HW 1
HW 1
9) Walter A. Shewhart was considered the father of statistical quality control and the PDSA (Plan-Do-
Study-Act) cycle. In 1924, he developed the control chart, a fundamental tool for statistical process
control. He introduced the concepts of common cause and special cause variation in processes. He
developed the Shewhart cycle for learning and improvement, which W. Edwards Deming later adapted
into the PDSA cycle. He is described as one of the most influential figures in the field of quality
management.
16 the Malcolm Baldrige National Quality Award is given annually to recognize U.S. organizations for
) performance excellence in five categories: manufacturing, service, small business, health care, and
education.
23 Reliability can indeed be a dimension of service quality. Eight dimensions of quality proposed by David
) A. Garvin, which apply to both products and services. Specifically for reliability: Reliability is defined as
“The consistency of performance over time and probability of failure”. While this definition is given in
the context of products, the concept can be applied to services as well. For a service, reliability would
refer to how consistently the service is performed and how often it fails to meet customer expectations.
We can infer that reliability in a service context could involve:
1. Consistently delivering the service as promised
2. Performing the service correctly the first time
3. Providing the service at the designated time
4. Minimizing errors or failures in service delivery
So, in summary, while the file focuses more on product quality, the reliability dimension can be
extended to service quality as a measure of how dependably and accurately the promised service is
performed over time.
28 The following example is from my research (publishing scientific research article) on the topic of
) semiconductor manufacturing. In the semiconductor manufacturing industry, excessive variability in
chip production can lead to unacceptable performance. For example, if there is too much variation in
the thickness of silicon wafers or in the precision of etching processes, it can result in chips with
inconsistent performance characteristics. Some chips may run too hot, consume too much power, or
have slower processing speeds than specified. This variability can cause entire batches of chips to fail
quality control tests, leading to lower yields, increased costs, and potentially defective products
reaching consumers. Chip manufacturers like Intel and TSMC invest heavily in reducing process
variability to ensure consistent, high-quality chip performance that meets strict specifications. This
example illustrates how excessive variability in a manufacturing process can directly impact the
performance and quality of the final product, potentially making it unacceptable for use. Tight control of
variability is critical in high-precision industries like semiconductor manufacturing to maintain product
quality and reliability.