2024-25 CBSE 12 Physics Syllabus Analysis

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SYLLABUS 2024-25

Unit-I Electrostatics
Chapter 1: Electric Charges and Fields
• Electric Charges; Conservation of charge, Coulomb’s law-force between two point charges,
forces between multiple charges; superposition principle and continuous charge distribution.
• Electric ield, electric ield due to a point charge, electric ield lines, electric dipole, electric
ield due to a dipole, torque on a dipole in uniform electric ield.
• Electric lux, statement of Gauss’s theorem and its applications to ind ields due to ininitely
long straight wire, uniformly charged ininite plane sheet and uniformly charged thin
spherical shell (ield inside and outside).
Chapter 2: Electrostatic Potential and Capacitance
• Electric potential, potential difference, electric potential due to a point charge, a dipole
and system of charges; equipotential surfaces, electrical potential energy of a system of
two point charges and of electric dipole in an electrostatic ield.
• Conductors and insulators, free charges and bound charges inside a conductor.
Dielectrics and electric polarisation, capacitors and capacitance, combination of
capacitors in series and in parallel, capacitance of a parallel plate capacitor with and
without dielectric medium between the plates, energy stored in a capacitor. (no
derivation, formula only)

Unit-II Current Electricity


Chapter 3: Current Electricity
• Electric current, low of electric charges in a metallic conductor, drift velocity,
mobility and their relation with electric current; Ohm’s law, V-I characteristics (linear
and nonlinear), electrical energy and power, electrical resistivity and conductivity,
temperature dependence of resistance.
• Internal resistance of a cell, potential difference and emf of a cell, combination of cells in
series and in parallel, Kirchhoff’s laws and simple applications, Wheatstone bridge.

Unit-III Magnetic Effects of Current and Magnetism


Chapter 4: Moving Charges and Magnetism
• Concept of magnetic ield, Oersted’s experiment.
• Biot - Savart law and its application to the current carrying circular loop.
• Ampere’s law and its applications to ininitely long straight wire. Straight solenoids (only
qualitative treatment), force on a moving charge in uniform magnetic and electric ields.
• Force on a current-carrying conductor in a uniform magnetic ield, force between
two parallel current-carrying conductors-deinition of ampere, torque experienced
by a current loop in uniform magnetic ield; current loop as a magnetic dipole and
its magnetic dipole moment, moving coil galvanometer-its current sensitivity and
conversion to ammeter and voltmeter.
Chapter 5: Magnetism and Matter
• Bar magnet, bar magnet as an equivalent solenoid (qualitative treatment only),
magnetic ield intensity due to a magnetic dipole (bar magnet) along its axis and
perpendicular to its axis (qualitative treatment only), torque on a magnetic dipole (bar
magnet) in a uniform magnetic ield; magnetic ield lines.

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• Magnetic properties of materials: Para-, dia- and ferro - magnetic substances, with
examples. Magnetization of materials, effect of temperature on magnetic properties..

Unit-IV Electromagnetic Induction and Alternating Currents


Chapter 6: Electromagnetic Induction
• Electromagnetic induction; Faraday’s laws, induced EMF and current; Lenz’s Law, Self
and mutual induction.
Chapter 7: Alternating Current
• Alternating currents, peak and RMS value of alternating current/voltage; reactance and
impedance; LCR series circuit (Phasors only), resonance; power in AC circuits, power
factor, wattless current.
• AC generator and transformer.

Unit-V Electromagnetic waves


Chapter 8: Electromagnetic Waves
• Basic idea of displacement current, Electromagnetic waves, their characteristics, their
Transverse nature (qualitative ideas only).
• Electromagnetic spectrum (radio waves, microwaves, infrared, visible, ultraviolet, X-rays,
gamma rays) including elementary facts about their uses.

Unit-VI Optics
Chapter 9: Ray Optics and Optical Instruments
• Ray Optics: Relection of light, spherical mirrors, mirror formula, refraction of light,
total internal relection and its applications, optical ibres, refraction at spherical
surfaces, lenses, thin lens formula, lensmaker’s formula, magniication, power of a lens,
combination of thin lenses in contact, refraction of light through a prism.
• Optical instruments: Microscopes and astronomical telescopes (relecting and
refracting) and their magnifying power
Chapter 10: Wave Optics
• Wave Optics: Wavefront and Huygens principle, relection and refraction of plane
waves at a plane surface using wave fronts. Proof of laws of relection and refraction
using Huygens principle. Interference, Young’s double slit experiment and expression
for fringe width (No derivation inal expression only), coherent sources and sustained
interference of light, diffraction due to a single slit, width of central maxima (qualitative
treatment only).

Unit-VII Dual Nature of Radiation and Matter


Chapter 11: Dual Nature of Radiation and Matter
• Dual nature of radiation, Photoelectric effect, Hertz and Lenard’s observations;
Einstein’s photoelectric equation-particle nature of light.
• Experimental study of photoelectric effect
• Matter waves - wave nature of particles, de-Broglie relation.

Unit-VIII Atoms and Nuclei


Chapter 12: Atoms
• Alpha-particle scattering experiment; Rutherford’s model of atom; Bohr model of
hydrogen atom, expression for radius of nth possible orbit, velocity and energy of
electron in nth orbit, hydrogen line spectra (qualitative treatment only).
Chapter 13: Nuclei
• Composition and size of nucleus, Nuclear force
• Mass-energy relation, mass defect; binding energy per nucleon and its variation with
mass number; nuclear ission, nuclear fusion.

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Unit-IX Electronic Devices
Chapter 14: Semiconductor Electronics: Materials, Devices and Simple Circuits
• Energy bands in conductors, semiconductors and insulators (qualitative ideas only),
Intrinsic and extrinsic semiconductors - p and n type, p-n junction
• Semiconductor diode - I-V characteristics in forward and reverse bias application of
junction diods, diode as a rectiier;

PRACTICALS
The record to be submitted by the students at the time of their annual examination
has to include:
• Record of at least 8 Experiments [with 4 from each section], to be performed by the
students.
• Record of at least 6 Activities [with 3 each from section A and section B], to be
performed by the students.
• The Report of the project carried out by the students.

SECTION - A
Experiments
1. To determine resistivity of two / three wires by plotting a graph for potential difference
versus current.
2. To ind the resistance of a given wire / standard resistor using a metre bridge.
3. To verify the laws of combination (series) of resistances using a metre bridge.
OR
To verify the laws of combination (parallel) of resistances using a metre bridge.
4. To determine the resistance of a galvanometer by half-delection method and to ind
its igure of merit.
5. To convert the given galvanometer (of known resistance and igure of merit) into a
voltmeter of the desired range and to verify the same.
OR
To convert the given galvanometer (of known resistance and igure of merit) into an
ammeter of desired range and to verify the same.
6. To ind the frequency of AC mains with a sonometer.

SECTION - B
Experiments
1. To ind the value of v for different values of u in the case of a concave mirror and to
ind the focal length.
2. To ind the focal length of a convex mirror, using a convex lens.
3. To ind the focal length of a convex lens by plotting graphs between u and v or
between 1/u and 1/v.
4. To ind the focal length of a concave lens, using a convex lens.
5. To determine the angle of minimum deviation for a given prism by plotting a graph
between angle of incidence and angle of deviation.
6. To determine the refractive index of a glass slab using a travelling microscope.
7. To ind the refractive index of a liquid using a convex lens and plane mirror.
8. To ind the refractive index of a liquid using a concave mirror and a plane mirror.
9. To draw the I-V characteristic curve for a p-n junction diode in forward and reverse
bias.

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