Network and Data Center

Solution Brochure
Dear Customer, Find out about
With the progressive evolution of optical and electrical data transmission, it is a In-depth, end-to-end test solutions and product workstations, spanning from
great pleasure to continuously support you personally working on these new electrical to optical, optical to electrical and physical layer to protocol test:
challenges. We are pleased to take this opportunity of presenting our new • 1.6T and 800G R&D test solutions for optical and electrical
published brochure, introducing Keysight’s “Latest” products and solutions that characterization of Tx/Rx
will be a major contributor in accelerating innovations to connect and secure the • Terabit Research – Beyond 2T Coherent Optical
world. • Data Center Transceiver Design & Test - 800G Layer 1 Test with
We are exceptionally thrilled to introduce Keysight’s latest Arbitrary Waveform FEC
Generator to enable signals well beyond 160GBaud.
• Integrated Photonics - Optical Parametric Test
• High Speed Multimode Optics - 100G per lane Multimode
• Automated test solution for coherent optical transmit and
Our Highlights in this issue receive devices - e.g., standard conform for OIF-400ZR-01.0
• New AWG for 160 GBaud signal generation and beyond
• 1.6T and 800G optical and electrical transmission based on 200G and
Our technical experts and application engineers are available to discuss
100G serial interfaces is developing and requires test of the Forward Error
Correction (FEC) to run error free. challenges in R&D, design verification and for scalable and fully
automated production processes.
• Following the IEEE 802.3db release multimode transmission expands to
100G per lane Reach out without hesitation to your local Keysight representative
• Integrated Photonics is enabling new optical design-ins and require
comprehensive testing at wafer level as well as on singulated dies
• Verifying compliance for new standards requires careful considerations to
test setup and execution as design margins continue to decrease.

Dr. Joachim Peerlings

Vice President and General Manager
Network & Data Center Solutions

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Table of Contents
New Product Introduction Addressing 160 GBaud and Beyond .................................................................................................... 5

M8199B 256 GSa/s Arbitrary waveform generator ..................................................................................................................................................................... 5

Design ................................................................................................................................................................................................. 6

PAM4 system analysis .................................................................................................................................................................................................................. 6

PathWave advanced design system (ADS)................................................................................................................................................................................... 7
Data Center Transceiver Test ............................................................................................................................................................ 8

800G R&D test solutions for optical and electrical characterization of Tx/Rx............................................................................................................................. 8
DCA-X performance ..................................................................................................................................................................................................................... 8
N1060A Precision waveform analyzer ......................................................................................................................................................................................... 9
N1046A 75/85/100 GHz 1/2/4 port remote sampling heads module ......................................................................................................................................... 9
N1032A/B 90/120 GHz Single/dual channel optical module ..................................................................................................................................................... 10
G800GE - 800GE Layer 1 BERT + KP4 FEC Multiport .................................................................................................................................................................. 11
FEC- proofed designs ................................................................................................................................................................................................................. 12
M8040A 64 GBaud High-performance BERT ............................................................................................................................................................................. 13
M8050A 120 GBaud High-performance BERT ........................................................................................................................................................................... 14
High speed multimode optics solutions..................................................................................................................................................................................... 15
100/400GE Optical receiver stress test solution – ensuring repeatable and reproducible results ........................................................................................... 17

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Integrated Photonics and Optical Parametric Test ....................................................................................................................... 18

Silicon photonics - efficient wafer level test ................................................................................................................................................................................. 18

Integrated photonics test solution ............................................................................................................................................................................................ 19
Parametric photonic test ........................................................................................................................................................................................................... 20
High frequency parametric testing for silicon photonics and electro-optic device testing....................................................................................................... 23
N5291A 900 Hz to 120 GHz PNA Millimeter-wave system ........................................................................................................................................................ 24
Coherent Transceiver Test .............................................................................................................................................................. 25

220 GBaud R&D test system for coherent optical transmissions .............................................................................................................................................. 25
Testing the coherent 400G ecosystem ...................................................................................................................................................................................... 26
Automated test solution for coherent optical transmit and receive devices ............................................................................................................................ 27
Terabit Research – Precision tests at terabit speeds ................................................................................................................................................................. 29
UXR1104A Infiniium UXR-series oscilloscope: 110GHz, 4 channels .......................................................................................................................................... 29
M8199A 128/256 GSa/s Arbitrary waveform generator ........................................................................................................................................................... 30
M8199B 256 GSa/s Arbitrary Waveform Generator ................................................................................................................................................................. 32
KeysightCare – Support. Elevated. ................................................................................................................................................. 33

References ........................................................................................................................................................................................ 34

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New Product Introduction Fastest AWG on the market

Addressing 160 GBaud and The Keysight M8199A AWG uses an external passive coupler to interleave
two 128 GSa/s channels to achieve signal generation up to 256 GSa/s.
Beyond The M8199B AWG follows the same interleaving approach as the
M8199A, but the passive combiner and RF amplifier are integrated into a
M8199B 256 GSa/s Arbitrary waveform single package, greatly improving the achieved bandwidth and signal-to-
noise ratio (SNR).
generator
The Keysight M8199B AWG offers you performance never seen before. It
has a built-in frequency and phase response calibration, which ensures
generating the most accurate signal possible. It is ready to use out-of-the-
box, which means you spend less time setting up your test equipment and
more time running your tests. Brand-new Keysight custom technology
ensures highest signal quality and maximum flexibility.

Support for leading-edge applications

The M8199B AWG allows you to generate signals up to 256 GSa/s with
Key features & specifications sufficient signal integrity, perfect for applications like 1.6 Tb/s coherent
transmissions or beyond 224 Gbit/s/lane intensity-modulation/direct-detect
• Up to 256 GSa/s for 2 channels in a 2-slot AXIe module (IM/DD) transmissions.
• 8-bit resolution
The M8199B AWG is the unique solution in the market allowing R&D
• Analog bandwidth >80 GHz (enabling 160 GBaud serial data
teams in the telecom and datacom industry, developing components,
generation)
prototypes or products for coherent and IM/DD optical transmission
• High-voltage output amplifier enables amplitudes > 3 Vpp, diff systems operating at data rates up to 160 GBaud and beyond.
• 1 MSa/channel memory
The M8199B AWG provides a stimulus signal with flexible modulation
• Synchronize up to 8 channels (across 4 modules)
schemes (NRZ, PAM-n, QPSK, QAM-n). In addition, it allows you to apply
Helping you develop your innovation offline customized digital-signal processing before loading the signal into
the memory of the AWG.
Keysight knows you are pushing boundaries and understands that your
innovation requires next generation test equipment. That’s why we
continually develop solutions that keep up with the latest technology waves
and applications. The M8199B Arbitrary Waveform Generator (AWG) is the
latest example of this commitment.
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Design Facing today’s high-speed design challenges.

When digital signals reach multigigabit speeds, the unpredictable becomes

PAM4 system analysis the norm. Keysight’s PathWave ADS will help you cut through these
challenges by state-of-the art high speed digital design simulation
Keysight has a full PAM4, E-O-E (Electrical – Optical – Electrical) end-to- solutions. PathWave ADS delivers industry leading time-, frequency-
end link simulation example in PathWave ADS 2020, including modeling of domain, and channel simulation technologies, within a cohesive design-to-
the optical channel using VPIphotonics’ VPItransmissionMaker™. The test workflow, to help you overcome signal integrity and power integrity
connected solution to FlexDCA feature allows fast and accurate insights of issues for SerDes and memory interface designs, while ensuring the
PAM4 measurements and comparison with measured results including design for compliance.
transmitter dispersion and eye closure quaternary (TDECQ).

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PathWave advanced design system Visualize CTLE transfer functions with poles and zeros (Many preset
CTLE values are provided for 802.3bs, USB, MIPI, PCIe Gen3, Gen4 and
(ADS) Gen5, etc)
With PathWave ADS and other tools from Keysight you can: • IBIS-AMI Back Channel Interface – enables automatic negotiation of
EQ settings between Tx and Rx models
• Analyze complete serial link and memory interface systems
• Analyze eye diagram, eye mask, BER etc. for PAM-n (PAM3, PAM4,
PAM8, PAM16, etc) signals
• Simulate AMI (Algorithmic Modeling Interface) models from any
SerDes vendors and calculate ultra-low BER in seconds not days
using the statistical Channel SimulatorUse measured waveform for Tx
AMI model
• Handles frequency-domain S-parameter models accurately in time-
domain and channel simulations, using patented causality and
passivity algorithmsAccurate EM-based PCB channel modeling and
transmission line impedance scanning
• Perform COM (Channel Operating Margin) calculation for normative
channel compliance
• Connect to FlexDCA (Sampling scope) to process the simulated
waveforms for advanced PAM4 measurements such as TDECQ and
jitter analysis. Also connects to Infiniium (real-time scope)

CTLE Interface

Flex DCA Software

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Data Center Transceiver Test DCA-X performance
800G R&D test solutions for optical and
electrical characterization of Tx/Rx
Keysight’s total solution approach
Keysight continuously make new addition to its 400G/800G R&D
characterization portfolio. This will offer designers and R&D engineers
clock recovery, equalization and error detection capabilities at emerging
data-rates.

Test equipment and solutions for optical and electrical characterization of

Tx/Rx :

• UXR1102A Infiniium series 110GHz Realtime Oscilloscope The N1000A DCA-X wide-bandwidth sampling oscilloscopes provide
• N7005A O/E converter for UXR accurate and precise measurements of high-speed digital designs from 50
• M8040A or M8050A Bit Error Tester (BERT) Mb/s to 224 Gb/s.
• M8199A/B or M8194A Arbitrary Waveform Generator (AWG) Applications include:
• N1000A DCA-X Wide-Bandwidth Oscilloscope Mainframe
• Optical transceiver design and production tests
• N1032A 120 GHz optical plug-in module
• Electrical ASIC/FPGA/IC design and characterization
• N1046A 75/85/100 GHz 1/2/4 port remote sampling heads module
• Serial bus characterization, measurements and trouble-shooting via
• N1060A precision waveform analyzer TDR/TDT and S-parameter measurements of channels, cables and
• G800GE OSFP/ QSFP-DD test system PCBs.
Keysight offers wide range of solutions to target on your applications that
can be combined with or used alongside the DCA-X, DCA-M, stand-alone
clock recovery and N1010A FlexDCA software.

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N1060A Precision waveform analyzer N1046A 75/85/100 GHz 1/2/4 port remote
sampling heads module

N1060A Precision Waveform Analyzer with N1000A DCA-X

Key features & functions

Gain margin with high instrument performance: bandwidth to > 90 GHz, N1046A | 75GHz | 85GHZz | 100GHz | 1 Port | 2 Port | 4 Port | Remote sampling
residual jitter as low as 50 fs and adjustable clock recovery peaking & loop heads for 86100D DCA-X
BW.
Key features
Reduce development time through instrument flexibility: integrated clock
recovery data rates to 64 GBaud (112 Gb/s) (NRZ & PAM4) and integrated The N1046A is a group of remote sampling head modules designed to
pickoffs for simple one connection “triggerless” operation characterize your highest-performance designs for 56 GBaud and beyond.
The “soft roll-off” of their frequency response can capture wideband digital
Reduce validation time with analysis tools like Jitter Spectrum Analysis & signals such as NRZ or PAM4, as well as narrowband.
SW Clock Recovery Emulation
• 1/2/4 Port, Electrical Remote Sampling Head
• 2 channel / clock recovery / precision timebase combo
• 75 GHz, 85 GHz or > 100 GHz maximum available bandwidth
• 50 or 85 GHz bandwidth (upgradable)
• 16, 32 or 64 G NRZ and PAM4 clock recovery • High bandwidth and low-noise samplers, ideal for analyzing high-
• Jitter Spectrum Analysis and Clock Recovery Emulation speed signals used in emerging designs such as 224 Gb/s
• Electrical inputs: 1.0 mm male (1.0 female to 1.85 female adapters
incl.

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N1032A/B 90/120 GHz Single/dual Key features & functions
channel optical module Highest Optical Bandwidth

The new N1032A/B optical module for DCA-X sampling scopes provides • Feature: World’s highest optical oscilloscope at 120 GHz bandwidth
the world’s highest optical bandwidth up to 120 GHz. The ultra-high optical • Benefit: Helps pathfinders and researchers to see the true
bandwidth in N1032A/B module is ideally analyzing 112 GBaud (224 performance of their designs
Gbps) optical signals or any application that require ultra-wide optical Unique Solution for 224 Gb/s (112 Gbaud PAM4)
receiver > 65 GHz bandwidth (-3 dBo).
• Feature: Optical reference receiver range from 49.8 to 224 Gb/s
• Benefit: First optical reference receiver to enable 800G/1.6T
transmission
Ultra-wide Optical Reference Receiver

• Feature: Fully calibrated and easy-to-use optical reference receiver

• Benefit: Accurate characterize subsystems used in data
communications that require > 65 GHz BW
Smooth frequency response enables accurate System Impulse Response
Correction (SIRC)

• Adjustable BW (-3 dBo): 35 GHz – 90 GHz (#09U) and 35 GHz – 130

GHz (#13U)
N1032A/B optical modules with N1000A DCA-X
• Adjustable Frequency Response: Bessel, Gaussian, Flat, Sin(x)/(x)
Typical Setup for signaling rates > 64 GBaud

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G800GE - 800GE Layer 1 BERT + KP4 • Perform long-duration (timed tests) and stress tests by using Keysight’s
KP4 FEC symbol bit error density distribution analysis—excellent for
FEC Multiport catching bursty errors that occur over time
• Simplify connection of the G800GE to Keysight’s M8040A high-
World’s First Line-Rate 2 x 800GE Test system performance BERT analyzer for FEC-aware physical layer test
• Programable FEC capture with external trigger to UXR Realtime scope.
Keysight’s G800GE OSFP test system makes the challenge of qualifying bit
error rate (BER) and forward error correction (FEC) symbol performance and • Exhaustive manufacturing solution for 800G transceiver, combined with
Keysight DCA-M oscilloscope
stress-testing with line-rate packet traffic on 800GE electronic devices easier
and affordable. Used to validate chips, optical transceivers, or the port • Available interfaces OSFP + COAX, OSFP, QSFP-DD + COAX and
QSFP-DD.
electronics of networking equipment, the G800GE is a purpose-built BERT
and FEC test system with 112Gb electrical lane signaling per port that gives • Find problems faster with KiOS browser-based single-page application
you the ability to find a problem in minutes, not hours. It shows a system-level (SPA), system-view of all the BERT, FEC, and packet statistics of all the
lanes or ports with 1x800GE, 2x400GE, 4x200GE, and 8x100GE speed
view of the BER and FEC performance of all lanes and on the ports, as
support
desired, all at once, in real time.
• Measure line-rate BER and FEC performance in minutes, not hours—
evaluate optical transceiver and silicon device BER at all Ethernet speeds
More accurate measurement using coaxial simultaneously by using the patented enhanced BERT option (BERT
connectivity inferred FEC)

The G800GE 1-port optical transceiver interface model is a unique benchtop

test chassis that includes a 1-port electrical Tx/Rx coaxial interface. The coaxial
interface is an excellent medium for electrical signals. Its use results in more
accurate measurements because it offers an extremely clean signal. The
coaxial interface connects with many different types of device evaluation boards
to validate devices under test with the G800GE’s BERT, FEC, and packet G800GE 1-port optical transceiver interface model
transmission capabilities.

Key features & functions

• Functional testing for 400G and 800G silicon and transceiver with
100G serial interfaces.
• Validate the BER performance of high-port-count devices with 2-ports of
the G800GE 800GE BERT, FEC, and packet blast capabilities with
Keysight’s KiOS multi-port browser application
G800G software interface

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FEC- proofed designs High-performance BERT analyzer
synchronization
The combination of adaptive digital equalizers combined with forward error
correction has drastically increased the level of complexity for the design, The G800GE OSFP can be upgraded in the field to support
characterization, and validation process of 400G and 800G components interconnection and synchronization with Keysight’s M8040A or M8050A
and interfaces. high-performance BERT analyzer. The combined system is a symbol-
striped, FEC-aware physical layer BER tester for 112G electrical lanes. It
800G FEC-aware Rx conformance test is a solution for 800GE characterization, stress, and conformance tests,
and to perform physical-layer channel stress and impairment of a channel.
100G serial interfaces heavily rely on adaptive digital equalizer to
Additionally, advanced tests such as TDECQ and optical receiver stress
compensate for the channel loss and reflections and on Forward Error
testing (ORST) may be performed for optical transceivers in conjunction
Correction (FEC) to run error free. Unfortunately, digital equalizers and re-
with various Keysight Layer 1 instruments such as a real-time
timers generate error bursts that strongly affect the performance of Reed
oscilloscope, a DCA, and other equipment and accessories depending on
Solomon FEC codes used in the 400G and 800G designs The Solution
the application.
consist of the M8040A or M8050A BERT combined with the G800GE. It is
designed to integrate FEC constraints into the physical design validation. Key features
The G800GE generates and analyzes 100G, 200, 400 or 800G traffic. Some • Stressed signal calibrated according to IEEE 802.3ck (electrical) and
of the electrical lanes can be replaced by those of a classical BERT system IEEE 802.3cd (optical)
acting as victim lanes calibrated according to standards such as IEEE • 100GBASE FEC lanes from 2 sources seamlessly (PRBS possible)
802.3ck. The traffic can be PRBS-based or FEC encoded – for this the
• Real-time Rx performance monitoring on G800GE e.g. BER, FLR,
G800GE and the BERT must be synchronized. FEC margin, and bursts capture.
• Connect a module compliance board to your device evaluation board
by using the G800GE electrical coaxial cabling system

FEC-AWARE conformance test for 100G Serial Interfaces with M8040A and
G800GE

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M8040A 64 GBaud High-performance
BERT

The pattern generator of M8040A provides a clean PAM4 signal.

Key features
Get repeatable and accurate results with the M8040A 64 GBaud High-
• Data rates from 2 to 64 GBaud PAM4 signal
Performance BERT.
• True PAM4 error detection in real-time up to 58 GBaud
Master your next design • Built-in de-emphasis, analyzer equalization and clock recovery
• Integrated and calibrated jitter injection: RJ, PJ1, PJ2, SJ, BUJ, and clk/2
The M8040A provides clean NRZ and PAM4 signals up to 64 Gbaud with fast
jitter
transitions and low intrinsic jitter. The remote head concept of the M8040A
with the short 1.85 mm cables brings the performance close to the device • Two pattern generator channels per module to emulate aggressor lane
under test, minimizing signal degradations caused by lossy channels. • Interactive link training and SKP OS filtering for 8/16/32/64 GT/s PCI
Express®, SAS and USB3.2/ 4
The M8040A can be used for receiver (input) testing for many popular • Algorithmic PRBS, QPRBS and memory-based patterns such
interconnect standards that use PAM4 and NRZ data formats such as: 50 / SSPRQ, pattern sequencer.
100 / 200 / 400 / 800 GbE, OIF CEI-56G, and CEI-112G, 64G/112G Fibre • For PAM4: Gray coding, FEC encoding and precoder an error
Channel, PCIe 6.0 / 5.0 / 4.0, TBT3, USB3/4, SAS and Infiniband. distribution analysis
• All options and modules are upgradeable

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M8050A 120 GBaud High-performance
BERT

The M8050A provides pattern generation for up to 120 GBaud with clean open eyes.

Key features
• Pattern generation up to 120 GBaud NRZ, PAM4, PAM6/8
Get up to 120 GBaud pattern generation and error analysis with the M8050A. • Fast transition times of 5 picoseconds
• A super-clean clock with less than 100 fs random jitter @ 106 GBd
Keysight is your partner for 1.6T
• An output amplitude up to 1.6V peak to peak differential.
Keysight’s most advanced BERT, the M8050A, ensures success in next- • 7 tap de-emphasis with nominal 0.5% resolution provides lower
generation chip deployments for up to 1.6 Tbps and other leading-edge distortions through better channel match and improved channel loss
technologies by providing the unmatched combination of 120 GBaud compensation
signal generation with uncompromised signal integrity. • Error analysis up to 120 GBaud with the SD7150A Receiver and
Transmitter Test solution
When you combine the M8050A with an 80 GHz UXR, you have a full 120
• Software support from the well-known M8070B system software,
GBaud receiver and transmitter test solution – only available from
which means along with additional conformance test software
Keysight! Succeeding in next-generation technologies is seamless when packages, you can easily verify you are meeting standards
partnering with Keysight and the M8050A high-performance 120 GBaud requirements.
BERT.

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High speed multimode optics solutions Get N1000A DCA accuracy with a test solution
designed for manufacturing
Keysight’s total solution for 100G/lane multimode
Keysight’s N1000A digital communication analyzer (DCA) family is
Keysight has a total solution approach for 100G/lane Multimode optical recognized as the industry standard for verifying optical transmitter
transceiver test. Transmitter dispersion and eye closure quaternary compliance to communications standards. For years engineers have
(TDECQ) is the primary metric to assess PAM4 optical transmitter trusted the DCA to provide accurate and easy measurement of digital
communication quality. A solution combining the N1092A DCA-M communication waveforms. The Keysight N109X DCA-M family has built
Sampling Oscilloscope, with new N1077B Clock Recovery module is on that legacy by using the high-performance elements of both the
targeted on 100G per lane multimode applications defined under IEEE N1000A-oscilloscope mainframe acquisition system and the optical and
802.3db. electrical channel hardware of the N104XA plug-in modules. The N1092
and N1094 are for use from 8.4 GBaud to 64 GBaud on NRZ and PAM4
• First-to-market 64GBaud Multimode CDR
waveform and jitter measurement.
• IEEE 802.3db compliance
• Complete Tx-test Solution

Designed specifically for high-volume

N1092A/B/C/D/E and N1094A/B DCA-M Optical manufacturing test applications
and Electrical Sampling Oscilloscopes
Designed specifically for high-volume manufacturing test applications, the
DCA-M provides the measurement accuracy of the N1000A, without the
extra cost associated with an R&D test solution. Be confident that your test
results will never be questioned when performed with an N109X because
end users of your transceivers and components are likely to use similar
accurate, high-quality test systems to verify component performance.

N1092A/B/C/D/E and N1094A/B DCA-M optical and electrical sampling oscilloscopes

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Integrated instruments built in a small form factor N1077B 64 GBaud multimode optical/electrical
Built on Keysight's digital communication analyzer (DCA) technology, the
clock recovery
DCA-M family is recognized as the industry standard for verifying optical The N1077B Optical/Electrical Clock Recovery provides instrument-grade
transmitter compliance to communications standards. With single to quad clock recovery with adjustable loop bandwidth and peaking on both optical
optical AND electrical channels in a compact form factor, the DCA-M is ideal and electrical signals up to 64 GBaud. The N1077B clock recovery
for both manufacturing and R&D applications. Analyze both multi-mode and instrument is controlled via a USB connection to an N1000A DCA-X
single-mode signals with the low-noise, high-sensitivity calibrated reference mainframe, or to a standalone PC, running N1010A FlexDCA software.
receivers. The variety of models along with the supporting software and
compliance applications ensure you can measure with high precision,
whether you analyze electrical or optical devices.

• Analyze a wide range of data rates, from 1 Gb/s through 64 GBaud

• Electrical channels are available with up to 50 GHz bandwidth
• Characteristic intrinsic jitter as low as 160 fs RMS
• Supported both multimode and single-mode for single to quad channels
models

Based on the modern N1010A FlexDCA user

interface N1077B 64 GBaud Multimode Optical/Electrical Clock Recovery

Keysight's N1010A FlexDCA is the software that runs on the Keysight DCA
Series of sampling oscilloscopes. It controls measurement hardware both as Key features & functions
a local user interface and for remote control. In addition to acquiring data and
making measurements, FlexDCA has powerful tools that boost productivity • 125 MBd to 64 GBaud data rate range (continuous) on optical and
and provide insights into root causes of issues with the signal or device electrical NRZ and PAM4 data signals
under test. • Standards-compliant clock recovery (“Golden PLL”) with adjustable
peaking and loop bandwidth (to 20 MHz)
• Lock onto degraded signals (“closed eyes”) using a built-in variable
equalizer (Option EVA)
• Gain insight into root cause(s) for jitter using Jitter Spectrum Analysis
(Option JSA). Perform compliant PLL bandwidth and peaking
measurements using N1010300A FlexPLL Analysis software and
N1081PLCA PCI Express PLL Test Application
N1010A FlexDCA user interface

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100/400GE Optical receiver stress test Key specifications
solution – ensuring repeatable and • Controllable stress mix (ISI, jitter, noise) to address IEEE
802.3bs/cd/db test procedure and user-specific test (design
reproducible results characterization)
• Up to 56GBaud PAM4 in O- C-band and 850nm with 81492A-135
single mode and 81491A-085 multimode reference transmitters.
• Controllable amount of jitter-, noise- and ISI-induced penalty for both
NRZ and PAM4
• Automated stress signal calibration, receiver sensitivity and jitter
tolerance measurements
• Repeatable and stable calibration of optical stressed NRZ and PAM4
signals

When transceiver modules interoperability issues arise or simply when

discrepancies between the measured and expected performance are
observed, additional rounds of module characterization must be performed
by the vendor leading to a delay in the shipment or even to product
disqualification.

Keysight provides fully automated solutions for optical transmitter

characterization and optical receiver stress testing following IEEE 100G,
400G and MSAs. Keysight optical receiver stress testing solution is the
only commercially available and complete solution including an automated
optical stressed eye calibration, where stress conditions are fully controlled
and adjustable thus ensuring repeatable and reproducible results.

Key features & benefits

• Test compliance of optical 100G & 400G transceivers with IEEE
standards & MSAs
• Detect and understand interoperability issues
• One vendor turn-key solution. Optical 53.125GBaud PAM4 generated using M8196A AWG and 81490A-135
reference transmitter.

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Integrated Photonics and Optical o Up to 110GHz RF tests with Keysight N4372/3E Lightwave
Component Analyzer

Parametric Test o Frequency, Time domain and coherent test

• Fully automated wafer and die test workflow based on Keysight
PathWave Test Automation (TAP) with integrated instrument and
Silicon photonics - efficient wafer level test probe station control
o N7700210C Wafer Prober Plug-In for Test Automation
Integrated photonic devices o Test Automation Plug-In for PAS Lambda Scan SW
Integrated photonic devices require comprehensive testing for optical and o N4370P01B LCA Plug-In for Test Automation
electro-optical parameters at wafer level as well as on singulated dies both • Partnering with FormFactor
for DC and high-frequency signals. Fully automated probing of wafer o Semi-automated Wafer and Single-die probing with FormFactor
structures with high precision and speed is essential for R&D and design CM300xi probe station
verification. Now available with Keysight’s scalable multi-channel Optical, o Precise, fast and repeatable device probing on up to 300mm
RF, DC solutions. wafers, wafer and sub-die navigation
o Edge/Trench and Surface / grating optical coupling with single and
Keysight’s integrated photonic test solution multi-fiber connection with high degree of flexibility
combines wafer probing and measurement solutions o RF probing up to 110GHz and multi-pin DC electric ai probing
for parametric testing
Fully automated probe station and instrumentation characterizing optical and
electro-optic devices for optical, frequency and time domain tests which are
scalable to serve also your future test challenges.

• Polarization resolved optical characterization over multiple wavelength

bands (1240 – 1650 nm) with
o Photonic Application Suite Lambda Scan software
o N777-C tunable laser sources, N778-C polarization instrument family,
N774-C multiport power meter family, N7731/4A optical switches,
SMU instruments for O/E responsivity
• Scalable and modular PXI platform with
o M9601A (1 channel highest resolution) and M9614/15 (5 channel)
Precision Source/Measure Units
o M9808A 53GHz Vector Network Analyzer with N4377A Lightwave Auxiliary chuck for calibration and single die testing suitable for edge and surface
Detector probing

18
Integrated photonics test solution

19
Parametric photonic test • The N777-C tunable laser family provides models to cover the full 1240-
1650 nm range with performance classes for 2-way swept measurements
at up to 200 nm/s, picometer wavelength accuracy, and economical static
Keysight offers integrated solutions for measuring wavelength and
and stepped-wavelength applications.
polarization dependence of optical components. The new software and
hardware use Keysight’s unique single-sweep method for the best • The N774-C multiport power meters and remote heads with 2, 4 or 8
optical ports now transfer data at up to 3x faster rate than the
repeatability. New polarization alignment and stabilized polarization sweeps predecessors while logging up to 1M samples/port at up to 1 MHz
are especially valuable for on-wafer and PIC testing, including probe sampling rate, for synchronized use with tunable lasers and other time-
alignment. Measurement and start-up times are greatly reduced. dependent optical measurements, supported by the new triggering on
input signal events. Analog voltage output is available for alignment and
New generation of fiberoptic test instruments: feedback use, with both linear and logarithmic proportionality to the
N77-C family optical signal.
• The N778-C polarization instrument family include a polarimeter
benefitting from the sampling rate and dynamic range of the N774-C
electronics, a fast synchronized scrambler with new digital-feedback
stabilization and combined instruments for fast deterministic polarization
synthesis or component analysis including DGD/PMD.

Compact standard platform for N77-C instruments

N7749C interface for 8162-C remote power heads

For optical component development and manufacturing, these new test
instruments provide the required functionality and accuracy with faster data
Widely compatible with current instrument generations, the new N77-C
transfer and easy connectivity. New tunable lasers, optical power meters
instruments simplify the integration of test solutions and protect investments in
and polarization instruments are optimized to work together making fast
earlier hardware and in software development.
wavelength and polarization dependent measurements. All instruments have
a browser-based GUI, so basic functionality is available simply and remotely
without installing additional software, both over the LAN and USB interfaces.

www.keysight.com/find/oct

20
Application software for wavelength & Swept-wavelength measurement solution for
polarization dependence integrated photonics
The Photonic Application Suite, PAS Version 3, adds support for the N77-
C instruments, adopts a new 64-bit implementation and introduces the
new Lambda Scan measurement package for enhanced performance and
more flexible features.

Software packages
• New LS Engine: enhanced and extended functionality for lambda scans
with or without polarization functionality, for IL, PDL, PMD, and also
responsivity for integrated detector devices, supporting integration of a
wide range of instruments, including optical power meters and remote
heads, source measure units like the new PXI M9601A, M9614A and
M9615A for photocurrent detection, and the N7788C component
analyzer for DGD and PMD measurement.
• Legacy FSIL Engine: calibrate and adjust devices at highest repetition
rates using N774x power meters
• Legacy IL/PDL Engine: measure IL and PDL vs. wavelength using the
N7786B, also for integrated detector devices
For details, see: www.keysight.com/find/n7700
Basic configuration for single-sweep IL and PDL multiport measurements
Licenses
• N7700100C Polarization Lambda Scan (PLS) for single-sweep Keysight’s single-sweep technique measures polarization dependence without
multichannel measurement using the LS or IL/PDL engine repeating sweeps for much better repeatability and stability against temperature
• N7700101C DWDM Channel Analysis (DWDM) for specified drift and fiber movement. Automatic resolution of spectra for the TE and TM
component parameters from the spectral measurements modes of planar integrated devices avoids time-consuming polarization alignment
• N7700102C Fast Lambda Scan (FLS) for multichannel wavelength- prior to the measurement. New IL de-embedding of setup elements like optical
dependence using the LS or FSIL engine. switch paths simplifies measurement calibration. The Static-Mode function
• N7700103C PMD Lambda Scan (PMD) for single channel stabilizes the polarization to the device axis, based on the swept measurement to
measurements of devices and fiber for differential group delay and support probe alignment and adjustment processes, especially when performing
PMD parameters as well as insertion loss and PDL, using the wafer-level testing. With the LS engine and N7786C polarization synthesizer,
N7788C with 1 or more tunable lasers. wavelength scans can be performed at these stabilized polarizations.

21
All-band coverage with new wavelength option Multi-wavelength meters
for tunable laser family

86122C multi-wavelength meter

With two models, Keysight’s family of multi-wavelength meters addresses

the test of tunable transmitters for DWDM systems at ±0.2 ppm in the
range of 1270 nm to 1650 nm (model 86122C, 0.3 sec cycle time), as well
as the measurement of lasers for the new SWDM and CWDM MSAs at
typ. ± 1 ppm in the extended range of 700 nm to 1700 nm (model 86120D,
specified: 700 nm to 1650 nm, 0.6 sec cycle time). Both models in the
family of multi-wavelength meters can acquire up to 1000 laser lines in a
single sweep. The high-end model 86122C comes with 5 years factory
warranty, including coverage of reference laser exchange.

Optical power spectrum of N777-C tunable lasers

In both forms, as stand-alone N777-C or as 8160xA module, the laser

family has options for complete coverage of the single-mode fiber telecom
bands, from 1240 nm to 1650 nm. The combination of an O-band and an
E-band laser (options 113 and 114) for example, enables the
measurement of multiplexers/demultiplexers and receiver subassemblies
for the 400G CWDM8 MSA, while the full CWDM spectrum is covered by
the combination of three wavelength options: 113, 114 and 116 or 216.
The PAS LS software makes it particularly easy to make measurements
combining multiple lasers with automated switching of the laser ports.

22
High frequency parametric testing for • Expansion of measurement capabilities through combination with PNA
measurement classes (e.g. for THD and gain compression
silicon photonics and electro-optic measurements)

device testing • NIST traceable

• Integrated optical power meter
N4372E Lightwave Component Analyzer up to
110GHz
N4377A calibrated lightwave detector

N4377A calibrated lightwave detector

N4372E Lightwave Component Analyzer up to 110GHz

The N4377A is a self-contained, USB-powered Lightwave Detector with
optical power meter capability for frequency domain applications to
The N4372E 110GHz Lightwave Component Analyzer (LCA) extends be used with
Keysight’s LCA family for high frequency parametric testing of optical • Vector network analyzers
transmitters and receivers up to 110GHz. Based on the N5290A/N5291A 900
• Spectrum analyzers
Hz to 110/120 GHz PNA mm-Wave System, the N4372E is the only electro-
• Powered and connected via USB interface:
optic vector network analyzer system realizing S-Parameter measurements
for both E-to-O and O-to-E devices up to 110GHz. o Calibration data stored as S2P files on module and accessible as USB
drive
Key features of LCA family: o SCPI remote programming via USBTMC

• Optical transmitter and -receiver test: responsivity, electrical return loss • (Re-)Calibration independent from network analyzer

• Single mode component test up to 110 GHz, 1260 - 1620 nm range • Available Options:

• Multimode component test up to 50 GHz, 820 – 980 nm range • S70: 70 GHz operating range at 1310 nm/ 1550 nm; single mode fiber

• Absolute and relative electro-optic response (magnitude and phase) • S40: 40 GHz operating range at 1310 nm/ 1550 nm; single mode fiber
• M40: 40 GHz operating range at 850 nm; multimode fiber

23
N5291A 900 Hz to 120 GHz PNA Key features & functions
Millimeter-wave system • Single-sweep solution with compact frequency extenders
• Available as a single product solution
• Accurate leveled power can be applied to the device, providing the
ability to sweep power
• Available various software applications for detail analysis

N5291A 900 Hz to 120 GHz PNA mm-Wave System

Gain confidence with an off-the-shelf solution

Assembling a “roll your own” millimeter-wave network analyzer can be
challenging and time-consuming. Worse, there are no guaranteed
specifications for stability or accuracy.

The better alternative is a preconfigured solution that includes a two- or

four-port network analyzer along with the necessary millimeter-wave
cabling, frequency extenders and test-set controller. With the N5290/91A
solutions, you can select either a PNA or PNA-X network analyzer with
maximum frequency of 26.5 GHz or 67 GHz. Keysight’s configuration
The combination of calibration, fixture de-embedding and fixture removal enhances
guide describes the full range of choices.
the accuracy of on-wafer measurements.
The result is a broadband millimeter-wave solution that enhances device
characterization and modeling for on-wafer and connectorized
measurements. To ensure accurate and repeatable on-wafer results, the
N5290/91A solution is also compatible with the wafer-level measurement
solution (WMS) created by Keysight and solution-partner Formfactor
(former Cascade Microtech).

24
Coherent Transceiver Test
220 GBaud R&D test system for
coherent optical transmissions
Test advanced modulation schemes for 600 Gb/s to 2 Tb/s transmission M8199A Arbitrary Waveform Generator,4-ch 128GSa/s or 4-ch 256 GSa/s with interleaving
market. The next generation of coherent transceivers will operate at
symbol rates of around 160 GBaud and beyond. This test solution mimics For coherent transmission test, Keysight offers instruments for the generation and
the function of a coherent transceiver generating signals with flexible analysis of complex modulated optical signals. Multichannel arbitrary waveform
modulation formats using Keysight’s M8199 Family of Arbitrary generators are typically used to synthesize those complex modulated signals.
Waveform Generators (AWG). For the analysis of these signals Use the 81195A optical modulation generator software to generate clean complex
Keysight’s groundbreaking N4391B Optical Modulation Analyzer (OMA) modulated signals as well as signal impairments to stress coherent receivers over
is used which is based on Keysight’s industry leading UXR real-time multiple test scenarios.
oscilloscope family. This solution enables full transceiver analysis at the Optical modulation analyzers provide insights into the physical layer of complex
new speed class to verify and improve the transceiver’s performance. modulated optical signals to determine signal quality or evaluate components that
• Highest bandwidth are designed for IQ modulation and demodulation. Keysight offers the widest
range of optical modulation analysis and synthesis instruments for testing up to 1.2
• Lowest noise floor
Tb/s – for your current and future needs.
• Lowest noise floor

70 GHz and 110 GHz optical modulation analyzer Key features & specifications
receiver
• Maximum detectable symbol rates 80 | 100 | 118 | 140 GBd and 160
| 200 | 220 GBd depending on oscilloscope option
• 40 | 50 | 59 | 70 GHz and | 80 | 100 | 110 GHz system bandwidth
options with a single oscilloscope
• 256 GSa/s Sample rate
• ADC resolution 10 bits for all bandwidth grades
• Specified typical system noise floor < 1.6% EVM rms at reference conditions
• Relative skew < ± 0.5 ps
N4391B Optical Modulation Analyzer Receiver • Optical operating wavelength range 1528 nm to 1620 nm
• Absolute wavelength accuracy +/- 2.5 pm typical

25
Testing the coherent 400G ecosystem Key features & specifications
• Turn-key solution for testing coherent optical transmit and receive
Scalable solution for R&D and Manufacturing devices
Interoperability and volume requirements necessitate a paradigm shift in • Compact and flexible AXIe modular form factor
coherent transceiver manufacturing. Keysight offers a test solution • Common Specs for M8292A and M8296A
designed for the coherent 400G ecosystem, optimized for cost and size, o 74 GBd maximum symbol rate
including the M8290A Modular Optical Modulation Analyzer family (M- o 83 to 92 GSa/s sample rate
OMA) and the Arbitrary Waveform Generators (AWG) M8196A (92 GSa/s,
o 512k samples maximum record length
32 GHz analog bandwidth) or the M8194A (120 GSa/s, 50 GHz analog
o 8 bit ADC resolution
bandwidth).
• M8292A Optical Receiver only:
M8290A optical modulation analyzer and high- o 1528 to 1570 nm wavelength coverage
speed digitizer test solution • M8296A Electrical Receiver (ADC) only
o 150 mV to 400 mV Input range

Optimized for the 400G speed class, the M8292A optical modulation
analyzer provides a compact, rack-mountable test instrument within the
M8290A family, that connects to the optical output of coherent transmitters.
It leverages the full feature set of Keysight's vector signal analyzer and
optical modulation analyzer software ensuring a positive user experience
analyzing complex modulated data signals.

26
Automated test solution for coherent Testing of coherent optical transmit and receive
optical transmit and receive devices devices (COD Test)

Coherent optical devices such as dual-polarization IQ modulators, Highlights:

intradyne coherent receivers and transmitters need to be tested in their • single connection between fixture and instruments saves time and
different development stages as well as qualified by the system increases repeatability
integrators. • simultaneous measurement of all four S21 magnitude and phase
responses
The N4391B OMA Software contains packages that use Keysight
• De-embeds cables and fixtures
hardware to provide turn-key solutions for full characterization of coherent
optical transmit and receive devices. Both hardware platforms, the • Scalable setup to perform additional measurements
M8290A as well as the N4391 family are supported. • Measures IQ skew, XY skew
• Rx IQ angles — requires heterodyne configuration
Featured application packages in OMA software:

Standard Conform EVM measurement

Highlights:

• Transmitter test with pre-defined parameters and methodology

according to ITU G.698.2 and OIF-400ZR-01.0
• Measures EVM on defined block length for all processing steps
• n-tap T-spaced adaptive equalizer
• digital noise loading (optional)

COD Test Result: Tx Amplitude & Phase Response with zoomed-in skew results

Standard-conform EVM Result screen for 400ZR transceiver

27
Integrated Coherent Receiver (ICR) testing
Highlights

• EVM noise floor

• Image suppression
• Simultaneous measurement of all four S21 magnitude responses
saves test time
• Measures IQ skew, XY skew, and Rx IQ angle
• IQ and XY gain imbalance

ICR Test result screen with Phase & Frequency Response

28
Terabit Research – Precision tests at Do what has never been done
terabit speeds • Achieve next-generation technology breakthroughs with 40 to 110 GHz of real-
time bandwidth
To test the transmission speeds for tomorrow Keysight offers the latest • Enable higher order modulation standards with 10-bit ADC and superior ENOB
industry leading signal generation and analysis technology based on the performance
M8199A AWG and Infiniium UXR Realtime oscilloscope. • See the truest representation of your signal with ultra-low noise floor
The M8199A and M8199B AWG provide the combination of speed (256
GSa/s), bandwidth and channel density (up to 4 differential channels). The
UXR is the first series of real-time oscilloscopes featuring ultra-low noise
and high signal fidelity with 10 bits of high-definition resolution and four
channels of simultaneous 13-110 GHz of bandwidth, each concurrently
sampling at 256 GSa/s.

• Industry’s fastest AWG

UXR1104A Infiniium UXR-series oscilloscope: 110GHz, 4 channels
• Ultra-low noise 110 GHz scope
• 100 GBaud/1 Tb research Performance beyond the extremes of greater
visibility, improved accuracy and faster testing
UXR1104A Infiniium UXR-series • 40 to 110 GHz of real-time oscilloscope bandwidth
• High definition 10 bit analog-to-digital converter (ADC)
oscilloscope: 110GHz, 4 channels • Full bandwidth and channel upgradability
Infiniium UXR-series real-time oscilloscopes • The industry’s highest ENOB at bandwidths up to 110 GHz

The Infiniium UXR is the first series of real-time oscilloscopes to offer ultra- • Industry’s lowest noise floor with less than 1 mVrms of noise
high-performance acquisition with 10 bits of high-definition resolution. With • Industry’s lowest jitter with less than 25 fs (rms) of intrinsic jitter and less than
four channels of simultaneous 110 GHz of bandwidth, each concurrently 10 fs (rms) of inter-channel jitter
sampling at a staggering 256 GSa/s, Infiniium UXR delivers the world-leading
performance, ultra-low noise and high signal fidelity necessary for engineers
Key features
• Models from 40 to 110 GHz of industry best real-time analog bandwidth Up
and scientists to truly see and understand even the fastest phenomena – to 256 GSa/s sampling rate
enabling you in accelerating the development of the next generation of • 2-channel and 4-channel models  Unrestricted full bandwidth and sampling
technology and research. per channel
• 10-bit Analog to Digital Converter (ADC)
• Industry-leading deep memory  Up to 2 Gpts per channel

29
M8199A 128/256 GSa/s Arbitrary Coherent optical applications
waveform generator 800G and 1 Terabit applications demand a new class of generators that provide
high speed, precision, and flexibility at the same time. The M8199A is the ideal
solution to test various optical systems from discrete components like optical
power amplifiers to more complex dual polarization systems such as optical
modulators or optical receivers. Even for tests of signal processor ASICs or
algorithms, the M8199A is an excellent signal source to provide stressed signals
to these devices.

With up to 4 channels per 2-slot AXIe module, each running at up to 128 GSa/s
with 65 GHz of analog bandwidth, the M8199A allows dual polarization testing in
a small form factor and the generation of complex signals with any modulation
M8199A 256 GSa/s Arbitrary Waveform Generator
scheme (QPSK, nQAM, etc.) up to 128 GBaud.

Key features & specifications

• 4 channels at 128 GSa/s or 2 channels 256 GSa/s
• Up to 70 GHz nominal analog bandwidth
• Built-in frequency and phase response calibration for clean output
signals
• 6 bits ENOB, DC to 50 GHz, Fs 100 GSa/s
• Intrinsic jitter: < 75 fs
• Continuous sample rate range: 100 to 128 GSa/s resp. 200 to 256
GSa/s
• Up to 1.4 Vpp differential output voltage @128 GBaud
Provides research engineers a high-performance signal source for arbitrary
signals, enabling development of designs up to 140 GBaud.

• Delivers twice the sampling rate of any AWG on the market today The M8199A enables 128 GBaud PAM4 (= 256 Gpbs).
• Integrated, ready-to-use instrument
• Operates with well-known software, like MATLAB or Keysight IQTools Using option ILV boosts the sample rate from 128 GSa/s on 4 channels to
and SCPI programming interface based on M8070B 256 GSa/s on two channels. An optionally available remote head
increases the output amplitude so that it can directly drive a modulator
• High flexibility with upgrade options from 2 channels at 128 GSa/s to 4
channels at 256 GSa/s amplifier.

30
Compensation for distortions generated e.g. by cables and amplifiers can The flexibility of the waveform generation with highest speeds, combined
be compensated by embedding/de-embedding the S-parameters of the with excellent intrinsic jitter performance makes the M8199A a truly unique
respective circuits or by performing an in-situ calibration using the and versatile instrument. At data rates of multiple Gb/s, the effect of cables,
Keysight Technologies vector signal analysis software. board traces, and connectors etc. must be considered in order to generate
the desired signal at the test point of the device under test. The M8199A
incorporates digital correction techniques for frequency- and phase-response
Multi-level / multi-channel digital signals compensation of the AWG output and any external circuit to generate the
desired signal at the device under test. Channels can be embedded/de-
With increasing data rates in servers and computers, the trace loss
embedded if the S-parameters of the respective circuits are provided.
increases, which reduces the signal to-noise ratio. Standard modulation
formats, such as NRZ or PAM-4 may not be sufficient anymore. Here the
M8199A is the right tool that provides the flexibility for advanced research
on improved and more advanced modulation formats to boost
transmission rates to the next level. For example, high speed research is
already experimenting using PAM-3, PAM-6, PAM-8 or proprietary
modulation formats at data rates up to 128 GBaud. Interleaving can boost
the sample rate to 256 GSa/s, enabling symbol rates beyond 128 GBaud.

80 GBaud PAM-8 (= 240 Gpbs

144 GBaud PAM-4 (= 288 Gbps)

31
M8199B 256 GSa/s Arbitrary Waveform Fastest AWG on the market
Generator The Keysight M8199A AWG uses an external passive coupler to interleave
two 128 GSa/s channels to achieve signal generation up to 256 GSa/s.
The M8199B AWG follows the same interleaving approach as the
M8199A, but the passive combiner and RF amplifier are integrated into a
single package, greatly improving the achieved bandwidth and signal-to-
noise ratio (SNR).

The Keysight M8199B AWG offers you performance never seen before. It
has a built-in frequency and phase response calibration, which ensures
generating the most accurate signal possible. It is ready to use out-of-the-
box, which means you spend less time setting up your test equipment and
more time running your tests. Brand-new Keysight custom technology
ensures highest signal quality and maximum flexibility.
Key features & specifications
Support for leading-edge applications
• Up to 256 GSa/s for 2 channels in a 2-slot AXIe module
The M8199B AWG allows you to generate signals up to 256 GSa/s with
• 8-bit resolution
sufficient signal integrity, perfect for applications like 1.6 Tb/s coherent
• Analog bandwidth >80 GHz (enabling 160 GBaud serial data transmissions or beyond 224 Gbit/s/lane intensity-modulation/direct-detect
generation)
(IM/DD) transmissions.
• High-voltage output amplifier enables amplitudes > 3 Vpp, diff
• 1 MSa/channel memory The M8199B AWG is the unique solution in the market allowing R&D
teams in the telecom and datacom industry, developing components,
• Synchronize up to 8 channels (across 4 modules)
prototypes or products for coherent and IM/DD optical transmission
Helping you develop your innovation systems operating at data rates up to 160 GBaud and beyond.

Keysight knows you are pushing boundaries and understands that your The M8199B AWG provides a stimulus signal with flexible modulation
innovation requires next generation test equipment. That’s why we schemes (NRZ, PAM-n, QPSK, QAM-n). In addition, it allows you to apply
continually develop solutions that keep up with the latest technology waves offline customized digital-signal processing before loading the signal into
and applications. The M8199B Arbitrary Waveform Generator (AWG) is the the memory of the AWG.
latest example of this commitment.

32
KeysightCare – Support. Elevated. Assured - fast support
• 10-day instrument repair
Overview • proactive firmware notifications
When the pressure is on, costly delays come from waiting on tools, • 4-business-hour technical response
answers or help. That’s why we created KeysightCare. It is ensured action, • support knowledge center
when you need it. KeysightCare transforms service and support to help • self-service web portal
your team deliver better results, consistently. It’s a bold promise, and we
back it up. Enhanced - priority Support
Flexibility • 7-day instrument repair
• proactive firmware notifications
KeysightCare goes beyond basic warranty, offering three tiers of support
• 2-business-hour technical response
to address your unique needs. Whether receiving accelerated response
• support knowledge center
times, keeping your equipment operating like the day you purchased it, or
getting access to experts, there is a KeysightCare offer that is right for you. • self-service web portal
• 5-day expedited calibration

Performance - enterprise support

• 5-day instrument repair
• proactive firmware notifications
• 2-hour technical response
• support knowledge center
• self-service web portal
• 3-day expedited calibration
• 24x7 emergency response

Software - subscription support

• software updates and enhancements
• proactive software notifications
• 4-business-hour technical response
• support knowledge center

33
References
Optical Receiver Stress Testers
PathWave Advanced Design System (ADS)
https://www.keysight.comfind/optical-receiver-stress-testers
https://www.keysight.com/find/ADS
Integrated Photonics Test Products
800G and 1.6T Test Solutions
https://www.keysight.com/find/integrated-photonics-test-products
https://www.keysight.com/find/1.6T
Optical Component Test
DCA-X Sampling Oscilloscopes https://www.keysight.com/find/optical-component-test-products.html
https://www.keysight.com/find/dca-x-sampling-oscilloscopes 110 GHz Lightwave Component Analyzer
DCA-M Sampling Oscilloscopes https://www.keysight.com/find/N4372E

https://www.keysight.com/find/dca-m-sampling-oscilloscopes N4377A Lightwave Detector

https://www.keysight.com/find/N4377A
Electrical And Optical Clock Recovery Series
Coherent Transmission Test Instruments
https://www.keysight.com/find/infiniium-dca-equivalent-time-sampling-
oscilloscopes/electrical-and-optical-clock-recovery-series-oscilloscopes https://www.keysight.com/find/coherent-transmission-test-instruments

G800GE OSFP/ QSFP-DD test system Infiniium Real-Time Oscilloscopes

https://www.keysight.com/find/infiniium-real-time-oscilloscopes
https://www.keysight.com/find/g800ge
M8199A Arbitrary Waveform Generator
M8040A High-performance BERT 64 GBd
https://www.keysight.com/find/M8199A
https://www.keysight.com/find/M8040A
N5291A PNA Millimeter-wave System, 900 Hz to 120 GHz
M8050A High-performance BERT 120 GBd https://www.keysight.com/find/N5291A
https://www.keysight.com/find/M8050A

Optical Transceiver Test Solutions

https://www.keysight.com/find/optical-transceiver-test-solutions

34
This information is subject to change without notice. © Keysight Technologies, 2022, Published in Germany, October 4, 2022, 3122-1988.EN