Product Information

Version 1.2
ZEISS Axio Imager 2
Your Open Microscope System for Automated Material Analysis
 Your Open Microscope System for Automated Material Analysis

› In Brief
Axio Imager 2 from ZEISS is your system platform tailored to demanding materials
analysis tasks, development of new materials as well as quality control.
› The Advantages
You always profit from crisp images and high optical performance. This applies in
› The Applications particular to sophisticated contrasting techniques, e.g. like the Circular Differential
› The System Interference Contrast (C-DIC) and polarization contrast.
Use the motorized stand to achieve reproducible illumination settings and,
› Technology and Details
consequently, constant image quality. You always obtain comparable results and
› Service
high productivity by automating your workflow. Axio Imager 2 offers a high
degree of adaptability in line with your future requirements. The stands are
open to expand and cover a wide range of applications.

Animation

2
 Simpler. More Intelligent. More Integrated.

Profit from an Open Microscope System Experience Competence in all Achieve Reliable, Reproducible Results
› In Brief
Contrasting Techniques
› The Advantages Whether in research, testing or failure analysis, Choose from a variety of contrasting techniques Stability is essential if you want to obtain good
materials microscopy faces quite various to achieve an optimum image quality for your results. You will appreciate the stable imaging
› The Applications
challenges. With Axio Imager 2 from ZEISS you dedicated applications. Examine your samples in conditions of Axio Imager 2, especially when
› The System will be able to meet and win these challenges. reflected light in brightfield, darkfield, Differential working with high magnifications and performing
Attach application-specific components and perform Interference Contrast (DIC), Circular Differential time dependent studies. Due to the motorization
› Technology and Details
e.g. particle analysis, investigate non-metallic Interference Contrast (C-DIC), polarization or of Axio Imager 2 you will achieve quick and repro-
› Service inclusions (NMI), liquid crystals or semiconductor- fluorescence contrast. For transmitted light you ducible results while you always work under constant
based MEMs. Axio Imager 2 supports the correlative can choose between brightfield, darkfield, conditions. For instance, the motorized apertures
workflow to electron microscopic investigations, Differential Interference Contrast (DIC), polarization and the illumination control, which automatically
too. or circular polarization. Minimized stray light enables adjusts the color temperature via filter wheels.
homogenous illumination. You achieve outstanding
image contrast, even at high magnifications.

20 µm

Stage insert with correlative sample holder for a big variety of Carbon fiber-reinforced polymer (CFRP), Differential Interference Appreciate the stable imaging conditions with Axio Imager 2.
specimen. Contrast (DIC); Objective: EC Epiplan-NEOFLUAR 50×/0.8

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 Expand Your Possibilities

Experience Competence in all Contrasting Techniques

› In Brief

› The Advantages Brightfield and Darkfield:

Maximum Homogeneity and
› The Applications
a Stray Light Free Image Background
› The System In brightfield Axio Imager 2 provides homoge-
neous illumination and exceptional contrast.
› Technology and Details
By minimizing disturbing stray light and reducing
› Service the longitudinal color aberration of the illumination
optics, the darkfield illumination contrast is suitable
for the most challenging samples and impresses 100 µm 100 µm
even when faced with finest structures. Switching Copper casting, brightfield. Copper casting, darkfield.
between the techniques only requires a simple Objective: EC Epiplan-NEOFLUAR 20×/0.5 Objective: EC Epiplan-NEOFLUAR 20×/0.5

turn. The motorized stands allow you to work

particularly quickly and conveniently.

C-DIC: Perfect for All Structures

Circular Differential Interference Contrast (C-DIC) contrast and quality, as it is the case in basic DIC.
is a polarization-optical technique which, in contrast With C-DIC it is simply enough to adjust the
to ordinary Differential Interference Contrast (DIC), position of the C-DIC prism to achieve best image
uses circularly polarized light. This technique has a quality whether it is for contrast and/or resolution
number of decisive advantages for the contrasting independent of sample orientation. And all this
of differently aligned object structures. The speci- is possible using one C-DIC prism for a homoge-
men no longer has to be rotated for best image neous unsurpassed quality image.

100 µm

Copper casting, C-DIC.

Objective: EC Epiplan-NEOFLUAR 20×/0.5

4
 Expand Your Possibilities

Experience Competence in All Contrasting Techniques

› In Brief

› The Advantages Brightfield Darkfield C-DIC

› The Applications

› The System

› Technology and Details

› Service

200 µm 200 µm 200 µm

Polarization Contrast Polarization with Additional Lambda Plate

Contrasting Reflected Transmitted
Technique Light Light
Brightfield ˜ ˜
Darkfield ˜ ˜
DIC ˜ ˜
C-DIC ˜
Fluorescence ˜
Phase contrast ˜

200 µm 200 µm Polarization ˜ ˜

Sample: pure aluminum; Objective: EC Epiplan-NEOFLUAR

10×/0.25, same position acquired with different contrasting
techniques

5
 Tailored Precisely to Your Applications

› In Brief Industry, Typical Applications, Typical Samples Task ZEISS Axio Imager 2 Offers
Automotive Industry • Quality control and development of compound materials • Hardware Auto Focus
› The Advantages • Quality control of welded joints • Correlative microscopy with ZEN module Shuttle & Find
• Examination of inclusions and cracks • Polarization contrast and C-DIC
› The Applications • Determination of grain sizes and non-metallic inclusions • ZEN core modules: Grains, Graphite, NMI, Multiphase
• Particle Analysis • AxioVision module: Particle Analyzer
› The System
Aviation and Space Industry • Quality control and development of compound materials • Hardware Auto Focus
› Technology and Details • Quality control of welded joints • Correlative microscopy with ZEN core module Shuttle & Find
• Examination of inclusions and cracks • Polarization Contrast and C-DIC
› Service • Determination of grain sizes and microstructure phases • ZEN core module: Grains, Graphite, Multiphase

Metal Producing and Processing Industry • Examination of inclusions and cracks • Hardware Auto Focus
• Determination of grain sizes and non-metallic inclusions • Correlative microscopy with ZEN core module Shuttle & Find
• Analysis of anisotropic materials • Polarization Contrast and C-DIC
• ZEN core module: Grains, Graphite, Multiphase, NMI
Oil, Gas and Mining Industry • Analysis of texture and microstructure • Laser Scanning Microscope LSM 900
• Analysis of pores • Correlative microscopy with ZEN core module Shuttle & Find
• Fluorescence analysis
• 2D- and 3D-Imaging

Particle Analysis • Inspection of cleanliness acc. to ISO 16232, VDA 19 • AxioVision module Particle Analyzer
• Determination of residual contamination of oil and lubricants acc.
to ISO 4406, ISO 4407, SAE AS 4059

Correlative Microscopy • Combination of information from light- and electron microscope • Correlative microscopy with ZEN core module Shuttle & Find
• Fast relocation of Regions of Interest

6
 Tailored Precisely to Your Applications

› In Brief Industry, Typical Applications, Typical Samples Task ZEISS Axio Imager 2 Offers
Non-metallic Inclusions (NMI) • Quantitative and qualitative analysis of microstructure of steel ZEN core module NMI
› The Advantages • Determination of purity of steel
• Investigation of content and distribution of non-metallic inclusions
› The Applications based on color, brightness, shape and formation
• Evaluation of inclusions with comparative diagrams
› The System • Precise identification of sulfides and oxides acc. to DIN 50602,
EN 10247, ASTM E45, ISO 4967, GB/T 10561, SEP 1571 and JIS G 0555
› Technology and Details
3D-Topography • Measurement of roughness Laser Scanning Microscope LSM 900
› Service • Detection of height differences
• Measurement of thickness of transparent coatings, surface characteristics,
color and gloss

Temperature Microscopy • Examination of temperature influence on behavior of metals, crystals, Linkam heating stages and software module Linkam
ceramics and polymers for ZEN core
• Identification of phase transformations
• Determination of temperature for phase transition
• Determination of melting point

7
 ZEISS Axio Imager 2 at Work

Aviation and Space Industry

› In Brief

› The Advantages

› The Applications

› The System

› Technology and Details

› Service

20 µm 20 µm 20 µm

Carbon fiber-reinforced polymer (CFRP), brightfield, Carbon fiber-reinforced polymer (CFRP), darkfield, Carbon fiber-reinforced polymer (CFRP), DIC,
objective: EC Epiplan-NEOFLUAR 50×/0.8 objective: EC Epiplan-NEOFLUAR 50×/0.8 objective: EC Epiplan-NEOFLUAR 50×/0.8

Metal Producing and Processing Industry

20 µm 200 µm 200 µm

Raw iron, brightfield, Aluminium, polarization, Aluminium, polarization with Lambda plate,
objective: EC Epiplan-NEOFLUAR 50×/0.8 objective: EC Epiplan-NEOFLUAR 10×/0.25 objective: EC Epiplan-NEOFLUAR 10×/0.25

8
 ZEISS Axio Imager 2 at Work

Oil, Gas and Mining Industry Automotive Industry Particle Analysis

› In Brief

› The Advantages

› The Applications

› The System

› Technology and Details

› Service

10 µm 20 µm 50 µm

Vitrinite, Cast iron, brightfield, Particle analysis, brightfield,

objective: EC Epiplan-NEOFLUAR 50×/1.0 Oil Pol objective: EC Epiplan-APOCHROMAT 50×/0.95 objective: EC Epiplan-NEOFLUAR 20×/0.5

9
 Expand Your Possibilities

Analyze Tiny Particles: Accurately and Reproducibly

› In Brief
Particle Analyzer is a milestone for your quality control. With the fully motorized light microscope
› The Advantages Axio Imager 2 you measure particles down to 2 µm.
Particle Analyzer software supports the standards for cleanliness testing ISO 16232, VDA 19, and oil
› The Applications
analysis ISO 4406, ISO 4407, and SAE AS 4059. With the system solutions from ZEISS, you ensure that
› The System the required microscope settings are always selected correctly. You receive reliable, reproducible results
nearly independent of the user carrying out the analysis. By carrying out correlative particle analyzes,
› Technology and Details
you expand the depth of information contained within your findings to include the results of element
› Service and materials characterization.

10
 Expand Your Possibilities

Correlative Automated Particle Analysis (CAPA): More Knowledge. Higher Quality.

› In Brief

› The Advantages Completely characterize residual dirt particles with As an experienced user, you can inspect the results
Correlative Automated Particle Analysis from of the combined light microscopic and electron
› The Applications
ZEISS. Detect particles with your Axio Imager 2 microscopic analysis on an interactive overview
› The System and relocate preselected particles automatically, screen. Retrieve particles at the touch of a button,
using your SEM from ZEISS. Perform an EDX automatically start new EDX analyzes, and auto-
› Technology and Details
analyisis to reveal information of their elemental matically generate a report. With Correlative Particle
› Service composition. Correlative Particle Analyzer Analyzer, your results will be available up to ten
automatically documents the results from both, times faster than first conducting an analysis with
the light microscopic and electron microscopic a light microscope and then sub-sequently with an
analysis. You receive a combined, informative electron microscope. You can systematically focus
report at the touch of a button. on potentially process-critical particles.
The complementary material characterization from
Correlative sample holder for efficient relocation of particles in
both microscopic worlds gives you added security. your ZEISS scanning electron microscope.

100 µm 100 µm 100 µm

Image of a metallic particle from a light microscope Image of the same metallic particle from an electron Overlay of the images from both systems; chemical
microscope element composition via EDX analysis; graphical EDX
overlay prepared with Bruker Esprit software

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 Expand Your Possibilities

Correlative Microscopy with

› In Brief
ZEISS Axio Imager 2: Bridging the Micro
› The Advantages and Nano World
Are you looking for a way to combine imaging
› The Applications
and analytical methods effectively?
› The System Shuttle & Find offers precisely this: An easy-to-use,
highly productive workflow from a light to an
› Technology and Details
electron microscope – and vice versa.
› Service The workflow between the two systems has never
been so easy. The precise recall of regions of
20 µm 20 µm
interest enhances productivity. Instead of wasting
valuable time searching, you now gain new
insights into your samples with a few mouse
clicks. Regions of interest, marked on one system,
you can instantely relocate on the other system.
Open up new dimensions of information in
numerous material analysis applications.
Absolutely reproducible.

20 µm 20 µm

CLEM (Correlative Light and Electron Microscopy) image of a region of interest from an aged Li-ion battery with different contrasts of
brightfield (a) and polarized light (b) in LM as well as BSE signal (c) and EDS mapping (d) in SEM.

12
 Expand Your Possibilities

Examinations in the fields of research and industrial

› In Brief
production (e.g. surface examinations of reflective,
Sensor module
› The Advantages low-contrast specimens such as metallographic
specimens and polished or textured wafers) require
› The Applications 3
a fast focusing system that ensures high precision 4

› The System levels of max. 0.3 times the objective’s depth of

field. This requirement can be easily met by com- 5
› Technology and Details
bining your Axio Imager 2 with the Auto Focus
› Service system to benefit from fast and accurate focusing
1 2
across a wide capture range of up to 12,000 µm.
6
The Auto Focus system is designed to work with
reflected light and transmitted light in brightfield,
How the Auto Focus system works: 1) LED 2) Sensor module 3) Sensor 4) Beam splitter 5) ­Objective 6) Specimen
darkfield, polarized light and DIC.

How it Works
The objective guides the structured light produced
by an LED in the Auto Focus system onto the Objective Max. capture range in µm Maximum precision of Minimum size of the object
magnification (reflective plain surface) focus position (accuracy) to be brought into focus,
specimen, with the specimen’s surface reflecting it
(~0.3 times the objective’s in µm
back. During this process, Auto Focus permanently depth of field), in µm
analyses the signal and derives the appropriate 1.25× >12000 ~170.00 ~2000
control signals for the focus drive, to bring the 2.5× >10000 ~42.00 ~1000
surface into focus. The Auto Focus sensor detects 5× >10000 ~8.90 ~500
changes and deviations in the focus position and
10× >8000 ~2.50 ~250
compensates them automatically. The Auto Focus
20× >4000 ~0.60 ~125
system comes with three different modes corre-
50× >700 ~0.25 ~50
sponding to different specimen characteristics
100× >150 ~0.20 ~25
(reflective/partially reflective/diffuse) and with
three different precision levels (precision/balance/
speed).

13
 Your Flexible Choice of Components

1 Microscope 4
› In Brief
• Axio Imager.A2m (encoded)
› The Advantages • Axio Imager.D2m (encoded, partly motorizable) 5
• Axio Imager.M2m (motorizable, TL manual) 3
› The Applications
• Axio Imager.Z2m (motorizable, TL motorized)
› The System
2 Objectives 1
› Technology and Details
Reflected Light
› Service • EC EPIPLAN
6 2
• EC Epiplan-NEOFLUAR
• EC Epiplan-APOCHROMAT
Transmitted Light
• N-ACHROPLAN
• EC Plan-NEOFLUAR
• Plan-APOCHROMAT
• C-APOCHROMAT
• FLUAR
Long Working Distance
• LD EPIPLAN
• LD EC Epiplan-NEOFLUAR 4 Cameras 6 Accessories
• Axiocam 105 • Auto Focus
3 Illumination • Axiocam 305 • Linkam heating- and cooling stages
Reflected Light • Axiocam 506 • Focus Linear Sensor
• MicroLED • Axiocam 705 • Correlative Microscopy
• VisLED • Axiocam 712
• Halogen
• HBO / HXP 5 Software
Transmitted Light • ZEN core
• MicroLED • ZEN starter
• VisLED
• Halogen

14
 System Overview

› In Brief Condenser module DIC I/0.9 with polarizer

426701-0000-000 Specimen holder for slide 76x26 mm
Condenser module DIC II/0.9 with polarizer Mechanical stage 75x50 R; SCD Mechanical stage 75x50 R 120 mm for one-hand operation
426702-0000-000 432018-9002-000 with hardcoat anodized surface 432301-0000-000
in addition: 432012-9902-000 Specimen holder 76x26 mm,
› The Advantages Condenser module DIC III/0.9 with polarizer
426703-0000-000 Display unit SCDplus one-hand operation for immersion
Polarizer D for condensers 0.8 and 0.9 432035-9111-000 432308-0000-000
427710-9050-000 Ergo specimen holder for 76x26 mm slides,
for one-hand operation

› The Applications Specimen holder D Pol

453563-0000-000
432309-0000-000
Specimen holder plate for supporting slides
Achromatic-aplanatic 432333-9010-000
universal condenser 0.9 H D Ph DIC, mot. Mechanical stage 75x50 R basic,
424201-9902-000 Specimen holder A Pol for Axio Imager,
› The System 453564-0000-000 with hardcoat anodized surface
432035-9021-000 Specimen holder, reflected light,
Achromatic-aplanatic for mechanical stage 75x50
universal condenser 0.9 H D Ph DIC Object guide Pol 45x25 mm, 432302-0000-000
424200-9901-000 with click stop
› Technology and Details 453560-0000-000

Achromatic-aplanatic
pathology condenser 0.9 H mot. Mechanical stage 75x50/240° R Converter CAN-USB Rev.2

› Service 424220-9901-000 with hardcoat anodized surface

432001-9902-000
432909-9901-000
(for use of CAN stages
with manual stands)
Achromatic-aplanatic Rotary stage Pol 360°,
pathology condenser 0.9 H 45° click stops switchable,
424219-9901-000 for Axio Imager
432007-0000-000

Achromatic-aplanatic universal Mechanical stage 75x50 R

condenser 0.9 H Pol with hardcoat anodized surface Mounting frame
424212-9901-000 432002-9902-000 for Specimen holder
Mechanical stage, CorrMic MAT; 96x86
Condenser module DIC II/1.4 with polarizer right transmitted/reflected light, 432335-9160-000
426708-0000-000 105x105/85 mm
Condenser module DIC III/1.4 with polarizer 432018-9020-000
426709-0000-000
Mechanical stage, right transmitted/reflected light,
105x105/85 mm SCD
Achromatic-aplanatic 432018-9010-000 Mechanical stage 75x50 L
condenser 1.4 H D Ph DIC Display unit SCDplus with hardcoat anodized surface
424208-0000-000 432035-9110-000 432006-9902-000

Condenser module DIC 0/0.8 with polarizer Condenser, LD achromatic 0.8 H DIC
426704-0000-000 424206-9901-000 Adapter plate for Scanning stage 225x85; PIEZO Mechanical stage 75x50 mot.; CAN
Condenser module DIC I/0.8 with polarizer mounting frames 432023-9901-000 432024-9903-000
426705-0000-000 Glass insert plate 432310-0000-000
Condenser module DIC II/0.8 with polarizer 432312-0000-000
426706-0000-000 Metal insert plate
Polarizer D for condensers 0.8 and 0.9 432313-0000-000 Joystick XY; CAN
427710-9050-000 Mounting frame Stage controller XY PIEZO; USB 432903-9011-000
for slide 76x26 432901-9903-000
432315-0000-000 Joystick XY for stage controller Trackball XY; CAN
Achromatic LD condenser Achromatic LD condenser Stage insert 160x116 mm with PIEZO/MCU 2008 432903-9000-000
0.8 H D Ph DIC 0.8 H D Ph DIC, mot. holder for 4" wafer, rotatable 432903-9902-000
Electronic
424204-9901-000 424209-9901-000 432322-9010-000
coaxial drive; CAN
Mounting frame for
432904-9901-000
specimen holder CorrMic MAT; 96x86
Darkfield attachment 1.2-1.4 Oil 432335-9080-000
424218-0000-000 Adapter plate CorrMic
with SEM interface; 160x116
432335-9181-000 Scanning stage 130x85; PIEZO
432022-9902-000

Scanning stage 130x85 DC

Large-field DF slider Achromatic-aplanatic universal 432032-9901-000
for 2.5x-5x condenser 0.9 H/0.8-0.9 DF in addition: Mechanical stage 75x50
424215-0000-000 424216-9901-000 mot. standard; CAN
432026-9000-000

Joystick XY Scanning stage 130x85 STEP

for stage controller 432033-9902-000
PIEZO/MCU 2008 Stage controller XY MCU 2008 in addition:
Slider with phase stop Ph1 432903-9902-000 432929-9000-000
for condenser 0.9 H/0.4 LD
426716-9000-000 Achromatic-aplanatic
Slider with phase stop Ph2 condenser 0.9 H/0.4 LD
for condenser 0.9 H/0.4 LD 424221-9000-000
426716-9010-000
Electronic coaxial Stage controller
Joystick XY; CAN Trackball XY; CAN drive; CAN XY STEP SMC 2009
432903-9011-000 432903-9000-000 432904-9901-000 432929-9011-000

15
 System Overview

› In Brief
Eyepiece insert plate Tube carrier multidiscussion for 2 tubes,
on request connect linear left/right

› The Advantages Eyepiece PL 10x/25 Br. foc.

425145-9020-000
Tube carrier multidiscussion for 1 tube,
444034-9000-000 arm left deflection, connect Tube-lens 1.25x
Eyepiece E-PL 10x/25 Br. foc. 425145-9030-000 for Axio Imager
444234-9902-000 Tube carrier multidiscussion for 1 tube, 425303-0000-000
› The Applications Eyepiece E-PL 10x/23 Br. foc.
444235-9901-000
arm right deflection, connect
425145-9040-000
Tube-lens 1.6x
for Axio Imager
Auxiliary microscope, Eyepiece PL 10x/23 Br. foc. Tube carrier multidiscussion for 2 tubes, 425304-0000-000
d=30 444036-9000-000 end panel linear, l/r Tube-lens 2.5x
444830-9902-000 425145-9050-000 for Axio Imager
› The System Tube carrier for 1 Co-observer, light-intensive,
end panel, left
425305-0000-000
Tube- lens 4.0x
425145-9060-000 for Axio Imager
Comfortable binocular Ergotube 425307-0000-000
8-33°/23, 50 mm high,
› Technology and Details reversed image
425518-9010-000 Note:
For tube lens turrets the eyepieces
PL 10x/25 Br. foc or PL 10x/23 Br. foc

› Service have to be used.

Note:
The tubes
425500-0000-000, to be equipped at most
425502-0000-000, with three tube lenses:
425503-9901-000, Center component for multidiscussion, 5-position tube-lens turret, cod.,
Binocular tube 30°/23, Binocular phototube 30°/25 mot. Binocular tube 30°/25, 425506-0000-000, for tube carrier left and right with Bertrand system
reversed image, Axio Imager with two camera ports 60N reversed image 425515-0000-000, 425141-9901-000 425309-9901-000
425520-9060-000 425504-0000-000 425500-0000-000 425518-9010-000, or 5-position tube-lens turret mot.
can be combined with a tube lens turret Center comp. co-observation, with Bertrand system
or the center component for multidiscussion for tube carrier light-intensive, left 425302-9901-000
equipment. 425143-9000-000

Binocular phototube 30°/23 (50:50), Binocular phototube 30°/25 Binocular phototube 30°/25
reversed image, Axio Imager (100:0/30:70/0:100), reversed image (30vis:70doc), reversed image
425520-9070-000 425506-0000-000 425501-0000-000

Reflector module C-DIC/TIC ACR P&C

for reflected light
424929-9903-000
C-DIC prism for modulator turret
426921-0000-000
C-DIC prism for modulator turret
426922-0000-000
TIC prism for modulator turret
for EC EPN 5x-100x
426923-9901-000
Binocular Ergophototube 20°/23 MAT Binocular phototube 15°/25 Binocular phototube 30°/25
(100:0/0:100), upright image (100:0/0:100), upright image (100:0/30:70/0:100), reversed image
425514-0000-000 425503-9901-000 425502-0000-000

4-position modulator turret

for circular DIC/TIC DIC slider
424703-0000-000 on request
4-position modulator turret
mot. for circular DIC/TIC
424704-9901-000 for transmitted light: 6-position objective nosepiece, 7-position objective nosepiece, HD M27 cod.
Compensator mount 6x20 HD DIC M27 cod. 424501-0000-000
424705-0000-000 424504-0000-000 7-position objective nosepiece, HD M27 mot.
for reflected light: 6-position objective nosepiece, 424502-0000-000
Analyzer slider fixed for Compensator mount 6x20 HD DIC M27 mot. 6-position objective nosepiece, Pol M27 cod.
transmitted light, 6x20 with DF stop 424505-0000-000 424503-0000-000
Binocular phototube Pol 15°/23 Comfortable binocular Ergophototube Binocular phototube 6-25°/23 433605-0000-000 424706-0000-000 6-position objective nosepiece,
(100:0/0:100), upright image 15°/23 (50:50), upright image (100/100) HD DIC M27 mot. ACR
425517-0000-000 425515-0000-000 425518-9020-000 424507-0000-000
Antiglare screen
452163-0000-000

Quartz depolarizer with tube-lens Quartz depolarizer with tube-lens Objective ring ACR for objective sleeve cylindrical short
for tubes Axio Scope.A1 for tubes Axio Imager We recommend the following 424508-0000-000
428106-9000-000 428106-9030-000 components for easy cleaning of Objective ring ACR for objective sleeve cylindrical long
(not in use with 425514 and 425517 oil immersion on material samples: 424511-0000-000
Immersol M, Oiler 20 ml Objective ring ACR for objective sleeve conical short
444965-0000-000 Objectives M27 424509-0000-000
Immersol M, Bottle 100 ml ICS-Objectives Objective ring ACR for objective sleeve conical long
444966-0000-000 on request 424510-0000-000

16
 System Overview

› In Brief
Excitation filter wheel Workstation with Axio Vision / ZEN Software
(8 positions) mot. Illuminator microLED
for 25 mm filters; CAN 423053-9071-000
› The Advantages 452356-0000-000
Camera with C-mount Camera with SLR-bayonet Camera with C-mount

Switching mirror Attachment lamp VIS-LED

for 2 illuminators with collector
› The Applications 447230-9903-000
Switching mirror mot.; CAN
423053-9030-000
Adapter video Camera adapter T2-C 1" 1.0x T2-adapter for SLR-camera Camera adapter
447229-0000-000 60 C 1/3" 0.4x 426104-0000-000 e.g.: 60N-C 1" 1.0x
456108-0000-000 (without fig.) Camera adapter T2-C 1" 1.0x; T2-adapter for Canon EOS 426114-0000-000
Camera adapter adjustable (EF bayonet)
› The System Reflected-light illuminator
for FL and HD for Axio Imager
HAL 100 illuminator
with quartz collector
60N-C 2/3" 0.5x
426112-0000-000 (without fig.)
426105-0000-000 (without fig.) 416013-0000-000

423600-0000-000 423000-9901-000 Camera adapter

Diffusion disk for Shutter, standard 60N-C 2/3" 0.63x
reflected-light illumination, (included in A2m, D2m) 426113-0000-000 (without fig.) Camera adapter
› Technology and Details switchable
423632-0000-000 Reflected-light illuminator mot.
Camera adapter T2-T2 DSLR 1.6x
60N-C 1" 1.0x 426115-0000-000
(included in A2m, D2m, for FL and HD for Axio Imager 426114-0000-000 (without fig.)
M2m, Z2m) 423601-9901-000 Camera adapter

› Service Shutter, standard

(included in M2m, Z2m)
Adapter 60N-T2 1.0x
426103-0000-000
T2-T2 SLR 2.5x
426116-0000-000
Magnification changer 4x,
switchable
60N-60N
426137-9000-000

HBO 100 illuminator with Power supply unit for HBO 100,
lamp mount and collector 90...250 V, 50...60 Hz, 265 VA Module 0.5x
Camera path deflection 423010-0000-000 432604-9902-000 We recommend these components for 426137-9010-000
on the left side, interface 60N Auto Focus equipment for Sideport 60N HBO 100 illuminator, self-adjusting temporary image quality review using an Module 1.6x
425103-0000-000 425131-9000-000 and with lamp mount and collector Slider with 100% mirror eyepiece: 426137-9020-000
Camera path deflection Installation kit for Autofocus equipment 423011-9901-000 for double adapter Module 2.5x
on the left side, mot., interface 60N on Sideport Axio Imager.Z2 426141-9011-000 426137-9030-000
425104-0000-000 425131-9030-000 Module 4.0x
Shutter high speed, reflected-light 426137-9040-000
for Axio Imager M and Z Adapter 60N for microscope camera, Module 5.0x
Note: 423622-9901-000 Illuminator microLED Slider with d=30 mm 426137-9050-000
These components can only be used alternatively and not in combination with a 423053-9071-000 beam splitter mount 426101-0000-000
Bertrand lens slider or analyzer slider. Shutter, standard for double adapter (Eyepiece additionally required)
(included in reflected-light 426141-9021-000
illumination) and
Attachment lamp Beam splitter 50%, 26x36 mm
VIS-LED with collector Double Adapter Duolink 446310-0002-000
423053-9030-000 60N - 2x60N man.
426143-9000-000 Double adapter 60N-2x 60N
(further information with slider mount
see price list 40.24.00) 426141-9902-000 Tube module 60N, 100 % to the camera,
HAL 100 illuminator reversed image
for camera path deflection with quartz collector 425518-9000-000
required: 423000-9901-000
Beam splitter 50% Transmitted-light illumination
for camera deflection, for Axio Imager 2
34x46x2.2 mm 423900-9901-000 alternatively, Auxiliary microscope,
425110-9120-000 Transmitted-light illumination HAL 100 illuminator d=30
or mot. for Axio Imager 2 with collector: 444830-9902-000
Path deflecting mirror 100% 423901-9902-000
for camera deflection, Shutter for transmitted-light
34x46x4 mm illumination
425110-9110-000 423621-9901-000 Binocular
phototube
see tubes overview Illumination system Colibri.2
LED illuminator 423052-9501-000
for transmitted light consisting of:
423904-9902-000 Lamp module,
control unit and
optional: Adjusting aid for HBO/XBO lamps Optical adapter control panel
Fine drive knob with scala, changeable for Axio Imager for LED transmitted-light illumination
430051-9000-000 423631-9901-000 423903-0000-000
Fine drive disk, flat with scala for Axio Imager 2, Polarizer slider for reflected light,
changeable 360° rotatable for Axio Imager
430051-9010-000 427704-9901-000 MTB 2004 software
PC included in
Axio Vision software
Axio Imager.A2m microscope stand Power supply, external on request
430015-9901-000 for HAL 100 and LED lamps,
Axio Imager.D2m microscope stand CAN connect Dust protection Set M
Note: with Light Control man. 432610-9040-000 434303-0000-000
Always included in 430011-9902-000 CAN-bus cable 2.5 m Dust protection Set L
A2m and D2m stands: Axio Imager.M2m microscope stand 457411-9011-000 434304-0000-000 Bertrand lens slider 12x46
Focusing drive man. with Z-drive mot. and TFT monitor 453671-0000-000
Always included in M2m stand: 430014-9902-000 4-position CAN hub Protection cap set Note:
Focusing drive mot. basic Axio Imager.Z2m microscope stand for microscope stands Power supply, external 434302-0000-000 These components cannot be used in combination
Always included in Z2m stand: with Z-drive mot. and TFT monitor with CAN interface HAL 100 and LED lamps (included in 434303-0000-000 with the camera path deflection (left side installation),
Heavy duty focusing drive motorized 430010-9902-000 432927-9050-000 (included in M2m, Z2m) and 434304-0000-000) the autofocus equipment or the analyzer slider.

17
 Technical Specifications

› In Brief

› The Advantages

› The Applications

› The System

› Technology and Details

› Service

Stand Axio Imager.A2m Axio Imager.M2m Axio Imager.D2m Axio Imager.Z2m

Contrast Manager ˜ ˜
Light Manager ˜ ˜ ˜ ˜
TFT-Display ˜ ˜
Remote Control š š
(Docking Station) (Docking Station)

˜ Included
š Optional

18
 Technical Specifications

› In Brief Dimensions (width x depth x height)

Axio Imager stand, manual with HBO 100 approx. 300 mm × 721 mm × 505 mm
› The Advantages
Axio Imager stand, motorized with HBO 100 and TFT display approx. 390 mm × 721 mm × 505 mm

› The Applications
Weight
› The System Axio Imager, manual/motorized (dependent on equipment) approx. 18 to 40 kg

› Technology and Details Ambient Conditions Transport (in packaging):

Permissible ambient temperature -40 to +70 °C
› Service

Storage
Permissible ambient temperature +10 to +40 °C
Permissible relative humidity (no condensation) max. 75% at 35 °C

Operation
Permissible ambient temperature +10 to +40 °C
Permissible relative humidity max. 75% at 35 °C
Atmospheric pressure 800 hPa to 1060 hPa
Altitude max. 2000 m
Pollution degree 2

19
 Technical Specifications

› In Brief Operating data for coded Axio Imager, equipped with an integrated power supply or motorized Axio Imager using the VP232-2 external power supply
Operating environment Closed room
› The Advantages
Protection Class I

› The Applications Protection Type IP 20

Electrical safety in compliance with DIN EN 61010-1 (IEC 61010-1) including CSA and UL directives
› The System
Overvoltage category II
Radio interference suppression in accordance with EN 55011 Class B
› Technology and Details
Noise immunity in accordance with DIN EN 61326 -1
› Service Line voltage for integrated power supply 100 to 127 and 200 to 240 V ±10 %
Change of line voltage setting is not required!
Line voltage for external power supply VP232-2 100 to 240 V ±10 %
Line frequency 50/60 Hz
Power consumption of coded Axio Imager max. 260 VA
Power consumption of Axio Imager, motorized max. 190 VA
LED illuminator 400 to 700 nm, peak at 460 nm
Attachment lamp VIS-LED 400 to 700 nm, peak at 460 nm

Transformer HBO 100

Operating environment Closed room
Protection Class I
Protection Type IP 20
Line voltage 100 VAC ... 240 VAC
Line frequency 50/60 Hz
Power consumption when HBO 100 is used 155 VA

Fuses in Accordance with IEC 127

Axio Imager microscope stand, manual T 5.0 A/H / 250V, 5×20 mm
Power supply VP232-2 for Axio Imager, mot. T 4.0 A / 250V, 5×20 mm
Transformer HBO 100 T 2.0 A/H, 5×20 mm

20
 Technical Specifications

› In Brief Light Sources

Halogen lamp 12 V/100 W
› The Advantages
Adjustment of light source continuous, approx. 0.7 to 12 V

› The Applications Mercury vapor short-arc lamp HBO 103 W/2

Power consumption of HBO 103 W/2 100 W
› The System
Axio Imager, coded
› Technology and Details
Stand with manual stage focusing Coarse drive approx. 2 mm/revolution

› Service Fine drive approx. 1/10 gear transmission ratio

Lifting range max. 25 mm
Height stop mechanically adjustable
Achromatic-aplanatic universal condenser 0.9 H D Ph DIC for objective magnifications <10× front lens 0.9 swiveled out
with swivel-type front lens, achromatic-aplanatic 0.9 DIC
for objective magnifications ≥10× front lens 0.9 swiveled in 8 position turret disc
Objective change Manually via 6-position or 7 position nosepiece, HD or HD DIC M27
Change of method modules Manually via 6-position reflector turret

Axio Imager, motorized

Stand with motorized stage focusing Mean step size of stepper motor 25 nm (Axio Imager.M2)
10 nm ±10 (Axio Imager.Z2)
Quick lowering/lifting of stage 10 mm
Lifting range 25 mm
Height stop electronic
Focusing speed variable
Achromatic-aplanatic universal condenser 0.9 H D Ph DIC, for objective magnifications <10× front lens 0.9 swiveled out
mot. with swivel-type front lens, achromatic-aplanatic 0.9 DIC
for objective magnifications ≥10× front lens 0.9 swiveled in 8 position turret disc
Objective change Manually or motorized via 6 position or 7 position nosepiece
Change of method modules Manually via 6 position reflector turret
Motorized via 6 position or 10 position reflector turret
Manually/motorized via DIC or C-DIC modulator turret
High-performance focus for scanning stages Applicable for specimens weighing up to 5 kg

21
 Count on Service in the True Sense of the Word

Because the ZEISS microscope system is one of your most important tools, we make sure it is always ready
› In Brief
to perform. What’s more, we’ll see to it that you are employing all the options that get the best from
› The Advantages your microscope. You can choose from a range of service products, each delivered by highly qualified
ZEISS specialists who will support you long beyond the purchase of your system. Our aim is to enable you
› The Applications
to experience those special moments that inspire your work.
› The System
Repair. Maintain. Optimize.
› Technology and Details
Attain maximum uptime with your microscope. A ZEISS Protect Service Agreement lets you budget for
› Service operating costs, all the while reducing costly downtime and achieving the best results through the improved
performance of your system. Choose from service agreements designed to give you a range of options and
control levels. We’ll work with you to select the service program that addresses your system needs and
usage requirements, in line with your organization’s standard practices.

Our service on-demand also brings you distinct advantages. ZEISS service staff will analyze issues at hand and
resolve them – whether using remote maintenance software or working on site.

Enhance Your Microscope System.

Your ZEISS microscope system is designed for a variety of updates: open interfaces allow you to maintain
a high technological level at all times. As a result you’ll work more efficiently now, while extending the
productive lifetime of your microscope as new update possibilities come on stream.

Profit from the optimized performance of your microscope

system with services from ZEISS – now and for years to come.

>> www.zeiss.com/microservice

22
07745 Jena, Germany
[email protected]
www.zeiss.com/axioimager-mat
Carl Zeiss Microscopy GmbH

Not for therapeutic use, treatment or medical diagnostic evidence. Not all products are available in every country. Contact your local ZEISS representative for more information.
EN_42_011_031 | CZ 11-2019 | Design, scope of delivery, and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbH