Lab 6
Lab 6
Theory:
𝑰𝑬 = 𝑰𝑩 + 𝑰 𝑪
𝑰𝑪 = 𝜷𝑰𝑩
Procedure:
Observations:
Table 1. Required Parameter Values
Theoretical Simulation
Hand Calculations:
𝐵𝐸 :
�
�
V B=V BE =0.7 V
𝐼𝐵 : V BB−V BE 3−0.7
I B= = 3
=0.047 mA
RB 49 × 10
𝐼𝐶 :
𝐶𝐸 :
�
� 3.869
V CE =V CC −I C RC =9− ( 470 )=7.18 V
1000
Discussions:
The circuit is operating as expected since the measured values for VBE,
IB, and IC closely resemble the expected values. Despite being marginally
higher than anticipated, the VCE figure is most likely the result of
measurement errors. The transistor is in the linear zone, which is ideal for most
transistor circuits since it allows input signals to be amplified without
distortion. A fixed-bias or base-bias transistor circuit, which is frequently seen
in amplifiers and other electrical devices, is depicted in Figure 6.1.
Transistor Q1 turns off with no collector current flow when the resistor Rb
is open because the base current drops to zero. As a result, Q1's collector
voltage and supply voltage V2 are equal. On the other hand, the collector
current of Q1 passes via the base-emitter junction when resistor Rc is open,
which could cause the transistor to overheat and possibly fail. The transistor is
turned off by an internal open in the base, collector, or emitter. Similar to the
impact of an open resistor Rb, the transistor will not switch on if the emitter
terminal is internally open or improperly connected to the ground.
Conclusions:
To sum up, this lab exercise provided insightful knowledge about the
real-world implementation of theoretical concepts associated with Bipolar
Junction Transistor (BJT) analysis. The expected behavior of the circuit was
shown by the tight alignment of the experimental and analytical values for
VBE, IB, and IC. The transistor operated within the linear range, which is
perfect for undistorted signal amplification, even if the VCE value was slightly
raised, most likely due to measurement mistakes.
The circuit for a fixed-bias transistor demonstrated its widespread
use in electrical devices and amplifiers. An open resistor, Rb, deactivated the
transistor, but an open resistor, Rc, caused overheating and possible failure,
according to our investigation into possible defects. The transistor's function
was disrupted by comparable internal openings in the base, collector, or
emitter.
Understanding these circuit characteristics and possible difficulties
improves our ability to identify issues and create reliable electrical systems.
Essentially, this practical experience helped to bridge the gap between
theoretical knowledge and practical skills, resulting in a deeper understanding
of BJT analysis in practical settings.
Recommendation/s:
The BJT analysis lab exercise emphasizes the value of increased measurement
precision by suggesting the use of sophisticated instruments and carrying out
numerous measurements. In order to increase the longevity of electrical
devices, the emphasis is on preventing problems through frequent circuit
inspections. To reduce possible hazards, it is recommended to put safety
measures in place, such as thermal protection equipment. The goal of
encouraging more experimentation with different circuit configurations is to
improve students' understanding of BJT analysis. A thorough approach that
incorporates safety measures, fault prevention, mistake analysis, and ongoing
experimentation enhances the learning process.