Challenges in Nanomaterials Design
Challenges in Nanomaterials Design
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CONTENTS
1. INTRODUCTION 5
2. ADVANCES IN FABRICATION/PROCESSING 5
2.1 Bulk Fabrication/processing 5
2.2. Film Fabrication/processing 6
3. ADVANCES IN CHARACTERIZATION 9
3.1. Tunneling 10
3.1.1. Scanning tunneling microscopy 10
3.1.2. Scanning tunneling spectroscopy (STS) 10
3.2. Field Emission 12
3.3. Force Microscopy/spectroscopj 12
3.4. Near-jield Microscopylspectroscopj 13
4. PROPERTIES 14
4. I. Mechanical Properties 14
4.2. Surface Properties 16
4.3. Electric Transport, Electronic and Optrcal Properties 16
4.4. Magnetic Properties 17
5. CONCLUSION 17
ACKNOWLEDGEMENTS 18
REFERENCES 18
1. INTRODUCTION
When crystalline dimensions are reduced to nanometre sizes, new structures and properties
result. Because of this, considerable effort is being devoted to fabricating nanomaterials
to exploit their special properties. Here we present an overview of some aspects of these
efforts. The field of nanomaterials is very large and can be considered to include clusters
and, in fact, any material having a nanometre dimension. Because of space limitations, no
attempt has been made to provide a comprehensive overview. A recent book provided such
an overview.“’ Although the choice of materials to be discussed was of necessity subjective,
the emphasis will be on selected advances in fabricating and characterizing nanomaterials
and their properties. We begin with a discussion of advances in fabrication/processing of
nanomaterials.
2. ADVANCES IN FABRICATION/PROCESSING
2.1. Bulk Fabrication/processing
As in all areas of materials research, progress in the study of nanomaterials is dependent
on having new materials that are worthy of study. There is a need for different techniques
5
6 Progress in Materials Science
(a)
20
10
(b) 8
200 300
Time (Set)
Fig. 1. (a) An AFM image of a quantum device fabricated by use of an electrically conducting
AFM as described in the text. (b) The graph plots the conductance of four different trials of the
device, which were recorded in real time during the fabrication of the point contact. A final
conductance of 2ez/h was achieved, which corresponds to a single atomic-sized conducting channel
(conductance value of one).co
Nanomaterials Design 9
Fig. 2. SEM micrograph illustrating the uniform hexagonal array of 0.5 pm diameter channels in
a nanochannel glass.
3. ADVANCES IN CHARACTERIZATION
This section highlights the new tools that have become available for characterizing
nanostructured materials, with emphasis on the new class of analytical tools-proximal
probes. These are analytical tools in which the separation between the probe and the
sample is a few nanometres. c-61 The scanning tunneling microscope (STM) is the most
recognized example of a proximal probe. Such probes can be organized into four classes
defined by the physical principles on which they operate-tunneling, field emission, force,
and near-field. CM)The operating p rinciples and capabilities of these proximal probes are
succinctly presented below with copious references (4657)for those desiring more extensive
understanding. A Workshop on Industrial Applications of Scanned Probe Microscopy
focused on accelerating the already rapid rate at which proximal probes are being
incorporated into industrial practices.(58)
In addition to the proximal probes, other advances in analytical capability are
important. Low-energy electron microscopy with better than 10 nm resolution has been
developed by Bauer.‘j9) Ourmazd et al. (60)have combined chemical lattice imaging with
vector pattern recognition to extract near-atomic composition profiles by means of
transmission electron microscopy (TEM). Konnert and D’Antonio(61) have shown that
electron nanodiffraction patterns may be obtained with scanning transmission electron
10 Progress in Materials Science
microscopy (STEM) beams. These diffraction patterns, which change drastically when the
beam is translated a small fraction of its diameter, contain information on the structure
of the atoms within the beam to a much higher resolution than the beam dimension. The
electron nanodiffraction patterns obtained with a STEM from overlapping regions of an
Si (110) sample have been used to reconstruct 1 8, resolution images.(62) With the
high-intensity synchrotron X-ray sources, the size of crystallites necessary for X-ray
diffraction studies is in the nanometre domain (0.4 l.tm3).(63)
3.1. Tunneling
3.1.1. Scanning tunneling microscopy (STM)
Scanning tunneling microscopy is based on electron tunneling through the potential
barrier between two surfaces positioned about a nanometre apart. The exponential
dependence of tunneling current on tip-surface separation imparts the ability to image the
surface with nanometre resolution. Valuable resources for scanning tunneling concepts and
for the state-of-the-art are STM conference proceedings(45) and several books.(4657)
Tunneling contrast mechanisms at clean (UHV) metal and semiconductor surfaces are
believed to be reasonably well understood. (5’.40Moreover, tunneling is not constrained to
vacuum barriers, and can occur through dielectric fluids. Tunneling tips are utilized in the
in situ study of electrochemical phenomena, .(61*65)however, the contrast mechanisms at the
solid/liquid interface are not always apparent. The tunneling tip also can be used to image
buried interface structures in a technique called ballistic electron emission microscopy
(BEEM).‘%’
There have been several efforts at microfabricating an STM apparatus;(36,37)MacDonald
and co-workers at Cornell have demonstrated an operating microfabricated STM with
5 MHz resonant frequency and 400 nm x 400 nm scanning range.@‘)The principal drivers
to the microfabrication efforts are lithography and non-destructive evaluation (NDE) of
integrated circuits. Moreover, these microfabricated proximal probes will enable
investigation in highly constrained geometries.
An elegant example of STM imaging to assist in understanding semiconductor
surface structures at the atomic scale is presented in Fig. 3. The figure compares the
experimental and theoretical STM images of Si(5 5 12) which were used to determine
how the surface reconstructs. However, meaningful characterization of surface
features does not always require atom-level resolution. Many groups utilize the
STM for characterization of high-technology nanometre structures such as machined
surfaces,(69*‘O)fracture surfaces,(“) Vickers’ imprints, (72)X-ray optical multilayer films,(73)
microfabricated electronic device patterns,(74) optical disks(75) and microbridges in
superconductivity quantum interference devices (SQUIDS).“@
Fig. 3. The atomic-scale structure of Si(5 5 12). Models are shown of the bulk-truncated (D) and
reconstructed surfaces (C). The atoms are shaded to highlight their proposed rearrangement within
the reconstruction. The unit cell on the reconstructed surface is indicated (black box). Theoretical
(A) and experimental (B) STM images of reconstructed surface are exhibited.‘68J
the surface under investigation. There are some efforts to couple electromagnetic
spectroscopies for chemical identification and tips for localization.(7*,79)
Microscope Probe I ‘ I ” ’” ,’ x ” ” ”
Fadhesive = 2.3 nN
4. PROPERTIES
4.1. Mechanical Properties
The mechanical properties of nanostructures such as the strength are dominated by
the interfacial properties of these structures. For example, ultimate failure results from
crack nucleation and migration, which frequently takes place along interfaces. Because
of the large number of interfaces, the bulk properties of nanomaterials such as their
strength and toughness are significantly modified. (93)It is well established that materials
with smaller grain sizes (down to about 100 A) are stronger. The usual mechanisms of
plasticity and failure do not adequately represent a sample largely made up of grain
boundaries.
The strength of materials can be increased by introducing barriers or inhibitors to delay
or reduce the crack migration process. Composites which introduce barriers to slip and
crack migration within a matrix operate on this principle. Nanostructured composites offer
an increased density of inhibitors to slip crack migration, leading to enhanced mechanical
properties. A large percentage of material is in the interfacial layer when the surface layer
thickness is comparable to the crystallite size. The fraction of the material in the interface
is 3dr/r where dr is the interface thickness of a sphere with radius r.
Interfaces in crystalline solids also play a role in high-temperature creep. Since one of
the predominant mechanisms of creep, grain boundary sliding, results from migration of
grains along the grain boundary, a material that is largely made up of grain boundaries
will exhibit greater creep rates leading to superplasticity. This may or may not be desirable.
For example, ceramic nanostructures are found to be more malleable, or ‘superplastic’.
Thus, the formability of ceramic materials is enhanced with nanostructures. However,
metallic nanostructured materials, formed from metals that are malleable when they have
micrometre-sized grains, may have unacceptable levels of creep. This is especially likely
to be a problem if these metallic nanostructured materials are subjected to temperature
excursions.
Improved mechanical properties have been realized for selected nanomaterials.(94)
Direct attempts with other materials to demonstrate the improvements for structural
application have met either with prohibitive cost or technological barriers. Laboratory
techniques used to demonstrate the behavior of milligram or gram samples are of
value to show feasibility of these new materials; however, to be incorporated into
technology, sufficient quantities of material must be produced at a market-acceptable
cost.
Many investigations of the mechanical behavior of materials require bulk quantities
(pounds) of material. The problem of having small quantities of material for testing
can be mitigated somewhat by using techniques such as nanoindentation. Obtaining
quantitative information by this technique has been difficult but there has been recent
progress(95)with the use of spherical indentors. Figure 5 shows a plot of the reduced elastic
modulus obtained from nanoindentation measurements with spherical indentors on
polystyrene films as a function of film thickness. The reduced modulus is an average
Nanomaterials Design 15
0
0
0 I 8 I n I ’ 1 ’
0 200 400 600 800
Film thickness (nm)
Fig. 5. Measurements of the elastic moduli of thm. polystyrene films on Si obtained by using
spherical indentors. The reduced elastic modulus is an average modulus taking mto account the
deformation of the tip and the sample. The bulk value is indicated by the straight hne. The
deviation at low film thickness is due to tip deformation.
modulus taking into account the deformation of the tip and the modulus. One sees
quantitative agreement between the literature value and the reduced modulus determined
by the nanoindentation measurements on thicker films for which tip deformation is less
important.
By controlling the thermomechanical processing history of a sample, the grain size
may be modified to a surprising degree. A notable example of the application of this
approach is the nanostructured composite composed of COWC.‘~~’This material exhibits
a hardness that makes it attractive for machine cutting tools. Rapid solidification with
controlled processing conditions and chemical composition produces grain structures over
a wide range, from being similar to glasses to submicrometre-size crystallites. This is not
a simple process to control. Rapid cooling rates may not result in a nanostructured
material, but slow cooling rates always produce relatively large grain sizes.
The admixture of nanostructures with a matrix material (organic, metallic or ceramic)
leads to a variety of composite materials having superior properties. The discovery of
carbon tubules having nanometre dimensions’97’ indicates the vitality and continued
opportunity for the unexpected discovery of new nanometre-sized materials. These
nanotubes of carbon appear to have surprising mechanical properties. They may offer
improved material properties once researchers successfully demonstrate cost-effective
methods of synthesis and fabrication.
The ability to fabricate microstructures using lithographic techniques has been extended
to the fabrication of machines consisting of moving structures, gears. levers, etc.,
characteristic of larger devices. (98,99)
A 10 urn gear, however, takes considerable expertise
to fabricate and control. The community of micromechanical electromechanical machines
(MEMS) is demonstrating a great deal of ingenuity for fabricating mechanical devices and
sensors (on a chip) using lithographic techniques. This innovative field has demonstrated
cost-effective alternatives for a number of sensors.
16 Progress in Materials Science
-40
-50 - -13
-50 -30 -10 10 30 50
H(kOe)
Fig. 6. The longitudinal (II) and transverse (I) magnetoreslstance, p. of a granular Co,,Ag,,, film
annealed at 500 K. (From 13”.p. 368.)
5. CONCLUSION
In summary, the advancing frontier of nanoscience and nanotechnology appears to offer
exciting scientific challenges and possibilities. The rapid progress in nanomaterials is
clearly evidenced in the exponential increase in published work during the last five years.
Many related programs will be needed to maintain this progress and to investigate the
18 Progress in Materials Science
validity of hypotheses, many of which are difficult to test. Often it is only by applying
several techniques that one can understand the structure and properties of a new
nanomaterial. If present nanomaterial processing techniques are refined and new ones
developed, the interplay of new ideas in this frontier will be attractive for some time to
come.
ACKNOWLEDGEMENTS
Useful conversations with W. Tolles, R. Tonucci, and B. Shanabrook and the support of
the Office of Naval Research are gratefully acknowledged.
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