Lab Exp 1-12 2024
Lab Exp 1-12 2024
DEPARTMENT OF PHYSICS
PHYSICS LABORATORY
MANUAL CUM RECORD NOTE BOOK
(2023 Regulations)
(2024-2025)
NAME :
SECTION ROLL NO :
REGISTRATION NUMBER :
SEMESTER :
DEPARTMENT :
NAME :
REGISTER NO :
YEAR / SEM :
DEGREE / BRANCH :
Certified that this is a bonafide record work done by the above student during the
2. Instructions to Students 3
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Institute Vision Mission
VISION
To serve the society by offering top-notch technical education on par with global standards.
MISSION
We will strive to
M1: Be a center of excellence for technical education in emerging technologies by exceeding the
needs of the industry and society.
M2: Be an institute with world class research facilities.
M3: Be an institute nurturing talent and enhancing the competency of students to transform them
as all-round personality respecting moral and ethical values.
To enhance the quality education in basics science and humanities subjects and creating eminent
engineers by providing the best teaching methodologies.
MISSION OF DEPARTMENT:
To stimulate the young minds for active involvement in academic and co-curricular
activities
To legitimize students with good competitive skills for facing the challenges in the field of
1
Program Outcomes (POs)
Engineering knowledge: Apply the knowledge of mathematics, science, engineering
PO 1 fundamentals, and an engineering specialization to the solution of complex engineering
problems.
Problem analysis: Identify, formulate, review research literature, and analyze complex
PO 2 engineering problems reaching substantiated conclusions using first principles of
mathematics, natural sciences, and engineering sciences.
Modern tool usage: Create, select, and apply appropriate techniques, resources, and
PO 5 modern engineering and IT tools including prediction and modeling to complex
engineering activities with an understanding of the limitations.
The engineer and society: Apply reasoning informed by the contextual knowledge to
PO 6 assess societal, health, safety, legal and cultural issues and the consequent
responsibilities relevant to the professional engineering practice.
Life-long learning: Recognize the need for, and have the preparation and ability to
PO 12 engage in independent and life-long learning in the broadest context of technological
change.
2
Instructions to Students
GENERAL INSTRUCTIONS:
Students should attend the Physics practical class with completed Record
Students should bring the required things like calculator, pen, pencil, eraser,
etc.,
While entering the lab students should enter their attendance in lab register.
Also they have to sign in apparatus issue register while receiving and returning
the accessories like screw guage, vernier caliper, reading lens, etc.,
The procedure will be explained in the lab and the student has to complete the
experiment on time.
The doubts & difficulties, if any, should be discussed with the concern staff
immediately.
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Course Code : GEA1111
Course Title : ENGINEERING PHYSICS LABORATORY
Course Objectives
To impart the usage of basic apparatus and to study the characteristics of the materials and light
source.
Course Outcomes
Upon completion of the course, the students will be able to:
CO1 Analyze the properties of an optical fibre and the wavelength of a laser source
CO2 Determine a Planck's constant and analyze the variation in photocurrent.
CO3 Analyze the thermal behaviour of poor conductors
CO4 Examine the elastic behaviour of a given material.
CO5 Invesigate the properties of semiconducting material.
Determine the properties of a liquid under ultrasonic conditions and simulate the
CO6
indentation behaviour of a material.
Syllabus
List of Experiments:
1 Examine the numerical aperture and acceptance angle values of a given optical fibre
2 Determine the wavelength of the given laser source
3 Determine the size of the lycopodium powder using lase
4 Design the necessary circuit to find the Planck’s Constant
5 Investigate the variation of photocurrent with the intensity of light
6 Test the thermal conducting nature of a given poor conductor using Lee’s disc method
7 Inspect the given thin wire by finding its rigidity modulus value.
8 Estimate the Young’s modulus of the given material by using non-uniform bending method
9 Examine the bandgap value of a given semiconducting material
Analyse the type of a given semiconductor material based on its Hall coefficient and charge
10
densityvalues
Determine the velocity of Ultrasonic waves and compressibility of the given liquid by
11
formation ofacoustical grating - Ultrasonic interferometer
12 Determine the indentation hardness of the material using Vicker’s hardness method
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Contents
Faculty
Ex. No. Date Name of the Experiment PageNo. Marks
Sign.
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Contents
Faculty
Ex. No. Date Name of the Experiment PageNo. Marks
Sign.
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14.
Staff in-charge
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Fig. 1.1 Vernier Caliper
Measuring Instruments
I. Vernier Caliper
AIM
To find the breadth of the given specimen.
Apparatus Required
Vernier Caliper, Specimen.
Description
The Vernier caliper consists of a main scale (fixed scale) and a Vernier scale.
Before taking a reading with the Vernier caliper the least count and zero error have to be
determined.
When the two jaws A & B (Fig. 1.1) of the Vernier caliper touch each other and
if the zero of the Vernier coincides with zero of the main scale division there is no zero error
(Fig. 1.2)
When the two jaws are in contact and if the zero of the vernier is to the right of the
zero of the main scale the error is positive. In this case let 5th vernier division coincide with
definite main scale division (Fig. 1.3)
Value of zero error = + (VSC x LC)
= + 5 x 0.01 cm = 0.05 cm
When the two jaws are in contact and if the zero of the Vernier is to the left of
the zero of the main scale the error is negative. In this case let 5th vernier scale division
coincides with definite main scale divisions (Fig. 1.4).
Then value of zero error (ZE) = – (10 – 5) x LC
ZE = – 5 x LC
= – 5 x 0.01 cm
ZE = – 0.05 cm
ZC = + 0.05 cm
8
Least count
L.C. = 1 MSD – 1 VSD
= 0.1 – 0.09
= 0.01 cm
9
Determination of breadth of the given specimen
The object whose length to be measured is held between the two outside jaws. The main
scale reading and the vernier scale coincidence are noted.
Observed reading (OR) = MSR + (VSC x LC)
Now VSR = VSC x LC
Total reading (TR) = OR + ZC
Length of the given object is measured at different places and the observations are
tabulated in table (1) and mean value is taken.
Table - 1
Least count = 0.01 cm Zero error = ................................. div
1.
2.
3.
4.
5.
Mean = x 10–2 m
Result
10
Fig. 2.1 Screw gauge
Pitch
Least count =
Number of head scale divisions
5 mm
= = 1mm.
5
1 mm
L.C = = 0.01 mm.
100
Fig. 2.4 Negative zero error Fig. 2.5 Screw gauge readings
11
II. Screw gauge
AIM
To find the thickness of given specimen.
Apparatus Required
Screw gauge and specimen
Description
A screw gauge can measure the distance with more precision than a vernier caliper.
The screw gauge consists of a barrel (pitch scale) moving within a head scale (sleeve).
The head scale is divided into 100 divisions. The head scale moves over the pitch scale,
which is graduated in 1 mm. A ratchet knob is provided for closing the screw gauge on the
object being measured without exerting too much force.
To make a measurement with the screw gauge, the pitch, least count and zero error
have to be determined.
Total number of divisions on head scale = 100.
When the tip of the screw and the stud are in contact (Fig. 2.1) and if the zero of the
head scale exactly coincides with the zero of the pitch scale (Fig. 2.2), there is no zero error.
If the zero of the head scale is below the reference line on the pitch scale, the error is positive.
In this case let 5th head scale division coincides with the reference line (Fig. 2.3)
Then the value of zero error = HSC x LC
= 5 x 0.01 mm
= + 0.05 mm
Z.C. = – 0.05 mm
If the zero of the head scale is above the reference line then the zero error is negative.
Let 95th head scale division coincides with the reference line, in this case (Fig. 2.4).
Then the value of zero error = – ( 100 – 95 ) x LC
= – 0.05 mm
Z.C. = + 0.05 mm
12
Determination of thickness of an object
The object whose thickness is to be measured is held tightly between the stud (A) and
the spindle (B). The head scale coincidence with the pitch scale and the pitch scale reading
is noted.
Observed reading (OR) = PSR + (HSC x LC)
Total reading (TR) = OR ZC
Observations are repeated at different places on the object. The readings are tabulated
in Table (2) and mean value is found.
Table - 2
Least count = 0.01 cm Zero error (ZE) = ....................... div
1.
2.
3.
4.
5.
Mean = x 10–3 m
Result
14
III. Travelling Microscope
AIM
To determine the outer diameter of the given specimen.
Apparatus Required
Travelling microscope, capillary tube, reading lens.
Description
The travelling microscope consists of a compound microscope that is capable of
independent vertical and horizontal movements fitted with main scales (M1 and M2) and
verniers (V1 and V2). The microscope attached with vernier V 1 can be raised or lowered
along M1 by a screw S1/P. Similarly V2 is moved to and fro horizontally with a screw S2/Q.
Two screws (L1 and L2) at the base of the microscope are used for its leveling. The main
scale is marked in millimeters and half millimeters. The vernier is divided into 50 divisions
(Fig. 3.1).
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Table - 3
Determination of outer diameter of the capillary tubeLeast count =
0.001 cm
Microscope reading
Vernier
Main TR =
S. Scale V.S.C = Diameter
Position Scale (MSR +
No. Coincide (VSC x LC)
Reading VSR)
Right
2.
(B)
Bottom
4.
(D)
Calculation
Least Count (LC) = 1 MSD – 1 VSD
1
1 MSD = cm = 0.05 cm
20
Total number of divisions on the vernier scale = 50 50
50 VSD = 49 MSD
1 VSD = MSD
= x 0.05 = 0.049 cm
LC = 1 MSD – 1 VSD
= 0.05 – 0.049
LC = 0.001 cm
Result
Outer diameter of the capillary tube =
16
Expt. No: Date:
DETERMINATION OF ACCEPTANCE ANGLE AND NUMERICAL APERTURE IN
AN OPTICAL FIBER
AIM
To determine the numerical aperture and acceptance angle of the given optical fibre
APPARATUS REQUIRED
(i) Laser source
(ii) Screen and Scale
(iii) Optical Fiber
(iv) Numerical Aperture measurement Jig etc
FORMULA:
𝑟
𝑁𝐴 = 𝑁𝑜 𝑢𝑛i𝑡
√𝑟2 + 𝑑2
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Fig.4. Numerical Aperture
PROCEDURE
A known length of fiber is taken. One end of the fiber is connected to the laser source and the other
end is connected to the numerical aperture (NA) Jig as shown in fig.4. The source is switched ON. The
opening in the NA jig is completely opened so that a circular red patch oflaser light is observed on the
screen. By opening in the jig is slowly closed with the knob provided, at a particular point the circular red
patch of laser light is observed on the screen. By adjusting the opening in the NA Jig is slowly at particular
points the circular light patch in the screen just cuts. The radius of the circular opening (r) of NA jig at
which the circular patch of light just cuts is measured.
The distance between the NA jig and opening and the fiber can be measured directly with the help
of the calibration in NA jig. By substituting the values in the given formula the NA can be calculated. By
finding NA and substitute it in the given formula the acceptance angle can be calculated.
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TABLE 3: TO FIND NUMERICAL APERTURE
Mean=
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(ii) DETERMINATION OF ACCEPTANCE ANGLE.
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
RESULTS
APPARATUS REQUIRED
(i) Laser source - Diode Laser Grating
(ii) Screen and Scale
(iii) Scale
FORMULA
𝑆i𝑛 𝜃
λ= 𝑀𝑒𝑡𝑟𝑒
𝑁𝑛
Fig.1.Wavelength of LASER
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PROCEDURE
CALCULATION OF THE WAVELENGTH OF THE LASER SOURCE
The laser source and the laser grating are mounted on separate stands as shown in fig.1. A fixed
distance (D) is kept between the laser grating and the screen. The laser source is switched ON and the beam
of laser is allowed to fall on the laser grating. The diffracted beams are collected on the screen. The
diffracted beams are in the form of spots as shown in fig.1.
From the figure the intensity of the irradiance is found to decrease from 0-th order to higher orders,
i.e., the first order is brighter than the second order and so on. The positions X1 , X2 , X3,……….X n of
the spots belongs to the first order , second order , third order etc., On either side of the central maximum
are marked on the screen and is noted. The experiment is repeated for various values of D and the
positions of the spots are noted. Then, by using the given equation the wavelength of the laser source can
be calculated and the mean is taken.
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TABLE 1: DETERMINATION OF WAVELENGTH OF LASER SOURCE
Leftside Rightside
Å
Order of diffraction (n)
𝒙
tan 𝜃1 =( )
𝒙 𝒙
tan 𝜃2 =(𝑫) 𝜃2 =tan-1 (𝑫)
S.No
𝒙
𝜃1 =tan-1 ( )
𝑫 Mean
(cm)
(cm)
1 1 X1= X1=
2 2 X2= X2=
3 3 X3= X3=
4 4 X4= X4=
λ= Å
CALCULATIONS:
(i) DETERMINATION OF WAVELENGTH
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24
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
RESULTS
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Expt. No: Date:
To determine the Particle size of the given powder (Lycopoium) using LASER source.
APPARATUS REQUIRED
(i) Laser source
(ii) Lycopodium powder
(iii) Glass plate
(iv) Screen and Scale
FORMULA
𝑛𝜆𝐷
𝑑= 𝑀𝑒𝑡𝑒𝑟
𝑋𝑛
26
Fig. 2. Diffraction pattern
PROCEDURE
CALCULATION OF THE SIZE OF THE GIVEN PARTICLE
The laser source and the powder consist of micro sized particle are mounted on separate
stands as shown in fig.1. A fixed distance (D) is kept between the laser grating and the screen. The laser
source is switched ON and the beam of laser is allowed to fall on the laser grating. The diffracted beams
are collected on the screen. The diffracted beams are in the form of circular rings as shown in fig.1.
Now the laser grating is removed and the powder consist of micro sized particle is
introduced. The laser source is switched ON and the light is made to fall on the particle. The screen is
moved back and forth until the clear image of the spectrum is seen and the distance between the screen and
the particle (D) is noted. Due to diffraction of the laser light by the particle, different orders of spectrum are
obtained as shown in fig.2
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TABLE 2: PARTICLE SIZE DETERMINATION
λ = ................................... Å
Particle Size
Distance
Order of Distance between
between screen
S.No Diffraction central bright point
and glass plate
(n) and nth fringe xn (cm)
(D) cm
×10-6m
1
1
2
1
2
2
Mean =
CALCULATIONS:
28
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
RESULTS
29
Expt. No: Date:
Determination of Planck’s Constant
Aim
Determination of Planck’s Constant by measuring radiation in a fixed spectral
range.
Apparatus
Power supply , lamp holder with bulb, wooden plank with a half meter scale, set of
three colors filters, two numbers of Digital Panel Meter (voltmeter and current meter) are
provided on the front panel.
Formula
Plank’s Constant h =
Where,
30
Fig. 1 Circuit to determine Planck’s constant
31
Table1 : Determination of stopping potentials
32
33
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
34
Expt. No: Date:
Apparatus Required
O Photocell
O Resistor (1 K ohm)
O Rheostat
O Electric Lamps
O Ammeter (0 - 10 mA)
O Regulated Power Supply
O Voltmeter (0 - 10 V)
Formula
The relation between intensity of illumination and distance is
I = constant / d2
Where, I - Current (mA)
d - Distance of Lamp from Photo Cell
I = 1 / d2
Since, constant = 1 (as there was no change in angle and relationship is linear).
The intensity of light is inversely proportional to the square of distance.
Procedure
1. The connections are given in as shown in Fig. 1.
2. The light source is switched on and made to fall on the Photocell.
3. The corresponding voltmeter and ammeter readings are noted.
4. The procedure is repeated by keeping the light source at different
distances from the Photocell.
5. The theoretical explanation of variations of photoelectric current by
changing the intensity of light gives the following graph (Fig. 2).
6. This graph shows that there is a linear positive relationship between
current and inverse of square of distance. The inverse of square of
35
distance is the measure
7. of intensity of light and it has been plotted on x-axis. On y-axis the readings of
deflections of ammeter have been showed which measure of photoelectric
current. The inverse of square of distance is the independent variable while
the deflection of Microammeter is the dependent variable.
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Fig. Circuit diagram of Photoelectric effect
(I Vs 1/d2)
Fig. Model Graph between Photoelectric Current and Inverse of Square of Distance
37
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
The characteristics of Photocell were studied and the impact of change in intensity of light
on photoelectric current are plotted.
38
Expt. No: Date:
Aim
To determine the thermal conductivity of a bad conductor using Lee’s disc Method.
Apparatus Required
• Lee’s disc apparatus Steam boiler
• Two thermometers Vernier caliper
• Bad conductors Stop watch
• Heating oven
Formulae:
Rate of cooling at θ2
Kelvin/sec
Description:
The apparatus consists of a metal slab A of copper which is suspended by means of three
strings from a stand. A hollow cylindrical vessel B with inlet and outlet for steam is placed above
A. The cardboard of same diameter whose thermal conductivity is required is placed between A
and B. The thermometers T1 and T2 are used to measure the temperatures of B and A
respectively.
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Fig.1. Lee’s disc arrangement
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Determination of Rate of cooling
3
4
5
6
7
8
9
10
11
12
To find the thickness (y) of the Bad conductor using screw gauge
LC = 0.01 X 10-3 m ZE = _______X 10 -3 m
ZC = X 10 -3 m
Pitch Scale Head Scale
Observed Reading Correct Reading
S. No. Reading Coincidence
OR = PSR +(HSC X LC) = OR ± ZC
(PSR) (HSC)
Unit X 10 -3 m div. X 10 -3 m X 10 -3 m
1.
2.
3.
4.
5.
41
Procedure:
The experimental arrangement is shown fig. steam is allowed to pass through the inlet of
the vessel B and it escapes out through the outlet. The temperatures θ1 and θ2 are noted when the
thermometers T1 and T2 show steady and constant readings. Now the cardboard is removed and
the vessel B is kept in direct contact with the metal slab A, till its temperature is about 5ºC above
the steady temperature θ2. A stop watch is started and time is noted for every 1ºC fall the
temperature until the metallic disc attains 5ºC below θ2. A graph between temperature and time is
drawn. Rate of cooling dθ/dt at θ2 is calculated from the graph.
Thickness and radius of metallic disc is measured using screw gauge and Vernier caliper
respectively. The thickness of bad conductor is found using screw gauge. Substituting the all
values in the given formula the thermal conductivity of bad conductor can be calculated.
To find the thickness (h) of the Metallic Disc using screw gauge
LC = 0.01 X 10-3 m ZE = ___ X 10 3 m
3
ZC = X 10 m
Pitch Scale Head Scale
Observed Reading Correct Reading
S. No. Reading Coincidence
OR = PSR +(HSC X LC) = OR ± ZC
(PSR) (HSC)
Unit X 10 -3 m div. X 10 -3 m X 10 -3 m
1.
2.
3.
4.
5.
Mean (h) = X 10 3 m
r= ×10-2m
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CALCULATION:
43
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
RESULT
44
Expt. No: Date:
To determine the moment of inertia of a given disc by Torsional oscillations and the
rigidity modulus of the material of the suspension wire.
Apparatus Required
Metallic wire Meter scale
Torsional pendulum Screw gauge
Stop clock
Formula
Kg m2
Nm-2
45
Fig. 1 Torsional pendulum
Theroy
The circular disc is rotated in a horizontal plane so that a twist is given to the wire which holds the
disc. Hence the various elements of the wire undergo shearing strains. The restoring couples, which tend
to restore the unstrained conditions, are called into action now when the disc is released it starts executing
torsional oscillations. The couple which acts on the disc produces in it an angular acceleration which is
proportional to the angular displacement and is always directed towards its mean position. Hence the
motion of the disc is a simple harmonic motion.
Procedure
One end of the long uniform wire whose rigidity modulus is to be determined is clamped by a
vertical chuck. To the lower end, a heavy uniform circular disc is attached by another chuck. The length
of the suspension ’l’ fixed to a particular value (say 40 cm or 50 cm).The suspended disc is slightly twisted
so that it executes tensional oscillations. Care is taken to see that the disc oscillates without wobbling.
The first few oscillation is omitted by using the pointer then the time takes for 10 complete
oscillations are noted. Two trials are taken. The mean time period ’T’ is found.
The diameter of the wire is accurately measured at various places along its length with screw gauge.
From this, the radius of the wire is calculated. The moment of inertia of the disc and the rigidity modulus
of the wire are calculated using the given formals.
46
Table 1. To find L/T2
Unit X 10 -3 m div. X 10 -3 m X 10 -3 m
1.
2.
3.
4.
5.
Mean = X 103 m
47
To find the radius of the Circular Metallic Disc
R= ×10-2m
Calculation
Kg m2
Nm-2
48
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
1. Moment of inertia of the circular disc I = ................................……………………Kgm2
2. Rigidity modulus of the given wire n = ………………………………………….Nm-2
49
Expt. No: Date:
Apparatus Required
Principle
When a beam symmetrically supported on two knife edge is loaded at its centre, the bent beam
would not form an arc of circle. This type of bending is called non uniform bending. The maximum
elevation is produced at its mid point.
Formula
The Young’s Modulus of the material,
50
Fig.1. Young’s modulus – non uniform bending
PROCEDURE
The given beam is placed over the knife edges A and B at a particular distance say 80 cm or 70
cm in the same Horizontal level. The hanger is placed at the centre of the knife edge and a pin is also
fixed using wax as shown in fig 1.
The load in step of 50g will be loaded on the both sides of the beam using hanger and hence,
there will be the Corresponding elevation, which can be measured using the travelling Taking weight
hanger alone as the dead Load, the midpoint of the pin is focused by the microscope, ad is adjusted in
such a way that the tip of the pin Touches with the horizontal cross wire. The MSR & VSR reading on
the vertical scale are noted. Now the Weight is added in the steps of 50gm on hanger which is kept at
the centre of the beam. The reading to note Each time and the tip of the pin is made to this horizontal
cross wire and the reading are noted in the Microscope. By unloading the weight in steps of the 50gm
reading are tabulated in table. The thickness (d) and the breadth (b) of the beam are measured using the
screw gauge and vernier caliper respectively. Substituting the values in Equation, Young’s modulus can
be calculated.
51
Table. 1 To find depression ‘y’
Microscope
Reading Depression
X 10 -2
Unit X 10 -3 kg X 10 -2 m div. X 10 -2 m m
div. X 10 -2 m X 10 -2 m X 10 -2 m
1. W
2.
W+50
3.
W+100
4.
W+150
5.
W+200
52
Table .2 To find the breadth (b) of the beam using vernier caliper
-2 2
LC = 0.01 x10 m ZE = X 10 m
2
ZC = X 10 m
Main Scale Vernier Scale Correct
Observed Reading
S. No. Reading Concidence Reading
OR = MSR+(VSC X LC)
(MSR) (VSC) = OR ± ZC
-2 -2 -2
Unit X 10 m div. X 10 m X 10 m
1.
2.
3.
4.
5.
-2
Mean (b) = x10 m
Table .3 To find the thickness (b) of the beam using screw gauge
-3
LC = 0.01 X 10 m ZE = _ X10-3m
3
ZC = X10 m
Pitch Scale Head Scale
Observed Reading Correct Reading
S. No. Reading Coincidence
OR = PSR +(HSC X LC) = OR ± ZC
(PSR) (HSC)
-3 -3 -3
Unit X 10 m div. X 10 m X 10 m
1.
2.
3.
4.
5.
3
Mean (d) = X 10 m
53
CALCULATION
54
55
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
The young’s modulus of the given material of the beam (Y) = ...................................... Nm-2
56
Expt. No: Date:
AIM
APPARATUS REQUIRED
Semiconductor diode
Heating arrangement to heat the diode
Ammeter
Voltmeter
Thermometer
PRINCIPLE
For a semiconductor diode at 0K the valence band is completely filled and the
conduction band is empty and it behaves as an insulator. If the temperature is increased, some of the
valence electrons gains thermal energy greater than the forbidden energy (Eg) and it moves to
conduction band, which constitutes some current to flow through the semiconductor diode.
FORMULA:
PROCEDURE
The connections are given as shown in figure. The semiconductor diode whose band gap
want to be determined and the thermometer are immersed in oil bath in such a way that the
thermometer is kept nearby diode. The input voltage is constant (say 3-5 V), the heating mantle is
switched on and oil bath is heated up to 100oC. The heating mantle is switched off when the
temperature of oil bath reached 100 oC. The The temperature of oil bath stabilized say at 95oC. The
temperature and current through diode are noted. Allow the oil to cool and take at least ten readings for
every fall of 5oC. Tabulate the readings and using the above formula calculate the band gap of the
semiconductor.
57
A graph is plotted taking (1000/T) X axis and log Is along Y axis. A straight line obtained
as shown in model graph. By finding the slope of the straight line, the band gap energy can be
calculated using the given formula. The sample procedure can be repeated for various constant
voltages.
58
TABLE
MEASUREMENT OF CURRENT FOR VARIOUS TEMPERATURES
Temperature in Temperature in
S.No 1000/T (K-1) Is (×10-6 Amp) Log Is (Amp)
°C (K)
10
Calculation:
59
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
RESULT
The Band gap energy of a given diode is = ----------------- eV.
60
Expt. No: Date:
Analyze the Type of a Given Semiconductor Material Based on its Hall Coefficient and
Charge Density Values
Aim
To determine the Hall voltage developed across the semiconducting material and calculate the Hall coefficient and
the carrier density of the given semiconducting material.
Apparatus
Two solenoids, Constant current supply, Four probe, Digital gauss meter, Hall effect apparatus (which consist of
Constant Current Generator (CCG), digital milli voltmeter and Hall probe).
Formula
i. Hall coefficient of that material (RH)
R = VH t / (I*B) m3 C-1
I - Current (Amphere)
B - Magnetic Field (Tesla)
Procedure
O Connect ‘Constant current source’ to the solenoids.
O Four probe is connected to the Gauss meter and placed at the middle of the two
solenoids.
O Switch ON the Gauss meter and Constant current source.
O Vary the current through the solenoid from 1A to 5A with the interval of 0.5A,and note
the corresponding Gauss meter readings.
O Switch OFF the Gauss meter and constant current source and turn the knob ofconstant
current source towards minimum current.
Fix the Hall probe on a wooden stand. Connect green wires to Constant CurrentGenerator and
connect red wires to milli voltmeter in the Hall Effect apparatus
O Replace the Four probe with Hall probe and place the sample material at themiddle
of the two solenoids.
O Switch ON the constant current source and CCG.
O Carefully increase the current I from CCG and measure the corresponding Hallvoltage
VH. Repeat this step for different magnetic field B.
O Thickness t of the sample is measured using screw gauge.
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O Hence calculate the Hall coefficient RH the carrier concentration n using equationabove
equation.
1.
2.
3.
4.
5.
Mean (RH) =
62
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
i. Hall coefficient of the given semiconducting material (RH)
= carriers / m-3
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Expt. No: Date:
ULTRASONIC INTERFEROMETER
Aim
1. To determine the velocity of ultrasonic wave in the medium of different liquids using
ultrasonic interferometer.
2. To determine the compressibility of the given liquid.
Apparatus Required
Principle
High frequency generator, which excites the quartz crystal, generates the ultrasonic wave
in the experimental liquid. The liquid will now serving as an acoustical grating element. Hence,
when an ultrasonic wave passes through the ruling of gratings, successive maxima and minima
occur, satisfying the condition for diffraction.
Formulae
V=fλ ms-1
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Fig. 1. Ultrasonic Interferometer
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Description
Measuring Cell
Measuring cell shown in fig.1. has a double walled vessel with a provision to maintain
temperature constant. At the top of the cell a fine micrometer screw is fitted. With the help of the
screw, the reflector plate placed in a cell can be lowered or raised through a known distance. The
reflector and the quartz crystal (mounted at the bottom of the cell) are parallel to each other.
When the alternating field from the frequency generator is applied to the crystal, it gets into
resonant vibrations.
Procedure
The high frequency generator is switched on and the alternating field from the generator
is applied to the quartz crystal. The quartz crystal produces longitudinal ultrasonic waves. The
ultrasonic wave passes through the liquid and gets reflected at the surface of the reflector plate.
If the distance between the reflector and crystal is exactly a whole multiple of the sound
wavelength, standing waves are formed within the medium. This results in the formation of
acoustics resonance and cause a change in the potential difference at the generator which excites
the crystal. Due to this, anode current of the generator becomes maximum .The change in the
anode current can be measured from the micrometer fitted with the frequency generator.
The distance between the reflector and crystal is varied using the micrometer screw such
that the anode current decreases from maximum and then increases up to a maximum. The
distance of separation between successive maximum or minimum in the anode current is equal
to half the wavelength of the ultrasonic waves in the liquid.
By nothing the initial and final position of the micrometer for one complete oscillation
(maxima-minima-maxima), one can determine the distance moved by the parallel reflector as
shown Fig.2.
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Table. 1 Calculation of the Wavelength ( ) of the ultrasonic in the liquid
1. n
2. n+5
3. n+10
4. n+15
5. n+20
6. n+25
7. n+30
8. n+35
9. n+40
10. n+45
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Thus ‘n’ number of successive maxima or minima is recorded for a distance d. The total
distance moved by the micrometer screw is given by
or
Wavelength m
From the value of λ, the velocity of the longitudinal ultrasonic waves is calculated using the
relation,
V= fλ, where f is the frequency of the generator which is used to excite the crystal. After
determining the velocity of the ultrasonic waves in liquid is calculated using the formula
K=1/v2ρ where ρ is the density of the liquid. The experiment is repeated for different liquids.
Calculation
V=fλ ms-1
m2N-1
68
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
1. Velocity of the ultrasonic waves in the given liquid (v) = .......................................... m/s
69
Expt. No: Date:
Determine the Indentation Hardness of the Material Using Vicker’s Hardness Method
Aim
To determine the indentation hardness of Mild steel, Brass and Aluminium using
Vickers hardness testing machine.
Apparatus Required
Vickers hardness Testing Machine
Formula
Vickers Hardness Number (HV) = 0.8191F/d2 GPa
Where,
F - The force applied to the diamond (Newton)
d - Average length of the diagonal in millimetres
Simulation Procedure
Step 1 : Type of the indenter used is diamond cone indenter with square based
pyramid shape.
Step 2 : The selected specimen placed on a supporting table and height is adjusted by
rotating hand wheel.
Step 3 : The load to applied on a specimen is set by adjusting the Knob.
Step 4 : The time up to which load has to be applied for the specimen is adjusted.
The load is applied for a period 10 to 15 seconds.
Step 5 : Apply the selected load by pressing the green button for 2 or 3 seconds until
the red light glows.
Step 6 : The image of impression will now clearly visible on the screen measure the
diagonal Length in X-direction and Y- direction.
Theory
The Vickers hardness test was developed by RL. Smith and Sandland in 1921
at Vickers Ltd as an alternative to brinell hardness test method to measure the
hardness of the material. The Vickers hardness test follows the brinell principle,
70
in that an indenter of definite shape is pressed into the material to be tested, then
the load is removed and the diagonals of the resulting indentation are measured from
these the hardness number is calculated by dividing the load by the surface area of indentation.
The Vickers test is easier than other hardness tests since the required
calculations are independent of the size of the indenter and the indenter can be
used for all materials irrespective of hardness.
Principle
The indenter is made of diamond and is in the form of a square-based
pyramid with an angle of 1360 between faces. The faces of diamond indenter are
highly polished, and the point is sharp. The loads applied vary from 1 to 120 kg;
the standard loads are 5, 10, 20, 30, 50, 100, and 120 kg. For most hardness
testing, 50 kg is maximum.
The Vickers test can be used for all metals and is one of the widely used test
among hardness tests. The unit of hardness is known as the Vickers Pyramid
Number (HV) or Diamond Pyramid Hardness (DPH). The hardness number can be
calculated by the load over the surface area of the indentation.
Implementation
The angle between the two faces of diamond indenter used in Vickers hardness
test is 136 and the faces makes an angle 22 with the horizontal. The HV number is
then determined by the ratio F/A, where F is the force applied to the diamond in
kilograms-force and A is the surface area of the indentation in square millimeters. A
can be determined by the formula. by eliminating the sine term we get,= d2 / 2 sin
(136 /2)|
A = d2 / 1.8544|
HV = 0.1891(F/d2) GPa
Observation
Table 1 : Determination of Average Vickers hardness Number
Average Vickers
Load Average
diagonal Hardness
Trial Specimen Applie Vickers
length d Number
d (Kg) hardness
(mm) HV=
Number (HV)
0.8191F/d2
1.
Mild steel
2.
1.
Aluminum
2.
1.
Brass
2.
Fig. 1
72
Fig. 2
73
LABORATORY PREPARATION 10
RESULTS 5
VIVA 15
TOTAL 50
Result
Vickers hardness Number (HV) of i. Mild steel = GPa
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