Design of A Low Power High Speed Double Tail Comparator
Design of A Low Power High Speed Double Tail Comparator
In a comparator, when the non-inverting terminal is at a higher The implementation of comparators with 4 stages and
voltage potential than the inverting terminal, the output is integrated inductors was done. This used a 10GHz 4-stage
pulled up to +Vsatas shown in the Fig 1. Similarly when the comparator in 0.11ȝm/1.2V CMOS, which was used to obtain
inverting terminal is at a higher voltage potential than non- every 4th bit of the data stream. With supply voltage being 1V
inverting terminal, the output is pulled down to –Vsat. at the input side, a bit error rate of < 10-12 was achieved
[3].The comparators are used under very low supply voltages
The comparators are most widely used in analog to digital
convertors like the flash ADC. The comparator design has a
predominant influence on the overall performance of ADCs.
For any comparator a low supply voltage, high speed and
The circuit in [3][4] was further modified and the delay time
of the comparator was measured with the help of an additional
on-chip circuit and the delay time variation of the comparator
was found to be ı§11ps [5].
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2017 International Conference on circuits Power and Computing Technologies [ICCPCT]
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2017 International Conference on circuits Power and Computing Technologies [ICCPCT]
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2017 International Conference on circuits Power and Computing Technologies [ICCPCT]
Comparato Conventio Double- Modifie Propose Design Technique for CMOS technology,” in Proc. IEEE
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CMOS 180nm 180nm 180nm 180nm [5] B. Goll and H. Zimmermann, “Low-power 600MHz
Technolog comparator for 0.5 V supply voltage in 0.12 ȝm CMOS,”
y IEEE Electron.Lett., vol. 43, no. 7, pp. 388–390, Mar.
Supply 0.8V 0.8V 0.8V 0.8V 2007.
voltage
Power 38.54ȝW 48.05ȝ 79.54ȝ 35.5ȝW [6] S. Babayan-Mashhadi and R. Lotfi, “An offset
consumed W W cancellation technique for comparators using body-
Time delay 41ps 37.9ps 24.5ps 5.1ps voltage trimming,” Int. J. Analog Integr. Circuits Signal
Process., vol. 73, no. 3, pp. 673–682, Dec. 2012.
Area 51x51ȝm 52x49ȝ 70x68ȝ 78x80ȝ
occupied m m m
[7] Ajay Vishwakarma, RichaSoni,
SwetaSahu&VijayVishwakarma,“Different Parameter
Analysis of CMOS Charge Sharing Latch Comparator
using 90nm Technology”, International Journal of
Computer Applications, vol. 63, no.11, 2013.
IV. CONCLUSION
[8] Alan Hastings. “The Art of Analog Layout”, Prentice
Hall, Englewood cliffs, NJ, 2001.
In the proposed paper, an elaborate and detailed analysis of
four different clocked regenerative comparators, the [9] D.Shinkel E. Mensink E. Klumperink E. van Tuijl
conventional, Double-Tail, Modified Double-Tail, and and B. Nauta, “A double tail latch type voltage sense
proposed comparators were analyzed and simulated. Further amplifier with 18ps Setup + Hold time”, in Proc. IEEE Int.
these were compared based on Power, Chip area and Delay. Solid-State Circuits Conf, Dig. Tech papers, ,pp.314-
The results were obtained from the simulation done using 315,Feb.2007.
CADENCE VIRTUOSO IC 6.1 software tool in 180 nm
CMOS technology. The results show us that the proposed [10] Phillip E.Allen and Douglas.R.Holberg.“CMOS
comparator, i.e. modified based on clock-gating technique has Analog Circuit Design. Oxford University Press,Second
shown a very drastic improvement in Power and Delay with a edition, 2002.
trade-off on the area occupied.
[11] Navya Mohan, J.P. Anita, “A Zero Suppressed Binary
Decision Diagram based test setrelaxation for single and
Multiple stuck-at faults” in the International Journal of
Mathematical Modelling and Numerical Optimisation
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[1] SamanehBabayan-mashhadi, And Reza Lotfi,
“Analysis And Design Of A Low-voltage Low-power
Double-tail Comparator”, IEEE Trans. on Very Large
Scale Integration (VLSI) Systems, vol. 22, no. 2, pp. 343–
352, Feb.2014.
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