Grade 1 Qualification)
Application Reports
The SMT & packaging application notes website lists documentation on TI’s surface mount technology (SMT)
and application notes on a variety of packaging-related topics.
Semiconductor Packing Methodology describes the packing methodologies employed to prepare semiconductor
devices for shipment to end users.
Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime
of TI embedded processors (EPs) under power when used in electronic systems. It is aimed at general
engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement.
An Introduction to IBIS (I/O Buffer Information Specification) Modeling discusses various aspects of IBIS
including its history, advantages, compatibility, model generation flow, data requirements in modeling the input/
output structures, and future trends.
Serial Flash Programming of C2000™ Microcontrollers discusses using a flash kernel and ROM loaders for
serial programming a device.
The Essential Guide for Developing With C2000™ Real-Time Microcontrollers provides a deeper look into the
components that differentiate the C2000 Microcontroller Unit (MCU) as it pertains to Real-Time Control Systems.
9.6 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.7 Trademarks
PowerPAD™, C2000™, TMS320C2000™, FAST™, Code Composer Studio™, and TI E2E™ are trademarks of
Texas Instruments.
Bosch® is a registered trademark of Robert Bosch GmbH Corporation.
Windows® is a registered trademark of Microsoft Corporation.
Linux® is a registered trademark of Linus Torvalds.
macOS® is a registered trademark of Apple Inc.
All trademarks are the property of their respective owners.
9.8 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.9 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
Changes from July 4, 2023 to November 20, 2023 (from Revision A (July 2023) to Revision B
(November 2023)) Page
• Global: Information on the TMS320F2800156-Q1 (Grade 1), TMS320F2800155-Q1, TMS320F2800155,
TMS320F2800154-Q1, TMS320F2800153-Q1, and TMS320F2800152-Q1 devices is now Production Data.. 1
• Global: Information on the TMS320F2800157-Q1 (Grade 0) and TMS320F2800156-Q1 (Grade 0) devices is
preview information only (not Production Data)..................................................................................................1
• Features section: Changed Security features under "On-chip memory" feature................................................1
• Features section: Updated "Functional Safety-Compliant" features. Updated "Safety-related certification"
features. Added link to Functional Safety Certificate..........................................................................................1
• Package Information table: Removed "Preview information (not Production Data)" footnote............................ 2
• Device Comparison table: Changed "Code security for on-chip flash and RAM" to "Security: JTAGLOCK,
Zero-pin boot, Dual-zone security"..................................................................................................................... 7
• Device Comparison table: Changed footnote about preview information...........................................................7
• Digital Inputs and Outputs on ADC Pins (AGPIOs) section: Updated section..................................................41
• Current Consumption Graphs section added................................................................................................... 55
• Operating Mode Power Example table footnote updated to clarify TA 150°C values as estimated maximum
allowable values............................................................................................................................................... 60
• External Supervisor Usage section: Updated section...................................................................................... 63
• Supply Slew Rate section: Updated section.....................................................................................................68
• Recommended Operating Conditions Applicability to the PMM section: Added section..................................68
• Testing section: Updated section......................................................................................................................84
• RAM Parameters table: Updated table.............................................................................................................92
• ROM Parameters table: Updated table............................................................................................................ 92
• ADC Electrical Data and Timing section: Updated "The ADC inputs should be kept below VDDA + 0.3 V
…" note........................................................................................................................................................... 115
• Block Diagram section: Added "Each reference 12-bit DAC can be configured to drive a reference voltage
into the negative input of the respective comparator" paragraph. Added "Reference DAC Block Diagram"
figure...............................................................................................................................................................125
• I2C Electrical Data and Timing section: Updated "A pullup resistor must be chosen to meet the I2C standard
timings ..." paragraph in Note......................................................................................................................... 150
• I2C Timing Requirements table: Added footnotes..........................................................................................150
• Lockstep Compare Module (LCM) section: Updated section......................................................................... 178
• Security section: Changed Dual Code Security Module section to Security section...................................... 188
• Functional Safety section: Added section.......................................................................................................192
• Automotive Pump Resources section: Updated list of Reference Designs and Associated Training Videos.200
• Automotive HVAC Compressor Resources section: Updated list of Reference Designs and Associated
Training Videos............................................................................................................................................... 203
www.ti.com 6-Apr-2024
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
F2800152QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
152QPHPQ
F2800152QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
52QRHBQ
F2800153QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
153QPHPQ
F2800153QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
53QRHBQ
F2800154QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
154QPHPQ
F2800154QPMRQ1 ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00154QPMQ Samples
F28
F2800154QPNRQ1 ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00154QPNQ Samples
F28
F2800154QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
54QRHBQ
F2800155QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
155QPHPQ
F2800155QPMRQ1 ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00155QPMQ Samples
F28
F2800155QPNRQ1 ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00155QPNQ Samples
F28
F2800155QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
55QRHBQ
F2800155SPHPR ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
155SPHP
F2800155SPMR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00155SPM Samples
F28
F2800155SPNR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00155SPN Samples
F28
F2800156EPHPQ1 ACTIVE HTQFP PHP 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 150 F2800 Samples
156EPHPQ
F2800156EPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 150 F2800 Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 6-Apr-2024
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
156EPHPQ
F2800156QPHPQ1 ACTIVE HTQFP PHP 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
156QPHPQ
F2800156QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
156QPHPQ
F2800156QPMQ1 ACTIVE LQFP PM 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00156QPMQ Samples
F28
F2800156QPMRQ1 ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00156QPMQ Samples
F28
F2800156QPNQ1 ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00156QPNQ Samples
F28
F2800156QPNRQ1 ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00156QPNQ Samples
F28
F2800156QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
56QRHBQ
F2800157EPHPQ1 ACTIVE HTQFP PHP 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 150 F2800 Samples
157EPHPQ
F2800157EPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 150 F2800 Samples
157EPHPQ
F2800157QPHPQ1 ACTIVE HTQFP PHP 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
157QPHPQ
F2800157QPHPRQ1 ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
157QPHPQ
F2800157QPMQ1 ACTIVE LQFP PM 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157QPMQ Samples
F28
F2800157QPMRQ1 ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157QPMQ Samples
F28
F2800157QPNQ1 ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157QPNQ Samples
F28
F2800157QPNRQ1 ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157QPNQ Samples
F28
F2800157QRHBRQ1 ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 F28001 Samples
57QRHBQ
F2800157SPHP ACTIVE HTQFP PHP 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
157SPHP
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com 6-Apr-2024
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
F2800157SPHPR ACTIVE HTQFP PHP 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F2800 Samples
157SPHP
F2800157SPM ACTIVE LQFP PM 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157SPM Samples
F28
F2800157SPMR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157SPM Samples
F28
F2800157SPN ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157SPN Samples
F28
F2800157SPNR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 00157SPN Samples
F28
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Addendum-Page 3
PACKAGE OPTION ADDENDUM
www.ti.com 6-Apr-2024
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 4
PACKAGE MATERIALS INFORMATION
www.ti.com 28-Sep-2024
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 28-Sep-2024
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 28-Sep-2024
Width (mm)
H
W
Pack Materials-Page 3
PACKAGE MATERIALS INFORMATION
www.ti.com 28-Sep-2024
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
F2800156QPNRQ1 LQFP PN 80 1000 367.0 367.0 55.0
F2800156QRHBRQ1 VQFN RHB 32 3000 367.0 367.0 35.0
F2800157EPHPRQ1 HTQFP PHP 48 1000 336.6 336.6 31.8
F2800157QPHPRQ1 HTQFP PHP 48 1000 336.6 336.6 31.8
F2800157QPMRQ1 LQFP PM 64 1000 336.6 336.6 41.3
F2800157QPNRQ1 LQFP PN 80 1000 367.0 367.0 55.0
F2800157QRHBRQ1 VQFN RHB 32 3000 367.0 367.0 35.0
F2800157SPHPR HTQFP PHP 48 1000 336.6 336.6 31.8
F2800157SPMR LQFP PM 64 1000 336.6 336.6 41.3
F2800157SPNR LQFP PN 80 1000 367.0 367.0 55.0
Pack Materials-Page 4
PACKAGE MATERIALS INFORMATION
www.ti.com 28-Sep-2024
TRAY
W-
Outer
tray
width
Text
Pack Materials-Page 5
GENERIC PACKAGE VIEW
PHP 48 TQFP - 1.2 mm max height
7 x 7, 0.5 mm pitch QUAD FLATPACK
This image is a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4226443/A
www.ti.com
PACKAGE OUTLINE
PHP0048E SCALE 1.900
PowerPAD
TM
HTQFP - 1.2 mm max height
7.2
B
6.8
NOTE 3
48 37
PIN 1 ID
1 36
7.2 9.2
TYP
6.8 8.8
NOTE 3
12
25
13 24
A
0.27
44X 0.5 48X
0.17
0.08 C A B
4X 5.5
1.2 MAX
SEATING PLANE
12 25
0.25
GAGE PLANE (1)
3.62
49
3.15
0.75 0.15
0 -7 0.45 0.05
1 36 DETAIL A
A 16
TYPICAL
48 3.62 37
4X (0.25) NOTE 5
3.15 4226616 /A 02/2021
PowerPAD is a trademark of Texas Instruments.
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. Reference JEDEC registration MS-026.
5. Feature may not be present.
www.ti.com
EXAMPLE BOARD LAYOUT
PHP0048E PowerPAD
TM
HTQFP - 1.2 mm max height
( 6.5)
NOTE 10
(3.62)
SYMM
48 37 SOLDER MASK
DEFINED PAD
48X (1.6)
1
36
48X (0.3)
(3.62)
SYMM 49
(1.1 TYP)
12 25
(R0.05) TYP
( 0.2) TYP
VIA
13 24 METAL COVERED
SEE DETAILS (1.1 TYP) BY SOLDER MASK
(8.5)
EXPOSED METAL
METAL UNDER
SOLDER MASK SOLDER MASK
OPENING
www.ti.com
EXAMPLE STENCIL DESIGN
PHP0048E PowerPAD
TM
HTQFP - 1.2 mm max height
(3.62)
BASED ON
0.125 THICK STENCIL
48X (1.6)
1
36
48X (0.3)
(8.5)
(3.62)
SYMM 49 BASED ON
0.125 THICK
STENCIL
44X (0.5)
12 25
(R0.05) TYP
METAL COVERED
BY SOLDER MASK
13 24
(8.5)
4226616 /A 02/2021
NOTES: (continued)
11. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
12. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
PN0080A SCALE 1.250
LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
12.2
PIN 1 ID B
11.8
80 61
A
1 60
12.2 14.2
TYP
11.8 13.8
20
41
21 40
1.6 MAX
C
(0.13) TYP
SEATING PLANE
0.08
SEE DETAIL A
0.25 (1.4)
GAGE PLANE
TYPICAL
4215166/A 08/2022
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PN0080A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.5)
1
60
80X (0.3)
(R0.05) TYP
20 41
21 40
(13.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
4215166/A 08/2022
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PN0080A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.5)
1
60
80X (0.3)
(13.4)
(R0.05) TYP
20 41
21 40
(13.4)
4215166/A 08/2022
NOTES: (continued)
7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
8. Board assembly site may have different recommendations for stencil design.
www.ti.com
GENERIC PACKAGE VIEW
RHB 32 VQFN - 1 mm max height
5 x 5, 0.5 mm pitch PLASTIC QUAD FLATPACK - NO LEAD
Images above are just a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4224745/A
www.ti.com
PACKAGE OUTLINE
RHB0032U SCALE 3.000
VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
5.1 B
A
4.9
5.1
4.9
0.1 MIN
(0.13)
SECTION A-A
TYPICAL
A-A 30.000
1.0 C
0.8
SEATING PLANE
0.05 3.7 0.1
0.00 0.08 C
2X 3.5
(0.2) TYP
9 16 EXPOSED
THERMAL PAD
28X 0.5
8
17 (0.16) TYP
2X
33
A A SYMM
3.5
0.3
32X
0.2
24 0.1 C A B
1
0.05 C
PIN 1 ID 32 25
(45 X 0.3) SYMM
(0.25) 0.5
32X
TYP 0.3
4225709/C 01/2021
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RHB0032U VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
( 3.7)
SYMM
32 25
32X (0.6)
1 24
32X (0.25)
(0.97)
28X (0.5)
(0.63)
33 TYP SYMM
(4.8)
( 0.2) TYP
VIA
8 17
(R0.05)
TYP
9 16
(0.63) TYP (0.97)
(4.8)
SOLDER MASK
METAL EDGE OPENING
EXPOSED METAL
SOLDER MASK EXPOSED
METAL METAL UNDER
OPENING SOLDER MASK
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
RHB0032U VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
9X ( 1.06)
(R0.05) TYP (1.26)
32 25
32X (0.6)
1 24
32X (0.25)
(1.26)
28X (0.5)
SYMM
33
(4.8)
METAL
TYP
8 17
(R0.05) TYP
9 16
SYMM
(4.8)
4225709/C 01/2021
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
PACKAGE OUTLINE
PM0064A SCALE 1.400
LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
10.2
B
9.8
NOTE 3
64 49
PIN 1 ID
1 48
10.2 12.2
TYP
9.8 11.8
NOTE 3
16 33
17 32
A
0.27
60X 0.5 64X
0.17
4X 7.5 0.08 C A B
C
(0.13) TYP
SEATING PLANE
0.08
SEE DETAIL A
TYPICAL
4215162/A 03/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
60X (0.5) (11.4)
(R0.05) TYP
16 33
17 32
(11.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
4215162/A 03/2017
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
(R0.05) TYP
16 33
17 32
(11.4)
4215162/A 03/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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