User Manual

English

HV Impulse Analysis Option

Perception
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Document version 4.0 - August 2012

For Perception 6.06 or later

For HBM's Terms and Conditions visit www.hbm.com/terms

HBM GmbH
Im Tiefen See 45
64293 Darmstadt
Germany
Tel: +49 6151 80 30
Fax: +49 6151 8039100
Email: [email protected]
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Copyright © 2012

All rights reserved. No part of the contents of this document may be reproduced or transmitted in any form or by
any means without the written permission of the publisher.

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LICENSE AGREEMENT AND WARRANTY

For information about LICENSE AGREEMENT AND WARRANTY refer to
www.hbm.com/terms.

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Table of Contents page

1 Getting Started 7
1.1 Introduction 7
1.1.1 The software 7
1.2 How to install the HV-IA option 8
1.3 Sheet overview 9
2 Functions – Control and Usage 15
2.1 Overview 15
2.2 Choose a test type 16
2.3 Open a collection 17
2.4 Start an acquisition 20
2.5 The Collection Manager 23
3 The HV Impulse analysis menu 25
3.1 Analysis Menu 25
4 Commands – How to 34
4.1 Introduction 34
4.1.1 Functions in the HV-IA sheet 34
5 Measurements with an extra (second) channel 37
5.1 Introduction 37
A HV Impulse Analysis Data sources 40
A.1 Introduction 40
A.2 Lightning impulse parameters IEC 60060-1 Ed. 2.0 (1989-11) 46
A.3 Lightning impulse parameters IEC 60060-1 Ed. 3.0 (2010-09) 50
A.4 Switching impulse parameters IEC 60060-1 Ed. 2.0 (1989-11) 53
A.5 Switching impulse parameters IEC 60060-1 Ed. 3.0 (2010-09) 56
A.6 Current impulse parameters IEC 62475 Ed. 1.0 (2010-09) 58
A.7 Example: Markers using calculation results 61
B HV Impulse Test Set-up 64
B.1 Introduction 64
B.1.1 Technical Problem 64
B.1.2 Challenge 64
B.1.3 Impulse Generation and Test Object Set-up 64
B.2 Measurement Equipment Set-up 65
B.3 Traditional Test Set-up and Earth Connections 66
B.4 New Test Set-up (a) and Earth Connections 68
B.5 New Test Set-up (b) and Earth Connections 70

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C Calculate Uncertainty 72
C.1 Introduction 72
D HV-IA Preferences 75
D.1 Introduction 75
D.2 Preferences dialog 76
D.3 Output formats 77
D.4 Recording location 78
D.4.1 Miscellaneous 79
D.5 Calculations 85

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1 Getting Started
1.1 Introduction
The High Voltage Impulse Analysis (HV-IA) option calculates and analyzes a
variety of parameters that are relevant in high-voltage impulse testing. The HV-
IA option is typically used as a stand-alone application for repetitive tests. This
option is focused on the results of tests and is tailored for ease of use.
The HV-IA option is a successor for the legacy HV-IA software that ran on
the Nicolet Accura and Sigma DSO's with ProView software.

1.1.1 The software

l Measures the parameters of impulse waveforms in accordance with IEEE
and IEC specifications.
l Automatic comparison of measured parameters against user entered
tolerances.
l Provides reduced and full voltage waveforms for superimposed visual
comparison.

You can do the following:

l Make and evaluate a “test”

l Create a series of tests as a collection
l Maintain/modify the collection of tests
l Set/modify the acquisition parameters
l Set/modify the attenuator and tolerances
l Save the results
l Create a report

Note Measurements and calculations comply with current and new standards,
including the K-factor filter for the revision of IEC60060-1 and -2.

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1.2 How to install the HV-IA option

The Perception software requires a HASP key. HASP (Hardware Against
Software Piracy) is a hardware-based (hardware key) software copy protection
system that prevents unauthorized use of software applications.
Each HASP key contains a unique ID number used for personalization of the
application according to the features and options purchased. The key is also
used for storing licensing parameters, applications and customer-specific data.
If you have purchased the HV-IA option as a separate item, you will receive a
personalized "key file". Use this file to unlock the additional features.

You can find the serial number of your key in Help About Perception

To update the key information:

1 Choose Help Update Key...

2 In the Open dialog locate the Key File (*.pKey) and click Open.
3 If everything is OK you will see the following message:

Figure 1.1: Software copy protection dialog

4 Click OK.
After the installation you can go to Help About Perception More... to see
all installed options.

You will need to restart the program before the changes take effect. The HV
Impulse Analysis option is now available.

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1.3 Sheet overview

Figure 1.2: HV Impulse Analysis sheet

A Task pane
B Results area
C Collection pane
D Display area

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A The Task pane contains the following groups:

A1 Evaluation group
A2 Control group
A3 Digitizer setup group
A4 Toolbox group

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B Results area
The analysis settings and the results of a test will show in the results area,
enabling tolerance testing in the Analysis settings window will highlight
these results as shown below.

Figure 1.3: Lightning impulse test results (A)

Figure 1.4: Lightning impulse test results (B)

Figure 1.5: Lightning impulse test results (C)

If tolerance testing is enabled in the Analysis settings then the results which
do not fall within the specifications of the testing parameters will show up
highlighted in yellow, see Figure 1.5, whereas a good test result will be
highlighted in green, see Figure 1.4. When tolerance testing is not enabled
the results are not highlighted.

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C Collection pane
This section explains the available controls and data show in the collection
pane.

Figure 1.6: Collection pane

C1 Collection name This contains the name of the collection and the
button New...

C2 Collection grid This area shows the current tests of a collection and
their status.

C3 Collection test data This area shows, if available, the information

related to the current test.

When a new collection is started the collection pane will appear as in Figure
1.7 "Start new collection area" on page 13.

To start a new collection click:

or select New Impulse Analysis Collection from the menu.

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Figure 1.7: Start new collection area

C4 Tests

C5 Terminals

Complete test
A Test has been done with no warnings.
B This test is on display.

Test error
A Test has been done with a warning.
B This test is on display.
C The next test will be done in the next cell.

Collection control
You can navigate in a collection by using keyboard arrows to move to
different cells. Double clicking or pressing enter will select a cell as active
or you can right click and click Select. If the black arrow , is not
pointing to start a test in the correct cell, right click and click Start next test
here.
If a cell is selected for a test and it is occupied, a warning dialog will come
up and informs you that it is not possible to start a new test because the
test storage location is not empty. Before you can continue you have to
empty the location, see Figure 1.8.

Figure 1.8: Start Request dialog

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D Display area
The main graphical area of the screen.

Figure 1.9: Display area

This area displays current waveforms and the controls and position axis to
navigate current data. Cursors can be found in their default position in the
top left of the area. Data sources can also be dragged into this area for
viewing. The display setup menu is accessed via a right click in this area.

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2 Functions – Control and Usage

2.1 Overview
For control and analysis of a high voltage test setup the HV-IA option is
provided. This chapter will guide you through the various steps, required to
obtain a general understanding of the concepts used in the HV Impulse Analysis
sheet.

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2.2 Choose a test type

Before performing any analysis, choose an evaluation method, either
Lightning Impulse or Switching Impulse:

Figure 2.1: Evaluation contol

A Lightning Impulse
B Switching Impulse
C Current Impulse

This is done before making a new collection as a collection can only use one
method of evaluation.

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2.3 Open a collection

Before you are allowed to start an acquisition you must open a collection. In the
collection pane click New… or select New Impulse Analysis Collection from
the menu.

Figure 2.2: New collection

Note A saved collection or a default collection contain with it configurations and

settings which apply to the entire user interface. Loading a collection will
therefore also load the corresponding HV-IA sheet settings and layout.

A dialog will then open with 3 Options as shown in Figure 2.2.

A Set up a new collection using the current configuration

This will only open a new collection with the same configuration and setup
as is currently running.
B Set up a new collection using an existing configuration
Locate your own settings and test setup that you want to use with the new
collection.
C Set up a new collection using a default configuration
This is a fast way to setup your test environment to a preferred default when
opening a new collection.

Note If you are using the HV-IA sheet for the first time it is recommended to use option
C to get started.

After selecting your collection type you will be presented with a collection setup
dialog. In this dialog you will design your collection layout and properties.

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Figure 2.3: New Impulse Analysis Collection

Number of terminals
Choose from a number of 1 to 20 terminals using the up and down arrows. In
the terminal window, terminals will fill up with results in numerical order until all
tests are complete and then the next terminal will start to fill up.

Tests per terminal

A range of 1 to 200 tests can be associated with each terminal (all terminals
have the same number of tests).

Collection name
Each collection should have a unique name. This name is also used for the
name of the file which contains all the measured and calculated data including
the system configuration.

Comment
Use this entry field to add additional comments and remarks to the collection.
This comment can be used for reporting.

After you Click OK the collection will be ready for tests and the main screen
collection pane will look like Figure 2.4.

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Figure 2.4: Collection pane

Notice that the right arrow in the upper left cell of the collection grid indicates
that the next test will be saved here.

The system is now ready for aquiring the first test.

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2.4 Start an acquisition

Click Start in Control to activate the system.

Figure 2.5: Control Acquisition

Note The control pane will display “waiting for trigger” and the current step to be filled
in the collection matrix.

The system is ready for a triggered input or event to start recording the impulse
data. A few seconds after the trigger a physical test is done, and a pop up dialog
will ask if the test is to be accepted or rejected.

Figure 2.6: Collection Control dialog

1 Click Accept to save the current results to the collection, after this a new
test can be started.
2 Click Reject if for some reason you do not want to save the results to the
collection.

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At this point you can enter a test name to replace the automatically created
name "A1". This name is created from the current terminal name and test
number. If a test name is changed the system will remember the name, this will
now become the default name for the "A1" test position. A comment can also
be added to the Comment text box. Once a comment is added and accepted
the display will look like Figure 2.7.

Note The name can be reset by clicking Reset in the Collection... settings via the
sheet menu.

Figure 2.7: HV Impulse Analysis sheet with Display Lightning Impulse

The upper left hand cell in the collection table now indicates that the test
has been done; the results are within tolerance and that the next test will be
done in the cell below ("A2").

Note If you cannot see the waveform click the star key in the display control area to
fit the waveform to the screen.

The results are always displayed as described in Figure 1.3 "Lightning impulse
test results (A)" on page 11 and the following figures.

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Note If you have selected the standard IEC 60060-1 Ed. 3.0 (2010-09) and you are
doing Lightning Impulse tests and you are evaluating a tail chopped signal
then an additional not chopped signal is needed to do the calculations. The
application assumes that the first test of a terminal is a not chopped signal and
will automatically be used. If this signal is not available then you can measure
it later and do a manual recalculation on the chopped signal afterwards.

Note The calculations will automatically detect if there is a major oscillation for
Lightning or Switching Impulse tests. In those cases the standard IEC 60060-3
(2006) will automatically be used to do the calculations.

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2.5 The Collection Manager

To modify and manage test results a data manager is provided, a button is
available in the Toolbox pane to access this.

Figure 2.8: Toolbox options

Click the collection manager button and the dialog in Figure 2.9 should
appear.

Figure 2.9: Collection Manager dialog

Within this dialog you have a selection of 4 buttons, first you must select a test
or row then:

Click to edit the comment for this test.

Click to simply clear this test data.
Click to re-evaluate the calculations for this particular test.

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Click or double click the test in question to view the result data of this test.

Note A comment can also be added for the entire collection

Re-evaluate multiple tests

It is possible to redo the calculation for more than one test at the same time.
Open the collection manager and select the tests you want to recalculate.

Figure 2.10: Re-evaluate test(s) option

Once highlighted right click and select Re-evaluate test(s). The tests will be
recalculated one test at a time.

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3 The HV Impulse analysis menu

3.1 Analysis Menu
This is a break down of the HV Impulse Analysis menu.

Figure 3.1: HV Impulse Analysis menu

A Load or save
B Collection menu items
C Configuration defaults
D Test Analysis Setup
E Miscellaneous

A Load or save

Load Impulse Analysis Settings

Loads a previously saved HV Impulse Analysis sheet.

Save Impulse Analysis Settings As

The settings of the HV Impulse Analysis sheet can be saved in a separate
file with extension “.pHVIASettings”. This file contains only settings related
to this sheet, it contains the layout of the displays, the tolerance settings
etc.

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B Collection menu items

The next 6 items in the menu are related to collections. The menu offers
the possibility to do the following with Impulse analysis collections:

Make a New collection

Use this menu item to make a new collection. See "Open a collection" on
page 17 for more detailed information.

Open Impulse Analysis Collection

Self defined

Close Impulse Analysis Collection

Self defined

Save Impulse Analysis Collection

Saves the current collection into a collection file. The save action always
automatically takes place after a test is recorded and the calculations are
done.

Save Impulse Analysis Collection As

Saves the current collection into a collection file. The save action always
automatically takes place after a test is recorded and the calculations are
done.

Collection Manager
Opens the collection manager dialog for an overview of the active
collection, see Figure 4.1 "Add Recording dialog" on page 35 for more
information.

Add Recording
Adds an already existing recording to the active collection, see Figure 4.1
"Add Recording dialog" on page 35 for more information.

C Configuration defaults

Save as Default Configuration

You can set up your own default configuration. By using this menu item
your current configuration will be saved as default. This means that each
time you start a new collection and select Using a default
configuration this configuration will be used. A default configuration can
be saved for each test type, either Lightning Impulse or Switching Impulse.

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Restore Factory Default Configuration

The HV-IA option comes with default configurations for the different test
types. These configurations will be changed each time you select Save as
Default Configuration. However using the Restore Factory Default
Configuration will reset the configuration to the initial defaults that HV-IA
came installed with.

D Test Analysis Setup

These menus give access to the setup parameters of the HV-IA
application. Before performing any analysis, the HV-IA application must
know what kind of impulses to expect and which channel or channels will
acquire them.

Analysis ...
Click Analysis in the sheet menu and the dialog in Figure 3.2 will be
shown:

Figure 3.2: Impulse Analysis Test Setup dialog

Accept test without confirmation

Select this check box if you want to automatically accept tests. The dialog
in Figure 2.6 on page 20 will not be shown.

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The Enable Tolerance Testing option is off by default. This option will
enable the program to compare the analysis results to the entered
tolerances. The default tolerance percentages are specified by the IEC
standards.

Selecting the Lightning Impulse tab enables testing between three

groups of tolerance values:

l Full wave
l Chopped wave
l Front Chopped wave

Selecting the Switching Impulse tab will only apply one set of testing
parameters in all cases.

Click Reset to default values to return all tolerance percentages in view

back to their original values.

Note The HV-IA application supports three different types of available IEC working
standards. For Lightning and Switching Impulse you either can select IEC
60060-1 Ed. 2.0 (1989-11) or IEC 60060-1 Ed. 3.0 (2010-09), the (2001-09)
standard uses the k-factor filtering method. For Current Impulse the standard
IEC 62475 Ed. 1.0 (2010-09) will always be used.

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Collection...

Click Collection in the sheet menu and the dialog in Figure 3.3 will be
shown:

Figure 3.3: Impulse Analysis Test Setup - Collection

The Collection tab provides the ability to modify a current collection matrix
without changing the saved collection file or it's name.

Also in this tab is Logical name. Each test is given a unique name. Select
the Terminal name and Test number using the related drop down boxes.
Now you can change the default logical name by typing in the new name
in the Logical name box.

Click Automatically re-arm system after finishing calculations when

you want that the system re-arms itself after finishing the recording and
calculations of a previous test. The time delay before the system is re-
armed can be set via the HVIA Miscellaneous Preferences dialog (Delay
before auto restart).

Click Reset to set all logical names back to their defaults (A combination
of the Terminal name and Test number).

Note For more information on collections please see Figure 1.6 "Collection pane" on
page 12.

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Digitizer...

Click Digitizer in the sheet menu and the dialog in Figure 3.4 will be shown:

Figure 3.4: Impulse Analysis Test Setup dialog - Digitizer

Voltage Channel
This channel measures the voltage signal. The voltage channel defaults to
the first channel of the first recorder.

Current Channel
The current channel is optional and can be used to measure a current
signal. Make this field empty if you do not use a current signal.

Change the data source

You can change a data source by selecting another channel using the
button.

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Figure 3.5: Select Data Source dialog

Please see "Introduction" on page 40 for more details on data sources.

Both the voltage channel and the current channel have high voltage
attenuator and low voltage attenuator settings.

The High Voltage attenuator and Low voltage attenuator settings are
combined to reduce the signal at the digitizer input to less than 100 V. If
the HV attenuator ratio is 2000:1 and the LV attenuator ratio is 50:1 then
the total attenuation will be 100 000:1.

Note The Perception setting Technical Units Multiplier of the selected hardware
channel is automatically set to 100 kV/V.

When connected to Active hardware, the following will become active for
data input:
l Span (Voltage span/range)
This is the Peak-to-peak scale that the digitizer can measure at the
input. It defines the physical measurement range.
l Technical unit
The technical units (y scale) as displayed in displays, tables, meters
or reports.
l Trigger Level (The level used to trigger the acquisition)
If the trigger level is set to e.g. 100 kV then the acquisition is triggered
if the signal goes above 100 kV or below -100 kV.

Note The Perception Trigger mode is set to Dual and the primary level is set to the
entered trigger level while the secondary level is set to the negative value of
this entered trigger level.

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l Memory Length (Total number of samples in 1 acquisition)

The number of samples per channel saved during an acquisition. If
the number of samples is set to 25 k and the sampling rate is
100 MS/s than the length in time of the recorded signal is
25 k/100 MS/s = 250 μs.

E Digitizer Extra
The Digitizer Extra tab is only available if the HVIA miscellaneous
preference Allow working with 2nd channel has been enabled. For
more information see the appendix “HV-IA Preferences - Miscellaneous”
on page 79.

Figure 3.6: Impuls Analysis Test Setup dialog - Digitizer Extra

It is possible to measure an extra channel and do the same calculations
as those which are done on the first channel. This feature can be used for
calibrating purposes.

Enable Extra Channel

Select this check box if you want to measure with an extra channel.

Voltage Channel
This channel measures the voltage or current signal of the extra channel.
This channel defaults to the second channel of the first recorder.

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Change the data source

You can change a data source by selecting another channel using the
button.
Please see “HV Impulse Analysis Data sources” on page 40 for more
details on data sources.

Both the voltage channel and the current channel have high voltage
attenuator and low voltage attenuator settings.

When connected to active hardware, the following will become active for
data input:

l Span (Voltage span/range)

This is the Peak-to-peak scale that the digitizer can measure at the
input. It defines the physical measurement range.
l Technical unit
The technical units (y scale) as displayed in displays, tables, meters
or reports.

F Miscellaneous
If you have multiple monitors you can open the HV Impulse Analysis sheet
into a new window. This is only possible if the option Workbooks in your
key have been enabled. See “Perception Data Acquisiton” manual.

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4 Commands – How to
4.1 Introduction
This section describes, in short summaries, how to carry out some of the most
useful functions in the HV-IA sheet.

4.1.1 Functions in the HV-IA sheet

l To do a repeat test
Load the collection needed. Place the collection “pointer” using a double
click or a right click and select Start next test here. If the operator clicks
on a test that has data in it, another dialog comes up to confirm deletion of
the selected test data.
l Continuing an old test
Make sure the correct collection is loaded. Click the empty slot to place the
“pointer” within the collection and start a test.
l Start an acquisition
Make sure you have a collection ready, click Start and then wait for a
trigger.
l Visually analyze the waveform
Drag a zoom box around the area of interest and the position the two
available cursors to intersect the data curve and read the relative data
points.
l Print the results of a test
When you have completed all tests in a collection and would like to print
click the print button in the toolbox pane to print a default report. To
modify default reports please refer to the Perception manual.
l Save the results of a test (the data of a test is saved by default)
l Modify a default report
The HV-IA provides a default layout for reporting, however to override this
default and design a specific report do the following:
Go to the Sheets menu and click Manage Sheets, from here select the
Reporting sheet and click Load. Once the report sheet has been you loaded
you may modify the report according to the methods set out in the
Perception Manual.
If the report has been modified to a preferable format, this format can be
saved in the HV-IA menu. Navigate to HV Impulse Analysis in the menu
bar and click Save as Default Configuration... This will save the default
report in this style for future report making.
l Add a Recording
Via the HV-IA option you may import .wft data files that were made with
older hardware including: PowerPro, Accura 100HV, Sigma 100HV. HV-IA
now uses .pnrf files, however importing either file is done in the same way.

Click the Add recordings button the Add Recording dialog will be
shown.

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Figure 4.1: Add Recording dialog

Select multiple files from the recordings folder using the Ctrl key and then click
Open. The file will then be loaded into the Collection Recording Loader where
you may select a Channel for it to be placed.

The application will look for empty test locations to place each of the new files.
If you would like to place the files in different positions do the following:

Figure 4.2: Collection Recording Loader dialog

1 Select the test to move.

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2 In the Recording column select the drop down box as empty.

3 Go to the location you want the test to appear in.
4 Select the drop down box and choose the file you would like to appear.

Once you are satisfied click Load recordings. While loading, the status will
change to one of the following fields.

l Waiting The Load recordings button has been pressed, the recording is
waiting to be read.
l Reading The program is busy reading and doing calculations on the current
recording.
l Done Recording has been read, calculations have been done, the data is
now part of the collection.

Note Some recordings can contain multiple channels, if this is the case, select the
correct channel in the "U" and "I" columns.

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5 Measurements with an extra (second) channel

5.1 Introduction
You can use an extra channel during a test. This feature can be used for
calibration tests.

The system will perform the same calculations for the second channel as for
the first channel. The results of the second channel will be saved in a separate
test. This test is located on the right-hand side of the first test in the collection
grid. The test is also a different color (blue). Before you start any test, the light
blue cell background indicates that you are working with an extra channel.

Figure 5.1: Test Second Channel (Part 1)

After you have done the first measurement, the first cell and the one directly
next to it are both filled.

Figure 5.2: Test Second Channel (Part 2)

A Second channel

You can see the second channel results and other data by selecting its
corresponding cell in the collection grid, just as you do in normal operation.

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You cannot switch back to normal operation while a collection is open. First,
you need to close the collection and then you can enable or disable the Extra
Channel (see Figure 5.3).

Figure 5.3: Impulse Analysis Test Setup dialog with the Extra Channel disabled
A This selection can be modified after you close the current collection

You can only change the Enabled Extra Channel option if you close the
collection first (see Figure 5.4)

Figure 5.4: Impulse Analysis Test Setup dialog with the Extra Channel enabled
A Enabled Extra Channel

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The extra channel functionality is only available if the HVIA miscellaneous

preference Allow working with 2nd channel has been enabled. For more
information, see the appendix “HV-IA Preferences - Miscellaneous” on
page 79.

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A HV Impulse Analysis Data sources

A.1 Introduction
The following is an explanation of data sources in the HV-IA sheet. Data
sources and the data sources window are an important part of the HV-IA option
to understand. When a test is done the results are saved and can be accessed
at any time from the data sources window. Please refer to the Perception
manual for more detail on how to use the data sources in Perception.

Figure A.1: Data sources navigator

All of the data sources; consisting of numbers, strings and waveforms are
stored here, the main sections can be expanded by clicking on the respective
plus sign.

The HV-IA data sources are structured like a tree as shown in Figure A.1. The
main branch for this sheet is called HVIA.

The sub nodes of this HVIA entry are A, B, C, … , Collection, LI. The nodes
A,B,C correspond to the number of used terminals and contain the calculation
results per test.

Figure A.2: HVIA node/terminal A

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The sub nodes per test contain all the calculation results for a specific test:

Figure A.3: HVIA node/subnodes

The variables marked by the icon are waveforms. These waveforms can be
measured or calculated data. The waveforms can be displayed by any
Perception display. If the name of the waveform ends with “_cmp” then we are
dealing with a normalized waveform, the maximum of a normalized waveform
is set to 1 and the minimum is set to 0

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The variables marked by the icon are numerical values.

The variables marked by the icon are string values.

For detail on the meaning of each variable please refer to the tables in the
Lightning impulse, Switching impulse and Current impulse parameters chapters
starting on page 46.

If a data source has the same name as another data source but ends with a k
or µ then this data sources refers to the same parameter; the only difference is
that the parameter value is expressed differently:

l Name ends with k: Parameter value is divided by 1000. For example 1000
-> 1 or 1000 V becomes 1 kV.
l Name ends with µ: Parameter value is multiplied by 1e06. For example
0.000001 becomes 1 or 0.000001 s becomes 1 µs.

Those values can be useful for reporting.

The collection node contains only two variables:

Figure A.4: HVIA node/collection subnodes

A Comment: The saved collection comment
B Name: Collection name

The last node will be LI, SI or CI depending on the selected test/evaluation type.
This node represents the current selected test in the control area, see Figure
A.5. The LI, SI or CI nodes show the current or active test results, Figure A.5
shows test A2 is highlighted, this means that LI, SI or CI will reflect the results
obtained in node A2.

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Figure A.5: New collection area

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The LI node can look like:

Figure A.6: HVIA node/LI node

A LI node

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In the example above, the LI node will have the same “sub-node source
structure” as represented by the data source HVIA, see Figure A.6.

Depending on the standard and test/evaluation type used, the variables can
differ and will have another meaning. Therefore we will explain the different
cases.

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A.2 Lightning impulse parameters IEC 60060-1 Ed. 2.0 (1989-11)

This standard has been used by the old HV-IA ProView software that ran on
the Nicolet Accura and Sigma DSO’s.

The data sources are shown in Figure A.7.

Figure A.7: Data sources navigators

Before explaining each individual variable we will show a lightning impulse with
some characteristic measured information.

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Figure A.8: Review Sweep area with LI calculations

The above display can be constructed with your current HV-IA application, see
following chapter for more details. In Figure A.8 we see the main parameters
of the LI calculations. The table below describes these and all other parameters.
Description of the data sources when dealing with lightning impulse
measurement, calculated with the standard IEC 60060-1 Ed. 2.0 (1989-11).

Variable Description Possible

Name Value
This variable returns 0 if the HV-IA
CalculatingResult calculations have been done 0
successfully, else it returns 1.
Description of the calculation result. If “Peak value
calculation was OK it will be empty else between start and
CalculatingResult-
it gives information what went wrong. end signal is
Description
below 10 % of
range”
Returns chopped status, possible
values:
ChoppedStatus 0 = not chopped 0
1 = front chopped
2 = tail chopped

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Variable Description Possible

Name Value
Returns chopped status as a string,
ChoppedStatus- possible values:
“Not Chopped”
AsString “Front-chopped”, ”Tail-chopped”, “Not
Chopped”
Returns the test comment. “Reduced wave
Comment
50 %“
Date Date test was done. 02-12-2009
Oscillation frequency: the 1/period of
any overshoot [Hz] or oscillation
f detected [Hz]. Displayed only if 636.94 kHz
overshoot less than 1 μs duration or
fast oscillation is detected.
Ip is the peak value of the current signal
minus the current base line. This peak
is defined at least 5 μs after the virtual
Ip 120 kA
origin (O1). The Ip value is only
displayed if a current channel is
selected.
The position in time of the maximum
IpPos 2.15 µs
current.
Undershoot amount is the Percentage
K0 of undershoot below baseline zero. 9.207 %
Displayed only for chopped impulses.
The virtual origin is calculated as: the
time location in the recorded curve that
is one half the 30 % to 90 % rise time
(before the time of the 30 % crossing).
O1 9.846 µs
This calculation is the same as
extending the unfit straight line
between the 90 % and 30 % crossings
to the intersection with the baseline.
OvershootWidth Width of the overshoot in seconds. 870.0 ns
Virtual Steepness is the slope on the
front of the best-fit straight line between
S 30 % and 90 % of the peak. This value 1157 kV/µs
is only displayed for front chopped
impulses.
Overshoot amount is the percentage of
overshoot above the estimated mean
ß curve. Displayed only if overshoot is 0.000 %
less than 1 μs duration or a fast
oscillation is detected.
ß' Not applicable for this standard. 0.000 %

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Variable Description Possible

Name Value
Front Time, is the rise time of the curve
T1 between 30 % and 90 %of the peak 839.6 ns
voltage, multiplied by 1.67.
Time to Half Value is the time from
T2 virtual origin to 50 % of the peak voltage 60.15 µs
on the tail.
Time to chopping. This is a virtual
parameter defined as the time interval
Tc 450.2 ns
between the virtual origin 0 and the
instance of chopping.
TestName Name of the test. B2
Time The time when the test has been done. 10:51:38
Returns the result of the tolerance
testing, possible values are:
ToleranceTesting-
0 = tolerance testing failed 2
Result
1 = tolerance testing successful
2 = no tolerance testing done
ToleranceTesting- Returns the result of the tolerance
Not evaluated
ResultAsString testing as a string.
The baseline of the impulse is
calculated from the statistical mean of
U0 the first 50 points of the impulse signal. -49.97 kV
Impulse Analysis requires a pre-trigger
setting of at least 100 data points.
For slow or no overshoot Up is the
actual peak voltage.
Up For overshoot (less then 1us duration) 1.050 MV
or oscillations (greater than 500 kHz)
Up is the peak of the mean curve.
UpPos Position of the actual peak voltage. 11.58 µs
Returns the used standard, possible
values are:
UsedStandard 2
2: IEC 60060-1 Ed. 2.0 (1989-11)
3: IEC 60060-1 Ed. 3.0 (2010-09)
UsedStandard- Returns the used standard as a string. IEC 60060-1 Ed.
AsString 2.0 (1989-11)
Ut Is not applicable for this standard.

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A.3 Lightning impulse parameters IEC 60060-1 Ed. 3.0 (2010-09)

This standard uses a so called k-factor method (with curve fitting and filtering)
during the evaluation of lightning impulse voltages.

The following paragraph gives a basic overview of the used calculation method,
for exact details we refer to the above mentioned standard.

See Figure A.9, start with U(t) this is the recorded curve (red) and the base
curve Ub(t) (green).

Figure A.9: Review Sweep area with voltage curve

Description of the data sources when dealing with lightning impulse

measurement and calculated with the standard IEC 60060-1 Ed. 3.0 (2010-09).

Variable Description Possible

Name Value
This variable returns 0 if the HV-IA
CalculatingResult calculations have been done 0
successfully, else it returns 1.

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Variable Description Possible

Name Value
Description of the calculation result. If “Peak value
calculation was OK it will be empty else between start and
CalculatingResult-
it gives information what went wrong. end signal is
Description
below 10 % of
range”
Returns chopped status, possible
values:
ChoppedStatus 0 = not chopped 0
1 = front chopped
2 = tail chopped
Returns chopped status as a string,
ChoppedStatus- possible values:
“Not Chopped”
AsString “Front-chopped”, ”Tail-chopped”, “Not
Chopped”
Returns the test comment. “Reduced wave
Comment
50 %“
Date Date test was done. 02-12-2009
f -
Ip is the peak value of the current signal
minus the current base line. This peak
is defined at least 5 μs after the virtual
Ip 120 kA
origin (O1). The Ip value is only
displayed if a current channel is
selected
The position in time of the maximum
IpPos 2.15 µs
current.
K0 -
The virtual origin is calculated as: the
time location in the recorded curve that
is one half the 30 % to 90 % rise time
(before the time of the 30 % crossing).
O1 9.846 µs
This calculation is the same as
extending the unfit straight line
between the 90 % and 30 % crossings
to the intersection with the baseline.
OvershootWidth -
Virtual Steepness is the slope on the
front of the best-fit straight line between
S 30 % and 90 % of the peak. This value 1157 kV/µs
is only displayed for front chopped
impulses.
ß Not applicable for this standard.

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Variable Description Possible

Name Value
The ratio of the overshoot magnitude to
ß' the extreme value, expressed as a 0.000 %
percentage.
Front Time, is the rise time of the curve
T1 between 30 % and 90 %of the peak 839.6 ns
voltage, multiplied by 1.67
Time to Half Value is the time from
T2 virtual origin to 50 % of the peak voltage 60.15 µs
on the tail.
Time to wave chopping. This is a virtual
parameter defined as the time interval
Tc 450.2 ns
between the virtual origin 0 and the
instance of chopping.
TestName Name of the test. B2
Time The time when the test has been done. 10:51:38
Returns the result of the tolerance
testing, possible values are:
ToleranceTesting-
0 = tolerance testing failed 2
Result
1 = tolerance testing successful
2 = no tolerance testing done
ToleranceTesting- Returns the result of the tolerance
Not evaluated
ResultAsString testing as a string.
The baseline of the impulse is
calculated from the statistical mean of
U0 the first 50 points of the impulse signal. -49.97 kV
Impulse Analysis requires a pre-trigger
setting of at least 100 data points.
Up Not applicable in this standard.
Position of the actual peak voltage or
UpPos 11.58 µs
Ut.
Returns the used standard, possible
values are:
UsedStandard 2: IEC 60060-1 Ed. 2.0 (1989-11) 2
3: IEC 60060-1 Ed. 3.0 (2010-09)
4: IEC 60060-3 (2006)
UsedStandard- Returns the used standard as a string. IEC 60060-1 Ed.
AsString 3.0 (2010-09)
The maximum value of the test voltage
Ut 1.050 MV
curve measured from the base level.

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A.4 Switching impulse parameters IEC 60060-1 Ed. 2.0 (1989-11)

This standard has also been used by the old HV-IA ProView software that ran
on the Nicolet Accura.

The data source window looks like:

Figure A.10: HVIA node/SI node

A SI node

Variable Description Possible

Name Value
This variable returns 0 if the HV-IA
CalculatingResult calculations have been done 0
successfully, else it returns 1.
Description of the calculation result. If “Peak value
calculation was OK it will be empty else between start and
CalculatingResult-
it gives information what went wrong. end signal is
Description
below 10 % of
range”
Returns the test comment. “Reduced wave
Comment
50 %“

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Variable Description Possible

Name Value
Ip is the peak value of the current signal
minus the current base line. The Ip
Ip 120 kA
value is only displayed if a current
channel is selected.
O Not applicable for this standard
O1 The virtual origin of the waveform . 798.4 µs
Time to Half Value is the time from
T2 virtual origin to 50 % of the peak voltage 2.516 ms
on the tail.
Td is the time above 90 % and is
calculated as the time difference
between the first crossing of 90 % of the
Td 529.1 µs
test voltage before the peak and the
first crossing of 90 % of the test voltage
after the peak.
TestName Name of the test. B2
Time The time when the test has been done. 10:51:38
Returns the result of the tolerance
testing, possible values are:
ToleranceTesting-
0 = tolerance testing failed 2
Result
1 = tolerance testing successful
2 = no tolerance testing done
ToleranceTesting- Returns the result of the tolerance
Not evaluated
ResultAsString testing as a string.
The time to peak is the difference
between, the virtual origin and the
Tp 253.4 µs
position where the voltage has reached
its peak.
The time to zero is calculated as the
time difference between the virtual
Tz
origin and the first crossing of the
baseline after the peak of the impulse.
The baseline of the impulse is
calculated from the statistical mean of
U0 the beginning of the waveform. Impulse 49.50 kV
Analysis requires a pre-trigger setting
of at least 100 data points.
Up is the peak value of the impulse
Up 950.8 kV
minus the impulse baseline.
UpPos x-Position of the actual peak voltage. 11.58 µs

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Variable Description Possible

Name Value
Returns the used standard, possible
values are:
UsedStandard 2
2: IEC 60060-1 Ed. 2.0 (1989-11)
3: IEC 60060-1 Ed. 3.0 (2010-09)
UsedStandard- Returns the used standard as a string. IEC 60060-1 Ed.
AsString 2.0 (1989-11)

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A.5 Switching impulse parameters IEC 60060-1 Ed. 3.0 (2010-09)

This is the new upcoming standard uses the true origin instead of the virtual
origin for its calculations.

Variable Description Possible

Name Value
This variable returns 0 if the HV-IA
CalculatingResult calculations have been done 0
successfully, else it returns 1.
Description of the calculation result. If “Peak value
CalculatingResult- calculation was OK it will be empty else between start and
Description it gives information what went wrong. end signal is below
10 % of range”
Returns the test comment. “Reduced wave
Comment
50 %”
Date Date test was done. 02-12-2009
Ip is the peak value of the current
signal minus the current base line. The
Ip 120 kA
Ip value is only displayed if a current
channel is selected.
The true origin is the instant where the
O recorded curve begins a monotonic 800.6 µs
increase or decrease.
O1 Not applicable in this standard.
Time to Half Value is the time from
T2 virtual origin to 50 % of the peak 2.516 ms
voltage on the tail.
Td is the time above 90 % and is
calculated as the time difference
between the first crossing of 90 % of
Td 529.1 µs
the test voltage before the peak and
the first crossing of 90 % of the test
voltage after the peak.
TestName Name of the test. B2
Time The time when the test has been done. 10:51:38
Returns the result of the tolerance
testing, possible values are:
ToleranceTesting-
0 = tolerance testing failed 2
Result
1 = tolerance testing successful
2 = no tolerance testing done
ToleranceTesting- Returns the result of the tolerance
Not evaluated
ResultAsString testing as a string.

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Variable Description Possible

Name Value
The time interval from the true origin to
Tp the time of maximum value of a 253.4 µs
switching impulse voltage.
The time to zero is calculated as the
time difference between the origin and
Tz
the first crossing of the baseline after
the peak of the impulse.
The baseline of the impulse is
U0 calculated from the statistical mean of 49.50 kV
the beginning of the waveform.
Up is the peak value of the impulse
Up 950.8 kV
minus the impulse baseline.
UpPos x-Position of the actual peak voltage 11.58 µs
Returns the used standard, possible
values are:
UsedStandard 2: IEC 60060-1 Ed. 2.0 (1989-11) 2
3: IEC 60060-1 Ed. 3.0 (2010-09)
4: IEC 60060-3 (2006)
UsedStandard- Returns the used standard as a string. IEC 60060-1 Ed.
AsString 3.0 (2010-09)

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A.6 Current impulse parameters IEC 62475 Ed. 1.0 (2010-09)

The data source window looks like:

Figure A.11: HVIA node/CI node

A CI node

Variable Description Possible

Name Value
This variable returns 0 if the HV-IA
CalculatingResult calculations have been done 0
successfully else it returns 1.
Description of the calculation result. If “Peak value
calculation was OK it will be empty else between begin
CalculatingResult-
it gives information what went wrong. signal and end
Description
signal is below
10 % of range”
Returns the test comment “50 % of range
Comment
used”
Date Date test was done 02-12-2009
The baseline of the impulse is
I0 calculated from the statistical mean of 1.8 A
the beginning of the waveform.

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Variable Description Possible

Name Value
Ip is the peak value of the impulse
Ip 120 kA
minus the impulse baseline.
The virtual origin is calculated as the
time location in the record that is one
eighth of the rise time between the
crossing of 10 % of the test current and
the crossing of 90 % of the test current
O1 798.4 µs
before the time of the 10 % crossing.
This calculation is the same as
extending the unfit straight line between
the 90 % and 10 % crossings to the
intersection with the baseline.
The time to zero is calculated as the
time difference between the virtual
T0 11.55 µs
origin and the first crossing of the
baseline after the peak of the impulse.
The front time is 1.25 times the time
T1 interval between the 10 % and 90% 4.237 µs
crossings of the test current.
Time to Half Value is the time from
T2 virtual origin to 50 % of the peak voltage 9.127 µs
on the tail.
Td is the time above 90 % and is
calculated as the time difference
between the first crossing of 90 % of the
Td 529.1 µs
test current before the peak and the first
crossing of 90 % of the test current after
the peak.
TestName Name of the test SI_A1
Time The time when the test has been done 10:51:38
Returns the result of the tolerance
testing, possible values are:
ToleranceTesting-
0 if tolerance testing did fail 2
Result
1 if tolerance testing is successful
2 if no tolerance testing has been done
ToleranceTesting- Returns the result of the tolerance
Not evaluated
ResultAsString testing as a string.
The total duration is the time during
Tt which the rectangular impulse current is 10.37 µs
higher than 10 % of its peak value
Up Not applicable

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Variable Description Possible

Name Value
Returns the used standard, possible
UsedStandard values are: 4
4: IEC 62475 Ed. 1.0 (2010-09)
UsedStandard- Returns the used standard as a string IEC 62475 Ed. 1.0
AsString (2010-09)

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A.7 Example: Markers using calculation results

In this example we use the calculated results to control markers in a display
using the LI test evaluation type and the standard … 1980/11 … The display
might look like Figure A.12:

Figure A.12: Review Sweep area with the calculated results

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After zooming you will see Figure A.13:

Figure A.13: Review Sweep area with the calculated results (zoomed)

To be able to show these markers the following formulas must be defined:

Num Name Formula

1 Used by vertical y-range marker to show Up
2 Upeak HVIA.LI.U0 + HVIA.LI.Up
3 U50 %_Level HVIA.LI.U0 + 0.5 * HVIA.LI.Up
4
5 Used by horizontal x-range marker to show T2
6 UT2_x1 HVIA.LI.O1
7 UT2_x2 HVIA.LI.O1 + HVIA.LI.T2
8
9 Used by slope cursor to show the slope used Formula
calculating T1
10 Rise (HVIA.LI.T1 + 0.000000002) / 1.67
11 X1 HVIA.LI.O1
12 X2 HVIA.LI.O1 + HVIA.LI.T1

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Num Name Formula

13 Y1 HVIA.LI.U0
14 Y2 Formula.Upeak

The markers will use these formulas and they are defined as follows:

Name Type Label text Anchor 1 Anchor Anchor Anchor

(x) 1 (y) 2 (x) 2 (y)
Up Y- Up: HVIA.LI.Up Formula. - HVIA.LI.
Range {HVIA.LI.Up! Pos Upeak U0
Value,#.###k!Units}
T2 X- T2: Formula.U Formula. Formula -
Range {HVIA.LI.T2! T2_x1 U50%_ .UT2_x2
Value,#.###k!Units} Level
O1 Trace O1: HVIA.LI.O1 - - -
{HVIA.LI.O1!
Value,#.###k!Units}
Slope Slope Slope T1: Formula.X1 Formula. Formula Formula
T1 {HVIA.LI.T1! Y1 .X2 .Y2
Value,#.###k!Units}
Ozoom Trace O1: HVIA.LI.O1 - - -
{HVIA.LI.O1!
Value,#.###k!Units}
Slope Slope Slope T1: Formula.X1 Formula. Formula Formula
Zoom {HVIA.LI.T1! Y1 .X2 .Y2
Value,#.###k!Units}

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B HV Impulse Test Set-up

B.1 Introduction
There are several ways to set up experiments for HV-IA analysis. This chapter
depicts the difference between the traditional equipment set up versus the
newer set ups made possible by the ISOBE5600 series.

B.1.1 Technical Problem

Producing HV Impulses up to several MV and dividing these voltages down for
measurement purposes is a technology of its own and specialized
manufacturers provide solutions to HV labs. To ensure safe operation for the
human operators, as well as for the equipment itself, standards from regulatory
organizations describe how a proper set-up has to be done. This includes
proper grounding with earth pits and conducting mesh in the foundation of the
HV lab. This is part of the customer’s installation.

B.1.2 Challenge
The main challenge for any measurement equipment is to operate as safely
and accurately as possible in severe electromagnetic environments. High
voltages in combination with fast rise/fall times create additional problems.
Each piece of wire acts as an antenna. Each series resistor in a connection
between two points creates a potential difference and hence a voltagedrop,
which in turn results in current flow. The higher the voltages and the faster the
rise/fall times are, the more serious the effects.

B.1.3 Impulse Generation and Test Object Set-up

The output of the impulse generator is connected to the test object - here the
energy is transferred. From the same terminal of the test object, there is a
connection to a voltage divider (either resistive or capacitive), which is used to
produce a proportionally smaller signal of the impulse for measurement
purpose. All of these three components are connected to the same earth point
in the HV lab by a copper strip, ideally in a star connection. The copper strip
has two major characteristics: it is low impedance for low frequency energy
because of its big sectional area and it has a lot of surface, which results in low
impedance for high frequency energy. The high frequency components of the
energy are produced by the high rise/fall times (high dU/dt). The voltage divider
brings the impulse's voltage down by a known factor. For example a 1 MV
impulse is divided by a 2000:1 ratio down to 500 V.

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B.2 Measurement Equipment Set-up

The output voltage of the voltage dividers can go up to approximately 1 kV,
depending on the manufacturer and the model of the divider. This output
voltage is still above the direct input capability of digitizers and the output
connectors of the HV dividers are typically LEMO type. To interface between
the voltage divider and the digitizer, a for example 50:1 impulse attenuator is
used. The impulse attenuator divides the voltage by 50, in the above example
from 500 V to 10 V. Additionally, the impulse attenuators input LEMO
connection interfaces well with the customer's test setup, while the BNC output
cable interfaces well with the digitizer.

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B.3 Traditional Test Set-up and Earth Connections

Control room measurement

A Shielded control room

B Sigma 100 HV
C Conducting mesh
D Foundation material
E Impulse attenuator
F Voltage divider
G Earth connections
H Unit under test
I Earth pit
J Impulse generator
K Test cell (Customers installation)

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All of the above-mentioned voltages at the generator output, the test object, the
voltage divider input and output are the potential difference between the
terminal and an earth. To have the impulse attenuator and the digitizer working
on the same reference level, they also have to be connected to the same
protective earth. For this purpose, the impulse attenuator and the Sigma
100 HV are equipped with protective earth screw terminals, so a proper
protective earth connection with a copper strip can be made. The protective
earth connection serves additional purposes. First, the metal housing is acting
as a Faraday cage and the solid connection to protective earth allows offloading
of the energy picked up from electromagnetic fields and keeps the inside free
of disturbances.

There are two main disadvantages of such a traditional setup:

l Grounding: The digitizer is powered via mains in the control room. Each
mains connection contains also an earth connection and the earth
connection of the wall outlet is in most test labs not the same as the test
cell earth connection. This may become an issue during impulse testing,
as the high energy and the high dU/dt may result in short term potential
differences in the earth connections. As a result, there will be equalizing
currents, which may damage equipment over time.
l Lethal voltages in control room: The output signal of the HV divider can
reach values of up to 1.5 kV. In the traditional set-up, these voltages are
brought into the control room.

With HBM’s battery operated and fiber optic isolated digitizers ISOBE5600t,
two new test set-up’s can be realized:
l Measurement point in control room
l Measurement point in test cell

For both of these set-up’s a few things need to be taken into account.

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B.4 New Test Set-up (a) and Earth Connections

Control room measurement

A Shielded control room

B PC with Perception (HV-IA)
C Conducting mesh
D Foundation material
E Impulse attenuator
F Voltage divider
G Earth connections
H Unit under test
I Earth pit
J Impulse generator
K Test cell (Customers installation)
L ISOBE5600t (Transmitter)
M Fiber Optic data cable
N ISOBE5600m (Receiver)

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In this set-up, all the measurement equipment is still located in the well shielded
control room. The PC and the ISOBE5600m (receiver with memory) are mains
powered and earthed via this mains connection. The ISOBE5600t (battery
operated digitizer) is connected to the ISOBE5600m only by means of fiber
optic cables, so there is NO electrical connection between them. The digitizer
does get the input signal from the impulse attenuator, which is properly
grounded to the test cells earth connection.

The advantages compared to the traditional test set-up:

l NO electrical connection between test cell signals and equipment powered
in the control room (measurement system and PC).
l NO equalizing currents between test cell earth connection and mains earth
connection.
l Impulse attenuator and battery operated digitizer still placed in the shielded
control room, means a minimum exposure to electromagnetic disturbance.

There is no disadvantage compared to the traditional test set-up.

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B.5 New Test Set-up (b) and Earth Connections

The ISOBE5600 set up with measurements done from inside the test cell

A Shielded control room

B PC with Perception (HV-IA)
C Conducting mesh
D Foundation material
E Impulse attenuator
F Voltage divider
G Earth connections
H Unit under test
I Earth pit
J Impulse generator
K Test cell (Customer installation)
L ISOBE5600t (Transmitter)
M Fiber Optic data cable

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N ISOBE5600m (Receiver)
O Shielded compartment in test cell

In this set-up, half of the measurement equipment is still located in the well
shielded control room, the PC and the ISOBE5600m (receiver with memory).
They are mains powered and earthed via the mains connection.

The ISOBE5600t (battery operated digitizer) is connected to the ISOBE5600m

only by means of fiber optic cables, so there is NO electrical connection
between them. The digitizer does get the input signal from the impulse
attenuator, which is properly grounded to the test cell’s earth connection. The
ISOBE5600t and the impulse attenuator are placed in the test cell in a shielded
box.

The advantages compared to the traditional test set-up:

l NO electrical connection between test cell signals and equipment powered
in the control room (measurement system and PC).
l NO equalizing currents between test cell earth connection and mains earth
connection.
l Impulse attenuator and battery operated digitizer are placed in the test cell,
means NO lethal voltages are wired into the well shielded control room.

The disadvantages compared to the traditional test set-up:

l The electromagnetic disturbance in the test cell is much higher than in the
well shielded control room, means the digitizer may pick unwanted signals
and show them superimposed to the real signal. This signal pickup may
heavily vary from several factors like distance to source of disturbance,
wave shape used, etc.
l The 50:1 impulse attenuators were originally designed only for usage in
the well shielded control room. To make them work in the test cell, it is
absolutely necessary to place them in a shielded and earthed box or
compartment.

Ideally, the ISOBE5600t, the impulse attenuator and the connecting short cable
are all placed together in the same shielded and earthed box or compartment.
The size and performance of such a box is up to the test cells requirement and
part of the users installation. HBM does not offer such boxes.

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C Calculate Uncertainty
C.1 Introduction
The method to calculate the SW uncertainty per parameter in this appendix is
based on the method described in Appendix B of IEC 61083-2 Ed. 2.0 (CDV).

The values uB71 listed in the table below show the standard uncertainty of the
algorithms used in the HV Impulse analysis option of the Perception software
for each kind of waveshape and each parameter. The values uB72 show the
standard uncertainty of the reference values according to tables B.1 to B.6 in
the IEC 61083-2 Ed. 2.0 (CDV).

The last column with the values uB7 shows the resulting standard uncertainty
as the result of uB71 and uB72.

The symbol uB7 follows the numbering used in IEC 60060-2:2010 (clauses
5.2.1.3 to 5.9).

HV-IA uncertainty summary

Perception version: 6.20
Standard: IEC 61083-2 Ed. 2.0 (CDV)
Draft document 42/290/CDV
Noise setting of TDG: 0.07 %

Full lightning impulse (LI) (1)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Ut 0.021 % 0.015 % 0.03 %
T1 0.200 % 0.250 % 0.32 %
T2 0.046 % 0.030 % 0.06 %
Beta' [abs %] 0.075 0.040 0.09

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Chopped lightning impulse (LIC) (1)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Up, Ut 0.036 % 0.035 % 0.05 %
T1 0.337 % 0.450 % 0.56 %
Tc 0.225 % 0.200 % 0.30 %
Beta' [abs %] 0.057 0.025 0.06

Switching impulse (SI) (2)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Up 0.154 % 0.065 % 0.17 %
Tp 1.361 % 2.000 % 2.42 %
T2 0.576 % 1.000 % 1.15 %

Current impulse (IC) (1)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Ip 0.048 % 0.040 % 0.06 %
T1, Td 0.179 % 0.250 % 0.31 %
T2 0.143 % 0.300 % 0.33 %

Oscillating lightning impulse (OLI) (1)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Up 0.074 % 0.070 % 0.10 %
T1 0.246 % 0.150 % 0.29 %
T2 0.779 % 0.400 % 0.88 %

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Oscillating switching impulse (OSI) (2)

Parameter Standard Standard Resulting
uncertainty of uncertainty of standard
Perception HV-IA SW reference value uncertainty
uB71 uB72 uB7
Up 0.189 % 0.100 % 0.21 %
Tp 0.329 % 0.150 % 0.36 %
T2 0.475 % 0.650 % 0.81 %

(1) TDG 2.06 settings: 14 bit; 100 MS/s; noise

(2) TDG 2.06 settings: 14 bit; 1 MS/s; noise

NOTES
1 Each calculated parameter for every waveform is within the acceptance
limits of the standard.

2 The calculated standard uncertainties per group of waveforms are

calculated on ALL the waveforms in the standard. In some cases this
results in a higher value of uB7 than some of the individual wafeforms limits
in the standard. This is caused by the fact, that the acceptance limits and
the standard uncertainties in the standard are not always the same for all
waveform cases of the same group of waveforms.
As an example, the acceptance limit of Tp for SI-A1 and SI-A2 are ±2 %
while the acceptance limit of Tp for SI-A3, SI-A4 and SI-A5 are ± 5%.
The contribution of the reference value for SI is 2.000 % (due to SI-A5),
while the contribution of the HV-IA option of Perception is only 1.361%.

3 The settings used (sampling rate, resolution and noise) of the TDG is listed
for each group of waveforms. The choices were made to be in line with the
hardware specifications (ISOBE5600t and 6600HV digitizer) as well as to
take worst case scenarios of user’s choice into account (sampling speed
for slow waveforms like SI and OSI). The algorithms were verified with
higher sampling speeds for SI and OSI as well.

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D HV-IA Preferences
D.1 Introduction
The HV-IA application can be modified by using special HV-IA preferences. You
can modify not only the user interface, but some behavior as well.

This section will describe all preferences available.

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D.2 Preferences dialog

The HVIA preference settings are accessible via the Preferences dialog.

To open the Preferences dialog:

1 Select File ►Preferences

2 Select HVIA Settings

Figure D.1: Preferences dialog/HV-IA Settings

A HV-IA Settings node

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D.3 Output formats

These preferences are used to define the output format of the results in the
Results Area.

Figure D.2: Results area

● Nr. digits time results: Set the number of digits for all time results in the
Lightning impulse test results area.
● Nr. decimals time Set the number of decimals for all time results in
results: the Lightning impulse test results area.
● Nr. digits U/I results: Set the number of digits for all Voltage and Current
results in the Lightning impulse test results area.
● Nr. decimals U/I Set the number of decimals for all Voltage and
results: Current results in the Lightning impulse test results
area.

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D.4 Recording location

You can enable the preference setting Create new folder per collection by
selecting a checkbox.

Figure D.3: Recordings location

A Create new folder per collection

Enabling this preference creates a new folder to store the individual recordings
(*.pNRF files) for each test when a new collection is started. The new folder will
be a sub-folder of the base folder as defined in the preferences recordings
location dialog. The collection name is used for defining a sub-folder name.

HINT/TIP

All data from a collection is saved in a collection file (*.pHVIACollection). You

do not need the individual recording (*.pNRF) files.

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D.4.1 Miscellaneous
This section contains various preferences, most of which are related to the
HV-IA application user interface.

Figure D.4: Miscellaneous HV-IA preferences

A Nice scaling nr. of divisions
B Delay before auto restart
C Show ratio in digitizer menu
D Show range From/To in digitizer menu
E Enable edit span in digitizer menu
F Ratio entry when starting a new collection
G Show Info tables
H Ask for info variables when starting a new collection
I Allow span change when armed
J Allow working with an extra 2nd channel

A Nice scaling nr. of divisions

The display from and display to values are added to each waveform
when the system performs recordings and calculations, as found in the
HV-IA data sources sub-tree. These values are used to set the display to
the correct Y-scaling automatically when such a waveform is shown. The
number of horizontal divisions is a display property and can be manually
set in the Setup of Display dialog. When you set the Nice scaling nr. of
divisions preference to be equal to the number of horizontal divisions of
the display, the Y-scaling values are set to nice values.

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B Delay before auto restart

You can select the option Automatically re-arm system after finishing
calculations in the Impulse Analysis Test Setup menu (see Figure 3.3
"Impulse Analysis Test Setup - Collection" on page 29).
The Delay before auto restart preference defines how long the system
should wait before re-arming. You can look at the current test results during
this delay period. These test results will disappear from the results area
when the system is re-armed and waiting for the next trigger.

C Show ratio in digitizer menu

Click the Show ratio in digitizer menu to see the ratio used or the overall
attenuation in the digitizer setup information field.

D Show range From/To in digitizer menu

Click the Show range From/To in digitizer menu to see the range used
in the digitizer setup information field.

Figure D.5: Digitizer setup - Show range From/To

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E Enable edit span in digitizer menu

Click the Enable edit span in digitizer menu to be able to edit the input
range in the digitizer setup information field.

Figure D.6: Digitizer setup - Enable edit span

F Ratio entry when starting a new collection

Click the Ratio entry when starting a new collection to be able to set the
ratio or total attenuation at the beginning of a new collection.

Figure D.7: New Impulse Analysis Collection dialog

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G Show Info tables

Click the Show Info tables entry when you want to use an information table
in the HV-IA sheet. This information table is a user table and is initially
empty, just like any other new user table in Perception. You can configure
this table and add the information of your choosing. The example below
shows you an example as how the info table could be used.

Figure D.8: Example of an Info table

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H Ask for info variables when starting a new collection

Click the Ask for info variables when starting a new collection check
box to be able to enter information variables at the beginning of a new
collection.
These information variables are defined in the Information sheet (see
Figure D.9). You can define new information variables here.

Figure D.9: Information sheet and New Impulse Analysis Collection

1 Information sheet
2 New Impulse Analysis Collection

I Allow span change when armed

Click the Allow span change when armed to be able to change the span
when the system is armed.

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J Allow working with 2nd channel

Click the Allow working with 2nd channel check box to be able to work
with an extra (second) channel. This feature can be used for calibration
measurements (see chapter “Measuring with extra (second) channel” on
page 37).

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D.5 Calculations
The standard IEC 60060-1 Ed 3.0 (2010-09) tries to generate a test signal using
a double exponential curve fitting algorithm. If this curve fitting fails, the
calculations cannot be performed in accordance with this standard.
Calculations are performed in accordance with the new version of the IEC
60060-1 Ed 3.0 standard by default, although calculations can be performed in
accordance with the older version of this standard. By enabling the following
setting, the calculations will be automatically performed using the older
standard IEC 60060-1 Ed. 2.0 (1989-11) when the new standard is selected
and the curve fitting has failed.

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Index
C I

Calculate Uncertainty ........................................... 72 Imprint .......................................................................

Calculations .......................................................... 85 Install the HV-IA option ........................................... 8
Choose a test type ............................................... 16 Introduction
Collection High Voltage Impulse Analysis (HV-IA) ............. 7
Open a collection ............................................. 17 HV Impulse Test Set-up .................................. 64
Re-Evaluate multiple tests ............................... 24
Reset name ..................................................... 21
L
Collection Manager .............................................. 23
Collection... ........................................................... 29 Lethal voltages ..................................................... 67
Commands License ................................................................... 3
Add a Recording .............................................. 34 Lightning impulse parameters
Continuing an old test ...................................... 34 IEC 60060-1 Ed. 2.0 (1989-11) ....................... 46
Modify a default report ..................................... 34 IEC 60060-1 Ed. 3.0 (2010-09) ....................... 50
Print the results of a test .................................. 34
Start an acquisition .......................................... 34
To do a repeat test .......................................... 34 M
Visually analyze the waveform ........................ 34
Markers using calculation results ......................... 61
Current impulse parameters IEC 62475 Ed. 1.0
Measuring with extra (second) channel ................ 37
(2010-09) .............................................................. 58

N
D
New Test Set-up
Data sources
Measurement point in control room ................. 68
Introduction ...................................................... 40
Measurement point in test cell ......................... 70

H
O
HV Impulse Analysis Menu .................................. 25
Open a collection .................................................. 17
Accept test without confirmation ...................... 27
Collection name ............................................... 18
Collection menu items ..................................... 26
Comment ......................................................... 18
Collection Setup .............................................. 29
Number of terminals ........................................ 18
Configuration defaults ..................................... 26
Tests per terminal ............................................ 18
Digitizer Extra .................................................. 32
Output formats ...................................................... 77
Digitizer Setup ................................................. 30
Load or save .................................................... 25
Miscellaneous .................................................. 33 P
Test Analysis Setup ......................................... 27
HV Impulse Test Set-up Preferences dialog
Measurement Equipment Set-up ..................... 65 HV-IA settings ................................................. 76
HV-IA uncertainty summary ................................. 72
HVI-IA Preferences
Introduction ...................................................... 75

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Recording location ................................................ 78

Delay before auto restart ................................. 80
Enable edit span in digitizer menu .................. 81
Miscellaneous .................................................. 79
Nice scaling nr. of divisions ............................. 79
Ratio entry when starting a new collection ...... 81
Show Info tables .............................................. 82
Show range From/To in digitizer menu ........... 80
Show ratio in digitizer menu ............................ 80

Sheet overview ....................................................... 9

Collection pane ................................................ 12
Display area .................................................... 14
Results area .................................................... 11
Task pane ........................................................ 10
Start an acquisition ............................................... 20
Switching impulse parameters
IEC 60060-1 Ed. 2.0 (1989-11) ....................... 53
IEC 60060-1 Ed. 3.0 (2010-09) ....................... 56

Traditional Test Set-up ......................................... 66

Warranty ................................................................. 3

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Head Office
HBM
Im Tiefen See 45
64293 Darmstadt
Germany
Tel: +49 6151 8030
Email: [email protected]

France
HBM France SAS
46 rue du Champoreux
BP76
91542 Mennecy Cedex
Tél:+33 (0)1 69 90 63 70
Fax: +33 (0) 1 69 90 63 80
Email: [email protected]

UK
HBM United Kingdom
1 Churchill Court, 58 Station Road
North Harrow, Middlesex, HA2 7SA
Tel: +44 (0) 208 515 6100
Email: [email protected]

USA
HBM, Inc.
19 Bartlett Street
Marlborough, MA 01752, USA
Tel : +1 (800) 578-4260
Email: [email protected]

PR China
HBM Sales Office
Room 2912, Jing Guang Centre
Beijing, China 100020
Tel: +86 10 6597 4006
Email: [email protected]

© Hottinger Baldwin Messtechnik GmbH. All rights reserved.

All details describe our products in general form only.
They are not to be understood as express warranty and do
not constitute any liability whatsoever.
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