Quiz
Quiz
Question 1 Consider that a p-type silicon device is injected with an electron diffusion current of 8
2
Not answered mA. The cross sectional area of the device: 1 mm and the excess electron
concentration falls off exponentially with distance from the injecting contact. Assume
Not graded
that:
-3 2
1. Diffusion coefficient is: 1.2 x l0 m /s, and
2. The excess electron concentration drops to 25% within a distance of 0.5 mm from the
contact.,
Now calculate the excess hole concentration at the contact.
Hint:
Flux = I/(q x A); And flux can be determined from diffusion equation also.
I is current, q is charge and A is cross sectional area;
Question 2 Correct statement about effective mass of the charge carriers in the following band
Correct structure:
Select one:
a. Effective mass can be +ve as well as -ve also. electrons at the conduction
band minimum have a positive effective mass, whereas holes at valence band
maximum will have a negative effective mass.
b. Effective mass only depends on the band structure dispersion. electrons at the
conduction band will have -ve effective mass due to -ve charge, whereas holes at
valence band will have a +ve effective mass due to +ve charge.
c. Depending on this curvature of the band structure, electrons will have -ve
effective mass at the conduction band minimum, but holes will have +ve effective
mass at valence band maximum.
Select one:
a. This is an indirect band-gap semiconductor with Eg: 0.45 eV
B. Now consider a situation that doping is changing in the device with distance. Sketch
how the total mobility will vary with increasing carrier doping at fixed temperature, 200
K. Write proper justification.
Note: Marks for each plot will be given only when both the regions are correctly
drawn. no marks will be given without Proper written justification.
*In order to avoid confusion and loose of marks, use a scale to draw the lines.
Comment:
Wrong answer for lower T
15 -3
Question 5 A device is made of silicon semiconductor, which is doped with (7 x 10 ) cm Fe
o
Incorrect atoms. The device is working at 1000 C. Identify the correct statement under fully
ionized condition.
Mark 0.00 out of
10 -3
1.00 intrinsic carrier concentration at 300 K: 1 .4 x 10 cm
Select one:
a. Carriers will appear after applying external electric field.
4 -3
b. Minority carriers are electron type with concentration: 1 x 10 cm .
15 -3
c. Majority carriers are electron type with concentration: 7 x 10 cm .
21 -3
d. Majority carriers are hole type with concentration: 7 x 10 m .
4 -3
e. Minority carriers are hole type with concentration: 2.8 x 10 cm .
d. Fermi-level is simply one reference level which can appear at different places
on a semiconductor energy-band diagram depending on the doping conditions. So,
probability of one electron occupancy at +ΔE above Fermi level is the same of a
hole occupancy at -ΔE below the Fermi-level.
d. Carrier mobility is dependent only on the strength of the external electric field.
system parameters doesn't matter.
2
Question 8 In a Silicon device, electrons and hole carriers have mobilities of 0.11 m /V s and 0.02
2
Correct m /V s respectively. Which of the following statement is correct for carrier diffusion:
d. Carrier diffusion rates of electrons and holes can be same, depending on the
device temperature.
◄ Minor exam
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